Eye pattern test switching equipment and eye pattern test device
By using an adapter board and connecting cable instead of carbon rod soldering in eye diagram testing, the effects of parasitic capacitance and inductance are avoided, achieving higher accuracy eye diagram testing and solving the problem of large test result errors in existing technologies.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-13
- Publication Date
- 2026-03-17
AI Technical Summary
In existing technologies, the eye diagram test results have large errors, mainly because the parasitic capacitance and parasitic inductance introduced when welding the carbon rod to the test equipment affect the impedance and resonant frequency of the signal, resulting in inconsistent waveforms in the test results.
By using an adapter board and connecting cable as a relay between the test equipment and the oscilloscope, the welding of carbon rods to the test equipment is avoided. Signal transmission is achieved using high-speed cables and adapters, reducing the influence of parasitic capacitance and inductance, and ensuring accurate signal transmission.
This improved the accuracy of eye diagram testing, reduced testing errors, and ensured the consistency and accuracy of the waveforms in the test results.
Smart Images
Figure CN224005198U_ABST
Abstract
Description
Technical Field
[0001] This application relates to testing technology, and more particularly to an eye diagram testing adapter and an eye diagram testing apparatus. Background Technology
[0002] Eye diagram testing plays a crucial role in signal integrity analysis of high-speed interconnect systems. Through eye diagram testing, information such as the presence of overshoot, ringing, excessive jitter, signal-to-noise ratio, and symmetry of rise / fall times (duty cycle) in digital signals can be observed. This information is essential for evaluating system transmission performance, debugging circuits, and optimizing system design.
[0003] The testing equipment is typically connected to an oscilloscope via a high-speed differential carbon rod to perform eye diagram testing. Specifically, one end of the high-speed differential carbon rod is connected to the oscilloscope, and the other end is soldered to the testing equipment.
[0004] However, the eye diagram test results obtained by the above testing method have a large error. Utility Model Content
[0005] This application provides an eye diagram testing adapter and an eye diagram testing apparatus to reduce eye diagram testing errors.
[0006] On one hand, this application provides an eye diagram testing adapter, including a first adapter board and a connecting cable. The first adapter board has a first connection port and a second connection port, and the first connection port is connected to the testing equipment.
[0007] The first end of the connecting cable is connected to the oscilloscope, and the second end of the connecting cable is connected to the second connecting port.
[0008] In one possible implementation, the second connection port is an SSMP connection port, with the first end of the connection cable connected to the SMA connection port of the oscilloscope and the second end of the connection cable connected to the SSMP connection port.
[0009] In one possible implementation, the connecting cable includes a first cable, an adapter, and a second cable;
[0010] The first end of the first cable has an SMA connector, which is connected to the SSMP connection port, and the second end of the first cable is connected to the first end of the adapter.
[0011] The first end of the second cable is connected to the second end of the adapter, and the second end of the second cable has an SSMP connector, which is connected to the SSMP connection port.
[0012] In one possible implementation, both the first cable and the second cable are high-speed cables.
[0013] In one possible implementation, the first connection port is connected to the first docking port of the test device.
[0014] In one possible implementation, a first board-to-board connector is also included, wherein a first end of the first board-to-board connector is connected to the first connection port, and a second end of the first board-to-board connector is connected to the first mating port.
[0015] In one possible implementation, the eye diagram test adapter further includes a second adapter board connected to the test device;
[0016] The second adapter board has a PCIe slot, and the first connection end includes gold fingers, which are connected to the PCIe slot.
[0017] In one possible implementation, a second board-to-board connector is also included, wherein the second adapter board has a second mating interface;
[0018] The first end of the second board-to-board connector is connected to the first mating port, and the second end of the second board-to-board connector is connected to the second mating interface.
[0019] In one possible implementation, the test device includes a domain controller.
[0020] On the other hand, this application provides an eye diagram testing apparatus, including a testing device, an oscilloscope, and an eye diagram testing adapter as described above;
[0021] The connecting cable of the eye diagram test adapter is connected to the oscilloscope, and the first connecting port of the first adapter board of the eye diagram test adapter is connected to the test equipment.
[0022] The eye diagram testing adapter and eye diagram testing device provided in this application have the following beneficial effects.
[0023] The eye diagram testing apparatus includes an eye diagram testing adapter, which comprises a first adapter board and a connecting cable. The first adapter board has a first connection port and a second connection port. The first connection port is used to connect the testing equipment, allowing the testing equipment to connect to the first adapter board and transmit its signal to the first adapter board. An oscilloscope is connected to the first end of the connecting cable, and the second end of the connecting cable is connected to the second connection port of the first adapter board. This allows the signal from the testing equipment to be relayed through the adapter board and transmitted to the oscilloscope via the connecting cable for eye diagram testing of the testing equipment.
