W-band waveguide type SIP module automatic test table board equipment

Abstract

The utility model discloses W-frequency-band waveguide type SIP module automatic test table board equipment, which comprises a machine shell and a test assembly arranged in the machine shell, and the test assembly comprises a jig, a signal transmitting piece and a signal receiving piece. The jig is provided with a front-end right-angle waveguide port and a rear-end right-angle waveguide port, the front-end right-angle waveguide port corresponds to a front-end transceiving channel of the waveguide type SIP module, the rear-end right-angle waveguide port corresponds to a rear-end transceiving channel of the waveguide type SIP module, and the jig is used for fixing the waveguide type SIP module. According to the utility model, mechanical equipment is used for replacing transmission manual testing, automatic switching of waveguide ports can be realized, a gold wire bonding step required by manual testing is taken out during testing, personnel allocation and material consumption are greatly reduced, manpower, material resources and financial resources are saved, and meanwhile, testing data are automatically stored.

Description

Technical Field

[0001] This utility model relates to the field of testing equipment technology, and in particular to an automatic test bench device for waveguide-type SIP modules in the W-band. Background Technology

[0002] In an active phased array radar system, one or more radiating elements require a separate T / R (Transmitter and Receiver) module to form the active phased array radar antenna. The T / R module is packaged into a SiP (System-in-Package) integrated module using encapsulation technology. This SiP integrated module is for the W-band of the active phased array.

[0003] like Figure 3 This W-band SIP integrated module includes 2 front-end transceiver channels and 4 back-end transceiver channels.

[0004] The current testing procedure is as follows: after connecting the front-end transceiver channel 1 port to the back-end port 11, and then connecting the external waveguide probe and instruments, the receive gain and transmit power tests are completed, which takes about 5 minutes; then the channels are switched so that the front-end port 1 is connected to the back-end port 12, and the above test is repeated; the above switching is repeated once to complete the transceiver tests of all combinations of 1-11, 1-12, 2-21, and 2-22.

[0005] The current testing method involves creating a dedicated TR test chamber fixture containing five SIP modules. Each channel of the SIP modules is guided and connected to the outside of the TR test chamber fixture via a dedicated waveguide path. During testing, external waveguide probes (only one pair) are installed onto the corresponding waveguide ports using screws to complete the transmit and receive tests. Testing also requires powering and connecting control signals to each SIP module. Currently, this is done by installing a control circuit board (referred to as a daughter board) inside the TR fixture. After the SIP modules are installed, the SIP pins are connected to the daughter board pins using gold wire bonding. After testing, the gold wires are removed and the area is cleaned.

[0006] Current SIP module testing has the following shortcomings:

[0007] 1. The waveguide port switching is done manually by personnel, which cannot guarantee the consistency of installation and is time-consuming and labor-intensive.

[0008] 2. Gold wire bonding wastes raw gold wire and requires specialized equipment for bonding.

[0009] 3. The testing process is cumbersome and increases the company's manufacturing costs. The gold wire bonding process can be reduced.

[0010] 4. The technical skills of testers vary greatly, resulting in poor consistency of test data.

[0011] 5. Low level of automation, labor-intensive, and cumbersome operation procedures.

[0012] 6. Test data needs to be manually copied and pasted one by one, which is prone to errors and cannot generate reports automatically. Utility Model Content

[0013] The purpose of this invention is to overcome the shortcomings of the existing technology and provide an automatic test platform device for waveguide-type SIP modules in the W-band. By replacing manual testing with mechanized equipment, it can realize automatic switching of waveguide ports. During testing, the gold wire bonding steps required for manual testing are removed, which greatly reduces personnel configuration and material consumption, saving manpower, material resources and financial resources. At the same time, the test data is automatically saved.

[0014] The objective of this utility model is achieved through the following technical solution:

[0015] An automated test bench device for waveguide-type SIP modules in the W-band includes a housing and a test assembly disposed within the housing. The test assembly includes a fixture, a signal transmitter, and a signal receiver.

[0016] The fixture is provided with a front right-angle waveguide port and a rear right-angle waveguide port. The front right-angle waveguide port corresponds to the front transceiver channel of the waveguide-type SIP module, and the rear right-angle waveguide port corresponds to the rear transceiver channel of the waveguide-type SIP module. The fixture is used to fix the waveguide-type SIP module.

