Testing seat clamping device and chip testing device
By designing a test socket clamp, the problem of difficulty in taking and placing the chip test socket in existing equipment is solved, and the effect of simplifying operation and protecting the chip test socket is achieved.
Patent Information
- Application Number
- CN202422351248.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-26
- Publication Date
- 2025-09-30
- Estimated Expiration
- 2034-09-26
AI Technical Summary
Existing chip testing equipment has many test sockets arranged on the test board, which makes it difficult to pick and place, inconvenient to operate, and has a cumbersome maintenance process, which increases the workload of the operator.
A test socket clamp is designed, including a clamping body, a first clamping jaw and a second clamping jaw. The clamping jaw and the clamping body are movably connected, and have the position of clamping and releasing the chip test socket. Combined with the hook part and the positioning groove, stable clamping and protection of the chip test socket are achieved.
The clamping and releasing operations of the chip test seat are simplified, the operating difficulty is reduced, the workload of the operator is reduced, the chip test seat and the operator are protected, and the service life of the equipment is extended.
Smart Images
Figure CN223400925U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of semiconductor chip testing, in particular to a test seat clamp and a chip testing device. Background Art
[0002] With the widespread use of semiconductor chip testing technology, market demand has increased significantly, and test content and test requirements have also posed huge challenges to corresponding equipment. Existing related testing equipment has many test sockets arranged on the test board, which makes it more difficult to pick and place, and the pick and place operations are inconvenient, resulting in cumbersome maintenance processes and long repair cycles. At the same time, in order to replace the problematic test socket, the test socket in the normal position needs to be disassembled, which increases the workload of the operator. Utility Model Content
[0003] The purpose of the utility model is to provide a test socket clamp and a chip testing device, which have a simple structure and are easy to use. They can not only reduce the workload of operators, but also reduce the difficulty of operation, and can protect the chip test socket and operators.
[0004] The embodiment of the present utility model is achieved as follows:
[0005] In a first aspect, the present invention provides a test socket clamp, the test socket clamp comprising a clamping body, a first clamping jaw, and a second clamping jaw;
[0006] The first clamping jaw and the second clamping jaw are both connected to the clamping body. The first clamping jaw and the second clamping jaw are connected to opposite sides of the clamping body. There is a gap between the first clamping jaw and the second clamping jaw. A first hooking portion is configured on a side of the first clamping jaw facing the second clamping jaw, and a second hooking portion is configured on a side of the second clamping jaw facing the first clamping jaw to jointly clamp the chip test socket.
[0007] At least one of the first clamping jaw and the second clamping jaw is movably connected to the clamping body and has a position for clamping the chip test socket and a position for releasing the chip test socket.
[0008] In an optional embodiment, the first clamping jaw and the second clamping jaw are respectively provided with a first clamping portion and a second clamping portion, and the first clamping portion and the second clamping portion are both used to clamp the lower portion of the chip test seat;
[0009] The first hooking portion is located at an end of the first clamping portion away from the clamping body, and the second hooking portion is located at an end of the second clamping portion away from the clamping body.
[0010] In an optional embodiment, the first hooking portion includes two first hooking platforms protruding toward the second clamping jaw, and the two first hooking platforms are arranged at intervals; the second hooking portion includes two second hooking platforms protruding toward the first clamping jaw, and the two second hooking platforms are arranged at intervals.
[0011] In an optional embodiment, the bottom of the clamping body is provided with a positioning groove for cooperating with the chip test socket.
[0012] In an optional embodiment, the first clamping jaw is rotatably connected to the clamping body.
[0013] In an optional embodiment, the test seat clamp further includes an elastic member, which is disposed at the rotational connection between the first clamping jaw and the clamping body and is used to enable the first clamping jaw to have a tendency to move from a position of releasing the chip test seat to a position of clamping the chip test seat.
[0014] In an optional embodiment, a side of the clamping body on which the first clamping jaw is mounted is configured with a mating flat surface and a mating inclined surface;
[0015] When the first clamping jaw is in a position for clamping the chip test seat, the first clamping jaw is in contact with the matching plane; when the first clamping jaw is in a position for releasing the chip test seat, the first clamping jaw is in contact with the matching inclined surface.
