Sensor test platform and test system

Abstract

The utility model discloses a sensor test platform and a test system. The test platform comprises a first guide rail assembly, a second guide rail assembly and a switching assembly, the first guide rail assembly comprises a first guide rail and a first driving part. The first guide rail is provided with a fixing support and a first sliding block capable of moving on the first guide rail in the first direction. The second guide rail assembly comprises a second guide rail and a second driving piece, and a second sliding block capable of moving on the second guide rail in the second direction is arranged on the second guide rail; the fixed support and the second sliding block are both provided with the switching assemblies, so that a to-be-detected sensor arranged on the fixed support and the second sliding block is switched from a first state to a second state during testing, the testing of Y-axis and Z-axis data can be realized, the requirements of left-right deviation and up-down deviation of the sensor are met, and the testing efficiency is improved. And the test precision is high.

Description

[0001] This application claims priority to Chinese patent application filed on June 17, 2024, with application number 202410778699.8 and title "Sensor Testing Platform, Testing System and Testing Method". Technical Field

[0002] This application belongs to the field of sensor technology, specifically relating to a sensor testing platform and testing system. Background Technology

[0003] As a detection device, a sensor typically includes through-beam photoelectric sensors and reflective photoelectric sensors. They can detect the presence of objects in a detection area. Sensors usually need to be tested using a sensor test bench to ensure their performance and quality.

[0004] Traditional sensor testing platforms have limited testing items and simple testing functions, which can only meet the basic testing requirements in the product development process. They can only perform tests in the X-axis direction and cannot perform tests in the Y-axis and Z-axis directions, which has certain limitations. Utility Model Content

[0005] This application provides a sensor testing platform and testing system that can solve the problem of how to test sensors in the Y-axis and Z-axis directions, thereby improving the testing accuracy of sensors.

[0006] To address the aforementioned technical problems, this application provides a sensor testing platform, which includes a first guide rail assembly, a second guide rail assembly, and a switching assembly arranged in a cross configuration.

[0007] The first guide rail assembly includes a first guide rail and a first driving member. The first guide rail is provided with a fixed bracket and a first slider that can move along a first direction on the first guide rail.

[0008] The second guide rail assembly includes a second guide rail and a second driving member, and a second slider is provided on the second guide rail that can move along the second direction on the second guide rail;

[0009] The switching component is provided on both the fixed bracket and the second slider to switch the sensor to be tested on the fixed bracket and the second slider from the first state to the second state during testing.

[0010] As a further improvement of this application, the first guide rail is provided with a first limiting member and a second limiting member for limiting the first slider, and a first sensing member is provided between the first limiting member and the second limiting member.

[0011] As a further improvement of this application, the second guide rail is provided with a third limiting member and a fourth limiting member for limiting the second slider, a fifth limiting member is provided between the third limiting member and the fourth limiting member, and a second sensing member is provided between the third limiting member and the fifth limiting member.

[0012] As a further improvement of this application, the first state is that both the transmitting end and the receiving end of the sensor under test are in a vertical state, and the second state is that both the transmitting end and the receiving end of the sensor under test are in a horizontal state.

[0013] As a further improvement to this application, the sensor to be detected is either a through-beam photoelectric sensor or a diffuse reflection photoelectric sensor.

[0014] When the sensor to be detected is a through-beam photoelectric sensor, the transmitting end and the receiving end of the through-beam photoelectric sensor are respectively disposed on the fixed bracket and the first slider, or respectively disposed on the fixed bracket and the second slider;

[0015] When the sensor to be detected is a diffuse reflection photoelectric sensor, the diffuse reflection photoelectric sensor and the target baffle are respectively disposed on the fixed bracket and the first slider, or respectively disposed on the fixed bracket and the second slider.

[0016] As a further improvement of this application, a first belt is provided on the first guide rail, and a first coupling is provided between the first drive member and the first belt.

[0017] A second belt is provided on the second guide rail, and a second coupling is provided between the second drive component and the second belt.

[0018] As a further improvement of this application, the sensor testing platform also includes a test bench and photoelectric protectors disposed around the test bench;

[0019] The first guide rail assembly, the second guide rail assembly, and the switching assembly are all mounted on the test bench.

[0020] As a further improvement of this application, the sensor testing platform also includes a control box, which is provided with a servo control area, including a first servo driver and a second servo driver.

[0021] The first servo driver is used to control the first guide rail assembly, and the second servo driver is used to control the second guide rail assembly.

[0022] This application also provides a sensor testing system, which includes the sensor testing platform described in any of the above claims;

[0023] The sensor detection platform is used to detect one-dimensional, two-dimensional, and three-dimensional data of the sensor to be detected.

[0024] As a further improvement of this application, the one-dimensional data includes any one or more of the following: sensing distance, sensing hysteresis, and sensing blind zone; the two-dimensional data includes the offset distance of the sensor to be detected in the Y-axis direction; and the three-dimensional data includes the offset distance of the sensor to be detected in the Z-axis direction.

