An active linear array automatic test device
By designing an active linear array automatic testing device, which employs a computer-controlled RF switch matrix and instrumentation unit, automated testing is achieved. This solves the problems of low efficiency and poor accuracy of traditional testing devices, improves testing speed and accuracy, and enhances production efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- CNGC INST NO 206 OF CHINA ARMS IND GRP
- Filing Date
- 2025-06-27
- Publication Date
- 2026-06-19
AI Technical Summary
Traditional active linear array testing devices require manual operation, resulting in low measurement efficiency and a high risk of statistical errors, failing to meet the high efficiency and high precision requirements of production sites.
Design an active linear array automatic testing device, which adopts a computer-controlled RF switch matrix and instrument unit to realize automated testing. The RF switch matrix connects input and output signals, the computer controls the switching of measurement channels, the instrument unit performs measurement and data reading, and automatically judges and displays the test results.
It improves testing speed and accuracy, reduces equipment wear and tear, is stable and reliable, and significantly improves the efficiency of production debugging and delivery.
Smart Images
Figure CN224383349U_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to the field of automatic testing technology for active linear arrays, and more particularly to an automatic testing device for active linear arrays. Background Technology
[0002] With the finalization of research products and their transition to mass production, active linear array devices, characterized by large quantities per unit, numerous electrical performance parameters, and high requirements for testing complexity and accuracy, result in heavy production workloads during debugging and testing. Traditional testing equipment requires manual operation and the use of multiple instruments to build the testing platform. This not only necessitates manual result statistics, leading to low measurement efficiency but also increases the risk of statistical errors and inaccurate measurement results. Therefore, traditional manual testing equipment is no longer sufficient for current production conditions, and there is an urgent need to adopt automated testing equipment to complete the testing tasks.
[0003] Therefore, it is necessary to improve one or more of the problems existing in the above-mentioned related technical solutions.
[0004] It should be noted that this section is intended to provide background or context for the technical solutions of this disclosure as set forth in the claims. The description herein does not constitute an admission that it is prior art simply because it is included in this section. Utility Model Content
[0005] The purpose of this disclosure is to provide an automatic testing device for active linear arrays, thereby overcoming, at least to some extent, one or more problems caused by the limitations and defects of related technologies.
[0006] According to an embodiment of this disclosure, an automatic testing device for active linear arrays is provided, the device comprising:
[0007] The server rack has external displays and internal components including computers, instrumentation units, an RF switch matrix, product adapter units, and a dedicated power supply.
[0008] The computer is electrically connected to the monitor, instrument unit, product adapter unit, RF switch matrix, and dedicated power supply, respectively. The RF switch matrix is electrically connected to the product adapter unit.
[0009] Furthermore, the radio frequency switch matrix includes:
[0010] Multiple RF switches, network interface modules, and power supply modules; among which,
[0011] The radio frequency switch is electrically connected to the instrument unit, the network interface module, and the power supply module, respectively. The network interface module is electrically connected to the computer.
[0012] Furthermore, the instrument unit includes at least:
[0013] Signal source, spectrum analyzer, and phase meter; among which,
[0014] The signal source, spectrum analyzer, and phase meter are all electrically connected to the computer and RF switch, respectively.
[0015] Furthermore, the RF switch matrix is equipped with multiple RF cables for connecting to the active linear array under test.
[0016] Furthermore, there are 32 radio frequency cables.
[0017] Furthermore, the product adapter unit is also equipped with a control cable for connecting to the active linear array under test.
[0018] Furthermore, the dedicated power supply is also equipped with a power cable for supplying power to the active linear array under test.
[0019] Furthermore, the device also includes:
[0020] The router is located between the computer electrical and instrumentation unit, the radio frequency switch matrix, the product adapter unit, and the dedicated power supply unit.
[0021] Furthermore, the device also includes:
[0022] The keyboard is electrically connected to the computer.
