Integrated waveguide test fixture
By designing an integrated waveguide test fixture, the optomechanic and the test fixture are integrated, solving the alignment problem between the optomechanic and the test fixture, improving the efficiency and accuracy of waveguide testing, and ensuring the uniformity and accuracy of test results.
Patent Information
- Application Number
- CN202520573624.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-30
- Publication Date
- 2026-02-06
- Estimated Expiration
- 2035-03-30
AI Technical Summary
In augmented reality display technology, how to improve testing efficiency and accuracy during batch testing of waveguides, especially how to ensure the alignment of the optomechanical system and the test fixture to avoid repeated debugging.
An integrated waveguide test fixture was designed, which combines the test fixture with the optomechanical system. By setting the optomechanical holding component on the inclined surface of the substrate, the coupling angle of the optomechanical system is kept constant, which can adapt to the test requirements of different waveguides.
It enables accurate alignment of the optical machine and waveguide during batch testing, improving testing efficiency and accuracy, avoiding repeated debugging of the optical machine and test fixture, and ensuring the uniformity and accuracy of test results.
Smart Images
Figure CN223883173U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the field of optical detection technology, and in particular to an integrated waveguide test fixture. BACKGROUND
[0002] In the field of augmented reality display technology, testing the performance of a waveguide is one of the most important links for evaluating the waveguide display effect. The testing of the waveguide often needs to ensure that the test fixture is aligned with the optical machine. When testing waveguides in batches, how to improve the efficiency and accuracy of the testing is a technical problem that needs to be solved by those skilled in the art. CONTENT OF THE UTILITY MODEL
[0003] The utility model provides a kind of integrated waveguide test fixture, test fixture and optical machine are integrally combined design, avoid the repeated debugging of optical machine and test fixture when testing in batches, improve test efficiency and accuracy.
[0004] An integrated waveguide test fixture includes a base body having a first inclined surface. The base body has a groove opening on a side facing the first inclined surface, and the groove opening is used to accommodate the waveguide. An optical machine holding component is integrally arranged on the first inclined surface. The optical machine holding component has a through hole to accommodate the optical machine, and the incident angle of the optical machine meets the coupling-in test requirements of the waveguide.
[0005] Further, the optical machine holding component has a second inclined surface, and the through hole is located on the second inclined surface of the optical machine holding component.
[0006] Further, the coupling-in angle of the optical machine is determined based on the inclination angle of the second inclined surface.
[0007] In one embodiment, the groove opening has at least one step to accommodate and support the waveguide.
[0008] Further, the first inclined surface has a certain included angle with respect to the horizontal plane of the base body. The horizontal plane of the base body has a first direction and a second direction. The first inclined surface has a first inclination angle with respect to the first direction. The first inclined surface has a second inclination angle with respect to the second direction. The first direction and the second direction are perpendicular to each other.
[0009] In one embodiment, the first inclination angle of the first inclined surface with respect to the first direction and the second inclination angle with respect to the second direction are different.
[0010] Further, the inclined surface of the optical machine holding component with respect to the first direction and the second direction of the horizontal plane of the base body includes a third inclination angle with respect to the first direction and a fourth inclination angle with respect to the second direction.
[0011] In an embodiment, the third and fourth tilt angles are different.
[0012] In an embodiment, the first and second tilt angles of the first tilt surface are different from the third and fourth tilt angles of the second tilt surface.
[0013] Further, the groove opening shape is adapted to the outer shape of the waveguide.
[0014] Further, the first, second, third and fourth tilt angles are determined based on the coupling-in angle of the waveguide and the optical machine.
[0015] In the present application, an integrated waveguide test fixture is provided, which integrally sets an optical machine holding part on a first tilt surface of a base body, and an optical machine is integrally fixed on the base body through the optical machine holding part, so that the coupling-in angle of the optical machine and the waveguide is fixed and unchanged when a large number of different waveguides are tested, and the test of a large number of waveguides can be quickly responded, and the coupling-in angle of the optical machine is determined through a second tilt surface, and when different test waveguides are replaced, the coupling-in angle of the optical machine relative to the waveguide is still fixed and unchanged, so that the test standard is unified and the test result is more accurate; and the repeated debugging of the optical machine and the test fixture during batch testing is avoided. Compared with the prior art, the present application has beneficial technical effects. BRIEF DESCRIPTION OF DRAWINGS
[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.
