Marking and detecting device for quartz crystal resonator

Abstract

The utility model relates to a marking and detecting device for quartz crystal resonators, which comprises a second rotating disc, a plurality of temporary placing tables for bearing the quartz crystal resonators are uniformly distributed on the second rotating disc along the circumferential direction of the second rotating disc, and the middle part of each temporary placing table is provided with an air suction port; the second rotating disc can rotate around the axis of the second rotating disc and drive the temporary placing tables to rotate synchronously, and the temporary placing tables rotate to pass through a marking station and a first detection station which are sequentially arranged in the rotating direction of the second rotating disc. The marking mechanism is used for marking the quartz crystal resonator positioned on the marking station; and the detection mechanism I is used for carrying out front visual detection on the quartz crystal resonator positioned on the detection station I. By means of the arrangement, production efficiency is improved, management is convenient, and the requirement for large-scale production is met.

Description

Technical Field

[0001] This utility model relates to the field of quartz crystal resonator processing technology, and in particular to a marking and testing device for quartz crystal resonators. Background Technology

[0002] A quartz crystal resonator is an electronic component that utilizes the inverse piezoelectric effect of quartz crystal material to generate high-precision oscillation frequencies. Quartz crystal resonators are widely used in electronic devices such as oscillators, timers, clock circuits, and wireless communication systems to ensure accurate timing and frequency stability.

[0003] During the production and processing of quartz crystal resonators, marking is required to indicate their parameters, model, batch number, and other information. Traditionally, marking quartz crystal resonators involves manual, repeated handling of the resonators under the laser head of the marking mechanism. This process is labor-intensive, inefficient, and prone to safety accidents, making it impossible to establish a continuous and efficient assembly line operation and failing to meet the demands of large-volume marking production. Utility Model Content

[0004] To address the aforementioned shortcomings, this invention proposes a marking and testing device for quartz crystal resonators.

[0005] The technical solution adopted in this utility model is a marking and testing device for a quartz crystal resonator, comprising:

[0006] The second turntable has multiple temporary platforms for supporting quartz crystal resonators evenly distributed along its circumference. Each temporary platform has an air intake in the middle. The second turntable can rotate around its axis and drive the multiple temporary platforms to rotate synchronously. The temporary platforms rotate through a marking station and a detection station arranged sequentially along the rotation direction of the second turntable.

[0007] A marking mechanism that marks the quartz crystal resonator located at the marking station;

[0008] Inspection unit one performs frontal visual inspection on the quartz crystal resonator located at inspection station one.

[0009] Furthermore, the marking mechanism includes a marking adjustment mounting base with adjustable height and angle, a laser mounted on the upper end of the marking adjustment mounting base, and a laser head mounted on one end of the laser. The laser is used to generate a laser beam and emit it through the laser head to a quartz crystal resonator on the marking station.

[0010] Furthermore, the detection mechanism includes a mounting and adjustment bracket and a red ring light source and a black and white camera mounted on the mounting and adjustment bracket. The black and white camera is located directly above the red ring light source. The red ring light source emits light downwards directly at the quartz crystal resonator at the detection station, and the black and white camera is used to capture the image of the quartz crystal resonator.

[0011] Furthermore, the second turntable is also provided with a second positioning station along its rotation direction. The second positioning station is located upstream of the marking station, or the second positioning station and the marking station are the same station. The marking and testing device also includes a second positioning mechanism, which positions the quartz crystal resonator located at the second positioning station.

[0012] Furthermore, the second positioning mechanism includes a positioning mounting base, a second positioning motor and a positioning slide mounted on the positioning mounting base, and a positioning piece fixedly connected to one end of the positioning slide. The second positioning motor drives the positioning slide to reciprocate and moves the positioning piece to reciprocate.

[0013] Furthermore, along the rotation direction of the second turntable, an exchange station is also provided between the first detection station and the second positioning station; the temporary placement stage replaces the quartz crystal resonator it carries at the exchange station.

[0014] Furthermore, it also includes a waste disposal mechanism. Along the rotation direction of the second turntable, a waste disposal station is also provided between the detection station and the exchange station. Quartz crystal resonators that fail the front visual inspection are taken away and discarded by the waste disposal mechanism at the waste disposal station.

