Chip test seat capable of preventing material carrying
By designing stainless steel pressure claws and limiting structures, the problems of uneven pressure and wear in the testing of small-sized chips by the chip test socket were solved, achieving uniform pressure and no sliding friction, thus improving the reliability of chip testing.
Patent Information
- Application Number
- CN202421479434.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-26
- Publication Date
- 2025-12-19
- Estimated Expiration
- 2034-06-26
AI Technical Summary
Existing chip test sockets suffer from uneven pressure, wear, and static electricity when testing small-sized chips, resulting in severe chip contamination.
A chip test socket designed to prevent chip contamination is presented. It features a stainless steel claw structure with uniform centerline pressure and vertical vertical contact. Spring and limit block assemblies are included to ensure that the claws do not slip on the chip contact surface. A detachable auxiliary limit frame is also provided to accommodate different chip specifications.
It achieves uniform pressure and zero sliding friction, reduces wear, avoids chip contamination, and improves the reliability and stability of testing.
Smart Images
Figure CN223692393U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to chip test seat technical field especially relates to prevent the chip test seat of material. BACKGROUND
[0002] Chip or microcircuit, microchip, wafer or chip is a kind of circuit miniaturization in electronics, and is often manufactured on semiconductor wafer surface.
[0003] Now in life, due to the development of science and technology, various high technologies have all been introduced, and chip as the brain of all machines is very important, and needs to be detected when producing chip.
[0004] 1.5X1.5mm size specification below chip is serious in the program burning operation material (i.e. chip to be burned).
[0005] This mainly has the following reasons:
[0006] 1;Chip size is small, and the texture is relatively light, and the pressure between the pressure jaw is too large;
[0007] 2;Pressure jaw wear, leading to increased contact surface friction;
[0008] 3;Static, humidity and other reasons. INVENTION CONTENTS
[0009] The utility model discloses a chip test seat of preventing material to solve the problems in prior art.
[0010] In order to realize the above-mentioned purpose, the utility model discloses a technical scheme as follows:
[0011] Chip test seat of preventing material, including base, the base bottom is equipped with probe test part, the outside of base top is provided with mounting seat, the mounting seat is installed with the pressure platform through spring assembly, the pressure platform is located the top of mounting seat, the both sides of pressure platform inner perimeter are rotatably installed with pressure jaw, the both sides of mounting seat inner perimeter are installed with limit block assembly, and limit block assembly is rotatably connected with the middle part of pressure jaw through pivot.
[0012] Preferably, the probe test part includes a base probe platform integrally arranged at the bottom of the base and an auxiliary limiting frame detachably connected above the base probe platform.
[0013] Preferably, the mounting seat and the pressure platform are both in frame type, a plurality of sliding grooves are formed on the outside of the mounting seat, a plurality of sliding blocks are installed on the bottom of the pressure platform, and the sliding blocks are slidably connected with the sliding grooves.
[0014] Preferably, a plurality of accommodating holes are formed on the top of the mounting seat, and the spring assembly is installed in the accommodating holes.
[0015] Preferably, two connecting plates are mounted on both sides of the inner periphery of the pressing table, and a rotating shaft is mounted at the bottom between the two connecting plates, and one side of the pressing jaw is fixedly mounted on the rotating shaft.
[0016] Preferably, grooves are formed on both sides of the inner periphery of the mounting seat, the positions of the grooves correspond to the positions of the two connecting plates, a connecting block is mounted on the inner wall of the groove, a connecting piece is rotatably mounted on the other side of the connecting block through a rotating shaft, and the other end of the connecting piece is rotatably connected with the pressing jaw through a rotating shaft.
[0017] Preferably, the end of the pressing jaw is in an elliptical shape, and the end positions of the two pressing jaws are staggered.
[0018] Preferably, the material of the pressing jaw is stainless steel, and the material of the auxiliary limiting frame is anti-static plastic.
[0019] Compared with the prior art, the chip testing seat has the advantages that:
[0020] Compared with the prior art, the pressing jaw structure in the device is changed, the center two sides of the pressing chip are changed into a center line, the pressure is uniform, and the strip material caused by uneven stress is avoided.
[0021] The pressing jaw vertically moves up and down, and the contact surface with the chip does not move, and there is no sliding friction force.
[0022] The material of the pressing jaw is stainless steel, and the hardness is much greater than that of the chip, so the wear can be ignored, and the adverse effects caused by the wear of the pressing jaw are avoided.
