A chip test socket

Abstract

This utility model discloses a chip testing socket, including a base, a substrate fixedly connected to the upper surface of one end of the base, a test socket body fixedly connected to the upper surface of the substrate, a detection port fixedly connected to the upper end of the test socket body, a support block provided on one side of the test socket body, support plates symmetrically provided on both sides of the support block, a rotating shaft rotatably connected to the inner surface of the support plate, a base plate on the middle side surface of the rotating shaft, the base plate being fixedly connected to the rotating shaft via a connecting block, cylinders I fixedly connected at the four corners of the base plate, a moving plate fixedly connected to the lower end of cylinders I, an air cylinder fixedly connected inside the moving plate, a suction cup fixedly connected to the lower end of the air cylinder via a buffer structure, and an adjustment mechanism provided at the upper end of the air cylinder. This reduces the inconvenience for operators, improves the efficiency of chip testing, and avoids wear and tear on the chip during testing due to repeated contact with the chip by operators, thereby preventing a decrease in the accuracy of the chip testing results.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically a chip testing socket. Background Technology

[0002] Before being packaged and manufactured, chips must undergo multiple testing procedures to screen out and eliminate defective products, maintain the quality of chip products, and avoid increasing the cost of subsequent product repairs. Chip test sockets are required when testing chips.

[0003] Existing chip test sockets involve placing the chip in the chip placement position of the test socket, then covering the chip placement position with a cover. The chip is clamped between the bottom base and the upper cover, allowing the chip's pins to fully contact the spring-loaded pins and enabling the chip to perform specific functions. However, one end of the cover is usually rotatably located on one side of the chip test socket body. This process requires manual operation and involves many steps, increasing the inconvenience for workers and reducing the efficiency of chip testing. Furthermore, workers will touch the chip multiple times during the testing process, which can cause the chip to move and wear, thus reducing the accuracy of chip testing. Utility Model Content

[0004] To address the shortcomings of existing technologies, this utility model provides a chip testing socket that solves the problem of traditional chip testing sockets requiring manual operation by staff during chip testing. This reduces the inconvenience for staff, improves chip testing efficiency, and avoids wear and tear on the chip caused by repeated contact with the chip, thus preventing a decrease in the accuracy of chip testing results.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a chip test socket, comprising a base, a substrate fixedly connected to the upper surface of one end of the base, and a test socket body fixedly connected to the upper surface of the substrate. A detection port is fixedly connected to the upper end of the test socket body. A support block is provided on one side of the test socket body, and support plates are symmetrically provided on both sides of the support block. A rotating shaft is rotatably connected to the inner surface of the support plate, and a base plate is located on the middle side surface of the rotating shaft. The base plate is fixedly connected to the rotating shaft via a connecting block, and cylinders I are fixedly connected to the four corners of the base plate. A moving plate is fixedly connected to the lower end of cylinder I. An air cylinder is fixedly connected inside the moving plate, and a suction cup is fixedly connected to the lower end of the air cylinder via a buffer structure. An adjustment mechanism is provided at the upper end of the air cylinder, and an air outlet is opened at the upper end of the air cylinder. A piston plate is slidably connected inside the air cylinder, and a sealing block is fixedly connected to the upper surface of the piston plate, with the sealing block aligned with the air outlet.

[0006] Preferably, the buffer structure includes an air guide tube, and the side surface of the air guide tube is slidably connected to the lower end of the air cylinder. The lower end of the air guide tube is fixedly connected to the upper end of the suction cup, and the suction cup and the air guide tube are in communication with each other. A spring II is sleeved on the side surface of the air guide tube, and the two ends of the spring II are fixedly connected to the lower surface of the air cylinder and the upper surface of the suction cup, respectively.

[0007] Preferably, a pressure rod is provided on the outside of the air outlet, and the pressure rod is slidably connected to the upper end of the air cylinder. A pressure plate is fixedly connected to the upper end of the pressure rod, and a spring I is fixedly connected to the lower surface of the pressure plate. The lower end of the spring I is fixedly connected to the upper end of the air cylinder.

[0008] Preferably, the adjustment mechanism includes a side plate, and a cylinder II is fixedly connected to one side surface of the side plate. A wedge block is fixedly connected to one end of the cylinder II, and the wedge block corresponds to the pressure plate.

