External amplification testing device

Abstract

The utility model discloses an external amplification test device, and belongs to the technical field of automobile power distribution circuit board detection, the external amplification test device comprises a substrate, a detection terminal and a fixing member, the detection terminal is connected with the substrate, the substrate is used for bearing a to-be-detected member, and the detection terminal is used for being connected with the to-be-detected member so as to electrically connect a to-be-detected circuit in a circuit board with the detection terminal; the fixing part is connected with the substrate, the fixing part comprises a fixing plate, a fixing hole is formed in the fixing plate, an opening of the fixing hole faces the side, away from the substrate, of the fixing table, and the detection terminal is arranged in the fixing hole in a penetrating mode so that the detection terminal can be fixed to the substrate through the fixing part. The circuit board is externally connected with the detection terminal to replace the point to be detected to be in contact with the detection probe, so that the technical problems that the detection reliability is reduced and the circuit board and electronic devices are damaged due to the fact that the area of the point to be detected is small and the detection probe falls outside the area to be detected are solved.

Description

Technical Field

[0001] This application belongs to the field of automotive power distribution circuit board testing technology, specifically relating to an external amplification testing device. Background Technology

[0002] In a vehicle's battery module, high-voltage power distribution equipment such as BDU (Battery Disconnect Unit), PDU (Power Distribution Unit), and BMU (Battery Management Unit) are typically required to manage the power distribution of the battery.

[0003] In the aforementioned high-voltage power distribution equipment, the switching is typically controlled by electrical control devices such as circuit breakers, relays, contactors, switching equipment, and overload protectors, and the on / off state of the electrical control devices is controlled by PCB boards (Printed Circuit Boards) and / or FPC boards (Flexible Printed Circuits).

[0004] PCB boards and FPC boards need to undergo circuit qualification testing before shipment. However, the high integration of PCB boards and FPC boards results in a small contact area at the test point, which requires high precision control of the test probe's landing point. It is very easy for the test probe to fall outside the test area, resulting in a decrease in test reliability. At the same time, if the probe falls outside the test point, it is very easy to damage the circuit board, circuit and electronic components. Utility Model Content

[0005] Purpose of the utility model: This application develops an external amplification testing device, which aims to solve the technical problem in the prior art where the area of ​​the test point on the circuit board is small and the detection probe falls outside the test area, resulting in a decrease in detection reliability.

[0006] Technical solution: This application provides an external amplification testing device, comprising:

[0007] A substrate for mounting a device under test, the substrate having a first direction, a second direction and a third direction intersecting each other, the substrate extending along a plane formed by the first direction and the second direction;

[0008] A detection terminal is provided for electrical connection with the device under test.

[0009] A fastener is connected to the substrate; the fastener includes a fixing plate having a fixing hole disposed along the third direction, the opening of the fixing hole facing the side of the fixing plate away from the substrate;

[0010] The detection terminal is connected to the fixing plate and at least partially passes through the fixing hole.

[0011] In some embodiments, the detection terminal includes:

[0012] The detection part is at least partially inserted through the fixing hole;

[0013] A wiring portion is connected to the detection portion, and the wiring portion is partially disposed in the fixing hole; along the third direction, the wiring portion is disposed on the side of the detection portion near the substrate, and extends out from the side of the fixing hole near the substrate;

[0014] A locking part, which is connected to the wiring part, and is disposed on the side of the fixing plate near the base plate along the third direction;

[0015] The fixing plate further includes a first limiting part, which is disposed on the inner wall of the fixing hole and on the side of the detection part near the substrate; along the third direction, the first limiting part and the orthographic projection of the detection part at least partially overlap.

[0016] In some embodiments, the fastener further includes a support block connected to the fixing plate, and the support block is disposed on the side of the fixing plate near the substrate along the third direction;

[0017] The support block and the fixing plate together form a relief groove, the wiring part passes through the fixing hole into the relief groove, and the locking part is disposed in the relief groove.

