Testing device

Abstract

The embodiment of the utility model provides a testing device, and belongs to the technical field of chips. The testing device comprises a bearing base table and an installation jig, the bearing base table comprises a main support and a tray, the tray is movably installed on the main support, the tray is provided with a bearing face, the bearing face is used for installing a to-be-tested device, and the installation jig is used for installing a debugger for testing the to-be-tested device and a power source for supplying power to the debugger. And the mounting jig is detachably connected with the tray. When the debugger tests the to-be-tested device, the installation jig provided with the debugger and the power supply for supplying power to the debugger is connected to the tray so as to test the to-be-tested device, after the to-be-tested device is tested, the installation jig can be detached from the tray, and an operator does not need to hold the debugger all the time in the testing process. The hand space of an operator is liberated, the operator can conveniently test the to-be-tested device, and the test efficiency of the to-be-tested device is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the chip technical field, and in particular to a testing device. BACKGROUND

[0002] In the development process of a device to be tested, the device to be tested needs to be tested by a testing device, a debugger is used to check and debug to troubleshoot and ensure that the quality meets the requirements. The testing device includes a bearing base, the device to be tested is installed on the bearing base, and the debugger is used to test the device to be tested on the bearing base.

[0003] In the related art, the testing efficiency of the device to be tested is low. SUMMARY

[0004] To solve the problems in the related art, the embodiments of the present application aim to provide a testing device to improve the testing efficiency of the device to be tested.

[0005] The technical scheme of the embodiments of the present application is implemented as follows:

[0006] The embodiments of the present application provide a testing device, which includes:

[0007] A bearing base includes a main support and a tray, the tray is movably installed on the main support, the tray has a bearing surface, and the bearing surface is used to install a device to be tested;

[0008] An installation jig is used to install a debugger used to test the device to be tested and a power supply used to supply power to the debugger, and the installation jig is detachably connected with the tray.

[0009] In an embodiment, the installation jig has a hook, the hook is hung on the tray to detachably connect the installation jig with the tray.

[0010] In an embodiment, the tray is provided with a handle used to move the tray relative to the main support, and the hook is hung on the handle.

[0011] In an embodiment, the installation jig includes:

[0012] A main box has a first accommodating cavity used to accommodate the debugger and a first installation opening in communication with the first accommodating cavity, and the first installation opening is used to move the debugger into or out of the first accommodating cavity;

[0013] An auxiliary box is connected with the main box, the auxiliary box has a second accommodating cavity used to accommodate the power supply and a second installation opening in communication with the second accommodating cavity, and the second installation opening is used to move the power supply into or out of the second accommodating cavity.

[0014] In an embodiment, the first mounting port is located at one side of the first accommodating cavity along a first direction, and the second mounting port is located at one side of the second accommodating cavity along the first direction.

[0015] In an embodiment, the first direction is parallel to and opposite to a direction of gravity.

[0016] In an embodiment, the auxiliary box has a first avoiding port for avoiding an output port of the power supply and a second avoiding port for avoiding an input port of the power supply, the first avoiding port and the second avoiding port are arranged in a second direction, the main box and the auxiliary box are arranged in a third direction, the first direction is arranged transversely to the third direction, and the second direction is arranged transversely to the first direction and the third direction, respectively, the main box has a third avoiding port formed at a side thereof away from the first direction, the third avoiding port is used for avoiding a wiring port of the debugger, and the wiring port includes a power supply port.

[0017] In an embodiment, the main box comprises:

[0018] a back plate, the first accommodating cavity being located between the back plate and the auxiliary box along the third direction;

[0019] a side plate connected between the back plate and the auxiliary box, the back plate being provided with the side plate on opposite sides thereof along the second direction, the side plates on the opposite sides being arranged spaced apart, the auxiliary box being arranged across the side plates on the opposite sides, and the first accommodating cavity being located between the side plates on the opposite sides along the second direction.

