Storage component reliability verification testing device

Abstract

The utility model is applicable to the technical field of detection equipment, and relates to a storage component reliability verification test device, which comprises a communication module, a storage component test module and a power supply module, the communication module is respectively in communication connection with the storage component test module and the power supply module, and the communication module is also in communication connection with an upper computer; the storage component test module comprises a central management unit, a test information storage unit, a tested component unit and an indicating lamp, and the communication module is connected with the central management unit in a serial port communication mode. The device is simple in structure and convenient to operate, and improves the accuracy of the reliability verification test of the storage component.

Description

Technical Field

[0001] This utility model belongs to the field of testing equipment technology, and in particular relates to a reliability verification and testing device for storage components. Background Technology

[0002] Storage components are widely used in automotive electronic systems, smart meters, medical devices, and other fields. They are used to store critical data such as vehicle configuration information and equipment calibration parameters. In embedded systems, they serve as the storage medium for system configuration and boot code, ensuring stable system operation. With the development of IoT technology, storage components are also increasingly used in smart homes, smart wearable devices, and other fields. As a persistent and reliable memory solution, storage components therefore require higher standards for lifespan and reliability.

[0003] The development of domestically produced components in recent years has led to significant differences in batch consistency among memory components from different manufacturers, and even different models from the same manufacturer, due to variations in materials, electrical performance, packaging processes, tape-out processes, and wire bonding. To evaluate and verify the quality of new materials or to identify risks and verify the lifespan reliability of batch deliveries in advance, memory components are typically placed in high-temperature and high-humidity environmental test chambers for read / write reliability testing. During the test, the number of times the chamber is opened is minimized to reduce the impact on the lifespan reliability test. To facilitate the recording of failures of faulty memory components, lights are usually used for recording. However, during the verification of batch chips, using light warnings without opening the chamber cannot accurately count the serial numbers of the faulty memory components, affecting the test process. Patent application CN113759192A discloses an EMC testing method, comprising: in response to acquiring raw lighting data from an LED driver element, sending the raw lighting data to a rapid photoelectric colorimetric testing system; the LED driver element sending real-time lighting data based on interference signals from an interference source; a sampling probe transmitting the real-time lighting data to the rapid photoelectric colorimetric testing system based on the acquired real-time lighting data; the rapid photoelectric colorimetric testing system determining whether the received real-time lighting data is consistent with the raw lighting data; and if the received real-time lighting data is inconsistent with the raw lighting data, calculating the deviation of the real-time lighting data. This patent application also uses lighting to perform the testing, exhibiting the same drawbacks as existing technologies.

[0004] Therefore, how to provide a convenient and highly accurate reliability verification and testing device for storage components is a problem that urgently needs to be solved by those in this technical field. Utility Model Content

[0005] To address the shortcomings of existing technologies, the purpose of this utility model is to provide a reliability verification and testing device for storage components, thereby solving the problems of inconvenient operation and low accuracy in the reliability verification and testing process of storage components in existing technologies.

[0006] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0007] This utility model provides a reliability verification and testing device for storage components, including:

[0008] The system includes a communication module, a storage component testing module, and a power supply module. The communication module is communicatively connected to the storage component testing module and the power supply module, respectively, and is also communicatively connected to a host computer.

[0009] The storage component testing module includes a central management unit, a test information storage unit, a tested component unit, and indicator lights. The communication module is connected to the central management unit via serial communication.

[0010] Furthermore, the power module adopts a 220VAC isolated switching power supply, which outputs stable DC 5V and 3.3V.

[0011] Furthermore, the communication module adopts serial communication, including wired and wireless methods. The wired method includes one or more of RS485 communication and RJ45 communication, and the wireless method includes one or more of Bluetooth, RF communication, CAT1 communication, and NB-IoT communication.

