A temperature stress integrated measuring device based on polarized interference method

Abstract

The utility model belongs to optical technique field, concretely relates to a temperature stress integration measuring device based on polarized light interference method. By light path system, temperature system, stress system, shading system and support constitute, utilize the equipment of this embodiment to carry out test, can measure the birefringence of quartz crystal after the light intensity data of modulated polarizer and polarimeter in perpendicular and parallel two kinds of modes is brought into corresponding formula by electric control polarimeter, the device of the application can be used for the measurement of stress and temperature and the demonstration of the phenomenon of birefringence influence factor in the polarization experiment of light in university physics experiment.

Description

Technical Field

[0001] This utility model belongs to the field of optical technology, specifically relating to an integrated temperature and stress measurement device based on polarized interferometry. Background Technology

[0002] Birefringent crystals are special optical materials whose anisotropy in internal structure causes their physical properties (such as refractive index) to vary with direction. Therefore, incident light is decomposed into two refracted beams: the ordinary ray (o ray) follows the law of refraction, its refractive index remains constant, and its polarization direction is perpendicular to the optical axis; the extraordinary ray (e ray) does not follow the conventional law of refraction, its refractive index varies with direction, and its polarization direction is parallel to the optical axis. The core parameter of birefringence is the birefringence, defined as: Δn = |n| e - n o Its size characterizes the degree of anisotropy in a crystal and is a key physical quantity for measuring the strength of the birefringence effect.

[0003] Due to their unique physical properties, birefringent crystals are used in optics as polarization control devices: quarter-wave plates and half-wave plates. By precisely controlling the thickness and optical axis direction of the crystal, these devices can accurately change the phase difference of incident polarized light, achieving conversion between linearly polarized, circularly polarized, and elliptically polarized light.

[0004] Currently, the most common device for detecting birefringent crystals is a polarizing microscope. In a polarizing microscope, light emitted from a light source becomes polarized after passing through a polarizer. When this polarized light passes through a birefringent crystal, due to the crystal's birefringence, it is decomposed into two polarized beams with mutually perpendicular vibration directions. These two beams travel at different speeds within the crystal, resulting in an optical path difference. When observed through an analyzer, different interference phenomena appear depending on the optical path difference and the crystal's properties, such as alternating bright and dark fringes and color variations.

[0005] Beyond the field of optics, coupling the birefringence of a crystal with voltage and utilizing the electro-optic effect of certain birefringent crystals can create electro-optic modulators. In laser technology, by rapidly modulating the voltage, it is possible to quickly control the loss or reflectivity of the laser cavity, which is one of the key technologies for generating high-intensity, short-pulse lasers (such as Q-switched lasers).

[0006] It is evident that the current applications of birefringent crystals are mainly in the pure optical field and the coupling of optics and electricity. There is currently no experimental apparatus in the technology that combines optics with mechanics and thermodynamics to further expand the applications of birefringent crystals. Utility Model Content

[0007] The purpose of this invention is to address the shortcomings of existing technologies and provide an integrated temperature and stress measurement device based on polarized interferometry, which indirectly measures stress and temperature through the birefringence of a crystal.

[0008] This utility model is achieved through the following technical solution:

[0009] A temperature and stress integrated measurement device based on polarized interferometry consists of an optical path system, a temperature system, a stress system, a light-shielding system, and a support.

[0010] The bracket consists of a support platform and support plates mounted on the support platform. The support platform is a hollow cuboid, and the support plates include a first support plate, a second support plate, and a third support plate. The first, second, and third support plates are all perpendicular to the upper surface of the support platform and are parallel to each other. Four load-bearing supports perpendicular to the upper surface of the support platform are provided between the first and second support plates. All components of the bracket are made of acrylic sheets.

[0011] The temperature system consists of a heating element, a temperature controller, and a heat insulation plate. There are two heat insulation plates, both of which are set between the four load-bearing supports. The heat insulation plate set at the bottom is the lower heat insulation plate, and the heat insulation plate set at the top is the upper heat insulation plate. The heating element is set on the lower heat insulation plate.

