Micro-electronic component aging test socket

Abstract

The utility model discloses an aging test socket for microelectronic components, which relates to the technical field of aging test equipment and comprises an aging oven, a movable seat is arranged below the aging oven, and placing grooves are arranged in the middles of two sides of the movable seat. According to the utility model, the movable seat is arranged below the aging oven, the middle parts of the two sides of the movable seat are provided with the placing grooves, electronic components to be detected can be placed in the placing grooves, the fixed frame is arranged at the notch of the placing grooves, the two sides of the fixed frame are provided with the slots, the insertion plates are arranged in the slots, and one end of each insertion plate is provided with the pressing plate. The pressing block is arranged below the aging oven, and the pressing block and the pressing plate are matched to drive the insertion plate to move in the process that the movable seat drives the electronic component to ascend and enable the electronic component to enter the aging oven, so that the insertion plate clamps and fixes the electronic component; and the stability of the electronic component in the detection process is ensured in the process of quickly putting the electronic component into the aging oven.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of aging test equipment, especially relates to a microelectronic component aging test socket. BACKGROUND

[0002] The test box adopts fluorescent ultraviolet lamps as light sources, carries out accelerated weather resistance test on materials through simulating ultraviolet radiation and condensation in natural sunlight, so as to obtain the weather resistance of the materials. The UV ultraviolet aging test box can simulate the environmental conditions such as ultraviolet, rain, high temperature, high humidity, condensation and darkness in natural climate, combine these conditions into a cycle, and automatically execute the cycle times. However, the electronic components in the prior art are inconvenient to take out from the UV ultraviolet aging test box.

[0003] For example, a UV ultraviolet aging test box for testing electronic components, including the box, the box is internally provided with a storage plate, and the storage plate is formed with a plurality of third through holes, and the third through holes are distributed on the surface of the storage plate, the left and right sides of the surface of the storage plate are provided with first sliding rails, and the first sliding rails are slidably provided with a first partition plate, the surface of the first partition plate is formed with a plurality of first covering positions, and the first covering positions are respectively covered on the third through holes, and the surfaces of the first covering positions are respectively formed with first through holes, the left and right sides of the bottom surface of the storage plate are provided with second sliding rails, and the second sliding rails are slidably provided with a second partition plate, the surface of the second partition plate is formed with a plurality of second covering positions, and the second covering positions are respectively located at the bottom end of the third through holes, and the bottom surfaces of the second covering positions are respectively formed with second through holes.

[0004] The above technical scheme has some problems in actual application. The technical scheme cannot realize the quick installation and removal of electronic components during use, and cannot realize the quick switching of multiple groups of electronic components during continuous testing of multiple groups of components.

[0005] Therefore, it is necessary to invent a microelectronic component aging test socket to solve the above problems. Utility model content

[0006] The utility model aims at providing a microelectronic component aging test socket to solve the problems in the background art.

[0007] In order to achieve the above object, the utility model provides the following technical scheme: A kind of microelectronic component aging test socket, including aging cabinet, the lower part of the aging cabinet is provided with movable seat, the middle part of both sides of the movable seat is equipped with placing groove, the notch of the placing groove is fixedly provided with fixed frame, the middle part of both sides of the fixed frame is equipped with slot, the slot is set to inclined structure, and the inside of the slot is provided with plugboard, one end of the plugboard is parallel with the inner side wall of fixed frame, the other end of the plugboard is fixedly provided with pressing plate, and the pressing plate is set to the upper of movable seat, the middle part of the bottom of the aging cabinet is penetrated and is equipped with through slot, the notch of the through slot is fixedly provided with pressing block on both sides, and the position of pressing block and pressing plate is corresponding.

[0008] Preferably, the both sides of the movable seat are equipped with positioning groove, and the positioning groove is set to inclined structure.

[0009] Preferably, the inside of the positioning groove is inserted and is provided with positioning rod, and the bottom end of the positioning rod and the groove bottom of the positioning groove are provided with spring.

[0010] Preferably, the both ends of the movable seat are fixedly provided with connecting block, and the outer side of the connecting block is movably provided with connecting seat through pin shaft.