[0025] The sensor testing platform and testing system provided in this application have the following beneficial effects:

[0026] This application mounts the sensor to be tested on a fixed bracket, a first slider, and a second slider as required. When testing is required in the X-axis direction, a first driving component drives the first slider to move relative to the fixed bracket. When testing is required in the Y-axis direction, a second driving component drives the second slider to move relative to the fixed bracket. Switching components are provided on both the fixed bracket and the second slider. When testing is required in the Z-axis direction, the switching components switch the sensor to be tested from a first state to a second state on the fixed bracket and the second slider, and the second driving component drives the second slider to move relative to the fixed bracket. This satisfies the sensor's need for left-right and up-down offset in practical applications. By replacing manual testing with automated testing, testing efficiency is improved, the reliability of test parameters is increased, and accurate evaluation of sensor performance and quality is achieved. Attached Figure Description

[0027] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only a part of the embodiments of this application, and not all of the embodiments. For those skilled in the art, other drawings obtained from these drawings without creative effort are all within the scope of protection of this application.

[0028] Figure 1 This is a schematic diagram of the sensor testing platform provided in the embodiments of this application;

[0029] Figure 2 for Figure 1 The diagram shows the structure of the first guide rail assembly in the sensor testing platform shown.

[0030] Figure 3 for Figure 1 The diagram shows the structure of the second guide rail assembly in the sensor testing platform shown.

[0031] Figure 4 for Figure 1 The first application embodiment of the sensor testing platform shown;

[0032] Figure 5 for Figure 1 The second application embodiment of the sensor testing platform shown;

[0033] Figure 6 for Figure 1 The third application embodiment of the sensor testing platform shown;

[0034] Figure 7 for Figure 1 The diagram shows the structure of the control box in the sensor testing platform.

[0035] Figure 8 for Figure 1 The diagram shows the communication connection between the host computer and the slave computer in the sensor testing platform shown.

[0036] Figure 9 for Figure 1 The diagram shows the hardware schematic of the signal input interface in the sensor test platform.

[0037] Figure 10 for Figure 1 The diagram shows the hardware schematic for mode switching in the sensor testing platform shown.

[0038] Figure 11 A schematic diagram of a sensor testing system for detecting one-dimensional data;

[0039] Figure 12 This is a schematic diagram illustrating the relationship between detection distance and offset distance in a sensor testing system.

[0040] Explanation of reference numerals in the attached figures:

[0041] 1-Host computer; 2-Test bench; 3-Control box; 4-Photoelectric protector;

[0042] 10-First guide rail assembly; 11-Fixed bracket; 12-First guide rail; 13-First driving component; 14-First slider; 15-First limiting component; 16-Second limiting component; 17-First sensing component; 18-First belt; 19-First coupling;

[0043] 20-Second guide rail assembly; 21-Second guide rail; 22-Second driving component; 23-Second slider; 24-Third limiting component; 25-Fourth limiting component; 26-Fifth limiting component; 27-Second sensing component; 28-Second belt; 29-Second coupling;

[0044] 31-Servo power supply area; 311-Air switch; 312-Filter; 313-Relay; 32-Servo control area; 321-First servo driver; 322-Second servo driver; 33-Lower control area; 331-Input interface female; 332-Input interface female; 333-Four-wire interface; 334-Main control chip; 335-Sensor signal output interface; 336-Voltage output interface; 34-Programmable control area; 341-Programmable electronic load; 342-Programmable DC load. Detailed Implementation

[0045] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the embodiments of this application will be further described in detail below with reference to the accompanying drawings and specific examples. It should be understood that the specific embodiments described herein are merely illustrative of the embodiments of this application and are not intended to limit the embodiments of this application.

[0046] In the description of the embodiments of this application, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified. All directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of this application are only used to explain the relative positional relationships and movement of the components in a specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion.

[0047] To make the description of this disclosure more detailed and complete, illustrative descriptions of implementation methods and specific embodiments of the present application are provided below; however, this is not the only form of implementing or utilizing the specific embodiments of the present application. The implementation methods cover features of multiple specific embodiments and methods and steps for constructing and operating these specific embodiments, as well as their order. However, other specific embodiments may also be used to achieve the same or equivalent functions and step sequences.

[0048] Please refer to Figures 1-12 This application proposes a sensor testing platform and system, which solves the problem of how to test sensors in the Y and Z axis directions, thus improving the testing accuracy of sensors; please refer to... Figure 1 The figure shows a schematic diagram of the sensor testing platform provided in the embodiment of this application. The testing system includes a first guide rail assembly 10, a second guide rail assembly 20 and a switching assembly (not shown in the figure) arranged in a cross configuration.

[0049] In the embodiments of this application, please refer to Figure 2 ,for Figure 1The schematic diagram of the structure of the first guide rail assembly 10 in the sensor test platform shown in this application includes a first guide rail 12 and a first driving member 13. A fixed bracket 11 and a first slider 14 that can move along a first direction on the first guide rail 12 are provided on the first guide rail 12.

[0050] Please refer to Figure 3 ,for Figure 1 The schematic diagram of the second guide rail assembly 20 in the sensor test platform shown is shown. The second guide rail assembly 20 includes a second guide rail 21 and a second driving member 22, and a second slider 23 that can move along the second direction on the second guide rail 21 is provided.