[0012] The optical path system comprises a laser, a polarizer, a quartz crystal, an electrically controlled analyzer, and a photodetector. The first support plate has mounting holes through which the laser is mounted. The polarizer is attached to the emitting end of the laser. The bottom of the quartz crystal is mounted on a heating element, and its top is in close contact with the upper heat insulation plate. The electrically controlled analyzer comprises a rotating platform, a servo motor, a wing, and a polarizer. The rotating platform consists of two circular turntables and two rectangular neck plates. The two turntables are respectively positioned at both ends of the two neck plates, and the two neck plates and the two turntables are parallel to each other. The second and third support plates each have a circular hole matching the size of the turntable, and the two turntables are respectively positioned in the two circular holes. The rotating platform is mounted on the second support plate... The first turntable is mounted on the first support plate, and the second turntable is mounted on the third support plate. The first turntable has circular polarizer mounting holes, and the second turntable has rectangular wing mounting holes. The polarizers are mounted in the polarizer mounting holes, and the wing is mounted in the wing mounting holes. Two mounting plates are also provided on the side of the third support plate where the turntable is not mounted; these two mounting plates are perpendicular to both the third support plate and the upper surface of the support plate. The servo motor is positioned between the two mounting plates. The servo motor's drive shaft is connected to the wing. A photoelectric receiver passage slot is provided on the upper surface of the support plate below the turntable, and a photoelectric receiver slide rail is provided on the bottom surface of the support plate below the turntable. The bottom of the photoelectric receiver is mounted on the photoelectric receiver slide rail, and the top passes through the photoelectric receiver passage slot between the two neck plates of the turntable.

[0013] The stress system consists of a stress sensor and a stress display screen. The stress sensor has an "I" shaped structure and is installed between four load supports with its bottom mounted on the upper heat insulation plate.

[0014] The light-shielding system consists of six light-shielding plates, which are combined into a rectangular box. The bracket, optical path system, temperature system, and stress system are all housed within this box. The temperature controller and stress display screen are both mounted on the light-shielding plates.

[0015] It also includes an optical power meter and a power supply; the power supply is electrically connected to the optical power meter, temperature controller, stress display screen, servo motor, heating element, photoelectric receiver, and laser, respectively; the optical power meter is communicatively connected to the photoelectric receiver; the temperature controller is communicatively connected to the heating element; and the stress display screen is communicatively connected to the stress sensor.

[0016] Preferably, the first support plate has an annular angle indicator sticker along the mounting hole on the side away from the load-bearing bracket, and the 0° direction of the annular angle indicator sticker is set in the vertical direction.

[0017] The center lines of the laser, the quartz crystal, the electrically controlled analyzer, and the photodetector are all located on the same straight line.

[0018] The wing has a connection port at its center, and the drive shaft of the servo motor is connected to the wing through the connection port to drive the wing to rotate.

[0019] Preferably, the support platform is also provided with an operation window.

[0020] The heating element is connected to the temperature controller via a temperature probe, which is mounted on the heating element.

[0021] The third support plate is also provided with a limiting block; one end of the limiting block is fixed to the third support plate, and the other end extends to the round hole on the third support plate.

[0022] The limiting blocks are at least two in number, and are disposed on the front and / or rear side of the second support plate. The front side refers to the side closer to the photoelectric receiver, and the rear side refers to the side closer to the servo motor.

[0023] The laser is further supported by a support frame, which consists of a support base on a light shield, a support rod on the support base, and a support bracket fixed on the support rod. The support bracket is arc-shaped, and its radius is equal to that of the laser. One end of the laser is located inside the support bracket.

