Double-station current chip sorting machine
By designing a dual-station current chip sorting machine and adopting an automated structure, efficient chip testing and sorting are achieved, solving the problems of low testing efficiency and wasted manual sorting time in existing technologies, and realizing automated testing and sorting.
Patent Information
- Application Number
- CN202422832936.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-20
- Publication Date
- 2025-12-02
- Estimated Expiration
- 2034-11-20
AI Technical Summary
In the current current chip production process, testing efficiency is low, and workers need to manually sort qualified products, which wastes time and cannot be efficiently sorted.
Design a dual-station current chip sorting machine, which adopts a structure including a mounting plate, a transmission track, a measuring plate, a swing rod, and a pull rope to realize automated chip testing and sorting. The test is performed by bonding the test block to the chip surface, and the integrity of the test is ensured by the use of a blocking mechanism and a separating mechanism.
It improves the testing and sorting efficiency of current chips, realizes automated chip testing and sorting, reduces manual intervention, and adapts to chip testing with different pin specifications.
Smart Images
Figure CN223616260U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of sorting machine technology, and in particular to a dual-station current chip sorting machine. Background Technology
[0002] As the chip industry continues to develop, chip performance and functionality are gradually approaching their limits. Especially in recent years, the growth and expansion of the domestic chip industry has led to varying degrees of improvement in chip design, manufacturing, and testing technologies. This has provided ample room for the localization of chip supply chain equipment. As is well known, after the chip packaging process is completed, it needs to enter the testing phase for verification to prevent defective products from reaching the market.
[0003] In existing current module chip manufacturing processes, workers need to place the current module chips under a testing machine for testing. After testing, qualified current module chips need to be collected and sorted by workers, which wastes a lot of time. Moreover, only one current chip can be tested and sorted at a time, thus greatly reducing the testing efficiency of current module chips. To address these problems, a solution is proposed below. Utility Model Content
[0004] The purpose of this invention is to provide a dual-station current chip sorting machine, which has the advantage of high testing and sorting efficiency.
[0005] The above-mentioned technical objective of this utility model is achieved through the following technical solution:
[0006] A dual-station current chip sorting machine includes a mounting plate with a transmission track at its front end. The mounting plate has a mounting groove containing a detachable measuring plate. A vertical plate is fixed to one side of the measuring plate, and two swing rods are mounted on one side of the vertical plate, with their centers rotatably connected to the vertical plate. One end of each swing rod is connected to a pull rope. Two sets of pulling mechanisms are located below the measuring plate. The measuring plate has two through holes, the inner diameter of which is larger than the outer diameter of the pull mechanism. The two pull ropes pass through the two through holes and are connected to the two sets of pulling mechanisms. The components are connected in phase. The other end of the swing rod is rotatably connected to a connecting block. A limiting block is fixed at the lower end of the connecting block, and a test pressure block is fixed at the lower end of the limiting block. Two test guide rails are installed on the measuring plate. Each test guide rail has a test port, and the test port is located below the test pressure block. Two sets of material blocking mechanisms are also provided on the measuring plate. Four test mounting blocks are also provided on one side of the measuring plate. Every two test mounting blocks are located on both sides of the test guide rail. A detachable test head is provided on the test mounting block. Two sets of material feeding mechanisms are also provided on the mounting plate.
[0007] Preferably, the material blocking mechanism includes a material blocking block, a material blocking protrusion connected to the front end of the material blocking block, a sliding groove opened at the lower end of the test pressure block, and the material blocking protrusion slidably located in the sliding groove. A fixing block is fixedly provided on one side of the material blocking block, and two sets of pushing cylinders are installed below the test plate, with the two sets of pushing cylinders respectively connected to the two fixing blocks.
[0008] Preferably, both sets of material distribution mechanisms include a material distribution seat, and the mounting plate is provided with two sets of pulleys, with each of the two material distribution mechanisms connected to one of the pulley sets.
[0009] Preferably, two limiting frames are fixed on one side of the upright plate, and one side of the limiting block is located inside the limiting frame.
[0010] Preferably, a feeding guide rail is provided on the lower side of the mounting plate, and a feeding mounting seat is also fixed on the lower side of the mounting plate.
[0011] The beneficial effects of this utility model are as follows:
[0012] 1. Two sets of pulling mechanisms can drive the pull rope to move up and down. When the pull rope is pulled diagonally downward, it can drive one end of the swing rod to swing downward. At the same time, the other end of the swing rod swings upward. When the other end of the swing rod swings upward, it drives the connecting block to move upward, thereby driving the limit block to move upward. Finally, it can drive the test pressure block to move upward, so that the test pressure block can be separated from the test guide rail. When the chip is transferred to the test port, the test pressure block can move up and down to make the test pressure block fit with the upper surface of the chip, thereby completing the chip testing.