[0018] In some embodiments, the substrate further has a wire groove, the opening of which faces the side of the substrate closer to the fixing member along the third direction; the fixing member spans at least a portion of the opening of the wire groove.

[0019] In some embodiments, the external amplification testing device further includes:

[0020] A wiring terminal is disposed on the side of the substrate near the detection terminal along the third direction; along the trajectory direction of the wire groove, the wiring terminal is spaced apart from the fixing member, and the wiring terminal spans at least a portion of the opening of the wire groove trajectory;

[0021] A wire clamping member is disposed on the side of the substrate near the detection terminal along the third direction; the terminal and the fixing member are spaced apart along the trajectory direction of the wire groove, and the wire clamping member spans at least a portion of the opening of the wire groove trajectory; the wire clamping member is connected to the terminal and to the substrate.

[0022] In some embodiments, the substrate has a first support groove extending along the third direction, the opening of the first support groove facing the side of the substrate near the detection terminal, and the first support groove is used to place the workpiece to be tested.

[0023] In some embodiments, the external amplification testing device further includes a cover plate connected to the substrate. Along the third direction, the cover plate is disposed on the side of the substrate near the detection terminal and covers part of the opening of the first bearing groove.

[0024] The cover plate has a first through hole, which is opened along the third direction and communicates with the first bearing groove.

[0025] In some embodiments, multiple first bearing grooves are provided, and the multiple first bearing grooves are spaced apart along the first direction, forming a bearing platform between two adjacent first bearing grooves;

[0026] The cover plate includes a first pressing member, and along the third direction, the orthographic projection of the first pressing member at least partially coincides with the support platform.

[0027] In some embodiments, the cover plate further includes a second pressing member connected to the first pressing member, and the second pressing member is disposed on the side of the first pressing member near the first bearing groove along the first direction.

[0028] In some embodiments, the external amplification testing device further includes a clamping element, the clamping element comprising:

[0029] A clamping block is disposed on the side of the substrate near the cover plate along the third direction; the clamping block has a connecting hole that is disposed through the third direction; the clamping block includes a second limiting part, which is disposed on the inner wall of the connecting hole and disposed on the side of the connecting hole near the substrate along the third direction.

[0030] A connector, comprising a connecting rod and a third limiting portion; the connector passes through the connecting hole and extends out from the side of the connecting hole near the substrate, connecting to the substrate; the third limiting portion passes through the connecting hole, and along the third direction, the third limiting portion is disposed on the side of the connecting rod away from the substrate; along the third direction, the circumcircle of the orthographic projection of the third limiting portion covers the orthographic projection of the connecting rod;

[0031] An elastic element is sleeved on the connecting rod and, along the third direction, its two ends are respectively connected to the second limiting part and the third limiting part.

[0032] Beneficial Effects: Compared with the prior art, the external amplification testing device provided in this application includes a substrate, detection terminals, and a fixing member. The detection terminals are connected to the substrate, which is used to support the device under test (DUT). The detection terminals are used to connect to the DUT to electrically connect the circuit under test in the circuit board to the detection terminals. The fixing member is connected to the substrate and includes a fixing plate with fixing holes. The opening of the fixing holes faces the side of the fixing platform away from the substrate. The detection terminals pass through the fixing holes to fix the detection terminals to the substrate by the fixing member. This application solves the technical problem that the detection probe falls outside the test area due to the small area of ​​the test point, resulting in reduced detection reliability and damage to the circuit board and electronic devices. Attached Figure Description

[0033] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0034] Figure 1 A perspective view of the external magnification testing device provided in the embodiment of this application, showing the workpiece being clamped;

[0035] Figure 2 A perspective view of the external amplification test device provided in the embodiments of this application;

[0036] Figure 3 A perspective view of the substrate in the external amplification test device provided in the embodiments of this application;

[0037] Figure 4 A perspective view of the cover plate in the external amplification test device provided in the embodiments of this application;