[0012] Furthermore, the central management unit is controlled by an MCU and includes a 16-pin PA port and a 16-pin PB port. The 16-pin PA port serves as the SCL of the 16 devices under test, and the 16-pin PB port serves as the SDA of the 16 devices under test, so as to uniformly operate the 16 devices under test.

[0013] Furthermore, the test information storage unit uses an EEPROM storage chip.

[0014] Furthermore, the indicator lights are LED lights, including a power status indicator light and a running status indicator light.

[0015] Furthermore, the number of storage devices in the test information storage unit is 16 to 96.

[0016] Compared with the prior art, the storage component reliability verification and testing device provided by this utility model has at least the following advantages:

[0017] Typically, the read / write reliability of storage components is recorded using lights in a high-temperature, high-humidity test chamber to document failures. However, during batch chip verification, relying solely on light warnings without opening the chamber cannot accurately identify the serial numbers of faulty components, impacting the testing process. This invention automates reliability testing, reducing manual intervention and thus lowering labor costs. Furthermore, automated testing minimizes interference from human and environmental factors, improving accuracy and efficiency, further reducing overall testing costs. The automated testing fixture, via a communication unit, can read data in real-time, and with the assistance of host computer software, can automatically analyze and record test results, facilitating subsequent problem tracking and analysis, and improving product quality and reliability. Attached Figure Description

[0018] To more clearly illustrate the solution of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0019] Figure 1 A structural block diagram of a storage component reliability verification and testing device provided in this embodiment of the utility model;

[0020] Figure 2 This is a schematic diagram of an EEPROM test unit used in a reliability verification test device for storage components provided in this embodiment of the present invention. Detailed Implementation

[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the invention. For example, terms such as “length,” “width,” “upper,” “lower,” “left,” “right,” “front,” “rear,” “vertical,” “horizontal,” “top,” “bottom,” “inner,” and “outer” indicate orientations or positions based on the orientations or positions shown in the accompanying drawings and are merely for ease of description and should not be construed as limiting the invention.

[0022] The terms "comprising" and "having," and any variations thereof, in the specification, claims, and accompanying drawings of this utility model are intended to cover non-exclusive inclusion; the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this utility model are used to distinguish different objects, not to describe a particular order. In the specification, claims, and accompanying drawings of this utility model, when an element is referred to as "fixed to," "mounted to," "set on," or "connected to" another element, it can be directly or indirectly located on that other element. For example, when an element is referred to as "connected to" another element, it can be directly or indirectly connected to that other element.

[0023] Furthermore, the reference to "embodiment" herein means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the present invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0024] This utility model provides a reliability verification and testing device for storage components, applied in a laboratory environment. Specifically, it verifies the read / write lifespan of different models or batches of storage components under high temperature, low temperature, high / low temperature shock, and temperature / humidity conditions. The storage component reliability verification and testing device includes:

[0025] The system includes a communication module, a storage component testing module, and a power supply module. The communication module is connected to both the storage component testing module and the power supply module, and it is also connected to a host computer. The storage component testing module includes a central management unit, a test information storage unit, a tested component unit, and indicator lights. The communication module is connected to the central management unit via serial communication.

[0026] This invention has a simple structure and is easy to operate, which improves the accuracy of reliability verification testing of storage components.

[0027] To enable those skilled in the art to better understand the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings.

[0028] This invention provides a reliability verification and testing device for storage components, applicable to laboratory environments. Specifically, it verifies the read / write lifespan of different models or batches of storage components under high temperature, low temperature, high / low temperature shock, and temperature / humidity conditions. Figure 1 and Figure 2 In this embodiment, the storage component reliability verification and testing device includes:

[0029] The system includes a power supply module, a storage component testing module, and a communication module. The storage component testing module comprises a central management unit, indicator lights, a test information storage unit, and a device under test (DUT) unit. The test information storage unit uses an EEPROM storage chip to back up the DUT unit's read / write test comparison information. The communication module connects to the central management unit of the storage component testing module via serial communication and pairs with a host computer. The host computer software synchronizes its clock with the storage component testing module's clock in real time. Then, the chip numbers of the storage component testing module are classified and archived. The status data changes of the tested storage component are read through the communication module for reliability analysis, and finally, a report is output.