[0024] Compared to related technologies, the eye diagram test adapter and eye diagram test device provided in this application use an adapter board and connecting cable as a relay part between the test equipment and the oscilloscope to realize the connection between the test equipment and the oscilloscope, thereby performing eye diagram tests. This avoids welding the carbon rod to the test equipment, thereby avoiding the introduction of parasitic capacitance and / or parasitic inductance, and thus avoiding the influence of parasitic capacitance and / or parasitic inductance on impedance and resonant frequency. This ensures that the waveform of the eye diagram test results is consistent with the actual waveform, improves the accuracy of eye diagram tests, and reduces eye diagram test errors. Attached Figure Description
[0025] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.
[0026] Figure 1 This is a schematic diagram of the structure of an eye diagram testing device provided in an embodiment of this application;
[0027] Figure 2 This is a schematic diagram of another eye diagram testing device provided in an embodiment of this application.
[0028] Explanation of reference numerals in the attached figures:
[0029] 1-Eye diagram testing equipment;
[0030] 10 - First adapter board;
[0031] 11-First connection interface; 12-Second connection interface;
[0032] 20 - Connecting cable;
[0033] 30 - Second adapter board;
[0034] 31 - PCIe slot; 32 - Second mating interface;
[0035] 2-Test equipment;
[0036] 201 - First docking interface;
[0037] 3-Oscilloscope.
[0038] The accompanying drawings have illustrated specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to specific embodiments. Detailed Implementation
[0039] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.
[0040] As described in the background section, the testing methods in related technologies suffer from significant eye diagram testing errors. This problem arises because the signal transmitted in eye diagram testing is a high-frequency signal. During the welding of the carbon rod to the testing equipment, additional parasitic capacitance and / or inductance are generated due to welding spacing, welding material properties, welding process, and skin effect. These parasitic capacitances and / or inductances then affect the signal impedance and resonant frequency, resulting in a large difference between the waveform of the eye diagram test result and the actual waveform, thus increasing the eye diagram testing error.
[0041] To address the aforementioned technical issues, the eye diagram testing adapter and eye diagram testing device provided in this application use an adapter board and connecting cable as a relay between the testing equipment and the oscilloscope to achieve connection between the testing equipment and the oscilloscope, thereby performing eye diagram testing. This avoids welding the carbon rod to the testing equipment, thus avoiding the introduction of parasitic capacitance and / or parasitic inductance, and further avoiding the influence of parasitic capacitance and / or parasitic inductance on impedance and resonant frequency. This ensures that the waveform of the eye diagram test result is consistent with the actual waveform, improves the accuracy of eye diagram testing, and reduces eye diagram test errors.
[0042] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.
[0043] like Figure 1 and Figure 2 As shown, this application embodiment provides an eye diagram test adapter 1, which can be used to connect a test device 2 and an oscilloscope 3 in an eye diagram test. The eye diagram test adapter 1 includes a first adapter board 10 and a connecting cable 20. The test device 2 can be a domain controller.
[0044] The first adapter board 10 can be a circuit board used to transfer signals from the test equipment 2. The first adapter board 10 has a first connection port 11 and a second connection port 12. The first connection port 11 and the second connection port 12 are for electrical connection and signal connection, respectively. The first connection port 11 is the port for connecting to the test equipment 2, for example, through a connector or a flexible printed circuit board (FPC). This application does not limit the connection in this regard, thereby transmitting the signals of the test equipment 2 to the first adapter board 10. The second connection port 12 is the port for connecting to the oscilloscope 3.
[0045] like Figure 1 As shown, the connecting cable 20 is the connection structure between the first adapter board 10 and the oscilloscope 3, used to realize signal transmission between the first adapter board 10 and the oscilloscope 3. The first end of the connecting cable 20 is used to connect to the oscilloscope 3, and the second end of the connecting cable 20 is connected to the second connection port 12 of the first adapter board 10. The signal of the first adapter board 10 is transmitted to the oscilloscope 3 through the connecting cable 20. Since the first adapter board 10 is connected to the test equipment 2, and the first end of the connecting cable 20 is connected to the oscilloscope 3, and the second end of the connecting cable 20 is connected to the second connection port 12 of the first adapter board 10, the signal of the test equipment can be relayed by the adapter board and transmitted to the oscilloscope through the connecting cable to perform eye diagram testing on the test equipment.
[0046] According to the RLC circuit theory model, the impedance of the signal... and resonant frequency As follows, among which The imaginary unit, Angular frequency, For inductance, For resistance, It is a capacitor.
