Electronic device testing tool
By designing an electronic device testing tool that integrates testing of multiple components, the problems of high cost and insufficient security of existing tools are solved, achieving low-cost, accurate and safe testing results.
Patent Information
- Application Number
- CN202421873304.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-02
- Publication Date
- 2025-12-30
- Estimated Expiration
- 2034-08-02
AI Technical Summary
Existing testing tools for components such as optocouplers are expensive and have an exposed design, resulting in insufficient lifespan and safety.
An electronic device testing tool integrating multiple component tests was designed, including an interlocking upper and lower shell, a built-in circuit board, an integrated test circuit, and a retractable elastic probe assembly. The circuit board has pin holes, and the shell and test ports are copper-clad to enhance electromagnetic compatibility.
It enables integrated testing of multiple components, reduces costs, improves testing accuracy and safety, and extends the tool's lifespan.
Smart Images
Figure CN223742512U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of testing technology, and specifically relates to a testing tool for optocouplers or components. Background Technology
[0002] The status and disadvantages of existing technologies: Existing technologies either require specialized testing instruments, such as multimeters, oscilloscopes, LCR meters, component testers, and IC testers, which are usually quite expensive; or existing testing tools for components such as optocouplers are just bare test boards with no guarantee of lifespan or safety. Utility Model Content
[0003] The purpose of this invention is to provide an electronic device testing tool that integrates testing of multiple components into one unit, features a limiting design, and has copper-plated protection for the outer shell and test ports.
[0004] The technical solution of this utility model is the aforementioned electronic device testing tool, comprising an interlocking upper and lower shell, and a circuit board housed within the formed cavities of the upper and lower shells. Its unique feature is that the circuit board integrates a testing circuit for detecting the functional parameters of various electronic devices; a retractable elastic probe assembly is fixed at the front end of the circuit board; the elastic probe assembly contacts the corresponding pins of the electronic devices on the circuit board; pin holes corresponding to the pins of the electronic devices are formed on the circuit board; the upper shell has limiting openings corresponding to the holes of the electronic devices within the cavity, allowing components to be inserted from the outside; both the shell and the testing port are covered with a copper layer, which is grounded to enhance electromagnetic compatibility.
[0005] Preferably, the pin holes are respectively located at the front and rear ends of the circuit board, or at the front end of the circuit board.
[0006] Preferably, the circuit board is provided with an input port and buttons.
[0007] Preferably, the shape and position of the limiting opening correspond to the pin positions of different electronic devices.
[0008] Preferably, the elastic probe assembly includes multiple independently retractable probe units, each probe unit being connected to a test point on the circuit board.
[0009] Preferably, the electronic devices include optocouplers, IGBTs, silicon controlled rectifiers, NPN transistors, NMOS transistors, PNP transistors, and PMOS transistors.
[0010] Another technical solution of this utility model is the electronic device testing tool, which includes an upper shell and a lower shell that interlock with each other, and a circuit board housed in the inner cavity formed by the upper shell and the lower shell. Its special feature is that it also includes electronic devices inserted into the circuit board and retractable probes fixed to the front end of the circuit board. The electronic devices include optocouplers, IGBTs, silicon controlled rectifiers (SCRs), NPN transistors, NMOS transistors, PNP transistors, and PMOS transistors. The upper shell has limiting openings corresponding to the holes of the electronic devices inside the cavity, for external insertion of the components. The probes contact the corresponding pins of the electronic devices on the circuit board. Both the shell and the test port are covered with a copper layer.
[0011] Compared with the prior art, the beneficial effects of this utility model are as follows:
[0012] (1) This utility model has the advantages of being of high quality and low price, and can integrate the testing of multiple components into one unit at a low price.
[0013] (2) This utility model eliminates the need for exposed test plates; this product is a finished shell.
[0014] (3) Because this utility model has a shell, it can be designed to limit the position, accurately measure the components, and avoid the inconvenience of difficult or inaccurate insertion and removal during testing.
[0015] (4) The outer shell and test port of this utility model are protected by copper plating, which ensures the product's lifespan and safety. Attached Figure Description
[0016] Figure 1 This is an exploded view of the structure of the first embodiment of this utility model;
[0017] Figure 2 This is a structural assembly diagram of the first embodiment of the present invention;
[0018] Figure 3 This is an exploded view of the structure of the second embodiment of the present invention;
[0019] Figure 4 This is a structural assembly diagram of the second embodiment of the present invention.
[0020] Explanation of key component symbols:
[0021] Upper shell 1 Limiting opening 11 Lower shell 2 Circuit Board 3 Test port 31 Probe 4 Indicator 5 Indicator 6 Input Port 7 Button 8 Battery 9 10 foot holes Detailed Implementation
[0022] This utility model will be further described in detail below with reference to the accompanying drawings:
[0023] Figure 1 , Figure 2 The first embodiment of the present invention is shown.
