Optical testing device for detector

Abstract

The utility model relates to an optical testing device for a detector, which comprises a bottom plate, a base and a detector fixing assembly, the bottom plate comprises a base connecting part and a limiting part, the base connecting part is used for being rotatably connected with the base, and the limiting part is used for limiting the rotation angle of the base. The base is detachably arranged on the bottom plate and can rotate on the bottom plate; the base comprises a first bottom plate connecting part, a second bottom plate connecting part, a first limiting matching part and a second limiting matching part; wherein the first bottom plate connecting part and the second bottom plate connecting part are located on two planes perpendicular to each other, and the base can be taken down to change the bottom plate connecting part matched with the base connecting part. The detector fixing assembly is arranged on the base and is used for fixing a detected detector; when the base rotates, the detector fixing assembly rotates along with the base to drive the detector to swing. The operation is simple, the test process is simplified, and the production efficiency is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to the field of detector test, especially a kind of detector optical testing device. BACKGROUND

[0002] In the development process of infrared detector and other detectors, in order to test the optical performance of the detector, the detector needs to be radiated by black body to form an image, so as to test the uniformity of the detector imaging. Meanwhile, the optical uniformity analysis is also needed before the delivery of the components produced in batches. According to the customer's requirements, the optical uniformity at different angles of the relative black body light source needs to be tested in the test process, which requires rotating the detector assembly, including the horizontal direction and the vertical direction as well as different angles. The production form of the detector assembly is batch production, and the optical uniformity test task is heavy. The current auxiliary test device cannot meet the requirements of rotating angle, and the operation is troublesome, the single detector test period is long, which is not conducive to the batch production of components and brings a huge task to the operator. UTILITY MODEL CONTENTS

[0003] The utility model aims at providing a kind of detector optical testing device to solve the problem of optical uniformity test operation troublesome, single detector test period is long, which is not conducive to the batch production of components and brings a huge task to the operator.

[0004] The utility model discloses a kind of detector optical testing device, including:

[0005] Base plate, pedestal and detector fixed assembly;

[0006] The base plate includes pedestal connecting portion and limiting portion, the pedestal connecting portion is used to rotatably connect the pedestal, and the limiting portion is used to limit the rotating angle of the pedestal;

[0007] The pedestal is used to be detachably arranged on the base plate and can rotate on the base plate;The pedestal includes first base plate connecting portion, second base plate connecting portion, first limiting cooperation portion and second limiting cooperation portion;Wherein, the first base plate connecting portion and the second base plate connecting portion are located on two perpendicular planes, the pedestal can be taken off to change the base plate connecting portion cooperating with the pedestal connecting portion;The first base plate connecting portion is used to rotatably connect with the pedestal connecting portion, when the first base plate connecting portion cooperates with the pedestal connecting portion, the first limiting cooperation portion cooperates with the limiting portion to realize limiting;The second base plate connecting portion is used to rotatably connect with the pedestal connecting portion, when the second base plate connecting portion cooperates with the pedestal connecting portion, the second limiting cooperation portion cooperates with the limiting portion to realize limiting;

[0008] The probe fixing assembly is arranged on the base and used for fixing the measured probe; when the base rotates, the probe fixing assembly rotates along with the base to drive the probe to swing.

[0009] Optionally, the base connecting part comprises a first connecting hole, the first bottom plate connecting part comprises a second connecting hole, the second bottom plate connecting part comprises a third connecting hole, and the probe optical testing device further comprises a connecting column; the connecting column connects the first connecting hole with the second connecting hole or the third connecting hole, and serves as a rotation shaft of the base on the bottom plate.

[0010] Optionally, the limiting part comprises a blocking structure, and the first limiting fitting part and the second limiting fitting part respectively comprise a protruding structure.

[0011] When the base is arranged on the bottom plate, the blocking structure is located beside the base, and the protruding structure enters the range of the blocking structure and is blocked by the blocking structure to limit the rotation range of the base.

[0012] Optionally, the blocking structure comprises at least two insertion grooves and blocking pieces.

[0013] The insertion grooves are arranged on the bottom plate and used for insertion and fixation of the blocking pieces, and the at least two insertion grooves have a spacing therebetween.

[0014] The protruding structure is located in the spacing region between the at least two insertion grooves and is blocked by the blocking pieces on both sides to limit the rotation range of the base.

[0015] Optionally, the bottom plate is provided with an angle mark, and the angle mark is located in the spacing region between the at least two insertion grooves.