[0047]
[0048]
[0049] signal impedance and resonant frequency Due to the influence of inductance and capacitance, when carbon rods are soldered to the circuitry of testing equipment in related technologies, additional parasitic capacitance and / or parasitic inductance are generated due to factors such as soldering spacing, soldering material properties, soldering process, and skin effect, thereby increasing capacitance. and / or inductance This, in turn, reduces the impedance. and resonant frequency Large differences reduce the accuracy of eye diagram test waveforms, resulting in large eye diagram test errors.
[0050] The eye diagram testing adapter provided in this application uses a first adapter plate 10 and a connecting cable 20 as a relay part between the test device 2 and the oscilloscope 3 to connect the test device 2 and the oscilloscope 3, thereby performing eye diagram testing. This avoids welding the carbon rod to the test device 2, thus avoiding the introduction of parasitic capacitance and / or parasitic inductance, and further avoiding the influence of parasitic capacitance and / or parasitic inductance on impedance and resonant frequency. This ensures that the waveform of the eye diagram test result is consistent with the actual waveform, improves the accuracy of eye diagram testing, and reduces eye diagram test error.
[0051] In some embodiments, the external port of the oscilloscope 3 used for high-frequency signal testing is an SMA connection port. SMA stands for SubMiniature version A, which is a microwave high-frequency connection interface used to connect to an SMA connector.
[0052] The second connection port 12 is an SSMP connection port, which is used to connect to an SSMP connector.
[0053] The first end of the connecting cable 20 is connected to the SMA port of the oscilloscope 3, and the second end of the connecting cable 20 is connected to the SSMP port. This allows for the switching between the SMA and SSMP ports via the connecting cable 20. Since the SSMP connection operates at a higher frequency than the SMA connection and occupies less space, it improves the signal frequency range, reduces space usage, and further enhances eye diagram testing performance.
[0054] In some embodiments, the connecting cable 20 includes a first cable, an adapter, and a second cable. The first cable has an SMA connector at one end, which connects to an SMA connection port, and the second end of the first cable connects to the first end of the adapter. The second cable has an SSMP connector at one end, which connects to an SSMP connection port. Thus, the first cable connects the adapter to the SMA connection port, and the second cable connects the adapter to the SSMP connection port, thereby enabling the conversion from SMA to SSMP connection. The arrangement of the first cable, adapter, and second cable facilitates connection between the oscilloscope 3 and the first adapter board.
[0055] In some embodiments, both the first and second cables are high-speed cables, which serve as a low-cost, short-distance connection solution to replace optical modules. The high-speed cable is a cable assembly with fixed connectors at both ends. High-speed cables possess excellent attenuation performance, low latency, and interference resistance, enabling high-frequency broadband transmission. They offer advantages such as high performance, energy efficiency, low power consumption, low cost, and ease of installation and maintenance.
[0056] In some embodiments, the first connection port 11 is connected to the first docking port 201 of the test device 2 to realize the docking of the first adapter board 10 and the test device 2, thereby increasing the ease of assembly and disassembly of the first adapter board 10 and the test device 2.
[0057] In some embodiments, a first board-to-board connector is further included, comprising a plug and a socket with conductive contacts. The contacts inside the plug and socket connect the two circuit boards (or panels) together and establish a reliable signal transmission channel. A first end of the first board-to-board connector is connected to a first connection port, and a second end of the first board-to-board connector is connected to a first mating port.
[0058] In some embodiments, reference Figure 2 The eye diagram test adapter also includes a second adapter board 30, which is used to connect the first adapter board 10 and the test device 2. The second adapter board 30 is connected to the test device 2.
[0059] The second adapter board 30 has a PCIe slot 31. The first connection end 11 of the first adapter board 10 includes gold fingers. The gold fingers are connected to the PCIe slot 31, thereby triggering the excitation source on the test equipment 2 through the second adapter board 30, so that the test equipment 2 generates a signal, and then transmits the signal to the oscilloscope 1 for eye diagram testing.
[0060] In some embodiments, a second board-to-board connector is further included, and the second adapter board 30 has a second mating interface 32. The first end of the second board-to-board connector is connected to the first mating port 201 of the test equipment 2, and the second end of the second board-to-board connector is connected to the second mating interface 32. The second board-to-board connector enables mating between the test equipment 2 and the second adapter board 30, improving the reliability of the connection and the ease of assembly and disassembly between the test equipment 2 and the second adapter board 30.
[0061] In some embodiments, the test equipment includes a domain controller, which refers to a controller that integrates multiple traditional electronic control units with similar functions into a single controller with powerful computing power and resources. This controller is called a domain controller, so "domain" here refers to a functional domain. Domain controllers are a product of the shift in automotive electronic and electrical architecture from distributed to centralized, making vehicle control more centralized, efficient, and intelligent. This makes the eye diagram test adapter provided in this application applicable to the vehicle field.