[0016] In an optional embodiment, the first clamping jaw is provided with a first mounting hole, the matching inclined surface is provided with a second mounting hole, and both the first mounting hole and the second mounting hole are matched with the elastic member.
[0017] In an optional embodiment, the test socket clamper further includes an operating handle connected to the clamping body.
[0018] In a second aspect, the present invention provides a chip testing device, which includes a chip testing carrier and the above-mentioned test socket clamp;
[0019] The chip test carrier is used to load multiple chip test sockets, and the test socket clamp is used to clamp the chip test sockets.
[0020] The beneficial effects of the embodiments of the present utility model include:
[0021] The test socket gripper includes a clamping body, a first clamping jaw, and a second clamping jaw. Both the first clamping jaw and the second clamping jaw are connected to the clamping body, and a gap is provided between the first clamping jaw and the second clamping jaw to jointly clamp the chip test socket. At least one of the first clamping jaw and the second clamping jaw is movably connected to the clamping body and has a position for clamping the chip test socket and a position for releasing the chip test socket. This test socket gripper is used in chip testing equipment and has a simple structure and is easy to use. It can reduce the operator's workload, simplify operation, and protect the chip test socket and the operator. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following is a brief introduction to the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.
[0023] Figure 1 This is a structural schematic diagram of the first perspective when the test socket clamper is in the position of clamping the chip test socket in the embodiment of the present utility model;
[0024] Figure 2 This is a structural schematic diagram of a second viewing angle when the test socket clamper is in a position for clamping a chip test socket according to an embodiment of the present invention;
[0025] Figure 3 This is a structural schematic diagram of the first perspective when the test socket gripper of the embodiment of the present utility model is in a position of releasing the chip test socket;
[0026] Figure 4 This is a structural schematic diagram of a second viewing angle when the test socket gripper is in a position to release the chip test socket in an embodiment of the present invention;
[0027] Figure 5 This is an exploded schematic diagram of a test socket clamp in an embodiment of the present utility model;
[0028] Figure 6 This is a schematic structural diagram of the first clamping jaw in an embodiment of the present utility model;
[0029] Figure 7 This is a schematic diagram of the arrangement of the positioning groove in an embodiment of the present utility model;
[0030] Figure 8 It is a structural schematic diagram of the clamping body in an embodiment of the present utility model.
[0031] Icon: 100-test socket clamp; 110-clamping body; 120-first clamping jaw; 130-second clamping jaw; 121-first hooking portion; 131-second hooking portion; 122-first clamping portion; 132-second clamping portion; 123-first hooking platform; 133-second hooking platform; 111-positioning groove; 140-elastic member; 112-matching plane; 113-matching inclined surface; 124-first mounting hole; 114-second mounting hole; 150-operating handle. DETAILED DESCRIPTION
[0032] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings herein can be arranged and designed in various different configurations.
[0033] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but rather merely represents selected embodiments of the present invention. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without creative effort are also within the scope of protection of the present invention.
[0034] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings.
[0035] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer" and the like, indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, or are the orientations or positional relationships in which the utility model product is typically placed when in use. These terms are intended solely to facilitate the description of this utility model and to simplify the description, and are not intended to indicate or imply that the device or component referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first," "second," and "third," etc., are used solely to distinguish descriptions and should not be construed as indicating or implying relative importance.
[0036] Furthermore, terms such as "horizontal" and "vertical" do not necessarily mean that a component must be absolutely horizontal or overhanging, but rather that it can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal than "vertical," and does not mean that the structure must be completely horizontal, but rather that it can be slightly tilted.
[0037] It should also be noted that, in the description of this utility model, unless otherwise expressly specified or limited, the terms "disposed," "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections; direct connections, indirect connections through an intermediate medium, and internal connections between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on the specific circumstances.
