A PCB test probe anti-offset fixture
By using the threaded fit between guide plates, cylinder drive, and guide block vibration reduction structure, the offset problem of PCB test probes during multi-point testing is solved, achieving stable probe fixation and efficient testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- HUIKEN TECH CO LTD
- Filing Date
- 2025-07-22
- Publication Date
- 2026-06-09
AI Technical Summary
Existing PCB test probes are difficult to fix stably when testing at multiple test points, and are prone to displacement and shaking, which affects test accuracy and reliability.
The probe sleeve is fixed by threaded connection between guide plates, combined with the structure of cylinder, guide column and pressure plate. Vibration is damped by guide block and silicone ring, and the probe is fixed by spring and limit block to ensure the stability of the probe during the test.
It effectively prevents probe deviation and shaking during the testing process, improving the stability and accuracy of the test, and supporting fast, reliable PCB loading/unloading and repeat testing.
Smart Images

Figure CN224341633U_ABST