Test pin for current impact test of laminated inductor
By designing an arc-shaped test piece and a beryllium bronze test probe, the problem of surface-mount test probes scratching the tin plating layer of multilayer inductors was solved, thereby improving product reliability and reducing wear.
Patent Information
- Application Number
- CN202423200949.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-24
- Publication Date
- 2026-02-03
- Estimated Expiration
- 2034-12-24
AI Technical Summary
The planar structure of existing surface-mount test probes can easily scratch the tin plating of multilayer inductors during current surge testing. Furthermore, the large contact area leads to severe wear over long-term use, affecting product reliability.
A test probe was designed, including a connecting arm and an arc-shaped test piece. The connecting arm forms an obtuse angle with the positioning mounting plate, and the convex surface of the test piece faces the multilayer inductor under test, reducing the contact area and avoiding secondary damage. Beryllium bronze is used to improve wear resistance.
It effectively reduces the probability of scratches on the tin plating layer of multilayer inductors, improves product reliability, is suitable for small-size inductors, and reduces processing costs.
Smart Images
Figure CN223870757U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of electronic measurement technology, and in particular to a test probe for current impulse testing of multilayer inductors. Background Technology
[0002] Current surge testing is a crucial step in the manufacturing process of multilayer chip inductors, directly impacting product reliability. The current surge test probe is a key component in this process. Currently, the main type of current surge test probe used is the chip probe. The test tip of this probe has a planar structure. During current surge testing, after the test tip contacts the product, the end of the test tip scratches the tin plating on the top of the inductor. Furthermore, the contact area between the planar structure test tip and the multilayer inductor is large, much larger than the top area of a small-sized multilayer inductor. Prolonged use leads to wear on the test tip, resulting in an uneven contact surface. After extended use, the test tip needs to be polished before it can be used again. Utility Model Content
[0003] The purpose of this invention is to provide a test probe for current surge testing of multilayer inductors, reducing the probability of the test probe scratching the tin plating layer of the multilayer inductor electrodes and improving product reliability.
[0004] To achieve the above objectives, this utility model provides a test probe for current impulse testing of multilayer inductors, comprising a probe piece and a positioning mounting plate for connection to a test socket. The probe piece includes a connecting arm and a test piece. The first end of the connecting arm is connected to the end of the positioning mounting plate, and the included angle between the connecting arm and the positioning mounting plate is an obtuse angle. The second end of the connecting arm is connected to the test piece, which is arc-shaped, and the convex surface of the test piece faces the multilayer inductor under test.
[0005] As a preferred embodiment of this utility model, the connecting arm is trapezoidal in shape, the second end of the connecting arm is the short side, and the width of the test piece is the same as the side length of the second end of the connecting arm.
[0006] As a preferred embodiment of this utility model, the side length of the second end of the connecting arm is 0.38mm.
[0007] As a preferred embodiment of this utility model, the thickness of the test needle is 0.15 mm.
[0008] As a preferred embodiment of this utility model, the test needle is a beryllium bronze test needle.
[0009] As a preferred embodiment of this utility model, the positioning mounting plate is provided with positioning holes and bridge module connection holes that connect to the bridge connection module of the test base. The positioning holes fix the positioning mounting plate to the test base with fasteners.
[0010] As a preferred embodiment of this utility model, the included angle between the connecting arm and the positioning mounting plate is 135°.
[0011] Compared with the prior art, the test probe for current impulse testing of multilayer inductors according to this embodiment of the utility model has the following advantages:
[0012] The test piece in this invention is arc-shaped, with its convex surface facing the multilayer inductor under test. During testing, the multilayer inductor under test contacts the convex surface of the test piece. This makes the contact point between the multilayer inductor under test and the test piece the tangent point of the arc-shaped test piece, reducing the contact area and thus reducing scratches on the tin plating layer at the top of the multilayer inductor under test. It is also suitable for small-sized multilayer inductors. Furthermore, the end of the test piece is raised and away from the multilayer inductor under test, so there is no secondary damage to the tin plating layer at the top of the multilayer inductor under test during the test. Attached Figure Description
[0013] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings of the embodiments will be briefly described below.