[0017] Fig. 1 A front view of the integrated waveguide test fixture provided by the present application;
[0018] Fig. 2 A top view of the integrated waveguide test fixture provided by the present application;
[0019] Fig. 3 A side view of the integrated waveguide test fixture provided by the present application;
[0020] Fig. 4 A partial enlarged view of the optical machine holding part of the integrated waveguide test fixture provided by the present application;
[0021] Fig. 5The utility model provides a kind of integral waveguide test fixture's optical machine holding part's partial enlarged view is provided;
[0022] Fig. 6 The utility model provides a kind of integral waveguide test fixture's optical machine coupling waveguide schematic diagram is provided;
[0023] Fig. 7 A front view of the utility model provides a kind of integral waveguide test fixture. DETAILED DESCRIPTION
[0024] In order to make the personnel in the technical field better understand the utility model scheme, the technical scheme in the embodiments of the utility model will be described clearly and completely below in conjunction with the drawings in the embodiments of the utility model, apparently, the described embodiments are only a part of the embodiments of the utility model, not all. Based on the embodiments in the utility model, all other embodiments obtained by the person skilled in the art without making creative labor should belong to the scope of the utility model protection.
[0025] The application provides a kind of integral waveguide test fixture, test fixture and optical machine are integrally combined design, avoid the repeated debugging of optical machine and test fixture when batch testing, improve test efficiency and precision.
[0026] As shown in detail, Figs. 1-3 A kind of integral waveguide test fixture, including base body 10, base body 10 has first inclined surface 100, the side of base body 10 towards first inclined surface 100 has recess opening, the recess opening is used to accommodate waveguide;Light machine holding part 200 is integrally arranged on the first inclined surface 100, the light machine holding part 200 has through hole 2002 to accommodate optical machine, the incidence angle of the optical machine meets the coupling-in test requirement of waveguide.
[0027] Further, as shown in Figs. 4-5 Light machine holding part 200 has second inclined surface 2001, through hole 2002 is located on the second inclined surface 2001 of the light machine holding part 200. Fig. 6 Further, as shown in The second inclined surface 2001 is so that the optical machine passing through the through hole 2002 has the incidence angle of inclination relative to waveguide, and the incidence angle meets the requirement when testing waveguide.
[0028] Further, base body 10 has first inclined surface 100, first inclined surface 100 has a certain angle relative to the horizontal plane of base body 10, as Fig. 7As shown, the base body 10 has a first direction and a second direction along the horizontal plane of the base body 10, that is, the bottom surface of the base body 10 is a horizontal plane, and the first direction and the second direction are perpendicular to each other along the horizontal plane; that is, the first direction and the second direction are parallel to the horizontal plane of the base body 10, the first inclined surface 100 has a first inclination angle relative to the first direction; the first inclined surface 100 has a second inclination angle relative to the second direction; and the first direction and the second direction are perpendicular to each other.
[0029] Further, the first inclination angle and the second inclination angle of the first inclined surface 100 relative to the first direction and the second direction are different; the specific sizes of the first inclination angle and the second inclination angle are determined based on the coupling-in angle of the waveguide relative to the human eye or the light machine during testing, and the specific sizes of the angles are not limited herein. For those skilled in the art, the determination of the sizes of the angles is known.
[0030] In an embodiment, as known, the first inclination angle and the second inclination angle are limited to about 0-12°.
[0031] Further, as shown in Figs. 1-3 the base body 10 has a groove opening on the side facing the first inclined surface 100, and the groove opening is used to accommodate the waveguide; that is, the shape of the groove opening is adapted to the outer shape of the waveguide, and the groove opening has a step to accommodate and support the waveguide, so as to facilitate the fixation of the waveguide for testing.
[0032] The first inclined surface 100 is integrally provided with a light machine holding member 200, and in detail, the light machine holding member 200 is integrally provided on the first inclined surface 100, and the light machine is aligned with the coupling-in region of the waveguide placed on the groove opening, so that the light machine passing through the light machine holding member 200 can accurately couple into the coupling-in region of the waveguide; the integral provision of the light machine and the waveguide coupling-in angle avoids repeated debugging of the light machine and the test fixture during batch testing.