[0051] As an optional implementation method, please continue to refer to Figure 1 The first guide rail 12 and the second guide rail 21 provided in this application must satisfy the positional relationship of being intersected. This intersecting relationship can be a vertical intersection or an intersection with an included angle between the first guide rail 12 and the second guide rail 21. The first guide rail 12 and the second guide rail 21 can be set to the same horizontal plane height, or the height of the first guide rail 12 can be set to be slightly higher than the height of the second guide rail 21, or the height of the first guide rail 12 can be set to be slightly lower than the height of the second guide rail 21. However, in principle, the orthographic projections of the first guide rail 12 and the second guide rail 21 must satisfy the positional relationship of being intersected.

[0052] Preferably, the first guide rail 12 is arranged perpendicular to the second guide rail 21, and the height of the second guide rail 21 is slightly higher than the height of the first guide rail 12. Of course, the positions of the first guide rail 12 and the second guide rail 21 can be adjusted according to actual needs, and this application does not impose further restrictions on this.

[0053] Please continue to refer to Figure 2 and Figure 3 In this application, a first belt 18 is provided on the first guide rail 12, and the first drive member 13 drives the first belt 18 to move, which in turn drives the first slider 14 to move horizontally; similarly, in this application, a second belt 28 is provided on the second guide rail 21, and the second drive member 22 drives the second slider 23 to move horizontally.

[0054] Furthermore, this application provides a switching component on both the fixed bracket 11 and the second slider 23. The switching component can switch the sensor to be tested on the fixed bracket 11 and the second slider 23 from the first state to the second state during testing.

[0055] It should be noted that the sensor testing platform provided in this application can be used to test common photoelectric sensors on the market, such as through-beam photoelectric sensors and diffuse reflection photoelectric sensors. Through-beam photoelectric sensors include a transmitter and a receiver, which are set separately. During detection, a target object needs to be placed between the transmitter and the receiver to block the light signal emitted from the transmitter to the receiver. Diffuse reflection photoelectric sensors also include a transmitter and a receiver; however, the transmitter and receiver are usually integrated on the same side. During detection, the light signal emitted by the transmitter is reflected by the target baffle and then acquired by the receiver. Other aspects of the working principles of the above-mentioned through-beam photoelectric sensors and diffuse reflection photoelectric sensors will not be elaborated in detail here.

[0056] Furthermore, this application provides a first limiting member 15 and a second limiting member 16 on the first guide rail 12 to limit the first slider 14, and a first sensing member 17 is provided between the first limiting member 15 and the second limiting member 16 to sense whether the first slider 14 has passed the position of the first sensing member 17; preferably, the first limiting member 15 is disposed close to the fixed bracket 11, the second limiting member 16 is disposed at the end of the first guide rail 12 away from the fixed bracket 11, and the first sensing member 17 is disposed close to the first limiting member 15, because practical During the testing process, the first slider 14 needs to be moved from the end away from the fixed bracket 11 to the position of the fixed bracket 11 at a certain speed. Due to the different performance of the sensors to be tested, a sensing blind zone may occur when approaching the fixed bracket 11. Therefore, this application sets the first limiting member 15 close to the fixed bracket 11, sets the second limiting member 16 at the end of the first guide rail 12 away from the fixed bracket 11, and sets the first sensing member 17 close to the first limiting member 15. Of course, other setting methods are also feasible, and this application does not impose further restrictions on them.

[0057] When actually testing on the first guide rail assembly 10, the sensor to be tested needs to be kept in the first state, and the sensor to be tested is placed on the fixed bracket 11 and the first slider 14 respectively. When the sensor to be tested is a diffuse reflection type photoelectric sensor, the integrated transmitter and receiver need to be placed on the fixed bracket 11, and the target baffle is placed on the first slider 14. When the sensor to be tested is a through-beam type photoelectric sensor, the transmitter and receiver are placed on the fixed bracket 11 and the first slider 14 respectively. Those skilled in the art should know this.

[0058] It is understandable that when the sensor to be detected is a through-beam photoelectric sensor, the transmitting end can be placed on the fixed bracket 11, and the receiving end needs to be placed on the first slider 14. Alternatively, the receiving end can be placed on the fixed bracket 11, and the transmitting end needs to be placed on the first slider 14. In principle, the transmitting end and the receiving end need to meet the relative positional relationship so that the receiving end can receive the light signal emitted by the transmitting end. This application does not impose further restrictions on the specific setting method of the above-mentioned through-beam photoelectric sensor.

[0059] In the embodiments of this application, please refer to Figure 4 ,for Figure 1 The first application embodiment of the sensor testing platform shown in this application enables the effective detection of one-dimensional data of the sensor to be tested by placing the sensor to be tested on the first slider 14 and the fixed bracket 11 of the first guide rail assembly 10.

[0060] Specifically, since a first driving member 13 is provided on the first guide rail assembly 10, the first slider 14 can be driven by the first driving member 13 to move between the first limiting member 15 and the second limiting member 16, thereby detecting the sensing distance, sensing hysteresis and sensing blind zone of the sensor to be detected.

