Diode testing device

Abstract

The utility model discloses a diode testing device which comprises a base and a digital multimeter, the upper surface of the base is fixedly provided with a test board, the upper surface of the test board is transversely provided with a plurality of placement holes, the lower surface of the test board is provided with conducting rods, the conducting rods are connected with the placement holes, the bottom surfaces of the placement holes are provided with jacks, and the jacks penetrate through the test board and the conducting rods. The conducting rod is provided with a connecting hole matched with a meter pen of the digital multimeter; supporting pieces are oppositely arranged on the two side edges of the upper surface of the testing table, the two supporting pieces are jointly connected with a moving rod in a sliding mode, the moving rod is made of insulation materials, a plurality of through holes are transversely arrayed in the moving rod, conductive tubes are arranged in the through holes in a matched mode, the central axes of the conductive tubes coincide with the central axes of the inserting holes, and the conductive tubes are fixedly connected with a testing rod. The positive and negative electrode pins of the diode are inserted into the jacks and the conductive tubes, so that the test efficiency is improved, and the pins of the diode cannot be damaged by the meter pen of the digital multimeter.

Description

TECHNICAL FIELD

[0001] The utility model belongs to diode testing equipment technical field especially relates to the testing device of a plurality of diodes can be tested. BACKGROUND

[0002] Diode is made of (silicon, selenium, germanium, etc.) a kind of electronic device, diode has unidirectional conductivity, the current direction is from anode to cathode when conducting, diode production needs to test whether diode is unidirectional conduction when leaving factory, to pick out unqualified products.

[0003] The most common method for testing diode at present is digital multimeter, the digital multimeter is adjusted to diode detection position, the red pen of digital multimeter is touched to the anode of diode, and the black pen is touched to the cathode of diode, the value greater than 1 shown by digital multimeter indicates forward voltage drop value, represents diode conduction, otherwise digital multimeter shows number 1, then indicates diode cut-off, so it is proved that diode is qualified, but using red and black pens of digital multimeter to test diode one by one, it is time-wasting and labor cost-wasting, and the testing efficiency is very low, the pin of diode is usually thin, and it is easy to bend the pin of diode when directly pressing the pen of digital multimeter during testing, even the diode itself can be damaged, leading to diode failure. UTILITY MODEL CONTENT

[0004] The utility model aims at setting multiple installation holes, and inserting diode anode and cathode pins into insertion hole and conductive tube, to solve the problem of using red and black pens of digital multimeter to test diode one by one, leading to very low testing efficiency, and the pen of digital multimeter is easy to damage diode pin.

[0005] The specific technical scheme of the utility model is as follows:

[0006] A kind of diode testing device, including base and digital multimeter, the test table is fixed on the upper surface of base, the upper surface of test table is transversely arrayed with several installation holes, the lower surface of test table is equipped with conductive rod, the conductive rod is connected with the installation hole, the hole bottom surface of installation hole is equipped with insertion hole, the insertion hole penetrates test table and conductive rod, the conductive rod is equipped with the connecting hole adapted to the pen of digital multimeter;Opposite support piece is equipped on the upper surface of test table two sides, two support pieces are slidably connected with moving rod, the moving rod is of insulating material, there are several through holes on the moving rod, the through hole is adapted to conductive tube, the central axis of conductive tube coincides with the central axis of insertion hole, and the test rod is fixedly connected to the conductive tube.

[0007] Further, vertical sliding grooves are arranged on opposite sides of the two support members respectively, and the two sides of the moving rod are respectively provided with sliding blocks matched with the vertical sliding grooves, and the cross section of the vertical sliding groove is trapezoidal.

[0008] Further, the moving rod is made of insulating rubber.

[0009] Further, the conductive pipe is in interference fit with the through hole, and the sliding block is in interference fit with the vertical sliding groove.

[0010] Further, the conductive pipe and the test rod are made of metal.

[0011] Further, the conductive rod is made of metal.

[0012] Further, the conductive rod is fixedly connected with a connecting rod, the connecting rod is made of metal, the connecting hole penetrates through the connecting rod, and a clamping surface is arranged on the outer surface of the connecting rod.

[0013] Further, the front facade of the test table is provided with character identification.

[0014] Further, the upper surface of the base is axially connected with a backrest through a hole, the back surface of the backrest is axially connected with a supporting leg through a hole, and the upper surface of the base is provided with a limiting groove matched with the supporting leg.

