Measuring circuit and measuring device
By controlling the conduction state of the transistor through a switching circuit, the high cost and large area issues caused by MCU chips are solved, the cost and area of the antenna parameter measurement circuit are optimized, and the working efficiency of the communication base station is improved.
Patent Information
- Application Number
- CN202520016155.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-03
- Publication Date
- 2026-01-09
- Estimated Expiration
- 2035-01-03
AI Technical Summary
Existing antenna parameter measurement circuits are connected to MCU chips, resulting in large circuit costs and area, which affects the working performance of communication base stations.
A switching circuit is used to switch the conduction state of the first transistor and the second transistor, reducing the control requirements of the auxiliary measurement chip and lowering the circuit cost and area.
By designing the switching circuit, the circuit cost and area of the antenna parameter measurement circuit were reduced, and the working efficiency of the communication base station was improved.
Smart Images
Figure CN223786070U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of antenna measurement technology, and more particularly to measurement circuits and measuring devices. Background Technology
[0002] Antennas in communication base stations, serving as the equipment for energy conversion, directional radiation, and reception, are the core of the entire base station's operation. The operating parameters of the antennas (e.g., heading angle, pitch angle, roll angle) are crucial to signal coverage and communication quality. However, during operation, antennas are often affected by severe weather or unexpected external forces, which may alter their operating parameters and thus affect the base station's performance. Therefore, it is necessary to measure the antenna's operating parameters to facilitate maintenance when these parameters change.
[0003] To measure antenna parameters, a parameter measurement device is available. The parameter measurement circuit is designed with a main measurement module and a sub-measurement module that are respectively connected to a microcontroller unit (MCU) chip. The sub-measurement chip can be controlled by the MCU chip. However, the MCU chip results in a larger circuit cost and circuit area for the antenna parameter measurement circuit. Utility Model Content
[0004] This application provides a measurement circuit and a measurement device that can reduce the circuit cost and circuit area of antenna parameter measurement circuits.
[0005] To achieve the above objectives, this application adopts the following technical solution:
[0006] In a first aspect, a measurement circuit is provided, comprising: an input terminal, an output terminal, a main measurement circuit, a secondary measurement circuit, a first resistor, a first transistor, a first diode, a second transistor, and a switching circuit; the switching circuit is used to switch the conduction states of the first transistor and the second transistor. The input terminal is electrically connected to the main measurement circuit through the first resistor; the input terminal is also electrically connected to the secondary measurement circuit through the first transistor; the output terminal is electrically connected to the main measurement circuit through the first diode; the output terminal is also electrically connected to the secondary measurement circuit through the second transistor; the switching circuit is electrically connected to the first transistor, the second transistor, and the main measurement circuit respectively.
[0007] Because the switching circuit can switch the conduction state of the first and second transistors, when control of the secondary measurement chip is not required, the switching circuit can switch the conduction state of the first and second transistors to non-conducting. At this time, since the first and second transistors are not conducting, data cannot be transmitted to the secondary measurement circuit through the first and second transistors. When control of the secondary measurement chip is required, the switching circuit can switch the conduction state of the first and second transistors to conducting. At this time, since the first and second transistors are conducting, data can be transmitted to the secondary measurement circuit through the first and second transistors. Therefore, there is no need to control the secondary measurement chip through the MCU chip, thereby reducing the circuit cost and circuit area of the antenna parameter measurement circuit.
[0008] In conjunction with the first aspect, in some embodiments of the first aspect, the main measurement circuit includes a main measurement chip, and the switching circuit includes a second resistor, a third resistor, a first capacitor, and a second capacitor.
[0009] The second resistor and the first capacitor are respectively electrically connected to one end of the first transistor;
[0010] The third resistor and the second capacitor are respectively electrically connected to one end of the second transistor;
[0011] The second resistor, the third resistor, the first capacitor, and the second capacitor are also electrically connected to the switching pins of the main measurement chip.
[0012] In conjunction with the first aspect, in some embodiments of the first aspect, the resistance value of the first resistor is 0kΩ-1kΩ.
