Insulation mechanism for high voltage resistance test
By using eccentric pin alignment adjustment and floating electrode design, the problem of fixing and aligning large electronic products under high voltage resistance testing was solved, achieving high-precision and high-stability testing results.
Patent Information
- Application Number
- CN202422618255.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-29
- Publication Date
- 2026-01-02
- Estimated Expiration
- 2034-10-29
AI Technical Summary
In high-voltage resistance testing of large electronic products, the large size makes fixing and alignment difficult, which can easily lead to problems such as leakage and arcing. The accuracy of existing testing structures is difficult to guarantee.
It adopts an eccentric pin alignment adjustment structure and an array-type floating electrode design. The eccentric pin can be rotated and adjusted to ensure that the electrode module is aligned with the product under test, and the floating electrode can adapt to changes in surface shape. Combined with an insulating coating layer, it isolates ionized air.
It achieves precise alignment and tight contact of large electronic products, reduces testing errors, improves the accuracy and stability of testing, and avoids leakage and arcing.
Smart Images
Figure CN223756850U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of electronic product testing, in particular to a high-voltage-resistant testing insulation mechanism. BACKGROUND
[0002] In the production process of electronic, electrical components or products, in order to ensure the performance safety and reliability, the components and products need to be tested for voltage resistance. For large high-voltage electronic products, the test structure needs to withstand high voltage twice the use voltage, and the precision of the high-voltage-resistant testing mechanism and the selection of the parts material are extremely high.
[0003] There are two technical problems in the existing high-voltage-resistant testing of large electronic products. First, due to the large size of large electronic products and voltage-resistant electrodes, the machining difficulty of large-size voltage-resistant testing mechanisms increases, the deviation is large, and the size precision is difficult to effectively guarantee, which leads to the difficulty in aligning when fixing the products to be tested and the voltage-resistant electrodes, and further leads to the problems of increased leakage current, sparking and other problems in the testing process, and finally leads to testing failure. Second, using ordinary test electrodes, air is easily broken down and forms a conductor loop, resulting in testing failure. CONTENT OF THE INVENTION
[0004] In order to solve the problem of the existing technology that the large size of large electronic products and voltage-resistant electrodes leads to the difficulty in fixing and aligning, and easily causes leakage, sparking and other problems, and finally leads to testing failure.
[0005] The present application provides a high-voltage-resistant testing insulation mechanism, which comprises a test conductive plate group and a bearing conductive plate for placing the product to be tested.
[0006] The test conductive plate group comprises a fixed plate and an electrode module arranged on the fixed plate.
[0007] Both ends of the fixed plate are respectively provided with at least one alignment adjustment structure, the alignment adjustment structure comprises an eccentric pin, the eccentric pin can rotate relative to the fixed plate, and the axis lines of both ends thereof do not coincide, the eccentric pin is used for cooperating with the pin hole on the product positioning plate, so that the electrode module is aligned with the product to be tested.
[0008] Further, the eccentric pin comprises a first shaft section and a second shaft section, the first shaft section is connected with the fixed plate, and the second shaft section is used for connecting with the product positioning plate, the axis lines of the first shaft section and the second shaft section do not coincide.
[0009] Further, the electrode module comprises a plurality of arrayed floatable electrodes.
[0010] Further, each of the floatable electrodes comprises a floating assembly and an electrode contact, the electrode contact is arranged at one end of the floating assembly and is movable relative to the fixed plate to be attached to the product to be tested.
[0011] Further, the electrode contact is provided with an insulating coating layer on the outside, the bottom surface of the insulating coating layer is protruded from the bottom surface of the electrode contact, when the insulating coating layer is deformed under pressure, the electrode contact is in contact with the product to be tested.
[0012] Further, the height difference between the bottom surface of the insulating coating layer and the bottom surface of the electrode contact is 0.2mm-0.5mm.
[0013] Further, the test conductive plate set and the bearing conductive plate are respectively connected to the positive and negative poles of the power supply through conductive wires.
[0014] Further, the floating assembly comprises an elastic member, a linear guide rail set and a moving plate.
[0015] The linear guide rail set is used to be connected with the fixed plate, the moving plate is connected with the linear guide rail set and the electrode contact respectively, and the elastic member is used to drive the moving plate to move relative to the fixed plate.
[0016] Further, the linear guide rail set comprises a guide rail seat and a sliding block, the guide rail seat is used to be connected with the fixed plate, and the sliding block is connected with the moving plate.