[0024] Compared with the prior art, the present invention has the following beneficial effects:

[0025] (1) This utility model achieves automated light intensity measurement of polarizer and analyzer in two modes by setting a rotating stage, effectively eliminating human operation error and light attenuation factor; ensuring the consistency and traceability of experimental data.

[0026] (2) This utility model is based on a modular design concept and uses a self-designed acrylic sheet bracket for structural assembly. The device designs the optical system, stress system, and temperature system as independent modular units, and the systems are connected through standardized interfaces, which can be easily disassembled and quickly assembled, facilitating equipment maintenance, function upgrades, and troubleshooting. The acrylic sheet has good processing performance and optical compatibility, and its customized shape design ensures that the device has a compact structure and reasonable layout. At the same time, the device integrates a high-definition display screen on the outside, which can present temperature and stress measurement data in real time and intuitively, realizing efficient visualization of measurement results.

[0027] (3) This utility model utilizes an acrylic sheet to design mounting holes that allow the laser to rotate and be placed horizontally. A polarizer with a known polarization direction is glued to the laser light source emission point and the polarization direction is marked. A circular angle indicator is pasted on the laser placement port, with the 0° direction of the indicator in the vertical direction. A customized platform is made using an acrylic sheet combined with a stress system and a temperature system. A rotating stage is designed using an acrylic sheet and hot melt adhesive to connect the analyzer and the servo motor. The servo motor can freely switch between 0° and 90°. A slide rail and operating window for the photoelectric receiver are designed so that the photoelectric receiver can be freely moved to the light spot.

[0028] (4) This invention utilizes a relay to connect the heating element and control the temperature, and uses high-temperature resistant tape to bind the heating element and quartz crystal together. Simultaneously, it is placed on a heat insulation plate, and two heat insulation plates are used to fix the heating element, crystal, and the relay's temperature probe together, thus controlling the heating element temperature and delaying the heating time to allow the crystal and heating element to reach thermal equilibrium. Using heat insulation plates to wrap the heating element and quartz crystal not only protects the experimental apparatus but also helps ensure temperature stability. The use of a relay to control the heating element temperature enables automated temperature control in the experiment.

[0029] (5) After placing the stress sensor above the heat insulation plate, apply a weight to the sensor to approximate the stress on the crystal and realize the measurement of multiple data; it has higher measurement accuracy and better dynamic response capability, ensuring that reliable and real-time data are obtained in stress and birefringence testing.

[0030] (6) The light shielding system isolates external light while integrating the three main functional systems, bracket and display screen together. It also needs to be detachable and assembleable to facilitate internal adjustments of the instrument.

[0031] (7) By setting up a support frame, this utility model ensures that the laser machine will not sag due to gravity during long-term use, thus ensuring the accuracy of experimental data.

[0032] (8) By setting a limiting block, this utility model can prevent the rotary table from falling out of the round hole during rotation, thus ensuring the safety of the experimental process.

[0033] (9) In this invention, the laser, the quartz birefringent crystal, the analyzer, and the photodetector are arranged to be coaxial (equal horizontal lines). The laser and the polarizer are combined so that the light incident on the quartz birefringent crystal is linearly polarized light with constant intensity and different polarization directions. Attached Figure Description

[0034] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0035] Figure 2 This is a schematic diagram of the internal structure of the present invention;

[0036] Figure 3 This is a schematic diagram of the structure of the rotary table of this utility model;

[0037] Figure 4 This is a schematic diagram of the structure of the laser of this utility model;

[0038] Figure 5 This is a schematic diagram of the structure of the heating element of this utility model;

[0039] Figure 6 This is a schematic diagram of the annular angle indicator of this utility model;

[0040] Figure 7 This is a schematic diagram of the third support plate structure of this utility model;

[0041] Figure 8 for Figure 7 A side view diagram;