[0061] As an optional implementation, this application provides a third limiting member 24 and a fourth limiting member 25 at both ends of the second guide rail 21 for limiting the second slider 23, a fifth limiting member 26 between the third limiting member 24 and the fourth limiting member 25, and a second sensing member 27 between the third limiting member 24 and the fifth limiting member 26, thereby enabling the sensing of whether the second slider 23 has passed the position of the second sensing member 27.

[0062] Specifically, the fifth limiting member 26 is preferably positioned between the third limiting member 24 and the fourth limiting member 25, and the second sensing member 27 is also preferably positioned between the third limiting member 24 and the fifth limiting member 26. This application does not impose further restrictions on this.

[0063] Please refer to Figure 5 ,for Figure 1 In the second application embodiment of the sensor testing platform shown, when testing the two-dimensional data of the sensor to be tested, it is also necessary to keep the sensor to be tested in the first state and place the sensor to be tested on the fixed bracket 11 and the second slider 23 respectively. When the sensor to be tested is a diffuse reflection type photoelectric sensor, the integrated transmitter and receiver need to be placed on the fixed bracket 11 and the target baffle is placed on the second slider 23. When the sensor to be tested is a through-beam type photoelectric sensor, the transmitter and receiver are placed on the fixed bracket 11 and the second slider 23 respectively.

[0064] Similarly, when the sensor to be detected is a through-beam photoelectric sensor, the transmitting end can be placed on the fixed bracket 11, and the receiving end needs to be placed on the second slider 23. Alternatively, the receiving end can be placed on the fixed bracket 11, and the transmitting end needs to be placed on the second slider 23. In principle, the transmitting end and the receiving end need to meet the relative positional relationship so that the receiving end can receive the light signal emitted by the transmitting end. This application does not further limit the specific setting method of the above-mentioned through-beam photoelectric sensor.

[0065] Specifically, since a second driving member 22 is provided on the second guide rail assembly 20, and a fifth limiting member 26 is provided at the middle position of the third limiting member 24 and the fourth limiting member 25, and since the first guide rail 12 and the second guide rail 21 are intersected, the position of the fifth limiting member 26 should be relative to the position of the fixed bracket 11. In actual testing, the second slider 23 can be placed at the position of the fifth limiting member 26 first, and the second driving member 22 drives the second slider 23 to move towards the third limiting member 24 and the fourth limiting member 25 respectively, starting from the position of the fifth limiting member 26, so as to detect the offset distance of the sensor under test in the Y-axis direction and realize the detection of the two-dimensional data of the sensor under test.

[0066] As an optional implementation, the sensor testing platform provided in this application can also detect the three-dimensional data of the sensor to be tested. Similarly, the sensor to be tested needs to be placed on the fixed bracket 11 and the second slider 23 respectively. Since the fixed bracket 11 and the second slider 23 are both equipped with switching components, the sensor to be tested placed on them needs to be switched from the first state to the second state through the switching components.

[0067] In a specific embodiment provided in this application, the first state is that the transmitting end and the receiving end of the sensor to be tested are both in a vertical state, and the second state is that the transmitting end and the receiving end of the sensor to be tested are both in a horizontal state. In related technologies, in order to detect the three-dimensional data of the sensor to be tested, a telescopic structure needs to be set below the transmitting end and the receiving end of the sensor to be tested. Taking the receiving end as an example, the telescopic structure needs to be used to further control the movement of the receiving end in the Z-axis direction, so as to obtain the offset distance that the sensor to be tested can achieve in the Z-axis direction.

[0068] However, adding a telescopic structure is costly and only allows the receiving end to extend and retract in the direction above the second guide rail 21, not in the direction below the second guide rail 21. Therefore, it is impossible to comprehensively detect the offset distance of the sensor under test in the Z-axis direction. Therefore, based on the position structure of the first guide rail 12 and the second guide rail 21, this application sets a switching component on the fixed bracket 11 and the second slider 23. Through this switching component, the sensor under test can be switched from vertical detection to horizontal detection, and the sensor under test on the fixed bracket 11 and the second slider 23 can be rotated from the vertical state to the horizontal state. This expands the traditional one-dimensional detection parameters of the sensor to three-dimensional detection, which can meet the needs of the sensor for left-right and up-down offset in practical applications, and the test parameters are more complete and accurate.

[0069] It should be noted that the switching component provided in this application can be a rotary cylinder. The piston rod of the rotary cylinder is connected to the clamping mechanism for rotation, which can connect the clamping mechanism to the sensor under test. When the clamping mechanism rotates, it will further drive the sensor under test to switch from a vertical state to a horizontal state. Of course, other mechanical structures can also be used to realize the detection of the sensor under test from the first state to the second state. If necessary, the transmitting end and receiving end of the sensor under test can also be placed in a horizontal state by manual adjustment. All of the above switching methods are feasible. This application does not impose any restrictions on the specific configuration of the switching component.

