Detection mechanism and electronic device
By working in tandem with the rotating support assembly and the electrode structure, the state changes of the electronic device under test are accurately detected, solving the problems of easy bypassing and failure of electronic anti-theft switches in extreme environments in the existing technology, and realizing high-precision and low-cost security testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- LCFC HEFEI ELECTRONICS TECH
- Filing Date
- 2025-05-07
- Publication Date
- 2026-06-09
AI Technical Summary
In existing electronic device security designs, electronic anti-theft switches are easily bypassed and prone to failure in extreme environments, resulting in decreased security and increased manufacturing costs.
By employing the coordinated operation of the rotating support assembly and the electrode structure, the rotating support assembly is driven to rotate by the tension of the test piece, and the electrode structure is connected or disconnected from the detection area, thus accurately detecting changes in the state of the test piece.
It improves detection accuracy, reduces production and manufacturing costs, enhances equipment stability and compatibility, and simplifies installation and maintenance processes.
Smart Images
Figure CN224341882U_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to the field of electronic equipment security protection technology, and in particular to a testing institution and electronic equipment. Background Technology
[0002] Current electronic device security designs typically employ electronic anti-theft switches, relying on the physical pressing of the back cover to activate the circuit. The system then determines the open / closed state of the back cover based on the circuit's continuity. However, this method is easily bypassed by tools such as cards; for example, pressing the anti-theft switch with a card can evade the system's detection, leading to security failure. In high or low temperature environments, the contacts of the anti-theft switch are prone to oxidation or deformation, causing false alarms or malfunctions. Furthermore, this method requires additional adhesive reinforcement and a protective film, increasing manufacturing costs. Utility Model Content
[0003] This disclosure provides a testing mechanism and electronic equipment to at least solve the above-mentioned technical problems existing in the prior art.
[0004] A first aspect of this disclosure provides a testing mechanism, including a testing element, a rotating support assembly, and an electrode structure; wherein...
[0005] The rotating support assembly is disposed on the side of the test piece and is rotatable relative to the test piece. The rotating support assembly is configured to rotate under the tension of the test piece.
[0006] The electrode structure is disposed on the rotating support assembly and moves with the rotation of the rotating support assembly, for communicating or disconnecting with the detection area of the detection element;
[0007] The detection element responds to the connection between the electrode structure and the detection area by feeding back a first response signal; the detection element responds to the disconnection between the electrode structure and the detection area by feeding back a second response signal.
[0008] In one embodiment, the rotating support assembly includes a fixed support and a first support, the first support being connected to the fixed support and capable of rotating relative to the detection element, the first support being disposed on the side of the detection element via the fixed support, and the electrode structure being disposed on the side of the first support close to the detection element.
[0009] In one embodiment, the first support has a normal state and a tilted state relative to the detection element. When the first support is in the normal state, the electrode structure is connected to the detection area; when the first support is in the tilted state, the electrode structure is disconnected from the detection area.
[0010] In one embodiment, the rotating support assembly further includes a second support, the first support being connected to the fixed support via the second support, one end of the second support being rotatably connected to the fixed support, and the other end of the second support being rotatably connected to the first support.
[0011] In one embodiment, the second bracket is provided with a clearance groove to avoid the electrode structure.
[0012] In one embodiment, the second bracket is provided with a locking part for engaging with the detection piece.
[0013] In one embodiment, the second bracket has a first position and a second position relative to the fixed bracket. When the second bracket is in the first position, the second bracket is in contact with the detection element; when the second bracket is in the second position, the second bracket is separated from the detection element.
[0014] In one embodiment, the first bracket has a fastened state and a disengaged state relative to the second bracket. When the second bracket is in a first position and the first bracket is in the fastened state, the electrode structure is connected to the detection area; when the second bracket is in the first position and the first bracket is in the disengaged state, the electrode structure is disconnected from the detection area.
[0015] A second aspect of this disclosure provides an electronic device including a device under test (DUT) and a detection mechanism as described in any of the above embodiments, wherein the DUT is connected to the rotating support assembly.
[0016] In one embodiment, the test piece is provided with a hook structure, which engages with the rotating support assembly.
[0017] In this disclosure, the testing mechanism, through the coordinated operation of the rotating support assembly and the electrode structure, can accurately detect minute changes in the state of the test piece, greatly improving the accuracy of the testing. The testing mechanism eliminates complex mechanical and electronic components and adopts a simple mating structure, reducing production and manufacturing costs, making installation and maintenance more convenient, and improving the overall stability of the equipment.
