Tool applied to S parameter actual measurement
By designing a PCB board and elastic conductive needle structure suitable for S-parameter measurement tooling, efficient and automatic switching between GSG single-ended and GSSG differential data acquisition is achieved, solving the problems of low test accuracy and efficiency in existing technologies and improving the quality and reliability of chip testing.
Patent Information
- Application Number
- CN202422785204.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-15
- Publication Date
- 2025-10-21
- Estimated Expiration
- 2034-11-15
AI Technical Summary
In existing chip testing technology, there is a gap between S-parameter simulation and actual test results, which affects test quality and accuracy. In particular, it is difficult to meet PAM4 signal integrity and electromagnetic signal integrity requirements under high-frequency signal requirements.
A tooling for S-parameter measurement was designed, which includes first and second PCB boards, elastic conductive pins and a switching module. The elastic conductive pins are matched with the chip connection contacts, and the switching module is combined to realize automatic switching between GSG single-ended and GSSG differential data, reducing alignment operations and improving test efficiency and accuracy.
By reducing the number of alignment operations, the efficiency and quality of chip testing are improved, and test anomalies caused by unstable connections can be discovered in a timely manner, ensuring the accuracy of test results.
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Figure CN223461669U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The application relates to the technical field of chip testing devices, and particularly relates to an S parameter actual measurement tool. BACKGROUND
[0002] In the field of coaxial socket chip testing sockets, S parameters are usually simulated by HFSS software to obtain some simulation indexes such as S21, S11 and TDR. With the advent of PCIE5.0, 6.0 and even 7.0 bus protocols, the signal integrity requirement of PAM4 needs to be higher and higher, up to 224GHz. Meanwhile, with the global compilation of the standard framework protocol of 6G communication, the requirement of some radio frequency chips, microwave chips and millimeter wave chips for electromagnetic signal integrity is also higher and higher. The gap between the data simulated by mainstream tools such as HFSS and the data in the actual use process is enough to affect the chip testing plan work and the performance index distortion phenomenon, which is a frequent pain point in the field. As one of the core factors of chip testing, the testing socket has a crucial influence on the accuracy of chip testing data.
[0003] Therefore, an S parameter actual measurement tool is urgently needed to improve the testing quality. CONTENT OF THE UTILITY MODEL
[0004] The utility model mainly aims at the above problems, and provides an S parameter actual measurement tool, which aims to solve the technical problems in the background art.
[0005] To achieve the above purpose, the utility model provides an S parameter actual measurement tool, which comprises:
[0006] A first PCB board is connected with a first radio frequency terminal connector; a first battery connection contact point is arranged on the surface of the first PCB board; the first radio frequency terminal connector is electrically connected with the first battery connection contact point through a first conductive circuit arranged on the first PCB board;
[0007] A second PCB board is connected with a second radio frequency terminal connector; a second battery connection contact point is arranged on the surface of the second PCB board; the second radio frequency terminal connector is electrically connected with the second battery connection contact point through a second conductive circuit arranged on the second PCB board;
[0008] The connecting module is provided with elastic conductive pins extending from both ends of the connecting module body; the number of the elastic conductive pins is two groups, the arrangement of one group of the elastic conductive pins is defined to match the GSG single-end data acquisition wiring definition, and the arrangement of the other group of the elastic conductive pins is defined to match the GSSG differential data acquisition wiring definition; the first PCB board and the second PCB board are respectively arranged on the two side surfaces of the connecting module; the first battery connection contact and the second battery connection contact are respectively connected with two groups of the elastic conductive pins.
[0009] Further, a first coaxial cable is included, one end of the first coaxial cable is connected with the first radio frequency terminal connector or the second radio frequency terminal connector, and the other end is connected with a test machine or a vector network analyzer test interface.