[0042] In the diagram: 1-Optical power meter, 2-Power supply, 3-Temperature controller, 4-Stress display screen, 5-Light shield, 6-Laser, 7-Heating element, 8-Quartz crystal, 9-Stress sensor, 10-Photodetector, 11-Rotating stage, 12-Servo motor, 13-Polarizer, 14-Photodetector slide rail, 15-Loading support, 16-Heat insulation plate, 17-Upper heat insulation plate, 18-Lower heat insulation plate, 19-Support, 20-Support platform, 21-First support plate, 22-Then 23-Third support plate, 24-Mounting hole, 25-First turntable, 26-Neck plate, 27-Round hole, 28-Mounting plate, 29-Second turntable, 30-Wing, 31-Wing mounting hole, 32-Photoelectric receiver through slot, 33-Polarizer mounting hole, 34-Operating window, 35-Circular angle indicator sticker, 36-Interface, 37-Polarizer, 38-Temperature probe; 39-Support bracket, 40-Support rod, 41-Support seat, 42-Limiting block. Detailed Implementation

[0043] The present invention will be further described below with reference to the accompanying drawings and embodiments, but the scope of protection of the present invention is not limited by the embodiments. Example 1

[0044] like Figure 1-8 The temperature and stress integrated measurement device shown is based on polarized interferometry and consists of an optical path system, a temperature system, a stress system, a light-shielding system, and a support.

[0045] The bracket consists of a support platform and support plates mounted on the support platform. The support platform is a hollow cuboid, and the support plates include a first support plate, a second support plate, and a third support plate. The first, second, and third support plates are all perpendicular to the upper surface of the support platform and are parallel to each other. Four load-bearing supports perpendicular to the upper surface of the support platform are provided between the first and second support plates. All components of the bracket are made of acrylic sheets.

[0046] The temperature system consists of a heating element, a temperature controller, and a heat insulation plate. There are two heat insulation plates, both of which are set between the four load-bearing supports. The heat insulation plate set at the bottom is the lower heat insulation plate, and the heat insulation plate set at the top is the upper heat insulation plate. The heating element is set on the lower heat insulation plate.

[0047] The optical path system comprises a laser, a polarizer, a quartz crystal, an electrically controlled analyzer, and a photodetector. The first support plate has mounting holes through which the laser is mounted. The polarizer is attached to the emitting end of the laser. The bottom of the quartz crystal is mounted on a heating element, and its top is in close contact with the upper heat insulation plate. The electrically controlled analyzer comprises a rotating platform, a servo motor, a wing, and a polarizer. The rotating platform consists of two circular turntables and two rectangular neck plates. The two turntables are respectively positioned at both ends of the two neck plates, and the two neck plates and the two turntables are parallel to each other. The second and third support plates each have a circular hole matching the size of the turntable, and the two turntables are respectively positioned in the two circular holes. The rotating platform is mounted on the second support plate... The first turntable is mounted on the first support plate, and the second turntable is mounted on the third support plate. The first turntable has circular polarizer mounting holes, and the second turntable has rectangular wing mounting holes. The polarizers are mounted in the polarizer mounting holes, and the wing is mounted in the wing mounting holes. Two mounting plates are also provided on the side of the third support plate where the turntable is not mounted; these two mounting plates are perpendicular to both the third support plate and the upper surface of the support plate. The servo motor is positioned between the two mounting plates. The servo motor's drive shaft is connected to the wing. A photoelectric receiver passage slot is provided on the upper surface of the support plate below the turntable, and a photoelectric receiver slide rail is provided on the bottom surface of the support plate below the turntable. The bottom of the photoelectric receiver is mounted on the photoelectric receiver slide rail, and the top passes through the photoelectric receiver passage slot between the two neck plates of the turntable.

[0048] The stress system consists of a stress sensor and a stress display screen. The stress sensor has an "I" shaped structure and is installed between four load supports with its bottom mounted on the upper heat insulation plate.

[0049] The light-shielding system consists of six light-shielding plates, which are combined into a rectangular box. The bracket, optical path system, temperature system, and stress system are all housed within this box. The temperature controller and stress display screen are both mounted on the light-shielding plates.