[0038] Figure 5 A perspective view of the fixing component in the external amplification test device provided in the embodiments of this application;

[0039] Figure 6 A partial perspective cross-sectional view of the fixture, detection terminals and substrate connected in the external amplification test device provided in the embodiment of this application;

[0040] Figure 7 A partial perspective cross-sectional view of the substrate and cover plate clamping components in the external magnification test device provided in the embodiments of this application;

[0041] Reference numerals: 10, substrate; 11, wire groove; 12, first bearing groove; 13, bearing platform; 20, detection terminal; 21, detection part; 22, wiring part; 23, locking part; 30, fixing member; 31, fixing plate; 311, fixing hole; 312, first limiting part; 32, support block; 33, clearance groove; 40, wiring terminal; 41, wire pressing member; 50, pressing member; 51, pressing block; 511, connecting hole; 512, second limiting part; 52, connecting member; 521, connecting rod; 522, third limiting part; 53, elastic member; 60, cover plate; 61, first through hole; 62, first pressing member; 63, second pressing member; X, first direction; Y, second direction; Z, third direction. Detailed Implementation

[0042] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0043] In a vehicle's battery module, high-voltage power distribution equipment such as BDU (Battery Disconnect Unit), PDU (Power Distribution Unit), and BMU (Battery Management Unit) are typically required to manage the power distribution of the battery.

[0044] In the aforementioned high-voltage power distribution equipment, the switching is typically controlled by electrical control devices such as circuit breakers, relays, contactors, switchgear, and overload protectors, and the on / off state of the electrical control devices is controlled by PCB (Printed Circuit Board) and / or FPC (Flexible Printed Circuit) boards.

[0045] PCB boards and FPC boards need to undergo circuit qualification testing before shipment. However, the high integration of PCB boards and FPC boards results in a small contact area at the test point, which requires high precision control of the test probe's landing point. It is very easy for the test probe to fall outside the test area, resulting in a decrease in test reliability. At the same time, if the probe falls outside the test point, it is very easy to damage the circuit board, circuit and electronic components.

[0046] In view of this, embodiments of this application provide an external amplification testing device, including a substrate 10, a detection terminal 20, and a fixing member 30. The detection terminal 20 is connected to the substrate 10, the substrate 10 is used to support the device under test (DUT), and the detection terminal 20 is used to connect to the DUT to electrically connect the circuit to be tested on the circuit board to the detection terminal 20. The fixing member 30 is connected to the substrate 10 and includes a fixing plate 31. The fixing plate 31 has a fixing hole 311, the opening of which faces the side of the fixing platform away from the substrate 10. The detection terminal 20 passes through the fixing hole 311 to fix the detection terminal 20 to the substrate 10 by the fixing member 30. This application solves the technical problem that the detection probe falls outside the test area due to the small area of ​​the test point, resulting in reduced detection reliability and damage to the circuit board and electronic devices, by using an external detection terminal 20 on the circuit board to replace the contact between the test point and the detection probe.

[0047] In some embodiments, please refer to Figures 1 to 3 , Figure 1 This is a perspective view of the external magnification testing device provided in the embodiments of this application, showing the workpiece being clamped. Figure 2 This is a perspective view of the external amplification test device provided in the embodiments of this application. Figure 3 This is a perspective view of the substrate in the external amplification test device provided in the embodiments of this application; the substrate 10 is used to support the test piece. To facilitate understanding of the relative positional relationship between the components, the embodiments of this application introduce an intersecting first direction X, a second direction Y, and a third direction Z. The plate body of the substrate 10 extends along the plane formed by the first direction X and the second direction Y. Specifically, the substrate 10 is a rectangular plate-shaped piece. The length direction of the rectangular plate-shaped piece is the first direction X, the width direction is the second direction Y, and the thickness direction is the third direction Z. It can be understood that the first direction X, the second direction Y, and the third direction Z are orthogonally arranged.

