Small darkroom applied to EMI (Electro-Magnetic Interference) test
By designing a small anechoic chamber, combined with a signal line placement chamber, a testing chamber, and wireless transmission components, the problem of designers being unable to conduct EMI testing in real time was solved, enabling low-cost and efficient EMI testing and improving the efficiency and quality of product design.
Patent Information
- Application Number
- CN202520437656.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-13
- Publication Date
- 2026-02-27
- Estimated Expiration
- 2035-03-13
AI Technical Summary
In the existing technology, designers are unable to build their own darkrooms, which prevents them from conducting EMI testing during the initial design verification process, affecting product verification and delivery.
A small anechoic chamber was designed, comprising a signal cable placement chamber and a testing chamber. It is equipped with an antenna, a wireless transceiver chip, a signal amplifier, a sensor, a microcontroller, and a display screen to enable wireless signal transmission and real-time monitoring, supporting testing over long distances and in complex environments.
It reduced testing costs, improved the efficiency and quality of design verification, ensured the accuracy and flexibility of testing, and shortened the R&D cycle.
Smart Images
Figure CN223955652U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model belongs to EMI test technical field especially relates to a small -size anechoic chamber for EMI test. BACKGROUND
[0002] The EMI requirement of crystal oscillator in market is increasing, but the establishment cost requirement of existing anechoic chamber, except special test mechanism, basically will not establish own anechoic chamber, and the product of each design needs to send outside and detect, and the EMI of product cannot be tested in time in the initial design verification process of designer, which influences the verification and delivery of product. UTILITY MODEL CONTENT
[0003] The utility model provides a small -size anechoic chamber for EMI test to solve the problem of not establishing own anechoic chamber in prior art and inconvenient EMI test of designer in initial design verification process.
[0004] The utility model adopts the technical scheme of:
[0005] A small -size anechoic chamber for EMI test, including signal line placement room and test room, wherein:
[0006] The common surface of signal line placement room and test room has at least one hole for connecting test probe;
[0007] At least one hole is arranged on at least one surface of signal line placement room except the common surface with test room, for connecting external test instrument, so as to measure the parameter of measured piece, and connector is used at all holes of signal line placement room, forming airtight space in the room;
[0008] The inner wall of test room is pasted with wave-absorbing material, and test probe and measured piece are arranged in test room; at least one hole is arranged on at least one surface of test room except the common surface with signal line placement room, for connecting external power supply, so as to power the measured piece; connector is used at all holes of test room, forming airtight space in the room; the top of signal line placement room can be opened, and the operator can connect test probe with different test instruments according to different test requirements.
[0009] Further, it further includes:
[0010] Antenna, the antenna is installed in the outside of small -size anechoic chamber;
[0011] Wireless transceiver chip, the wireless transceiver chip is connected with the antenna;The wireless transceiver chip is connected with the test instrument outside small -size anechoic chamber, and the wireless transceiver chip transmits the test data of test instrument outside small -size anechoic chamber to external equipment through the antenna.
[0012] Further, a signal amplifier is connected between the antenna and the wireless transceiver chip, which amplifies the signal output from the wireless transceiver chip and transmits it to the antenna to overcome the loss of the signal in the transmission process.
[0013] Further, the wireless transceiver chip is Si24R03.
[0014] Further, it further comprises:
[0015] A sensor is installed in the test chamber for detecting the EMI level in the small darkroom;
[0016] A single-chip microcomputer is connected with the sensor, and the single-chip microcomputer is used to analyze the data of the EMI level transmitted by the sensor;
[0017] A display screen is connected with the single-chip microcomputer, and the display screen is used to display the data of the EMI level, and the user can adjust the EMI test parameters according to the data of the EMI level.
[0018] Further, the wireless transceiver chip, the signal amplifier, the single-chip microcomputer and the display screen are arranged on the same PCB board.