[0016] Optionally, the base further comprises a fixing assembly connecting hole.

[0017] The probe fixing assembly comprises a probe fixing support and a support connecting column, the support connecting column is connected with the probe fixing support, and the support connecting column at least partially enters the fixing assembly connecting hole; the support connecting column can move along the axial direction of the fixing assembly connecting hole to adjust the position of the probe fixing assembly.

[0018] Optionally, the support connecting column is provided with a position mark.

[0019] Optionally, the base further comprises an assembly fixing hole and a fixing piece, the assembly fixing hole is perpendicular to the fixing assembly connecting hole and communicates with the fixing assembly connecting hole; the fixing piece is inserted into the assembly fixing hole and reaches the position of the support connecting column to fix the position of the support connecting column.

[0020] Optionally, the probe fixing support comprises a support base, a clamp and a lens mounting structure.

[0021] The support base is arranged on the support connecting column and can move axially along the fixing assembly connecting hole of the support connecting column.

[0022] The clamp is detachably arranged on the support base and used for fixing the measured probe on the support base.

[0023] The lens mounting structure is arranged on the side of the clamp away from the base and used for mounting the outer lens of the measured probe.

[0024] Optionally, when the first bottom plate connecting part and the second bottom plate connecting part are connected with the base connecting part, the axial position of the probe fixed on the probe optical testing device is unchanged.

[0025] The probe optical testing device can rotate the probe in different angular directions through the rotation of the base on the bottom plate. The probe can be rotated in another direction only by taking down the base, rotating it by 90° and then mounting it on the bottom plate. The rotation direction of the probe can be accurately adjusted without disassembling the probe multiple times, and multiple angle tests can be completed. The operation is simple, which is beneficial to simplify the testing process and accelerate the production efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0026] Figure 1 Fig. 1 is a structural schematic view of the probe optical testing device of the present embodiment;

[0027] Figure 2 Fig. 2 is a schematic view of fixing the probe of the probe optical testing device of the present embodiment;

[0028] BRIEF DESCRIPTION OF DRAWINGS

[0029] 1-bottom plate; 11-obstruction structure; 111-insertion slot; 112-obstruction piece; 12-angle mark; 2-base; 21-second connecting hole; 22-third connecting hole; 23-protruding structure; 24-assembly fixing hole; 3-probe fixing assembly; 311-support base; 312-clamp; 313-lens mounting structure; 314-nut; 315-screw rod; 32-support connecting column; 4-probe. DETAILED DESCRIPTION

[0030] In order to make the person skilled in the art better understand the technical scheme of the present application, the technical scheme in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by the person skilled in the art without creative labor should belong to the scope of protection of the present application.

[0031] It should be noted that the terms "first", "second" and the like in the description and claims of the present application and the above drawings are used to distinguish similar objects, and do not necessarily have to be used to describe a specific order or sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device including a series of steps or units does not have to be limited to only those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0032] Embodiment one:

[0033] The present embodiment provides a kind of detector optical testing device, including but not limited to bottom plate 1, pedestal 2 and detector fixed assembly 3.

[0034] The bottom plate 1 includes pedestal 2 connecting portion and limiting portion, and the pedestal 2 connecting portion is used to rotatably connect the pedestal 2, and the limiting portion is used to limit the rotation angle of the pedestal 2;

[0035] The pedestal 2 is used to be detachably arranged on the bottom plate 1, and can rotate on the bottom plate 1;The pedestal 2 includes first bottom plate 1 connecting portion, second bottom plate 1 connecting portion, first limiting cooperation part and second limiting cooperation part;Wherein, the first bottom plate 1 connecting portion and the second bottom plate 1 connecting portion are located on two perpendicular planes, and the pedestal 2 can be taken off to change the bottom plate 1 connecting portion cooperating with the pedestal 2 connecting portion;The first bottom plate 1 connecting portion is used to rotatably connect with the pedestal 2 connecting portion, when the first bottom plate 1 connecting portion cooperates with the pedestal 2 connecting portion, the first limiting cooperation part cooperates with the limiting portion to realize limiting;The second bottom plate 1 connecting portion is used to rotatably connect with the pedestal 2 connecting portion, when the second bottom plate 1 connecting portion cooperates with the pedestal 2 connecting portion, the second limiting cooperation part cooperates with the limiting portion to realize limiting;

[0036] The detector fixed assembly 3 is arranged on the pedestal 2, and is used to fix the detector 4 to be measured;When the pedestal 2 rotates, the detector fixed assembly 3 rotates with the pedestal 2 to drive the detector 4 to swing.