[0015] Further, the upper surface of the base is provided with a receiving groove I matched with the backrest, the backrest and the receiving groove I are axially connected through the inner vertical surfaces of the two sides, the back surface of the backrest is provided with a receiving groove II matched with the supporting leg, the supporting leg and the receiving groove II are axially connected through the inner vertical surfaces of the two sides, and the limiting groove is located on the upper surface of the groove bottom of the receiving groove I and longitudinally arranged.

[0016] Compared with the prior art, the utility model has the following beneficial effects:

[0017] 1, when testing, the digital multimeter is adjusted to the diode detection position, the positive pin of the diode is inserted into the hole, the negative pin is inserted into the conductive pipe, the red pen of the digital multimeter is inserted into the connecting hole, the black pen touches the test rod, the value greater than 1 displayed by the digital multimeter represents the forward voltage drop value of the diode, which represents that the diode is turned on, then the black pen of the digital multimeter is inserted into the connecting hole, the red pen touches the test rod, the digital multimeter displays the number 1, which indicates that the diode is cut off, so as to judge whether the diode is qualified, a plurality of setting holes are arranged on the test table, and a plurality of conductive pipes can be assembled on the moving rod, the whole diode testing device can test a plurality of diodes at the same time, the testing efficiency is improved, and the enterprise saves time and labor testing cost.

[0018] 2、Because the pins of the diode are connected with the jack and the conductive tube respectively, when testing, the test pen of the digital multimeter will not directly press the pins, and the pins can be avoided from being damaged to cause the diode to be invalid. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 It is a three-dimensional structural schematic view of the embodiment of the utility model;

[0020] Figure 2 It is Figure 1 It is a partial enlarged schematic view of A in the middle;

[0021] Figure 3 It is a structural schematic view of the top of the base in the embodiment of the utility model;

[0022] Figure 4 It is a front view of the base in the embodiment of the utility model;

[0023] Figure 5 It is a three-dimensional structural schematic view of the moving rod in the embodiment of the utility model;

[0024] Figure 6 It is a three-dimensional structural schematic view of the conductive tube and the test rod in the embodiment of the utility model;

[0025] Figure 7 It is a three-dimensional structural schematic view of the diode in the embodiment of the utility model;

[0026] Figure 8 It is a three-dimensional structural schematic view of the backboard being stored in storage groove one in the embodiment of the utility model;

[0027] Figure 9 It is a three-dimensional structural schematic view of the backboard being supported by the supporting leg in the embodiment of the utility model;

[0028] REFERENCE NUMERALS:

[0029] 1, base; 11, test table; 111, character mark; 12, arrangement hole; 121, jack; 13, supporting piece; 131, vertical sliding slot; 14, conductive rod; 141, connecting hole; 15, connecting rod; 151, clamping surface; 16, limiting slot; 17, storage groove one;

[0030] 2, moving rod; 21, through hole; 22, sliding block;

[0031] 3, conductive tube; 31, test rod;

[0032] 4, digital multimeter; 41, test pen;

[0033] 5, backboard; 51, supporting leg; 52, storage groove two;

[0034] 6, diode; 61, pin. DETAILED DESCRIPTION

[0035] In order to better understand the purpose, structure and function of the utility model, the technical solutions in the embodiments of the utility model will be clearly and completely described below in combination with the drawings.

[0036] Referring to Figures 1 to 9 The embodiment discloses a diode testing device which comprises a base 1 and a digital multimeter 4, a testing table 11 is fixedly arranged on the upper surface of the base 1, a plurality of placement holes 12 are horizontally arranged on the upper surface of the testing table 11 and used for placing diodes 6, a conductive rod 14 is arranged on the lower surface of the testing table 11, the conductive rod 14 is connected with the placement holes 12, a jack 121 is arranged on the bottom surface of each placement hole 12, the jack 121 penetrates through the testing table 11 and the conductive rod 14, the pins 61 of the diodes 6 are electrically connected with the conductive rod 14 through the jacks 121, the conductive rod 14 is provided with a connecting hole 141 which is matched with a probe 41 of the digital multimeter 4, during testing, the probe 41 of the digital multimeter 4 is inserted into the connecting hole 141 and connected with the pins 61 through the conductive rod 14, a support 13 is arranged on each side of the upper surface of the testing table 11, two support 13s are jointly and slidably connected with a moving rod 2, the moving rod 2 is made of insulating material, a plurality of through holes 21 are horizontally arranged on the moving rod 2, a conductive tube 3 is matched with each through hole 21, the inner diameter of the conductive tube 3 is same as that of the pins 61 of the diodes 6, when the pins 61 are inserted into the conductive tube 3, the pins 61 are electrically connected with the conductive tube 3, the central axis of the conductive tube 3 coincides with that of the jacks 121, so that the positive and negative pins of the diodes 6 will not be bent when being inserted into the jacks 121 and the conductive tube 3, the conductive tube 3 is fixedly connected with a testing rod 31, during testing, the probe 41 of the digital multimeter 4 touches the testing rod 31 and does not need to be pressed on the pins 61.