[0048] In some embodiments, please refer to Figure 1 , Figure 2 and Figure 6 , Figure 1 This is a perspective view of the external magnification testing device provided in the embodiments of this application, showing the workpiece being clamped. Figure 2 This is a perspective view of the external amplification test device provided in the embodiments of this application. Figure 6 This is a partial perspective sectional view of the external amplification test device provided in this application embodiment, after the fixing member, detection terminal, and substrate are connected; the detection terminal 20 is connected to the substrate 10 and is used to make an electrical connection with the device under test to connect the circuit under test in the circuit board. Specifically, the detection terminal 20 can be a copper terminal or an aluminum terminal.

[0049] In some embodiments, please refer to Figure 6 , Figure 6This is a partial perspective cross-sectional view of the external amplification test device provided in this application embodiment after the fixing member, detection terminal, and substrate are connected. The detection terminal 20 includes a detection part 21, a wiring part 22, and a locking part 23. The detection part 21 is at least partially inserted through the fixing hole 311. The wiring part 22 is connected to the detection part 21 and is partially disposed in the fixing hole 311. Along the third direction Z, the wiring part 22 is disposed on the side of the detection part 21 near the substrate 10 and extends out from the side of the fixing hole 311 near the substrate 10. The locking part 23 is connected to the wiring part 22 and is disposed on the side of the fixing plate 31 near the substrate 10 along the third direction Z. Specifically, the detection part 21 is a circular plate or cylindrical component, the wiring part 22 is a cylindrical component, the axes of the detection part 21 and the wiring part 22 coincide on the same straight line, and they are integrally manufactured. The locking part 23 is a locking nut, which is threadedly connected to the wiring part 22 for fastening the wires connecting the detection terminal 20 and the circuit under test.

[0050] In some embodiments, please refer to Figure 1 , Figure 2 , Figure 5 and Figure 6 , Figure 1 This is a perspective view of the external magnification testing device provided in the embodiments of this application, showing the workpiece being clamped. Figure 2 This is a perspective view of the external amplification test device provided in the embodiments of this application. Figure 5 This is a perspective view of the fixing component in the external amplification testing device provided in the embodiments of this application. Figure 6 This is a partial perspective cross-sectional view of the external amplification testing device provided in this application after the fixing member, detection terminal, and substrate are connected. The external amplification testing device provided in this application also includes a fixing member 30, which is used to connect the substrate 10 and the detection terminal 20 to achieve the connection and fixation of the detection terminal 20. Specifically, the fixing member 30 includes a fixing plate 31, which is a rectangular plate. The fixing plate 31 is arranged parallel to the substrate 10. The fixing plate 31 has a fixing hole 311, which extends along the third direction Z and faces the side of the fixing platform away from the substrate 10. The detection terminal 20 is connected to the fixing platform and at least partially passes through the fixing hole 311 to facilitate the detection probe to press down and contact the detection terminal 20 for circuit testing.

[0051] In some embodiments, please refer to Figure 1 , Figure 2 , Figure 5 and Figure 6 , Figure 1 This is a perspective view of the external magnification testing device provided in the embodiments of this application, showing the workpiece being clamped. Figure 2 This is a perspective view of the external amplification test device provided in the embodiments of this application. Figure 5 This is a perspective view of the fixing component in the external amplification testing device provided in the embodiments of this application. Figure 6 This is a partial perspective cross-sectional view of the external amplification testing device provided in this application embodiment after the fixing member, detection terminal, and substrate are connected. The fixing plate 31 also includes a first limiting part 312, which is disposed on the inner wall of the fixing hole 311 and on the side of the detection part 21 near the substrate 10. Along the third direction Z, the orthographic projection of the first limiting part 312 and the detection part 21 at least partially overlap. Specifically, along the third direction Z, the first limiting part 312 is an annular boss, disposed on the inner wall of the fixing hole 311, and the wiring part 22 passes through the annular hole of the annular boss. Along the third direction Z, the detection part 21 abuts against the annular boss, so that the annular boss supports the detection part 21 in a direction away from the substrate 10, so that the detection probe contacts the detection terminal 20 for detection.

