Rapid test card seat mechanism

Abstract

The utility model discloses a rapid test clamping seat mechanism, which relates to the field of lamp bead testing and comprises a base, a clamping seat is mounted at the top of the base, a sliding rail is arranged in the clamping seat, a cover body is mounted on one side of the clamping seat, and a positioning screw is rotatably mounted on the inner wall of the cover body. A test assembly is mounted at the top of the base; the test assembly comprises a fixed plate which is fixedly installed on the top of the base; the first reset spring is fixedly connected with the inner wall of the base and is in sliding connection with the inner wall of the fixing plate; the pressing plate is fixedly mounted at the top of the first reset spring; the two symmetrically-arranged sliding blocks are installed at the top of the fixing plate in a sliding mode and connected with the pressing plate in a sliding mode; according to the rapid test card seat mechanism, the abrasion of the probe is smaller; the fixation is firmer; the clamping seat is longer in service life; and the application scenes are richer and more diversified.

Description

TECHNICAL FIELD

[0001] The utility model relates to lamp pearl test technology, concretely relates to a quick test card seat mechanism. BACKGROUND

[0002] LED lamp pearl fixed test is the important link of evaluating the performance and reliability of LED lamp pearl under the fixed state. The following is the detailed explanation of LED lamp pearl fixed test:

[0003] I. Test purpose

[0004] The main purpose of LED lamp pearl fixed test is to verify whether LED lamp pearl can work normally after fixed installation, and its stability and durability under specific conditions. Through the test, potential faults and problems can be found in time, so as to ensure the quality and reliability of LED products.

[0005] II. Test method

[0006] Solder joint strength test:

[0007] Equipment: multifunctional solder joint strength tester, which can be used for lead solder joint strength test after microelectronic lead bonding, solder joint and substrate surface adhesion test and failure analysis.

[0008] Steps:

[0009] Select the LED lamp pearl sample after welding and cooling, ensure that the solder joint has solidified.

[0010] Confirm that the push-pull force testing machine and all its accessories are complete and function normally, including the key components such as push knife and clamp have completed calibration.

[0011] Install the LED lamp pearl to be tested correctly on the push-pull force testing machine, connect the power supply, start the testing machine, and wait for the system self-check and module initialization to complete.

[0012] Select the appropriate push knife according to the test requirements, and fix it in the specified position of the push-pull force testing machine, ensure firm locking.

[0013] Place the LED lamp pearl accurately in the test clamp, and ensure its position is correct, then install the clamp on the workbench of the testing machine, and fasten it with fixing screws, simulate the fixed state in actual use.

[0014] Input necessary test parameters in the software interface of the push-pull force testing machine, including test method, sensor selection, test speed (usually select 100 μm / s), target force value, shear height and test times, etc.

[0015] After confirming that the relative positions of the LED lamp bead and the push knife are correct under the assistance of a microscope, a test procedure is started, and the actions during the test process are closely monitored to ensure that everything is carried out according to the set parameters.

[0016] After the test is completed, the damage of the LED lamp bead is observed, and failure analysis is carried out.

[0017] The existing rapid test card seat mechanism is of a probe type, that is, the four peripheries of the lamp bead are fixed through movable limiting blocks and probes, and the lamp bead is fixed by relying on the force applied by the probes and the probes. The utility model discloses a rapid test card seat mechanism

[0018] The utility model discloses a rapid test card seat mechanism, which solves the defects of the prior art that the card seat is of a probe type, that is, the four peripheries of the lamp bead are fixed through movable limiting blocks and probes, and the lamp bead is fixed by relying on the force applied by the probes and the probes.

[0019] In order to achieve the above-mentioned purpose, the utility model provides the following technical scheme: a rapid test card seat mechanism, comprising a base, a card seat is installed at the top of the base, a sliding rail is formed in the inside of the card seat, a cover body is installed on one side of the card seat, and a positioning screw is rotatably installed on the inner wall of the cover body.

[0020] Further, the test assembly comprises:

[0021] A fixed plate is fixedly installed at the top of the base;

[0022] A reset spring one is fixedly connected with the inner wall of the base, and is slidably connected with the inner wall of the fixed plate;

[0023] A pressing plate is fixedly installed at the top of the reset spring one;

[0024] Two symmetrically arranged sliding blocks are slidably installed at the top of the fixed plate, and are slidably connected with the pressing plate.

[0025] Further, the test assembly further comprises:

[0026] Two symmetrically arranged baffle plates are fixedly installed at the top of the fixed plate;

[0027] Two groups of symmetrically arranged reset springs two are fixedly connected with one side of the sliding block at one end, and are fixedly connected with one side of the baffle plate at the other end;

[0028] Two groups of symmetrically arranged probes are fixedly installed on one side of the sliding block;

[0029] Two groups of symmetrically arranged connecting lines are fixedly installed on one side of the probe and penetrate the sliding block.

[0030] Further, the cover is fixed with the card holder through a positioning screw.

[0031] Further, the test assembly is located on the side of the cover away from the card holder.

[0032] Compared with the prior art, the quick test card holder mechanism can make the probe wear less, be fixed more firmly, have a longer service life and be applied in more various scenes. BRIEF DESCRIPTION OF DRAWINGS

[0033] In order to make the technical personnel of the art better understand the technical scheme of the present application, the drawings needed in the embodiments or the prior art will be briefly introduced below, and obviously, the drawings in the following description are only some embodiments described in the present application, and other drawings can also be obtained by those skilled in the art according to these drawings.

[0034] Figure 1 The overall structure of the embodiment of the present application is provided.