[0050] It also includes an optical power meter and a power supply; the power supply is electrically connected to the optical power meter, temperature controller, stress display screen, servo motor, heating element, photoelectric receiver, and laser, respectively; the optical power meter is communicatively connected to the photoelectric receiver; the temperature controller is communicatively connected to the heating element; and the stress display screen is communicatively connected to the stress sensor.

[0051] The first support plate has a circular angle indicator sticker along the mounting hole on the side away from the load bracket, and the 0° direction of the circular angle indicator sticker is set in the vertical direction.

[0052] The center lines of the laser, the quartz crystal, the electrically controlled analyzer, and the photodetector are all located on the same straight line.

[0053] The wing has a connection port at its center, and the drive shaft of the servo motor is connected to the wing through the connection port to drive the wing to rotate.

[0054] Preferably, the support platform is also provided with an operation window.

[0055] The heating element is connected to the temperature controller via a temperature probe, which is mounted on the heating element.

[0056] The third support plate is also provided with a limiting block; one end of the limiting block is fixed to the third support plate, and the other end extends to the round hole on the third support plate.

[0057] The limiting blocks are at least two in number, and are disposed on the front and / or rear side of the second support plate. The front side refers to the side closer to the photoelectric receiver, and the rear side refers to the side closer to the servo motor.

[0058] The laser is further supported by a support frame, which consists of a support base on a light shield, a support rod on the support base, and a support bracket fixed on the support rod. The support bracket is arc-shaped, and its radius is equal to that of the laser. One end of the laser is located inside the support bracket.

[0059] In this embodiment, the servo system consists of a power input and protection module, a main control microcontroller module, a PWM output module, an RF remote control module, a button input module, and a servo execution module.

[0060] The power input and protection module ensures the safety and stability of the system power supply through diode reverse connection protection, fuse overcurrent protection, and filter capacitors.

[0061] The main control microcontroller module uses the STC89C51 microcontroller as the control core. It uses a timer to dynamically adjust the high-level pulse width of the PWM signal. Based on the angle command input via serial port or radio frequency, it outputs a PWM signal with a period of 20ms to drive the servo motor to the target angle.

[0062] The PWM output module directly transmits the control signal to the servo motor, ensuring high-precision execution of angle commands.

[0063] The radio frequency remote control module provides remote wireless control capabilities.

[0064] The key input module supports local manual adjustment.

[0065] The servo actuator module drives the rotary table and polarizer to rotate synchronously, enabling flexible and precise positioning of the rotary table and polarizer.

[0066] The servo system in this embodiment adopts a digital control method, which has strong anti-interference ability and enables the analyzer and polarizer to switch flexibly between parallel and vertical modes, ensuring the stability and angular accuracy of the rotary table and polarizer.

[0067] The described RF remote control module uses an STC8G1K17 microcontroller as its core processor, combined with a Micro-R5A RF receiver module, an SG90 servo motor, and its peripheral circuitry, to achieve RF remote control signal reception and precise servo motor angle control. The power supply section employs a protection circuit consisting of an SS34 Schottky diode, a 220μF filter capacitor, and a fuse to ensure power supply stability and safety. The RF module inputs the decoded RF signal to the microcontroller's RXD2 pin via a serial data interface. The main control chip internally analyzes the RF signal and performs three sets of code matching verification to confirm the validity of the command. The servo motor control signal is directly provided by the STC8G1K17's PWM output pin P5.5, and after signal filtering and isolation, drives the SG90 servo motor to complete precise angle movements. Reserved key input (KEY) and serial port debugging (J2) interfaces in the circuit can be used for local manual operation or program debugging.

