Split type chip test seat
By designing a split-type chip test socket, which utilizes a combination structure of pin socket, chip placement socket and top cover, the problem of pin damage during use is solved, thus achieving pin protection and improving testing efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-28
- Publication Date
- 2026-04-07
AI Technical Summary
Existing chip test sockets are prone to pin damage during use, resulting in a reduced lifespan.
A split-type chip test socket was designed. Through the combination structure of pin socket, chip placement socket, reset spring and top cover, it is ensured that the chip does not contact the pin after placement, and only contacts the pin after the top cover is pressed tightly, thus avoiding scratches.
It effectively protects the chip pins, extends the lifespan of the chip test socket, and improves testing efficiency and reliability through guiding and heat dissipation structures.
Smart Images
Figure CN224095885U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip test socket technology, specifically a split-type chip test socket. Background Technology
[0002] A chip test socket, also known as a test fixture, test base, or IC socket, is a tool specifically designed to connect test equipment and the chip under test (DUT). It aims to ensure a reliable connection between the chip and the test instrument during testing, enabling accurate and effective electrical performance measurements. Specifically, the design of a chip test socket is typically customized based on the chip's package type (e.g., BGA, QFN) and test requirements to meet the needs of different chips and testing scenarios. As a static connector between the integrated circuit and the printed circuit board, it facilitates chip replacement and testing, avoiding damage that may result from frequent soldering and chip removal, thus improving testing efficiency. Existing chip test sockets often involve flipping a cover over the chip. During this flipping process, one end of the cover's connection contacts the chip first. While a gap is provided in the slot to allow chip removal, this can cause the chip to push forward, potentially wearing down or bending the chip or the pins on the test socket, reducing its lifespan. Therefore, a separate chip test socket is designed to address these issues. Utility Model Content
[0003] (a) Technical problems to be solved
[0004] To address the shortcomings of existing technologies, this utility model provides a split-type chip test socket, which solves the problem that existing chip test sockets are prone to pin damage during use, resulting in a reduced lifespan.
[0005] (II) Technical Solution
[0006] To achieve the above objectives, this utility model provides the following technical solution:
[0007] This utility model provides a split-type chip test socket, comprising: a hollow base, a pin socket connected to the lower end of the base by bolts, the lower end of the pin socket extending to the lower end of the base, a limiting seat connected around the outer perimeter of the opening on the upper surface of the base, a chip placement socket inserted and connected to the upper end of the opening of the base, the chip placement socket and the pin socket being connected by a return spring, the upper end of the pins inside the pin socket extending into the interior of the chip placement socket, a top cover with a slotted lower end on the upper end of the base, a pressure block inserted and connected to the lower end of the top cover, a clamping knob on the upper surface of the top cover, the lower end of the clamping knob being connected to the interior of the upper end of the top cover by a bearing, the lower end of the clamping knob being connected to the upper end of the pressure block by a thread, buckles rotatably connected to the left and right sides of the top cover, and slots on the lower ends of the left and right sides of the base.
[0008] Preferably, four guide posts are connected to the front and rear sides of the lower surface of the upper cover, and a guide groove is provided on the base relative to the guide posts.
[0009] Preferably, a guide sleeve is fixedly connected to the upper surface of the pin holder and located outside the reset spring, and the position where the lower surface of the chip holder connects to the upper end of the reset spring extends into the interior of the guide sleeve.
[0010] Preferably, a limiting groove is formed at the lower inner end of the base, and the lower outer side of the chip placement seat extends into the interior of the limiting groove.
[0011] Preferably, a retrieval groove is provided at the middle position of the outer side of the limiting seat, and a boss is connected to the groove on the lower surface of the upper cover at a position opposite to the retrieval groove.
[0012] Preferably, both the outer perimeter of the upper end of the limiting seat and the outer perimeter of the groove on the lower surface of the upper cover are chamfered.
[0013] Preferably, ventilation slots are provided on the front and rear sides of the top cover, and heat dissipation plates are connected in an array inside the ventilation slots and at the top of the pressure block.
[0014] (III) Beneficial Effects
[0015] This utility model provides a split-type chip test socket, which has at least the following advantages compared with the prior art:
[0016] This split-type chip test socket ensures that the bottom of the chip does not contact the pins when the chip is placed on the chip placement holder. After placing the top cover on top, turning the clamping knob will press down the pressure block and the reset spring, allowing the chip to contact the pins and ensuring that the chip makes vertical contact with the pins. Attached Figure Description
[0017] Figure 1 This is a schematic diagram of the structure of this utility model;
[0018] Figure 2 This is an exploded view of the present invention;
[0019] Figure 3 This utility model Figure 2 Bottom view;
[0020] Figure 4 This utility model Figure 1 A sectional view;
[0021] Figure 5 This utility model Figure 2 A sectional view.