[0018] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this disclosure, nor is it intended to limit the scope of this disclosure. Other features of this disclosure will become readily apparent from the following description. Attached Figure Description
[0019] The above and other objects, features, and advantages of this disclosure will become readily apparent from the following detailed description of exemplary embodiments, taken in conjunction with the accompanying drawings. Several embodiments of this disclosure are illustrated in the drawings by way of example and not limitation, in which:
[0020] In the accompanying drawings, the same or corresponding reference numerals indicate the same or corresponding parts.
[0021] Figure 1 A schematic diagram of the overall structure of a detection mechanism according to an exemplary embodiment of this disclosure is shown;
[0022] Figure 2 An exploded view of a detection mechanism according to an exemplary embodiment of this disclosure is shown;
[0023] Figure 3 An application scenario diagram of a testing mechanism according to an exemplary embodiment of this disclosure is shown;
[0024] Figure 4 This diagram illustrates a schematic representation of the electrode structure of a detection mechanism in an exemplary embodiment of the present disclosure when it is connected to the detection area.
[0025] Figure 5 A cross-sectional view of the electrode structure of a detection mechanism in an exemplary embodiment of this disclosure is shown when it is connected to the detection area.
[0026] Figure 6 A cross-sectional view of the detection mechanism of an exemplary embodiment of this disclosure is shown when the electrode structure is disconnected from the detection area.
[0027] Figure 7 This diagram illustrates the structure of a detection mechanism in an exemplary embodiment of the present disclosure when the first support is separated from the second support.
[0028] Figure 8 A schematic diagram of the structure of the detection mechanism in an exemplary embodiment of the present disclosure is shown when the second support is in a second position relative to the fixed support.
[0029] The following are the labels in the diagram: 1. Test piece; 2. Rotating support assembly; 3. Electrode structure; 4. Test piece; 5. Receiving groove; 6. Screw; 11. Test area; 21. Fixed support; 22. First support; 23. Second support; 41. Hook structure; 42. Abutment part; 211. Fixing part; 212. Bearing part; 221. Rotating shaft; 231. Clearance groove; 232. Engaging part; 233. Shaft hole. Detailed Implementation
[0030] To make the objectives, features, and advantages of this disclosure more apparent and understandable, the technical solutions in the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this disclosure, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this disclosure without creative effort are within the scope of protection of this disclosure.
[0031] The embodiments of this disclosure will now be described in detail with reference to the accompanying drawings.
[0032] Reference Figures 1-4 As shown, this disclosure discloses a detection mechanism in an exemplary embodiment, including a detection element 1, a rotating support assembly 2, and an electrode structure 3. The rotating support assembly 2 is disposed beside the detection element 1 and is rotatable relative to it. The rotating support assembly 2 is configured to rotate under the tension of the test element 4. The electrode structure 3 is disposed on the rotating support assembly 2 and moves with the rotation of the rotating support assembly 2, for communicating or disconnecting with the detection area 11 of the detection element 1. The detection element 1 responds to the electrode structure 3 communicating with the detection area 11 by feeding back a first response signal; the detection element 1 responds to the electrode structure 3 disconnecting from the detection area 11 by feeding back a second response signal.
[0033] In this embodiment, the test piece 4 can be the back cover or casing of an electronic product, such as the back cover of a learning machine, a laptop computer, a tablet computer, an industrial control computer cabinet door, or a smartphone. In the embodiments disclosed herein, the test piece 4 is taken as a laptop computer back cover. Accordingly, the test piece 4 has two states: open and closed. When the test piece 4 is open or closed, the tension generated by a specific structure on the test piece 4 is transmitted to the rotating support assembly 2, causing it to rotate relative to the test piece 1. This converts the physical action of the test piece 4 into the rotational power of the rotating support assembly 2, providing a basis for the subsequent action of the electrode structure 3. The electrode structure 3 is mounted on the rotating support assembly 2, either riveted to or welded to it. It moves synchronously with the rotation of the rotating support assembly 2, and its key function is to connect or disconnect with the detection area 11 of the test piece 1. For example, when the device under test (DUT) 4 is closed, it presses against the rotating support assembly 2. The electrode structure 3, driven by the rotating support assembly 2, makes close contact with the detection area 11 of the detection device 1, forming a connected state. At this time, current or signals can pass smoothly. When the state of the DUT 4 changes, for example, when the DUT 4 is opened, the rotating support assembly 2 is driven to rotate by tension, and the electrode structure 3 moves accordingly, gradually separating from the detection area 11, eventually achieving disconnection. The detection device 1 has a feedback function. When it senses that the electrode structure 3 is connected to the detection area 11, it will feed back a first response signal to inform the electronic product that the DUT 4 is currently in a normal state. When it senses that the electrode structure 3 is disconnected from the detection area 11, it will feed back a second response signal to indicate that the electronic product is currently in an abnormal state. The first and second response signals can be electrical signals, optical signals, or other forms of signals. For example, in a laptop system, the first response signal can enable the system to determine that the back cover is closed and the laptop is in a safe operating environment; conversely, when the detection element 1 detects that the electrode structure 3 is disconnected from the detection area 11, it feeds back a second response signal, indicating that the state of the device under test 4 has changed abnormally and the laptop back cover has been opened.