[0068] In this embodiment, a stress sensor developed based on the STC89C51 microcontroller uses a resistance strain gauge stress sensor as its core measurement unit. By manually adjusting the mass of the weight above and combining this with optical measurement methods, real-time measurement of the crystal's birefringence is achieved. In the system, the millivolt-level voltage signal output by the stress sensor is amplified and conditioned by a high-precision 24-bit A / D converter chip (HX711) before being input to the STC89C51 microcontroller. The microcontroller reads the digitized stress data in real time, processes the data, and outputs it stably. Simultaneously, the current stress value is displayed in real-time on an LCD1602 liquid crystal module, ensuring the controllability and visibility of stress adjustment. Furthermore, the circuit integrates an audible and visual alarm unit, which automatically triggers a buzzer and LED light when the set stress threshold is exceeded, providing multiple safety protections. Compared to commonly used 12-bit ADC sampling or low-speed microcontroller solutions, this embodiment uses the HX711 high-resolution A / D acquisition and the STC89C51 microcontroller for processing, resulting in higher measurement accuracy and better dynamic response capabilities, ensuring reliable and real-time data in stress and birefringence testing. The system's hardware structure adopts a modular approach, possessing excellent scalability and maintainability.

[0069] Experiments were conducted using the equipment in this embodiment. By modulating the polarizer and analyzer with an electronically controlled polarizer in both vertical and parallel modes, the light intensity data was measured and then substituted into the corresponding formula to determine the birefringence of the quartz crystal. The experimental conclusions are as follows: In the range of 25℃-110℃, the birefringence of the quartz crystal exhibits a linear relationship with temperature; in the range of 0Pa-166075Pa, the birefringence of the quartz crystal exhibits a linear relationship with temperature.

[0070] The stability of the device depends on the stability of the optical power meter readings. The optical power meter selected in the device has a signal-to-noise ratio of 50dB.

[0071] During the experiment, the angle between the incident light and the optical axis did not reach 45°; during temperature measurement, the heating plate and the crystal did not reach thermal equilibrium; during stress measurement, the weight to be measured was not placed in the center, resulting in uneven stress on the crystal surface; all of the above factors can lead to errors.

[0072] In summary, the device of this embodiment can be used for stress and temperature measurement, light polarization experiments in university physics experiments, and demonstration of phenomena related to the influence of birefringence.

Claims

1. A temperature and stress integrated measurement device based on polarized interferometry, comprising an optical path system, a temperature system, a stress system, a light-shielding system, and a support, characterized in that, The bracket (19) consists of a support platform (20) and a support plate disposed on the support platform; the support platform is a hollow cuboid, and the support plate includes a first support plate (21), a second support plate (22), and a third support plate (23); the first support plate, the second support plate, and the third support plate are all perpendicular to the upper surface of the support platform, and the first support plate, the second support plate, and the third support plate are parallel to each other; four load-bearing supports (15) perpendicular to the upper surface of the support platform are provided between the first support plate and the second support plate. The temperature system consists of a heating element (7), a temperature controller (3), and a heat insulation plate (16). There are two heat insulation plates, and both heat insulation plates are set between the four load-bearing supports. The heat insulation plate set at the bottom is the lower heat insulation plate (18), and the heat insulation plate set at the top is the upper heat insulation plate (17). The heating element is set on the lower heat insulation plate. The optical path system consists of a laser (6), a polarizer (37), a quartz crystal (8), an electrically controlled analyzer, and a photodetector (10); the first support plate has mounting holes (24), and the laser is mounted on the first support plate through the mounting holes; the polarizer is attached to the emitting end of the laser; the bottom of the quartz crystal is mounted on the heating plate, and the top is in close contact with the upper heat insulation plate; the electrically controlled analyzer consists of a rotating stage (11), a servo motor (12), a wing (30), and a polarizer (13), and the rotating stage consists of two circular turntables and two rectangular neck plates (26); the two turntables are respectively set at both ends of the two neck plates, and the two neck plates are parallel to each other, and the two turntables are parallel to each other; the second support plate and the third support plate each have a circular hole (27) matching the size of the turntable, and the two turntables are respectively set in the two circular holes; the first support plate has a circular hole (27) matching the size of the turntable, and the two turntables are respectively set in the two circular holes; the second support plate has a circular hole (27) matching the size of the turntable, and the second support plate has a circular hole (27) matching the size of the turntable. The turntable on the second support plate is the first turntable (25), and the turntable on the third support plate is the second turntable (29). The first turntable has a circular polarizer mounting hole (33), and the second turntable has a rectangular wing mounting hole (31). The polarizer is installed in the polarizer mounting hole, and the wing is installed in the wing mounting hole. On the side of the third support plate where the turntable is not installed, there are two mounting plates (28), which are perpendicular to the third support plate and the upper surface of the support plate. The servo is installed between the two mounting plates. The drive shaft of the servo is connected to the wing. The upper surface of the support plate below the turntable has a photoelectric receiver passage groove (32), and the bottom surface of the support plate below the turntable has a photoelectric receiver slide rail (14). The bottom of the photoelectric receiver is installed on the photoelectric receiver slide rail, and the top passes through the photoelectric receiver passage groove and is located between the two neck plates of the turntable. The stress system consists of a stress sensor (9) and a stress display screen (4). The stress sensor is an "I" shaped structure. The stress sensor is set between four load supports and the bottom of the stress sensor is set on the upper heat insulation plate. The light-shielding system consists of six light-shielding plates (5), which are combined into a rectangular box. The bracket, optical path system, temperature system and stress system are all installed in the box. The temperature controller and stress display screen are installed on the light-shielding plates.