[0037] Vertical sliding grooves 131 are arranged on the opposite vertical surfaces of the two support 13s respectively, and sliding blocks 22 are arranged on the two sides of the moving rod 2 and matched with the vertical sliding grooves 131 respectively, the moving rod 2 is slidably matched with the vertical sliding grooves 131 through the sliding blocks 22, so as to adjust the use height and better apply to diodes 6 with different lengths of pins 61, the cross section of the vertical sliding grooves 131 is trapezoidal, so as to prevent the sliding blocks 22 from falling off from the vertical sliding grooves 131 and make the moving rod 2 more stable when sliding up and down.

[0038] The moving rod 2 is made of insulating rubber, which can be polyurethane hard rubber, and is a hard material, which can avoid deformation of the moving rod 2 when sliding, and bending of the pin 61 of the diode 6. The polyurethane hard rubber has good insulation, which can avoid electrical connection between the plurality of conductive pipes 3 assembled on the moving rod 2, causing inaccurate testing. The polyurethane hard rubber also has a certain elasticity, which can realize the interference fit between the conductive pipe 3 and the through hole 21, and the interference fit between the sliding block (22) and the vertical sliding groove (131).

[0039] The conductive pipe 3 and the test rod 31 are made of metal, which can be copper.

[0040] The conductive rod 14 is made of metal, which can be copper.

[0041] The connecting rod 15 is fixedly connected with the conductive rod 14, and is made of metal, which can be copper. The connecting hole 141 penetrates through the connecting rod 15, and the clamping surface 151 is arranged on the outer surface of the connecting rod 15. The connecting rod 15 can be clamped by the pen clip of the digital multimeter 4, so that the pen clip is more easily clamped on the connecting rod 15, and falling off is prevented.

[0042] The front facade of the test table 11 is provided with a character mark 111, which can be a character positive electrode or negative electrode, representing that the pin 61 inserted into the jack 121 is a positive electrode or a negative electrode. In this way, the positive and negative electrodes of the diode 6 placed on the test table 11 during testing are uniform, which facilitates collective testing and prevents confusion of testing results.

[0043] The upper surface of the base 1 is axially connected with the backboard 5 through a hole, and the digital multimeter 4 can be used by being placed on the backboard 5. The back surface of the backboard 5 is axially connected with the supporting leg 51 through a hole. The upper surface of the base 1 is provided with a limiting groove 16 matched with the supporting leg 51, which can fix the position of the backboard 5.

[0044] The upper surface of the base 1 is provided with a storage groove one 17 matched with the backboard 5. The backboard 5 and the storage groove one 17 are axially connected with the inner vertical surface on both sides. The back surface of the backboard 5 is provided with a storage groove two 52 matched with the supporting leg 51. The supporting leg 51 and the storage groove two 52 are axially connected with the inner vertical surface on both sides. When the backboard 5 is not used, the backboard 5 can be stored in the storage groove one 17, and the supporting leg 51 can be stored in the storage groove two 52, so that the upper surface of the base 1 is neat. The limiting groove 16 is located on the upper surface of the groove bottom of the storage groove one 17, and a plurality of limiting grooves 16 are longitudinally arranged. By placing the supporting leg 51 in different limiting grooves 16, the angle of the backboard 5 can be adjusted, so that the user can adjust the digital multimeter to a suitable observation angle according to the user's own situation.