[0013] In conjunction with the first aspect, in some embodiments of the first aspect, the resistance values of the second resistor and the third resistor are 1kΩ-10kΩ.
[0014] In conjunction with the first aspect, in some embodiments of the first aspect, the capacitance values of the first capacitor and the second capacitor are 1nF to 22nF.
[0015] In conjunction with the first aspect, in some embodiments of the first aspect, the measurement circuit further includes a power supply terminal, which supplies power to the first transistor and the second transistor of the main measurement circuit and the auxiliary measurement circuit.
[0016] In conjunction with the first aspect, in some embodiments of the first aspect, the main measurement circuit includes a main measurement chip, an inertia sensing circuit, a first filter circuit, and a first antenna interface; the inertia sensing circuit is electrically connected to the main measurement chip; the first antenna interface is electrically connected to the main measurement chip through the first filter circuit; the input terminal is electrically connected to the main measurement circuit through a first resistor, including: the input terminal is electrically connected to the main measurement chip through the first resistor.
[0017] In conjunction with the first aspect, in some embodiments of the first aspect, the secondary measurement circuit includes a secondary measurement chip, a second filter circuit, and a second antenna interface; the second antenna interface is electrically connected to the secondary measurement chip through the second filter circuit; the input terminal is electrically connected to the secondary measurement circuit through a first transistor, including: the input terminal is electrically connected to the secondary measurement chip through the first transistor.
[0018] In conjunction with the first aspect, in some embodiments of the first aspect, the measurement circuit further includes a crystal oscillator circuit, which is electrically connected to both the main measurement circuit and the auxiliary measurement circuit.
[0019] In a second aspect, a measuring device is provided, which includes the measuring circuit provided in the first aspect and any embodiment thereof. Attached Figure Description
[0020] Figure 1 This is a schematic diagram of a measurement circuit provided in this application. Detailed Implementation
[0021] To facilitate a clear description of the technical solutions in the embodiments of this application, the terms "first" and "second" are used in the embodiments of this application to distinguish identical or similar items with essentially the same function and effect. Those skilled in the art will understand that the terms "first" and "second" do not limit the quantity or execution order, and the terms "first" and "second" are not necessarily different.
[0022] In this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design described as "exemplary" or "for example" in this application should not be construed as being better or more advantageous than other embodiments or designs. Specifically, the use of terms such as "exemplary" or "for example" is intended to present the relevant concepts in a specific manner to facilitate understanding.
[0023] It is understood that the term "embodiment" used throughout the specification means that a specific feature, structure, or characteristic related to an embodiment is included in at least one embodiment of this application. Therefore, various embodiments throughout the specification do not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. It is understood that in the various embodiments of this application, the sequence number of each process does not imply the order of execution; the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.
[0024] It is understood that in this application, "when," "if," and "if" all refer to the corresponding processing that will be carried out under certain objective circumstances, and are not limited to a specific time, nor do they require that there must be a judgment action when implemented, nor do they imply any other limitations.
[0025] It is understood that some optional features in the embodiments of this application can be implemented independently in certain scenarios without relying on other features, such as the current solution on which they are based, to solve the corresponding technical problems and achieve the corresponding effects. Alternatively, they can be combined with other features as needed in certain scenarios. Correspondingly, the apparatus given in the embodiments of this application can also implement these features or functions, which will not be elaborated here.
[0026] In this application, unless otherwise specified, the same or similar parts between the various embodiments can be referred to each other. In the various embodiments and implementation methods of the various embodiments in this application, unless otherwise specified or logically conflicting, the terminology and / or descriptions between different embodiments and between the implementation methods of the various embodiments are consistent and can be mutually referenced. The technical features in different embodiments and between the implementation methods of the various embodiments can be combined according to their inherent logical relationships to form new embodiments, implementation methods, implementation methods, or implementation approaches. The following embodiments of this application do not constitute a limitation on the scope of protection of this application.
