Probe assembly and resistor resistance value measuring device comprising same

Abstract

The utility model relates to the technical field of electronic measuring devices, in particular to a probe assembly and a resistor resistance measuring device comprising the probe assembly, which are technically characterized in that the probe assembly comprises a mounting seat, a probe and a cushion block, the probe is fixed on one side of the mounting seat pointing to the cushion block, and the probe is fixed on the other side of the mounting seat pointing to the cushion block. The mounting seat is arranged below the cushion block in a sliding manner along the extension direction of the probe, a guide hole corresponding to the probe is formed in the cushion block, a guide part is arranged in the guide hole, the cross section of the guide part is in a circular truncated cone shape, and the cross section of the guide part is in a circular truncated cone shape. And the area of one side, pointing to the probe, of the guide part is larger than that of one side, deviating from the probe, of the guide part. Through the arrangement of the guide part, the probe is smoothly guided through the guide angle, and the drop point position of the probe is limited. Therefore, in the resistance measurement process, the position of the drop point of the probe can be well controlled, and the measurement precision is ensured.

Description

Technical Field

[0001] This utility model relates to the field of electronic measurement device technology, specifically to a probe assembly and a resistance measurement device including the probe assembly. Background Technology

[0002] In the field of precision electronic component manufacturing, accurate measurement of milliohm-level resistance values ​​is crucial for product quality control. As microelectronic devices evolve towards high-density arrays, probe assemblies must possess high-precision positioning capabilities when simultaneously measuring multiple rows and columns of resistors.

[0003] In the prior art, probe components such as Figure 1 As shown, the device includes a mounting base 1, a probe 2, and a pad 3. A guide hole 31 is provided on the pad 3, which is adapted to the probe 2, allowing the probe 2 to pass through the guide hole 31 and abut against the bottom of the resistor 4. During resistance measurement (two / four-wire resistance measurement), the position of the probe landing point has a significant impact on the measurement accuracy and repeatability, especially when simultaneously measuring multiple rows and columns of micro-resistances (0.1 / 0.2 / 0.5... milliohms). Deviations in probe installation and probe mounting base manufacturing can lead to significant deviations in the probe landing point position, affecting accuracy. Utility Model Content

[0004] Therefore, the purpose of this application is to solve the technical problem that the probe landing point deviation is large in the prior art, which affects the accuracy.

[0005] The above-mentioned technical objective of this utility model is achieved through the following technical solution:

[0006] A probe assembly for holding a resistor to measure its resistance value includes a mounting base, a probe, and a pad. The probe is fixed to the mounting base on the side pointing towards the pad. The mounting base is slidably disposed along the extension direction of the probe towards the mounting base. The pad has a guide hole corresponding to the probe. A guide portion is disposed within the guide hole, located on the side of the guide hole pointing towards the mounting base. The guide portion has a frustum-shaped cross-section, and the area of ​​the guide portion on the side pointing towards the probe is larger than the area of ​​the guide portion away from the probe.

[0007] Preferably, the inner diameter of the guide portion on the side opposite to the probe is larger than the outer diameter of the probe.

[0008] Preferably, the guide hole further includes a positioning hole located on the side of the guide portion away from the mounting base, and the inner diameter of the positioning hole is consistent with the inner diameter of the guide portion on the side away from the probe.

[0009] Preferably, the top of the probe is conical, and the pointed end of the conical top of the probe points away from the side of the mounting base.

[0010] Preferably, the probe is a rigid probe, and the travel of the mounting base is controlled to prevent the probe from protruding from the pad.

[0011] Preferably, the probe is a spring probe, and the tip of the probe is retractable.

[0012] Preferably, the probe assembly is a two-wire resistance measurement probe assembly, the mounting base is rectangular, and there are two probes located on opposite sides of the mounting base along its length. The guide holes on the pad are corresponding to the probes.