[0034] It is understood that the detection component 1 may specifically include a feedback module or a motherboard. If the detection component 1 includes a feedback module, the feedback module may integrate output components including but not limited to a buzzer, a speaker, or an indicator light. When an abnormality is detected in the test component 4, the feedback module will generate a second response signal. The second response signal is expressed in the form of a buzzer, an alarm, or a flashing light. That is, the second response signal visually prompts the user that there is an abnormality in the test component 4 in the form of sound or optics. If the test component 1 includes a motherboard, when the test component 4 is in a normal state, the test component 4 does not exert any pulling force on the rotating bracket assembly 2, or the pulling force of the test component 4 on the rotating bracket assembly 2 is very small and insufficient to disconnect the electrode structure 3 from the detection area 11. The rotating bracket assembly 2 remains stationary, the electrode structure 3 contacts the detection area 11 of the test component 1, the circuit forms a closed loop, and the motherboard feeds back a first response signal to the device system. The device system determines that the test component 4 is in a normal state and continues to operate normally. When the state of the test component 4 changes, the pulling force generated by the test component 4 drives the rotating bracket assembly 2 to rotate. As the rotating bracket assembly 2 rotates, the electrode structure 3 installed on it gradually moves away from the detection area 11 of the test component 1 until the electrode structure 3 is disconnected from the detection area 11, the circuit forms an open circuit, and the motherboard feeds back a second response signal to the device system. After receiving the signal, the device system immediately starts the response processing program, such as issuing a pop-up reminder to the user or recording the back cover opening event.
[0035] In summary, the testing mechanism disclosed herein, through the coordinated operation of the rotating support assembly 2 and the electrode structure 3, can accurately detect minute changes in the state of the test piece 4, greatly improving the accuracy of the testing. The testing mechanism eliminates complex mechanical and electronic components, adopts a simple mating structure, reduces production and manufacturing costs, and makes installation and maintenance more convenient, thereby improving the overall stability of the equipment.
[0036] In one embodiment, the rotating support assembly 2 includes a fixed support 21 and a first support 22. The first support 22 is connected to the fixed support 21 and can rotate relative to the detection element 1. The first support 22 is disposed on the side of the detection element 1 via the fixed support 21, and the electrode structure 3 is disposed on the side of the first support 22 close to the detection element 1.
[0037] In this embodiment, the fixing bracket 21 is disposed at the opening and closing point of the test piece 1 near the test piece 4. A receiving groove 5 for engaging the fixing bracket 21 is correspondingly disposed on the side of the test piece 1. The fixing bracket 21 provides stable support, ensuring the stability and accuracy of the first bracket 22 during rotation. The fixing bracket 21 includes a fixing part 211 and a supporting part 212 that are perpendicular to each other. The fixing part 211 is engaged within the receiving groove 5, and the supporting part 212 supports the first bracket 22. This connection method allows the first bracket 22 to rotate smoothly around the connection point with the fixing bracket 21 in the direction of the tension force on the test piece 4 when driven by the tension force of the test piece 4, avoiding wobbling or displacement, thereby ensuring the accurate movement trajectory of the electrode structure 3 and improving the reliability of the detection.
[0038] Specifically, in one embodiment, the first support 22 has a normal state and a tilted state relative to the detection element 1. When the first support 22 is in the normal state, the electrode structure 3 is connected to the detection area 11; when the first support 22 is in the tilted state, the electrode structure 3 is disconnected from the detection area 11.