[0017] Further, the electrode contact is a copper electrode.
[0018] The implementation of the embodiment of the present application has the following beneficial effects:
[0019] The eccentric pin in the alignment adjustment structure can rotate relative to the fixed plate, and the axes of the two ends thereof do not coincide, which design makes the test conductive plate, in the case that the size precision is not guaranteed due to the large size and the machining error of the parts, can be adjusted through the adjustment of the alignment adjustment structure, so that even if the initial size or position of the test conductive plate has deviation, it can also be accurately aligned with the product to be tested after adjustment, and the electrode module and the electrode point of the product to be tested can be accurately corresponded. The positioning problem caused by the structural precision limitation of the large-scale high-voltage test mechanism is solved, and the accuracy and reliability of the test are improved.
[0020] The application sets multiple arrayed floatable electrodes, each electrode contact can adapt to the surface shape and height variation of the product to be tested, solves the fitting problem caused by the machining error or poor flatness of the traditional single large size electrode and the insufficient flatness of the electrode surface of the product to be tested, ensures the close contact between the electrode contact and the electrode surface of the product to be tested, improves the accuracy of the test, and also enhances the stability of the test, reduces the test failure rate caused by poor contact. BRIEF DESCRIPTION OF DRAWINGS
[0021] In order to more clearly illustrate the technical solutions of the present application, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are only some embodiments of the present application, and those skilled in the art can obtain other drawings according to these drawings without creating any creative labor.
[0022] Figure 1 is a structural schematic diagram of the test conductive plate group of the embodiment of the present application;
[0023] Figure 2 is a structural schematic diagram of the alignment adjustment structure of the embodiment of the present application;
[0024] Figure 3 is a structural schematic diagram of the eccentric pin of the embodiment of the present application;
[0025] Figure 4 is a schematic diagram of the test conductive plate group and the product positioning plate of the embodiment of the present application;
[0026] Figure 5 is a structural schematic diagram of the floatable electrode of the embodiment of the present application;
[0027] Figure 6 is a structural schematic diagram of the electrode contact and the insulating coating layer of the embodiment of the present application;
[0028] Figure 7 is a schematic diagram of the high-voltage test insulating mechanism of the embodiment of the present application for high-voltage test.
[0029] In the figure, the reference signs correspond to: test conductive plate group 1, fixed plate 11, floatable electrode 12, floating assembly 121, elastic member 1211, linear guide rail group 1212, moving plate 1213, guide rail seat 1214, sliding block 1215, electrode fixed plate 1216, electrode contact 122, insulating coating layer 123, alignment adjustment structure 13, eccentric pin 130, first shaft section 131, second shaft section 132, third shaft section 133, fixed screw 134, adjusting screw 135, adjusting support plate 136, bearing conductive plate 2, product to be tested 3, product positioning plate 4. DETAILED DESCRIPTION
[0030] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.
[0031] In the description of this application, it should be understood that the terms "upper," "lower," "inner," "outer," "top," and "bottom," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or regarding the vertical, perpendicular, or gravitational direction of the component itself. These terms are used only for the convenience of describing this application and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include one or more of that feature.
[0032] Unless otherwise defined, the technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used herein is for descriptive purposes only and is not intended to limit the scope of this application. Terms such as “part” or “component” appearing herein can refer to a single part or a combination of multiple parts. Terms such as “installation,” “setup,” and “connection” appearing herein should be interpreted broadly; for example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can indicate that one component is directly attached to another component or that one component is attached to another component via an intermediate component; they can refer to the internal connection of two elements. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances. A feature described in one embodiment herein may be applied alone or in combination with other features to another embodiment, unless that feature is not applicable in that other embodiment or is otherwise stated.
[0033] The following combination Figures 1-7 This application introduces a high-voltage insulation testing mechanism for high-voltage insulation testing with voltages greater than 4300V. In practical use, it is easy to assemble and debug, and its function is stable and reliable.
[0034] The high-voltage withstand test insulation mechanism in this embodiment includes a test conductive plate group 1 and a carrier conductive plate 2 for placing the product under test 3.
[0035] The test conductive plate set 1 comprises a fixed plate 11 and an electrode module arranged on the fixed plate 11;
[0036] The fixed plate 11 is provided with at least one alignment adjustment structure 13 at each end, the alignment adjustment structure 13 comprises an eccentric pin 130 which can rotate relative to the fixed plate 11 and the axes of the two ends thereof do not coincide, the eccentric pin 130 is used to cooperate with the pin hole on the product positioning plate 4 to align the electrode module 12 with the product to be tested 3.