[0038] Please refer to Figure 1-Figure 5 , this embodiment provides a test socket clamp 100, the test socket clamp 100 includes a clamping body 110, a first clamping jaw 120 and a second clamping jaw 130;
[0039] The first clamping jaw 120 and the second clamping jaw 130 are both connected to the clamping body 110. The first clamping jaw 120 and the second clamping jaw 130 are connected to opposite sides of the clamping body 110. There is a gap between the first clamping jaw 120 and the second clamping jaw 130, and a first hooking portion 121 is configured on the side of the first clamping jaw 120 facing the second clamping jaw 130, and a second hooking portion 131 is configured on the side of the second clamping jaw 130 facing the first clamping jaw 120, so as to jointly clamp the chip test socket; wherein, at least one of the first clamping jaw 120 and the second clamping jaw 130 is movably connected to the clamping body 110 and has a position for clamping the chip test socket and a position for releasing the chip test socket.
[0040] Please refer to Figure 1-Figure 5 The working principle of the test socket gripper 100 is:
[0041] The test socket clamp 100 includes a clamping body 110, a first clamping jaw 120 and a second clamping jaw 130; the first clamping jaw 120 and the second clamping jaw 130 are both connected to the clamping body 110, and there is a gap between the first clamping jaw 120 and the second clamping jaw 130 to jointly clamp the chip test socket; wherein, at least one of the first clamping jaw 120 and the second clamping jaw 130 is movably connected to the clamping body 110 and has a position for clamping the chip test socket and a position for releasing the chip test socket.
[0042] Thus, during use, after the test socket clamper 100 is in a suitable position, the first clamping jaw 120 or the second clamping jaw 130 movably connected to the clamping body 110 can be operated to release the chip test socket, and after the chip test socket is in a suitable position, the first clamping jaw 120 or the second clamping jaw 130 is in a position to clamp the chip test socket, thereby completing the clamping action of clamping the chip test socket, and then the chip test socket can be transferred;
[0043] On this basis, the first clamping jaw 120 is configured with a first hooking portion 121 on the side opposite to the second clamping jaw 130, and the second clamping jaw 130 is configured with a second hooking portion 131 on the side opposite to the first clamping jaw 120. Therefore, through the configuration of the first hooking portion 121 and the second hooking portion 131, it is possible to cooperate with the clamping action of the first clamping jaw 120 and the second clamping jaw 130, that is, to abut against the bottom of the test socket and reduce the probability of contact with the bottom components of the socket PCBA during the clamping process, so as to facilitate the extraction of the chip test socket after clamping it, thereby reducing damage to the connector during extraction and extending the service life. Such a structural configuration can easily complete the clamping or release action of the chip test socket, and its simple structure and easy use can not only reduce the workload of the operator, but also reduce the difficulty of operation, and can protect the chip test socket and the operator.
[0044] Further, please refer to Figure 1-Figure 7 In this embodiment, when installing the first clamping jaw 120 and the second clamping jaw 130, in order to facilitate the clamping of the chip test socket, the first clamping jaw 120 and the second clamping jaw 130 are connected to opposite sides of the clamping body 110. The purpose is to ensure that there is a suitable distance between the first clamping jaw 120 and the second clamping jaw 130, and the distance can be adapted to the clamping of the chip test socket.
[0045] Furthermore, to enable the chip test socket to be clamped by the first clamping jaw 120 and the second clamping jaw 130, the first clamping jaw 120 and the second clamping jaw 130 are respectively provided with a first clamping portion 122 and a second clamping portion 132, both of which are used to clamp the lower portion of the chip test socket. The first hooking portion 121 is located at the end of the first clamping portion 122 away from the clamping body 110, and the second hooking portion 131 is located at the end of the second clamping portion 132 away from the clamping body 110. Furthermore, a positioning groove 111 is configured at the bottom of the clamping body 110 for mating with the chip test socket.
[0046] Therefore, through the above-mentioned structural setting, during the clamping process, the positioning groove 111 on the clamping body 110 can cooperate with the upper part of the chip test seat to achieve positioning, and then the first clamping part 122 and the second clamping part 132 can be used to clamp the lower part of the chip test seat, thereby achieving stable clamping of the chip test seat.