[0023] The technical solutions provided by the embodiments of this disclosure may include the following beneficial effects:
[0024] In the embodiments of this disclosure, the aforementioned automatic testing device for active linear arrays, on the one hand, connects the inputs and outputs of the active linear array under test to the instrument unit via an RF switch matrix. The computer controls the RF switch matrix to switch measurement channels, switches the operating state of the active linear array via the product adapter unit, and sets and controls the instrument unit to perform measurement and test data reading via network connection. During the test, the device judges whether the test results meet the specifications and displays the results on the interface. After the test is completed, the results can be saved and printed as needed according to the required format. On the other hand, this device uses a multi-channel RF switch matrix, replacing the traditional manual switching test with automated electronic switch switching. This not only greatly improves the testing speed but also ensures stable and reliable performance, high accuracy and repeatability, and low equipment wear, thus improving the production debugging and acceptance methods of the subsystem and significantly increasing the efficiency of production debugging and acceptance. Attached Figure Description
[0025] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure. It is obvious that the drawings described below are merely some embodiments of this disclosure, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort.
[0026] Figure 1 This diagram illustrates the structure of an automatic testing device for an active linear array according to an exemplary embodiment of the present disclosure.
[0027] Figure 2 This diagram illustrates the composition principle of an automatic testing apparatus for a source linear array in an exemplary embodiment of the present disclosure.
[0028] In the diagram, 1 is the cabinet; 2 is the monitor; 3 is the instrument unit; 4 is the RF switch matrix; 5 is the product adapter unit; 6 is the dedicated power supply; and 7 is the keyboard. Detailed Implementation
[0029] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, they are provided so that this disclosure will be more comprehensive and complete, and will fully convey the concept of the exemplary embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
[0030] Furthermore, the accompanying drawings are merely illustrative diagrams of embodiments of this disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and therefore repeated descriptions of them will be omitted. Some block diagrams shown in the drawings are functional entities and do not necessarily correspond to physically or logically independent entities.
[0031] This example embodiment first provides an automatic testing device for an active linear array. (Reference) Figure 1 As shown, the active linear array automatic testing device may include:
[0032] The cabinet (1) has a monitor (2) on its exterior and a computer, an instrument unit (3), an RF switch matrix (4), a product adapter unit (5), and a dedicated power supply (6) inside.
[0033] The computer is electrically connected to the monitor (2), the instrument unit (3), the product adapter unit (5), the radio frequency switch matrix (4), and the dedicated power supply (6), respectively. The radio frequency switch matrix (4) is electrically connected to the product adapter unit (5).
[0034] The aforementioned automatic testing device for active linear arrays allows for several improvements. Firstly, the inputs and outputs of the active linear array under test are connected to the instrumentation unit via an RF switch matrix. The computer controls the RF switch matrix to switch measurement channels, switches the operating state of the active linear array via the product adapter unit, and sets and controls the instrumentation unit to perform measurements and read test data via network connection. During testing, the device judges whether the test results meet the specifications and displays the results on the interface. After testing, the results can be saved and printed as needed according to the required format. Secondly, the device uses a multi-channel RF switch matrix, replacing traditional manual switching with automated testing via electronic switch switching. This significantly improves testing speed, ensures stable and reliable performance, high accuracy and repeatability, and minimizes equipment wear. It also improves the production, commissioning, and acceptance methods for subsystems, greatly enhancing the efficiency of these processes.
[0035] Below, we will refer to Figures 1 to 2 The various parts of the above-described active linear array automatic testing device in this example embodiment will be described in more detail.
[0036] In one embodiment, to improve debugging and testing methods, an automatic testing device for active linear arrays is provided, which effectively solves the problem of instrument shortage in the production process. It can simultaneously complete the testing of multiple linear arrays, greatly accelerating the testing and debugging progress of production. Compared with previous testing systems, this automatic testing device for active linear arrays has fully automatic testing capabilities. After the active linear array is installed in the test bracket, the selected test items can be completed through simple operation of the software interface. The cabinet (1) installation method adopted can be easily adapted to any testing scenario. In addition, through simple hardware expansion and software design, this automatic testing device for active linear arrays can be applied to the testing of other projects or subsystems.
[0037] like Figure 1 The diagram shown is a schematic of the structural layout of an automatic testing device for an active linear array. Figure 2 This is a block diagram illustrating the composition principle of an automatic testing device for active linear arrays.