[0070] Please refer to Figure 6 ,for Figure 1 In the third application embodiment of the sensor testing platform shown, when both the transmitter and receiver of the sensor to be tested are set to a horizontal state, the second slider 23 is driven by the second driving member 22 to move towards the third limiting member 24 and the fourth limiting member 25 respectively, starting from the position of the fifth limiting member 26. This is equivalent to moving the sensor to be tested in the Z-axis direction, thereby testing the offset distance of the sensor to be tested in the Z-axis direction.

[0071] This application eliminates the need for a guide rail in the Z-axis direction. Instead, based on the existing first guide rail 12 and second guide rail 21, a switching component is installed on the fixed bracket 11 and the second slider 23 to switch the sensor under test from a vertical state to a horizontal state. This converts the movement of the sensor under test in the Y-axis direction into movement in the Z-axis direction, effectively saving testing costs and reducing control difficulty.

[0072] In one specific embodiment provided in this application, the first limiting member 15, the second limiting member 16, the third limiting member 24, the fourth limiting member 25, and the fifth limiting member 26 can be configured as slot-shaped photoelectric sensors, the first driving member 13 and the second driving member 22 can be configured as servo motors, and the first sensing member 17 and the second sensing member 27 can be configured as limiting slot-shaped photoelectric sensor sensing members. Of course, other configurations are also feasible, and this application does not impose further restrictions on them.

[0073] Preferably, this application provides a first coupling 19 between the first drive member 13 and the first belt 18, and a second coupling 29 between the second drive member 22 and the second belt 28. The first coupling 19 ensures that the first drive member 13 can drive the first belt 18 to move when it is in motion, and the second coupling 29 ensures that the second drive member 22 can drive the second belt 28 to move when it is in motion, ensuring that they will not disengage during operation. Power is smoothly transmitted to the first belt 18 and the second belt 28, further driving the first slider 14 or the second slider 23 to move as needed. This arrangement can protect the structurally connected parts from damage and improve the stability and service life of the first drive member 13 and the second drive member 22.

[0074] Please refer to Figure 7 ,for Figure 1 The schematic diagram of the control box 3 in the sensor test platform shown in this application indicates that the sensor test platform provided in this application also includes a host computer 1, a control box 3, a test bench 2, and a photoelectric protector 4. It can be observed that the first guide rail assembly 10, the second guide rail assembly 20, and the switching assembly are all set on the test bench 2. The photoelectric protector 4 is set around the test bench 2 to prevent personnel from accidentally entering the test area during formal testing. By setting the photoelectric protector 4, an emergency stop protection can be triggered to stop the test work, avoid injury to the test personnel, and protect the safety of the personnel.

[0075] As an optional implementation, the photoelectric protector 4 can be configured as a safety light curtain or safety light screen. The safety light curtain is composed of a set of transmitters and receivers. The transmitters transmit a set of infrared beams, and the receivers include many photosensors. If a worker enters between the transmitters and receivers, the receivers will not receive a complete signal and will send an emergency stop command to the host computer 1 to stop the test work in time and avoid personal injury.

[0076] Please continue to refer to Figure 7This application has four areas, A, B, C and D, inside the control box 3. Area A is the servo power supply area 31, which specifically includes an air switch 311, a filter 312 and a relay 313. Area B is the servo control area 32, which includes a first servo driver 321 and a second servo driver 322. The first servo driver 321 is used to control the first guide rail assembly 10, and the second servo driver 322 is used to control the second guide rail assembly 20.

[0077] Area C is the lower-level control area 33, used for communication with the upper-level computer 1. It includes an input interface female connector 331, an input interface female connector 332, a four-wire interface 333, a main control chip 334, a sensor signal output interface 335, and a voltage output interface 336. The four-wire interface 333 consists of a 24V interface, a GND interface, an NPN signal line, and a PNP signal line from left to right. This lower-level control area 33 is used to connect the sensor under test, sense the status of the sensor under test and transmit it to the upper-level computer 1, and transmit the instructions sent by the upper-level computer 1 to other devices in the control box 3 to cooperate in completing the detection work.

[0078] Area D is designated as the programmable control area 34, which includes a programmable electronic load 341 and a programmable DC load 342. The programmable electronic load 341 is a highly automated and programmable test device, mainly used to simulate different load conditions to test the output performance, stability, and reliability of power supplies, batteries, chargers, and other DC power supply devices. The programmable DC load 342 is a DC power supply whose output voltage and current can be controlled by a program. It can be precisely controlled and adjusted through a built-in microprocessor, and features programmability, good stability, and high output accuracy. It is widely used in various electronic equipment tests and circuit experiments.

[0079] This application sets up a control box 3 to receive instructions from a host computer 1. The control box 3 is internally encapsulated with a programmable electronic load 341, a programmable DC load 342, a first servo driver 321, a second servo driver 322, and various signal interfaces. This allows the operator to use the control box 3 for testing without opening its interior, thus improving the convenience of testing. This application does not further limit the specific internal structure of the control box 3. The above is only one example of an implementation method, and those skilled in the art should understand it.

[0080] Preferably, the host computer 1, the slave computer, the first servo driver 321, and the second servo driver 322 provided in this application communicate with each other using MODBUS (Modicon Communication Protocol). Of course, the host computer 1 can also communicate directly with the slave computer via USB, and can also indirectly communicate with the programmable electronic load 341 and the programmable DC load 342 through the slave computer bridging.