[0009] Preferably, the flipping mechanism includes a half gear, which is fixedly installed at both ends of the rotating shaft. The side surface of the half gear is meshed with a rack, and the lower surface of the rack is fixedly connected to the upper surface of the support block through a support frame.

[0010] Preferably, the upper surface of the base is symmetrically and fixedly connected with a sliding groove, and a moving block is slidably connected inside the sliding groove. The upper surface of the moving block is fixedly connected to the lower end of the support plate, and a lead screw is threadedly connected inside the moving block. One end of the lead screw is rotatably connected to the inside of the sliding groove, and the other end of the lead screw passes through the sliding groove and is fixedly connected to a servo motor.

[0011] Preferably, damping rings are fitted on both ends of the rotating shaft, and one side of the damping ring is fixedly connected to the inner side of the support plate.

[0012] This invention provides a chip test socket. Compared with the prior art, it has the following advantages:

[0013] The rotating shaft, which is rotatably connected to the inner surface of the support plate, and the rack, which is connected to the two ends of the rotating shaft by half-gear meshing, and the moving plate, which is connected to the rotating shaft by the base plate, and the suction cup, which is connected to the inside of the moving plate by an air cylinder, work together to solve the problem that traditional chip testing sockets require manual operation by staff during chip testing. This reduces the trouble for staff, improves the efficiency of chip testing, and avoids wear and tear on the chip caused by repeated contact with the chip by staff during the testing process, thus preventing a decrease in the accuracy of chip testing results. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the structure of this utility model;

[0015] Figure 2 This is a side view of the structure of this utility model;

[0016] Figure 3 This is a schematic diagram of the structure of the movable plate in this utility model;

[0017] Figure 4 Figure 3 A schematic diagram of the structure viewed from below;

[0018] Figure 5 This is a schematic diagram of the internal structure of the air cylinder in this utility model.

[0019] In the diagram: 1. Base; 101. Servo motor; 102. Slide groove; 103. Lead screw; 104. Moving block; 105. Support plate; 106. Damping ring; 108. Rotating shaft; 109. Half gear; 2. Base plate; 201. Detection port; 202. Test seat body; 3. Support block; 301. Rack; 302. Support frame; 4. Base plate; 401. Cylinder I; 402. Moving plate; 403. Air cylinder; 4031. Pressure rod; 4032. Spring I; 4033. Air outlet; 4034. Piston plate; 4035. Sealing block; 404. Pressure plate; 405. Wedge block; 406. Side plate; 407. Cylinder II; 408. Suction cup; 409. Spring II; 4010. Air guide pipe. Detailed Implementation

[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0021] Please see Figure 1-5This utility model provides a technical solution: a chip test socket, including a base 1, a substrate 2 fixedly connected to the upper surface of one end of the base 1, a test socket body 202 fixedly connected to the upper surface of the substrate 2, a detection port 201 fixedly connected to the upper end of the test socket body 202, a support block 3 provided on one side of the test socket body 202, support plates 105 symmetrically provided on both sides of the support block 3, a rotating shaft 108 rotatably connected to the inner surface of the support plate 105, a flipping mechanism provided on both end surfaces of the 108, and a bottom plate 4 on the middle surface of the rotating shaft 108, the bottom plate 4 being connected to the rotating shaft 108 via a connecting block. A rotating shaft 108 is fixedly connected. Cylinder I 401 is fixedly connected to the four corners of the base plate 4. A moving plate 402 is fixedly connected to the lower end of cylinder I 401. An air cylinder 403 is fixedly connected inside the moving plate 402. A suction cup 408 is fixedly connected to the lower end of the air cylinder 403 through a buffer structure. An adjustment mechanism is provided at the upper end of the air cylinder 403. An air outlet 4033 is opened at the upper end of the air cylinder 403. A piston plate 4034 is slidably connected inside the air cylinder 403. A sealing block 4035 is fixedly connected to the upper surface of the piston plate 4034. The sealing block 4035 is aligned with the air outlet 4033.

