Young modulus measuring equipment based on Michelson interferometer principle
By using a Young's modulus measurement device based on the Michelson interferometer principle, and utilizing an electromagnet-based non-contact tension and current controller to achieve continuously variable tensile force, the problems of low accuracy and large error in the optical lever method are solved, thus realizing high-precision Young's modulus measurement.
Patent Information
- Application Number
- CN202423294730.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2026-01-06
- Estimated Expiration
- 2034-12-31
AI Technical Summary
In existing technologies, the optical lever method for measuring Young's modulus suffers from problems such as bulky instruments, low measurement accuracy, and large errors in manual readings, leading to complex data processing and low accuracy.
A Young's modulus measurement device based on the Michelson interferometer principle is used. The electromagnet is used to stretch the object under test in a non-contact manner, and the Young's modulus is calculated by observing the changes in the interference ring. Combined with a current controller, the tension can be continuously and variablely changed.
It enables high-precision measurement of Young's modulus, reduces errors caused by physical contact, simplifies data processing, and improves the accuracy and efficiency of measurement.
Smart Images

Figure CN223769928U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of Young's modulus measurement technology, specifically relating to a Young's modulus measurement device based on the principle of Michelson interferometer. Background Technology
[0002] The key to measuring Young's modulus in university physics experiments is to determine the minute elongation of the object under force. However, the commonly used optical lever method has the disadvantages of bulky measuring instruments and insufficient measurement accuracy. This is because, in the experiment, the object is stretched by the weight of weights, and then the reading on the scale image is observed through the optical lever.
[0003] However, during the stretching measurement process, continuously adding or removing weights can cause the object to vibrate, thus interfering with the accuracy of the scale reading. In addition, due to the failure to completely eliminate the effect of parallax, gross errors will occur when reading the scale. This manual measurement and calculation method has low accuracy and is too complicated in data processing. To address these issues, we propose a Young's modulus measurement device based on the Michelson interferometer principle. Utility Model Content
[0004] The purpose of this invention is to provide a Young's modulus measurement device based on the principle of Michelson interferometer, in order to solve the problems existing in the background technology.
[0005] To achieve the above-mentioned technical objectives, the technical solution adopted by this utility model is as follows:
[0006] A Young's modulus measuring device based on the Michelson interferometer principle includes an A-frame tripod, a platform, a clamp, a crossbeam, and two columns. The A-frame tripod is placed on a horizontal plane, and the two columns are symmetrically installed on the upper end of the A-frame tripod. The platform is located in the middle of the two columns, and a through groove is opened in the middle of the upper end of the platform. The clamp is slidably disposed in the through groove. The crossbeam is installed on the upper part of the two columns, and the object to be measured is installed between the crossbeam and the clamp. A tensioning component is provided between the platform and the A-frame tripod.
[0007] The stretching assembly includes a mounting bracket, which is installed on the outside of the A-type tripod. A support rod is fixed to the upper end of the mounting bracket, and an electromagnet is fixed to the upper end of the support rod. A current controller is placed on the side of the A-type tripod, and the current controller is electrically connected to the electromagnet. An iron plate is fixed to the lower end of the clamp, and an interferometer assembly is installed on the column.
[0008] Further specifying, the interferometer assembly includes a laser emitter, a fixed reflector, a focusing lens, a beam splitter, a compensating mirror, a movable reflector, and an observation screen. The laser emitter and the observation screen are both placed directly in front of the A-type tripod. The fixed reflector, the focusing lens, the beam splitter, and the compensating mirror are all mounted on the same outer side of the column, and the fixed reflector, the beam splitter, and the compensating mirror are parallel to each other. A linkage plate is mounted on the upper part of the outer side of the clamp, and the movable reflector is fixedly connected to the upper end of the linkage plate. The laser emitter, the focusing lens, the fixed reflector, the beam splitter, the compensating mirror, the movable reflector, and the observation screen are all on the same vertical plane.
