A special gauge for rapid measurement of chamfers
By designing a special inspection tool and utilizing a combination of measuring guide sleeve, measuring gauge and return spring, the problems of long measurement time and high cost of chamfering of parts were solved, and fast and accurate chamfering inspection and 100% coverage were achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHANGHAI SINOTEC CO LTD
- Filing Date
- 2025-05-08
- Publication Date
- 2026-05-26
AI Technical Summary
In existing technologies, the waiting time for chamfer measurement results of parts is too long, making it impossible to achieve real-time measurement and 100% inspection, and the cost is high.
A special inspection tool was designed, including a measuring guide sleeve, a measuring gauge, a return spring, and a reference sleeve. It can quickly determine whether the chamfer meets the quality requirements by measuring the calibration surface, and achieves rapid reset by combining with the return spring, which is convenient for batch inspection.
It enables fast and accurate chamfer detection, reduces measurement costs, and allows for instant detection with 100% detection coverage, thereby improving production efficiency.
Smart Images

Figure CN224285773U_ABST