[0015] Furthermore, the first waste disposal mechanism includes a second air nozzle and a collection mechanism. The blowing force of the airflow ejected from the second air nozzle is greater than the suction force of the air intake. Quartz crystal resonators that fail the frontal visual inspection are blown into the collection mechanism by the second air nozzle at the first waste disposal station.

[0016] Furthermore, the collection mechanism includes a collection mechanism mounting base, a defective material cup and a feed tube disposed on the collection mechanism mounting base, wherein the defective quartz crystal resonator falls into the defective material cup through the feed tube.

[0017] Furthermore, along the rotation direction of the second turntable, a material identification station is provided between the exchange station and the positioning station, and / or a material identification station is provided between the marking station and the detection station, and / or a material identification station is provided between the waste station and the exchange station.

[0018] The marking and testing device also includes an optical fiber testing mechanism, which is used to detect whether the quartz crystal resonator is present at the material identification station one, material identification station two, or material identification station three.

[0019] Compared with the prior art, the present invention has the following beneficial effects:

[0020] The marking and testing device for quartz crystal resonators in this invention enables rapid switching between marking and testing processes, eliminating the need for manual handling and significantly reducing the dwell time of individual products between processes. The synchronous rotation of multiple temporary platforms achieves continuous assembly line operation, processing more products per unit time and significantly improving the overall production line efficiency to meet the demands of large-scale production. The automated turntable transfer, marking, and testing process greatly reduces manual operation, lowering reliance on manpower. This not only saves labor costs but also avoids human error and safety accidents caused by human fatigue or negligence, further improving the stability of the production process and the consistency of product quality. Attached Figure Description

[0021] The present invention will now be described in detail with reference to the embodiments and accompanying drawings, wherein:

[0022] Figure 1 This is a schematic diagram of the overall structure of equipment for testing, marking, inspecting, and packaging quartz crystal resonators;

[0023] Figure 2 This is a top view of equipment for testing, marking, inspecting, and packaging quartz crystal resonators;

[0024] Figure 3 This is a partial structural diagram of the marking and testing device;

[0025] Figure 4 This is a schematic diagram of the second turntable;

[0026] Figure 5 This is a schematic diagram of positioning mechanism two;

[0027] Figure 6 This is a schematic diagram of the marking mechanism;

[0028] Figure 7 This is a schematic diagram of testing agency one;

[0029] Figure 8 This is a schematic diagram of the collection organization.

[0030] 200. Marking and testing equipment;

[0031] 212. Second turntable; 213. Temporary display table;

[0032] 220. Collection mechanism; 221. Collection mechanism mounting base; 222. Defective material cup; 223. Material conveying pipe;

[0033] 250. Positioning mechanism two; 251. Positioning motor two; 252. Positioning slide; 253. Positioning plate; 254. Positioning mounting base;

[0034] 270. Marking mechanism; 271. Marking adjustment mounting base; 272. Laser head; 273. Laser; 274. Laser connection cable to control host; 275. Control host;

[0035] 280. Testing agency one; 281. Installation and adjustment bracket; 282. Red light ring light source; 283. Black and white camera; 284. Telecentric lens;

[0036] 510. Change workstations;

[0037] 610. Material Identification Station 1; 620. Positioning Station 2; 630. Marking Station; 640. Material Identification Station 2; 650. Inspection Station 1; 660. Disposal Station 1; 670. Material Identification Station 3;

[0038] 700. Quartz crystal resonator. Detailed Implementation

[0039] To make the objectives, technical solutions, and advantages of this utility model clearer, the embodiments of this utility model will be further described in detail below with reference to the accompanying drawings. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar components or components having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this utility model, and should not be construed as limiting this utility model.

[0040] In one embodiment, a marking and testing device 200 for a quartz crystal resonator, such as Figure 1-2 As shown, it can be used in equipment for testing, marking, inspecting, and packaging quartz crystal resonators. The marking and inspection device 200 includes a second turntable 212, a marking mechanism 270, and an inspection mechanism 280, as shown. Figure 4 As shown, multiple temporary platforms 213 are evenly distributed along the circumference of the second turntable 212. These platforms 213 support the quartz crystal resonator 700. The second turntable 212 can rotate around its axis, thereby causing the multiple temporary platforms 213 to rotate synchronously. Each platform 213 can then reach different workstations to perform different processes. The second turntable 212 can be an indexing plate or other rotatable disk.

