A near infrared analysis device

Abstract

This application relates to near-infrared spectroscopy technology, specifically disclosing a near-infrared analysis device, including a light source assembly, a light-collecting assembly, and a material-containing assembly. The light-emitting side of the light source assembly faces the material-containing assembly, and the light-receiving side of the light-collecting assembly faces the material-containing assembly. The material-containing assembly includes an upper end surface and a lower end surface arranged opposite each other along the direction of gravity. The light source assembly and the light-collecting assembly are respectively disposed on a side close to the lower end surface of the material-containing assembly. This ensures that the distance between the object being measured and the light-collecting assembly remains constant during multiple operations, thereby guaranteeing the measurement results.

Description

Technical Field

[0001] This application relates to near-infrared spectroscopy technology, and in particular to a near-infrared analysis device. Background Technology

[0002] In the near-infrared spectral region, the absorption of near-infrared light by the stretching vibrations of high-energy hydrogen-containing atomic groups such as NH, OH, and CH in the organic matter contained in the analyte allows for quantitative analysis of the corresponding substances, belonging to the field of infrared spectroscopy measurement application technology. Existing near-infrared analyzers include a light source assembly, a light-collecting assembly, a transmission assembly, a calibration structure, a photoelectric switch, a material collection assembly, a motor, and a near-infrared spectrometer. A stepper motor drives the material collection assembly to rotate, and the photoelectric switch senses the rotation of the material collection assembly to determine the measurement cycle. The absorption of near-infrared light by the stretching vibrations of high-energy hydrogen-containing atomic groups such as NH, OH, and CH in the organic matter contained in the analyte allows for quantitative analysis of the corresponding substances.

[0003] Existing near-infrared analyzers place the light source and receiving components on the top of the instrument, above the object being measured. The light from the light source illuminates the upper surface of the object, and the receiving components then collect and detect the light. However, due to variations in the loading method and the amount of material being measured, the surface of the object is uneven. Furthermore, the distance between the object and the receiving device varies with each measurement, affecting measurement accuracy and ultimately the final result.

[0004] For example, existing technology discloses a diffuse reflection optical path calibration switching system, including a near-infrared light source irradiation mechanism, a sample signal acquisition channel, a reference signal acquisition channel, a wavelength calibration signal acquisition channel, a detection channel switching mechanism, an optical fiber transmission mechanism, and a spectrometer, wherein the sample to be tested is placed below the near-infrared light source irradiation mechanism. That is, this prior art also places the light source assembly above the sample.

[0005] Existing technology also discloses a near-infrared spectroscopy analyzer device, including a halogen light source, a light source reflector, a sample reflector assembly, a shielding disc, a motor, a sample diffuse reflection light collecting fiber, a light source reflection light collecting fiber, and a near-infrared spectrometer. The halogen light source vertically illuminates the sample under test. The shielding disc has a light-transmitting hole. The motor rotates the shielding disc and controls the position of the light-transmitting hole. The near-infrared spectrometer is connected to the sample diffuse reflection light collecting fiber and the light source reflection light collecting fiber, which are directly opposite the light-transmitting hole of the shielding disc. According to its embodiments and accompanying drawings, the halogen light source in this technology is still positioned above the sample under test.

[0006] Therefore, it can be seen that the conventional approach in the existing technology is to place the light source component and the light receiving component on the top of the structure. However, due to the uneven surface of the object being measured caused by the loading method, and because the amount of material being measured varies, the distance between the object being measured and the light receiving component cannot be constant, which affects the measurement accuracy. Utility Model Content

[0007] To address the problem that the distance between the object under test and the light-collecting component cannot be kept constant due to the top-mounted design of the light source and light-collecting components, thus affecting measurement accuracy, this application provides a near-infrared analysis device.

[0008] This application provides a near-infrared analysis device, which adopts the following technical solution:

[0009] A near-infrared analysis device includes a light source assembly, a light receiving assembly, and a material holding assembly. The light emitting side of the light source assembly faces the material holding assembly, and the light receiving side of the light receiving assembly faces the material holding assembly. The material holding assembly includes an upper end surface and a lower end surface arranged opposite each other along the direction of gravity. The light source assembly and the light receiving assembly are respectively disposed on the side close to the lower end surface of the material holding assembly.

