Clamp for testing MOSFET (metal-oxide-semiconductor field effect transistor)

Abstract

The utility model relates to the technical field of test fixtures, in particular to a fixture for testing an MOSFET, which comprises a base and a mounting frame arranged on the upper end face of the base, a guide rod and a mounting frame are respectively arranged on two sides of the upper end of the base, a cover plate is slidably connected between the guide rod and the mounting frame, and the cover plate is connected with the mounting frame. A lifting assembly used for driving the cover plate to move upwards is arranged in the mounting frame, fixing assemblies used for being connected with the mounting frame are arranged on the two sides of the cover plate, and in the embodiment, through the technical means that the mounting frame is matched with the guide rods, movement of the cover plate is guided, and it is ensured that the cover plate vertically moves up and down when clamping the MOSFET. By means of the design, acting force can be evenly distributed on the MOSFET, the pin bending phenomenon is effectively prevented, the pin bending inferior product rate caused by improper clamping is reduced, and the overall working efficiency and production quality are improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to test fixture technical field especially relates to a MOSFET test clamp. BACKGROUND

[0002] MOSFET chip is also called metal oxide semiconductor field effect transistor, and it is a kind of control element with very wide application. Chip needs to be tested after production to ensure that the qualified rate of the batch product meets the use standard, but a special device is needed to fix it during testing, otherwise it will affect the test result, and accurate experimental data cannot be obtained, so we need a special efficient clamp that can fix chip product.

[0003] For example, the prior art Chinese patent publication number "CN205120759U" discloses a kind of test clamp of high-power MOSFET, including its base, middle plate, cover plate, support, lock catch, middle plate is installed on base, cover plate is installed on support, support is installed on one end of middle plate, lock catch is installed on one side of cover plate.

[0004] Most of the existing MOSFET test clamps can fix MOSFET during clamping, but due to the use of covering clamping method, it is easy to cause MOSFET to bear force on one side first. This uneven stress will cause MOSFET to tilt, and then cause pin bending, thereby causing adverse effects on the quality of MOSFET. UTILITY MODEL CONTENTS

[0005] The utility model aims at solving the above-mentioned shortcomings in the prior art and proposes a kind of MOSFET test clamp.

[0006] To achieve the above object, the utility model adopts the following technical scheme:

[0007] A kind of MOSFET test clamp is designed, including base and installation frame being arranged on the upper end surface of the base, the upper end of the base is respectively provided with guide rod and mounting bracket on both sides, sliding connection is achieved between the guide rod and the mounting bracket and cover plate, lifting assembly for driving the cover plate to move upwards is arranged in the mounting bracket, the both sides of the cover plate are provided with the fixed component for connecting the installation frame.

[0008] Further, the fixed component includes mounting seat fixedly connected to one side of the cover plate, lock catch is rotatably connected to the upper end of the mounting seat, pull spring is arranged between the lock catch and the mounting seat, and the both ends of the pull spring are respectively fixedly connected with the lock catch and the mounting seat.

[0009] Further, the two sides of the mounting frame are fixedly connected with the clamping plates matched with the lock catch, the end face of the base is provided with a groove, the groove is limited in the mounting frame, and a plurality of threading holes are formed in the end face of the groove.

[0010] Further, the lower end face of the cover plate is provided with a protruding part, the protruding part is movably inserted with the mounting frame, and one side of the cover plate is fixedly connected with a round rod.

[0011] Further, the lifting assembly comprises two lifting rods, the upper side of the mounting frame is provided with a through groove, the lower side of the through groove is provided with two sliding grooves, the lifting rods are slidingly connected in the sliding grooves, springs are arranged between the lifting rods and the sliding grooves, the two ends of the springs are fixedly connected with the lifting rods and the sliding grooves respectively, a pipe is fixedly connected between the two lifting rods, the pipe is slidingly connected in the through groove, and the round rod is rotatably connected in the pipe.

[0012] Further, the pipe is provided with a limiting groove in the middle part, the middle part of the round rod is formed with a protruding block, and the protruding block is slidingly connected in the limiting groove.