[0062] This application also provides an eye diagram testing device, which includes a testing device 2, an oscilloscope 3, and an eye diagram testing adapter 1 in any of the above embodiments. The connecting cable 20 of the eye diagram testing adapter 1 is connected to the oscilloscope 3, and the first connection port 11 of the first adapter board 10 of the eye diagram testing adapter 1 is connected to the testing device 2.
[0063] The specific structure and connection method of the eye diagram testing adapter 1 can be found in any of the above embodiments. Since the eye diagram testing device provided in this application includes the eye diagram testing adapter in any of the above embodiments, it has at least the beneficial effects of any of the above embodiments, and will not be described in detail here.
[0064] The various embodiments or implementation methods described in this specification are presented in a progressive manner. Each embodiment focuses on the differences from other embodiments, and the same or similar parts between the embodiments can be referred to each other.
[0065] It should be noted that phrases such as "in specific implementations," "in some embodiments," "in this embodiment," and "exemplarily" in the specification indicate that the described embodiments may include specific features, structures, or characteristics, but not every embodiment necessarily includes that specific feature, structure, or characteristic. Furthermore, such phrases do not necessarily refer to the same embodiment. Moreover, when a specific feature, structure, or characteristic is described in connection with an embodiment, implementing such a feature, structure, or characteristic in conjunction with other embodiments, whether explicitly described or not, is within the knowledge scope of those skilled in the art.
[0066] Generally speaking, terms should be understood at least in part by their use in context. For example, at least in part by context, the term "one or more" as used in the text can be used to describe any feature, structure, or characteristic of the singular meaning, or a combination of features, structures, or characteristics of the plural meaning. Similarly, at least in part by context, terms such as "a" or "the" can also be understood to convey either singular or plural usage.
[0067] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature.
[0068] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.
[0069] It should be readily understood that “on,” “above,” and “on top of” in this disclosure should be interpreted in the broadest manner, such that “on” means not only “directly on something” but also “on something” with an intermediate feature or layer therebetween, and that “above” or “on top of” means not only “on something” but also “on something” without an intermediate feature or layer therebetween (i.e., directly on something).
[0070] Furthermore, for ease of explanation, spatially relative terms such as "below," "below," "under," "above," and "above" may be used to describe the relationship of one element or feature relative to other elements or features as shown in the figures. Spatially relative terms are intended to encompass different orientations of the device in use or operation other than those shown in the figures. The device may have other orientations (rotated 90 degrees or in other orientations), and the spatially relative descriptive terms used herein may be interpreted accordingly.
[0071] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.
Claims
1. An eye-diagram test adapter, comprising: The adapter device comprises a first adapter plate and a connecting cable, the first adapter plate has a first connecting port and a second connecting port, the first connecting port is used for connecting a test device; The first end of the connecting cable is used for connecting an oscilloscope, and the second end of the connecting cable is connected to the second connecting port.
2. The eye diagram test patch device of claim 1, wherein, The second connecting port is an SSMP connecting port, the first end of the connecting cable is connected to an SMA connecting port of the oscilloscope, and the second end of the connecting cable is connected to the SSMP connecting port.
3. The eye diagram test patch device of claim 2, wherein, The connecting cable comprises a first cable, an adapter head, and a second cable; The first end of the first cable has an SMA joint connected to the SSMP connecting port, and the second end of the first cable is connected to the first end of the adapter head; The first end of the second cable is connected to the second end of the adapter head, and the second end of the second cable has an SSMP joint connected to the SSMP connecting port.
4. The eye diagram test patch device of claim 3, wherein, The first cable and the second cable are high-speed cables.
5. The eye diagram test patch device of claim 1, wherein, The first connecting port is connected to a first docking port of the test device.
6. The eye diagram test patch device of claim 5, wherein, The adapter device further comprises a first plate-to-plate connector, the first end of the first plate-to-plate connector is connected to the first connecting port, and the second end of the first plate-to-plate connector is connected to the first docking port.
7. The eye diagram test patch device of claim 1, wherein, The adapter device further comprises a second adapter plate, the second adapter plate is connected to the test device; The second adapter plate has a PCIE slot, the first connecting port comprises a gold finger, and the gold finger is connected to the PCIE slot.
8. The eye diagram test patch device of claim 7, wherein, The adapter device further comprises a second plate-to-plate connector, the second adapter plate has a second docking interface; The first end of the second plate-to-plate connector is connected to the first docking port of the test device, and the second end of the second plate-to-plate connector is connected to the second docking interface.
9. The eye pattern test tap of any of claims 1-8, wherein, The test device comprises a domain controller.
10. An eye pattern test apparatus characterized by comprising: The adapter device comprises a test device, an oscilloscope, and an eye diagram test adapter device according to any one of claims 1-9; The connecting cable of the eye diagram test adapter device is connected to the oscilloscope, and the first connecting port of the first adapter plate of the eye diagram test adapter device is connected to the test device.