[0052] In some embodiments, please refer to Figure 1 , Figure 2 , Figure 5 and Figure 6 , Figure 1 This is a perspective view of the external magnification testing device provided in the embodiments of this application, showing the workpiece being clamped. Figure 2 This is a perspective view of the external amplification test device provided in the embodiments of this application. Figure 5 This is a perspective view of the fixing component in the external amplification testing device provided in the embodiments of this application. Figure 6 This is a partial perspective cross-sectional view of the external amplification testing device provided in this application embodiment after the fixing member, detection terminal, and substrate are connected. The fixing member 30 also includes a support block 32, which is connected to the fixing plate 31. The support block 32 is disposed on the side of the fixing plate 31 near the substrate 10 along the third direction Z. The support block 32 and the fixing plate 31 enclose each other to form a relief groove 33. The wiring part 22 passes through the relief groove 33 from the fixing hole 311, and the locking part 23 is disposed in the relief groove 33. Specifically, the support block 32 is a rectangular block, which is disposed at the four corners of the rectangle of the fixing plate 31 to provide support for the fixing plate 31 and form the relief groove 33. The wiring terminal 40 extends out from the fixing hole 311 and passes through the relief groove 33 to connect with the locking part 23.

[0053] In some embodiments, please refer to Figure 1 , Figure 2 and Figure 3 , Figure 1 This is a perspective view of the external magnification testing device provided in the embodiments of this application, showing the workpiece being clamped. Figure 2 This is a perspective view of the external amplification test device provided in the embodiments of this application. Figure 3This is a perspective view of the substrate in the external amplification test device provided in this application embodiment; the substrate 10 also has a wire groove 11, which faces the side of the substrate 10 near the fixing member 30 along the third direction Z; the fixing member 30 spans the opening of at least a portion of the trajectory of the wire groove 11. Specifically, two support blocks 32 are disposed on one side of the width direction of the wire groove 11, and two support blocks 32 are disposed on the other side of the width direction of the wire groove 11, such that the fixing block spans the opening of the wire groove 11, and the wire is laid in the wire groove 11 along the trajectory of the wire groove 11 and connected to the wiring portion 22 in the relief groove 33.

[0054] In some embodiments, please refer to Figure 1 and Figure 6 , Figure 1 This is a perspective view of the external magnification testing device provided in the embodiments of this application, showing the workpiece being clamped. Figure 6 This is a partial perspective cross-sectional view of the external amplification testing device provided in this application embodiment after the fixing member, detection terminal, and substrate are connected. The external amplification testing device also includes a wiring terminal 40 and a wire clamping member 41. The wiring terminal 40 is disposed on the side of the substrate 10 near the detection terminal 20 along the third direction Z. Along the trajectory direction of the wire groove 11, the wiring terminal 40 and the fixing member 30 are spaced apart, and the wiring terminal 40 spans the opening of at least a portion of the trajectory of the wire groove 11. The wire clamping member 41 is disposed on the side of the substrate 10 near the detection terminal 20 along the third direction Z. Along the trajectory direction of the wire groove 11, the wiring terminal 40 and the fixing member 30 are spaced apart, and the wire clamping member 41 spans the opening of at least a portion of the trajectory of the wire groove 11. The wire clamping member 41 is connected to the wiring terminal 40 and to the substrate 10. Specifically, the wire clamping component 41 includes two connecting rods 521 and a wire clamping plate. The two connecting rods 521 are located on both sides of the wire groove 11 in the width direction and are connected to the terminal block 40. The wire clamping plate is arranged along the width direction of the wire groove 11 and spans the opening of the wire groove 11. Along the width direction of the wire groove 11, both ends of the wire clamping plate are connected to the two connecting rods 521 respectively. The wire clamping plate is fixed to the base plate 10 by bolts, and the terminal block 40 is fixed by the connecting rods 521.