[0013] The utility model discloses a kind of clamps for MOSFET test, beneficial effect is in that in this embodiment, the technical means of mounting frame and guide rod cooperation, the movement of cover plate is guided, it is guaranteed to realize vertical up-down motion when clamping MOSFET.This design makes that force be evenly distributed on MOSFET, effectively prevent the occurrence of pin bending phenomenon, to reduce the pin bending rejection rate caused by improper clamping, and then improve overall work efficiency and production quality. BRIEF DESCRIPTION OF DRAWINGS

[0014] Figure 1 It is the perspective view of the utility model;

[0015] Figure 2 It is the fixed assembly structure schematic view of the utility model;

[0016] Figure 3 It is the internal structure schematic view of the mounting frame of the utility model;

[0017] Figure 4 It is the side section structure schematic view of the utility model;

[0018] Figure 5 It is the partial structure enlarged schematic view of the utility model.

[0019] In the figure: 1, base; 11, mounting frame; 12, guide rod; 13, mounting bracket; 14, clamping plate; 15, groove; 16, threading hole; 17, through slot; 18, sliding slot; 2, cover plate; 21, protruding part; 22, round rod; 23, protruding block; 3, lifting assembly; 31, lifting rod; 32, spring; 33, pipe; 34, limiting groove; 4, fixing assembly; 41, mounting seat; 42, lock catch; 43, tension spring. DETAILED DESCRIPTION

[0020] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments.

[0021] Referring to Figures 1-5 , a kind of MOSFET test fixture is designed, including base 1 and the mounting frame 11 of setting on the upper end surface of base 1, the upper end of the base 1 two sides are provided with guide rod 12 and mounting bracket 13 respectively, sliding connection is established between the guide rod 12 and the mounting bracket 13 with cover plate 2, the mounting bracket 13 is provided with lifting assembly 3 for driving the cover plate 2 to move upwards, the two sides of the cover plate 2 are provided with fixing assembly 4 for connecting the mounting frame 11, wherein the side of cover plate 2 is provided with the slot of adaptation with guide rod 12.

[0022] It should be noted that the fixing assembly 4 includes mounting seat 41 fixedly connected to the side of the cover plate 2, the upper end of the mounting seat 41 is rotatably connected with lock catch 42, the lock catch 42 and the mounting seat 41 are provided with tension spring 43, the two ends of the tension spring 43 are fixedly connected with the lock catch 42 and the mounting seat 41, the cover plate 2 is guided by guide rod 12, press down vertically moves by pressing cover plate 2, the lock catch 42 is opened by the wedge surface of clamping plate 14 and is in contact, so that the lock catch 42 is opened, after being separated from the wedge surface, the lock catch 42 will be reset by the tension of tension spring 43, and then clamped with clamping plate 14.

[0023] In the embodiment, the two sides of the mounting frame 11 are fixedly connected with the clamping plate 14 matched with the lock catch 42, the end surface of the base 1 is provided with groove 15, the groove 15 is limited in the mounting frame 11, and a plurality of threading holes 16 are formed in the end surface of the groove 15.

[0024] More specifically, the middle of the lower end surface of the cover plate 2 is provided with protruding part 21, the protruding part 21 is movably inserted into the mounting frame 11, and the side of the cover plate 2 is fixedly connected with round rod 22.

[0025] Further, the lifting assembly 3 comprises two lifting rods 31, the upper side of the mounting frame 13 is provided with a through slot 17, the lower side of the through slot 17 is provided with two sliding grooves 18, the lifting rods 31 are slidingly connected in the sliding grooves 18, springs 32 are arranged between the lifting rods 31 and the sliding grooves 18, the two ends of the springs 32 are fixedly connected with the lifting rods 31 and the sliding grooves 18 respectively, a pipe 33 is fixedly connected between the two lifting rods 31, the pipe 33 is slidingly connected in the through slot 17, the round rod 22 is rotationally connected in the pipe 33, when the MOSFET needs to be removed, the fixing assembly 4 is opened, then the lifting rods 31 are lifted up through the tension of the springs 32, then the cover plate 2 is turned over through the overturning of the round rod 22 in the pipe 33, and the MOSFET is conveniently taken out.