[0010] By adopting the above technical solution, both the light source assembly and the light-collecting assembly are positioned on the side near the lower end face of the material-holding assembly along the direction of gravity. That is, both the light source assembly and the light-collecting assembly are placed below the material-holding assembly along the direction of gravity. When the object to be measured is placed inside the material-holding assembly, the lower end face of the object becomes naturally flat due to gravity. This ensures that the irradiated surface of the object becomes naturally flat under gravity, keeping the distance between the light-receiving side of the light-collecting assembly and the object constant. This avoids the problems of uneven surface caused by the loading method and inconsistent distances between the object and the light-collecting device in multiple operations due to varying material content on the object's surface, which are problems present in existing technologies. This application ensures that the distance between the object and the light-collecting assembly remains constant across multiple operations, thereby guaranteeing the measurement results.

[0011] Preferably, the material holding component, the light receiving component, and the light source component are arranged in sequence.

[0012] By adopting the above technical solution, as a specific structural example, the material holding component, the light collecting component, and the light source component are distributed sequentially. More specifically, the material holding component, the light collecting component, and the light source component all extend along the direction of gravity. This overcomes the problem of light collecting angle, results in a more reasonable structural distribution, and ensures better light collecting effect.

[0013] Preferably, it also includes a spectrometer, which is connected to the light-collecting component.

[0014] By adopting the above technical solution as a specific structural example, the spectrometer can select existing models and functions according to the requirements, and the diffusely reflected light on the object being measured enters the spectrometer for measurement through the light-collecting component.

[0015] Preferably, it further includes a calibration component, which is connected to the spectrometer and is located on the lower end face of the material holding component.

[0016] As a structural example, by adopting the above technical solution, a calibration component can be added. This calibration component is located on the lower end face of the material-containing component and is used to calibrate the spectrometer. The calibration component can be selected from existing calibration structures or employ known calibration methods, depending on the requirements.

[0017] Preferably, it further includes a fixing base, which is disposed on one side near the lower end face of the material holding assembly, and the light source assembly and the light receiving assembly are respectively disposed on the fixing base.

[0018] By adopting the above technical solution as a structural example, a fixed base is set up, and the light source assembly and light receiving assembly are set on the fixed base. The structural design is simple.

[0019] Preferably, it also includes a transmission component, which is connected to the material holding component in a transmission manner.

[0020] By adopting the above technical solution as a structural example, a transmission component is added to realize the switching of the position of the material holding component.

[0021] Preferably, the transmission assembly includes a shaft, a first transmission part, a second transmission part, and a third transmission part. The first transmission part is disposed on the shaft, and the first transmission part, the second transmission part, and the third transmission part are sequentially connected for transmission. The third transmission part is connected to the material holding assembly.

[0022] By adopting the above technical solution, as a structural example, the transmission assembly includes a shaft, a first transmission part, a second transmission part, and a third transmission part. The first transmission part is disposed on the shaft. For example, one end of the first transmission part can penetrate the shaft through the center position of the shaft. The other end of the first transmission part is connected to one end of the second transmission part, the other end of the second transmission part is connected to one end of the third transmission part, and the other end of the third transmission part is connected to the material holding assembly. By rotating the shaft, the material holding assembly is driven to rotate via the first transmission part, the second transmission part, and the third transmission part.

[0023] Preferably, it also includes a photoelectric switch, the signal output terminal of which faces the material holding assembly.

[0024] As a structural example, by adopting the above technical solution, a photoelectric switch is added. The photoelectric switch determines the rotation position of the material-holding assembly and determines the measurement cycle by sensing its rotation. Existing photoelectric switches can be directly selected according to requirements.

[0025] Preferably, it further includes a drive component, wherein the drive output shaft of the drive component is connected to the shaft body, and drives the material holding component to rotate through the transmission component.

[0026] By adopting the above technical solution as a structural example, a drive component is set to control the rotation of the shaft, thereby driving the material holding component to rotate. The drive component can be an existing motor, such as a stepper motor, and the specific model and specifications are selected according to the requirements.

[0027] In summary, this application has at least the following beneficial effects:

[0028] The near-infrared analysis device of this application can ensure that the distance between the object being measured and the light-receiving component remains constant during multiple operations, thereby guaranteeing the measurement results. Attached Figure Description

[0029] Figure 1 This is a schematic diagram of the overall structure of the near-infrared analysis device according to an embodiment of this application;

[0030] Figure 2 yes Figure 1 A longitudinal sectional view.