[0010] Further, a second coaxial cable and a radio frequency terminal seat are included; one end of the second coaxial cable is connected with the radio frequency terminal seat; when one end of the first coaxial cable is connected with the first radio frequency terminal connector, the other end of the second coaxial cable is connected with the second radio frequency terminal connector; when one end of the first coaxial cable is connected with the second radio frequency terminal connector, the other end of the second coaxial cable is connected with the first radio frequency terminal connector.
[0011] Further, the first radio frequency terminal connector and the second radio frequency terminal connector each include an SMA connector, one end of the SMA connector is provided with a connecting portion for connecting a PCB board body.
[0012] Further, the connecting portion is two groups of clamping plates arranged along the end of the SMA connector, and the spacing between the two groups of clamping plates corresponds to the thickness of the PCB board body.
[0013] Further, each group of clamping plates has two clamping plates, and the clamping plates are provided with screw holes; the clamping plates and the PCB board are connected by screwing the screw holes.
[0014] Further, the surface of the connecting module is provided with an alignment part, and the first PCB board and the second PCB board are provided with an alignment part corresponding to the alignment part.
[0015] Further, the first PCB board, the second PCB board, and the connecting module are provided with screw holes, and the three are connected by screwing the screw holes.
[0016] Further, the end surface of the first PCB board and the second PCB board, which is not connected with the connecting module, is provided with a supporting pad.
[0017] Further, a switching module is included, which is built in the connection module or between the S-parameter measurement tool and the vector network analyzer test interface connection line; the switching module is used to control the switching of the GSG single-end data acquisition connection line or the GSSG differential data acquisition connection line and the vector network analyzer.
[0018] Compared with the prior art, the S-parameter measurement tool provided by the application can connect the RF head terminal through the first RF terminal connector and connect the special test machine or the vector network analyzer test interface through the second RF terminal connector. Under the connection and distribution of the two sets of elastic conductive needle structures of the connection module, the switching module built in the special test machine can take turns to collect and test the GSG single-end data and the GSSG differential data without lifting the RF head terminal, thereby reducing the number of times of aligning the RF head terminal and the chip collection point by the operator. After the two test data results are obtained, the test results can be compared with the theoretical test results to determine whether the test results are normal. If both of the test results are not normal, it can be immediately determined whether the test abnormality is caused by unstable connection. Unlike the traditional test, the abnormal result needs to be re-aligned multiple times. BRIEF DESCRIPTION OF DRAWINGS
[0019] Figure 1 A second coaxial cable, an RF terminal seat and a chip clamp structure schematic diagram of the S-parameter measurement tool.
[0020] Figure 2 A chip clamp one-end face test point distribution structure schematic diagram of the S-parameter measurement tool.
[0021] Figure 3 A chip clamp other-end face test point distribution structure schematic diagram of the S-parameter measurement tool.
[0022] Figure 4 A vector network analyzer test data diagram.
[0023] Figure 5 A structure schematic diagram of the S-parameter measurement tool.
[0024] Figure 6 A structure exploded schematic diagram of the S-parameter measurement tool.
[0025] Figure 7 A first PCB board and a second PCB board structure exploded schematic diagram of the S-parameter measurement tool.
[0026] Figure 8 A connection module structure schematic diagram of the S-parameter measurement tool.
[0027] The reference signs shown in the figure: 1, first PCB board; 110, first battery cell connecting contact; 120, first conductive circuit; 130, alignment part; 2, first radio frequency terminal connector; 210, SMA connector; 220, clamp plate; 221, screw hole; 3, second PCB board; 310, second battery cell connecting contact; 320, second conductive circuit; 330, threaded hole; 4, second radio frequency terminal connector; 5, connecting module; 510, alignment part; 6, elastic conductive needle; 7, second coaxial cable; 8, radio frequency terminal seat; 9, screw; 10, supporting cushion block; 11, chip clamp; 1101, test point. DETAILED DESCRIPTION
[0028] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the present application. It can be understood that the drawings are only provided for reference and illustration, and are not used to limit the present application. The connection relationship shown in the drawings is only for the purpose of clear description, and does not limit the connection mode.