[0020] In an embodiment, the main box further comprises a bottom plate, the bottom plate, the side plates on the opposite sides, and the auxiliary box surrounding to form a fourth avoiding port, the fourth avoiding port being used for avoiding a light-emitting diode of the debugger, and the third avoiding port being formed in the bottom plate.

[0021] In an embodiment, the back plate is provided with a first heat dissipation hole, and the side plate is provided with a second heat dissipation hole, the first heat dissipation hole and the second heat dissipation hole both being in communication with the first accommodating cavity.

[0022] In an embodiment, the auxiliary box has a through slot in communication with the second accommodating cavity, the through slot being arranged across a box wall of the auxiliary box away from the main box along the third direction and a box wall of the auxiliary box away from the first direction.

[0023] In an embodiment, the auxiliary box further has a fifth avoiding port for avoiding a signal lamp of the power supply, the fifth avoiding port being located at a side of the second accommodating cavity away from the main box.

[0024] In an embodiment, a dimension of the handle along the second direction is greater than a dimension of the mounting jig along the second direction.

[0025] In one embodiment, the mounting jig has a hook, the hook is hung on the tray so that the mounting jig is detachably connected with the tray, the mounting jig comprises:

[0026] a main box, the main box has a first accommodating cavity for accommodating the debugger and a first mounting port communicated with the first accommodating cavity, the first mounting port is used for moving the debugger into or out of the first accommodating cavity, the hook is formed on the main box;

[0027] a secondary box connected with the main box, the secondary box has a second accommodating cavity for accommodating the power supply and a second mounting port communicated with the second accommodating cavity, the second mounting port is used for moving the power supply into or out of the second accommodating cavity, the hook is located on a side of the first mounting port away from the second mounting port.

[0028] In one embodiment, the device to be tested comprises a universal flash memory.

[0029] The test device provided by the embodiment of the present application is characterized in that the debugger and the power supply for supplying power to the debugger are mounted on the mounting jig, the mounting jig is detachably connected with the tray, so that the debugger and the power supply for supplying power to the debugger are mounted on the tray through the mounting jig, the device to be tested is mounted on the bearing surface of the tray, and the tray is movable on the main support, thereby facilitating the use of the debugger to test the device to be tested. When the debugger tests the device to be tested, the device to be tested is mounted on the bearing surface, the mounting jig on which the debugger and the power supply for supplying power to the debugger are mounted is connected to the tray, so as to test the device to be tested, and when the testing of the device to be tested is completed, the mounting jig can be detached from the tray, and the repeated operation on the next device to be tested is performed. The operator can not hold the debugger during the testing process, thereby freeing the hand space of the operator, facilitating the operator to test the device to be tested, and improving the testing efficiency of the device to be tested. BRIEF DESCRIPTION OF DRAWINGS

[0030] Figure 1 FIG. 1 is a structural schematic diagram of a test device according to an embodiment of the present application;

[0031] Figure 2 FIG. 2 is a projection view of FIG. 1; Figure 1 FIG. 3 is a projection view of FIG. 1;

[0032] Figure 3 FIG. 4 is an assembly schematic diagram of a mounting jig, a debugger and a power supply according to an embodiment of the present application;

[0033] Figure 4 FIG. 5 is a structural schematic diagram of the mounting jig according to an embodiment of the present application;

[0034] Figure 5 FIG. 6 is a structural schematic diagram of the mounting jig according to an embodiment of the present application;Figure 4 Cross-sectional view at B-B.