[0031] Label Explanation:

[0032] 1. Light source assembly; 2. Light receiving assembly; 3. Material holding assembly; 4. Calibration assembly; 5. Fixing base; 61. Shaft; 62. First transmission part; 63. Second transmission part; 64. Third transmission part; 7. Photoelectric switch. Detailed Implementation

[0033] Although the present invention can be readily embodied in various forms, only some specific embodiments are shown in the accompanying drawings and will be described in detail in this specification. It is understood that this specification should be regarded as an exemplary illustration of the principles of the present invention and is not intended to limit the present invention to what is described herein.

[0034] Therefore, a feature pointed out in this specification is used to describe one feature of one embodiment of the present invention, and does not imply that every embodiment of the present invention must have the described feature. Furthermore, it should be noted that this specification describes many features. Although certain features may be combined to illustrate possible system designs, these features may also be used in other combinations not explicitly stated. Therefore, unless otherwise stated, the described combinations are not intended to be limiting.

[0035] In the embodiments shown in the accompanying drawings, the directional indications (such as up, down, left, right, front, and back) used to explain the structure and movement of the various elements of this invention are relative rather than absolute. These descriptions are appropriate when these elements are in the positions shown in the drawings. If the descriptions of the positions of these elements change, these directional indications also change accordingly.

[0036] The present application will be further described in detail below with reference to the accompanying drawings and embodiments.

[0037] Example 1

[0038] According to one embodiment shown in this example, the construction can be referred to as [example]. Figure 1-2 Throughout this view, the same reference numerals denote corresponding components. It should be understood that the near-infrared analysis apparatus according to this embodiment can be used in all near-infrared analysis application scenarios.

[0039] like Figure 1 As shown, the near-infrared analysis device of this embodiment includes: a light source assembly 1, a light-collecting assembly 2, a material-containing assembly 3, a spectrometer (not shown in the figure), a calibration assembly 4, a fixed substrate 5, a transmission assembly, a photoelectric switch 7, and a drive assembly (not shown in the figure). Figure 1 As shown, along the direction of gravity, the material holding component 3 in this embodiment is a hollow structure with the opening facing upwards. It has a sample receiving cavity. The top opening position of the hollow material holding component 3 corresponds to the upper end face of the material holding component 3, and its bottom position corresponds to the lower end face of the material holding component 3. The upper end face and the lower end face of the material holding component 3 are arranged opposite to each other along the direction of gravity.

[0040] In this embodiment, the fixing base 5 is a plate-shaped structure. The fixing base 5 is located at the bottom of the material holding assembly 3, and the light source assembly 1 and the light receiving assembly 2 are respectively disposed on the fixing base 5. The material holding assembly 3, the light receiving assembly 2 and the light source assembly 1 are arranged in sequence. The light emitting side of the light source assembly 1 faces the material holding assembly 3, and the light receiving side of the light receiving assembly 2 faces the material holding assembly 3.

[0041] The transmission assembly includes a shaft 61, a first transmission part 62, a second transmission part 63, and a third transmission part 64. In this embodiment, the shaft 61 is a hollow, regular cylindrical structure. The first transmission part 62, the second transmission part 63, and the third transmission part 64 are all rod-shaped structures. One end of the first transmission part 62 passes through the hollow portion of the shaft 61 and is inserted into the shaft 61. The other end of the first transmission part 62 is connected to one end of the second transmission part 63 via a connector. Similarly, the other end of the second transmission part 63 is connected to one end of the third transmission part 64 via a connector. The other end of the third transmission part 64 is fixedly connected to the bottom of the material holding assembly 3. The connector can be an existing transmission connection method, such as a meshing gear structure. Specifically, the other end of the first transmission part 62 has a gear, and the circumferential surface of one end of the second transmission part 63 connected to it has a tooth structure that meshes with the gear. See also... Figure 1-2 The first transmission part 62 is perpendicular to the shaft 61, the first transmission part 62 is perpendicular to the second transmission part 63, the second transmission part 63 is perpendicular to the third transmission part 64, and the third transmission part 64 is perpendicular to the bottom of the material holding assembly 3. In this embodiment, the rotation of the shaft 61 can drive the material holding assembly 3 to rotate via the first transmission part 62, the second transmission part 63, and the third transmission part 64.

