Short beam shearing performance test clamp and device

Abstract

The utility model discloses a short beam shear performance test fixture and device, the test fixture comprises a base, and two support mechanisms and two limiting structures arranged on the top surface of the base, the two support mechanisms are arranged at an interval along a first direction, and the two limiting structures are arranged at an interval along a second direction; the first direction is perpendicular to the second direction and is parallel to the top face of the base, the supporting mechanism comprises a sliding groove or a guide rail extending in the second direction, and at least one of the two limiting structures is configured to be in sliding connection with the supporting mechanism through the sliding groove or the guide rail. According to the embodiment, the sliding groove or the guide rail is arranged on the supporting mechanism, the limiting structures are arranged to slide relative to the supporting structure, and in the testing process, the two limiting structures are arranged on the two sides of the to-be-tested sample respectively to limit the to-be-tested sample, so that the to-be-tested sample is prevented from shifting when bearing a large testing load; and higher load strength test requirements can be realized.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of mechanical property testing devices, in particular to a short beam shear performance testing clamp and device. BACKGROUND

[0002] Short beam shear performance testing is a standardized experimental method for evaluating the interlaminar shear strength of composite materials such as fiber-reinforced plastics, laminates, etc. It induces interlaminar shear failure of the sample by three-point bending loading, thereby determining the material's ability to resist delamination.

[0003] The test device in the prior art is prone to sample displacement during testing, affecting the accuracy of the test. CONTENT OF THE UTILITY MODEL

[0004] To overcome the problems in the related art, the present application provides a short beam shear performance testing clamp and device.

[0005] According to a first aspect of an embodiment of the present application, a short beam shear performance testing clamp is provided, comprising:

[0006] a base;

[0007] two support mechanisms arranged on the top surface of the base, the two support mechanisms being arranged at intervals along a first direction;

[0008] two limiting structures arranged on the top surface of the base, the two limiting structures being arranged at intervals along a second direction, the first direction and the second direction being perpendicular and both being parallel to the top surface of the base;

[0009] wherein the support mechanism comprises a sliding groove or a guide rail extending along the second direction, and at least one of the two limiting structures is configured to be slidingly connected with the support mechanism through the sliding groove or the guide rail;

[0010] In the test state, the bottom surface of the sample to be tested is in contact with the two support mechanisms and is located between the two limiting structures.

[0011] In some embodiments, the two limiting structures comprise a first limiting structure and a second limiting structure, the first limiting structure is fixedly connected with the support mechanism, and the second limiting structure is slidingly connected with the support mechanism.

[0012] In some embodiments, the support mechanism comprises:

[0013] a support connected with the base, the top surface of the support being used to support the sample to be tested;

[0014] A first mounting bracket is arranged on the side wall of the support member, and the first limiting structure is fixedly connected with the first mounting bracket.

[0015] A second mounting bracket is arranged on the side wall of the support member, and part of the structure of the second mounting bracket forms the sliding groove or the guide rail, and the second limiting structure is slidably connected with the support mechanism through the sliding groove or the guide rail.

[0016] In some embodiments, the side wall of the support member is provided with a first threaded hole, the first mounting bracket and the second mounting bracket are both provided with mounting holes, and the mounting holes are opposite to the threaded hole;

[0017] The first mounting bracket and the second mounting bracket are arranged in layers on the side wall of the support member, and a fastener penetrates the mounting holes on the first mounting bracket and the second mounting bracket and is threadedly connected with the first threaded hole.

[0018] In some embodiments, the mounting holes are all strip-shaped holes, and the extension direction of the strip-shaped holes is parallel to the second direction.

[0019] In some embodiments, the first mounting bracket comprises a first mounting structure and a second mounting structure arranged perpendicularly, the first mounting structure is connected with the support member and extends along the second direction, the second mounting structure extends along a direction perpendicular to the top surface of the base, and the second limiting structure is connected with an end of the second mounting structure away from the first mounting structure.

[0020] At least part of the structure of the second mounting bracket constitutes the guide rail, and the guide rail is connected with the end of the second mounting structure away from the first mounting structure.

[0021] In some embodiments, a second threaded hole is arranged in the second limiting structure, the second threaded hole exposes part of the surface of the sliding groove or the guide rail, a second fastener is arranged in the limiting hole, and the second fastener is rotated relative to the second threaded hole to lock the position of the second limiting structure in the sliding groove or the guide rail.