[0035] BRIEF DESCRIPTION OF DRAWINGS

[0036] 1, bearing base; 11, bearing surface; 12, main support; 13, tray; 131, handle; 2, mounting jig; 21, hook; 22, main box; 221, first accommodating cavity; 222, first mounting port; 223, third avoiding port; 224, fourth avoiding port; 225, back plate; 226, side plate; 227, bottom plate; 228, first heat dissipation hole; 229, second heat dissipation hole; 23, auxiliary box; 231, second accommodating cavity; 232, second mounting port; 233, first avoiding port; 234, second avoiding port; 235, fifth avoiding port; 236, through slot; 3, debugger; 31, indicator light; 4, power supply; 41, signal light; 5, device to be tested. DETAILED DESCRIPTION

[0037] In order to make the purpose, technical scheme and advantages of the present application more clear, the present application is further described in detail below in combination with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, and are not used to limit the present application.

[0038] In the specific embodiments, various specific technical features described can be combined in any suitable manner without contradiction, for example, different embodiments and technical solutions can be formed by combining different specific technical features. In order to avoid unnecessary repetition, various possible combinations of various specific technical features in the present application are not described again.

[0039] In the following description, the terms "first\second\..." are only used to distinguish different objects, and do not mean that there is the same or relationship between the objects. It should be understood that the terms "upper", "lower", "outer", "inner" are the positions of the normal use state, and the terms "left" and "right" represent the left and right directions shown in the specific corresponding schematic diagram, which can be the left and right directions of the normal use state or not.

[0040] It should be noted that the terms "include", "contain" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or appliance including a series of elements not only includes those elements, but also includes other elements not explicitly listed or inherent to such process, method, article or appliance. Without more limitation, the element defined by the sentence "including one" does not exclude the existence of other identical elements in the process, method, article or appliance including the element. "Multiple" means greater than or equal to two.

[0041] In the prior art, the device to be tested is mounted on a bearing base, and an operator needs to hold a debugger to test the device to be tested on the bearing base, the hand space of the operator is occupied by the debugger, which is inconvenient for the operator to debug, and the testing efficiency of the device to be tested is low.

[0042] The testing device provided in the embodiments of the present application, please refer to Figure 1 and Figure 2 The testing device comprises a bearing base 1 and a mounting jig 2. The bearing base 1 comprises a main support 12 and a tray 13. The tray 13 is movably mounted on the main support 12. The tray 13 has a bearing surface 11 for mounting the device to be tested 5. The mounting jig 2 is used for mounting a debugger 3 for testing the device to be tested 5 and a power supply 4 for supplying power to the debugger 3. The mounting jig 2 is detachably connected with the tray 13.

[0043] Exemplarily, the bearing base 1 has at least two trays 13.

[0044] Exemplarily, at least two devices to be tested 5 are mounted on the bearing surface 11.

[0045] Exemplarily, the main support 12 is provided with a slot, and the tray 13 moves in the slot.

[0046] Exemplarily, the main support 12 is made of aluminum profile, and the slot for pulling the tray 13 is processed on the aluminum profile.

[0047] In the embodiments of the present application, the debugger 3 and the power supply 4 for supplying power to the debugger 3 are mounted on the mounting jig 2, and the mounting jig 2 is detachably connected with the tray 13, so that the debugger 3 and the power supply 4 for supplying power to the debugger 3 are mounted on the tray 13 through the mounting jig 2, the device to be tested 5 is mounted on the bearing surface of the tray 13, and the tray 13 can move on the main support 12, which facilitates the use of the debugger 3 to test the device to be tested 5. When the debugger 3 tests the device to be tested 5, the device to be tested 5 is mounted on the bearing surface 11, the mounting jig 2 on which the debugger 3 and the power supply 4 for supplying power to the debugger 3 are mounted is connected to the tray 13 to test the device to be tested 5, and after the testing of the device to be tested 5 is completed, the mounting jig 2 can be detached from the tray to repeat the operation of testing the device to be tested 5. The operator can not hold the debugger 3 during the testing process, which frees the hand space of the operator, facilitates the operator to test the device to be tested 5, and improves the testing efficiency of the device to be tested 5.

[0048] For the convenience of description, the direction shown by the arrow R1 in the figure is the first direction, the direction shown by the arrow R2 in the figure is the second direction, and the direction shown by the arrow R3 in the figure is the third direction.