[0022] In the diagram: 1. Base; 2. Pin socket; 3. Limiting seat; 4. Chip placement seat; 5. Reset spring; 6. Top cover; 7. Pressure block; 8. Pressing knob; 9. Buckle; 10. Bayonet; 21. Guide post; 22. Guide groove; 23. Guide sleeve; 24. Limiting groove; 25. Pick-up groove; 26. Boss; 27. Ventilation groove; 28. Heat sink. Detailed Implementation
[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0024] Please see Figure 1-5 This utility model provides a technical solution: a split-type chip test socket, comprising: a hollow base 1, a pin seat 2 connected to the lower end of the base 1 by bolts, the lower end of the pin seat 2 extending to the lower end of the base 1, a limiting seat 3 connected around the outer perimeter of the opening on the upper surface of the base 1, a chip placement seat 4 inserted and connected to the upper end of the opening of the base 1, the chip placement seat 4 and the pin seat 2 being connected by a return spring 5, the upper ends of the pins inside the pin seat 2 extending into the interior of the chip placement seat 4, a top cover 6 with a slotted lower end on the upper end of the base 1, a pressure block 7 inserted and connected to the lower end of the top cover 6, a clamping knob 8 on the upper surface of the top cover 6, the lower end of the clamping knob 8 being connected to the interior of the upper end of the top cover 6 by a bearing, the lower end of the clamping knob 8 being connected to the upper end of the interior of the pressure block 7 by a thread, buckles 9 being rotatably connected to the left and right sides of the top cover 6, and slots 10 being opened at the lower ends of the left and right sides of the base 1.
[0025] In use, the base 1 is connected to the PCB board with bolts, and the contact point of the pin holder 2 is in contact with the contact point on the upper surface of the PCB board. Then, the chip is placed between the upper surface of the chip placement seat 4 and the limiting seat 3. At this time, because the reset spring 5 lifts the chip placement seat 4, the chip does not contact the pin at the upper end of the pin holder 2. Then, the upper cover 6 is aligned with the base 1, and the groove at the lower end of the upper cover 6 is aligned with the limiting seat 3 on the upper surface of the base 1. Then, the upper cover 6 is lowered. The latches 9 on the left and right sides of the upper cover 6 are connected to the upper cover by springs, so that the latches 9 retract inward. When pushed down, the latches 9 will be locked on the latch 10. Then, the clamping knob 8 is rotated. The lower end of the clamping knob 8 is connected to the upper end of the inner part of the pressure block 7 by threads, so that the pressure block 7 is pushed down, so that the chip placement seat 4 moves downward against the force of the reset spring 5, and the contact point on the lower surface of the chip contacts the pin.
[0026] like Figure 1-5 As shown in the figure, this utility model embodiment provides an implementation method. Based on the above implementation method, four guide posts 21 are connected to the front and rear sides of the lower surface of the upper cover 6, and a guide groove 22 is opened in the base 1 at the position opposite to the guide posts 21.
[0027] Analysis of the above structure shows that when connecting, inserting the guide post 21 into the guide groove 22 can further help position the upper cover 6 and the base 1.
[0028] like Figure 1-5 As shown, this utility model embodiment provides an implementation method. Based on the above implementation method, a guide sleeve 23 is fixedly connected to the upper surface of the pin seat 2 and located outside the reset spring 5. The position where the lower surface of the chip placement seat 4 is connected to the upper end of the reset spring 5 extends into the interior of the guide sleeve 23.
[0029] Analysis of the above structure shows that when the pressure block 7 is pushed down, the lower surface of the chip placement base 4 will press against the upper surface of the guide sleeve 23 when the pin just reaches the upper surface of the chip placement base 4, preventing the chip placement base 4 from being pushed down. At the same time, the guide sleeve 23 can play a guiding role, making it easier for the chip placement base 4 to be pushed down.
[0030] like Figure 1-5 As shown, this utility model embodiment provides an implementation method. Based on the above implementation method, a limiting groove 24 is formed at the lower inner end of the base 1, and the lower outer side of the chip placement seat 4 extends to the inside of the limiting groove 24.