[0011] Preferably, the middle part of the connecting seat is penetrated and is equipped with sliding hole, the inside of the sliding hole is penetrated and is provided with sliding rod, and the sliding rod is fixedly set to the bottom end of the aging cabinet.

[0012] Preferably, the bottom end of the sliding rod is fixedly provided with fixed seat, and the fixed seat and the connecting seat are provided with top spring.

[0013] The technical effect and advantage of the utility model are as follows:

[0014] 1, the utility model discloses the movable seat of setting under the aging cabinet, the middle part of both sides of movable seat is provided with placing groove, and the electronic component to be detected can be placed into placing groove, and the fixed frame is set to the notch of placing groove, and the both sides of fixed frame are provided with slot, and the plugboard is set to the inside of slot, and one end of plugboard is provided with pressing plate, and the pressing block is set to the bottom of the aging cabinet, and the movable seat is driven electronic component and makes it enter the process of the aging cabinet, and pressing block and pressing plate cooperate and can drive plugboard to move, so that plugboard clamps and fixes electronic component, and the stability of electronic component in detection process is guaranteed in the process of realizing that electronic component is quickly placed into the aging cabinet.

[0015] 2, the utility model discloses a connecting block is set up in both ends of movable seat, connecting block's outside sets up connecting seat, and connecting block and connecting seat are connected through pin shaft, and the setting of pin shaft makes connecting block and connecting seat can rotate relatively, when carrying out continuous test to multiple electronic components, and the turnover of movable seat can be realized when rotating connecting block, so that the free drop of component after test and the quick placement of the component to be tested can be realized, and then the test efficiency of device can be effectively improved. BRIEF DESCRIPTION OF DRAWINGS

[0016] Fig. 1 It is the whole structure schematic diagram of the utility model.

[0017] Fig. 2 It is the whole structure cross section schematic diagram of the utility model.

[0018] Fig. 3 It is the movable seat structure cross section schematic diagram of the utility model.

[0019] In the drawing: 1, aging box;2, movable seat;3, place groove;4, fixed frame;5, plug-in slot;6, plug-in board;7, pressing plate;8, through slot;9, pressing block;10, positioning groove;11, positioning rod;12, spring;13, connecting block;14, connecting seat;15, sliding hole;16, sliding rod;17, fixed seat;18, top spring. DETAILED DESCRIPTION

[0020] The technical scheme in the embodiments of the utility model will be described clearly and completely below in combination with the drawings in the embodiments of the utility model, and obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by the ordinary skill in the art without creative labor are within the protection scope of the utility model.

[0021] The utility model provides a kind of Figs. 1-3The utility model discloses a microelectronic component aging test socket, including the aging box 1, the lower part of aging box 1 is provided with movable seat 2, and the middle part of both sides of movable seat 2 is seted up and is placed with the slot 3, and the slot of slot 3 is fixedly seted up with fixed frame 4, and the middle part of both sides of fixed frame 4 is seted up with the slot 5, and the slot 5 is seted up as the inclined structure, and the inside of slot 5 is provided with the plugboard 6, and one end of plugboard 6 is parallel with the inside wall of fixed frame 4, and the other end of plugboard 6 is fixedly seted up with the pressing plate 7, and the pressing plate 7 is seted up above movable seat 2, and the middle part of the bottom of aging box 1 is seted up with the through slot 8, and the both sides of the slot of through slot 8 are fixedly seted up with the pressing block 9, and the position of pressing block 9 corresponds with the pressing plate 7, and the both sides of movable seat 2 are seted up with the locating slot 10, and the locating slot 10 is seted up as the inclined structure, and the inside of locating slot 10 is inserted with the locating rod 11, and the bottom of locating rod 11 and the groove bottom of locating slot 10 are seted up with the spring 12, and the locating rod 11 cooperates with locating slot 10, can realize the guidance of the movement of pressing plate 7 and plugboard 6,

[0022] Specifically, the both ends of the movable seat 2 are fixedly provided with the connecting blocks 13, the outer sides of the connecting blocks 13 are movably provided with the connecting seats 14 through the pin shafts, and the pin shafts are arranged to enable the connecting blocks 13 and the connecting seats 14 to relatively rotate, so as to facilitate the rotation of the movable seat 2.