[0049] Exemplarily, the first direction and the second direction are perpendicular, the second direction and the third direction are perpendicular, and the first direction and the third direction are perpendicular.

[0050] In an embodiment, referring to Figure 1 , Figure 2 and Figure 5 , the mounting jig 2 has a hook 21, and the hook 21 is hung on the tray 13 so that the mounting jig 2 is detachably connected with the tray 13.

[0051] In the embodiment of the application, the mounting jig 2 is installed on the tray 13 through the hook 21, and the mounting jig 2 is hung on the tray 13 through the hook 21. The mounting jig 2 is simple to install, and the debugger 3 and the mounting jig 2 are convenient to place and disassemble, thereby improving the test efficiency.

[0052] It can be understood that the mounting jig 2 is not limited to having the hook 21. Exemplarily, the tray 13 is provided with a hook, and the mounting jig 2 is provided with a handle, and the handle of the mounting jig 2 is hung on the hook of the tray 13.

[0053] Exemplarily, the tray 13 is provided with a mounting groove, and the mounting jig 2 is placed in the mounting groove of the tray 13.

[0054] In an embodiment, referring to Figure 1 and Figure 2 , the tray 13 is provided with a handle 131 for operating the tray 13 to move relative to the main support 12, and the hook 21 is hung on the handle 131.

[0055] In the embodiment of the application, the hook 21 of the mounting jig 2 is hung on the handle 131 of the tray 13, does not occupy the space of the bearing surface 11 on the tray 13, and allows more devices 5 to be tested to be arranged on the bearing surface 11 of the tray 13, thereby improving the space utilization of the test device. The mounting jig 2 is hung on the handle 131, reduces the space of the bearing surface 11 on the tray 13 occupied by the mounting jig 2, the space of the bearing surface 11 on the tray 13 is larger, and in addition to the fault elimination test on part of the devices 5 to be tested on the bearing surface 11, the bearing surface 11 has operation space to perform other test operations on another part of the devices 5 to be tested on the bearing surface 11, and the plurality of devices 5 to be tested do not affect each other.

[0056] It can be understood that the hook 21 is not limited to being hung on the handle 131. Exemplarily, the tray 13 is provided with a barb, the direction of the barb is opposite to the direction of the hook 21, and the hook 21 of the mounting jig 2 is hung on the barb of the tray 13.

[0057] In an embodiment, referring to Figures 3-5The mounting jig 2 comprises a main box 22 and an auxiliary box 23. The main box 22 has a first accommodating cavity 221 for accommodating the debugger 3, and a first mounting port 222 communicating with the first accommodating cavity 221, the first mounting port 222 being used for moving the debugger 3 into or out of the first accommodating cavity 221. The auxiliary box 23 is connected with the main box 22, and has a second accommodating cavity 231 for accommodating the power supply 4, and a second mounting port 232 communicating with the second accommodating cavity 231, the second mounting port 232 being used for moving the power supply 4 into or out of the second accommodating cavity 231.

[0058] In the embodiment, the debugger 3 is accommodated in the main box 22, and the power supply 4 is accommodated in the auxiliary box 23, so that the debugger 3 and the power supply 4 can be more flexibly and conveniently mounted on the mounting jig 2. The debugger 3 is placed in the first accommodating cavity 221, and the power supply 4 is placed in the second accommodating cavity 231, which is beneficial to flexibly arranging the space of the main box 22 and the auxiliary box 23 according to the volume of the debugger 3 and the power supply 4, and improving the space utilization of the mounting jig 2.

[0059] It can be understood that the mounting jig 2 is not limited to comprising the main box 22 and the auxiliary box 23. For example, the mounting jig 2 has a cavity, and the debugger 3 and the power supply 4 are placed in the cavity together.