[0041] like Figure 3As shown, the second turntable 212 is sequentially equipped with a marking station 630 and an inspection station 650 along its rotation direction. The temporary placement table 213 passes through the marking station 630 and the inspection station 650 sequentially as the second turntable 212 rotates. When the temporary placement table 213 rotates the quartz crystal resonator 700 to the marking station 630, the marking mechanism 270 marks the quartz crystal resonator 700 located at the marking station 630. When the temporary placement table 213 rotates the quartz crystal resonator 700 to the inspection station 650, the inspection mechanism 280 performs a frontal visual inspection of the quartz crystal resonator 700 located at the inspection station 650. The inspection mechanism 280 can promptly and accurately detect various defects and marking problems on the front of the quartz crystal resonator 700, screening out unqualified products at an early stage, preventing defective products from flowing into the next process, and effectively ensuring the overall quality of the product.

[0042] Furthermore, a suction port is provided in the middle of the temporary platform 213. The suction port creates negative pressure through suction, making the quartz crystal resonator 700 more stably supported on the temporary platform 213. During the movement of the quartz crystal resonator 700 with the temporary platform 213, relative displacement between them is less likely. The suction port can be connected to a negative pressure vacuum pipe for material suction and discharge. A filter can be installed in the middle to filter the air entering the negative pressure vacuum pipe, removing dust and impurities. Automated suction and discharge operations can also be achieved through a vacuum breaking structure, improving production efficiency and reducing human error. The specific vacuum breaking structure can be controlled by a solenoid valve to start and stop.

[0043] The marking and inspection device 200 for quartz crystal resonators in this embodiment enables the quartz crystal resonator 700 to quickly switch between marking and inspection processes without manual handling, significantly reducing the dwell time of a single product between processes. The synchronous rotation of multiple temporary platforms 213 achieves continuous assembly line operation, processing more products per unit time, significantly improving the overall production line efficiency and meeting the needs of large-scale production. The automated turntable transfer, marking, and inspection process greatly reduces manual operation, lowers reliance on manpower, saves labor costs, and avoids human error and safety accidents caused by human fatigue or negligence, further improving the stability of the production process and the consistency of product quality.

[0044] In one embodiment, such as Figure 6As shown, the marking mechanism 270 includes a marking adjustment mounting base 271, a laser 273, and a laser head 272. The laser 273 is mounted on the upper end of the marking adjustment mounting base 271, and the laser head 272 is mounted on one end of the laser 273. The laser 273 generates a laser beam and emits it through the laser head 272 to the quartz crystal resonator 700 on the marking station 630. The laser 273 generates a high-energy laser beam and can be an Nd:YAG laser 273, a semiconductor laser 273, etc. The laser head 272, mounted on one end of the laser 273, is the laser beam emission terminal, responsible for focusing and precisely projecting the laser beam generated by the laser 273 onto the surface of the quartz crystal resonator 700. Specifically, the laser head 272 can have a red light correction function, and the lens focal length can be precisely adjusted within a certain range, roughly covering from an initial value to 100mm. It can use 20W power for laser marking and engraving.

[0045] The height and angle of the marking adjustment mounting base 271 are adjustable, allowing for fine-tuning of the laser 273 and laser head 272 in terms of vertical and horizontal angles. The height and angle adjustment of the marking adjustment mounting base 271 can be achieved through screw drive, gear adjustment, or hydraulic / pneumatic devices. For example, in vertical adjustment, rotating the screw can smoothly raise or lower the laser 273 and laser head 272 according to a predetermined precision (e.g., 0.1mm step), adapting to marking tasks of the quartz crystal resonator 700 with different height requirements. In angle adjustment, a graduated rotary joint or worm gear mechanism can precisely adjust the tilt angle of the laser 273 and laser head 272, ensuring that the laser beam is incident perpendicularly on the product surface and guaranteeing consistent marking results.