[0029] It should be noted that when a component is considered to be "connected" to another component, it can be directly connected to the other component, or a middle component can exist at the same time. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which the present application belongs. It should also be noted that, unless otherwise specified and limited, the terms "mounting", "connection", "connection" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or integrally connected; it can be mechanically connected, or it can be electrically connected, or it can be the communication between two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances. The terms used in the specification of the present application are only for the purpose of describing the specific embodiments, and are not intended to limit the present application.
[0030] It also needs to be explained that in the description of the utility model, the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the utility model and simplifying the description, and do not indicate or imply that the indicated device or element must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the utility model. In addition, the terms "first", "second", "third" are only for the purpose of description, and cannot be understood as indicating or implying relative importance.
[0031] Please refer to Figure 1 - Figure 8 The embodiment provides a kind of applied to S parameter real measurement tooling, comprising:
[0032] First PCB board 1, the first PCB board 1 is connected with first radio frequency terminal connector 2;The first PCB board 1 surface is equipped with first electric core connection contact 110;First radio frequency terminal connector 2 with the first electric core connection contact 110 is electrically connected by the first conductive circuit 120 of the first PCB board 1 being equipped with;
[0033] Second PCB board 3, the second PCB board 3 is connected with second radio frequency terminal connector 4;The second PCB board 3 surface is equipped with second electric core connection contact 310;Second radio frequency terminal connector 4 with the second electric core connection contact 310 is electrically connected by the second conductive circuit 320 of the second PCB board 3 being equipped with;
[0034] Connecting module 5, the connecting module 5 is equipped with two ends elastic conductive needle 6 that stretch out the block of the connecting module 5;The number of the elastic conductive needle 6 is two groups, and the arrangement of one group of the elastic conductive needle 6 is defined with GSG single-end data acquisition wiring definition matching;The arrangement of another group of the elastic conductive needle 6 is defined with GSSG differential data acquisition wiring definition matching;The first PCB board 1, second PCB board 3 are respectively arranged in the two side surfaces of the connecting module 5;The first electric core connection contact 110, second electric core connection contact 310 are respectively connected with two groups of the elastic conductive needle 6.
[0035] In the prior art, two RF head terminals need to be assembled to lock two output cables of a network analyzer, two output cables, two RF head terminals, one for collecting GSG single-end data and one for collecting GSSG differential data collection wiring, which means that two RF head terminals need to be connected to the same collection point of the tested chip in turn, and two data are collected respectively for testing. However, when connecting the collection point of the tested chip, the operator usually holds the RF head terminal, aligns and presses it against the chip, and needs to additionally ensure that the test end fully contacts the chip collection point. When the collection point has multiple groups, it means that the RF head terminal needs to be replaced multiple times, and each replacement needs to be re-aligned, which is low in efficiency and difficult to ensure the test quality.
[0036] However, through the application of the S parameter measurement tool provided in the present application, the first RF terminal connector 2 is connected to the RF head terminal, and the second RF terminal connector 4 is connected to the test interface of the special test machine or the vector network analyzer. Under the connection and distribution of the connection module 5 with the structure of two elastic conductive needles 6, the built-in switching module of the special test machine can collect and test GSG single-end data and GSSG differential data in turn without lifting the RF head terminal, which reduces the number of times of aligning the RF head terminal with the chip collection point by the operator. When the two test data results are obtained, they can be compared with the theoretical test results to determine whether the test results are normal. If both are not normal, it can be immediately deduced whether the test abnormality is caused by unstable connection. Unlike traditional tests, the test needs to be re-aligned multiple times when abnormal results occur.
[0037] Therefore, the S parameter measurement tool can improve the test efficiency and test quality of the chip.
[0038] In some embodiments, the GSG single-end data collection wiring and the GSSG differential data collection wiring share some defined wiring lines, such as ground lines.