[0060] In an embodiment, referring to Figures 1-5 , the first mounting port 222 is located at one side of the first accommodating cavity 221 along a first direction, and the second mounting port 232 is located at one side of the second accommodating cavity 231 along the first direction.

[0061] For example, other positions of the main box 22 except the first mounting port are used for limiting the debugger 3 from moving out of the first accommodating cavity 221, and other positions of the auxiliary box 23 except the second mounting port are used for limiting the power supply 4 from moving out of the second accommodating cavity 231.

[0062] In the embodiment, the first mounting port 222 is located at one side of the first accommodating cavity 221 along the first direction, and the second mounting port 232 is located at one side of the second accommodating cavity 231 along the first direction, so that the debugger 3 and the power supply 4 can be mounted on the mounting jig 2 from the same direction, which is convenient for mounting the debugger 3 and the power supply 4.

[0063] It can be understood that the first mounting port 222 and the second mounting port 232 are not limited to facing the same direction. For example, the first mounting port 222 and the second mounting port 232 face two directions intersecting with each other.

[0064] In an embodiment, referring to Figures 2-5 , the first direction is parallel to the direction of gravity and opposite to the direction of gravity.

[0065] In the embodiment, the first direction is parallel to and opposite to the direction of gravity, the first mounting port 222 and the second mounting port 232 are opposite to the direction of gravity, the debugger 3 is limited in the first accommodating cavity 221 by gravity, the power supply 4 is limited in the second accommodating cavity 231 by gravity, the debugger 3 and the power supply 4 are not easy to fall off from the mounting jig 2, and the debugger 3 and the power supply 4 are stably mounted.

[0066] It can be understood that the first direction is not limited to being parallel to the direction of gravity. For example, the first direction is crossed with the direction of gravity.

[0067] In an embodiment, referring to Figures 3-5 The auxiliary box 23 has a first avoiding port 233 for avoiding the output port of the power supply 4 and a second avoiding port 234 for avoiding the input port of the power supply 4, the arrangement direction of the first avoiding port 233 and the second avoiding port 234 is the second direction, the arrangement direction of the main box 22 and the auxiliary box 23 is the third direction, the first direction is arranged to be crossed with the third direction, and the second direction is arranged to be crossed with the first direction and the third direction respectively, and the side of the main box 22 away from the first direction is formed with a third avoiding port 223 in communication with the first accommodating cavity 221, and the third avoiding port 223 is used for avoiding the wiring port of the debugger 3, and the wiring port includes the power supply port.

[0068] In the embodiment, the third avoiding port 223 is arranged on the main box 22, the first avoiding port 233 and the second avoiding port 234 are arranged on the auxiliary box 23, the debugger 3 and the power supply 4 are electrically connected through wires through the first avoiding port 233 and the third avoiding port 223. The power supply 4 is charged through the second avoiding port 234, the first avoiding port 233 and the second avoiding port 234 are not in the same direction as the second mounting port 232, the third avoiding port 223 is not in the same direction as the first mounting port 222, and the wires of the debugger 3 and the power supply 4 do not limit the mounting of the debugger 3 and the power supply 4.

[0069] It can be understood that the third avoiding port 223 can not be arranged on the main box 22, and the first avoiding port 233 and the second avoiding port 234 can not be arranged on the auxiliary box 23. For example, the wiring port of the debugger 3 is located on the side of the debugger 3 facing the first mounting port 222, the wiring port of the debugger 3 is avoided through the first mounting port 222, the output port of the power supply 4 and the input port of the power supply 4 are located on the side of the power supply 4 facing the second mounting port 232, and the output port of the power supply 4 and the input port of the power supply 4 are avoided through the second mounting port 232.

[0070] In an embodiment, referring to Figures 3-5The main box 22 includes a back plate 225 and a side plate 226, the first accommodating cavity 221 is located between the back plate 225 and the auxiliary box 23 along the third direction, the side plate 226 is connected between the back plate 225 and the auxiliary box 23, the back plate 225 is provided with the side plate 226 on opposite sides along the second direction, the two side plates 226 are arranged at intervals, and the auxiliary box 23 is arranged between the two side plates 226 along the second direction.

