A special gauge for rapid measurement of chamfers

By designing a special inspection tool and utilizing a combination of measuring guide sleeve, measuring gauge and return spring, the problems of long measurement time and high cost of chamfering of parts were solved, and fast and accurate chamfering inspection and 100% coverage were achieved.

CN224285773UActive Publication Date: 2026-05-26SHANGHAI SINOTEC CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHANGHAI SINOTEC CO LTD
Filing Date
2025-05-08
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

In existing technologies, the waiting time for chamfer measurement results of parts is too long, making it impossible to achieve real-time measurement and 100% inspection, and the cost is high.

Method used

A special inspection tool was designed, including a measuring guide sleeve, a measuring gauge, a return spring, and a reference sleeve. It can quickly determine whether the chamfer meets the quality requirements by measuring the calibration surface, and achieves rapid reset by combining with the return spring, which is convenient for batch inspection.

Benefits of technology

It enables fast and accurate chamfer detection, reduces measurement costs, and allows for instant detection with 100% detection coverage, thereby improving production efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

This utility model relates to a special gauge for rapid chamfer measurement. The gauge includes a measuring guide sleeve with an internal cavity. One end of the measuring guide sleeve has a testing port for inserting the product being inspected. A measuring gauge is located inside the cavity, and a return spring is fitted around the measuring gauge. The other end of the measuring guide sleeve has a reference sleeve, and the end of the measuring gauge has a calibration surface that mates with the reference sleeve. In practice, this utility model enables rapid measurement of chamfers on parts, effectively improving the problem of long waiting times for measurement results. This rapid chamfer measurement gauge is low-cost and highly efficient, allowing for immediate measurement after processing. It can quickly and promptly identify dimensional problems in the product, effectively controlling potential batch quality risks.
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