A semiconductor component production inspection device

CN224340971UActive Publication Date: 2026-06-09WUXI BALANCE TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
WUXI BALANCE TECH CO LTD
Filing Date
2025-04-24
Publication Date
2026-06-09

AI Technical Summary

Technical Problem

Existing testing equipment for semiconductor component production is difficult to adapt to the testing needs of semiconductors of different thicknesses, resulting in inaccurate or no testing, which limits the applicability of the testing equipment.

Method used

The device employs a combination design of components such as a base, guide plate, moving plate, lead screw, torsion block, data transmitter, and electric actuator. The detection height is adjusted by the cooperation of the lead screw and moving plate, and the rotation of the detection component is controlled by the cooperation of the connecting tube and electric actuator, thus achieving accurate detection of semiconductors of different thicknesses.

Benefits of technology

This improves the applicability and accuracy of the detection device, adapts to the detection of semiconductors of different thicknesses, and enhances the detection effect of semiconductors.

✦ Generated by Eureka AI based on patent content.

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Abstract

This utility model discloses a testing device for semiconductor component production, relating to the technical field of semiconductor component testing equipment. It includes a base with an L-shaped guide plate at its lower end, and the base is mounted on the inner bottom surface of the guide plate. The top surface of the base holds the semiconductor to be tested, and a testing component is located at the upper end of the base. In this utility model, the cooperation of a lead screw and a moving plate facilitates adjustment of the testing height, thereby adapting to semiconductors of different thicknesses and improving the semiconductor testing range. The cooperation of a connecting tube and an electric actuator facilitates control of the rotation of the testing component, thereby improving the fan-shaped testing range of the device. The cooperation of the connecting tube and the moving plate facilitates the rotation of the connecting tube in a fan-shaped area, thereby facilitating accurate semiconductor testing and improving the semiconductor testing effect.
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