[0037] The detector optical testing device of the embodiment can rotate the detector 4 in different angular directions through the rotation of the base 2 on the bottom plate 1. Moreover, the detector 4 can be rotated in another direction only by taking off the base 2, rotating it by 90° and then mounting it on the bottom plate 1. For example, after the detector 4 is horizontally rotated by different angles for testing, the base 2 is taken off, rotated by 90° and then mounted on the bottom plate 1. Although the base 2 is still horizontally rotated, for the detector 4 arranged thereon, the actual angle tested at this time is the angle in the vertical direction before. It can be seen that the detector optical testing device of the embodiment can accurately adjust the rotation direction of the detector 4 without disassembling the detector 4 multiple times, and complete the testing of multiple angles. Its operation is simple, which is beneficial to simplify the testing process and speed up the production efficiency.

[0038] Referring to Figure 1 and Figure 2 , the detector optical testing device of the embodiment mainly comprises a bottom plate 1, a base 2 and a detector fixing assembly 3.

[0039] The bottom plate 1 is a platform for carrying the base 2 and the detector fixing assembly 3. It can be a flat plate, or the tabletop of a work platform such as a table can be directly used to form. When the bottom plate 1 is a first separate flat plate, it can be provided with a structure for fixing with a work platform such as a table.

[0040] The bottom plate 1 comprises a base 2 connecting portion and a limiting portion. The base 2 connecting portion is a structure for connecting with the base 2. In the embodiment, the connection between the base 2 and the bottom plate 1 is not completely fixed, and the base 2 can rotate on the bottom plate 1. Specifically, the base 2 cannot be translated or flipped on the bottom plate 1, but can be rotated on the plane of the bottom plate 1. Through the rotation of the base 2, the detector 4 on the detector fixing assembly 3 is swung to test different angles.

[0041] In some embodiments, the base 2 connecting portion comprises a first connecting hole. In the embodiment, only one first connecting hole in the base 2 connecting portion can complete the connection of the base 2 in different postures. Of course, the first bottom plate 1 connecting portion and the second bottom plate 1 connecting portion on the base 2 need to be made into the same structure so that the two bottom plate 1 connecting portions can cooperate with the first connecting hole. In actual application, a plurality of first connecting holes can be provided to realize the mounting of the base 2 in different positions. The number thereof is not limited in the embodiment.

[0042] To cooperate with the first connecting hole, the first bottom plate 1 connecting part and the second bottom plate 1 connecting part on the base 2 can include a first connecting column and a second connecting column matched with the first connecting hole, and the first connecting column or the second connecting column is inserted into the first connecting hole to realize the installation of the base 2. At the same time, the inserted first connecting column or second connecting column also serves as the rotating shaft of the base 2.

[0043] In some embodiments, the first bottom plate 1 connecting part includes a second connecting hole 21, the second bottom plate 1 connecting part includes a third connecting hole 22, and the probe optical testing device further includes a connecting column; the connecting column connects the first connecting hole with the second connecting hole 21 or the third connecting hole 22, and serves as the rotating shaft of the base 2 on the bottom plate 1. The connecting column in this embodiment is different from the foregoing examples, which is a separate connecting piece. When installing the base 2, the first connecting hole is aligned with the second connecting hole 21 or the third connecting hole 22, and the connecting column is inserted into the first connecting hole and the second connecting hole 21 (or the third connecting hole 22) at the same time, so as to connect the base 2 with the bottom plate 1. The connecting structures on the bottom plate 1 and the base 2 are both holes, which are easy to process, and the installation operation of inserting the separate connecting piece into the connecting hole is simple and convenient for technicians to perform tests.

[0044] In still other embodiments, a fixed connecting column can be formed on the bottom plate 1, and the connection is completed by inserting the connecting hole on the base 2, or the connection of the two can be realized by other rotatable connecting structures. The connecting column in the foregoing examples can be a pin or the like in actual application, and the connecting hole is a corresponding pin hole. Figure 1 and Figure 2 In the examples, the connecting hole is on the side opposite to the limiting cooperation part; during installation, the connecting column penetrates through the base 2 to reach the bottom plate 1 to realize the connection. In other examples, the connecting hole can also be on the same side as the limiting cooperation part, and during installation, the connecting column penetrates through the bottom plate 1 from the other side of the bottom plate 1 to reach the limiting cooperation part on the side close to the bottom plate 1 to realize the connection.