[0030] Furthermore, in this embodiment, the power supply module adopts a 220VAC isolated switching power supply, which outputs stable DC 5V and 3.3V.

[0031] Furthermore, in this embodiment, the communication module mainly adopts serial communication, which generally includes wired and wireless methods. Wired methods mainly include RS485 communication, RJ45 communication, etc., while wireless methods mainly include Bluetooth, RF communication, CAT1 communication, NB-IoT communication, etc.

[0032] Furthermore, in this embodiment, the communication module combines hardware chip select and software interrupt to test the storage component test module and interact with the host computer. The central management unit matches the communication units of the tested components in parallel communication, and each tested component communication unit is controlled by IIC.

[0033] Furthermore, in this embodiment, the central management unit is controlled by an MCU, with PA and PB ports, each with 16 pins. The 16 pins of the PA port of the central management unit MCU serve as the SCL of 16 devices under test, and the 16 pins of the PB port serve as the SDA of 16 devices under test, so as to operate on 16 devices under test in a unified manner. The design uses a single port to operate a group of ports at the same time, optimize operation efficiency, and save test time.

[0034] Furthermore, in this embodiment, the indicator lights include a power status indicator light and a running status indicator light, both of which are LED lights.

[0035] In this embodiment, the storage device of the test information storage unit includes a driver framework and a task framework. This ensures running speed and logically avoids operation of the storage device, increasing the storage device life test. A pseudo-random number of n bytes is written to the starting address of each page of the storage device and read out (n is preferably 5), and then compared. The test is completed when all pages of the entire storage device are written and read. The total number of read and write lifetimes required by the device datasheet is tested. The number of storage devices can be determined according to the number of storage devices under test, generally 16-96, preferably an integer multiple of 16.

[0036] The following describes the specific application process of the storage component reliability verification and testing device provided in this embodiment:

[0037] a. The testing device uses a 220VAC isolated switching power supply to output a stable DC 5V to power four storage component test modules. The four storage component test modules are numbered A1# to A4#. Sixty-four EEPROM samples (D4C512AS, M24M01-RMN6TP, SOP-8, 64Kbit, 1.8~5.5V, 30000pcs) of the storage components under test are randomly selected from the batch of delivered materials and installed on the four storage component test modules. The 16-pin PA port of the central management unit MCU of each storage component test module is used as the SCL of 16 pcs of the device under test, and the 16-pin PB port of the central management unit MCU is used as the SDA of 16 pcs of the device under test. They are numbered according to X01 to X16 (X = A1 to A4), that is, the 64 pcs of the EEPROM under test are numbered A101 to A416.

[0038] b. The communication module uses Bluetooth to communicate with the four storage component test modules via chip select and interrupt to exchange information with the host computer on the laboratory computer.

[0039] c. The test program for the EEPROM memory chip runs under the DL / T698.45 object-oriented power information data exchange protocol framework, which includes driver framework and task framework. This ensures running speed and logically avoids operation of the internal card. The EEPROM life test is added. 5 bytes of pseudo-random numbers are written to the starting address of each page and read out, and then compared. The completion of writing and reading all pages of the entire chip is considered one test. A total of 1.1 million tests are conducted.