[0013] Preferably, the probe assembly is a four-wire resistance measurement probe assembly. The mounting base on the probe assembly is rectangular, and four probes are provided. The four probes are respectively located at the four corners of the mounting base, and the guide holes on the pad are corresponding to the probes.

[0014] Preferably, the probe assembly can also be a multi-row, multi-column probe group, with multiple probes arranged in an array along the length and width directions of the mounting base.

[0015] This application also provides a resistance measuring device, which includes the probe assembly described above.

[0016] Compared with the prior art, this application has the following beneficial effects:

[0017] With the guide section, the probe is smoothly guided by the guide angle, and the probe landing position is defined. This allows for precise control of the probe landing position during resistance measurement, thus ensuring measurement accuracy. The probe assembly provided in this application is ingeniously designed and has the advantages of simple manufacturing and low cost. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the overall structure of a probe assembly in the prior art;

[0019] Figure 2 This is a schematic diagram of the overall structure of a probe assembly according to the present invention;

[0020] Figure 3 This is a schematic diagram of the structure of a two-wire probe assembly in one embodiment of the present invention;

[0021] Figure 4 This is a schematic diagram of a four-wire probe assembly according to one embodiment of the present invention;

[0022] Figure 5 This is a schematic diagram of a multi-wire probe assembly according to one embodiment of the present invention.

[0023] In the diagram, 1 is the mounting base; 2 is the probe; 3 is the pad; 31 is the guide hole; 311 is the guide part; 312 is the positioning hole; and 4 is the resistor. Detailed Implementation

[0024] The present invention will be further described in detail below with reference to the accompanying drawings and embodiments.

[0025] A probe assembly for holding below resistor 4 to measure the resistance value of resistor 4. (See also...) Figure 2 and Figure 3 The probe assembly includes a mounting base 1, a probe 2, and a pad 3. The mounting base 1 is fixedly mounted, and the probe 2 is located on the side of the mounting base 1 pointing towards the pad 3. Both the pad 3 and the mounting base 1 are made of insulating material. In one embodiment, the probe 2 is perpendicular to the mounting base 1, and the mounting base 1 slides towards the pad 3 along the extension direction of the probe 2. The top of the probe 2 is conical, with the conical tip pointing away from the mounting base 1. The probe 2 is a rigid probe, and the movement of the mounting base 2 is controlled to prevent the probe 2 from protruding from the pad 3. In other embodiments, the probe 2 is a spring probe, and the tip of the probe 2 is retractable. The tip of the probe 2 is made of a wear-resistant metal, providing strong piercing capability and reducing contact resistance to ensure accurate and stable measurement.

[0026] Please see Figure 2 and Figure 3 The mounting base 1 can be made of insulating material (non-metallic or insulated material) according to different measurement scenarios to ensure that the probes do not conduct or interfere with each other.

[0027] In one embodiment, the pad 3 is provided with a guide hole 31, which is matched with the probe 2. Please refer to [link to relevant documentation]. Figure 2 and Figure 3A guide portion 311 is provided within the guide hole 31. The guide portion 311 is located on the side of the guide hole 31 pointing towards the mounting base 1. In one embodiment, the guide portion 311 has a frustum-shaped cross-section, and the area of ​​the guide portion 311 on the side pointing towards the probe 2 is larger than the area of ​​the guide portion 311 on the side away from the probe 2. Furthermore, the inner diameter of the guide portion 311 on the side away from the probe 2 is larger than the outer diameter of the probe 2. In one embodiment, the guide hole 31 further includes a positioning hole 312 located on the side of the guide portion 311 away from the mounting base 1, and the inner diameter of the positioning hole 312 is the same as the inner diameter of the guide portion 311 on the side away from the probe 2. In another embodiment, the side of the guide portion 311 away from the mounting base 1 is coplanar with the side of the pad 3 on the side away from the mounting base 1. The thickness of the pad 3 is less than or equal to the length of the probe 2.