[0039] The first coaxial cable (not shown) is connected to the first RF terminal connector 2 or the second RF terminal connector 4 at one end and connected to the test machine or the vector network analyzer test interface at the other end.
[0040] Please refer to Figure 1 , including a second coaxial cable 7 and an RF terminal seat 8; one end of the second coaxial cable 7 is connected to the RF terminal seat 8; when one end of the first coaxial cable is connected to the first RF terminal connector 2, the other end of the second coaxial cable 7 is connected to the second RF terminal connector 4; when one end of the first coaxial cable is connected to the second RF terminal connector 4, the other end of the second coaxial cable 7 is connected to the first RF terminal connector 2.
[0041] In some embodiments, the radio frequency terminal seat 8 is as big as a seal, which can be pressed to the test point 1101 of the chip clamp 11. There are 6 test points 1101 on the chip clamp 11, 3 on the front and 3 on the back. In the case of accurate alignment and stable connection of the radio frequency terminal seat 8 to the test point 1101, the application of the S parameter measurement tool only needs to be aligned with the test point 1101 for 6 times. However, the traditional test scheme needs to be aligned for 12 times.
[0042] Please refer to Figure 6 and Figure 7 , the first radio frequency terminal connector 2 and the second radio frequency terminal connector 4 each include an SMA connector 210, one end of which is provided with a connecting portion for connecting the PCB board body.
[0043] The use of SMA connector 210, a standardized structure, facilitates procurement and interface connection with existing equipment.
[0044] Please refer to Figure 7 , the connecting portion is two sets of clamping plates 220 distributed along the end of the SMA connector 210, and the distance between the two sets of clamping plates 220 corresponds to the thickness of the PCB board body.
[0045] Please refer to Figure 6 and Figure 7 Each set of clamping plates has two clamping plates 220, which are provided with screw holes 221; the clamping plates and the PCB board are connected by screwing the screw 9 through the screw holes.
[0046] Please refer to Figure 7 and Figure 8 , the surface of the connecting module 5 is provided with an alignment part 510, and the first PCB board 1 and the second PCB board 3 are provided with an alignment part 130 corresponding to the alignment part 510.
[0047] In some embodiments, the alignment part 510 is a pin with a rounded or beveled end, and the alignment part 130 is a guide hole corresponding to the pin.
[0048] It is easy to think that the alignment part 130 can be a pin and the alignment part 510 can be a guide hole.
[0049] By setting such an alignment structure, the first cell connection contact 110 and the second cell connection contact 310 can be accurately connected with the two sets of elastic conductive pins 6, respectively.
[0050] Please refer to Figure 7 , the first PCB board 1, the second PCB board 3 and the connecting module 5 are provided with screw holes 330, and the three are connected by screwing the screw through the screw holes 330.
[0051] Please refer to Figure 5 and Figure 6 The end surface of the first PCB plate 1 and the second PCB plate 3, which is not connected with the connecting module 5, is provided with a supporting pad 10.
[0052] By arranging the supporting pad 10, the nut of the screw is prevented from pressing the PCB plate body, thereby avoiding the fracture of the plate body.
[0053] In some embodiments, a switching module (not shown) is arranged in the connecting module 5 or between the application interface of the S parameter measurement tool and the vector network analyzer test interface connection line; the switching module is used for controlling the switching of the GSG single-end data acquisition connection line or the GSSG differential data acquisition connection line and the vector network analyzer.
[0054] The conventional vector network analyzer corresponds to two interfaces of GSG single-end data acquisition and GSSG differential data acquisition, respectively. Therefore, a switching module needs to be newly arranged. The specially configured tester has a built-in switching module and can be directly used with the present measurement tool. The switching module realizes the switching of the line and can be realized by using a single-chip microcomputer or other existing technologies.