[0013] 2. The blocking mechanism can block the chip to be tested to ensure that the chip can be tested completely. The test head can be used to observe the current of the chip to test whether the chip can be powered on and working normally. By changing the test head, the application range of the device can be increased to test chips with different pin specifications. Attached Figure Description
[0014] Figure 1 This is a schematic diagram of the structure of an embodiment;
[0015] Figure 2 This is a schematic diagram of the upper structure of the measuring plate in the embodiment;
[0016] Figure 3 This is a partial structural diagram of an embodiment.
[0017] Reference numerals: 1. Mounting plate; 2. Conveyor rail; 3. Measuring plate; 4. Vertical plate; 5. Swing rod; 6. Pull rope; 7. Through hole; 8. Connecting block; 9. Limiting block; 10. Test pressure block; 11. Test guide rail; 12. Test port; 13. Material blocking mechanism; 14. Test mounting block; 15. Test head; 16. Material blocking block; 17. Material blocking abutment; 18. Fixing block; 19. Material distribution seat; 20. Pulley assembly; 21. Limiting frame; 22. Material discharge guide rail; 23. Material discharge mounting seat. Detailed Implementation
[0018] The following description is merely a preferred embodiment of this utility model, and the scope of protection is not limited to this embodiment. All technical solutions falling within the scope of this utility model's concept should be protected. Identical components are represented by the same reference numerals. It should be noted that the terms "front," "rear," "left," "right," "up," and "down" used in the following description refer to directions in the accompanying drawings, while the terms "bottom" and "top," "inner" and "outer" refer to directions toward or away from the geometric center of a specific component.
[0019] like Figures 1 to 3 As shown, a dual-station current chip sorting machine includes a mounting plate 1. A transmission rail 2 is provided at the front end of the mounting plate 1, through which chips can be transferred. The mounting plate 1 has a mounting slot, and a detachable testing plate 3 is provided in the mounting slot. Two test rails 11 are installed on the testing plate 3. The mounting plate 1 also has two groups of sorting mechanisms, each of which includes a sorting seat 19. The mounting plate 3 has two sets of pulleys 20. The two sorting mechanisms are respectively connected to the pulleys 20. The operation of the pulleys 20 can drive the sorting seat 19 to move left and right. Therefore, the chips transferred by the transmission rail 2 can be transported one by one to the two test rails 11 through the sorting seat 19 for chip testing. The structure and operation of the pulleys 20 are existing technologies and will not be described in detail.
[0020] A vertical plate 4 is fixedly mounted on one side of the measuring plate 3. Two swing rods 5 are mounted on one side of the vertical plate 4, and the center side of the swing rods 5 is rotatably connected to the vertical plate 4. One end of the swing rod 5 is connected to a pull rope 6. Two sets of pulling mechanisms (not shown in the figure) are provided below the measuring plate 3. Two through holes 7 are opened on the measuring plate 3. The inner diameter of the two through holes 7 is larger than the outer diameter of the pull rod. The two pull ropes 6 pass through the two through holes 7 respectively and are connected to the two sets of pulling mechanisms respectively. The two sets of pulling mechanisms can drive the pull ropes 6 to move up and down. When the pull ropes 6 are pulled diagonally downward, one end of the swing rod 5 can be driven to swing downward. At this time, the other end of the swing rod 5 swings upward. The structure and working method of the pulling mechanism are existing technologies, so they will not be described in detail. The other end of the swing rod 5 is rotatably connected to a connecting block 8. A limiting block 9 is fixed at the lower end of the connecting block 8, and a test pressure block 10 is fixed at the lower end of the limiting block 9. Each test guide rail 11 has a test port 12, and the test port 12 is located below the test pressure block 10. When the other end of the swing rod 5 swings upward, it drives the connecting block 8 to move upward, thereby driving the limiting block 9 to move upward, and finally driving the test pressure block 10 to move upward, so that the test pressure block 10 can be separated from the test guide rail 11. When the chip is transferred to the test port 12, it can move up and down through the test pressure block 10 so that the test pressure block 10 is in contact with the upper surface of the chip, thereby completing the chip testing.