[0022] As a technical optimization of this utility model, the buffer structure includes an air guide tube 4010. The side surface of the air guide tube 4010 is slidably connected to the lower end of the air cylinder 403. The lower end of the air guide tube 4010 is fixedly connected to the upper end of the suction cup 408. The suction cup 408 and the air guide tube 4010 are interconnected. A spring II 409 is sleeved on the side surface of the air guide tube 4010. The two ends of the spring II 409 are fixedly connected to the lower surface of the air cylinder 403 and the upper surface of the suction cup 408, respectively. The spring II 409 can buffer the impact force on the chip when pressing down to adsorb the chip, so as to avoid damage to the chip.

[0023] As a technical optimization of this utility model, a pressure rod 4031 is provided on the outside of the air outlet 4033. The pressure rod 4031 is slidably connected to the upper end of the air cylinder 403. A pressure plate 404 is fixedly connected to the upper end of the pressure rod 4031. A spring I 4032 is fixedly connected to the lower surface of the pressure plate 404. The lower end of the spring I 4032 is fixedly connected to the upper end of the air cylinder 403. The adjustment mechanism includes a side plate 406. A cylinder II 407 is fixedly connected to one side surface of the side plate 406. A wedge block 405 is fixedly connected to one end of the cylinder II 407. The wedge block 405 corresponds to the pressure plate 404. Through the cooperation of the adjustment mechanism and the pressure plate 404 and the pressure rod 4031, the suction cup 408 can be released from adsorption of the chip, making it convenient to remove the chip after testing.

[0024] As a technical optimization of this utility model, the flipping mechanism includes a half gear 109, which is fixedly installed at both ends of the rotating shaft 108. The side surface of the half gear 109 is meshed with a rack 301. The lower surface of the rack 301 is fixedly connected to the upper surface of the support block 3 through a support frame 302, which can adjust and flip the base plate 4, thus making it convenient for staff to pick up the chip when testing the chip.

[0025] As a technical optimization of this utility model, the upper surface of the base 1 is symmetrically and fixedly connected with a sliding groove 102, and a moving block 104 is slidably connected inside the sliding groove 102. The upper surface of the moving block 104 is fixedly connected to the lower end of the support plate 105. A lead screw 103 is threadedly connected inside the moving block 104. One end of the lead screw 103 is rotatably connected to the inside of the sliding groove 102, and the other end of the lead screw 103 passes through the sliding groove 102 and is fixedly connected to a servo motor 101, which can move the support plate 105 and the base plate 4, so as to facilitate the transfer of the chip to the detection port 201 for detection.

[0026] As a technical optimization of this utility model, damping rings 106 are sleeved on both ends of the rotating shaft 108. One side surface of the damping ring 106 is fixedly connected to the inner side surface of the support plate 105. The damping ring 106 can limit the rotating shaft 108 and prevent the rotating shaft 108 from rotating on its own after being subjected to the gravity of the base plate 4.

[0027] In use, the servo motor 101 is first started, which drives the lead screw 103 to move the support plate 105. When the support plate 105 moves the base plate 4 towards the support block 3, the rotating shaft 108 rotates 180 degrees through the half gear 109 and rack 301. At this time, the base plate 4 will flip upward and move to the chip unloading position. Then, the cylinder I 401 inside the base plate 4 is started to push the moving plate 402 close to the chip to be tested. At this time, the suction cup 408 connected to the lower end of the air cylinder 403 through the buffer mechanism will be squeezed. Then, the gas inside the suction cup 408 will push the piston plate 4034 inside the air cylinder 403 upward. After that, the piston plate 4034 moves to the upper end of the air cylinder 403 and blocks the air outlet 4033 through the sealing block 4035. At this time, the suction cup 408 will pick up the chip. Then, the servo motor 101 is started to rotate in the opposite direction, so that the support plate 105 will move the base plate 4 towards the support block 3. The test holder body 202 moves, at which point the rotating shaft 108 will pass the rack 301 again, while the base plate 4 and the moving plate 402 will rotate downwards in the opposite direction to face the upper surface of the support block 3 and the substrate 2. After the rotating shaft 108 passes the rack 301, the rotating shaft 108 will not rotate, and then the base plate 4 will move horizontally above the detection port 201. Then, the cylinder I 401 is activated to push the moving plate 402 toward the detection port 201. At this time, the chip adsorbed by the suction cup 408 will fall onto the detection port 201, and then the test holder body 202 will test the chip. After the test is completed, the chip is retrieved and the above operation is repeated to move the base plate 4 toward the support block 3. At this time, the base plate 4 rotates upwards again, and at the same time, the cylinder II 407 in the adjustment mechanism is activated. The cylinder II 407 squeezes the pressure plate 404, causing air to enter the air cylinder 403. Therefore, the piston plate 4034 will move toward the lower end of the air cylinder 403 to release the adsorption of the chip by the suction cup 408. Then, the operator removes the chip.