[0027] Antennas in communication base stations, serving as the equipment for energy conversion, directional radiation, and reception, are the core of the entire base station's operation. The operating parameters of the antennas (e.g., heading angle, pitch angle, roll angle) are crucial to signal coverage and communication quality. However, during operation, antennas are often affected by severe weather or unexpected external forces, which may alter their operating parameters and thus affect the base station's performance. Therefore, it is necessary to measure the antenna's operating parameters to facilitate maintenance when these parameters change.
[0028] To measure antenna parameters, a parameter measurement device is available. The parameter measurement circuit is designed with a main measurement module and a sub-measurement module that are respectively connected to a microcontroller unit (MCU) chip. The sub-measurement chip can be controlled by the MCU chip. However, the MCU chip results in a larger circuit cost and circuit area for the antenna parameter measurement circuit.
[0029] To solve the above problems, this utility model provides a measurement circuit. Figure 1 A schematic diagram of a measurement circuit provided by this utility model is shown below. Figure 1As shown, the measurement circuit 10 includes: an input terminal 20, an output terminal 30, a main measurement circuit 40, a secondary measurement circuit 50, a first resistor 60, a first transistor 70, a first diode 80, a second transistor 90, and a switching circuit 100.
[0030] The switching circuit 100 is used to switch the conduction state of the first transistor 70 and the second transistor 90. The input terminal 20 is electrically connected to the main measurement circuit 40 through the first resistor 60; the input terminal 20 is also electrically connected to the auxiliary measurement circuit 50 through the first transistor 70; the output terminal 30 is electrically connected to the main measurement circuit 40 through the first diode 80; the output terminal 30 is also electrically connected to the auxiliary measurement circuit 50 through the second transistor 90; the switching circuit 100 is electrically connected to the first transistor 70, the second transistor 90 and the main measurement circuit 40 respectively.
[0031] The conduction states of the first transistor 70 and the second transistor 90 include being on or not conducting.
[0032] The resistance of the first resistor 60 is 0kΩ-1kΩ.
[0033] The first transistor 70 or the second transistor 90 can be an NPN transistor.
[0034] The first diode 80 can be a Schottky diode.
[0035] like Figure 1 As shown, the main measurement circuit 40 includes a main measurement chip 401, an inertia sensing circuit 402, a first filter circuit 403, and a first antenna interface 404.
[0036] The inertia sensing circuit 402 is electrically connected to the main measurement chip 401; the first antenna interface 404 is electrically connected to the main measurement chip 401 through the first filter circuit 403; and the input terminal 20 is electrically connected to the main measurement chip 401 through the first resistor 60.
[0037] The first antenna interface 404 is connected to the main satellite signal receiving antenna, which can receive single-frequency or dual-frequency signals.
[0038] The inertia sensing circuit 402 may include a 3-axis accelerometer and a 3-axis gyroscope.
[0039] The specific structure of the inertia sensing circuit 402 can be referred to existing solutions, and will not be described in detail here.
[0040] The specific structure of the first filter circuit 403 can be referred to existing solutions, and will not be described in detail here.
[0041] The specific structure of the first antenna interface 404 can be referred to existing solutions, and will not be described in detail here.
[0042] like Figure 1 As shown, the auxiliary measurement circuit 50 includes an auxiliary measurement chip 501, a second filter circuit 502, and a second antenna interface 503.
[0043] The second antenna interface 503 is electrically connected to the auxiliary measurement chip 501 through the second filter circuit 502; the input terminal 20 is electrically connected to the auxiliary measurement chip 501 through the first transistor 70.
[0044] The second antenna interface 503 is connected to the secondary satellite signal receiving antenna, which can receive single-frequency or dual-frequency signals.
[0045] The specific structure of the second filter circuit 502 can be referred to existing solutions, and will not be described in detail here.
[0046] The specific structure of the second antenna interface 503 can be referred to existing solutions, and will not be described in detail here.
[0047] The main satellite signal receiving antenna or the secondary satellite signal receiving antenna can be an active antenna or a passive antenna.
[0048] By controlling the main measurement circuit 40 and the auxiliary measurement circuit 50, the working parameters of the antenna can be measured.