2. The integrated temperature and stress measurement device based on polarized light interferometry according to claim 1, characterized in that, It also includes an optical power meter (1) and a power supply (2); the power supply is electrically connected to the optical power meter, the temperature controller, the stress display screen, the servo motor, the heating element, the photoelectric receiver, and the laser, respectively; the optical power meter is communicatively connected to the photoelectric receiver; the temperature controller is communicatively connected to the heating element; and the stress display screen is communicatively connected to the stress sensor.

3. The integrated temperature and stress measurement device based on polarized light interferometry according to claim 1, characterized in that, The first support plate has a circular angle indicator sticker (35) along the mounting hole on the side away from the load support, and the 0° direction of the circular angle indicator sticker is set in the vertical direction.

4. The integrated temperature and stress measurement device based on polarized light interferometry according to claim 1, characterized in that, The center lines of the laser, the quartz crystal, the electrically controlled analyzer, and the photodetector are all located on the same straight line.

5. The integrated temperature and stress measurement device based on polarized light interferometry according to claim 1, characterized in that, The wing has a center interface (36) and the drive shaft of the servo motor is connected to the wing through the interface and drives the wing to rotate.

6. The integrated temperature and stress measurement device based on polarized light interferometry according to claim 1, characterized in that, An operation window (34) is also provided on the support platform.

7. The integrated temperature and stress measurement device based on polarized light interferometry according to claim 1, characterized in that, The heating element is connected to the temperature controller via a temperature probe (38), which is mounted on the heating element.

8. The integrated temperature and stress measurement device based on polarized light interferometry according to claim 1, characterized in that, The third support plate is also provided with a limiting block (42); one end of the limiting block is fixed on the third support plate, and the other end extends to the round hole on the third support plate.

9. The integrated temperature and stress measurement device based on polarized light interferometry according to claim 8, characterized in that, The limiting blocks are at least two, and the limiting blocks are disposed on the front side and / or rear side of the second support plate.

10. The integrated temperature and stress measurement device based on polarized light interferometry according to claim 1, characterized in that, The laser is also provided with a support frame below it. The support frame consists of a support seat (41) set on the light shield, a support rod (40) set on the support seat, and a support bracket (39) fixed on the support rod. The support bracket is arc-shaped and the radius of the support bracket is equal to the radius of the laser. One end of the laser is set inside the support bracket.

Images