[0023] The pressing jaw is single and asymmetric, and is symmetrically imaged up and down, so that the chip can be fully contacted. BRIEF DESCRIPTION OF DRAWINGS
[0024] Figure 1 It is an opened state perspective view of the chip testing seat for preventing strip material according to the utility model;
[0025] Figure 2 It is an opened state front view of the chip testing seat for preventing strip material according to the utility model;
[0026] Figure 3 It is an opened state rear view of the chip testing seat for preventing strip material according to the utility model;
[0027] Figure 4 It is an opened state left view of the chip testing seat for preventing strip material according to the utility model;
[0028] Figure 5 It is an opened state right view of the chip testing seat for preventing strip material according to the utility model;
[0029] Figure 6 The opening state plan view of the chip test seat for preventing strip material is provided by the utility model.
[0030] Figure 7 The opening state plan view of the chip test seat for preventing strip material is provided by the utility model.
[0031] Figure 8 The closing state perspective view of the chip test seat for preventing strip material is provided by the utility model.
[0032] Figure 9 The closing state front view of the chip test seat for preventing strip material is provided by the utility model.
[0033] Figure 10 The closing state rear view of the chip test seat for preventing strip material is provided by the utility model.
[0034] Figure 11 The closing state left view of the chip test seat for preventing strip material is provided by the utility model.
[0035] Figure 12 The closing state right view of the chip test seat for preventing strip material is provided by the utility model.
[0036] Figure 13 The closing state plan view of the chip test seat for preventing strip material is provided by the utility model.
[0037] Figure 14 The closing state plan view of the chip test seat for preventing strip material is provided by the utility model.
[0038] Figure 15 The connecting piece and the connecting block of the chip test seat for preventing strip material are provided by the utility model.
[0039] Figure 16 The chip test seat for preventing strip material is provided by the utility model.
[0040] In the figure: 1, base; 2, probe test part; 3, mounting seat; 4, spring assembly; 5, press table; 6, press jaw; 7, limit block assembly; 8, basic probe table; 9, auxiliary limit frame; 10, sliding block; 11, sliding slot; 12, containing hole; 13, connecting plate; 15, connecting block; 16, connecting piece. DETAILED DESCRIPTION
[0041] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments.
[0042] Refer toFigures 1-16 The chip testing seat of preventing strip material includes a base 1, a probe testing part 2 arranged at the bottom of the base 1, a mounting seat 3 arranged at the top of the base 1, a pressing table 5 mounted on the mounting seat 3 through a spring assembly 4, and a pressing claw 6 rotatably arranged at the inner side of the pressing table 5.
[0043] In use, the pressing table 5 is driven to move downward by an external power device (such as a cylinder), so that the pressing table 5 drives one end of the pressing claw 6 to move downward, and the middle part of the pressing claw 6 is limited, so that the end of the pressing claw 6 for pressing the chip moves upward and separates from the chip. Compared with the prior art, the structure of the pressing claw 6 in the device is changed, the center and the two sides of the pressing claw 6 are changed to the center line, the pressure is uniform, and the strip material caused by uneven stress is avoided. The pressing claw 6 vertically moves upward and downward, and the contact surface with the chip does not move, so there is no sliding friction force. The material of the pressing claw 6 is stainless steel, and the hardness is much greater than that of the chip, so the wear can be ignored, and the defects caused by the wear of the pressing claw 6 are avoided. The pressing claw 6 is asymmetric, and the upper and lower parts are mirror-symmetric, so the pressing claw 6 can fully contact the chip.
[0044] In the embodiment, the probe testing part 2 includes a basic probe table 8 integrally arranged at the bottom of the base 1 and an auxiliary limiting frame 9 detachably connected above the basic probe table 8 through bolts. When the chip product type is switched, such as from 1.5X1.5 to 1.0X1.0 chip, only the auxiliary limiting frame 9 needs to be replaced, so the cost is saved, and the operation is convenient.
[0045] In the embodiment, the mounting seat 3 and the pressing table 5 are in a frame type, a plurality of sliding grooves 11 are arranged at the outer side of the mounting seat 3, a plurality of sliding blocks 10 are arranged at the bottom of the pressing table 5, and the sliding blocks 10 are slidably connected with the sliding grooves 11, so as to limit the relative position of the pressing table 5 and the mounting seat 3.
[0046] In the embodiment, a plurality of accommodating holes 12 are arranged at the top of the mounting seat 3, and the spring assembly 4 is arranged in the accommodating hole 12, so as to take the top of the mounting seat 3 as the maximum downward position of the pressing table 5.
[0047] In the embodiment, two connecting plates 13 are arranged at the inner side of the pressing table 5, a rotating shaft is arranged at the bottom between the two connecting plates 13, and one side of the pressing claw 6 is fixedly arranged on the rotating shaft, so that the end of the pressing claw 6 rotates through the rotating shaft.