[0037] Specifically, the test conductive plate 1 is arranged above the bearing conductive plate 2, and the product to be tested is fixed on the bearing conductive plate 2 through the product positioning plate 4.
[0038] The electrode module is arranged below the fixed plate 11, when the test conductive plate set 1 moves downward to the position where the eccentric pin 130 cooperates with the pin hole on the product positioning plate 4, the electrode module is aligned with the electrode points of the product to be tested. The electrode module can be designed in different shapes and sizes to meet the testing requirements of different products to be tested. The number and position of the alignment adjustment structure 13 can be adjusted according to the size and shape of the product to be tested.
[0039] The eccentric pin 130 of the embodiment can rotate relative to the fixed plate 11. In a possible implementation, the alignment adjustment structure 13 comprises a fixing screw 134, an adjusting screw 135 and an adjusting support plate 136, the eccentric pin 130 comprises a third shaft segment 133, at least one side of the third shaft segment 133 is a plane to cooperate with the adjusting support plate 136 to limit the rotation of the eccentric pin 130. Preferably, the cross section of the third shaft segment 133 is rectangular, square or other special shape with at least one straight side. The cross section design of the third shaft segment 133 facilitates the cooperation and docking with the corresponding plane on the adjusting support plate 136, and also provides the necessary stability and anti-rotation ability. Specifically, one end of the eccentric pin 130 is connected with the fixed plate 11 through the fixing screw 134. One end of the adjusting support plate 136 is connected with the third shaft segment 133, and the other end is kept in a relative fixed state with the fixed plate 11 through the adjusting screw 135. Specifically, the adjusting screw 135 penetrates the adjusting support plate 136, directly contacts with the fixed plate 11 and generates a pressing force, thereby realizing the stable connection of the two.
[0040] In the alignment adjustment structure 13, the eccentric pin 130 can rotate relative to the fixed plate 11, and the axes of the two ends thereof do not coincide. This design enables the test conductive plate 1 to be accurately aligned with the product to be tested 3 after adjustment through the alignment adjustment structure 13, even if the initial size or position of the test conductive plate 1 deviates, while ensuring that the electrode module accurately corresponds to the electrode points of the product to be tested 3. This solves the positioning problem of large high-voltage test mechanism due to structural precision limitations, and improves the accuracy and reliability of the test.
[0041] Further, the eccentric pin 130 comprises a first shaft segment 131 connected with the fixed plate 11 and a second shaft segment 132 used for connecting with the product positioning plate 4, and the axes of the first shaft segment 131 and the second shaft segment 132 do not coincide.
[0042] Specifically, the process of rotating the eccentric pin 130 to adjust the distance between the two ends of the fixed plate 11 to match the position of the pin hole on the product positioning plate 4 comprises: loosening the fixing screw 134; loosening the adjusting screw 135 at one end of the adjusting support plate 136 to separate from the fixed plate 11; rotating the eccentric pin 130 to make the positions of the eccentric pins 130 at the two ends of the fixed plate 11 correspond to the position of the pin hole on the product positioning plate 4, so that the test conductive plate 1 can be normally buckled with the product positioning plate 4 to realize accurate alignment of the electrode module with the product to be tested 3. The eccentric pin 130 of the embodiment has simple structure, reliable function and easy installation, and the positioning distance can be adjusted by adjusting the eccentric amount of the eccentric pin 130 to meet different positioning requirements.
[0043] Further, the electrode module comprises a plurality of arrayed floating electrodes 12. Further, each floating electrode 12 comprises a floating assembly 121 and an electrode contact 122, and the electrode contact 122 is arranged at one end of the floating assembly 121 and can move relative to the fixed plate 11 to adhere to the product to be tested 3.
[0044] The embodiment effectively solves the problems of deformation, unevenness and processing errors caused by excessive electrode area by using a plurality of small floating electrodes 12 to replace the traditional whole electrode. Each electrode contact 122 can move freely relative to the fixed plate 11 to ensure that each electrode contact 122 can closely adhere to the surface of the product to be tested, which is conducive to reducing the test error caused by poor contact or uneven pressure and reducing the risk of ionized air leakage, thereby improving the ionization efficiency and the accuracy of the test. The arrayed floating electrodes 12 can be fine-tuned according to the shape and size of different products to be tested 3, and each electrode contact 122 can independently float and adapt to the slight changes of the surface, so that the electrode module can be widely applied to various products to be tested with complex shape and uneven surface, thereby expanding the test range and application field.