[0047] Furthermore, the first hooking portion 121 includes two first hooking platforms 123 protruding toward the second clamping jaw 130, and the two first hooking platforms 123 are spaced apart. The second hooking portion 131 includes two second hooking platforms 133 protruding toward the first clamping jaw 120, and the two second hooking platforms 133 are spaced apart. Thus, when clamping and extracting the test socket, the two first hooking platforms 123 and the two second hooking platforms 133 can be used to hook the four corners of the PCBA. This reduces the number and size of hooking points on the bottom of the first clamping portion 122 and the second clamping portion 132, thereby reducing the probability of contact with the bottom components of the socket PCBA, thereby reducing damage to the connector during extraction and extending its service life.
[0048] Based on the above, it can be seen that the method adopted is to make at least one of the first clamping jaw 120 and the second clamping jaw 130 movably connected to the clamping body 110, the purpose of which is to facilitate the clamping of the chip test seat. In this embodiment, the method adopted is to rotatably connect the first clamping jaw 120 to the clamping body 110, so that by operating the first clamping jaw 120, it can be rotated relative to the clamping body 110 under the action of external force, and then it can be switched between the positions of clamping and releasing the chip test seat, thereby meeting the requirements of clamping and releasing the chip test seat. It should be noted that in this embodiment, the example of the rotatable connection between the first clamping jaw 120 and the clamping body 110 is used for explanation, and in other embodiments of the present invention, the method of rotatably connecting both the first clamping jaw 120 and the second clamping jaw 130 to the clamping body 110 can also be adopted.
[0049] Furthermore, in this embodiment, based on the rotatable connection between the first clamping jaw 120 and the clamping body 110, in order to improve the stability when clamping the chip test seat and prevent the clamped chip test seat from accidentally falling off, the test seat clamper 100 also includes an elastic member 140. The elastic member 140 is arranged at the rotational connection between the first clamping jaw 120 and the clamping body 110, and is used to make the first clamping jaw 120 have a tendency to move from a position of releasing the chip test seat to a position of clamping the chip test seat.
[0050] That is, through the setting of the elastic member 140, the first clamping jaw 120 can have a tendency to move from the position of releasing the chip test seat to the position of clamping the chip test seat, and then when the first clamping jaw 120 is operated, the first clamping jaw 120 can be moved to the position of releasing the chip test seat by external force, and after the external force disappears, the first clamp can move to the position of clamping the chip test seat, and then when the clamped chip test seat is transferred, even if the external force disappears, the test seat clamper 100 can maintain the state of clamping the chip test seat, thereby avoiding the situation where the clamped chip falls off accidentally during the test.
[0051] From the above, please refer to Figures 1-8 In this embodiment, the first clamping jaw 120 is rotatably connected to the clamping body 110. On this basis, a matching flat surface 112 and a matching inclined surface 113 are configured on one side of the clamping body 110 where the first clamping jaw 120 is mounted.
[0052] When the first clamping jaw 120 is in the position of clamping the chip test socket, the first clamping jaw 120 is in contact with the matching plane 112 ; when the first clamping jaw 120 is in the position of releasing the chip test socket, the first clamping jaw 120 is in contact with the matching inclined surface 113 .
[0053] Therefore, when operating the test seat clamp 100, when external force is applied to the first clamping jaw 120, it can rotate relative to the clamping body 110, and then rotate from the mating plane 112 to the state of being in contact with the mating inclined surface 113, that is, the setting of the mating inclined surface 113 can limit the angle of rotation of the first clamping jaw 120 relative to the clamping body 110; for example, when the mating inclined surface 113 is inclined by 5° relative to the mating plane 112, when the first clamping jaw 120 is operated to rotate from the mating plane 112 to the state of being in contact with the mating inclined surface 113, the relative rotation angle is 5°; and in this embodiment, when configuring the mating inclined surface 113, the rotatable angle of the first clamping jaw 120 relative to the clamping body 110 can be adjusted by setting its inclination angle.