[0049] For example, the main measurement chip 401 controls the raw GNSS observation data observed by the main GNSS system through the first filter circuit 403 and the first antenna interface 404, and sends the raw GNSS observation data to the secondary measurement chip 501 in the main measurement circuit 40. Then, the secondary measurement chip 501 controls the main GNSS observation data sent by the main measurement chip 401 and the secondary GNSS observation data observed by itself through the second filter circuit 502 and the second antenna interface 503 to perform calculations, and returns the calculation result to the main measurement chip 401. Then, the main measurement chip 401 controls the main measurement chip 401 to perform fusion calculations with the data from the inertial sensor to obtain the working parameters information of the base station antenna, such as heading angle, pitch angle, roll angle, latitude and longitude, and altitude.
[0050] It should be noted that the above is only a brief description of the measurement process. For the specific measurement process, please refer to the existing solutions. This utility model will not describe it in detail here.
[0051] The main measurement chip 401 and the secondary measurement chip 501 can act as each other's watchdogs, monitoring each other's working status. If the other malfunctions, it can be reset to restore normal operation.
[0052] Both the main measurement chip 401 and the secondary measurement chip 501 support online upgrades. When it is necessary to upgrade the secondary measurement chip 501, the software of the secondary measurement chip 501 can be upgraded by connecting to the secondary measurement chip 501 through the switching circuit 100.
[0053] The measurement circuit 10 also includes a power supply terminal 110, which supplies power to the first transistor 70 and the second transistor 90. For example... Figure 1 As shown, power supply terminal 110 supplies power to the first transistor 70 through the fourth resistor 1101, and power supply terminal 110 supplies power to the second transistor 90 through the fifth resistor 1102.
[0054] The power supply terminal 110 can provide a DC voltage of 3.3±0.3V.
[0055] like Figure 1 As shown, the measurement circuit 10 also includes a crystal oscillator circuit 120, which is electrically connected to the main measurement circuit 40 and the auxiliary measurement circuit 50, respectively.
[0056] Thus, since the crystal oscillator circuit 120 is electrically connected to the main measurement circuit 40 and the auxiliary measurement circuit 50 respectively, the main measurement circuit 40 and the auxiliary measurement circuit 50 can share a single crystal oscillator circuit 120, reducing the circuit cost and circuit area of the antenna parameter measurement circuit 10.
[0057] The specific structure of the crystal oscillator circuit 120 can be referred to existing solutions, and will not be described in detail here.
[0058] like Figure 1 As shown, the switching circuit 100 includes a second resistor 1001, a third resistor 1002, a first capacitor 1003, and a second capacitor 1004.
[0059] The second resistor 1001 and the first capacitor 1003 are electrically connected to one end of the first transistor 70, respectively; the third resistor 1002 and the second capacitor 1004 are electrically connected to one end of the second transistor 90, respectively; the second resistor 1001, the third resistor 1002, the first capacitor 1003 and the second capacitor 1004 are also electrically connected to the switching pin of the main measurement chip 401, respectively.
[0060] The resistance values of the second resistor 1001 and the third resistor 1002 are 1kΩ-10kΩ.
[0061] The capacitance values of the first capacitor 1003 and the second capacitor 1004 are 1nF to 22nF.
[0062] When it is necessary to turn on the first transistor 70 and the second transistor 90, a switching command can be sent to the main measurement chip 401 to enable the off pin of the main measurement chip 401.
[0063] Since the switching circuit 100 can switch the conduction state of the first transistor 70 and the second transistor 90, when it is not necessary to control the sub-measurement chip 501, the switching circuit 100 can switch the conduction state of the first transistor 70 and the second transistor 90 to non-conducting. At this time, since the first transistor 70 and the second transistor 90 are not conducting, data cannot be transmitted to the sub-measurement circuit 50 through the first transistor 70 and the second transistor 90. When it is necessary to control the sub-measurement chip 501, the switching circuit 100 can switch the conduction state of the first transistor 70 and the second transistor 90 to conduct. At this time, since the first transistor 70 and the second transistor 90 are conducting, data can be transmitted to the sub-measurement circuit 50 through the first transistor 70 and the second transistor 90. Therefore, it is not necessary to control the sub-measurement chip 501 through the MCU chip, thereby reducing the circuit cost and circuit area of the antenna parameter measurement circuit 10.