[0022] In some embodiments, the short-beam shear performance test clamp further comprises a first tension spring arranged between the two limiting structures along the second direction, and the two ends of the first tension spring are connected with the two limiting structures respectively.

[0023] In some embodiments, the support mechanism further comprises a sample support rod arranged on the top surface of the support members of the two support mechanisms on the opposite side and extending along the second direction.

[0024] Two ends of the sample support rod are connected with the support through second tension springs.

[0025] According to a second aspect of the present application, a short beam shear performance testing device is provided, comprising a mechanical testing machine and the short beam shear performance testing fixture according to the first aspect.

[0026] The technical scheme provided by the embodiments of the present application can have the following beneficial effects: by arranging the sliding grooves or guide rails on the support mechanism and arranging the limiting structures to be capable of sliding relative to the support structure, the two limiting structures are arranged on the two sides of the sample to be tested during the testing process to limit the sample to be tested, so that displacement of the sample to be tested under a large testing load is avoided, and higher load strength testing requirements can be met.

[0027] It should be understood that the foregoing general description and the following detailed description are only exemplary and explanatory, and cannot limit the present application. BRIEF DESCRIPTION OF DRAWINGS

[0028] The accompanying drawings, which are incorporated into and form part of the specification, illustrate embodiments consistent with the present application and, together with the specification, serve to explain the principles of the present application.

[0029] Figure 1 A schematic view of a short beam shear performance testing fixture provided by an embodiment of the present application is shown;

[0030] Figure 2 A schematic view of a short beam shear performance testing fixture provided by another embodiment of the present application is shown;

[0031] Figure 3 A schematic view of a short beam shear performance testing fixture provided by still another embodiment of the present application is shown.

[0032] In the drawings:

[0033] 10, base;

[0034] 20, support mechanism; 20a, sliding groove; 20b, guide rail;

[0035] 21, support; 21a, first threaded hole; 22, first mounting bracket; 22a, mounting hole; 221, first mounting structure; 222, second mounting structure; 23, second mounting bracket; 24, sample support rod; 25, second tension spring;

[0036] 30, limiting structure;

[0037] 31, first limiting structure;

[0038] 32, second limiting structure; 32a, second threaded hole;

[0039] 40. A sample to be tested. DETAILED DESCRIPTION

[0040] The exemplary embodiments will be described in detail herein with reference to the accompanying drawings. In the following description, like reference numerals refer to like elements, unless the context clearly dictates otherwise. The following exemplary embodiments described are not meant to be all inclusive or represent all aspects of the application. Rather, they are merely examples of apparatus and methods consistent with some aspects of the present application as detailed in the appended claims.

[0041] To solve the problems in the related art, the present application provides a short beam shear performance test fixture and device. The short beam shear performance test fixture comprises a base and two support mechanisms and two limiting structures arranged on the top surface of the base. The two support mechanisms are arranged at intervals along a first direction, and the two limiting structures are arranged at intervals along a second direction. The first direction is perpendicular to the second direction and both are parallel to the top surface of the base. The support mechanism comprises a sliding groove or a guide rail extending along the second direction. At least one of the two limiting structures is configured to be slidingly connected with the support mechanism through the sliding groove or the guide rail. In the test state, the bottom surface of the sample to be tested is in contact with the two support mechanisms and is located between the two limiting structures. In this embodiment, the sliding groove or the guide rail is arranged on the support mechanism, and the limiting structure is arranged to be capable of sliding relative to the support structure. During the test, the two limiting structures are arranged on both sides of the sample to be tested to limit the sample to be tested, so as to avoid displacement of the sample to be tested when it bears a large test load, thereby facilitating the realization of higher load strength test requirements.

[0042] According to an exemplary embodiment of the present application, as shown in Figure 1 The present embodiment provides a short beam shear performance test fixture. The short beam shear performance test fixture comprises a base 10, which serves as the basic platform of the test fixture and is used to mount other structures supporting the test fixture to provide overall stability.

[0043] As shown in Figures 1 to 3 The test fixture further comprises two support mechanisms 20 arranged on the top surface of the base 10 and arranged at intervals in the x direction shown in Figure 1 The top surfaces of the two support mechanisms 20 are flush to horizontally support the sample to be tested 40. The two support mechanisms 20 have a spacing therebetween. During the test, the two ends of the sample to be tested 40 are connected with the two support mechanisms 20 respectively, and the middle part of the sample to be tested 40 is located above the interval space. The short beam shear performance test can be performed by applying a vertical load to the top surface of the middle part of the sample to be tested 40 through the force applying structure. The spacing between the two support mechanisms 20 is adjustable to adapt to the detection requirements of samples to be tested 40 of different sizes.