[0014] Figure 1 A schematic diagram of the structure of a test probe for current impulse testing of multilayer inductors provided by this utility model;
[0015] Figure 2 A side view of the test probe provided by this utility model;
[0016] Figure 3 A schematic diagram of the connection structure between the test probe and the test socket provided by this utility model;
[0017] Figure 4 A schematic diagram of the connection structure between the test probe and the test seat provided by this utility model from another perspective;
[0018] In the figure, there is a needle piece 1; a connecting arm 11; a test piece 12; a positioning mounting plate 2; a positioning hole 21; a bridge module connection hole 22; a test base 3; and a bridge connection module 31. Detailed Implementation
[0019] The specific embodiments of this utility model will be described in further detail below with reference to the accompanying drawings and examples. The following examples are used to illustrate this utility model, but are not intended to limit its scope.
[0020] In the description of this utility model, it should be understood that the terms "upper", "lower", "left", "right", "front", "back", "top", "bottom", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.
[0021] like Figures 1 to 4 As shown, a test probe for current impulse testing of multilayer inductors according to a preferred embodiment of the present invention includes a probe piece 1 and a positioning mounting plate 2 for connection to a test base 3. The probe piece 1 includes a connecting arm 11 and a test piece 12. The first end of the connecting arm 11 is connected to the end of the positioning mounting plate 2, and the included angle between the connecting arm 11 and the positioning mounting plate 2 is an obtuse angle. The second end of the connecting arm 11 is connected to the test piece 12. The test piece 12 is arc-shaped, and the convex surface of the test piece 12 faces the multilayer inductor under test.
[0022] The test piece 12 in this invention is arc-shaped, with its convex surface facing the multilayer inductor under test. During testing, the multilayer inductor under test contacts the convex surface of the test piece 12. Thus, the contact point between the multilayer inductor under test and the test piece 12 is the tangent point of the arc-shaped test piece 12, reducing the contact area to minimize scratches on the tin plating layer at the top of the multilayer inductor under test. It is also suitable for small-sized multilayer inductors. Furthermore, the end of the test piece 12 is raised and away from the multilayer inductor under test, so that the tin plating layer at the top of the multilayer inductor under test will not be damaged during the test.
[0023] For example, the connecting arm 11 is trapezoidal in shape, and the second end of the connecting arm 11 is the short side. The width of the test piece 12 is the same as the side length of the second end of the connecting arm 11, thereby reducing the area of the connecting arm 11. Specifically, the side length of the second end of the connecting arm 11 is 0.38 mm. Furthermore, the thickness of the test probe is 0.15 mm, thereby reducing the thickness of the connecting arm 11. By reducing the area and thickness of the connecting arm 11, the elasticity of the test probe is reduced, and the force exerted by the test probe on the surface of the multilayer inductor under test is reduced, effectively reducing scratches on the tin plating layer of the multilayer inductor under test.
[0024] This embodiment
[0025] The test probe of this utility model is used to perform current impulse tests on multilayer inductors. The thickness of the test probe is 0.15mm, the side length of the first end of the connecting arm 11 is 1mm, and the side length of the second end of the connecting arm 11 is 0.38mm. The width of the test piece 12 is 0.38mm, the test piece 12 is arc-shaped, the bending radius of the test piece 12 is 1.26mm, the current is 0.3A, the current impulse time is 3ms / pcs, and 10000pcs of continuous testing are performed. The burr ratio of the top tin plating layer of the multilayer inductor is 0 / 10000.
[0026] Comparative Example 1
[0027] The multilayer inductor current impulse test was performed using test probe I. The thickness of test probe I is 0.15mm. The first end of connecting arm I has a side length of 1mm, the second end of connecting arm I has a side length of 0.38mm, the width of test piece I is 0.38mm, test piece I has a flat structure, the current is 0.3A, the current impulse time is 3ms / pcs, and 10000pcs of continuous testing are performed. The burr ratio of the top tin plating layer of the multilayer inductor is 6 / 10000.