[0024] Please see Figure 1 , Figure 2 As shown, the optocoupler or component testing tool consists of an upper shell 1 and a lower shell 2 made of plastic material. A circuit board 3 is located between the upper shell 1 and the lower shell 2, with four probes 4 at the front end. The probes are retractable conductors. The circuit board 3 has two indicator lights 5 and 6, an input port 7, and internal buttons 8 and a battery 9. The circuit board 3 has pin holes 10 corresponding to the optocoupler electronic components. The upper shell 1 has openings corresponding to the optocouplers, allowing the optocouplers to be placed on the circuit board 3 and into the pin holes 10 of the electronic components. The upper shell 1 has limiting openings 11 corresponding to the holes of the internal electronic components, allowing the components to be inserted from the outside. Both the shell and the test port 31 are covered with a copper layer.
[0025] The optocoupler or component testing tool can charge the battery 9 via input port 7. The power button 8 turns the device on and off. After powering on, indicator light 6 illuminates. This product has two operating modes: Mode 1: Contact probe 4 with the four pins of the optocoupler under test. If the optocoupler is functioning normally, indicator light 5 illuminates; if the optocoupler is damaged but functioning normally, indicator light 5 does not illuminate. Mode 2: After powering on, place the optocoupler into the corresponding pin hole 10 on the circuit board. If the device is functioning normally, indicator light 5 illuminates; if the device is damaged, indicator light 5 does not illuminate.
[0026] Figure 3 , Figure 4 The second embodiment of this utility model is shown.
[0027] Please see Figure 3 , Figure 4 As shown, the optocoupler or component testing tool consists of an upper shell 1 and a lower shell 2 made of plastic material. A circuit board 3 is located between the upper shell 1 and the lower shell 2. Four probes 4 are located at the front end; the probes are retractable conductors. The circuit board 3 has two indicator lights 5 and 6, an input port 7, and internal buttons 8 and a battery 9. The circuit board 3 has pin holes 10 corresponding to the pin positions of electronic components such as optocouplers, IGBTs, thyristors, NPN transistors, NMOS transistors, PNP transistors, PMOS transistors, and other electronic components. The upper shell 1 has openings corresponding to the electronic components, allowing these components to be placed on the circuit board 3 and into the pin holes 10.
[0028] The optocoupler or component testing tool can charge the battery 9 via input port 7, and power on / off is activated by button 8. After power-on, indicator light 6 illuminates. This product has two operating modes: Mode 1: Contact probe 4 with the four pins of the optocoupler under test. If the optocoupler is functioning normally, indicator light 5 illuminates; if the optocoupler is damaged but functioning normally, indicator light 5 does not illuminate. Mode 2: After power-on, place the component to be tested (optocoupler, IGBT, SCR, NPN transistor, NMOS transistor, PNP transistor, PMOS transistor, 431) into the corresponding pin holes 10 on the circuit board. If the component is functioning normally, indicator light 5 illuminates; if the component is damaged, indicator light 5 does not illuminate.
[0029] The above description is only a preferred embodiment of the present utility model. All equivalent changes and modifications made within the scope of the claims of the present utility model should be covered by the claims of the present utility model.
Claims
1. An electronic device testing tool comprising an upper case and a lower case which are mutually engaged, a circuit board housed in a molded inner cavity of the upper case and the lower case, characterized in that, The circuit board is integrated with a test circuit for detecting functional parameters of various electronic devices; a retractable elastic probe assembly is fixed at the front end of the circuit board; the elastic probe assembly is in contact with each pin of the electronic devices on the circuit board; Pin holes corresponding to the pins of the electronic devices are formed on the circuit board; the upper shell is provided with a limiting opening corresponding to the hole positions of the electronic devices in the cavity for inserting the components from the outside; the shell and the test port are both covered with a copper layer, which is grounded to enhance electromagnetic compatibility.
2. The electronic device testing tool of claim 1, wherein, The pin holes are respectively arranged at the front end and the rear end of the circuit board, or at the front end of the circuit board.
3. The electronic device testing tool of claim 1, wherein, The circuit board is provided with an input port and a key.
4. The electronic device testing tool of claim 1, wherein, The shape and position of the limiting opening correspond to the pins of different electronic devices.
5. The electronic device testing tool of claim 1, wherein, The elastic probe assembly includes a plurality of probe units that can be independently retracted, and each probe unit is connected to a test point on the circuit board.
6. The electronic device testing tool according to any one of claims 1 to 5, wherein The electronic devices include optocouplers, IGBTs, silicon-controlled rectifiers, NPN triodes, NMOS tubes, PNP triodes, and PMOS tubes.
7. An electronic device testing tool comprising an upper case and a lower case that are engaged with each other, a circuit board housed in an inner cavity formed by the upper case and the lower case, characterized in that, The electronic devices include optocouplers, IGBTs, silicon-controlled rectifiers, NPN triodes, NMOS tubes, PNP triodes, and PMOS tubes; the upper shell is provided with a limiting opening corresponding to the hole positions of the electronic devices in the cavity for inserting the components from the outside; the probe is in contact with each pin of the electronic devices on the circuit board; the shell and the test port are both covered with a copper layer.