[0046] Furthermore, the marking mechanism 270 also includes a laser-to-control host cable 274, which connects the laser 273 and the control host 275 to transmit control signals. The control host 275 has built-in marking control software. Operators input various marking parameters, such as laser power, pulse frequency, marking speed, and marking pattern, into the human-machine interface of the control host 275. Based on these instructions, the control host 275 sends corresponding electrical signals to the laser 273 via the laser-to-control host cable 274, achieving real-time and precise control of the laser 273's operating status. For example, when the laser power needs to be changed, the control host 275 sends a digital signal containing the power adjustment value to the laser 273. Upon receiving this signal, the laser 273's internal power adjustment circuit responds quickly, adjusting the output laser power to the set value, ensuring a flexible and accurate marking process.

[0047] Due to the flexible adjustment characteristics of the marking adjustment mounting base 271 and the multi-adjustment function of the laser head 272, the marking mechanism 270 can handle quartz crystal resonators 700 of different specifications and materials, and achieve precise and efficient marking operations in the production process, thereby improving the traceability and marking quality of products.

[0048] In one embodiment, such as Figure 7 As shown, the detection mechanism 280 includes a mounting and adjustment bracket 281, a red ring light source 282, and a black and white camera 283. The red ring light source 282 and the black and white camera 283 are respectively mounted on the mounting and adjustment bracket 281. The mounting and adjustment bracket 281 can be equipped with multiple sets of guide rails, sliders, lead screw and nut pairs, and angle adjustment devices to achieve precise position adjustment of the red ring light source 282 and the black and white camera 283 mounted on it in three-dimensional space. The red ring light source 282 typically uses a high-brightness LED array as its light-emitting element, which is distributed in a ring structure. The red ring light source 282 provides uniform illumination, eliminates shadows and reflections, and ensures that the camera can clearly capture the image of the quartz crystal resonator 700.

[0049] The monochrome camera 283 captures images of the quartz crystal resonator 700. Its photosensitive element can be a high-sensitivity CCD or CMOS chip, capable of rapidly converting received light intensity signals into digital electrical signals. Specifically, the monochrome camera 283 can be configured with a 1.3 million pixel resolution, clearly revealing the detailed features of the product surface. For example, for laser-marked lettering, the camera can accurately distinguish the clarity of the strokes, the sharpness of the edges, and whether there are any minor omissions in the marking, providing high-precision image data for subsequent visual inspection algorithms. A telecentric lens 284 can be mounted on the front of the monochrome camera 283, providing distortion-free, high-precision imaging. The camera lens and the telecentric lens 284 are typically connected via a bayonet mount or threaded connection to ensure precise alignment of the optical path.

[0050] During operation, the red ring light source 282 emits light downwards directly at the quartz crystal resonator 700 on the first inspection station 650. The black and white camera 283 is located directly above the red ring light source 282. Utilizing the good lighting conditions provided by the light source, it captures the light reflected back from the surface of the quartz crystal resonator 700 and clearly presents the detailed features of the product surface with a resolution of 1.3 million pixels.

[0051] The testing agency 1280 performs font inspection and missing marking inspection on the laser-marked quartz crystal resonators 700. Through precise and efficient frontal visual inspection, unqualified quartz crystal resonators 700 are screened out at an early stage, preventing defective products from flowing into subsequent processes and effectively reducing the scrap rate.

[0052] In one embodiment, the second turntable 212 is further provided with a second positioning station 620 along its rotation direction. The second positioning station 620 is located upstream of the marking station 630, or the second positioning station 620 and the marking station 630 are the same station. The marking and testing device 200 also includes a second positioning mechanism 250, which positions the quartz crystal resonator 700 located on the second positioning station 620.

[0053] Specifically, such as Figure 5 As shown, the positioning mechanism 250 includes a positioning mounting base 254, a positioning motor 251 and a positioning slide 252 mounted on the positioning mounting base 254, and a positioning piece 253 fixedly connected to one end of the positioning slide 252. The positioning motor 251 drives the positioning slide 252 to reciprocate and moves the positioning piece 253 to reciprocate.

[0054] The mounting base can be equipped with a series of standard threaded holes, locating pin holes, and guide rail mounting slots, etc., to firmly fix the positioning motor 251 in the predetermined position through bolts, locating pins, and other connecting parts, ensuring that the motor will not shift or shake during operation. Simultaneously, it provides smooth and highly precise guide rail support for the positioning slide 252, allowing the slide to move only along a predetermined straight line. The clearance between the guide rail and the slide is extremely small, generally controlled within 0.05mm, ensuring high precision and stability of the slide's movement. The slide's stroke is designed according to the positioning requirements of the quartz crystal resonator 700, typically between 10-50mm, which satisfies the need for calibration of products in different placement positions while avoiding excessive stroke that would lead to structural redundancy and reduced motion accuracy.