[0019] The beneficial effects of the utility model are:
[0020] In terms of cost, the small darkroom for EMI test breaks the dilemma of relying on external detection due to high construction cost of the enterprise in the past, and reduces the test cost. For design verification, the designer can test in time in the initial design stage of the product, such as EMI test of crystal oscillator, which can quickly find and solve problems, improve design efficiency and quality, and shorten the research and development period. The structure design of the small darkroom for EMI test provided by the utility model is also very reasonable, the independent space of the signal line and the test chamber and the setting of the connecting hole and the connecting head guarantee the test accuracy and reliability; the signal line placement chamber top can be opened, which is convenient for the operator to flexibly connect the test instrument according to the test requirement, and improves the test flexibility and efficiency. The small darkroom for EMI test realizes stable data transmission in long-distance wireless transmission and complex environment through the combination of the antenna, the wireless transceiver chip and the signal amplifier, significantly improves the flexibility and efficiency of the test. At the same time, through the integrated design of the sensor, the single-chip microcomputer and the display screen, the real-time monitoring and accurate feedback of the EMI level are realized, and the accuracy and reliability of the test are improved. BRIEF DESCRIPTION OF DRAWINGS
[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor.
[0022] Figure 1 Schematic diagram of a small darkroom for EMI test;
[0023] Figure 2 Schematic diagram of a communication scheme of a small darkroom for EMI test. DETAILED DESCRIPTION
[0024] The embodiment provides a small darkroom for EMI test.
[0025] In the description of the present application, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.
[0026] The following disclosure provides many different embodiments or examples for implementing different structures of the present application. In order to simplify the disclosure of the present application, the components and settings of a specific example are described in the following. Of course, they are only examples, and the purpose is not to limit the present application.
[0027] The embodiments of the present application will be described in detail below with reference to the accompanying drawings.
[0028] The small darkroom for EMI test disclosed in the embodiment comprises the following components: a signal line placement room 11, a test room 12, an antenna, a wireless transceiver chip, a sensor, a single-chip microcomputer and a display screen. The wireless transceiver chip, the signal amplifier, the single-chip microcomputer and the display screen are arranged on the same PCB board.
[0029] The structure and function of the signal line placement room 11 and the test room 12 are described in detail below.
[0030] The signal line placement chamber 11 and the test chamber 12 are both cuboids. The length, width and height of the signal line placement chamber 11 are 3 meters, 1.5 meters and 1 meter respectively; the length, width and height of the test chamber 12 are 1 meter, 1.5 meters and 1 meter respectively.
[0031] The signal line placement chamber 11 is used for placing the signal line for EMI testing. The signal line placement chamber 11 has four sides (as shown in the accompanying drawings), which are named as side 211, side 212, side 213 and side 214 respectively, and the side 212 is the common side 2 of the signal line placement chamber 11 and the test chamber 12. There is one hole on the side 211, which is named as hole 311; there is one hole on the side 212, which is named as hole 312; there is one hole on the side 213, which is named as hole 313; and there is one hole on the side 214, which is named as hole 314. Connectors are used at all the holes 3 of the signal line placement chamber 11, so that a closed space is formed inside the chamber. Figure 1
[0032] Among them, the hole 311 is connected to a frequency spectrum analyzer outside, and the hole 312 is connected to a test probe inside; the hole 313 and the hole 314 are connected to different test instruments outside.
[0033] The test chamber 12 is used for EMI testing of the measured object. The inner wall of the test chamber 12 is pasted with wave-absorbing material; the test chamber 12 has a test probe and a measured object inside, and in this embodiment, the measured object is a crystal oscillator; the test chamber 12 has four sides (as shown in the accompanying drawings), which are named as side 221, side 212 (the common side 2 of the signal line placement chamber 11 and the test chamber 12), side 223 and side 224 respectively, and the side 212 is the common side 2 of the signal line placement chamber 11 and the test chamber 12. There are two holes on the side 221, which are named as hole 3211 and hole 3212 respectively; and there are no holes on the side 223 and the side 224. Connectors are used at all the holes of the test chamber 12, so that a closed space is formed inside the chamber. Figure 1
[0034] Among them, the hole 3211 and the hole 3212 are connected to a power supply outside, and the power supply supplies power to the measured object.