[0064] This utility model provides a measuring device, which includes the measuring circuit 10 described above.
[0065] Although the present invention has been described herein in conjunction with various embodiments, those skilled in the art will understand and implement other variations of the disclosed embodiments by reviewing the accompanying drawings, the disclosure, and the appended claims in carrying out the claimed invention. In the claims, the word "comprising" does not exclude other components or steps, and "a" or "an" does not exclude a plurality. A single processor or other unit can implement several functions listed in the claims. While different dependent claims may recite certain measures, this does not mean that these measures cannot be combined to produce good results.
[0066] Although the present invention has been described in conjunction with specific features and embodiments, it is obvious that various modifications and combinations can be made thereto without departing from the spirit and scope of the present invention. Accordingly, this specification and drawings are merely exemplary descriptions of the present invention as defined by the appended claims, and are considered to cover any and all modifications, variations, combinations, or equivalents within the scope of the present invention. Clearly, those skilled in the art can make various alterations and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if such modifications and modifications of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and modifications.
Claims
1. A measurement circuit, characterized in that, The measurement circuit includes: an input terminal, an output terminal, a main measurement circuit, a secondary measurement circuit, a first resistor, a first transistor, a first diode, a second transistor, and a switching circuit; the switching circuit is used to switch the conduction state of the first transistor and the second transistor. The input terminal is electrically connected to the main measurement circuit through the first resistor; The input terminal is also electrically connected to the auxiliary measurement circuit through the first transistor; The output terminal is electrically connected to the main measurement circuit through the first diode; The output terminal is also electrically connected to the auxiliary measurement circuit via the second transistor; The switching circuit is electrically connected to the first transistor, the second transistor, and the main measurement circuit, respectively.
2. The measurement circuit according to claim 1, characterized in that, The main measurement circuit includes a main measurement chip, and the switching circuit includes a second resistor, a third resistor, a first capacitor, and a second capacitor. The second resistor and the first capacitor are respectively electrically connected to one end of the first transistor; The third resistor and the second capacitor are respectively electrically connected to one end of the second transistor; The second resistor, the third resistor, the first capacitor, and the second capacitor are also electrically connected to the switching pins of the main measurement chip.
3. The measurement circuit according to claim 2, characterized in that, The resistance of the first resistor is 0kΩ-1kΩ.
4. The measurement circuit according to claim 2, characterized in that, The resistance values of the second resistor and the third resistor are 1kΩ-10kΩ.
5. The measurement circuit according to claim 2, characterized in that, The capacitance values of the first capacitor and the second capacitor are 1nF to 22nF.
6. The measurement circuit according to claim 1, characterized in that, The measurement circuit also includes a power supply terminal, which supplies power to the first transistor and the second transistor.
7. The measuring circuit according to any one of claims 1-6, characterized in that, The main measurement circuit includes a main measurement chip, an inertial sensing circuit, a first filtering circuit, and a first antenna interface; The inertia sensing circuit is electrically connected to the main measurement chip; The first antenna interface is electrically connected to the main measurement chip through the first filter circuit; The input terminal is electrically connected to the main measurement circuit through the first resistor, including: The input terminal is electrically connected to the main measurement chip through the first resistor.
8. The measurement circuit according to any one of claims 1-6, characterized in that, The secondary measurement circuit includes a secondary measurement chip, a second filter circuit, and a second antenna interface; The second antenna interface is electrically connected to the sub-measurement chip through the second filter circuit; The input terminal is electrically connected to the auxiliary measurement circuit via the first transistor, including: The input terminal is electrically connected to the sub-measurement chip via the first transistor.
9. The measuring circuit according to any one of claims 1-6, characterized in that, The measurement circuit also includes a crystal oscillator circuit, which is electrically connected to both the main measurement circuit and the auxiliary measurement circuit.
10. A measuring device, characterized in that, The measuring device includes the measuring circuit according to any one of claims 1-9.