[0044] As shown in Figure 1As shown, the test fixture also includes two limiting structures 30, which are disposed on the top surface of the base 10, and the two limiting structures 30 are along the second direction ( Figure 1 As shown in the y-direction, the two limiting structures 30 are spaced apart, and at least one of them is configured to move relative to the support mechanism 20 in the second direction, so that the two limiting structures 30 can move closer to or further away from each other. When the two limiting structures 30 move closer to each other, the two limiting structures 30 can clamp the sample to be tested 40 to limit the sample to be tested 40 in the second direction.

[0045] In some embodiments, see Figure 2 The support mechanism 20 is provided with a slide groove 20a extending in the second direction, and at least one of the two limiting structures 30 is provided with a slider, which is slidably disposed in the slide groove 20a.

[0046] In other embodiments, see Figure 1 and Figure 3 The support mechanism 20 is provided with a guide rail 20b extending in the second direction, and at least one of the two limiting structures 30 is provided with a mounting groove, which is slidably disposed on the guide rail 20b.

[0047] In some other embodiments (not shown in the figures), the support mechanism is provided with a groove and a guide rail extending in the second direction, which will not be described in detail here.

[0048] In this embodiment, by setting a slide or guide rail on the support mechanism and setting the limiting structure to slide relative to the support mechanism 20, during the test, the two limiting structures are set on both sides of the sample to be tested to limit the sample to be tested, so as to avoid displacement of the sample to be tested when it is subjected to a large test load, which is conducive to achieving the higher load strength test requirements.

[0049] In one exemplary embodiment, such as Figures 1 to 3 As shown, this embodiment provides a short beam shear performance testing fixture. The short beam shear performance testing fixture includes a base 10 and two support mechanisms 20 and two limiting structures 30 disposed on the top surface of the base 10. The two support mechanisms 20 are spaced apart along a first direction, and the two limiting structures 30 are spaced apart along a second direction. The first direction is perpendicular to the second direction and both are parallel to the top surface of the base 10. The support mechanism 20 includes a groove 20a or a guide rail 20b extending along the second direction. At least one of the two limiting structures 30 is configured to be slidably connected to the support mechanism 20 through the groove 20a or the guide rail 20b. In the test state, the bottom surface of the sample 40 to be tested is in contact with the two support mechanisms 20 and is located between the two limiting structures 30.

[0050] Among them, such as Figure 1As shown, the two limiting structures 30 include a first limiting structure 30 and a second limiting structure 30. The first limiting structure 30 is fixedly connected to the support mechanism 20, and the second limiting structure 30 is slidably connected to the support mechanism 20. In this embodiment, by setting the second limiting structure 30 to be fixed and the first limiting structure 30 to be slidably connected, adjustment and accurate positioning are facilitated.

[0051] Among them, such as Figure 1 As shown, the support mechanism 20 includes a support member 21, and a first mounting bracket 22 and a second mounting bracket 23 disposed on the support member 21. The support member 21 is connected to the base 10 for mounting the first mounting bracket 22 and the second mounting bracket 23. A first limiting structure 30 is fixedly connected to the first mounting bracket 22, and a second limiting structure 30 is slidably connected to the second mounting bracket 23, thereby forming a slidable connection with the support member 21.

[0052] In some embodiments, such as Figure 1 and Figure 3 As shown, the first mounting bracket 22 includes a first mounting structure 221 and a second mounting structure 222 arranged vertically. The first mounting structure 221 is connected to the support member 21 and extends along the second direction. The second mounting structure 222 extends along the direction perpendicular to the top surface of the base 10. The second limiting structure 30 is connected to the end of the second mounting structure 222 that is away from the first mounting structure 221.

[0053] In some embodiments, such as Figure 1 As shown, part of the structure of the second mounting bracket 23 forms a groove 20a or guide rail 20b of the support mechanism 20, and the second limiting structure 30 is slidably connected to the support mechanism 20 through the groove 20a or guide rail 20b.