[0035] The top of the signal line placement chamber 11 can be opened, and the operator can connect different test instruments to the test probe according to different test requirements.
[0036] The small darkroom applied to EMI testing is suitable for EMI testing under complex environments and long-distance wireless transmission, and the components and working principles related to the implementation of the functions are described below. The related components include an antenna, a wireless transceiver chip and a signal amplifier. As shown in the accompanying drawings. Figure 2
[0037] Antenna: installed on the outside of the small darkroom, used for receiving and sending wireless signals.
[0038] Wireless transceiver chip: The wireless transceiver chip is selected as Si24R03 chip. Si24R0 chip 3 has high sensitivity and strong anti-interference ability, which is suitable for EMI test environment. In addition, compared with other similar chips, Si24R03 chip integrates multiple functions into one chip, reducing the number of external components and power consumption, which is extremely critical for devices that need to run for a long time and have strict energy consumption requirements. Compared with some chips that are not highly integrated, it performs better in system simplicity and energy consumption control. The wireless transceiver chip is connected with the signal amplifier, and the signal amplifier is connected with the antenna. At the same time, the wireless transceiver chip is connected with the test instrument outside the small darkroom for collecting data of the test instrument.
[0039] Working principle:
[0040] Data transmission: The wireless transceiver chip receives test data from the external test instrument and transmits the amplified signal to the antenna through the signal amplifier. The antenna transmits the amplified signal wirelessly to the external device for subsequent processing.
[0041] Signal amplification: The function of the signal amplifier is to overcome the loss of the signal in the transmission process, to ensure the strength and quality of the signal, and to improve the reliability and stability of data transmission.
[0042] The small darkroom applied to EMI test can monitor EMI level in real time. The components related to the realization of this function and the working principle are described below. The relevant components include sensors, single-chip microcomputers, and display screens. As shown in the accompanying Figure 2 .
[0043] The sensor is installed in the test chamber to detect the EMI level in the small darkroom. The single-chip microcomputer is selected as STM32 single-chip microcomputer. The single-chip microcomputer is connected with the sensor to analyze the EMI level data transmitted by the sensor. The display screen is connected with the single-chip microcomputer to display the EMI level data.
[0044] Working principle:
[0045] EMI detection: The sensor detects the EMI level in the small darkroom and transmits the data to the single-chip microcomputer.
[0046] Data analysis and display: The single-chip microcomputer analyzes the EMI level data transmitted by the sensor and displays these data through the display screen. Users can adjust the EMI test parameters according to the displayed EMI level data.
[0047] The wireless transceiver chip, signal amplifier, single-chip microcomputer, and display screen are set on the same PCB board. This integrated design reduces the complexity of the circuit, improves the stability and reliability of the system, and is convenient for installation and maintenance.
[0048] The small darkroom for EMI testing provided by the embodiment has many advantages:
[0049] Reducing testing cost: In the past, except for special testing institutions, enterprises did not establish their own darkrooms due to high construction cost, and products need to be sent out for testing. The emergence of this small darkroom provides an economically feasible self-built testing environment solution for enterprises, reducing the cost of sending out for testing, helping enterprises to control costs, especially for enterprises that need to frequently conduct EMI testing, which has significant economic benefits in the long run.
[0050] Convenient for design verification: During the initial design stage of the product, the designer can use the small darkroom to test the EMI of the product (such as a crystal oscillator) immediately. In the past, due to the lack of internal testing conditions, the designer could not obtain the test results in time and adjust the design, but now the designer can quickly verify the rationality of the design, discover and solve potential EMI problems in time, greatly improve the efficiency and quality of product design, shorten the product development cycle, and enhance the competitiveness of the enterprise in the market.