[0009] Furthermore, a 3cm gap is left between the electromagnet and the iron sheet.
[0010] Further specifying, the laser emitter is configured as a helium-neon laser emitter.
[0011] Furthermore, both the laser emitter and the observation screen are equipped with brackets at their lower ends, and each bracket has a base fixed to its lower end.
[0012] The beneficial effects of this utility model are:
[0013] 1. By utilizing the principle of the Michelson interferometer and observing the changes in the interference rings on the screen, the deformation of the object under test can be accurately calculated, and the magnitude of Young's modulus can be derived.
[0014] 2. The non-contact stretching of the test object by relying on the electromagnet to attract the iron sheet not only reduces the error caused by physical contact, but also allows the tensile force of the test object to be continuously and variable by adjusting the current controller, thus facilitating measurement experiments under different tensile forces. Attached Figure Description
[0015] This utility model can be further illustrated by the non-limiting embodiments given in the accompanying drawings.
[0016] Figure 1 This is a schematic diagram of the structure of a Young's modulus measuring device based on the principle of a Michelson interferometer, according to this utility model. Figure 1 ;
[0017] Figure 2 This is a schematic diagram of the structure of a Young's modulus measuring device based on the principle of a Michelson interferometer, according to this utility model. Figure 2 ;
[0018] Figure 3 for Figure 2 Enlarged structural diagram at point A;
[0019] The symbols for the main components are explained below:
[0020] A-type tripod 100, platform 101, clamp 102, crossbeam 103, column 104, mounting bracket 105, support rod 106, electromagnet 107, current controller 108, iron sheet 109, laser emitter 200, fixed reflector 201, focusing lens 202, beam splitter 203, compensating mirror 204, movable reflector 205, observation screen 206, linkage plate 207, bracket 208, base 209. Detailed Implementation
[0021] To enable those skilled in the art to better understand this utility model, the technical solution of this utility model will be further described below in conjunction with the accompanying drawings and embodiments.
[0022] Example 1:
[0023] like Figure 1 As shown, a Young's modulus measurement device based on the principle of Michelson interferometer.
[0024] A Young's modulus measuring device based on the principle of Michelson interferometer includes an A-type tripod 100, a platform 101, a clamp 102, a crossbeam 103, and two columns 104. The A-type tripod 100 is placed on a horizontal plane, and the two columns 104 are symmetrically installed on the upper end of the A-type tripod 100. The platform 101 is located in the middle of the two columns 104, and a through groove is opened in the middle of the upper end of the platform 101. The clamp 102 is slidably installed in the through groove. The crossbeam 103 is installed on the upper part of the two columns 104, and the object to be measured is installed between the crossbeam 103 and the clamp 102. A tensioning component is provided between the platform 101 and the A-type tripod 104.
[0025] The tensioning assembly includes a mounting bracket 105, which is mounted on the outside of the A-type tripod 100. A support rod 106 is fixed to the upper end of the mounting bracket 105, and an electromagnet 107 is fixed to the upper end of the support rod 106. A current controller 108 is placed on the side of the A-type tripod 100, and the current controller 108 is electrically connected to the electromagnet 107. An iron sheet 109 is fixed to the lower end of the clamp 102, and an interferometer assembly is mounted on the column 104.
[0026] The interferometer assembly includes a laser emitter 200, a fixed reflector 201, a focusing lens 202, a beam splitter 203, a compensating mirror 204, a movable reflector 205, and an observation screen 206. The laser emitter 200 and the observation screen 206 are both placed in front of the A-type tripod 100. The fixed reflector 201, the focusing lens 202, the beam splitter 203, and the compensating mirror 204 are all mounted on the outside of the same column 104, and the fixed reflector 201, the beam splitter 203, and the compensating mirror 204 are parallel to each other. A linkage plate 207 is mounted on the upper part of the outside of the clamp 102. The movable reflector 205 is fixedly connected to the upper end of the linkage plate 207. The laser emitter 200, the focusing lens 202, the fixed reflector 201, the beam splitter 203, the compensating mirror 204, the movable reflector 205, and the observation screen 206 are all on the same vertical plane.