[0054] In one example, see Figure 1 The bottom surface of the second mounting bracket 23 is detachable from the support member 21. The top part of the structure of the second mounting bracket 23 forms a T-shaped guide rail 20b along the second direction. The bottom surface of the second limiting structure 30 is provided with a T-shaped mounting groove. In the assembled state, the second limiting structure 30 forms a sliding connection with the guide rail 20b through the mounting groove.

[0055] In another example, such as Figure 3 As shown, at least a portion of the structure of the second mounting bracket 23 forms a guide rail 20b, which is connected to the end of the second mounting structure 222 that is away from the first mounting structure 221. In this embodiment, by making the first mounting bracket 22 and the second mounting bracket 23 an integral structure, the assembly and disassembly steps are simplified.

[0056] Among them, such as Figure 1As shown, the side wall of the support 21 is provided with a first threaded hole 21a, and the first mounting bracket 22 and the second mounting bracket 23 are each provided with a mounting hole 22a. In the assembled state, the mounting holes 22a are opposite to the threaded hole, and the first mounting bracket 22 and the second mounting bracket 23 are stacked on the side wall of the support 21, and a fastener (such as a bolt) penetrates the mounting holes 22a on the first mounting bracket 22 and the second mounting bracket 23 and is threadedly connected with the first threaded hole 21a. In this embodiment, by stacking the first mounting bracket 22 and the second mounting bracket 23, the fastener can be shared, which is beneficial to improve the disassembly and assembly efficiency.

[0057] In some embodiments, referring to Figure 1 , the mounting hole 22a can be a strip-shaped hole, and the extension direction of the strip-shaped hole is parallel to the second direction (the y direction shown in Figure 1 ). In this embodiment, by setting the mounting hole 22a as a strip-shaped hole, the mounting position of the first mounting bracket 22 can be adjusted along the second direction, so that the to-be-tested sample 40 of different width sizes (the y direction shown in Figure 1 ) is in the central position and aligned with the force applying structure.

[0058] In this embodiment, referring to Figure 1 , the second limiting structure 30 is provided with a second threaded hole 32a, and the second threaded hole 32a exposes part of the surface of the sliding groove 20a or the guide rail 20b. The limiting hole is provided with a second fastener, and the second fastener is rotated relative to the second threaded hole 32a to lock the position of the second limiting structure 30 in the sliding groove 20a or the guide rail 20b. In this embodiment, after the to-be-tested sample 40 is placed on the support mechanism 20, one side of the to-be-tested sample 40 can be adjusted to abut against the first limiting structure 30, and then the position of the second limiting structure 30 in the sliding groove 20a or the guide rail 20b is adjusted until the other side of the to-be-tested sample 40 abuts against the second limiting structure 30. Then, the second fastener can be rotated to generate a normal pressure between the second fastener and the sliding groove 20a or the guide rail 20b to form a friction force, so as to limit the sliding of the second limiting structure 30 relative to the sliding groove 20a or the guide rail 20b, thereby limiting the to-be-tested sample 40.

[0059] In this embodiment, referring to Figure 1 , the short-beam shear performance test clamp further comprises a first tension spring (not shown in the drawings), and the first tension spring is arranged between the two limiting structures 30 along the second direction (the y direction shown in Figure 1 ). The two ends of the first tension spring are connected with the two limiting structures 30, respectively. In this embodiment, by arranging the first tension spring between the two limiting structures 30, the first tension spring can make the two limiting structures 30 close to each other, so that the two limiting structures 30 can clamp and fix the to-be-tested sample 40.

[0060] It should be noted that the test fixture provided in the embodiment can be provided with the second threaded hole 32a and the first tension spring at the same time, or only one of them.

[0061] In the embodiment, as shown in Figure 1 The support mechanism 20 further includes a sample support rod 24 arranged on the top surface of the support member 21 of the two support mechanisms 20 and extending in the second direction, and the two ends of the sample support rod 24 are connected to the support member 21 through a second tension spring 25. In the embodiment, the sample support rod 24 is in a cylindrical shape, which can provide stable support force for the sample 40 to be tested and ensure that the sample 40 to be tested only bears vertical load during the three-point bending loading process, so as to avoid the introduction of additional stress (such as torsion or lateral force) due to unstable support, thereby improving the test accuracy and reliability.