[0055] Upon receiving a positioning command from the control system, positioning motor 251 starts precisely according to the preset program and parameters, rotating at the required speed and direction, driving positioning slide 252 to move forward and backward in a linear motion. One end of the slide is securely fixed to positioning piece 253 by bolts or welding, allowing positioning piece 253 to move synchronously with the slide. Positioning piece 253 is the component that directly contacts the quartz crystal resonator 700. Its material selection balances product protection and effective positioning, generally using plastic or rubber-coated metal with moderate hardness, a smooth surface, and a certain degree of wear resistance. The shape of positioning piece 253 is customized according to the outer contour of the quartz crystal resonator 700, typically designed to fit the product's edge, such as an L-shape or U-shape, so that it can accurately apply force from multiple directions when in contact with the product, pushing or adjusting the product's position.

[0056] During operation, the positioning plate 253 gradually approaches the quartz crystal resonator 700 as the positioning slide 252 moves. When it comes into contact with the product, it uses the friction between itself and the product, as well as the pushing force transmitted by the slide, to gently and accurately correct the position of the product on the temporary stage 213, ensuring that its center, angle and other key position parameters meet the requirements of subsequent marking or inspection processes.

[0057] In one embodiment, an exchange station 510 is provided between the detection station 650 and the positioning station 620 along the rotation direction of the second turntable 212. The temporary placement table 213 replaces the quartz crystal resonator 700 it carries at the exchange station 510. When the temporary placement table 213 rotates to the exchange station 510, the downstream process removes the quartz crystal resonator 700 from the temporary placement table 213, and the upstream process places a new quartz crystal resonator 700 onto the temporary placement table 213, thus enabling the temporary placement table 213 to replace the quartz crystal resonator 700 it carries at the exchange station 510. The exchange station 510 enables seamless connection between upstream and downstream processes, greatly reducing waiting time between processes. Once the temporary placement table 213 reaches the exchange station 510, upstream and downstream processes can quickly complete the product handover, allowing the production line to operate continuously and efficiently, significantly increasing output per unit time and meeting the efficiency requirements of large-scale production. Specifically, upstream and downstream processes can use suction cups, grippers, or other mechanisms to pick up and place the quartz crystal resonator 700 on the temporary stage 213.

[0058] In one embodiment, the marking and testing device 200 for quartz crystal resonators further includes a waste disposal mechanism. Along the rotation direction of the second turntable 212, a waste disposal station 660 is provided between the testing station 650 and the exchange station 510. Quartz crystal resonators 700 that fail the frontal visual inspection are removed and discarded at the waste disposal station 660 by the waste disposal mechanism. After frontal visual inspection, the quartz crystal resonators 700 that fail the test are removed and discarded at the waste disposal station 660 by the waste disposal mechanism, while the quartz crystal resonators 700 that pass the test are taken to the exchange station 510 by the temporary placement table 213 and removed by the downstream process for subsequent processes.

[0059] In one embodiment, the waste disposal mechanism includes a second air nozzle and a collection mechanism 220. The blowing force of the airflow from the second air nozzle is greater than the suction force of the air intake. Quartz crystal resonators 700 that fail the frontal visual inspection are blown into the collection mechanism 220 by the second air nozzle at the waste disposal station 660. Since the blowing force of the airflow from the second air nozzle is greater than the suction force of the air intake, the second air nozzle can easily blow away the defective products sucked up by the air intake.