[0028] With the guide hole 31, during measurement, the pad 3 moves towards the mounting base 1, and the probe 2 passes through the guide hole 31 until its top is coplanar with the side of the pad 3 facing away from the mounting base 1, thus supporting the resistor 4. In this application, the guide hole 31 significantly reduces and improves the supporting force of the pad 3 on the probe 2 during measurement, preventing the probe 2 from bending. Furthermore, the guide hole 31 allows control over the landing point of the probe 2, ensuring accurate resistance measurement of the resistor 4.

[0029] In one implementation, please refer to Figure 3 The probe assembly is a two-wire resistance measurement probe assembly. The mounting base 1 is rectangular. There are two probes 2, which are located on both sides of the length of the mounting base 1. The guide holes 31 on the pad 3 are corresponding to the probes 2.

[0030] In another implementation, please refer to Figure 4 The probe assembly is a four-wire resistance measurement probe assembly. The mounting base 1 on the probe assembly is rectangular. There are four probes 2, which are located at the four corners of the mounting base 1. The guide hole 31 on the pad 3 is corresponding to the probe 2.

[0031] For other implementations, please refer to Figure 5 The probe assembly can also be a multi-row, multi-column probe group 2, with multiple probes 2 arranged in an array along the length and width directions of the mounting base 1.

[0032] In addition, this application also provides a resistance measurement device including the probe assembly described above, wherein the resistance measurement device is one of a two-wire resistance measurement device, a four-wire resistance measurement device, or a multi-wire resistance measurement device.

[0033] This application provides a probe assembly that, through the setting of the guide portion 311, can effectively control the landing position of the probe 2 during resistance 4 measurement, thereby ensuring measurement accuracy. The probe assembly provided in this application is ingeniously designed and has the advantages of simple manufacturing and low cost. Furthermore, this application is not limited to the use of a single product specification or type, and can be applied to all metal resistors that require adjustment.

Claims

1. A probe assembly for holding a resistor to measure its resistance value, characterized in that: The device includes a mounting base, a probe, and a pad. The probe is fixed to the mounting base on the side pointing towards the pad. The pad is slidably disposed along the extension direction of the probe. The pad has a guide hole corresponding to the probe. A guide portion is disposed in the guide hole and is located on the side of the guide hole pointing towards the mounting base. The guide portion has a frustum-shaped cross-section, and the area of ​​the guide portion on the side pointing towards the probe is larger than the area of ​​the guide portion on the side away from the probe.

2. The probe assembly according to claim 1, characterized in that: The inner diameter of the guide portion on the side opposite to the probe is larger than the outer diameter of the probe.

3. A probe assembly according to claim 2, characterized in that: The guide hole also includes a positioning hole located on the side of the guide portion away from the mounting base, the inner diameter of the positioning hole being the same as the inner diameter of the guide portion on the side away from the probe.

4. A probe assembly according to claim 3, characterized in that: The top of the probe is conical, with the pointed tip of the cone pointing away from the mounting base.

5. A probe assembly according to claim 4, characterized in that: The probe is a rigid probe, and the movement of the mounting base is controlled to prevent the probe from protruding from the pad.

6. A probe assembly according to claim 4, characterized in that: The probe is a spring probe, and the tip of the probe is retractable.

7. A probe assembly according to claim 4, characterized in that: The probe assembly is a two-wire resistance measurement probe assembly. The mounting base is rectangular, and there are two probes located on opposite sides of the mounting base along its length. The guide holes on the pad are corresponding to the probes.

8. A probe assembly according to claim 4, characterized in that: The probe assembly is a four-wire resistance measurement probe assembly. The mounting base on the probe assembly is rectangular, and four probes are provided. The four probes are located at the four corners of the mounting base, and the guide holes on the pad are corresponding to the probes.

9. A probe assembly according to claim 4, characterized in that: The probe assembly can also be a multi-row, multi-column probe group, with multiple probes arranged in an array along the length and width directions of the mounting base.

10. A resistance measuring device, characterized in that: It includes the probe assembly as described in any one of claims 1-9.

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