[0048] In the embodiment, the mounting seat 3 is provided with a groove on both sides of the inner periphery, the position of the groove corresponds to the position of the two connecting plates 13, the inner wall of the groove is provided with a connecting block 15, the other side of the connecting block 15 is rotatably provided with a connecting piece 16 through a rotating shaft, the other end of the connecting piece 16 is rotatably connected with the pressing claw 6 through a rotating shaft, when the end of the pressing claw 6 moves downward, under the limiting action of the connecting block 15, the pressing platform 5 drives one end of the pressing claw 6 to move downward, and the middle position of the pressing claw 6 is limited, so that the end of the pressing claw 6 for pressing the chip moves upward and separates from the chip.
[0049] In the embodiment, the material of the pressing claw 6 is stainless steel, and the material of the auxiliary limiting frame 9 is anti-static plastic. The material of the pressing claw 6 is stainless steel, and the hardness is much greater than that of the chip, so the wear can be ignored, and the poor quality caused by the wear of the pressing claw 6 is avoided. The auxiliary limiting frame 9 avoids the test failure caused by static electricity from the material use aspect.
[0050] In the embodiment, the end of the pressing claw 6 is oval, and the end positions of the two pressing claws 6 are staggered.
[0051] Working principle: first, the chip is placed on the probe test part 2 through the auxiliary limiting frame 9, the pressing platform 5 is driven to move downward by an external power device (such as a cylinder connected with the pressing platform 5), so that one end of the pressing claw 6 is driven to move downward by the pressing platform 5, when the end of the pressing claw 6 moves downward, under the limiting action of the connecting block 15, one end of the pressing claw 6 is driven to move downward by the pressing platform 5, and the middle position of the pressing claw 6 is limited, so that the end of the pressing claw 6 for pressing the chip moves upward and separates from the chip. Compared with the prior art, the structure of the pressing claw 6 in the device is changed, the center two sides of the chip are changed to the center line, the pressure is uniform, and the material is avoided due to uneven stress; the pressing claw 6 vertically moves upward and downward, and the contact surface with the chip does not move, so there is no sliding friction force; the material of the pressing claw 6 is stainless steel, and the hardness is much greater than that of the chip, so the wear can be ignored, and the poor quality caused by the wear of the pressing claw 6 is avoided; the pressing claw 6 is single and asymmetric, and is mirror-symmetric upward and downward, so it can fully contact with the chip.
[0052] The above is only a preferred specific embodiment of the present application, but the protection scope of the present application is not limited to this. Any skilled person in the art can make equivalent replacement or change according to the technical scheme and the inventive concept of the present application within the technical range disclosed by the present application, which should be covered in the protection scope of the present application.
Claims
1. A tape-out chip test socket, comprising a base, the base bottom is provided with a probe test part, characterized in that: The outer side of the top of the base is provided with a mounting seat, a pressing table is mounted on the mounting seat through a spring assembly, the pressing table is above the mounting seat, a pressing claw is rotatably mounted on the two sides of the inner periphery of the pressing table, a limiting block assembly is mounted on the two sides of the inner periphery of the mounting seat, and the limiting block assembly is rotatably connected with the middle part of the pressing claw through a rotating shaft.
2. The tape-out chip test socket of claim 1, wherein: The probe testing part comprises a basic probe table integrally arranged at the bottom of the base and an auxiliary limiting frame detachably connected above the basic probe table.
3. The tape-out chip test socket of claim 1, wherein: The mounting seat and the pressing table are both in the shape of a frame, a plurality of sliding grooves are formed on the outer side of the mounting seat, a plurality of sliding blocks are mounted on the bottom of the pressing table, and the sliding blocks are slidably connected with the sliding grooves.
4. The tape-out chip test socket of claim 2, wherein: A plurality of accommodating holes are formed on the top of the mounting seat, and the spring assembly is mounted in the accommodating holes.
5. The tape-out chip test socket of claim 1, wherein: Two connecting plates are mounted on the two sides of the inner periphery of the pressing table, a rotating shaft is mounted at the bottom between the two connecting plates, and one side of the pressing claw is fixedly mounted on the rotating shaft.
6. The tape-out chip test socket of claim 5, wherein: Grooves are formed on the two sides of the inner periphery of the mounting seat, the positions of the grooves correspond to the positions of the two connecting plates, connecting blocks are mounted on the inner walls of the grooves, connecting pieces are rotatably mounted on the other sides of the connecting blocks through rotating shafts, and the other ends of the connecting pieces are rotatably connected with the pressing claw through a rotating shaft.
7. The tape-out chip test socket of claim 6, wherein: The end part of the pressing claw is in the shape of an ellipse, and the end part positions of the two pressing claws are staggered.
8. The tape-out chip test socket of claim 5, wherein: The material of the pressing claw is stainless steel, and the material of the auxiliary limiting frame is anti-static plastic.