[0055] In some embodiments, please refer to Figure 2 and Figure 3 , Figure 2 This is a perspective view of the external amplification test device provided in the embodiments of this application. Figure 3This is a perspective view of the substrate in the external amplification testing device provided in this application embodiment. The substrate 10 has a first support groove 12 extending in the third direction Z. The opening of the first support groove 12 faces the side of the substrate 10 near the detection terminal 20. The first support groove 12 is used to place the workpiece to be tested. It can be understood that the first support groove 12 is used to support the PCB board (Printed Circuit Board).

[0056] In some embodiments, please refer to Figure 1 , Figure 4 , Figure 6 and Figure 7 , Figure 1 This is a perspective view of the external magnification testing device provided in the embodiments of this application, showing the workpiece being clamped. Figure 4 This is a perspective view of the cover plate in the external amplification test device provided in the embodiments of this application. Figure 6 This is a partial perspective sectional view of the external amplification testing device provided in this application embodiment, after the fixing components, detection terminals, and substrate are connected. Figure 7 This is a partial perspective cross-sectional view of the substrate and cover plate clamping components in the external amplification testing device provided in this application embodiment. The external amplification testing device provided in this application also includes a cover plate 60, which is connected to the substrate 10. Along the third direction Z, the cover plate 60 is disposed on the side of the substrate 10 near the detection terminal 20 and covers part of the opening of the first bearing groove 12. The cover plate 60 has a first through hole 61, which is opened along the third direction Z and communicates with the first bearing groove 12. Specifically, the cover plate 60 is hinged to the substrate 10 and is used to press and fix the PCB board. In this application, the cover plate 60 covers the part of the PCB board where no electronic components are placed to fix the PCB board. The electronic components on the PCB board pass through the first through hole 61 to make way for the electronic components and avoid the cover plate 60 pressing and damaging the electronic components.

[0057] In some embodiments, please refer to Figure 3 and Figure 4 , Figure 3 This is a perspective view of the substrate in the external amplification testing device provided in the embodiments of this application. Figure 4This is a perspective view of the cover plate in the external amplification test device provided in this application embodiment. Multiple first support grooves 12 are provided, spaced apart along a first direction X, and a support platform 13 is formed between adjacent first support grooves 12. The cover plate 60 includes a first pressing member 62, and along a third direction Z, the orthographic projection of the first pressing member 62 at least partially overlaps with the support platform 13. Specifically, in high-voltage power distribution equipment such as BDU (Battery Disconnect Unit), PDU (Power Distribution Unit), and BMU (Battery Management Unit), multiple PCBs are often connected via FPC (Flexible Printed Circuit). In this application, multiple PCBs are respectively disposed in the first support grooves 12, and the FPC between adjacent PCBs is disposed on the support platform 13 and pressed and fixed to the support platform 13 by the first pressing member 62.

[0058] In some embodiments, please refer to Figure 4 and Figure 6 , Figure 4 This is a perspective view of the cover plate in the external amplification test device provided in the embodiments of this application. Figure 6 This is a partial perspective cross-sectional view of the external amplification test device provided in this application embodiment after the fixing member, detection terminal and substrate are connected. The cover plate 60 also includes a second pressing member 63, which is connected to the first pressing member 62. Along the first direction X, the second pressing member 63 is disposed on the side of the first pressing member 62 near the first bearing groove 12 to further improve the pressing effect on the FPC board.