[0017] The signal transmitter is used to output test signals to the waveguide-type SIP module. The signal transmitter is installed in the housing through the first three-axis motion assembly. The signal transmitter is provided with a transmitting probe that is adapted to the front right-angle waveguide port.

[0018] The signal receiver is used to receive test signals. The signal receiver is installed in the housing via a second three-axis motion assembly. The signal receiver is equipped with a receiving probe that is adapted to the rear right-angle waveguide port.

[0019] Furthermore, the surface of the fixture is provided with a recessed vacuum cavity, which is connected to a vacuum generator via a vacuum tube.

[0020] Furthermore, it also includes a probe card, which is mounted inside the housing via a two-axis motion assembly.

[0021] Furthermore, magnetic doors are provided on both sides and the back of the housing.

[0022] Furthermore, the front of the housing is provided with a working window, and the inner side of the housing is provided with a slide rail. A glass door that can slide vertically is provided on the slide rail, and the glass door is used to cover the working window.

[0023] Furthermore, a fixing block made of magnetic material is provided on the upper side of the glass door, and a magnet corresponding to the fixing block of the glass door is provided on the inner top of the housing. When the glass door is pulled up to the position, it is fixed by the fixing block and the magnet to block the working window.

[0024] Furthermore, a toggle block is provided on the outside of the glass door.

[0025] The beneficial effects of this utility model are:

[0026] 1) This utility model replaces manual testing with mechanized equipment, which can realize automatic switching of waveguide ports. During testing, the gold wire bonding steps required for manual testing are removed, which greatly reduces personnel configuration and material consumption, saving manpower, material resources and financial resources. At the same time, the test data is automatically saved.

[0027] 2) The traditional gold wire bonding was replaced by a probe card, and the gold wire bonding and gold wire removal processes were eliminated by using automated technology; this greatly reduced the number of personnel and material consumption, saving manpower, material resources and financial resources.

[0028] 3) By using a vacuum fixture to adsorb the SIP module, the time and effort (about 3-4 minutes) of manually aligning and removing screws is reduced, and the SIP module can be quickly installed and removed (about 5 seconds). Attached Figure Description

[0029] Figure 1 This is a perspective view of the automatic test bench device for waveguide-type SIP modules in the W-band of this utility model embodiment;

[0030] Figure 2 for Figure 1 Enlarged view of point A in the middle section;

[0031] Figure 3 A 3D view of an automated test bench for W-band waveguide-type SIP modules, concealed behind a housing.

[0032] Figure 4 This is a schematic diagram of the glass door installation.

[0033] Figure 5 This is a 3D view of a waveguide-type SIP module;

[0034] Figure 6 For the three-dimensional of the metallurgical tool Figure 1 ;

[0035] Figure 7 For the three-dimensional of the metallurgical tool Figure 2 ;

[0036] Figure 8 A three-dimensional view of the signal receiver;

[0037] In the diagram, 1. Housing; 2. Fixture; 3. Signal transmitter; 4. Signal receiver; 5. Front right-angle waveguide port; 6. Rear right-angle waveguide port; 7. Vacuum cavity; 8. Probe card; 9. Magnetic door; 10. Slide rail; 11. Glass door; 12. Fixing block; 13. Pulling block; 14. Waveguide-type SIP module. Detailed Implementation

[0038] The technical solution of this utility model will be clearly and completely described below with reference to the embodiments. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0039] See Figures 1-8 This utility model provides a technical solution:

[0040] Example:

[0041] like Figures 1-8 As shown, an automatic test bench device for a waveguide-type SIP module in the W-band includes a housing 1 and a test assembly disposed within the housing 1. The test assembly includes a fixture 2, a signal transmitter 3, and a signal receiver 4.

[0042] like Figure 5 As shown, the fixture 2 is provided with two front right-angle waveguide ports 5 and four rear right-angle waveguide ports 6. The front right-angle waveguide ports 5 correspond to the front transceiver channels of the waveguide-type SIP module 14, and the rear right-angle waveguide ports 6 correspond to the rear transceiver channels of the waveguide-type SIP module 14. The fixture 2 is used to fix the waveguide-type SIP module 14 (the front / rear right-angle waveguide ports are provided with L-shaped connecting posts. After the waveguide-type SIP module 14 is fixed on the fixture 2, the front transceiver channels on the waveguide-type SIP module 14 are electrically connected to the first probe of the signal transmitter 3 through the connecting posts, and the rear transceiver channels of the waveguide-type SIP module 14 are electrically connected to the second probe of the signal receiver 4 through the connecting posts).