[0071] In the embodiment of the application, the two side plates 226 are arranged at intervals, an open structure is formed between the side plate 226 and the back plate 225, the debugger 3 is located in the open structure formed by the side plate 226 and the back plate 225, and the auxiliary box 23 is arranged between the two side plates 226, which can better install the auxiliary box 23 and is beneficial to heat dissipation of the debugger 3 towards the side of the power supply 4.

[0072] It can be understood that the auxiliary box 23 is not limited to being arranged between the two side plates 226. For example, the auxiliary box 23 is installed on the back plate 225.

[0073] In an embodiment, referring to Figures 3-5 The main box 22 further includes a bottom plate 227, the bottom plate 227, the two side plates 226 and the auxiliary box 23 surround to form a fourth avoiding opening 224, the fourth avoiding opening 224 is used for avoiding the indicator lamp 31 of the debugger 3, and the third avoiding opening 223 is formed in the bottom plate 227.

[0074] For example, the third avoiding opening 223 is located on a side of the main box 22 away from the first direction, and the fourth avoiding opening 224 is located on a side of the main box 22 along the third direction towards the auxiliary box 23.

[0075] In the embodiment of the application, the fourth avoiding opening 224 avoids the indicator lamp 31, which is convenient for real-time judgment of the state of the debugger 3 through the indicator lamp 31 of the debugger 3 in the process of testing the to-be-tested device 5.

[0076] It can be understood that the bottom plate 227, the two side plates 226 and the auxiliary box 23 are not limited to surrounding to form the fourth avoiding opening 224. For example, the indicator lamp 31 of the debugger 3 is avoided through the third avoiding opening 223.

[0077] In an embodiment, referring to Figures 3-5 The back plate 225 is provided with a first heat dissipation hole 228, and the side plate 226 is provided with a second heat dissipation hole 229, and the first heat dissipation hole 228 and the second heat dissipation hole 229 are in communication with the first accommodating cavity 221.

[0078] In the embodiment of the application, the first heat dissipation hole 228 and the second heat dissipation hole 229 improve the heat dissipation efficiency of the debugger 3, which is beneficial to use of the debugger 3.

[0079] It can be understood that the first heat dissipation hole 228 can not be arranged on the back plate 225, and the second heat dissipation hole 229 can not be arranged on the side plate 226.

[0080] In an embodiment, referring to Figure 3 and Figure 4 The auxiliary box 23 has a through slot 236 in communication with the second accommodating cavity, and the through slot 236 is arranged across the box wall of the auxiliary box 23 on the side away from the main box 22 along the third direction and the box wall of the auxiliary box 23 on the side away from the first direction.

[0081] In the embodiment of the present application, the through slot 236 is in communication with the second accommodating cavity, and the through slot 236 is arranged across the box wall of the auxiliary box 23 on the side away from the main box 22 along the third direction and the box wall of the auxiliary box 23 on the side away from the first direction. The through slot 236 makes the power supply 4 not completely blocked by the auxiliary box 23, and the through slot 236 is used to avoid the fingers of the operator, so as to facilitate the operator to pass through the through slot 236 to move the power supply 4 into or out of the second accommodating cavity 231.

[0082] It can be understood that the through slot 236 is not limited to being arranged across the box wall of the auxiliary box 23 on the side away from the main box 22 along the third direction and the box wall of the auxiliary box 23 on the side away from the first direction. For example, the through slot 236 is arranged only on the side of the auxiliary box 23 away from the first direction.

[0083] For example, the auxiliary box 23 can not be provided with the through slot 236.

[0084] In an embodiment, referring to Figure 1 and Figure 2 The size of the handle 131 along the second direction is greater than the size of the mounting jig 2 along the second direction.

[0085] For example, the main support 12 is provided with at least two trays 13.