[0038] This automatic testing device has the following functions:
[0039] a) Generate the various frequency signals and control signals required for the active receiving linear array and active transceiver linear array of the front-end subsystem of a certain radar project;
[0040] b) It can simultaneously test multiple active receiving linear arrays and active transceiver linear arrays (maximum capacity is 16 linear arrays / test).
[0041] c) The test is completed and displayed automatically using computer software. The test results are automatically stored and can be printed out.
[0042] d) The interface is expandable and the software is configurable. The product adapter unit (5) and the dedicated power supply (6) are designed only for active linear array radar projects.
[0043] e) The system has a self-test function, and testing software can be used to determine whether the system is normal.
[0044] Its working principle is as follows: the input and output of the active linear array are connected to the instrument unit (3) through the radio frequency switch matrix (4). The computer controls the radio frequency switch matrix (4) to switch the measurement channel, switches the working state of the active linear array through the product adapter unit (5), and sets and controls the instrument unit (3) to perform measurement and test data reading through network connection. During the test, the test results are judged to be qualified and indicate whether the indicators are met. Finally, the test results are displayed on the interface. After the test is completed, they can be saved and printed out according to the format requirements as needed.
[0045] In one embodiment, the RF switch matrix (4) is used for automatic switching of each channel and each input / output signal during the testing process. Structurally, it adopts a standard 19-inch 6U chassis and mainly consists of RF switches, a network interface module, and a power supply module. Its main functions include:
[0046] a) Distribution of local oscillator / excitation signals. A total of 32 channels are used to switch the local oscillator / transmit excitation signals provided to 16 active linear arrays.
[0047] b) Channel selection for receiving intermediate frequency (IF) signals. A total of 32 channels are available for switching the IF output signals of the active receiving linear array and the active transceiver linear array receiving channels.
[0048] c) Switching of detection channels. A total of 32 channels are used for switching the transmit output power coupling signal and the receive branch RF input signal.
[0049] The RF switch matrix (4) consists of multiple cascaded SP4T and SP8T switches forming a 4:32-channel RF switch. Considering the switching process and connection status after switching, the selected RF switches are absorptive type, ensuring that unconnected ports are also in a matched state, reducing the impact on the system under test and the test system itself. The RF switch matrix (4) converts the network signal from the computer into a switching control signal within the matrix via a network interface module. This control signal controls the switching of each RF switch, achieving 4 inputs / outputs (only one active at a time) and 32 outputs / inputs (only one active at a time).
[0050] In one embodiment, the product adapter unit (5) is designed as a separate unit to ensure the versatility of the automatic testing device. The product adapter unit (5) can be replaced / reconfigured to meet the control requirements of different products. When the product adapter unit (5) receives a network control signal from the computer, it converts the command into its own serial control command via a network-to-serial converter, and then sends it to the MCU+FPGA unit. After decoding by the MCU, it controls the FPGA to output the required timing and setting parameters for multiple active linear arrays. The main functions of the product adapter unit (5) of the automatic testing device are:
[0051] a) It can convert computer commands into product control commands through a network interface, providing the operating timing and setting parameters of the active linear array;
[0052] b) It can simultaneously control 16 active linear arrays (active receiver linear array / active transceiver linear array).
[0053] In one embodiment, the instrument unit (3) includes a signal source module, a spectrum analyzer module, and a phase measurement module. The signal source module is used to provide local oscillator / transmit excitation signals and detection signals (the detection signals are used to simulate received echo signals); the spectrum analyzer module is used to measure the frequency and amplitude of each radio frequency signal; and the phase measurement module is used to measure the phase shift of the transmit branch.
[0054] In addition, the COM port of the switch matrix will be connected to the instrument (i.e., the instrument unit) to provide input and output signals of the device under test. Different COM ports will be connected to different instruments to meet the measurement connection of different functions.
[0055] In one embodiment, the automatic test device cabinet (1) contains a dedicated power supply (6), a product adapter unit (5), an RF switch matrix (4), an instrument unit (3), a keyboard (7) (part of a computer), a monitor (2), and a computer (the computer is mounted behind the monitor (2)). The entire cabinet (1) adopts a standard 19-inch rack design, and the order of each unit can be changed as needed. It uses a universal interface and reserves certain expansion capabilities. The active linear array under test is connected and fixed on the mounting frame. The automatic test device cabinet (1) and the active linear array under test are connected by multiple RF cables, control cables, and power supply cables to complete the connection, control, and testing of various indicators of the active linear array under test.