[0081] As an optional implementation method, please refer to Figure 8 ,for Figure 1 The diagram shows the communication connection between the host computer 1 and the slave computer in the sensor test platform. In this application, the slave computer communicates with the programmable electronic load 341 and the programmable DC load 342 via RS232. At this time, the slave computer plays a forwarding role in the communication between the host computer 1 and the programmable electronic load 341 and the programmable DC load 342, which can reduce the number of serial port connections between the slave computer 1 and the host computer 1.

[0082] Furthermore, this application sets up communication and control between the host computer 1 and the first servo driver 321 and the second servo driver 322 via USB to RS485. One end of the host computer 1 is connected to the first servo driver 321 and the second servo driver 322 via an RJ-45 network interface. The first servo driver 321 and the second servo driver 322 are connected via a double-ended RJ-45 network interface. Through the above communication connection method, the number of serial communication ports connected to the host computer 1 can be reduced to two, and mutual communication between the host computer 1, the slave computer, and the first servo driver 321 and the second servo driver 322 is guaranteed. Of course, other wiring methods are also feasible, and this application does not impose further restrictions on them.

[0083] As an optional implementation method, please refer to Figure 9 ,for Figure 1 The hardware schematic of the signal input interface in the sensor test platform shown is illustrated. This application identifies whether the sensor under test outputs a sensing signal by setting the sensor signal input interface, and obtains the operating current of the sensor under test. It can be observed that interface J33 is set in the hardware schematic. This application connects NPNOUT and PNPOUT to the GPIO pins of the main control chip 334. For NPN type sensors, when the sensor under test does not output, the NPNOUT sensor signal line is pulled high, and the main control chip 334 recognizes it as a high level. When the sensor under test outputs, the NPNOUT sensor signal line outputs 0V, and the main control chip 334 recognizes it as a low level, thereby realizing the detection of whether the NPN type sensor outputs a sensing signal.

[0084] For PNP type, when the sensor under test is not outputting, transistor Q22 is not conducting, while transistor Q23 is conducting. At this time, the PNPOUT sensor signal line is connected to GND, and the main control chip 334 recognizes it as a low level. When the sensor under test is outputting, transistor Q22 is conducting, while transistor Q23 is not conducting. The PNPOUT sensor signal line is pulled up to 5V, and the main control chip 334 recognizes it as a high level, thus realizing the detection of whether the PNP type sensor is outputting sensing. J4 is a digital display DC dual display interface for voltage and current, which can display the current voltage and current consumption in real time, thereby obtaining the operating current of the sensor under test.

[0085] Please refer to Figure 10 ,for Figure 1 The hardware schematic diagram of mode switching in the sensor testing platform shown illustrates how the NPNPNP_Mode_SW and NPNPNP_DCLoad_SW signal lines are connected to the GPIO pins of the main control chip 334. K8 and K6 in the diagram represent relays 313. The level toggling of the NPNPNP_Mode_SW signal line controls relay 313 to switch between NPN and PNP modes according to the type of sensor under test. Similarly, the level toggling of the NPNPNP_DCLoad_SW signal line controls relay 313 to switch between NPN and PNP load connection modes according to the type of sensor under test. For specific wiring instructions for each component, please refer to [reference needed]. Figure 10 This application will not go into further detail here.

[0086] This application also provides a sensor testing system, which includes the sensor testing platform provided above. The sensor testing platform can be used to test one-dimensional data, two-dimensional data and three-dimensional data of the sensor to be tested.

[0087] The one-dimensional data includes one or more of the following: sensing distance, sensing hysteresis, and sensing blind zone; the two-dimensional data includes the offset distance of the sensor under test in the Y-axis direction; and the three-dimensional data includes the offset distance of the sensor under test in the Z-axis direction.

[0088] Please refer to Figure 11 This is a schematic diagram of the structure for detecting one-dimensional data in a sensor testing system. This application takes a diffuse reflection photoelectric sensor as an example. At this time, the transmitting end and receiving end of the diffuse reflection photoelectric sensor are set on the fixed bracket 11, and the target baffle is set on the first slider 14. Both the diffuse reflection photoelectric sensor and the target baffle need to be kept in the first state, that is, vertically set on the first guide rail 12.

[0089] For example, the target baffle can be set as a 200mm*200mm matte black target baffle. Preferably, the light signal emitted by the transmitter is set to be perpendicular to the target baffle. The distance between the target baffle and the diffuse reflection photoelectric sensor can be further detected when the target baffle changes from a light-blocking state to a light-incident state.

[0090] In actual testing, the first slider 14 and the target baffle set on the first slider 14 need to be gradually moved from the position of the second limiting member 16 to the position of the first limiting member 15, so as to... Figure 11 Taking the direction in the middle as an example, the target baffle needs to be moved to the left.

[0091] Furthermore, the sensor to be tested and the target baffle need to be respectively mounted on the fixed bracket 11 and the first slider 14. This application drives the first slider 14 to move along the direction close to the fixed bracket 11. When the sensor to be tested is sensed, the movement stops and the position of the sensing point is output. The position of the sensing point is the position where the sensor to be tested starts to sense, corresponding to sensing point 3 in the figure.