[0045] The limiting part of the bottom plate 1 is a structure for limiting the rotation range of the base 2, and in order to provide efficiency and ensure test accuracy, the maximum test angle can be limited by the limiting part.

[0046] In some embodiments, the limiting part comprises a blocking structure 11. The blocking structure 11 is a structure capable of contacting at least part of the structure on the base 2 to prevent the base 2 from continuing to rotate. Corresponding to the blocking structure 11, the first limiting matching part and the second limiting matching part on the base 2 can respectively comprise a protruding structure 23. The protruding structure 23 refers to a structure that is outwardly protruding from the surface of the base 2, which can be a structure integrated with the base 2 or can be detachable. The protruding structure 23 can enter the range of the blocking structure 11 and be blocked by the blocking structure 11 to limit the rotation range of the base 2. In some examples, the surface of the base 2 can be provided with a plug slot, and the protruding structure 23 can be a plug inserted into the plug slot, which protrudes from the surface of the base 2 and enters the range of the blocking structure 11.

[0047] When the base 2 is arranged on the bottom plate 1, the blocking structure 11 is located beside the base 2, and the protruding structure 23 enters the range of the blocking structure 11 and is blocked by the blocking structure 11 to limit the rotation range of the base 2. The blocking structure 11 can also be a baffle or any other fixed entity.

[0048] In some embodiments, the blocking structure 11 comprises at least two insertion slots 111 and blocking pieces 112. The insertion slots 111 are arranged on the bottom plate 1 for the blocking pieces 112 to be inserted and fixed, and the at least two insertion slots 111 have a spacing therebetween. The protruding structure 23 is located in the spacing region between the at least two insertion slots 111 and is blocked by the blocking pieces 112 on both sides to limit the rotation range of the base 2. By forming the insertion slots 111, the blocking pieces 112 can be installed on the bottom plate 1, so that the structure of the bottom plate 1 is simple and easier to manufacture.

[0049] For example, the spacing region between the two insertion slots 111 can be within a range of plus or minus 15°. In actual application, the specific angle range can be adjusted as needed. In other embodiments, the number of insertion slots 111 can be more, such as 4, 6, etc. By arranging multiple groups of insertion slots 111, different angle ranges can be corresponded respectively, the blocking pieces 112 can be assembled into different groups of insertion slots 111, which can simply change the maximum test angle range, the versatility of the probe optical testing device is better, and the operation is simple; and this way only needs to add corresponding insertion slots 111, the manufacturing cost is low.

[0050] In order to facilitate the technician to test, in some embodiments, the bottom plate 1 is provided with an angle mark 12, which is located in the interval area between the at least two insertion slots 111. Since the protruding piece of the base 2 enters the interval area between the insertion slots 111, the angle mark 12 arranged in the interval area between the insertion slots 111 can make the protruding piece simultaneously as an angle indicating structure, which is beneficial for the technician to intuitively view the current angle value, and ensures the high efficiency and accuracy of the test.

[0051] The base 2 of the detector optical testing device is a structure for connecting the detector fixing assembly 3 to drive it to rotate. By mounting and connecting the detector fixing assembly 3 through the base 2, the posture and rotation of the detector fixing assembly 3 are more easily controlled. The shape of the base 2 can be arbitrary, and in the present embodiment, the base 2 can be a hexahedron, which is easy to process and has a stable posture when placed.

[0052] The first bottom plate 1 connecting part and the second bottom plate 1 connecting part of the base 2 are located on two perpendicular planes, which makes the connecting posture of the base 2 on the bottom plate 1 can be turned over 90°, so as to realize the angle swing of the detector 4 in two perpendicular directions without disassembling the detector 4. By turning over the base 2 to adjust the swing direction of the detector 4, it can ensure that each time of turning over is 90°, and its accuracy is more accurate than directly rotating the detector 4 itself to change its swing direction.

[0053] In some embodiments, when the first bottom plate 1 connecting part and the second bottom plate 1 connecting part are connected with the base 2 connecting part, the axial position of the detector 4 fixed on the detector optical testing device is unchanged. That is, after the base 2 is turned over 90°, the physical position of the detector 4 does not change, but the detector 4 itself is equivalent to rotating 90° around the axis. This can ensure the accuracy of the test, and there is no need to adjust the relative position between the detector 4 and the blackbody light source, and also simplifies the operation. When manufacturing the base 2, the positions of the first bottom plate 1 connecting part and the second bottom plate 1 connecting part can be determined through simple geometric calculation.