[0028] Comparative Example 2
[0029] The current impulse test of the multilayer inductor was performed using test probe II. The thickness of test probe II is 0.2mm, the side length of the first end of connecting arm II is 1mm, the side length of the second end of connecting arm II is 0.38mm, the width of test piece II is 0.38mm, test piece II has a flat structure, the current is 0.3A, the current impulse time is 3ms / pcs, and 10000pcs of continuous testing are performed. The burr ratio of the tin plating layer on the top of the inductor is 4 / 1000.
[0030] Comparative Example 3
[0031] The current impulse test of the multilayer inductor was performed using test probe III. The thickness of test probe III is 0.2 mm, the side length of the first end of connecting arm III is 2 mm, the side length of the second end of connecting arm III is 1.37 mm, the width of test piece III is 1.37 mm, test piece III has a flat structure, the current is 0.3 A, the current impulse time is 3 ms / pcs, and 10000pcs of continuous testing are performed. The burr ratio of the tin plating layer on the top of the inductor is 6 / 1000.
[0032] Comparative Example 4
[0033] The current impulse test of the multilayer inductor was performed using test probe IV, which has a thickness of 0.3 mm. The first end of connecting arm IV has a side length of 2 mm, the second end of connecting arm IV has a side length of 1.37 mm, the width of test piece IV is 1.37 mm, and test piece IV has a flat structure. The current is 0.3 A, the current impulse time is 3 ms / pcs, and 10,000 pcs of continuous testing are performed. The burr rate of the tin plating layer on the top of the inductor is 1%.
[0034] Preferably, the test probe is a beryllium bronze test probe, which is made by stamping a thin sheet of beryllium bronze. This test probe has the advantages of wear resistance, excellent conductivity, simple processing, and low processing cost.
[0035] In this embodiment, the positioning mounting plate 2 is provided with a positioning hole 21 and a bridge module connection hole 22 that connects to the bridge connection module 31 of the test base 3. The positioning hole 21 secures the positioning mounting plate 2 to the test base 3 with fasteners, ensuring that the test probe is stably connected to the test base 3 for the multilayer inductor current impulse test. Specifically, the angle between the connecting arm 11 and the positioning mounting plate 2 is 135°, which gives the test probe a certain degree of elasticity and prevents the multilayer inductor under test from contacting the connecting arm 11.
[0036] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "connected" and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.
[0037] The above description is only a preferred embodiment of the present utility model. It should be noted that for those skilled in the art, several improvements and substitutions can be made without departing from the technical principles of the present utility model, and these improvements and substitutions should also be considered within the protection scope of the present utility model.
Claims
1. A test probe for current impulse testing of multilayer inductors, characterized in that, The device includes a pin and a positioning mounting plate for connection to a test socket. The pin includes a connecting arm and a test piece. A first end of the connecting arm is connected to an end of the positioning mounting plate. The angle between the connecting arm and the positioning mounting plate is an obtuse angle. A second end of the connecting arm is connected to the test piece. The test piece is arc-shaped, and the convex surface of the test piece faces the multilayer inductor under test.
2. The test probe for current impulse testing of multilayer inductors as described in claim 1, characterized in that, The connecting arm is trapezoidal in shape, with the second end of the connecting arm being the shorter side, and the width of the test piece being the same as the side length of the second end of the connecting arm.
3. The test probe for current impulse testing of multilayer inductors as described in claim 2, characterized in that, The side length of the second end of the connecting arm is 0.38 mm.
4. The test probe for current impulse testing of multilayer inductors as described in claim 1, characterized in that, The thickness of the test probe is 0.15 mm.
5. The test probe for current impulse testing of multilayer inductors as described in claim 1, characterized in that, The test needle is a beryllium bronze test needle.
6. The test probe for current impulse testing of multilayer inductors as described in claim 1, characterized in that, The positioning mounting plate is provided with positioning holes and bridge module connection holes that connect to the bridge connection module of the test base. The positioning holes fix the positioning mounting plate to the test base with fasteners.
7. The test probe for current impulse testing of multilayer inductors as described in claim 1, characterized in that, The angle between the connecting arm and the positioning mounting plate is 135°.