[0086] In the embodiment of the present application, the size of the handle 131 along the second direction is greater than the size of the mounting jig 2 along the second direction, and the size of the handle 131 along the second direction is long enough to allow the position of the mounting jig 2 on the handle 131 to be adjusted flexibly, thereby reducing the possibility that the mounting jig 2 blocks the mounting jig 2 on other trays 13, and facilitating the testing of the devices 5 to be tested on multiple trays 13.

[0087] It can be understood that the size of the handle 131 along the second direction is not limited to being greater than the size of the mounting jig 2 along the second direction. For example, the size of the handle 131 along the second direction is equal to the size of the mounting jig 2 along the second direction.

[0088] In an embodiment, referring to Figures 3-5 The auxiliary box 23 also has a fifth avoiding opening 235 for avoiding the signal lamp 41 of the power supply 4, and the fifth avoiding opening 235 is located on the side of the second accommodating cavity 231 away from the main box 22.

[0089] In the embodiment, the fifth avoiding opening 235 avoids the signal lamp 41 of the power supply 4, so that the running state of the power supply 4 can be observed through the signal lamp 41.

[0090] It can be understood that the fifth avoiding opening 235 is not limited to being located on the side of the second accommodating cavity 231 away from the main box 22. For example, the fifth avoiding opening 235 is located on the side of the second accommodating cavity 231 away from the first direction.

[0091] In an embodiment, referring to Figures 1-5 , the mounting jig 2 has a hook 21, the hook 21 is hung on the tray 13 so that the mounting jig 2 and the tray 13 are detachably connected, and the mounting jig 2 comprises:

[0092] The main box 22 has a first accommodating cavity 221 for accommodating the debugger 3 and a first mounting opening 222 in communication with the first accommodating cavity 221, the first mounting opening 222 is used for moving the debugger 3 into or out of the first accommodating cavity 221, and the hook 21 is formed on the main box 22.

[0093] The auxiliary box 23 is connected with the main box 22, the auxiliary box 23 has a second accommodating cavity 231 for accommodating the power supply 4 and a second mounting opening 232 in communication with the second accommodating cavity 231, the second mounting opening 232 is used for moving the power supply 4 into or out of the second accommodating cavity 231, and the hook 21 is located on the side of the first mounting opening 222 away from the second mounting opening 232.

[0094] In the embodiment, the hook 21 is located on the side of the main box 22 away from the auxiliary box 23, and in the case that the hook 21 is hung on the tray 13, the position of the hook 21 avoids the first mounting opening 222 and the second mounting opening 232 as much as possible, so as to facilitate the installation of the debugger 3 and the power supply 4.

[0095] It can be understood that the hook 21 is not limited to being located on the side of the first mounting opening 222 away from the second mounting opening 232. For example, the hook 21 is located between the first mounting opening 222 and the second mounting opening 232.

[0096] In an embodiment, referring to Figure 1 and Figure 2 , the device to be tested 5 comprises a universal flash memory.

[0097] In the embodiment, the universal flash memory is installed on the bearing surface 11 of the tray 13, the debugger is installed on the mounting jig 2, and the mounting jig 2 is detachably connected to the tray 13, so as to facilitate the use of the debugger 3 to test the universal flash memory.

[0098] In the description of this application, the terms "an embodiment," "some embodiments," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of the embodiments of this application. In this application, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Furthermore, without contradiction, those skilled in the art can combine different embodiments or examples described in this application, as well as features of different embodiments or examples.

[0099] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A test device, characterized by The utility model relates to a bearing base, including main support and tray, the tray is movably installed in main support, the tray has bearing surface, and the bearing surface is used for installing the device to be tested, installation jig is used for installing the debugging device that tests the device to be tested and the power supply that supplies power to the debugging device, and the installation jig is detachably connected with the tray. The installation jig has a hook, and the hook is hung on the tray to detachably connect the installation jig with the tray. The tray is provided with a handle for operating the movement of the tray relative to the main support, and the hook is hung on the handle.