[0033] Further, the light machine holding member 200 has a second inclined surface 2001 for controlling the coupling-in angle of the light machine when the light machine passes through the through hole 2002, so that the coupling-in angle of the light machine meets the testing requirements. In this embodiment, by controlling the different inclination angles of the second inclined surface 2001 relative to the horizontal plane, the incident angle of the light machine can be controlled.
[0034] Based on Fig. 7 the same understanding, reference is made to Fig. 4The second inclined surface 2001 of the optical machine holding component 200 includes different inclined angles relative to the horizontal first direction and the horizontal second direction in the horizontal direction relative to the base 10, such as a third inclined angle relative to the first direction and a fourth inclined angle relative to the second direction.
[0035] It is known that in the above embodiment, the first inclined angle, the second inclined angle, the third inclined angle and the fourth inclined angle are all different, so as to realize the alignment test between the optical machine and the waveguide coupling-in.
[0036] As shown in Figs. 1-2 The integrated waveguide test fixture further includes a plurality of mounting holes to facilitate the mounting and debugging of the waveguide test fixture.
[0037] In the present application, the optical machine is fixed by the through hole 2002 provided on the second inclined surface 2001 of the optical machine holding component 200, and since the optical machine holding component 200 is integrally formed with the base 100, the optical machine can maintain the same coupling-in angle relative to the waveguide when testing a plurality of samples; when testing a plurality of samples in batches, the coupling-in angle of the optical machine relative to the waveguide remains unchanged even when different test waveguides are replaced, which is beneficial to improve the accuracy and efficiency of the test.
[0038] It is known to those skilled in the art that when the coupling-in angle changes, the optical display effect of the waveguide will change greatly, and the test accuracy will be greatly reduced. Therefore, the integrated test fixture provided by the present application fixes the coupling-in angle of the waveguide and the optical machine, which can quickly respond to the test of a large number of waveguides, makes the test standard unified and the test result more accurate, and avoids repeated debugging of the optical machine and the test fixture during batch testing.
[0039] The above specific embodiments do not constitute a limitation on the protection scope of the present application. Those skilled in the art should understand that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement within the spirit and principles of the present application shall be included in the protection scope of the present application.
Claims
1. An integrated waveguide testing fixture, characterized in that, The device includes a substrate having a first inclined surface and a groove opening on the side of the substrate facing the first inclined surface for accommodating the waveguide. An optomechanical holding component is integrally disposed on the first inclined surface, the optomechanical holding component having a through hole for accommodating the optomechanical device, and the incident angle of the optomechanical device meeting the coupling test requirements of the waveguide.
2. The integrated waveguide test fixture according to claim 1, characterized in that, The optomechanical holding component has a second inclined surface, and the through hole is located on the second inclined surface of the optomechanical holding component.
3. The integrated waveguide test fixture according to claim 2, characterized in that, The coupling angle of the optomechanical system is determined based on the tilt angle of the second tilted surface.
4. An integrated waveguide test fixture according to claim 1 or 2, characterized in that, The groove opening has at least one step to accommodate and support the waveguide.
5. The integrated waveguide test fixture according to claim 4, characterized in that, The first inclined surface has a certain angle relative to the horizontal plane of the substrate; the horizontal plane of the substrate has a first direction and a second direction, the first inclined surface has a first inclination angle relative to the first direction; the first inclined surface has a second inclination angle relative to the second direction; and the first direction and the second direction intersect perpendicularly.
6. The integrated waveguide test fixture according to claim 5, characterized in that, The first tilt angle of the first inclined surface relative to the first direction is different from the second tilt angle relative to the second direction.
7. The integrated waveguide test fixture according to claim 4, characterized in that, The tilted surface of the optomechanical holding component has a first and a second direction relative to the horizontal plane of the substrate, including a third tilt angle relative to the first direction and a fourth tilt angle relative to the second direction.
8. The integrated waveguide test fixture according to claim 7, characterized in that, The third tilt angle is different from the fourth tilt angle.
9. The integrated waveguide test fixture according to claim 5, characterized in that, The first tilt angle and the second tilt angle of the first tilted surface are different from the third tilt angle and the fourth tilt angle of the second tilted surface.
10. The integrated waveguide test fixture according to claim 9, characterized in that, The magnitudes of the first tilt angle, the second tilt angle, the third tilt angle, and the fourth tilt angle are determined based on the coupling angle between the waveguide and the optomechanism.