[0059] In some embodiments, please refer to Figure 1 , Figure 2 and Figure 7 , Figure 1 This is a perspective view of the external magnification testing device provided in the embodiments of this application, showing the workpiece being clamped. Figure 2 This is a perspective view of the external amplification test device provided in the embodiments of this application. Figure 7This is a partial perspective cross-sectional view of the substrate and cover plate clamping components in the external magnification testing device provided in this application embodiment. The external magnification testing device in this application further includes a clamping component 50, which includes a clamping block 51, a connecting component 52, and an elastic component 53. Along the third direction Z, the clamping block 51 is disposed on the side of the substrate 10 near the cover plate 60; the clamping block 51 has a connecting hole 511 that is disposed through the connecting hole 511 along the third direction Z, and the clamping block 51 includes a second limiting part 512, which is disposed on the inner wall of the connecting hole 511 and is disposed along the third direction Z on the side of the connecting hole 511 near the substrate 10; the connecting component... 52 includes a connecting rod 521 and a third limiting part 522; the connecting member 52 passes through the connecting hole 511 and extends out from the side of the connecting hole 511 near the substrate 10, and is connected to the substrate 10; the third limiting part 522 passes through the connecting hole 511, and along the third direction Z, the third limiting part 522 is disposed on the side of the connecting rod 521 away from the substrate 10; along the third direction Z, the circumcircle of the orthographic projection of the third limiting part 522 covers the orthographic projection of the connecting rod 521; the elastic member 53 is sleeved on the connecting rod 521, and along the third direction Z, the two ends of the elastic member 53 are respectively connected to the second limiting part 512 and the third limiting part 522.

[0060] Understandably, the external amplification testing device provided in the embodiments of this application includes a substrate 10, a detection terminal 20, and a fixing member 30. The detection terminal 20 is connected to the substrate 10, the substrate 10 is used to support the device under test (DUT), and the detection terminal 20 is used to connect to the DUT to electrically connect the circuit to be tested in the circuit board to the detection terminal 20. The fixing member 30 is connected to the substrate 10 and includes a fixing plate 31. The fixing plate 31 has a fixing hole 311, the opening of which faces the side of the fixing platform away from the substrate 10. The detection terminal 20 passes through the fixing hole 311 to fix the detection terminal 20 to the substrate 10 by the fixing member 30. This application solves the technical problem that the detection probe falls outside the test area due to the small area of ​​the test point, resulting in reduced detection reliability and damage to the circuit board and electronic devices, by using an external detection terminal 20 on the circuit board to replace the test point and contact the detection probe.

[0061] This application has provided a detailed description of an external amplification testing device provided in the embodiments of this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. An external amplification testing device, characterized in that, include: A substrate (10) is used to mount a test piece. The substrate (10) has a first direction (X), a second direction (Y) and a third direction (Z) that are intersected. The substrate (10) extends along the plane formed by the first direction (X) and the second direction (Y). A detection terminal (20) is used to electrically connect to the device under test; A fastener (30) is connected to the substrate (10); the fastener (30) includes a fixing plate (31) having a fixing hole (311) disposed along the third direction (Z), the opening of the fixing hole (311) facing the side of the fixing plate (31) away from the substrate (10); The detection terminal (20) is connected to the fixing plate (31) and at least partially passes through the fixing hole (311).

2. The external amplification testing device according to claim 1, characterized in that, The detection terminal (20) includes: The detection part (21) is at least partially inserted through the fixing hole (311); A wiring portion (22) is connected to the detection portion (21), and the wiring portion (22) is partially disposed in the fixing hole (311); along the third direction (Z), the wiring portion (22) is disposed on the side of the detection portion (21) near the substrate (10), and extends out from the side of the fixing hole (311) near the substrate (10); A locking part (23) is connected to the wiring part (22) and is disposed on the side of the fixing plate (31) near the base plate (10) along the third direction (Z); The fixing plate (31) further includes a first limiting part (312), which is disposed on the inner wall of the fixing hole (311) and on the side of the detection part (21) near the substrate (10); along the third direction (Z), the first limiting part (312) and the orthographic projection of the detection part (21) at least partially overlap.