[0027] The A-type tripod 100, platform 101, clamp 102, crossbeam 103, and two columns 104 together form a measuring equipment frame; the A-type tripod 100 can be equipped with two columns 104, and the crossbeam 103 and platform 101 are installed on the two columns 104 from top to bottom. The clamp 102 can be installed on the upper end of the platform 101, and the object to be measured is installed between the clamp 102 and the crossbeam 103;
[0028] The device is powered by an external power source. When the electromagnet 107 is energized, it can generate a magnetic attraction force to attract the iron sheet 109. The mounting bracket 105, together with the support rod 106, can bring the electromagnet 107 close to the iron sheet 109, thus facilitating the attraction of the electromagnet 107 to the iron sheet 109. The current controller 108 can control the magnitude of the current input into the electromagnet 107, thereby indirectly controlling the magnitude of the tensile force on the object to be measured.
[0029] A Michelson interferometer is composed of a laser emitter 200, a fixed reflector 201, a focusing lens 202, a beam splitter 203, a compensating mirror 204, a movable reflector 205, and an observation screen 206. The laser emitter 200 emits a laser beam, the focusing lens 202 expands the received laser beam, resulting in obvious interference rings on the observation screen 206. Both the fixed reflector 201 and the movable reflector 205 reflect the laser beam. The beam splitter 203 splits the incident laser beam into reflected and transmitted light of equal intensity. The compensating mirror 204 ensures that the reflected and transmitted light participating in the interference pass through the medium in equal amounts, thereby eliminating the additional optical path difference introduced by the medium. The observation screen 206 receives the laser beam, thus forming interference rings visible to the naked eye.
[0030] This device utilizes the principle of the Michelson interferometer to accurately measure the minute deformation of the test object during stretching, and then calculates the Young's modulus of the test object. When energized, the experimenter can adjust the current input to the electromagnet 107 by adjusting the current controller 108. When the current enters the electromagnet 107, the electromagnet 107 generates a magnetic attraction force, thereby attracting the iron sheet 109. The iron sheet 109 drives the clamp 102, the linkage plate 207, and the moving reflector 205 to move downwards. While stretching the test object, the moving reflector 205 moves away from the compensation mirror 204. The interferometer assembly uses the principle of the Michelson interferometer, which is existing technology and will not be described in detail here. The movement of the moving reflector 205 changes the interference rings on the surface of the observation screen 206. Thus, the experimenter can determine the Young's modulus of the test object by observing the changes in the interference rings.
[0031] When not energized, the electromagnet 107 and the iron sheet 109 are not in contact, which reduces physical contact when stretching the object to be measured and reduces measurement errors.
[0032] When energized, the electromagnet 107 can attract the iron sheet 109, thereby stretching the test object. During the stretching process, the frequency of the stretching test can be increased by turning the energizer on and off, so as to obtain more accurate data.
[0033] In this embodiment, the object to be measured is stretched by the electromagnetic pulling force of the electromagnet 107, thereby realizing the continuous and variable change of the pulling force. Then, a laser is emitted by the laser emitter 200 and projected onto the surface of the observation screen 206. The deformation of the object to be measured is obtained according to the number of changes in the interference rings on the surface of the observation screen 206. Finally, the magnitude of Young's modulus is derived by formula.
[0034] Example 2:
[0035] like Figures 1-3 As shown, based on Embodiment 1, other components of a Young's modulus measuring device based on the Michelson interferometer principle are further described, with a 3cm gap between the electromagnet 107 and the iron sheet 109.
[0036] Laser emitter 200 is configured as a helium-neon laser emitter.