[0031] Analysis of the above structure shows that when the chip placement seat 4 is pushed upward by the force of the reset spring 5, the outer side of the chip placement seat 4 will be blocked by the limiting groove 24 to prevent the chip placement seat 4 from exceeding the limit.
[0032] like Figure 1-5As shown, this utility model embodiment provides an implementation method. Based on the above implementation method, a retrieval groove 25 is provided at the middle position of the outer side of the limiting seat 3, and a boss 26 is connected to the groove on the lower surface of the upper cover 6 at a position opposite to the retrieval groove 25.
[0033] Analysis of the above structure shows that when the top cover is pressed down, the boss 26 can play a positioning role. When it is necessary to remove the chip, you can put your hand into the retrieval slot 25 and take the chip out from one side.
[0034] like Figure 1-5 As shown, this utility model embodiment provides an implementation method. Based on the above implementation method, the outer perimeter of the upper end of the limiting seat 3 and the outer perimeter of the groove on the lower surface of the upper cover 6 are both chamfered.
[0035] Analysis of the above structure shows that the chamfers on the outer perimeter of the upper end of the limiting seat 3 and the outer perimeter of the groove on the lower surface of the upper cover 6 can serve as guides, making it easier for the chip to be placed in the chip placement seat 4, and also facilitating the docking of the upper cover 6 with the base 1.
[0036] like Figure 1-5 As shown, this utility model embodiment provides an implementation method. Based on the above implementation method, ventilation slots 27 are provided on the front and rear sides of the upper cover 6. The interior of the ventilation slots 27 and the upper end of the pressure block 7 are connected to heat dissipation plates 28 in an array.
[0037] Analysis of the above structure shows that during the test, the heat emitted by the chip is absorbed by the pressure block 7 and then conducted to the heat sink 28. The air is blown into the top cover 6 through the ventilation slot 27 to help cool the chip.
[0038] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.
[0039] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A split-type chip test socket, characterized in that, include: A hollow base (1) has a pin socket (2) bolted to its lower end. The lower end of the pin socket (2) extends to the lower end of the base (1). A limiting seat (3) is connected around the outer perimeter of the opening on the upper surface of the base (1). A chip placement seat (4) is inserted and connected to the upper end of the opening inside the base (1). The chip placement seat (4) and the pin socket (2) are connected by a reset spring (5). The upper ends of the pins inside the pin socket (2) extend into the interior of the chip placement seat (4). The upper end of the base (1) is provided with a cover (6) with an internal groove at the lower end. A pressure block (7) is inserted and connected to the lower end of the cover (6). A pressing knob (8) is provided on the upper surface of the cover (6). The lower end of the pressing knob (8) is connected to the upper end of the cover (6) through a bearing. The lower end of the pressing knob (8) is connected to the upper end of the pressure block (7) through a thread. Buckles (9) are rotatably connected to the left and right sides of the cover (6). A latch (10) is opened at the lower end of the left and right sides of the base (1).
2. The split-type chip test socket according to claim 1, characterized in that: The lower surface of the upper cover (6) is connected to four guide posts (21) on the front and rear sides, and the base (1) is provided with guide grooves (22) at the opposite position to the guide posts (21).
3. A split-type chip test socket according to claim 1, characterized in that: A guide sleeve (23) is fixedly connected to the upper surface of the pin holder (2) and outside the reset spring (5). The position where the lower surface of the chip placement seat (4) is connected to the upper end of the reset spring (5) extends into the interior of the guide sleeve (23).
4. A split-type chip test socket according to claim 1, characterized in that: The lower end of the base (1) has a limiting groove (24), and the outer side of the lower end of the chip placement seat (4) extends into the interior of the limiting groove (24).
5. A split-type chip test socket according to claim 1, characterized in that: The outer middle position of the limiting seat (3) is provided with a take-up groove (25), and the inside of the groove on the lower surface of the upper cover (6) is connected to the take-up groove (25) at a position opposite to it.
6. A split-type chip test socket according to claim 1, characterized in that: The upper outer circumference of the limiting seat (3) and the outer circumference of the groove on the lower surface of the cover (6) are both chamfered.
7. A split-type chip test socket according to claim 1, characterized in that: Ventilation slots (27) are provided on the front and rear sides of the upper cover (6), and heat dissipation plates (28) are connected in an array inside the ventilation slots (27) and the upper end of the pressure block (7).