[0035] Figure 2 The first part of the overall structure of the embodiment of the present application is provided.

[0036] Figure 3 The second part of the overall structure of the embodiment of the present application is provided.

[0037] Figure 4 The test assembly structure of the embodiment of the present application is provided.

[0038] Figure 5 The test assembly structure of the embodiment of the present application is provided.

[0039] Explanation of reference signs:

[0040] 1, base; 2, card holder; 3, sliding rail; 4, cover; 5, positioning screw; 6, test assembly; 61, baffle; 62, fixed plate; 63, sliding block; 64, pressing plate; 65, reset spring I; 66, probe; 67, connecting line; 68, reset spring II. DETAILED DESCRIPTION

[0041] In order to make the technical personnel of the art better understand the technical scheme of the present application, the drawings needed in the embodiments or the prior art will be briefly introduced below, and obviously, the drawings in the following description are only some embodiments described in the present application, and other drawings can also be obtained by those skilled in the art according to these drawings.

[0042] Embodiment one:

[0043] Please refer to Figure 1 - Figure 5 A quick test card seat mechanism, including the base 1, the top of the base 1 is installed with the card seat 2, the inside of the card seat 2 is opened with the slide rail 3, one side of the card seat 2 is installed with the cover body 4, the inner wall of the cover body 4 is rotatably installed with the positioning screw 5, the top of the base 1 is installed with the test assembly 6.

[0044] Specifically, the cover body 4 is fixed with the card seat 2 through the positioning screw 5, the test assembly 6 is located on the side of the cover body 4 away from the card seat 2, the slide rail 3 provides support for the bottom of the lamp bead, and the cover body 4 is used for fixing the Z direction of the lamp bead, protecting the test assembly 6 and limiting the test assembly 6, and in use, the cover body 4 is fixed on the card seat 2 through the positioning screw 5, and the lamp bead is placed in the slide rail 3, so that it naturally falls.

[0045] The test assembly 6 comprises:

[0046] The fixed plate 62 is fixedly installed on the top of the base 1;

[0047] The reset spring one 65 is fixedly connected with the inner wall of the base 1, and is slidably connected with the inner wall of the fixed plate 62;

[0048] The pressing plate 64 is fixedly installed on the top of the reset spring one 65;

[0049] The two symmetrically arranged sliding blocks 63 are slidably installed on the top of the fixed plate 62, and are slidably connected with the pressing plate 64;

[0050] The two symmetrically arranged baffle plates 61 are fixedly installed on the top of the fixed plate 62;

[0051] The two groups of symmetrically arranged reset springs two 68 are fixedly connected with one side of the sliding block 63 at one end, and are fixedly connected with one side of the baffle plate 61 at the other end;

[0052] The two groups of symmetrically arranged probes 66 are fixedly installed on one side of the sliding block 63;

[0053] The two groups of symmetrically arranged connecting lines 67 are fixedly installed on one side of the probe 66, and penetrate through the sliding block 63.

[0054] The specific implementation is that the probe 66 is fixed on the sliding block 63, the reset spring 65 is arranged to restore the original state after being pressed; when the pressing plate 64 slides downward, the inclined surface of the sliding block 63 is pressed by the pressing plate 64, the reset spring 68 is deformed, and the probe 66 slides to both sides, so that the lamp bead is not scratched by the probe 66; after being pressed to a certain extent, the lower part of the pressing plate 64 contacts the plane on the sliding block 63, the limit is triggered, and the service life of the internal spring is guaranteed; when the pressing plate 64 is not pressed, the reset spring 65 restores the original position, and the probe 66 contacts the lamp bead pin.

[0055] The above only describes some exemplary embodiments of the present application by way of illustration, without doubt, for ordinary skilled in the art, without departing from the spirit and scope of the present application, the described embodiments can be modified in various ways. Therefore, the above drawings and description are illustrative in nature and should not be construed as limiting the scope of protection of the present application.

Claims

1. A rapid test cartridge mechanism comprising a base (1), characterized in that, The top of the base (1) is provided with a clamping seat (2), the inner part of the clamping seat (2) is provided with a sliding rail (3), one side of the clamping seat (2) is provided with a cover body (4), the inner wall of the cover body (4) is rotatably provided with a positioning screw (5); the top of the base (1) is provided with a test assembly (6).

2. The test card seating mechanism of claim 1, wherein, The test assembly (6) comprises: A fixed plate (62) is fixedly installed on the top of the base (1); A reset spring (65) is fixedly connected with the inner wall of the base (1), and the inner wall of the fixed plate (62) is slidably connected with the reset spring (65); A pressing plate (64) is fixedly installed on the top of the reset spring (65); Two symmetrically arranged sliding blocks (63) are slidably installed on the top of the fixed plate (62), and the pressing plate (64) is slidably connected with the sliding blocks (63).

3. The test card seating mechanism of claim 2, wherein, The test assembly (6) further comprises: Two symmetrically arranged baffle plates (61) are fixedly installed on the top of the fixed plate (62); Two symmetrically arranged reset springs (68) are fixedly connected with one side of the sliding blocks (63), and the other end is fixedly connected with one side of the baffle plates (61); Two symmetrically arranged probes (66) are fixedly installed on one side of the sliding blocks (63); Two symmetrically arranged connecting lines (67) are fixedly installed on one side of the probes (66), and the sliding blocks (63) are penetrated.

4. The rapid test cartridge mechanism of claim 1, wherein, The cover body (4) is fixed with the clamping seat (2) through the positioning screw (5).

5. The test card seating mechanism of claim 1, wherein, The test assembly (6) is located on the side of the cover body (4) away from the clamping seat (2).

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