3. The external amplification testing device according to claim 2, characterized in that, The fastener (30) also includes a support block (32), which is connected to the fixing plate (31). The support block (32) is disposed on the side of the fixing plate (31) near the base plate (10) along the third direction (Z). The support block (32) and the fixing plate (31) enclose each other to form a relief groove (33), the wiring part (22) passes through the fixing hole (311) into the relief groove (33), and the locking part (23) is provided in the relief groove (33).

4. The external amplification testing device according to claim 1, characterized in that, The substrate (10) also has a wire groove (11) along the third direction (Z), with the opening of the wire groove (11) facing the side of the substrate (10) near the fixing member (30); the fixing member (30) spans at least a portion of the opening of the wire groove (11).

5. The external amplification testing device according to claim 4, characterized in that, The external amplification testing device also includes: A terminal block (40) is disposed on the side of the substrate (10) near the detection terminal (20) along the third direction (Z); the terminal block (40) is spaced apart from the fixing member (30) along the trajectory direction of the wire groove (11), and the terminal block (40) spans at least a portion of the opening of the trajectory of the wire groove (11); A wire clamping member (41) is disposed on the side of the substrate (10) near the detection terminal (20) along the third direction (Z); the terminal (40) and the fixing member (30) are spaced apart along the trajectory direction of the wire groove (11), and the wire clamping member (41) spans at least part of the opening of the trajectory of the wire groove (11); the wire clamping member (41) is connected to the terminal (40) and to the substrate (10).

6. The external amplification testing device according to claim 1, characterized in that, The substrate (10) has a first support groove (12) extending along the third direction (Z), the opening of the first support groove (12) facing the side of the substrate (10) near the detection terminal (20), and the first support groove (12) is used to place the workpiece to be tested.

7. The external amplification testing device according to claim 6, characterized in that, The external amplification test device also includes a cover plate (60), which is connected to the substrate (10). Along the third direction (Z), the cover plate (60) is disposed on the side of the substrate (10) near the detection terminal (20) and covers part of the opening of the first bearing groove (12). The cover plate (60) has a first through hole (61) which is opened along the third direction (Z) and communicates with the first bearing groove (12).

8. The external amplification testing device according to claim 7, characterized in that, Multiple first bearing grooves (12) are provided, and the multiple first bearing grooves (12) are spaced apart along the first direction (X), and a bearing platform (13) is formed between two adjacent first bearing grooves (12); The cover plate (60) includes a first pressing member (62) along the third direction (Z), the orthographic projection of the first pressing member (62) at least partially coinciding with the support platform (13).

9. The external amplification testing device according to claim 8, characterized in that, The cover plate (60) further includes a second pressing member (63), which is connected to the first pressing member (62). Along the first direction (X), the second pressing member (63) is disposed on the side of the first pressing member (62) near the first bearing groove (12).

10. The external amplification testing device according to claim 7, characterized in that, The external amplification testing device further includes a clamping element (50), which includes: A clamping block (51) is disposed on the side of the substrate (10) near the cover plate (60) along the third direction (Z); the clamping block (51) has a connecting hole (511) that is disposed through the third direction (Z); the clamping block (51) includes a second limiting part (512), the second limiting part (512) is disposed on the inner wall of the connecting hole (511) and is disposed on the side of the connecting hole (511) near the substrate (10) along the third direction (Z); A connector (52) includes a connecting rod (521) and a third limiting part (522); the connector (52) passes through the connecting hole (511) and extends out from the side of the connecting hole (511) near the substrate (10) to connect with the substrate (10); the third limiting part (522) passes through the connecting hole (511) and is located along the third direction (Z) on the side of the connecting rod (521) away from the substrate (10); along the third direction (Z), the circumcircle of the orthographic projection of the third limiting part (522) covers the orthographic projection of the connecting rod (521); An elastic element (53) is sleeved on the connecting rod (521) along the third direction (Z). The two ends of the elastic element (53) are respectively connected to the second limiting part (512) and the third limiting part (522).

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