Multi-probe non-contact glossmeter

Abstract

The utility model belongs to the field of a glossmeter, and particularly relates to a multi-probe non-contact glossmeter. Comprising a host and a plurality of distributed detection probes, the host comprises a mainboard used for uniformly processing glossiness data and executing calibration; the communication module is welded on the mainboard and is used for realizing synchronous interaction with the plurality of detection probes; the detection probe comprises an emitting electrode used for emitting a detection light beam to a detected surface; the receiving electrode is used for receiving the reflected light signal; the detection probe is connected with the host through the probe wire harness to form a distributed detection network, and a non-contact detection distance is formed between the probe and a detected surface. According to the utility model, the host can process multi-channel data in a centralized manner; the probe emitting electrode emits light beams to a detected surface, reflected light is converted into signals by the receiving electrode, physical contact is replaced by an optical path, abrasion is eliminated, the detection distance is expanded, and an industrial protective shell is adopted as a whole to improve environmental adaptability.

Description

Technical Field

[0001] This utility model belongs to the field of gloss meters, specifically a multi-probe non-contact gloss meter. Background Technology

[0002] Most gloss meters currently on the market adopt an integrated design of control module and detection probe, that is, the core control unit of the instrument (including data processing circuit, display screen, operation buttons, etc.) and the probe that collects gloss signals are integrated into the same housing. Although this integrated design can ensure the overall compactness and ease of operation of the equipment, its overall size is relatively large, and it usually requires manual hand-holding or placement on a fixed platform for use.

[0003] In industrial production line applications, this structure has significant limitations: First, it has poor installation adaptability, making it difficult to directly integrate into specific locations on production line equipment. It occupies a large space and is easily affected by equipment vibration or displacement, leading to decreased detection stability. Second, existing gloss meters are used offline. During testing, a portion of the product sample is removed from the production line, laid flat on a table, and the inspector holds the gloss meter and presses the inspection head flat onto the product for testing. The probe measurement port must be in close contact with the sample surface (contact distance ≤1mm), requiring additional mechanical support structures and potentially damaging the product surface due to contact friction, especially for soft materials such as films and coatings. Furthermore, the probe itself is prone to wear, shortening its lifespan. Third, the single-probe architecture is costly. If simultaneous testing of multiple points on the production line is required, multiple independent devices are needed, leading to a surge in hardware costs and scattered data that is difficult to centrally analyze. Finally, it lacks environmental adaptability, has a low equipment protection level, and experiences high failure rates and poor long-term operational stability in the dusty, humid, and continuously vibrating environments common in industrial workshops. These shortcomings severely restrict the efficient application of gloss meters in industrial scenarios and urgently need to be addressed. Utility Model Content

[0004] To address the above issues, this invention provides a multi-probe non-contact gloss meter that uses distributed probes separated from the main unit, allowing the main unit to centrally process multi-channel data. The probe emitter emits a light beam onto the surface being measured, and the reflected light is converted into a signal by the receiver. This optical path replaces physical contact, eliminating wear and extending the detection distance. The entire unit is equipped with an industrial protective shell to enhance environmental adaptability.

[0005] To achieve the above objectives, the present invention specifically employs the following technical means:

[0006] The host and several detection probes are configured in a distributed manner;

[0007] The host includes: a motherboard for uniformly processing gloss data and performing calibration; and a communication module soldered onto the motherboard for synchronous interaction with several detection probes.

[0008] The detection probe includes: an emitter for emitting a detection beam onto the surface being measured; and a receiver for receiving reflected light signals.

[0009] The detection probe is connected to the host via a probe harness to form a distributed detection network, and the probe is at a non-contact detection distance from the surface being measured.

[0010] Furthermore, the detection probe includes independent emitter and receiver electrodes, which are arranged at an angle to achieve a non-contact reflective optical path.

[0011] Furthermore, the emitter is provided with an emitter LED main board, an emitter LED baffle and an emitter lens, used to emit a focused detection beam onto the surface of the product under test;

[0012] The receiving electrode is equipped with a receiving electrode main board, a receiving electrode baffle and a receiving electrode lens, for receiving surface reflected light beams;

[0013] The optical axes of the transmitting lens and the receiving lens are at a preset angle, forming a non-contact reflective optical path.

[0014] Furthermore, an emitter housing and a receiver housing are respectively installed on the outside of the emitter and receiver.

[0015] Furthermore, the detection probe is provided with a connector at its tail, and the host is connected to the probe connector via the probe wiring harness.

[0016] Furthermore, the host is connected to a detection probe and controls multiple probes to collect data synchronously.

[0017] Furthermore, the main unit is equipped with a main unit cover, which includes an upper main unit cover and a lower main unit cover; the detection probe is equipped with a probe cover, which includes an upper probe cover and a lower probe cover; the joint between the main unit cover and the probe cover is provided with a sealing structure for overall dust and water protection.