[0039] In this embodiment, when the first support 22 is in the normal state, the electrode structure 3 is connected to the detection area 11. At this time, the test piece 4 does not exert a pulling force on the first support 22 sufficient to cause it to tilt, and the first support 22 remains in the normal state. To ensure stable connection between the electrode structure 3 and the detection area 11, the test piece 4 is also provided with an abutment portion 42, which applies force to the first support 22 to make it tightly contact the detection area 11, forming a conductive circuit. After the detection piece 1 detects this connection state, it feeds back a first response signal to the equipment system, and the equipment system determines that the test piece 4 is in the normal state. When the first support 22 is in the tilted state, the electrode structure 3 is disconnected from the detection area 11. At this time, the pulling force generated by the test piece 4 is transmitted to the first support 22. Under the action of the pulling force, the first support 22 tilts upward around the connection point with the fixed support 21, changing from the normal state to the tilted state. The electrode structure 3 also leaves the detection area 11, the connection between the two is broken, and the detection circuit is cut off. After detecting this disconnection state, the detection component 1 sends a second response signal to the equipment system, which then determines that the device under test 4 is in an abnormal state. Understandably, through the coordinated design of the various components, the electrode structure 3 can be triggered to disconnect when the opening angle of the device under test 4 is 5°, greatly improving the sensitivity of the safety protection.
[0040] Reference Figure 2 As shown, in one embodiment, the rotating bracket assembly 2 further includes a second bracket 23. The first bracket 22 is connected to the fixed bracket 21 through the second bracket 23. One end of the second bracket 23 is rotatably connected to the fixed bracket 21, and the other end of the second bracket 23 is rotatably connected to the first bracket 22.
[0041] In this embodiment, the second bracket 23 is provided with a shaft hole 233, and a rotating shaft 221 is provided at a corresponding position on the first bracket 22. The rotating shaft 221 cooperates with the shaft hole 233, allowing the first bracket 22 to rotate relative to the second bracket 23. The second bracket 23 is rotatably connected to the fixed bracket 21 by means including but not limited to pins, screws 6, or pins, and can drive the first bracket 22 to rotate synchronously relative to the fixed bracket 21. Taking the positions of the fixed bracket 21, the first bracket 22, and the second bracket 23 when the electrode structure 3 and the detection area 11 are connected as a reference, the direction in which the second bracket 23 rotates relative to the fixed bracket 21 in a direction away from the detection element 1 is defined as the first direction, and the direction in which the first bracket 22 rotates relative to the second bracket 23 in a direction away from the detection element 1 is defined as the second direction. The first direction and the second direction are opposite. When the second bracket 23 drives the first bracket 22 to rotate in the first direction, it facilitates the installation and removal of the detection element 1. When the first bracket 22 rotates in the second direction under the drive of the test element 4, the electrode structure 3 can be disconnected from the detection area 11.
[0042] In one embodiment, the second bracket 23 is provided with a clearance groove 231 to avoid the electrode structure 3.
[0043] In this embodiment, since the electrode structure 3 is installed on the side of the first support 22 close to the detection element 1, when the first support 22 rotates under the pulling force of the test element 4, the electrode structure 3 will move accordingly. The clearance groove 231 opened on the second support 23 provides movement space for the electrode structure 3, avoiding collision or friction between the electrode structure 3 and the second support 23 during movement, ensuring that the electrode structure 3 can move smoothly with the first support 22 and accurately connect or disconnect with the detection area 11.
[0044] In one embodiment, the second bracket 23 is provided with a locking part 232 for locking with the detection piece 1.
[0045] In this embodiment, the engaging portion 232 on the second bracket 23 engages with the detection element 1, providing positioning and support for the rotating bracket assembly 2. During the operation of the detection mechanism, the engaging portion 232 can restrict the position of the second bracket 23, preventing it from shaking or shifting when the first bracket 22 moves, thus ensuring the overall stability of the rotating bracket assembly 2.
[0046] Reference Figures 5-8 As shown, in one embodiment, the second bracket 23 has a first position and a second position relative to the fixed bracket 21. When the second bracket 23 is in the first position, the second bracket 23 is in contact with the detection element 1; when the second bracket 23 is in the second position, the second bracket 23 is separated from the detection element 1.
[0047] Furthermore, in one embodiment, the first support 22 has a fastened state and a disengaged state relative to the second support 23. When the second support 23 is in the first position and the first support 22 is in the fastened state, the electrode structure 3 is connected to the detection area 11; when the second support 23 is in the first position and the first support 22 is in the disengaged state, the electrode structure 3 is disconnected from the detection area 11.