[0040] d. The non-test area of ​​the first EEPROM (A101 / A201 / A301 / A401) of each storage component test module is responsible for storing the test comparison results. During normal operation, in addition to writing the status to the non-test area of ​​the first EEPROM, the operation indicator AX01 (X=1~4) is lit, that is, LED_P flashes at 1s intervals during normal operation. When an error occurs, the status word of the non-test area of ​​the first EEPROM is modified, and the operation indicator BX01 (X=1~4) is lit simultaneously, that is, LED_S remains constantly lit. When the test is completed without errors, both indicator LED_P and LED_S flash at 1s intervals. The status indications are summarized in Table 1 below:

[0041] Table 1

[0042]

[0043] e. During normal operation, each storage component test module outputs the number of runs and address information via serial port every 100 tests, and stores this information at the starting address of the last page of the EEPROM (e.g., 0xFF80 for a 64KB EEPROM). When an error occurs, the module outputs in real time which EEPROM is faulty, at which address the error occurred, and the current number of tests, and stores this information at the starting address of the last page of the EEPROM (e.g., 0xFF80 for a 64KB EEPROM). This data is synchronously pushed to the host computer in the laboratory via the communication unit in real time. The host computer analyzes the data and generates reliability logs and reports.

[0044] The storage component reliability verification and testing device described in the above embodiments, compared with the prior art, typically relies on lighting to record the failure status of faulty storage components when placing them in a high-temperature and high-humidity environmental test chamber. However, in the process of verifying batch chips, using light warnings without opening the chamber cannot accurately count the serial numbers of the faulty storage components, affecting the testing process. This invention automates reliability testing, reducing the need for manual operation and thus lowering labor costs. Furthermore, automated testing reduces interference from human and environmental factors, improving testing accuracy and efficiency, further reducing overall testing costs. Simultaneously, the automated testing fixture can read data in real time via a communication unit, and with the help of host computer software, it can automatically analyze and record test results, facilitating subsequent problem tracking and analysis, and improving product quality and reliability.

[0045] Obviously, the embodiments described above are merely preferred embodiments of this utility model, and not all embodiments. The accompanying drawings show preferred embodiments of this utility model, but do not limit the patent scope of this utility model. This utility model can be implemented in many different forms; rather, the purpose of providing these embodiments is to provide a more thorough and comprehensive understanding of the disclosure of this utility model. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing specific embodiments, or make equivalent substitutions for some of the technical features. Any equivalent structures made using the content of this utility model specification and drawings, directly or indirectly applied to other related technical fields, are similarly within the patent protection scope of this utility model.

Claims

1. A storage element reliability verification test apparatus, characterized by comprising: The application relates to a storage component testing device, which comprises a communication module, a storage component testing module and a power module, the communication module is in communication connection with the storage component testing module and the power module respectively, and the communication module is further in communication connection with an upper computer; the storage component testing module comprises a central management unit, a testing information storage unit, a measured component unit and an indicator lamp, and the communication module is connected with the central management unit in a serial communication mode. The power module adopts a 220VAC switching power supply with isolation, and outputs stable direct current 5V and 3.3V. The communication module adopts serial communication, including wired mode and wireless mode, the wired mode includes one or more of RS485 communication and RJ45 communication, and the wireless mode includes one or more of Bluetooth, RF communication, CAT1 communication and NB-IOT communication.

2. The reliability verification test apparatus for a memory element according to claim 1, wherein The central management unit is controlled by an MCU, includes a 16Pin PA port and a 16Pin PB port, 16 pins of the PA port are used as SCL of 16 pieces of the measured component unit, 16 pins of the PB port are used as SDA of 16 pieces of the measured component unit, and 16 pieces of the measured component unit are uniformly operated.

3. The reliability verification test apparatus for a memory element according to claim 1, wherein The testing information storage unit adopts an EEPROM storage chip.

4. The reliability verification test apparatus for a memory element according to claim 1, wherein The indicator lamp is an LED lamp, including a monitoring power state indicator lamp and a monitoring running state indicator lamp.

5. The reliability verification test apparatus for a memory element according to claim 1, wherein The number of storage devices of the testing information storage unit is 16 to 96.

6. The reliability verification test apparatus for a memory element according to claim 1, wherein ​ 7. The reliability verification test apparatus for a memory element according to claim 1, wherein ​

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