[0021] The test plate 3 is also equipped with two sets of baffle mechanisms 13, and four test mounting blocks 14 are also provided on one side of the test plate 3. Each pair of test mounting blocks 14 are located on both sides of the test guide rail 11. The baffle mechanism 13 can block the chip to be tested to ensure that the chip can be tested completely. The blocking mechanism 13 includes a blocking block 16, with a blocking abutment 17 connected to the front end of the blocking block 16. A groove is provided at the lower end of the test pressure block 10, and the blocking abutment 17 is slidably located in the groove. A fixing block 18 is fixed on one side of the blocking block 16. Two sets of pushing cylinders (not shown in the figure) are installed below the test plate 3. The two sets of pushing cylinders are respectively connected to the two fixing blocks 18. The two sets of pushing cylinders can drive the fixing blocks 18 to move up and down, thereby driving the blocking block 16 to move up and down, and finally driving the blocking abutment 17 to move up and down. When the blocking abutment 17 is in contact with the test guide rail 11, it can block the chip. Conversely, when the blocking abutment 17 is separated from the test guide rail 11, the chip can continue to be transmitted downward through the gap between the blocking abutment 17 and the transmission track 2.
[0022] The test mounting block 14 is equipped with a detachable test head 15. The current of the chip can be viewed from the side through the test head 15 to test whether the chip can be powered on and work normally. The range of applications of the device can be increased by replacing the test head 15 so as to test chips with different pin specifications.
[0023] Two limiting frames 21 are fixed on one side of the upright plate 4. One side of the limiting block 9 is located inside the limiting frame 21. The limiting frame 21 can limit the limiting block 9, thereby limiting the vertical movement trajectory of the test pressure block 10. A feeding guide rail 22 is provided on the lower side of the mounting plate 1. A feeding mounting seat 23 is also fixed on the lower side of the mounting plate 1. After the test is completed, the chip can be sorted onto the feeding guide rail 22 and the feeding mounting seat 23 by the sorting mechanism. At this time, the operator can attach a plastic protective strip to the lower end of the feeding guide rail 22 or the feeding mounting seat 23 to collect and protect the chip.
[0024] The specific embodiments described above further illustrate the technical problems, technical solutions, and beneficial effects of this utility model. It should be understood that the above descriptions are merely specific embodiments of this utility model and are not intended to limit this utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.
Claims
1. A dual-station current chip sorting machine, characterized in that, The system includes a mounting plate (1), a transmission rail (2) at the front end of the mounting plate (1), a mounting groove on the mounting plate (1), a detachable measuring plate (3) in the mounting groove, a vertical plate (4) fixed on one side of the measuring plate (3), two swing rods (5) on one side of the vertical plate (4), and the center side of the swing rods (5) is rotatably connected to the vertical plate (4). One end of the swing rods (5) is connected to a pull rope (6). Two sets of pulling mechanisms are provided below the measuring plate (3). Two through holes (7) are opened on the measuring plate (3). The inner diameter of the two through holes (7) is larger than the outer diameter of the pull. The two pull ropes (6) pass through the two through holes (7) respectively and are connected to the two sets of pulling mechanisms respectively. The other end of the swing rods (5) is connected to the vertical plate (4). The end is rotatably connected to a connecting block (8), and a limiting block (9) is fixedly provided at the lower end of the connecting block (8). A test pressure block (10) is fixedly provided at the lower end of the limiting block (9). Two test guide rails (11) are installed on the measuring plate (3). Each test guide rail (11) is provided with a test port (12), and the test port (12) is located below the test pressure block (10). Two sets of material blocking mechanisms (13) are also provided on the measuring plate (3). Four test mounting blocks (14) are also provided on one side of the measuring plate (3). Each pair of test mounting blocks (14) is located on both sides of the test guide rail (11). A detachable test head (15) is provided on the test mounting block (14). Two sets of material feeding mechanisms are also provided on the mounting plate (1).
2. The dual-station current chip sorting machine according to claim 1, characterized in that, The material blocking mechanism (13) includes a material blocking block (16), the front end of which is connected to a material blocking protrusion (17). The lower end of the test pressure block (10) is provided with a sliding groove, and the material blocking protrusion (17) is slidably located in the sliding groove. A fixing block (18) is fixedly provided on one side of the material blocking block (16). Two sets of pushing cylinders are installed below the measuring plate (3), and the two sets of pushing cylinders are respectively connected to the two fixing blocks (18).
3. A dual-station current chip sorting machine according to claim 2, characterized in that, Both of the material distribution mechanisms include a material distribution seat (19), and two sets of pulley groups (20) are provided on the mounting plate (1). The two material distribution mechanisms are respectively connected to the pulley groups (20).
4. A dual-station current chip sorting machine according to claim 3, characterized in that, Two limiting frames (21) are fixed on one side of the upright plate (4), and one side of the limiting block (9) is located inside the limiting frame (21).
5. A dual-station current chip sorting machine according to claim 4, characterized in that, The mounting plate (1) is provided with a feeding guide rail (22) on its lower side, and a feeding mounting seat (23) is also fixedly provided on the lower side of the mounting plate (1).