[0043] The signal transmitter 3 (signal transmitter end connected to external test instruments) is used to output test signals to the waveguide-type SIP module 14. The signal transmitter 3 is installed in the housing 1 through the first three-axis motion assembly. The signal transmitter 3 is provided with a transmitting probe that is adapted to the front right-angle waveguide port 5.

[0044] The signal receiver 4 (the signal receiving end connected to the external testing instrument) is used to receive test signals. The signal receiver 4 is installed inside the housing 1 via a second three-axis motion assembly. The signal receiver 4 is equipped with a receiving probe that is compatible with the rear right-angle waveguide port 6. The external testing instrument is common knowledge in the field, and its specific structure, model, and principle will not be described in detail here.

[0045] The surface of the fixture 2 is provided with a recessed vacuum cavity 7, which is connected to a vacuum generator via a vacuum tube.

[0046] It also includes a probe card 8, which is mounted inside the housing 1 via a two-axis motion assembly. The probe card's function is to move the spring probe to the SIP power-on position, then press down to connect the circuit and supply power. It also performs corresponding electrical control, controlling the on / off procedures within the SIP.

[0047] The casing 1 is provided with magnetic doors 9 on both sides and the back. The magnetic doors 9 facilitate the installation and removal of the side doors and the back door.

[0048] like Figures 1-3 As shown, the front of the housing 1 is provided with a working window, and the inner side of the housing 1 is provided with a slide rail 10. The slide rail 10 is provided with a glass door 11 that can slide vertically, and the glass door 11 is used to cover the working window.

[0049] The upper side of the glass door 11 is provided with a fixing block 12 made of magnetic material (such as iron block), and the inner top of the housing 1 is provided with a magnet corresponding to the fixing block 12 of the glass door 11. When the glass door 11 is pulled up to the position, it is fixed by the fixing block 12 and the magnet to block the working window.

[0050] A lever 13 is provided on the outer side of the glass door 11. The lever 13 facilitates the upward and downward sliding of the glass door 11.

[0051] 1. Both the first and second three-axis motion components are X, Y, and Z three-axis motion components, which can be implemented by, but are not limited to, three sets of lead screws and sliders arranged in a cross shape. The specific structure is existing technology and will not be described in detail here. The two-axis motion component is an X and Z axis motion component, which can also be implemented by, but is not limited to, lead screws and sliders. 2. The housing 1 is also equipped with a controller and control elements for the movement of the first three-axis motion component, the second three-axis motion component, and the two-axis motion component, as well as for controlling the signal transmission and reception of the signal transmitter 3 and the signal receiver 4 to complete the testing of the waveguide-type SIP module 14. The controller is connected to a control panel or remote device (such as a mobile phone, computer, etc.) for convenient controller operation. 3. The front of the housing 1 is equipped with status indicator lights and emergency stop and power buttons.

[0052] Working principle: (1) When the power is turned on, each motion axis of the equipment will automatically return to the zero position with one key.

[0053] (2) Set up the instruments and meters required for testing the SIP module and perform corresponding debugging.

[0054] (3) Set the parameters of the SIP module automatic test bench equipment and enter the automatic control interface.

[0055] (4) Manually slide down the glass door 11 and place the waveguide-type SIP module 14 to be tested into the fixture. The waveguide-type SIP module 14 is vacuum-adsorbed into the fixture 2, thus achieving quick fixation and disassembly. Afterward, manually slide up the glass door 11.

[0056] (5) Click the automatic test start button.

[0057] (6) The motion control of the signal receiver 4 (composed of three axes of XYZ), the motion control of the signal transmitter 3 (composed of three axes of XYZ) and the motion control of the probe card 8 (composed of two axes of XZ) automatically move to the test position. At the same time, the pneumatic vacuum valve connected to the fixture 2 is activated to adsorb the SIP module.

[0058] (7) After all motion components report no alarms, all motion components automatically move to the test position, start the first waveguide port test, and save the test data. The first three-axis motion component drives the transmitting probe of the signal transmitter 3 to insert into the first front right-angle waveguide port 5 on the fixture 2, and the second three-axis motion component drives the receiving probe of the signal receiver 4 to insert into the first rear right-angle waveguide port 6 on the fixture 2.