[0056] In one specific embodiment, the device mainly consists of a computer (including a router), an RF switch matrix (4), a product adapter unit (5), a dedicated power supply (6), auxiliary tooling (including test cables, a microwave absorption box, and an active linear array mounting frame), and an instrument unit (3) (signal source module, spectrum analyzer module, and phase measurement module). During the test, the device under test is fixed in the mounting frame on the right side. Multiple RF cables, control cables, and power supply cables connect the automatic test device cabinet (1) and the active linear array under test. Turn on the main power switch, wait for all the green lights to light up, start the computer's host computer test software, select the active receiving linear array or active transceiver linear array test object, and enter the product batch number or production serial number. After the test is completed, the report can be automatically saved, and the unqualified indicators will be highlighted in red.
[0057] The aforementioned automatic testing device for active linear arrays allows for several improvements. Firstly, the inputs and outputs of the active linear array under test are connected to the instrumentation unit via an RF switch matrix. The computer controls the RF switch matrix to switch measurement channels, switches the operating state of the active linear array via the product adapter unit, and sets and controls the instrumentation unit to perform measurements and read test data via network connection. During testing, the device judges whether the test results meet the specifications and displays the results on the interface. After testing, the results can be saved and printed as needed according to the required format. Secondly, the device uses a multi-channel RF switch matrix, replacing traditional manual switching with automated testing via electronic switch switching. This significantly improves testing speed, ensures stable and reliable performance, high accuracy and repeatability, and minimizes equipment wear. It also improves the production, commissioning, and acceptance methods for subsystems, greatly enhancing the efficiency of these processes.
[0058] It should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc., in the above description indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the embodiments of this disclosure and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this disclosure.
[0059] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of embodiments of this disclosure, "a plurality of" means two or more, unless otherwise explicitly specified.
[0060] In the embodiments of this disclosure, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this disclosure according to the specific circumstances.
[0061] In embodiments of this disclosure, unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature being directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature being directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0062] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this disclosure. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. In addition, those skilled in the art can combine and integrate the different embodiments or examples described in this specification.
[0063] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the utility models disclosed herein. This application is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the appended claims.
Claims
1. An active linear array automatic test device, characterized by, The device includes: The server rack has external displays and internal components including computers, instrumentation units, an RF switch matrix, product adapter units, and a dedicated power supply. The computer is electrically connected to the monitor, instrument unit, product adapter unit, RF switch matrix, and dedicated power supply, respectively. The RF switch matrix is electrically connected to the product adapter unit.
2. The active linear array automatic testing device according to claim 1, characterized in that, The RF switch matrix includes: Multiple RF switches, network interface modules, and power supply modules; among which, The radio frequency switch is electrically connected to the instrument unit, the network interface module, and the power supply module, respectively. The network interface module is electrically connected to the computer.
3. The active linear array automatic testing device according to claim 2, characterized in that, The instrument unit includes at least: Signal source, spectrum analyzer, and phase meter; among which, The signal source, spectrum analyzer, and phase meter are all electrically connected to the computer and RF switch, respectively.
4. The active linear array automatic test apparatus of claim 1, wherein The RF switch matrix is also equipped with multiple RF cables for connecting to the active linear array under test.
5. The active linear array automatic test device of claim 1, wherein, There are 32 radio frequency cables.
6. The active linear array automatic test device of claim 1, wherein, The product adapter unit also includes a control cable for connecting to the active linear array under test.
7. The active linear array automatic test device of claim 1, wherein The dedicated power supply is also equipped with a power cable for supplying power to the active linear array under test.
8. The active linear array automatic testing device according to claim 1, characterized in that, The device also includes: The router is located between the computer electrical and instrumentation unit, the radio frequency switch matrix, the product adapter unit, and the dedicated power supply unit.
9. The active linear array automatic testing device according to claim 1, characterized in that, The device also includes: The keyboard is electrically connected to the computer.