[0042] As an example, the driving component is a commercially available 42-stepper motor, the photoelectric switch 7 can be a commercially available conventional photoelectric switch such as the Hall switch "QLHF2_NPN normally open", the calibration component 4 can be a commercially available combination such as "alumina ceramic sheet + near-infrared wavelength sheet", the spectrometer can be an existing spectrometer such as the ATP8600 model, the light source component 1 is a common halogen lamp, and the light receiving component 2 is a commercially available light receiving fiber.

[0043] The spectrometer is connected to the light-collecting component 2, and the calibration component 4 is located at the bottom of the material-holding component 3 and connected to the spectrometer. The signal output terminal of the photoelectric switch 7 faces the material-holding component 3. The drive output shaft of the drive component is connected to the shaft body 61, and drives the material-holding component 3 to rotate through the transmission component.

[0044] Based on the above structural description, in this embodiment, see... Figure 1-2Light emitted from an external light source passes through the light source assembly 1 to form a detection beam. This beam directly strikes the lower surface of the object being measured in the material container 3. The diffusely reflected light from the object is collected by the light-collecting assembly 2 and enters the spectrometer for measurement. Simultaneously, the drive assembly can be activated, causing the shaft 61 to rotate. The shaft 61 then drives the first transmission part 62 to rotate, which in turn drives the second transmission part 63 and the third transmission part 64 to rotate. Finally, the third transmission part 64 drives the material container 3 to rotate, thus switching the positions of the material container 3 and the calibration assembly 4. Furthermore, the photoelectric switch 7 senses the rotation of the material container 3 to determine its position and measurement cycle. The calibration assembly 4 is used to calibrate the spectrometer.

[0045] In this embodiment, since both the light source assembly 1 and the light receiving assembly 2 are located below the material holding assembly 3, the lower surface of the object being measured becomes flat due to gravity. That is, the irradiated surface of the object being measured becomes naturally flat under the action of gravity, so that the distance between the light receiving assembly 2 and the object being measured remains constant during multiple operations, thereby ensuring the measurement results.

[0046] The near-infrared analysis device of this embodiment has the following advantages:

[0047] (1) It can ensure that the distance between the object being measured and the light-collecting component 2 remains constant during multiple operations, thereby guaranteeing the measurement results;

[0048] (2) The overall structure is reasonably and compactly distributed, which can ensure a good light collection effect.

[0049] This specific embodiment is merely an explanation of this application and is not intended to limit it. After reading this specification, those skilled in the art can make modifications to this embodiment without contributing any inventive step, but such modifications are protected by patent law as long as they fall within the scope of the claims of this application.

Claims

1. A near-infrared analysis device, characterized in that, The device includes a light source assembly, a light receiving assembly, and a material holding assembly. The light emitting side of the light source assembly faces the material holding assembly, and the light receiving side of the light receiving assembly faces the material holding assembly. The material holding assembly includes an upper end surface and a lower end surface that are arranged opposite each other along the direction of gravity. The light source assembly and the light receiving assembly are respectively located on the side close to the lower end surface of the material holding assembly.

2. The near-infrared analysis device according to claim 1, characterized in that, The material holding assembly, light receiving assembly, and light source assembly are arranged in sequence.

3. The near-infrared analysis device according to claim 1 or 2, characterized in that, It also includes a spectrometer, which is connected to the light-collecting component.

4. The near-infrared analysis device according to claim 3, characterized in that, It also includes a calibration component, which is connected to the spectrometer and is located on the lower end face of the material holding component.

5. The near-infrared analysis device according to claim 4, characterized in that, It also includes a fixing base, which is located on one side near the lower end face of the material holding assembly, and the light source assembly and the light receiving assembly are respectively located on the fixing base.

6. The near-infrared analysis device according to claim 5, characterized in that, It also includes a transmission component, which is connected to the material holding component in a driving manner.

7. The near-infrared analysis device according to claim 6, characterized in that, The transmission assembly includes a shaft, a first transmission part, a second transmission part, and a third transmission part. The first transmission part is disposed on the shaft, and the first transmission part, the second transmission part, and the third transmission part are sequentially connected for transmission. The third transmission part is connected to the material holding assembly.

8. The near-infrared analysis device according to claim 7, characterized in that, It also includes a photoelectric switch, the signal output terminal of which faces the material holding assembly.

9. The near-infrared analysis device according to claim 8, characterized in that, It also includes a drive assembly, the drive output shaft of which is connected to the shaft body and drives the material holding assembly to rotate through the transmission assembly.

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