[0018] Compared with the prior art, the present invention has the following beneficial technical effects:

[0019] Adopting a "one host, multiple probes" architecture, this solution reduces the cost of multi-point detection by distributing probes and the host. Compared to traditional single-probe devices, the hardware cost for the same detection point is reduced by 40%-60%. Taking 6 detection points as an example, the traditional solution requires 6 devices, while this solution only requires 1 host + 6 probes. At the same time, the host centrally processes data to eliminate system errors from multiple control units, and the detection repeatability error is ≤1GU, meeting the high-precision industrial requirements.

[0020] Non-contact testing (working distance > 1mm) is achieved through an adjustable focal length lens group and a 60°–120° included angle optical path, completely avoiding contact and friction between the probe and the product surface, increasing the pass rate of easily damaged products such as thin films and sprayed parts by 3%-5%, while extending the probe life from 1 year of traditional contact type to 3 years.

[0021] The industrial protective design, combined with a sealed structure and aluminum alloy shell, effectively resists dust, moisture and vibration environments, with a trouble-free operating time of over 12,000 hours and annual maintenance costs reduced by 60%. Attached Figure Description

[0022] Figure 1 This is a structural schematic diagram of a specific embodiment of the present invention;

[0023] Figure 2 This is a schematic diagram of the emitter and receiver of a specific embodiment of the present invention;

[0024] Figure 3 This is a schematic diagram of the detection process in a specific embodiment of this utility model;

[0025] Figure 4 This is a schematic diagram of the host structure of a specific embodiment of the present invention;

[0026] Figure 5 This is a schematic diagram of the detection probe structure of a specific embodiment of this utility model.

[0027] Numbers in the diagram:

[0028] 1. Main unit; 2. Probe harness; 3. Detection probe; 4. Main unit upper cover; 5. Main board; 6. Main unit power supply; 7. Main unit lower cover; 8. Probe upper cover; 9. Receiver; 10. Emitter; 11. Connector; 12. Probe lower cover; 13. Emitter LED main board; 14. Emitter LED baffle; 15. Emitter housing; 16. Emitter lens; 17. Receiver lens; 18. Receiver housing; 19. Receiver baffle; 20. Receiver main board; 21. Product under test; 22. Probe interface; 23. USB interface; 24. TCP / IP interface. Detailed Implementation

[0029] The following specific examples illustrate the implementation of this utility model. Those skilled in the art can easily understand other advantages and effects of this utility model from the content disclosed in this specification. This utility model can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this utility model. It should be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of this utility model. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0030] The accompanying drawings are for illustrative purposes only and are schematic diagrams, not actual pictures. They should not be construed as limiting the present invention. To better illustrate the embodiments of the present invention, some parts in the drawings may be omitted, enlarged, or reduced, and do not represent the actual product dimensions. It is understandable to those skilled in the art that some well-known structures and their descriptions are omitted in the drawings.

[0031] Please see Figure 1 , Figure 4 and Figure 5 This embodiment is applied to a wide-width copper foil production line, requiring real-time gloss detection at five key points on the surface of copper foil with a thickness ranging from 0.004 to 0.008 mm. The main unit 1 is fixed to the main unit's upper casing 4 and lower casing 7 using M4 screws. The internal main board 5, equipped with an ARM Cortex-M7 microprocessor, is fixed to the lower casing 7 via copper pillars. The main power supply 6 provides 24VDC and 5VDC via a terminal block connected to the main board 5. The communication module is soldered to the main board 5 and connects to five three-pair twisted-pair probe wire harnesses 2 through pre-drilled holes in the lower casing 7. The main unit 1 includes a probe interface 22, a USB interface 23, and a TCP / IP interface 24.

[0032] Please see Figure 2 and Figure 3The detection probe 3 is a slender structure measuring 86mm × 41mm × 31mm. The upper cover 8 and the lower cover 12 of the probe are connected by screws. The emitter 10 includes: an emitter LED main board 13 fixed inside the emitter housing 15, which is soldered with a 550nm wavelength LED and a constant current drive circuit; an emitter lens 16 with a focal length of 5mm and an emitter LED baffle 14 are mounted at the front end, which is used to filter out stray light; the receiver 9 includes: a receiver main board 20 fixed inside the receiver housing 18, which is equipped with a silicon photodiode; a receiver lens 17 and a receiver baffle 19 for limiting the receiving angle are mounted at the front end; the receiver lens 17 and the emitter lens 16 are coaxial and at an angle of 60°; the emitter 10 and the receiver 9 are assembled at an angle of 120 degrees. The connector 11 at the tail of the probe uses an M12 round plug and connects the emitter LED main board 13 and the receiver main board 20 through wires. An 8mm diameter corrugated tube is fitted externally, and waterproof adhesive is applied to the seams of the outer shell to achieve an IP65 protection rating.

[0033] Please see Figure 1 The main unit 1 is connected to the connectors 11 at the tail of five detection probes 3 via five probe harnesses 2, each 5m long. The probe harnesses 2 are fixed to the production line frame via wire grooves. The detection probes 3 are mounted with adjustable angle brackets via M3 threaded interfaces at the tail. The brackets can be adjusted from 0 to 30°. The vertical distance between the detection end and the copper foil surface (product 21 to be tested) is 5mm, which is suitable for the narrow space of the production line.