[0062] According to an exemplary embodiment of the present application, the present embodiment provides a short beam shear performance testing device, which includes a mechanical testing machine and the short beam shear performance testing fixture provided in any of the foregoing embodiments of the present disclosure. The testing fixture is used to carry and position the sample 40 to be tested and make the middle position of the sample 40 to be tested in a suspended state. The mechanical testing machine can apply vertical load to the middle position of the sample 40 to be tested, so as to verify the short beam shear performance of the sample 40 to be tested. In one example, the mechanical testing machine can be a hydraulic cylinder, a pneumatic cylinder or the like driving device.

[0063] Other embodiments of the application will be apparent to those skilled in the art from consideration of the specification and practice of the features of the application as set forth herein. It is intended that the specification and examples be considered as exemplary only, with the true scope and spirit of the application being indicated by the following claims.

[0064] It should be understood that the present application is not limited to the precise construction which has been described above and illustrated in the accompanying drawings, and that various modifications and changes can be made by those skilled in the art without departing from the scope of the application. The scope of the application is limited only by the appended claims.

Claims

1. A short beam shear performance test fixture, characterized by, The short-beam shear performance test fixture comprises: a base; two support mechanisms arranged on the top surface of the base, the two support mechanisms being arranged in a first direction; two limiting structures arranged on the top surface of the base, the two limiting structures being arranged in a second direction, the first direction being perpendicular to the second direction and both being parallel to the top surface of the base; wherein the support mechanism comprises a sliding groove or a guide rail extending in the second direction, and at least one of the two limiting structures is configured to be slidingly connected to the support mechanism through the sliding groove or the guide rail; in a test state, the bottom surface of a sample to be tested is in contact with the two support mechanisms and located between the two limiting structures.

2. The short beam shear performance test fixture of claim 1, wherein, The two limiting structures comprise a first limiting structure and a second limiting structure, the first limiting structure being fixedly connected to the support mechanism, and the second limiting structure being slidingly connected to the support mechanism.

3. The short beam shear performance test fixture of Claim 2, wherein, The support mechanism comprises: a support connected to the base, the top surface of the support being used to support the sample to be tested; a first mounting bracket arranged on the side wall of the support, the first limiting structure being fixedly connected to the first mounting bracket; a second mounting bracket arranged on the side wall of the support, part of the structure of the second mounting bracket forming the sliding groove or the guide rail, and the second limiting structure being slidingly connected to the support mechanism through the sliding groove or the guide rail.

4. The short beam shear performance test fixture of Claim 3, wherein, The side wall of the support is provided with a first threaded hole, the first mounting bracket and the second mounting bracket are both provided with mounting holes, and the mounting holes are opposite to the threaded hole; wherein the first mounting bracket and the second mounting bracket are arranged in layers on the side wall of the support, and a fastener penetrates the mounting holes on the first mounting bracket and the second mounting bracket and is threadedly connected to the first threaded hole.

5. The short beam shear performance test fixture of Claim 4, wherein, The mounting holes are all strip-shaped holes, and the extension direction of the strip-shaped holes is parallel to the second direction.

6. The short beam shear performance test fixture of Claim 3, wherein, The first mounting bracket comprises a first mounting structure and a second mounting structure arranged perpendicularly, the first mounting structure being connected to the support and extending in the second direction, the second mounting structure extending in a direction perpendicular to the top surface of the base, and the second limiting structure being connected to the end of the second mounting structure away from the first mounting structure; at least part of the structure of the second mounting bracket constitutes the guide rail, and the guide rail is connected to the end of the second mounting structure away from the first mounting structure.

7. The short beam shear performance test fixture of any of claims 2-6, wherein, The second limiting structure is provided with a second threaded hole, the second threaded hole exposing part of the surface of the sliding groove or the guide rail, the second threaded hole being provided with a second fastener, and the second fastener rotating relative to the second threaded hole to lock the position of the second limiting structure in the sliding groove or the guide rail.

8. The short beam shear performance test fixture of any of claims 1-6, wherein, The short-beam shear performance test fixture further comprises a first tension spring arranged between the two limiting structures in the second direction, and the two ends of the first tension spring are connected to the two limiting structures respectively.

9. The short beam shear performance test fixture of Claim 1, wherein, The support mechanism further comprises a sample support rod arranged on the top surface of the opposite side of the support of the two support mechanisms and extending in the second direction; The two ends of the sample support rod are connected to the support by second tension springs.

10. A short beam shear performance testing apparatus characterized by, The mechanical testing machine comprises a short beam shear performance test fixture as claimed in any one of claims 1 to 9.

Images