[0054] The first limiting cooperation part and the second limiting cooperation part are structures that cooperate with the limiting part on the bottom plate 1 in different postures of the base 2. The optional embodiments of the first limiting cooperation part and the second limiting cooperation part have been described above, and will not be repeated here.

[0055] The detector fixing assembly 3 is a structure for fixing the detector 4, which can be arranged on the base 2 and rotated with it, thereby driving the detector 4 fixed thereon to swing.

[0056] In some embodiments, the base 2 further comprises a fixing assembly connecting hole. The probe fixing assembly 3 comprises a probe 4 fixing bracket and a bracket connecting column 32, the bracket connecting column 32 is connected with the probe 4 fixing bracket, and the bracket connecting column 32 at least partially enters the fixing assembly connecting hole. The bracket connecting column 32 can move along the axial direction of the fixing assembly connecting hole to adjust the position of the probe fixing assembly 3, so as to control the distance between the probe 4 and the blackbody light source.

[0057] In some embodiments, the bracket connecting column 32 is provided with a position mark. The position mark can reflect the distance between the probe 4 and the blackbody light source. The part entering the fixing assembly connecting hole cannot be seen, and the technician can directly determine the distance between the probe 4 and the blackbody light source according to the position mark exposed at the opening of the fixing assembly connecting hole, so as to ensure the efficiency and accuracy of the test.

[0058] In some embodiments, the base 2 further comprises an assembly fixing hole 24 and a fixing member, the assembly fixing hole 24 is perpendicular to the fixing assembly connecting hole and communicates with the fixing assembly connecting hole. The fixing member is inserted into the assembly fixing hole 24 and reaches the position of the bracket connecting column 32 to fix the position of the bracket connecting column 32. The assembly fixing hole 24 and the fixing member can help to stably fix the probe fixing assembly 3 and the base 2, so that the probe fixing assembly 3 can more accurately follow the rotation of the base 2, and ensure the smoothness and accuracy of the test.

[0059] In some examples, the assembly fixing hole 24 can be a pin hole, and the fixing member can be a pin. The pin can enter the assembly fixing hole 24 and directly apply pressure to the bracket connecting column 32 to fix the position thereof. In some examples, a structure matched with the fixing member, such as a pin hole, can also be formed on the bracket connecting column 32, so that the pin is inserted to achieve more secure fixation.

[0060] As another example, the assembly fixing hole 24 can be a threaded hole, and the fixing member can be a screw. The screw can be fastened to apply pressure to the bracket connecting column 32 to fix the position thereof.

[0061] In some embodiments, the probe 4 fixing bracket comprises a bracket base 311, a clamp 312 and a lens mounting structure 313.

[0062] The bracket base 311 is arranged on the bracket connecting column 32 and can move along the axial direction of the fixing assembly connecting hole with the bracket connecting column 32. The clamp 312 is detachably arranged on the bracket base 311 and is used to fix the measured probe 4 on the bracket base 311.

[0063] The bracket base 311 and the clamping hoop 312 can form a shape matched with the detector 4, such as a semicircular arc, to better clamp the detector 4. For example, the bracket base 311 and the clamping hoop 312 can be fastened by the nut 314 and the screw 315. The bracket base 311 and the clamping hoop 312 are detachable to fix the detector 4, which is simple and convenient to operate.

[0064] In actual application, a plurality of specifications of the bracket base 311 and the clamping hoop 312 can be prepared to fix different models of the detector 4 and meet different test requirements.

[0065] The lens mounting structure 313 is arranged on the side of the clamping hoop 312 away from the base 2 and is used to mount the outer lens of the detector 4 to be tested. The lens mounting structure 313 can ensure the stability of the lens and the stable positional relationship between the lens and the detector 4.

[0066] In addition, although the exemplary embodiments have been described herein, the scope of the disclosure includes any and all embodiments having equivalent, modified, omitted, combined (for example, solutions in which various embodiments are crossed), adapted or changed features based on the disclosure. The examples described in the specification or during the implementation of the utility model are not limited and will be explained as non-exclusive.