[0092] As an optional implementation, the first slider 14 is driven to continue moving towards the fixed bracket 11. After passing the first sensing element 17, it continues to move towards the fixed bracket 11. If the sensor under test does not disconnect during the movement, it indicates that the sensor under test has no sensing blind zone. The first slider 14 is then driven to move to the first limiting element 15 and stops. The first slider 14 is then driven to move towards the second limiting element 16. When the sensor under test disconnects, the movement stops, and the disconnection point position is output. This disconnection point position is the critical point from near to far, from output to no output, corresponding to... Figure 11 The distance S3 between sensing point 4, sensing point 3 and sensing point 4 is the required sensing hysteresis.

[0093] If the sensor to be tested disconnects during the movement, that is, if the sensor to be tested disconnects during the movement towards the first limiting member 15, it indicates that there is a sensing blind zone of the sensor to be tested. It is necessary to stop the movement and output the location of the disconnection point. The location of the disconnection point corresponds to the sensing point 5 on the right side of the sensing blind zone S2 in the figure. Then, drive the first slider 14 to move to the first limiting member 15 and stop. The distance S2 between the first limiting member 15 and the sensing point 5 is the required sensing blind zone.

[0094] The first slider 14 is driven to move towards the second limiting member 16 again. It stops when the detection device starts sensing and outputs the sensing point position, which corresponds to the aforementioned sensing point 5. By outputting sensing point 5 again, the distance to the sensing blind zone S2 can be checked. Then, the second slider 23 is driven to move towards the second limiting member 16 again. It stops moving when the sensor to be detected disconnects from sensing and outputs the disconnection point position. This disconnection point position is also the critical point where the sensor to be detected moves from near to far, from outputting to not outputting, corresponding to... Figure 11 The distance S3 between sensing point 3 and sensing point 4 is the required sensing hysteresis.

[0095] Understandably, the better the performance of the sensor under test, the shorter or even non-existent the sensing blind zone S2 will be. If the sensor under test has no sensing blind zone, the sensing distance will be... Figure 11 S1 in the figure, and S3 in the figure; if the sensor to be detected has a dead zone, the sensing distance is... Figure 11 In the diagram (S1-S2), the sensing blind zone is S2, and the sensing hysteresis is S3.

[0096] The sensor testing platform provided in this application can detect one-dimensional data of the sensor under test, and test the sensing distance, sensing blind zone and sensing hysteresis of the sensor under test in the X-axis direction, so as to intuitively reflect the performance of the sensor under test.

[0097] As an optional implementation, the aforementioned sensor testing platform can also detect the offset distance of the sensor to be tested on the Y-axis and Z-axis to meet the requirements of the sensor's left-right and up-down offset.

[0098] Please continue to refer to Figure 5 and Figure 6 Taking a through-beam photoelectric sensor as an example, when detecting the two-dimensional data of the sensor to be detected, this application requires that the transmitting end and the receiving end be kept in the first state at the same time, and set on the fixed bracket 11 and the second slider 23 respectively. First, the second slider 23 is set at the position of the fifth limiting member 26. The second slider 23 is moved in the direction close to the third limiting member 24. If the sensing stops during the movement, the point is determined as the first deviation value. The second slider 23 is moved in the direction close to the fifth limiting member 26. If the sensing of the sensor to be detected stops during the movement, the point is determined as the second deviation value. The first deviation value and the second deviation value are the offset distance of the sensor to be detected in the Y-axis direction.

[0099] Of course, a curve can also be plotted with the detection distance as the x-axis and the offset distance in the Y-axis direction as the y-axis, showing the relationship between the detection distance and the offset distance of the sensor under test in the Y-axis direction. Figure 12 The diagram shown illustrates the relationship between detection distance and offset distance in a sensor testing system. This application obtains the offset distance in the Y-axis direction corresponding to different detection distances through testing. All of the above methods are feasible, and this application does not impose any further restrictions on them.

[0100] When detecting the three-dimensional data of the sensor to be tested, the transmitter and receiver need to be set on the fixed bracket 11 and the second slider 23 respectively. The transmitter and receiver are switched from the first state to the second state by the switching component. At this time, the transmitter and receiver are set parallel to the horizontal plane. Similarly, the second slider 23 is set at the position of the fifth limiting member 26. First, the second slider 23 is moved in the direction close to the third limiting member 24. If the sensing stops during the movement, the point is determined as the first deviation value. Continue to move the second slider 23 in the direction close to the fifth limiting member 26. If the sensing of the sensor to be tested stops during the movement, the point is determined as the second deviation value. The first deviation value and the second deviation value are the offset distance of the sensor to be tested in the Z-axis direction.

[0101] Of course, the detection distance can be used as the horizontal axis and the offset distance in the Z-axis direction as the vertical axis to plot the curve between the detection distance and the offset distance of the sensor under test in the Z-axis direction. By testing, the offset distance in the Z-axis direction corresponding to different detection distances can be obtained. Without adding guide rails and telescopic structures in the Z-axis direction, the detection of three-dimensional data of the sensor under test can be realized using the existing second guide rail assembly 20, which reduces the cost and obtains the offset distances in the Y-axis and Z-axis directions corresponding to different detection distances.