[0048] In this embodiment, when the second bracket 23 is in the first position and the first bracket 22 is in the latched state, it indicates that the device under test 4 is in a normal initial state. For example, in the scenario of detecting a laptop back cover, when the back cover is closed, the second bracket 23 is in the first position, and the first bracket 22 is latched to the second bracket 23. At this time, the electrode structure 3 installed on the first bracket 22 is in close contact with the detection area 11 of the detection device 1, forming a conductive circuit. After detecting this connected state, the detection device 1 sends a first response signal to the device system, and the device system determines that the state of the device under test 4 is normal, that is, the back cover has not been opened. When the second bracket 23 is in the first position and the first bracket 22 is in the separated state, it indicates that the state of the device under test 4 has changed. For example, when the laptop back cover is opened, the second bracket 23 is still in the first position, but the first bracket 22 will change from the latched state to the separated state. As the first bracket 22 separates, the connection between the electrode structure 3 and the bracket of the detection area 11 is cut off, and the detection circuit is broken. After detecting this disconnection state, the detection component 1 sends a second response signal to the equipment system. Upon receiving this signal, the equipment system determines that the state of the test component 4 is abnormal, i.e., the back cover is open. This structural design makes the working principle of the detection mechanism clearer and more reliable, and the cooperation between the components is more stable and reliable. During the switching between the latching and disengaging states, the first bracket 22 can accurately drive the electrode structure 3 to connect and disconnect with the detection area 11, enhancing the reliability and stability of the detection mechanism. When it is necessary to disassemble or install the detection component 1, refer to... Figure 8 The second bracket 23 can be controlled to open to the second position in a direction away from the detection element 1, so as to make way for the detection element 1.
[0049] Reference Figure 4 , Figure 5 , Figure 6 and Figure 8 As shown, this disclosure provides an electronic device, including a test piece 4 and a detection mechanism as described in any of the above embodiments, wherein the test piece 4 is connected to a rotating support assembly 2.
[0050] In this embodiment, the device under test (DUT) 4 is a component whose state needs to be monitored, such as the back cover of a laptop, a learning machine, a tablet computer, or the cabinet door of an industrial control computer. The DUT 4 is connected to the rotating support assembly 2, allowing changes in its state to be directly transmitted to the rotating support assembly 2. When the DUT 4 is in a normal state, the electrode structure 3 is connected to the detection area 11 of the detection element 1, and the detection element 1 sends a first response signal to the control system of the electronic device. At this time, the electronic device determines that the DUT 4 is in a normal state. Taking a laptop as an example, when the back cover is closed, the positions of the first support 22 and the second support 23 connect the electrode structure 3 to the detection area 11 on the motherboard. The computer system receives the first response signal, confirming that the back cover is closed and the device is in a safe state. When the state of the DUT 4 changes, such as when the laptop back cover is opened, the movement of the DUT 4 causes the rotating support assembly 2 to move. The states of the first support 22 and the second support 23 of the rotating support assembly 2 change, the electrode structure 3 disconnects from the detection area 11, and the detection element 1 sends a second response signal to the control system. After receiving the second response signal, the computer system determines that the back cover is in an abnormal state and takes corresponding measures, such as issuing an alarm to remind the user and recording the abnormal event for subsequent query and analysis. Therefore, the electronic device of this disclosure, due to the inclusion of a detection mechanism, can accurately detect minute changes in the state of the test piece 4 through the coordinated work of the rotating support assembly 2 and the electrode structure 3, greatly improving the accuracy of the detection. The detection mechanism eliminates complex mechanical and electronic components, adopting a simple mating structure, reducing production and manufacturing costs, and making installation and maintenance more convenient, thus improving the overall stability of the equipment. The modular design of the detection mechanism allows it to easily adapt to different types of electronic devices and test pieces 4. When upgrading or replacing components of the electronic device, only simple adjustments or replacement of some components in the detection mechanism are needed to meet new detection requirements, enhancing the compatibility and scalability of the equipment.
[0051] In one embodiment, the test piece 4 is provided with a hook structure 41, which engages with the rotating support assembly 2.
[0052] In this embodiment, the hook connection between the test piece 4 and the rotating bracket assembly 2 makes the connection between them more stable and precise. When the state of the test piece 4 changes, such as when the back cover of a laptop computer is opened or closed, the hook structure 41 can effectively transmit the movement of the test piece 4 to the rotating bracket assembly 2. The hook structure 41 is simple in design, easy to implement, and does not add excessive cost or equipment complexity. This structure ensures efficient implementation of the testing function while also taking into account the convenience of manufacturing and maintenance of electronic devices, and has good practicality.
[0053] In the description of this disclosure, it should be understood that the orientation or positional relationship indicated by directional terms is usually based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this disclosure and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this disclosure; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.