2. The test device of claim 1, wherein, The installation jig comprises:

3. The test device of claim 2, wherein, The main box has a first accommodating cavity for accommodating the debugging device and a first installation opening communicating with the first accommodating cavity, and the first installation opening is used for moving the debugging device into or out of the first accommodating cavity.

4. The test device according to any one of claims 1 to 3, characterized in that The auxiliary box is connected with the main box, and the auxiliary box has a second accommodating cavity for accommodating the power supply and a second installation opening communicating with the second accommodating cavity, and the second installation opening is used for moving the power supply into or out of the second accommodating cavity. The first installation opening is located on one side of the first accommodating cavity along a first direction, and the second installation opening is located on one side of the second accommodating cavity along the first direction. The first direction is parallel to the direction of gravity and opposite in direction.

5. The test device of claim 4, wherein, The auxiliary box has a first avoiding opening for avoiding the output port of the power supply and a second avoiding opening for avoiding the input port of the power supply, and the arrangement direction of the first avoiding opening and the second avoiding opening is a second direction, the arrangement direction of the main box and the auxiliary box is a third direction, the third direction is arranged transversely to the first direction, and the second direction is arranged transversely to the first direction and the third direction, respectively, and the side of the main box away from the first direction is formed with a third avoiding opening communicating with the first accommodating cavity, and the third avoiding opening is used for avoiding a wiring port of the debugging device, and the wiring port comprises a power supply port.

6. The test device of claim 5, wherein, The main box comprises:

7. The test device of claim 5, wherein, The first accommodating cavity is located between the back plate and the auxiliary box along the third direction; 8. The test device of claim 7, wherein, The side plates are arranged on opposite sides of the back plate along the second direction, and the auxiliary box is arranged across the two side plates, and the first accommodating cavity is located between the two side plates along the second direction. The main box further comprises a bottom plate, and the bottom plate, the two side plates and the auxiliary box enclose a fourth avoiding opening for avoiding a indicator light of the debugging device, and the third avoiding opening is formed in the bottom plate. The back plate is formed with a first heat dissipation hole, and the side plates are formed with a second heat dissipation hole, and the first heat dissipation hole and the second heat dissipation hole both communicate with the first accommodating cavity.

9. The test device of claim 8, wherein, The auxiliary box has a through groove communicating with the second accommodating cavity, and the through groove is arranged across the box wall of the auxiliary box away from the main box along the third direction and the box wall of the auxiliary box away from the first direction.

10. The test device of claim 8, wherein, ​ 11. The test device of claim 7, wherein, ​ 12. The test device of claim 7, wherein, The tray is provided with a handle for operating the tray to move relative to the main support, the mounting jig has a hook, the hook is hung on the handle, and the handle is larger than the mounting jig in the second direction.

13. The test device of claim 4, wherein, The auxiliary box also has a fifth avoiding opening for avoiding the signal lamp of the power supply, and the fifth avoiding opening is located on the side of the second accommodating cavity away from the main box.

14. The test device of claim 1, wherein, The mounting jig has a hook, the hook is hung on the tray to detachably connect the mounting jig with the tray, and the mounting jig comprises: The main box has a first accommodating cavity for accommodating the debugger and a first mounting opening in communication with the first accommodating cavity, the first mounting opening is used for moving the debugger into or out of the first accommodating cavity, and the hook is formed on the main box. The auxiliary box is connected with the main box, the auxiliary box has a second accommodating cavity for accommodating the power supply and a second mounting opening in communication with the second accommodating cavity, the second mounting opening is used for moving the power supply into or out of the second accommodating cavity, and the hook is located on the side of the first mounting opening away from the second mounting opening.

15. The test device of any one of claims 1 to 3 or claim 14, wherein, The device to be tested comprises a universal flash memory.

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