[0102] It is understood that although the above process is described using the transmitter and receiver of a through-beam photoelectric sensor as an example, in the actual detection of a diffuse reflection photoelectric sensor, it is only necessary to set the transmitter and receiver of the diffuse reflection photoelectric sensor on the fixed bracket 11 and set the corresponding target baffle on the first slider 14 or the second slider 23. The detection methods are the same, and this application will not elaborate further on this.

[0103] For other details regarding the implementation of the above technical solution in each step of the above sensor testing system, please refer to the description of the sensor testing platform provided in the above application embodiments, which will not be repeated here.

[0104] This application provides a sensor testing platform and system. The sensor to be tested is mounted on a fixed bracket, a first slider, and a second slider as required. When testing is required in the X-axis direction, a first driving component moves the first slider relative to the fixed bracket. When testing is required in the Y-axis direction, a second driving component moves the second slider relative to the fixed bracket. Switching components are provided on both the fixed bracket and the second slider. When testing is required in the Z-axis direction, the switching components switch the sensor to be tested from a first state to a second state, and the second driving component moves the second slider relative to the fixed bracket. This system can meet the requirements of left-right and up-down displacement of the sensor in practical applications. By replacing manual testing with automated testing, testing efficiency is improved, the reliability of test parameters is increased, and accurate evaluation of sensor performance and quality is achieved.

[0105] It is understood that the technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0106] The above embodiments are merely exemplary implementations used to illustrate the principles of the embodiments of this application; however, the embodiments of this application are not limited thereto. For those skilled in the art, various modifications and improvements can be made without departing from the spirit and essence of the embodiments of this application, and these modifications and improvements are also considered to be within the protection scope of the embodiments of this application.

Claims

1. A sensor testing platform, characterized in that, It includes a first guide rail assembly, a second guide rail assembly, and a switching assembly that are arranged in a cross configuration; The first guide rail assembly includes a first guide rail and a first driving member. The first guide rail is provided with a fixed bracket and a first slider that can move along a first direction on the first guide rail. The second guide rail assembly includes a second guide rail and a second driving member, and a second slider is provided on the second guide rail that can move along the second direction on the second guide rail; The switching component is provided on both the fixed bracket and the second slider to switch the sensor to be tested on the fixed bracket and the second slider from the first state to the second state during testing.

2. The sensor testing platform as described in claim 1, characterized in that, The first guide rail is provided with a first limiting member and a second limiting member for limiting the first slider, and a first sensing member is provided between the first limiting member and the second limiting member.

3. The sensor testing platform as described in claim 1, characterized in that, The second guide rail is provided with a third limiting member and a fourth limiting member for limiting the second slider. A fifth limiting member is provided between the third limiting member and the fourth limiting member. A second sensing member is provided between the third limiting member and the fifth limiting member.

4. The sensor testing platform as described in claim 3, characterized in that, The first state is when both the transmitting and receiving ends of the sensor under test are in a vertical position, and the second state is when both the transmitting and receiving ends of the sensor under test are in a horizontal position.

5. The sensor testing platform as described in claim 1, characterized in that, The sensor to be detected is either a through-beam photoelectric sensor or a diffuse reflection photoelectric sensor. When the sensor to be detected is a through-beam photoelectric sensor, the transmitting end and the receiving end of the through-beam photoelectric sensor are respectively disposed on the fixed bracket and the first slider, or respectively disposed on the fixed bracket and the second slider; When the sensor to be detected is a diffuse reflection photoelectric sensor, the diffuse reflection photoelectric sensor and the target baffle are respectively disposed on the fixed bracket and the first slider, or respectively disposed on the fixed bracket and the second slider.

6. The sensor testing platform as described in claim 1, characterized in that, A first belt is provided on the first guide rail, and a first coupling is provided between the first drive component and the first belt; A second belt is provided on the second guide rail, and a second coupling is provided between the second drive component and the second belt.

7. The sensor testing platform as described in claim 1, characterized in that, The sensor testing platform also includes a test bench and photoelectric protectors located around the test bench; The first guide rail assembly, the second guide rail assembly, and the switching assembly are all mounted on the test bench.

8. The sensor testing platform as described in claim 7, characterized in that, The sensor testing platform also includes a control box, which contains a servo control area, including a first servo driver and a second servo driver. The first servo driver is used to control the first guide rail assembly, and the second servo driver is used to control the second guide rail assembly.

9. A sensor testing system, characterized in that, The sensor testing system includes the sensor testing platform as described in any one of claims 1-8; The sensor detection platform is used to detect one-dimensional, two-dimensional, and three-dimensional data from the sensor to be detected.

10. The sensor testing system as described in claim 9, characterized in that, The one-dimensional data includes any one or more of the following: sensing distance, sensing hysteresis, and sensing blind zone. The two-dimensional data includes the offset distance of the sensor to be detected in the Y-axis direction; The three-dimensional data includes the offset distance of the sensor to be detected in the Z-axis direction.

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