[0054] For ease of description, spatial relative terms such as "above," "over," "on the upper surface of," and "above" are used herein to describe the spatial positional relationship between one or more components or features shown in the figures and other components or features. It should be understood that spatial relative terms include not only the orientation of the component as depicted in the figures but also different orientations during use or operation. For example, if the components in the figures are inverted as a whole, "above" or "above other components or features" will include cases where the component is "below" or "under" other components or features. Thus, the exemplary term "above" can include both "above" and "below." Furthermore, these components or features may also be positioned at other different angles (e.g., rotated 90 degrees or other angles), and this document intends to include all such cases.
[0055] It should be noted that the terminology used herein is for the purpose of describing particular implementations only and is not intended to limit the exemplary implementations according to this disclosure. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms “comprising” and / or “including” are used in this specification, they indicate the presence of features, steps, operations, parts, components, and / or combinations thereof.
[0056] It should be noted that the terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this disclosure are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this disclosure described herein can be implemented in sequences other than those illustrated or described herein.
[0057] This disclosure has been described through the above embodiments; however, it should be understood that the above embodiments are for illustrative purposes only and are not intended to limit this disclosure to the described embodiments. Furthermore, those skilled in the art will understand that this disclosure is not limited to the above embodiments, and many more variations and modifications can be made based on the teachings of this disclosure, all of which fall within the scope of protection claimed by this disclosure. The scope of protection of this disclosure is defined by the appended claims and their equivalents.
Claims
1. A testing institution, characterized in that, It includes a detection component (1), a rotating support assembly (2), and an electrode structure (3); among which, The rotating bracket assembly (2) is disposed on the side of the detection piece (1) and is rotatable relative to the detection piece (1). The rotating bracket assembly (2) is configured to be driven to rotate by the tension of the test piece (4). The electrode structure (3) is disposed on the rotating support assembly (2) and moves with the rotation of the rotating support assembly (2) to communicate or disconnect with the detection area (11) of the detection element (1); The detection element (1) responds to the connection between the electrode structure (3) and the detection area (11) by feeding back a first response signal; the detection element (1) responds to the disconnection between the electrode structure (3) and the detection area (11) by feeding back a second response signal.
2. The testing mechanism according to claim 1, characterized in that, The rotating support assembly (2) includes a fixed support (21) and a first support (22). The first support (22) is connected to the fixed support (21) and can rotate relative to the detection element (1). The first support (22) is disposed on the side of the detection element (1) through the fixed support (21). The electrode structure (3) is disposed on the side of the first support (22) close to the detection element (1).
3. The testing mechanism according to claim 2, characterized in that, The first support (22) has a normal state and a tilted state relative to the detection element (1). When the first support (22) is in the normal state, the electrode structure (3) is connected to the detection area (11); when the first support (22) is in the tilted state, the electrode structure (3) is disconnected from the detection area (11).
4. The testing mechanism according to claim 2, characterized in that, The rotating support assembly (2) further includes a second support (23), the first support (22) is connected to the fixed support (21) through the second support (23), one end of the second support (23) is rotatably connected to the fixed support (21), and the other end of the second support (23) is rotatably connected to the first support (22).
5. The testing mechanism according to claim 4, characterized in that, The second bracket (23) is provided with a clearance groove (231) to avoid the electrode structure (3).
6. The testing mechanism according to claim 4, characterized in that, The second bracket (23) is provided with a locking part (232) for locking with the detection piece (1).
7. The testing mechanism according to claim 4, characterized in that, The second bracket (23) has a first position and a second position relative to the fixed bracket (21). When the second bracket (23) is in the first position, the second bracket (23) is in contact with the detection element (1); when the second bracket (23) is in the second position, the second bracket (23) is separated from the detection element (1).
8. The testing mechanism according to claim 7, characterized in that, The first support (22) has a fastened state and a disengaged state relative to the second support (23). When the second support (23) is in the first position and the first support (22) is in the fastened state, the electrode structure (3) is connected to the detection area (11); when the second support (23) is in the first position and the first support (22) is in the disengaged state, the electrode structure (3) is disconnected from the detection area (11).
9. An electronic device, comprising a device under test (4), characterized in that, It also includes a testing mechanism as described in any one of claims 1-8, wherein the test piece (4) is connected to the rotating support assembly (2).
10. The electronic device according to claim 9, characterized in that, The test piece (4) is provided with a hook structure (41), which engages with the rotating support assembly (2).