[0054] In addition, it can be seen from the above content that the test seat clamp 100 is provided with an elastic member 140 so that it has a tendency to move from a position of releasing the chip test seat to a position of clamping the chip test seat. Therefore, when installing the elastic member 140, on the basis of the above-mentioned mating bevel 113, a first mounting hole 124 can be provided on the first clamping jaw 120, and a second mounting hole 114 is opened on the mating bevel 113. The first mounting hole 124 and the second mounting hole 114 are both matched with the elastic member 140, thereby simplifying the installation of the elastic member 140 and enabling the setting of the elastic member 140 to be combined with the setting of the mating bevel 113 to improve its operational flexibility.
[0055] In order to facilitate operation and movement of the chip test socket during use, the test socket clamper 100 further includes an operating handle 150 connected to the clamping body 110 .
[0056] Based on the above, please refer to Figures 1-8 This embodiment also provides a chip testing device, which includes a chip testing carrier and the above-mentioned test socket clamp 100; the chip testing carrier is used to load multiple chip test sockets, and the test socket clamp 100 is used to clamp the chip test sockets.
[0057] Among them, the chip testing device can conveniently install multiple chip test sockets into the chip test carrier, or remove the chip test sockets from the chip test carrier by adopting the above-mentioned test socket clamp 100; and its operation is simple and convenient, which can not only reduce the workload of the operator, but also reduce the difficulty of operation, and can protect the chip test sockets and operators.
[0058] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Those skilled in the art will readily appreciate that various modifications and variations are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.
Claims
1. A test socket clamp, characterized by: The test seat clamp includes a clamping body, a first clamping jaw and a second clamping jaw; The first clamping jaw and the second clamping jaw are both connected to the clamping body. The first clamping jaw and the second clamping jaw are connected to opposite sides of the clamping body. There is a gap between the first clamping jaw and the second clamping jaw. A first hooking portion is configured on a side of the first clamping jaw facing the second clamping jaw, and a second hooking portion is configured on a side of the second clamping jaw facing the first clamping jaw, so as to jointly clamp the chip test socket. Wherein, at least one of the first clamping jaw and the second clamping jaw is movably connected to the clamping body and has a position for clamping the chip test socket and a position for releasing the chip test socket.
2. The test socket clamp according to claim 1, characterized in that: The first clamping jaw and the second clamping jaw are respectively provided with a first clamping portion and a second clamping portion, and the first clamping portion and the second clamping portion are both used to clamp the lower portion of the chip test seat; Wherein, the first hooking portion is located at an end of the first clamping portion away from the clamping body, and the second hooking portion is located at an end of the second clamping portion away from the clamping body.
3. The test socket clamp according to claim 2, characterized in that: The first hooking portion includes two first hooking platforms protruding toward the second clamping jaw, and the two first hooking platforms are arranged at intervals; the second hooking portion includes two second hooking platforms protruding toward the first clamping jaw, and the two second hooking platforms are arranged at intervals.
4. The test socket clamp according to claim 2, wherein: The bottom of the clamping body is provided with a positioning groove for cooperating with the chip test seat.
5. The test socket clamp according to claim 1, characterized in that: The first clamping jaw is rotatably connected to the clamping body.
6. The test socket clamp according to claim 5, characterized in that: The test socket clamper further includes an elastic member, which is disposed at a rotational connection between the first clamping jaw and the clamping body and is used to enable the first clamping jaw to move from a position for releasing the chip test socket to a position for clamping the chip test socket.
7. The test socket clamp according to claim 6, characterized in that: A side of the clamping body where the first clamping jaw is mounted is provided with a matching flat surface and a matching inclined surface; When the first clamp is in a position to clamp the chip test socket, the first clamp is in contact with the matching plane; when the first clamp is in a position to release the chip test socket, the first clamp is in contact with the matching inclined surface.
8. The test socket clamp according to claim 7, characterized in that: The first clamping jaw is provided with a first mounting hole, the matching inclined surface is provided with a second mounting hole, and both the first mounting hole and the second mounting hole are matched with the elastic member.
9. The test socket gripper according to any one of claims 1 to 8, characterized in that: The test socket clamp further includes an operating handle connected to the clamping body.
10. A chip testing device, characterized in that: The chip testing device comprises a chip testing carrier and a test socket gripper according to any one of claims 1 to 9; The chip test carrier is used for loading a plurality of the chip test sockets, and the test socket clamper is used for clamping the chip test sockets.