[0059] (8) After the first waveguide port test is completed, the test will automatically proceed to the second waveguide port test and the test data will be saved.

[0060] (9) Repeat the cycle until the SIP module waveguide port channel test is completed. Each motion control mechanism will automatically move to the ready test position and release the vacuum of the SIP module positioning fixture.

[0061] Personnel review the test data. If a retest is required, click the automatic start button and repeat the above steps until the test is complete. If a retest is not required, personnel can manually remove the SIP module, insert a new SIP module to be tested, and click the automatic test button to automatically repeat the above steps until the test is complete. Three sets of XYZ coordinate motion mechanisms drive the waveguide probe and probe card 8, enabling automatic switching of the waveguide port and power supply signal required for the test, in conjunction with external testing instruments.

[0062] The traditional gold wire bonding was replaced by probe card 8, which uses automation technology to eliminate the past gold wire bonding and gold wire removal processes; this greatly reduces personnel and material consumption, saving manpower, material resources and financial resources.

[0063] By using a vacuum fixture to pick up the SIP module, the time and effort spent by personnel aligning and removing screws (approximately 3-4 minutes) is reduced, enabling rapid installation and removal of the SIP module (approximately 5 seconds).

[0064] This invention replaces manual testing with mechanized equipment, enabling automatic switching of waveguide ports. The gold wire bonding steps required for manual testing are eliminated during testing, greatly reducing personnel and material consumption, saving manpower, material resources and financial resources. At the same time, test data is automatically saved.

[0065] The above description is merely a preferred embodiment of this utility model. It should be understood that this utility model is not limited to the forms disclosed herein and should not be construed as excluding other embodiments. It can be used in various other combinations, modifications, and environments, and can be altered within the scope of the concept described herein through the above teachings or related technologies or knowledge. Modifications and variations made by those skilled in the art that do not depart from the spirit and scope of this utility model should be protected within the scope of the appended claims.

Claims

1. An automated test bench for waveguide-type SIP modules in the W-band, characterized in that: The device includes a housing and a test assembly disposed within the housing, wherein the test assembly includes a fixture, a signal transmitter, and a signal receiver. The fixture is provided with a front right-angle waveguide port and a rear right-angle waveguide port. The front right-angle waveguide port corresponds to the front transceiver channel of the waveguide-type SIP module, and the rear right-angle waveguide port corresponds to the rear transceiver channel of the waveguide-type SIP module. The fixture is used to fix the waveguide-type SIP module. The signal transmitter is used to output test signals to the waveguide-type SIP module. The signal transmitter is installed in the housing through the first three-axis motion assembly. The signal transmitter is provided with a transmitting probe that is adapted to the front right-angle waveguide port. The signal receiver is used to receive test signals. The signal receiver is installed in the housing via a second three-axis motion assembly. The signal receiver is equipped with a receiving probe that is adapted to the rear right-angle waveguide port.

2. The automatic test bench equipment for waveguide-type SIP modules in the W-band according to claim 1, characterized in that: The surface of the fixture is provided with a recessed vacuum cavity, which is connected to a vacuum generator via a vacuum tube.

3. The automatic test bench equipment for waveguide-type SIP modules in the W-band according to claim 1, characterized in that: It also includes a probe card, which is mounted inside the housing via a two-axis motion assembly.

4. The automatic test bench equipment for waveguide-type SIP modules in the W-band according to claim 1, characterized in that: The casing is equipped with magnetic doors on both sides and the back.

5. The automatic test bench equipment for waveguide-type SIP modules in the W-band according to claim 4, characterized in that: The front of the housing has a working window, and the inside of the housing has a slide rail with a glass door that can slide vertically on the slide rail. The glass door is used to cover the working window.

6. The automatic test bench equipment for waveguide-type SIP modules in the W-band according to claim 5, characterized in that: The upper side of the glass door is equipped with a fixing block made of magnetic material, and the inner top of the housing is equipped with a magnet corresponding to the fixing block of the glass door. When the glass door is pulled up to the position, it is fixed by the fixing block and the magnet to block the working window.

7. The automatic test bench equipment for waveguide-type SIP modules in the W-band according to claim 6, characterized in that: The glass door is equipped with a lever on the outside.

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