[0045] Further, the outer side of the electrode contact 122 is provided with an insulating coating layer 123, and the bottom surface of the insulating coating layer 123 protrudes from the bottom surface of the electrode contact 122. When the insulating coating layer 123 is deformed under pressure, the electrode contact 122 contacts the product to be tested 3.
[0046] Specifically, the insulating coating layer 123 can be made of a material with good elasticity, wear resistance, and insulation properties. Preferably, the insulating coating layer 123 can be made of thermoplastic elastomers, silicone rubber, polyurethane, or polytetrafluoroethylene. The thickness and shape of the insulating coating layer 123 can be adjusted according to testing requirements to adapt to electrode contacts of different shapes and performance and testing conditions. In this embodiment, the insulating coating layer 123 can withstand a high voltage of not less than 6000V and can isolate ionized air from all sides during testing.
[0047] Further, the height difference between the bottom surface of the insulating coating layer 123 and the bottom surface of the electrode contact 122 is H, and H ranges from 0.2mm to 0.5mm. Optionally, the height difference H between the bottom surface of the insulating coating layer 123 and the bottom surface of the electrode contact 122 can be 0.2mm, 0.3mm, 0.4mm, and 0.5mm. Preferably, it is 0.3mm.
[0048] In this embodiment, as Figure 7 As shown, the bottom surface of the electrode contact 122 is 0.3 mm lower than the bottom surface of the insulating coating layer 123. When the test conductive plate 1 is pressed down, it causes the floating electrode 12 to be pressed down to perform a withstand voltage test. The protruding layer on the bottom surface of the insulating coating layer 123 is compressed, sealing the bottom electrode surface of the electrode contact 122 inside the wear-resistant insulating coating layer 123, isolating ionized air. At the same time, the electrode contact 122 is in contact with the product under test 3, completing the entire withstand voltage test.
[0049] This embodiment effectively isolates the influence of ionized air on the high-voltage withstand voltage test by setting the insulating coating layer 123, thereby improving the accuracy and stability of the test. The insulating coating layer 123 allows the electrode contacts 122 to make better contact with the product under test during the test, while avoiding arcing and leakage during the test.
[0050] Furthermore, the test conductive plate group 1 and the carrier conductive plate 2 are respectively connected to the positive and negative terminals of the power supply through conductive lines to facilitate the withstand voltage test.
[0051] Furthermore, the floating component 121 includes an elastic element 1211, a linear guide rail assembly 1212, and a movable plate 1213; the linear guide rail assembly 1212 is used to connect with the fixed plate 11, the movable plate 1213 is connected to the linear guide rail assembly 1212 and the electrode contact 122 respectively, and the elastic element 1211 is used to drive the movable plate 1213 to move relative to the fixed plate 11.
[0052] Furthermore, the linear guide rail assembly 1212 includes a guide rail seat 1214 and a sliding block 1215. The guide rail seat 1214 is used to connect with the fixed plate 11, and the sliding block 1215 is connected with the movable plate 1213.
[0053] In a possible implementation, the guide rail seat 1214 of the linear guide rail set 1212 is connected with the fixed plate 11, the guide rails on the guide rail seat 1214 extend in a direction perpendicular to the fixed plate 11, and the sliding block 1215 is in sliding connection with the guide rail seat 1214. The sliding block 1215 is fixedly connected with the moving plate 1213, one end of the moving plate 1213 is free to move in a direction perpendicular to the fixed plate 11 through the elastic element 1211, and the other end is fixedly connected with the electrode contact 122.
[0054] In another possible implementation, the floating assembly 121 includes an electrode fixed plate 1216, the guide rail seat 1214 is connected with the electrode fixed plate 1216, and the sliding block 1215 is in sliding connection with the guide rail seat 1214. The sliding block 1215 is fixedly connected with the moving plate 1213, one end of the moving plate 1213 is free to move in a direction perpendicular to the electrode fixed plate 1216 through the elastic element 1211, and the other end is fixedly connected with the electrode contact 122.
[0055] The embodiment sets the floating assembly 121, so that each electrode contact 122 can better adapt to the surface shape and height variation of the product to be tested 3, solves the fitting problem of the traditional single large-size electrode caused by machining error or poor flatness and insufficient flatness of the electrode surface of the product to be tested, ensures the close contact between the electrode contact and the electrode surface of the product to be tested, improves the accuracy of the test, and also enhances the stability of the test and reduces the test failure rate caused by poor contact.