[0028] Furthermore, any content not described in detail in this specification is existing technology known to those skilled in the art.

[0029] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, the phrase "comprising an element defined as..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0030] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A chip test socket, comprising a base (1), characterized in that: A base plate (2) is fixedly connected to the upper surface of one end of the base (1), and a test seat body (202) is fixedly connected to the upper surface of the base plate (2). A test port (201) is fixedly connected to the upper end of the test seat body (202). A support block (3) is provided on one side of the test seat body (202), and support plates (105) are symmetrically provided on both sides of the support block (3). A rotating shaft (108) is rotatably connected to the inner surface of the support plate (105), and a bottom plate (4) is located on the middle side surface of the rotating shaft (108). The bottom plate (4) is fixedly connected to the rotating shaft (108) through a connecting block, and the four corners of the bottom plate (4) are fixedly connected to... There is a cylinder I (401), and a moving plate (402) is fixedly connected to the lower end of the cylinder I (401). An air cylinder (403) is fixedly connected inside the moving plate (402), and a suction cup (408) is fixedly connected to the lower end of the air cylinder (403) through a buffer structure. An adjustment mechanism is provided at the upper end of the air cylinder (403), and an air outlet (4033) is opened at the upper end of the air cylinder (403). A piston plate (4034) is slidably connected inside the air cylinder (403), and a sealing block (4035) is fixedly connected to the upper surface of the piston plate (4034). The sealing block (4035) is aligned with the air outlet (4033).

2. A chip test socket according to claim 1, characterized in that: The buffer structure includes an air guide tube (4010), and the side surface of the air guide tube (4010) is slidably connected to the lower end of the air cylinder (403). The lower end of the air guide tube (4010) is fixedly connected to the upper end of the suction cup (408), and the suction cup (408) and the air guide tube (4010) are interconnected. A spring II (409) is sleeved on the side surface of the air guide tube (4010), and the two ends of the spring II (409) are fixedly connected to the lower surface of the air cylinder (403) and the upper surface of the suction cup (408), respectively.

3. A chip test socket according to claim 1, characterized in that: A pressure rod (4031) is provided on the outside of the air outlet (4033), and the pressure rod (4031) is slidably connected to the upper end of the air cylinder (403). A pressure plate (404) is fixedly connected to the upper end of the pressure rod (4031), and a spring I (4032) is fixedly connected to the lower surface of the pressure plate (404). The lower end of the spring I (4032) is fixedly connected to the upper end of the air cylinder (403).

4. A chip test socket according to claim 1, characterized in that: The adjustment mechanism includes a side plate (406), and a cylinder II (407) is fixedly connected to one side surface of the side plate (406). A wedge block (405) is fixedly connected to one end of the cylinder II (407), and the wedge block (405) corresponds to the pressure plate (404).

5. A chip test socket according to claim 1, characterized in that: The flipping mechanism includes a half gear (109), and the half gear (109) is fixedly installed at both ends of the rotating shaft (108). The side surface of the half gear (109) is meshed with a rack (301), and the lower surface of the rack (301) is fixedly connected to the upper surface of the support block (3) through a support frame (302).

6. A chip test socket according to claim 1, characterized in that: The upper surface of the base (1) is symmetrically fixedly connected with a sliding groove (102), and a moving block (104) is slidably connected inside the sliding groove (102). The upper surface of the moving block (104) is fixedly connected to the lower end of the support plate (105), and a lead screw (103) is threadedly connected inside the moving block (104). One end of the lead screw (103) is rotatably connected to the inside of the sliding groove (102), and the other end of the lead screw (103) passes through the sliding groove (102) and is fixedly connected to a servo motor (101).

7. A chip test socket according to claim 1, characterized in that: Damping rings (106) are fitted on both ends of the rotating shaft (108), and one side of the damping ring (106) is fixedly connected to the inner side of the support plate (105).

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