[0060] In one embodiment, such as Figure 8As shown, the collection mechanism 220 includes a collection mechanism mounting base 221, a defective material cup 222 and a feed tube 223 mounted on the collection mechanism mounting base 221. Defective quartz crystal resonators 700 fall into the defective material cup 222 through the feed tube 223. The collection mechanism mounting base 221, as the basic support component of the entire collection mechanism 220, has sufficient strength to withstand the weight of the defective material cup 222 and the feed tube 223, as well as the impact force generated by the defective quartz crystal resonators 700 during their fall, ensuring that the entire collection mechanism 220 does not shake or shift during operation. The defective material cup 222 is usually made of transparent or semi-transparent plastic (such as polycarbonate), allowing operators to visually observe the quantity and condition of the collected defective quartz crystal resonators 700, enabling timely cleaning of the cup and preventing overflow that could cause blockage or malfunction of the collection system. The feed tube 223 is made of metal or plastic material with a smooth inner wall (such as stainless steel tube or hard plastic tube). Its inner diameter is slightly larger than the maximum size of the quartz crystal resonator 700 to ensure that unqualified products can pass smoothly under the action of airflow or their own gravity, while minimizing the friction and collision of products in the tube to prevent damage to the product surface or blockage of the feed tube 223 due to jamming.

[0061] In other embodiments, the collection mechanism 220 further includes a cylinder, and the defective material cups 222 may include two. The two defective material cups 222 of the first waste disposal mechanism are respectively loaded with quartz crystal resonators 700 that failed the upstream process test and quartz crystal resonators 700 that failed the front visual inspection, so that different defective products can be subsequently tested, analyzed, or recycled. The feed pipe 223 includes two pipes and a pipe head. The quartz crystal resonators 700 enter the different defective material cups 222 through the pipe head and pipes. The pipe connected to the pipe head is switched according to the cylinder detection result, thereby realizing the classified collection of different defective products.

[0062] In one embodiment, along the rotation direction of the second turntable 212, a material identification station 610 is provided between the exchange station 510 and the positioning station 620, and / or a material identification station 640 is provided between the marking station 630 and the detection station 650, and / or a material identification station 670 is provided between the waste disposal station 660 and the exchange station 510; the marking and detection device 200 also includes an optical fiber detection mechanism, which is used to detect whether there is a quartz crystal resonator 700 on the material identification station 610, the material identification station 640 or the material identification station 670.

[0063] Specifically, multiple fiber optic testing mechanisms are provided, each used to detect whether a quartz crystal resonator 700 is present on the temporary storage platform 213. For example, a material identification station 610 is located between the exchange station 510 and the positioning station 620 of the second turntable 212. The fiber optic testing mechanism detects whether a quartz crystal resonator 700 is present on the temporary storage platform 213 at the material identification station 610. If present, the temporary storage platform 213 rotates to the subsequent station for positioning, marking, etc.; otherwise, the temporary storage platform 213 idles. A material identification station 640 is located between the marking station 630 and the testing station 650 of the second turntable 212. The fiber optic testing mechanism detects whether a quartz crystal resonator 700 is present on the temporary storage platform 213 at the material identification station 640. If present, the temporary storage platform 213 rotates to the subsequent station for material testing, etc.; otherwise, the temporary storage platform 213 idles.

[0064] Fiber optic inspection mechanisms can include light sources, optical fibers, and photodetectors. Light emitted from the light source is transmitted through the optical fiber to the corresponding detection point at the material identification station. When a quartz crystal resonator is present, the light signal changes (e.g., due to reflection, refraction, or scattering). This changed light signal is then transmitted back to the photodetector through the optical fiber. The photodetector converts the change in light signal into an electrical signal, thereby determining the presence of a quartz crystal resonator. For example, in a reflective fiber optic sensor, if a quartz crystal resonator is at the detection position, it will change the intensity and other characteristics of the reflected light, thus achieving detection. Multiple fiber optic inspection mechanisms can detect the presence or absence of materials, control the operation of subsequent stations, avoid unnecessary operations, reduce equipment wear and energy consumption, and improve production efficiency.

[0065] In the description of this specification, the terms "Embodiment 1," "this embodiment," or "in one embodiment," etc., indicate that the specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention or utility model. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example; moreover, the specific features, structures, materials, or characteristics described may be combined in any appropriate manner in one or more embodiments or examples.