[0056] The linear guide rail set 1212 in the floating assembly 121 not only provides stable movement guidance, but also ensures accurate trajectory control of the electrode contact 122 during the test process, effectively reduces the test error caused by inaccurate electrode movement, and makes the test result more reliable.
[0057] Further, the electrode contact 122 is a copper electrode. It has excellent electrical conductivity, is easy to process and shape, has good corrosion resistance, can quickly and efficiently transmit current in electrochemical reactions or electrical tests, can work stably for a long time under certain conditions, is not easily affected by environmental factors, and is particularly important for applications such as voltage resistance tests that require high current density.
[0058] Obviously, the above-described embodiments are only part of the embodiments of the present specification, rather than all. Based on the embodiments in the present specification, those skilled in the art can make other different forms of changes or modifications without creative labor, and all should fall within the protection scope of the present specification.
[0059] Other embodiments of the present application will be apparent to those skilled in the art from consideration of the specification and practice of the application disclosed herein. It is intended that the specification and examples be considered as exemplary only, with the true scope and spirit of the application being indicated by the following claims.
[0060] It is to be understood that the present application is not limited to the precise construction described in the specification and shown in the drawings, and that various modifications and changes can be effected therein by those skilled in the art without departing from the scope of the application. The scope of the present application is limited only by the claims that follow.
Claims
1. A high voltage test insulation mechanism, characterized by, The test conductive plate group (1) and the bearing conductive plate (2) for placing the product to be tested (3); The test conductive plate group (1) comprises a fixed plate (11) and an electrode module arranged on the fixed plate (11); Both ends of the fixed plate (11) are respectively provided with at least one alignment adjustment structure (13), the alignment adjustment structure (13) comprises an eccentric pin (130), the eccentric pin (130) can rotate relative to the fixed plate (11), and the axes of both ends of the eccentric pin (130) do not coincide, the eccentric pin (130) is used for cooperating with a pin hole on a product positioning plate (4) to align the electrode module with the product to be tested (3).
2. The high voltage test insulation mechanism of claim 1, wherein, The eccentric pin (130) comprises a first shaft section (131) and a second shaft section (132), the first shaft section (131) is connected with the fixed plate (11), and the second shaft section (132) is used for connecting with the product positioning plate (4), the axes of the first shaft section (131) and the second shaft section (132) do not coincide.
3. The high voltage test insulation mechanism of claim 1, wherein, The electrode module comprises a plurality of arrayed floatable electrodes (12).
4. The high voltage test insulation mechanism of claim 3, wherein, Each floatable electrode (12) comprises a floating assembly (121) and an electrode contact (122), the electrode contact (122) is arranged at one end of the floating assembly (121) and can move relative to the fixed plate (11) to adhere to the product to be tested (3).
5. A high voltage test insulation mechanism according to claim 4, wherein, The outer side of the electrode contact (122) is provided with an insulating coating layer (123), the bottom surface of the insulating coating layer (123) protrudes from the bottom surface of the electrode contact (122), when the insulating coating layer (123) is deformed under pressure, the electrode contact (122) contacts the product to be tested (3).
6. A high voltage test insulation mechanism according to claim 5, wherein, The height difference between the bottom surface of the insulating coating layer (123) and the bottom surface of the electrode contact (122) is 0.2mm-0.5mm.
7. The high voltage testing insulation mechanism of claim 1, wherein, The test conductive plate group (1) and the bearing conductive plate (2) are respectively connected to the positive and negative poles of a power supply through conductive wires.
8. The high voltage testing insulation mechanism of claim 4, wherein, The floating assembly (121) comprises an elastic member (1211), a linear guide rail group (1212) and a moving plate (1213); The linear guide rail group (1212) is used for connecting with the fixed plate (11), the moving plate (1213) is connected with the linear guide rail group (1212) and the electrode contact (122) respectively, and the elastic member (1211) is used for driving the moving plate (1213) to move relative to the fixed plate (11).
9. A high voltage test insulation mechanism according to claim 8, wherein, The linear guide rail group (1212) comprises a guide rail seat (1214) and a sliding block (1215), the guide rail seat (1214) is used for connecting with the fixed plate (11), and the sliding block (1215) is connected with the moving plate (1213).
10. The high voltage testing insulation mechanism of claim 4, wherein, The electrode contact (122) is a copper electrode.