[0045] Working principle: when testing, the digital multimeter 4 is adjusted to the diode detection position, the positive pin of the diode 6 is inserted into the socket 121, the negative pin is inserted into the conductive tube 3, the red probe of the digital multimeter is inserted into the connecting hole 141, the black probe touches the test rod 31, the digital multimeter shows a value greater than 1, which represents that the diode is on, then the black probe of the digital multimeter is inserted into the connecting hole 141, and the red probe touches the test rod 31, the digital multimeter shows the number 1, which represents that the diode is off, a plurality of setting holes 12 are arranged on the test table to place the diode 6, and a plurality of conductive tubes 3 are arranged on the moving rod 2, the whole diode testing device can test a plurality of diodes 6 at the same time, improves the testing efficiency, saves time and labor testing cost for enterprises, since the pins 61 of the diode 6 are connected with the socket 121 and the conductive tube 3 respectively, the probe of the digital multimeter will not directly press the pin 61 during testing, which can avoid that the pin 61 is damaged to cause the diode 6 to be invalid.

[0046] The above is only the preferred specific implementation manner of the present application, but the protection scope of the present application is not limited to this, any skilled person in the art can make equivalent replacement or change according to the technical scheme and concept of the present application within the technical range disclosed by the present application, which should be covered in the protection scope of the present application.

Claims

1. A diode testing apparatus characterized by: The utility model provides a digital multimeter test device, including base (1) and digital multimeter (4), the upper surface of base (1) is fixedly provided with test table (11), the upper surface of test table (11) is transversely arranged with a plurality of installation hole (12), the lower surface of test table (11) is provided with electrically conductive rod (14), electrically conductive rod (14) is connected with installation hole (12), the bottom surface of installation hole (12) is provided with jack (121), jack (121) penetrates test table (11) and electrically conductive rod (14), electrically conductive rod (14) is provided with the connecting hole (141) of the pen (41) of adaptation of digital multimeter (4), the upper surface of test table (11) is provided with support (13) on both sides, two support (13) are slidably connected with moving rod (2), moving rod (2) is insulating material, and the lateral array of moving rod (2) has a plurality of through hole (21), and the through hole (21) is adapted to have electrically conductive pipe (3), and the central axis of electrically conductive pipe (3) coincides with the central axis of jack (121), and electrically conductive pipe (3) is fixedly connected with test rod (31).

2. The diode testing apparatus of claim 1, wherein, The opposite vertical sliding groove (131) is arranged on the two support (13), and the two sides of the moving rod (2) are respectively provided with the sliding block (22) matched with the vertical sliding groove (131), and the cross section of the vertical sliding groove (131) is trapezoidal.

3. The diode testing apparatus of claim 2, wherein, The material of the moving rod (2) is insulating rubber.

4. The diode testing apparatus of claim 3, wherein, The electrically conductive pipe (3) is in interference fit with the through hole (21), and the sliding block (22) is in interference fit with the vertical sliding groove (131).

5. The diode testing apparatus of claim 1, wherein, The electrically conductive pipe (3) and the test rod (31) are made of metal.

6. The diode testing apparatus of claim 1, wherein, The electrically conductive rod (14) is made of metal.

7. The diode testing apparatus of claim 6, wherein, The electrically conductive rod (14) is fixedly connected with the connecting rod (15), the connecting rod (15) is made of metal, the connecting hole (141) penetrates the connecting rod (15), and the clamping surface (151) is arranged on the outer surface of the connecting rod (15).

8. The diode testing apparatus of claim 1, wherein, The front vertical surface of the test table (11) is provided with a character mark (111).

9. The diode testing apparatus of claim 1, wherein, The upper surface of the base (1) is connected with the backboard (5) in hole axis fit, the back vertical surface of the backboard (5) is connected with the supporting leg (51) in hole axis fit, and the upper surface of the base (1) is provided with the limiting groove (16) matched with the supporting leg (51).

10. The diode testing apparatus of claim 9, wherein, The upper surface of the base (1) is provided with the receiving groove one (17) matched with the backboard (5), the backboard (5) is connected with the inner vertical surface of the two sides of the receiving groove one (17) in hole axis fit, the back vertical surface of the backboard (5) is provided with the receiving groove two (52) matched with the supporting leg (51), and the supporting leg (51) is connected with the inner vertical surface of the two sides of the receiving groove two (52) in hole axis fit, and the limiting groove (16) is located on the upper surface of the groove bottom of the receiving groove one (17) and is longitudinally arranged with a plurality of.

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