[0037] Both the laser emitter 200 and the observation screen 206 are equipped with brackets 208 at their lower ends, and bases 209 are fixed to the lower ends of both brackets 208.
[0038] In this embodiment, initially, the electromagnet 107 and the iron sheet 109 are separated with a gap of 3cm. This not only does not affect the subsequent attraction of the electromagnet 107 to the iron sheet 109, but also reduces the physical contact when stretching the object to be tested, thus reducing the error of the measurement data.
[0039] When the electromagnet 107 is energized, it can generate an attractive force, thereby attracting the iron sheet 109 and pulling the object to be tested, which makes it easy to realize continuous and variable changes in the tensile force.
[0040] Laser emitter 200 can emit lasers, and the laser emitted by the helium-neon laser emitter can greatly eliminate interference between optical paths, thereby reducing the errors caused by optical path interference and obtaining more accurate data.
[0041] The bracket 208 can support the laser emitter 200 and the observation screen 206, while the base 209 can make the laser emitter 200 and the observation screen 206 placed on the plane more stable.
[0042] The above embodiments are merely illustrative of the principles and effects of this utility model and are not intended to limit the scope of this utility model. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this utility model. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this utility model should still be covered by the claims of this utility model.
Claims
1. A Young's modulus measuring apparatus based on the principle of the Michelson interferometer, characterized in that: The utility model provides a kind of tensile test machine, including A tripod (100), platform (101), clamp (102), crossbeam (103) and two columns (104), the A tripod (100) is placed on horizontal plane, two the columns (104) are respectively symmetrically installed on the A tripod (100) upper end, the platform (101) is located in two the column (104) middle part, the platform (101) upper end middle part is equipped with through slot, the clamp (102) is slidably arranged in the through slot, the crossbeam (103) is installed in two the column (104) upper part, and the crossbeam (103) is installed with the object to be measured between the clamp (102), and the platform (101) is equipped with stretching assembly between the A tripod (100). The stretching assembly includes a mounting bracket (105), the mounting bracket (105) is mounted on the outside of the A tripod (100), the support rod (106) is fixed on the upper end of the mounting bracket (105), the electromagnet (107) is fixed on the upper end of the support rod (106), the current controller (108) is placed on the side of the A tripod (100), and the current controller (108) is electrically connected with the electromagnet (107), the iron sheet (109) is fixed on the lower end of the clamp (102), and the interferometer assembly is installed on the column (104).
2. A Young's modulus measuring device based on the principle of Michelson interferometer according to claim 1, characterized in that: The interferometer assembly includes a laser emitter (200), a fixed mirror (201), a focusing lens (202), a beamsplitter (203), a compensating mirror (204), a moving mirror (205), and an observation screen (206). The laser emitter (200) and the observation screen (206) are placed in front of the A tripod (100). The fixed mirror (201), the focusing lens (202), the beamsplitter (203), and the compensating mirror (204) are installed on the outside of the column (104). The fixed mirror (201), the beamsplitter (203), and the compensating mirror (204) are parallel to each other. The linkage plate (207) is installed on the outside of the clamp (102). The moving mirror (205) is fixedly connected with the upper end of the linkage plate (207). The laser emitter (200), the focusing lens (202), the fixed mirror (201), the beamsplitter (203), the compensating mirror (204), the moving mirror (205), and the observation screen (206) are in the same vertical plane.
3. A Young's modulus measuring apparatus based on the principle of Michelson interferometer according to claim 1, characterized in that: The electromagnet (107) and the iron sheet (109) have a gap of 3 cm.
4. A Young's modulus measuring apparatus based on the principle of Michelson interferometer according to claim 2, characterized in that: The laser emitter (200) is a helium-neon laser emitter.
5. A Young's modulus measuring apparatus based on the principle of Michelson interferometer according to claim 2, characterized in that: The laser emitter (200) and the observation screen (206) are provided with supports (208) at the lower end. The two supports (208) are fixedly connected with the base (209) at the lower end.