[0067] The above description is intended to be illustrative and not restrictive. For example, the above examples (or one or more solutions thereof) can be used in combination with each other. For example, other embodiments can be used by those of ordinary skill in the art upon reading the above description.

[0068] The above description is intended to be illustrative and not restrictive. For example, the above examples (or one or more solutions thereof) can be used in combination with each other. For example, other embodiments can be used by those of ordinary skill in the art upon reading the above description. The preferred embodiments of the utility model have been described above, and the utility model is not limited to the above. Those skilled in the art can make various changes and modifications to the embodiments of the utility model. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. A detector optical testing device, characterized in that: Includes a base plate, a base, and a detector fixing assembly; The bottom plate includes a base connecting portion and a limiting portion, wherein the base connecting portion is used to rotatably connect to the base, and the limiting portion is used to limit the rotation angle of the base; The base is used to be detachably arranged on the bottom plate and can be rotated on the bottom plate; the base includes a first bottom plate connection part, a second bottom plate connection part, a first limiting matching part and a second limiting matching part; wherein the first bottom plate connection part and the second bottom plate connection part are located on two perpendicular planes, and the base can be removed to change the bottom plate connection part that cooperates with the base connection part; the first bottom plate connection part is used to be rotatably connected to the base connection part, and when the first bottom plate connection part cooperates with the base connection part, the first limiting matching part cooperates with the limiting part to achieve limiting; the second bottom plate connection part is used to be rotatably connected to the base connection part, and when the second bottom plate connection part cooperates with the base connection part, the second limiting matching part cooperates with the limiting part to achieve limiting; The detector fixing assembly is arranged on the base and is used to fix the detector to be measured; when the base rotates, the detector fixing assembly rotates along with the base to drive the detector to swing.

2. The detector optical testing device according to claim 1, wherein: The base connection part includes a first connection hole, the first bottom plate connection part includes a second connection hole, the second bottom plate connection part includes a third connection hole, and the detector optical testing device also includes a connecting column; the connecting column connects the first connection hole with the second connection hole or the third connection hole, and serves as a rotating axis for the base to rotate on the bottom plate.

3. The detector optical testing device according to claim 1, wherein: The limiting portion includes a blocking structure, and the first limiting matching portion and the second limiting matching portion each include a protruding structure; When the base is arranged on the bottom plate, the blocking structure is located beside the base, and the protruding structure enters the range of the blocking structure and is blocked by the blocking structure to limit the rotation range of the base.

4. The detector optical testing device according to claim 3, wherein: The blocking structure includes at least two insertion slots and a blocking member; The insertion groove is provided on the bottom plate for inserting and fixing the blocking member, and there is a gap between the at least two insertion grooves; The protruding structure is located in the interval area between the at least two insertion slots and is blocked by the blocking members on both sides to limit the rotation range of the base.

5. The detector optical testing device according to claim 4, wherein: An angle mark is provided on the bottom plate, and the angle mark is located in the interval area between the at least two insertion slots.

6. The detector optical testing device according to claim 1, wherein: The base further includes a fixing assembly connection hole; The detector fixing assembly includes a detector fixing bracket and a bracket connecting column, the bracket connecting column is connected to the detector fixing bracket, and the bracket connecting column at least partially enters the fixing assembly connecting hole; the bracket connecting column can move axially along the fixing assembly connecting hole to adjust the position of the detector fixing assembly.

7. The detector optical testing device according to claim 6, wherein: A position mark is provided on the bracket connecting column.

8. The detector optical testing device according to claim 6, wherein: The base also includes a component fixing hole and a fixing piece, wherein the component fixing hole is perpendicular to the fixing component connecting hole and communicates with the fixing component connecting hole; the fixing piece is inserted into the component fixing hole and reaches the position of the bracket connecting column to fix the position of the bracket connecting column.

9. The detector optical testing device according to claim 6, wherein: The detector fixing bracket includes a bracket base, a clamp and a lens mounting structure; The bracket base is arranged on the bracket connecting column and can move axially along the fixing assembly connecting hole along with the bracket connecting column; The clamp is detachably provided on the support base and is used to fix the detector to be tested on the support base; The lens mounting structure is arranged on a side of the clamp away from the base, and is used for mounting the outer lens of the detector to be measured.

10. The detector optical testing device according to any one of claims 1 to 9, characterized in that: When the first bottom plate connecting portion and the second bottom plate connecting portion are matched and connected with the base connecting portion, the axial position of the detector fixed on the detector optical testing device remains unchanged.

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