[0034] Please see Figure 4 After the AC 220V power supply of the host 1 is turned on, the motherboard 5 performs the initialization operation: the communication module sends a handshake signal to the detection probe 3, and the green indicator light lights up to confirm that the connection is normal; the detection frequency is set to 5 times per second, the material type is copper foil, and the gloss threshold range is 80 to 120 GU through the 10-inch touch screen.

[0035] Please see Figures 2 to 5 During testing: The host 1 sends a command to the emitter LED mainboard 13 via the probe harness 2. The constant current drive circuit controls the LED to emit a 60° parallel beam with a current accuracy of ±1mA. The beam intensity is 5000 lux and the wavelength is 550-550nm ±5nm. After being focused by the emitter lens 16, the beam illuminates the surface of the copper foil. The surface-reflected beam is focused by the receiver lens 17 and received by the silicon photodiode of the receiver mainboard 20, which converts it into a 0-5V analog electrical signal. The photodiode response time is 5 microseconds. After the signal is amplified by 100 times and filtered by a 1kHz cutoff frequency, the signal-to-noise ratio reaches 65dB. Finally, the signal is transmitted back to the host 1 via the probe harness 2.

[0036] The motherboard 5 uses a copper foil-specific algorithm optimized based on the national standard GB / T 9754 to calculate the gloss value. The result is displayed in real time with a precision of 0.1 GU and uploaded to the manufacturing execution system via the Ethernet interface. If the communication of a certain detection probe 3 is interrupted for more than 1 second, the motherboard 5 triggers a pop-up alarm on the display screen and starts a buzzer to indicate that the detection probe 3 is offline. The alarm message is an example of "detection probe 3 is offline". The time of the fault is also recorded.

[0037] Daily calibration procedure: Place the 60° standard gloss plate (gloss value 98 GU) 5 mm in front of the detection probe 3. The gloss value of the standard plate is 98 GU. The host 1 automatically compares the detected value with the standard value and corrects the algorithm coefficient. The correction amount does not exceed ±0.5 gloss units. Clean the surface of the emitter lens 16 and receiver lens 17 with anhydrous ethanol every month to ensure that the light transmittance is ≥95%.

[0038] This embodiment uses a solution of one host 1 and five detection probes 3, which reduces the hardware cost by 52% compared to the traditional five-unit integrated equipment. The cost of the probes is only 1 / 3 of that of the traditional equipment. The detection repeatability error does not exceed ±0.8GU, while the traditional equipment is 1.5GU. The installation and debugging time of a single probe is shortened to 8 minutes, while the traditional solution requires 35 minutes. It is also successfully adapted to the 150mm gap space of the production line, which fully meets the requirements of online copper foil inspection.

[0039] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited thereto. Various changes can be made within the scope of knowledge possessed by those skilled in the art without departing from the spirit of the present invention.

Claims

1. A multi-probe non-contact gloss meter, characterized in that, include: The host (1) and several detection probes (3) in a distributed configuration; The host (1) includes: a motherboard (5) for uniformly processing gloss data and performing calibration; and a communication module soldered onto the motherboard (5) for synchronous interaction with several detection probes (3). The detection probe (3) includes: an emitter (10) for emitting a detection beam onto the surface to be measured; The receiving electrode (9) is used to receive reflected light signals; The detection probe (3) is connected to the host (1) through the probe harness (2) to form a distributed detection network, and the probe is separated from the surface to be measured by a non-contact detection distance.

2. The multi-probe non-contact gloss meter according to claim 1, characterized in that: The detection probe (3) includes an independent emitter (10) and a receiver (9), which are set at an angle to achieve a non-contact reflective optical path.

3. The multi-probe non-contact gloss meter according to claim 2, characterized in that: The emitter (10) is provided with an emitter LED main board (13), an emitter LED baffle (14) and an emitter lens (16) for emitting a focused detection beam onto the surface of the product under test (21); The receiving electrode (9) is provided with a receiving electrode main board (20), a receiving electrode baffle (19) and a receiving electrode lens (17) for receiving surface reflected light beams; The optical axes of the transmitting lens (16) and the receiving lens (17) are at a preset angle to form a non-contact reflective optical path.

4. The multi-probe non-contact gloss meter according to claim 2, characterized in that: The emitter (10) and receiver (9) are respectively equipped with an emitter housing (15) and a receiver housing (18).

5. The multi-probe non-contact gloss meter according to claim 1, characterized in that: The detection probe (3) is provided with a connector (11) at its tail, and the host (1) is connected to the probe connector (11) through the probe harness (2).

6. The multi-probe non-contact gloss meter according to claim 1, characterized in that: The host (1) is connected to 1 to 6 detection probes (3) and controls the multiple probes to collect data synchronously.

7. The multi-probe non-contact gloss meter according to claim 1, characterized in that: The host (1) is equipped with a host housing, which includes an upper host housing (4) and a lower host housing (7); the detection probe (3) is equipped with a probe housing, which includes an upper probe housing (8) and a lower probe housing (12); the joint between the host housing and the probe housing is provided with a sealing structure for overall dust and water protection.

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