[0055] After the present measurement tool is connected with the network analyzer, the network analyzer is successfully connected with the chip test point, and the network analyzer displays the corresponding data, as shown in the drawing. Figure 4 The test data of the MCW measurement below the frequency of 56GHz is PAM4 modulation >112Gbps; the network analyzer sets the parameters of the required test pattern in advance, such as impedance, return loss, differential loss, etc.
[0056] In the specification and claims of the present application, the words "comprise / contain" and the words "have / include" and their variants are used to specify the presence of the stated features, values, steps or components, but do not exclude the presence or addition of one or more other features, values, steps, components or combinations thereof.
[0057] Some features of the present application are described in different embodiments for the sake of clarity, however, these features can also be combined in a single embodiment. Conversely, some features of the present application are described in a single embodiment for the sake of brevity, however, these features can also be described in different embodiments, alone or in any suitable combination.
[0058] The above is only the preferred embodiment of the present application, and does not limit the present application, any modification, equivalent replacement and improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims
1. An S-parameter measurement fixture, comprising: The utility model relates to a kind of radio frequency terminal connector, including: First PCB board, first radio frequency terminal connector is connected with; First PCB board surface is equipped with first electric core connection contact point;First radio frequency terminal connector is electrically connected with first electric core connection contact point by first conductive circuit arranged on first PCB board; Second PCB board, second radio frequency terminal connector is connected with; Second PCB board surface is equipped with second electric core connection contact point;Second radio frequency terminal connector is electrically connected with second electric core connection contact point by second conductive circuit arranged on second PCB board; Connecting module, the elastic conductive needle of two ends of the connecting module is stretched out from the module block body;The number of the elastic conductive needle is two groups, and the arrangement definition of one group of the elastic conductive needle is defined to match with GSG single-end data acquisition wiring definition;The arrangement definition of another group of the elastic conductive needle is defined to match with GSSG differential data acquisition wiring definition;First PCB board, second PCB board are respectively arranged on the two side surfaces of the connecting module;First electric core connection contact point, second electric core connection contact point are respectively connected with two groups of the elastic conductive needle.
2. The S-parameter measurement tooling of claim 1, wherein, Including first coaxial cable, one end of the first coaxial cable is connected with the first radio frequency terminal connector or second radio frequency terminal connector, and the other end is connected with test machine or vector network analyzer test interface.
3. The S-parameter measurement tooling of claim 2, wherein, Including second coaxial cable, radio frequency terminal seat;One end of the second coaxial cable is connected with the radio frequency terminal seat;When one end of the first coaxial cable is connected with the first radio frequency terminal connector, the other end of the second coaxial cable is connected with the second radio frequency terminal connector;When one end of the first coaxial cable is connected with the second radio frequency terminal connector, the other end of the second coaxial cable is connected with the first radio frequency terminal connector.
4. The S-parameter measurement tooling of claim 1, wherein, The first radio frequency terminal connector and the second radio frequency terminal connector both include SMA connector, and the SMA connector is equipped with connecting portion for connecting PCB board body at one end.
5. The S-parameter measurement fixture of claim 4, wherein, The connecting portion is two groups of clamps distributed along the end of the SMA connector, and the spacing between the two groups of clamps corresponds to the thickness of the PCB board body.
6. The S-parameter measurement fixture of claim 5, wherein, Each group of clamps has two clamps, and the clamps are provided with screw holes;The clamps and the PCB board are connected by screwing the screw holes.
7. The S-parameter measurement fixture of claim 1, wherein, The surface of the connecting module is provided with an alignment part, and the first PCB board and the second PCB board are provided with an alignment part corresponding to the alignment part.
8. The S-parameter measurement fixture of claim 1, wherein, The first PCB board, the second PCB board and the connecting module are provided with screw holes, and the three are connected by screwing the screw holes.
9. The S-parameter measurement fixture of claim 1, wherein, The end surface of the first PCB board and the second PCB board, which is not connected with the connecting module, is provided with a supporting pad.