[0023] More specifically, the middle part of the connecting seat 14 is penetrated through to form a sliding hole 15, the sliding hole 15 is penetrated through to form a sliding rod 16 in the inside, and the sliding rod 16 is fixedly arranged at the bottom end of the aging box 1; the bottom end of the sliding rod 16 is fixedly provided with a fixed seat 17, and the fixed seat 17 and the connecting seat 14 are provided with a top spring 18 therebetween; the top spring 18 can exert an upward force on the connecting seat 14, so as to ensure that the movable seat 2 is attached to the bottom end of the aging box 1.

[0024] The working principle of the utility model:

[0025] When the device is used, the movable seat 2 is first pulled downward to separate the movable seat 2 from the bottom end of the aging box 1, then the electronic components to be tested are placed in the inside of the placing slots 3, the movable seat 2 is loosened, the connecting seat 14 moves upward under the action of the top spring 18, the connecting seat 14 drives the movable seat 2 to move upward through the connecting blocks 13, until the movable seat 2 is attached to the bottom end of the aging box 1; at this time, the pressing block 9 extrudes the pressing plate 7, so that the pressing plate 7 moves toward the movable seat 2, the pressing plate 7 drives the plugboard 6 to move, so that the plugboard 6 slides in the inside of the slot 5, the plugboard 6 extrudes the electronic components, two groups of plugboards 6 cooperate to realize the clamping and fixing of the electronic components, and ensure that the electronic components can be located in the middle part of the placing slots 3, so as to ensure the precision of the test of the electronic components in the aging box 1; after the test is completed, the movable seat 2 is pulled downward, and the movable seat 2 is rotated, until the electronic components in the placing slots 3 are automatically dropped, so that a plurality of electronic components can be continuously tested.

[0026] It should be pointed out finally that: the above only for the preferred embodiments of the utility model have, and do not for limiting the utility model, although the utility model has been described in detail with reference to the foregoing embodiments, for the person skilled in the art, it still can modify the technical scheme recorded in the foregoing each embodiment, or equivalent replacement to part of technical features, any modification, equivalent replacement, improvement etc. that is made within the spirit and principles of the utility model, should be included in the protection scope of the utility model.

Claims

1. A microelectronic component aging test socket, comprising an aging chamber (1), characterized in that: A movable seat (2) is provided below the aging chamber (1). Placement slots (3) are provided in the middle of both sides of the movable seat (2). A fixed frame (4) is fixedly provided at the opening of the placement slot (3). Slots (5) are provided in the middle of both sides of the fixed frame (4). The slots (5) are set as inclined structures, and a plate (6) is provided inside the slots (5). One end of the plate (6) is parallel to the inner side wall of the fixed frame (4). A pressure plate (7) is fixedly provided at the other end of the plate (6). The pressure plate (7) is set above the movable seat (2). A through groove (8) is provided in the middle of the bottom of the aging chamber (1). Pressure blocks (9) are fixedly provided on both sides of the opening of the through groove (8). The positions of the pressure blocks (9) and the pressure plates (7) are corresponding.

2. The microelectronic component aging test socket according to claim 1, characterized in that: The movable seat (2) has positioning grooves (10) on both sides, and the positioning grooves (10) are set as inclined structures.

3. The microelectronic component aging test socket according to claim 2, characterized in that: A positioning rod (11) is inserted into the positioning groove (10), and a spring (12) is provided between the bottom end of the positioning rod (11) and the bottom of the positioning groove (10).

4. The microelectronic component aging test socket according to claim 3, characterized in that: Both ends of the movable seat (2) are fixedly provided with connecting blocks (13), and the outer side of the connecting block (13) is movably provided with a connecting seat (14) via a pin.

5. A microelectronic component aging test socket according to claim 4, characterized in that: The connecting seat (14) has a through hole (15) in the middle, and a sliding rod (16) is provided inside the through hole (15), and the sliding rod (16) is fixedly installed at the bottom of the aging chamber (1).

6. The microelectronic component aging test socket according to claim 5, characterized in that: The bottom end of the slide rod (16) is fixedly provided with a fixing seat (17), and a top spring (18) is provided between the fixing seat (17) and the connecting seat (14).

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