[0066] In the description of this specification, the terms "connection," "installation," "fixing," "setting," and "having" are interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0067] In the description of this specification, relational terms such as “first” and “second” are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms “comprising,” “including,” or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase “comprising one…” does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0068] The above description of the embodiments is intended to enable those skilled in the art to understand and apply the technology of this invention. Those skilled in the art can readily make various modifications to these examples and apply the general principles described herein to other embodiments without creative effort. Therefore, this invention is not limited to the above embodiments. Modifications in the following situations should be within the scope of protection of this invention: ① New technical solutions implemented based on the technical solution of this utility model and combined with existing common knowledge, where the technical effects of the new technical solution do not exceed the technical effects of this utility model; ② Equivalent substitutions of some features of the technical solution of this utility model using known technology, resulting in the same technical effects as those of this utility model; ③ Extendable technical solutions based on the technical solution of this utility model, where the substantive content of the extended technical solution does not exceed the technical solution of this utility model; ④ Equivalent transformations made using the content of this utility model specification and drawings, directly or indirectly applied to other related technical fields.

Claims

1. A marking and testing device for a quartz crystal resonator, characterized in that, include: The second turntable has multiple temporary platforms for supporting quartz crystal resonators evenly distributed along its circumference. Each temporary platform has an air intake in the middle. The second turntable can rotate around its axis and drive the multiple temporary platforms to rotate synchronously. The temporary platforms rotate through a marking station and a detection station arranged sequentially along the rotation direction of the second turntable. A marking mechanism that marks the quartz crystal resonator located at the marking station; Inspection unit one performs frontal visual inspection on the quartz crystal resonator located at inspection station one.

2. The marking and testing device according to claim 1, characterized in that, The marking mechanism includes a marking adjustment mounting base with adjustable height and angle, a laser mounted on the upper end of the marking adjustment mounting base, and a laser head mounted on one end of the laser. The laser is used to generate a laser beam and emit it through the laser head to a quartz crystal resonator at the marking station.

3. The marking and testing device according to claim 1, characterized in that, The detection mechanism includes a mounting and adjustment bracket and a red light ring light source and a black and white camera mounted on the mounting and adjustment bracket, with the black and white camera located directly above the red light ring light source; The red ring light source emits light downwards directly at the quartz crystal resonator at the detection station, and the black and white camera is used to capture images of the quartz crystal resonator.

4. The marking and testing device according to any one of claims 1-3, characterized in that, The second turntable is also provided with a second positioning station along its rotation direction. The second positioning station is located upstream of the marking station, or the second positioning station and the marking station are the same station. The marking and testing device also includes a second positioning mechanism, which positions the quartz crystal resonator located at the second positioning station.

5. The marking and testing device according to claim 4, characterized in that, The second positioning mechanism includes a positioning mounting base, a second positioning motor and a positioning slide mounted on the positioning mounting base, and a positioning piece fixedly connected to one end of the positioning slide. The second positioning motor drives the positioning slide to reciprocate and moves the positioning piece to reciprocate.

6. The marking and testing device according to claim 4, characterized in that, Along the rotation direction of the second turntable, an exchange station is also provided between the first detection station and the second positioning station; the temporary placement stage replaces the quartz crystal resonator it carries at the exchange station.

7. The marking and testing device according to claim 6, characterized in that, It also includes a waste disposal mechanism. Along the rotation direction of the second turntable, a waste disposal station is set between the inspection station and the exchange station. Quartz crystal resonators that fail the front visual inspection are taken away and discarded by the waste disposal mechanism at the waste disposal station.

8. The marking and testing device according to claim 7, characterized in that, The first waste disposal mechanism includes a second air nozzle and a collection mechanism. The blowing force of the airflow ejected from the second air nozzle is greater than the suction force of the air intake. Quartz crystal resonators that fail the frontal visual inspection are blown into the collection mechanism by the second air nozzle at the first waste disposal station.

9. The marking and testing device according to claim 8, characterized in that, The collection mechanism includes a collection mechanism mounting base, a defective material cup and a feed tube disposed on the collection mechanism mounting base, and the defective quartz crystal resonator falls into the defective material cup through the feed tube.

10. The marking and testing apparatus according to any one of claims 7-9, characterized in that, Along the rotation direction of the second turntable, a material identification station is set between the exchange station and the positioning station, and / or a material identification station is set between the marking station and the detection station, and / or a material identification station is set between the waste station and the exchange station. The marking and testing device also includes an optical fiber testing mechanism, which is used to detect whether the quartz crystal resonator is present at the material identification station one, material identification station two, or material identification station three.

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