[0051] Independent space and connection design: The signal line placement room and the test room each perform their own functions and are closely connected. The signal line placement room is connected to external testing instruments through holes on different surfaces, which can accurately measure the parameters of the measured object; the test room is connected to external power supply through holes on a specific surface to power the measured object, and the connection heads are arranged on the common surface and other surface holes of the two rooms to ensure the airtightness of the room, prevent external interference from affecting the test results, and ensure the accuracy and reliability of the test.
[0052] Openable top design: The openable top design of the signal line placement room brings great convenience to the operator. The operator can flexibly connect the test probe to different testing instruments according to different testing requirements, meet various testing needs, enhance the versatility and adaptability of the testing equipment, and further improve the flexibility and efficiency of the test.
[0053] Wireless transmission: The small darkroom for EMI testing is suitable for EMI testing in complex environments that require long-distance wireless transmission, and can obtain test data remotely.
[0054] Real-time data feedback: The sensor can detect the EMI level in the small darkroom in real time and transmit the data to the single-chip microcomputer. The single-chip microcomputer analyzes these data and displays them on the display screen, so that the user can view the EMI level in real time and understand the changes in the test environment in time.
[0055] Accurate data analysis: The STM32 single-chip microcomputer has strong data processing capability and can accurately analyze the EMI level data transmitted by the sensor, ensuring the accuracy and reliability of the data.
[0056] User-friendly interface: The display screen directly displays EMI level data, and users can adjust EMI test parameters according to the displayed data, improving the flexibility and accuracy of the test. This design enables users to quickly respond to test requirements and optimize the test process.
[0057] Integrated design: The wireless transceiver chip, signal amplifier, single-chip microcomputer, and display screen are set on the same PCB board. This integrated design reduces the complexity of the circuit, improves the stability and reliability of the system, and is convenient for installation and maintenance. The integrated design also reduces signal transmission delay and improves the response speed of the system.
Claims
1. A compact anechoic chamber for EMI testing, characterized by, The small darkroom comprises a signal line placement chamber and a test chamber, wherein: the signal line placement chamber and the test chamber share at least one hole on a common surface for connecting a test probe; the signal line placement chamber has at least one hole on at least one surface other than the common surface with the test chamber for connecting an external test instrument to measure parameters of a measured object; the signal line placement chamber uses a connector at all holes to form a closed space inside the chamber; the test chamber has a test probe and a measured object inside, and a wall of the test chamber is attached with a wave-absorbing material; the test chamber has at least one hole on at least one surface other than the common surface with the signal line placement chamber for connecting an external power supply to power the measured object; the test chamber uses a connector at all holes to form a closed space inside the chamber; the top of the signal line placement chamber is open, and an operator can connect the test probe to different test instruments according to different test requirements; The small darkroom further comprises: an antenna installed outside the small darkroom; a wireless transceiver chip connected with the antenna; the wireless transceiver chip is connected with a test instrument outside the small darkroom, and the wireless transceiver chip transmits test data of the test instrument outside the small darkroom to an external device through the antenna.
2. The compact anechoic chamber for EMI test according to claim 1, wherein, A signal amplifier is connected between the antenna and the wireless transceiver chip, which amplifies the signal output from the wireless transceiver chip and transmits it to the antenna to overcome signal loss during transmission.
3. The compact anechoic chamber for EMI testing according to claim 2, wherein The wireless transceiver chip is Si24R03.
4. The compact anechoic chamber for EMI testing according to claim 3, wherein Further comprising: a sensor installed in the test chamber for detecting the EMI level in the small darkroom; a single-chip microcomputer connected with the sensor, which is used to analyze the data of the EMI level transmitted by the sensor; a display screen connected with the single-chip microcomputer, which is used to display the data of the EMI level, and a user can adjust the EMI test parameters according to the data of the EMI level.
5. The compact anechoic chamber for EMI testing according to claim 4, wherein The wireless transceiver chip, the signal amplifier, the single-chip microcomputer, and the display screen are arranged on the same PCB board.