[0026] On the basis of the above embodiment, the pipe 33 is provided with a limiting slot 34 in the middle, the middle of the round rod 22 is formed with a protruding block 23, the protruding block 23 is slidingly connected in the limiting slot 34, wherein the limiting slot 34 is that the pipe 33 is cut in the middle to be a semicircle of 180 degrees, the protruding block 23 is rotated in the limiting slot 34, so that the rotation angle of the round rod 22 is limited to 180 degrees, the overturning of the cover plate 2 is facilitated to take out the MOSFET, and the rotation angle of the cover plate 2 is limited, so that when the MOSFET needs to be clamped, the cover plate 2 is overturned, and the guide rod 12 directly aligns with the slot of the cover plate 2.

[0027] Working mode; when working, the MOSFET is placed in the mounting frame 11, the test circuit is connected through the wire passing hole 16, then the cover plate 2 is turned over and pressed downward, the cover plate 2 is connected and fixed with the mounting frame 11 through the fixing assembly 4, and detection can be carried out.

[0028] The above is only a preferred specific embodiment of the present application, but the protection scope of the present application is not limited to this, any skilled person in the art can make equivalent replacement or change according to the technical scheme and the inventive concept of the present application within the technical range disclosed by the present application, which should be covered in the protection scope of the present application.

Claims

1. A jig for testing a MOSFET, comprising a base (1) and a mounting frame (11) provided on an upper end surface of the base, characterized in that: The upper end of the base (1) is provided with a guide rod (12) and a mounting frame (13) respectively, the guide rod (12) and the mounting frame (13) are slidably connected with a cover plate (2), the mounting frame (13) is provided with a lifting assembly (3) for driving the cover plate (2) to move upward, the two sides of the cover plate (2) are provided with a fixing assembly (4) for connecting the mounting frame (11).

2. The MOSFET test fixture of claim 1, wherein: The fixing assembly (4) comprises a mounting seat (41) fixedly connected to one side of the cover plate (2), the upper end of the mounting seat (41) is rotatably connected with a lock catch (42), the lock catch (42) and the mounting seat (41) are provided with a tension spring (43), the two ends of the tension spring (43) are fixedly connected with the lock catch (42) and the mounting seat (41) respectively.

3. The MOSFET test fixture of claim 2, wherein: The two sides of the mounting frame (11) are fixedly connected with a clamping plate (14) matched with the lock catch (42), the end surface of the base (1) is provided with a groove (15), the groove (15) is limited in the mounting frame (11), and a plurality of wire holes (16) are formed in the end surface of the groove (15).

4. The MOSFET testing fixture of claim 1, wherein: The lower end surface of the cover plate (2) is provided with a protruding portion (21), the protruding portion (21) is movably inserted into the mounting frame (11), and a round rod (22) is fixedly connected to one side of the cover plate (2).

5. The MOSFET test fixture of claim 4, wherein: The lifting assembly (3) comprises two lifting rods (31), the upper side of the mounting frame (13) is provided with a through groove (17), the lower side of the through groove (17) is provided with two sliding grooves (18), the lifting rods (31) are slidably connected in the sliding grooves (18), springs (32) are arranged between the lifting rods (31) and the sliding grooves (18), the two ends of the springs (32) are fixedly connected with the lifting rods (31) and the sliding grooves (18) respectively, a pipe (33) is fixedly connected between the two lifting rods (31), the pipe (33) is slidably connected in the through groove (17), and the round rod (22) is rotatably connected in the pipe (33).

6. The MOSFET test fixture of claim 5, wherein: The pipe (33) is provided with a limiting groove (34) in the middle, the middle of the round rod (22) is formed with a protruding block (23), and the protruding block (23) is slidably connected in the limiting groove (34).

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