Modular substation testing system

Abstract

This utility model discloses a modular substation testing system, relating to the field of power system automation technology. The system receives test data from the substation via a module under test (DUT). The data is amplified and filtered before being input to a signal conversion circuit, significantly reducing signal noise and loss during measurement. The system processes the data and analyzes the link establishment time. A successive approximation AD chip is then used for conversion. The system collaborates with a host computer to verify the data acquisition accuracy, focusing on circuit design optimization and detailed performance testing. This ensures the tested data can safely and quickly enter the monitoring state, enabling control and data storage of multiple test data sets. The combined data is then sent to the automated testing module for automated testing. This achieves automated testing control using artificial intelligence, improving the efficiency of automated testing.

Description

Technical Field

[0001] This utility model relates to the field of power system automation technology, and in particular to a modular substation testing system. Background Technology

[0002] A substation is a location in a power system that transforms voltage and current, receives electrical energy, and distributes it. Substations within power plants are step-up substations, whose function is to step up the voltage of the electrical energy generated by generators before feeding it into the high-voltage power grid.

[0003] In the existing technology, mobile substations are usually composed of modular substations. However, after the modular substation is moved or during the move, signal interference, location changes and other reasons may cause the power grid time to be inconsistent, which cannot guarantee the economic and stable operation of the power grid. Therefore, there is room for improvement.

[0004] In power systems, automation devices in smart substations, such as protection and measurement and control systems, monitor and control the primary and secondary equipment of the entire substation. They also perform time-related testing functions such as remote control hold time, remote signaling anti-jitter, and SOE resolution. With the development of smart grid construction, more and more new smart substations are being built. The reliability of the functions and performance of these devices directly affects the safe operation of the substation; therefore, testing of smart substation automation devices is extremely important.

[0005] Currently, time correlation testing of automated devices still relies on some single-function debugging tools, such as multimeters, oscilloscopes, and simple switch quantity testers. Some of these instruments have simple functions, are inconvenient to use, or have low accuracy. Others require multiple instruments to complete the test, which cannot meet the testing needs of smart substations. Utility Model Content

[0006] The purpose of this invention is to address the shortcomings and deficiencies of existing technologies by providing a modular substation testing system, thereby solving the problems of inconvenient and low-precision testing of intelligent substation automation devices in the existing technology.

[0007] To achieve the above objectives, this utility model provides the following technical solution:

[0008] A modular substation testing system includes a module under test (DUT), a multiplexer, a signal preprocessing module, an analog-to-digital converter (ADC), a microcontroller module, an RF switch circuit, a wireless RF chip, a data storage module, a clock module, a crystal oscillator module, a command input module, and a power supply module. The DUT is connected to the microcontroller module sequentially via the multiplexer, the signal preprocessing module, and the ADC. The data storage module, clock module, crystal oscillator module, command input module, and power supply module are all connected to the microcontroller module. The microcontroller module is connected to the wireless RF chip via the RF switch circuit. The power supply module includes a high-frequency converter, a filter circuit, a DC / DC converter, and a voltage regulator circuit. The high-frequency converter is connected to the microcontroller module sequentially via the filter circuit, the DC / DC converter, and the voltage regulator circuit.

[0009] As a further preferred embodiment of the modular substation testing system of this utility model, the signal preprocessing module includes an amplifier circuit and a dual operational amplifier bandpass filter. The amplifier circuit consists of an OPA277 operational amplifier and resistors and capacitors, and the dual operational amplifier bandpass filter consists of two OPA277 operational amplifiers.

[0010] As a further preferred embodiment of the modular substation testing system of this utility model, the multiplexer is model AMC4601.

[0011] As a further preferred embodiment of the modular substation testing system of this utility model, the analog-to-digital converter module adopts an AD7794 analog-to-digital converter.

[0012] As a further preferred embodiment of the modular substation testing system of this utility model, the filter circuit includes a resistor R9 and a capacitor C9; the DC / DC converter and its peripheral circuit include a voltage input VIN terminal, resistors R1, R2, R3, and R7, capacitors C1, C2, C3, C5, C6, C7, C8, and C10, an inductor L1, a chip FR9885, and a voltage output VDCDC terminal;

[0013] In this circuit, the PWM terminal of the high-frequency converter is connected to one end of resistor R4. The other end of resistor R4 is connected to one end of capacitor C9 and one end of resistor R5. The other end of capacitor C9 is grounded. The voltage input VIN terminal is connected to one end of capacitor C1, one end of capacitor C2, and the VIN terminal of chip FR9885. The other end of capacitor C1 is connected to the other end of capacitor C2, one end of capacitor C3, and the GND terminal of chip FR9885, and grounded. The other end of capacitor C3 is connected to one end of resistor R1. The other end of resistor R1 is connected to the SHDN terminal of chip FR9885. The BST terminal of chip FR9885 is connected to one end of capacitor C10. The other end of capacitor C10 is connected to the LX terminal of chip FR9885 and one end of inductor L1. The other end of inductor L1 is connected to one end of resistor R2, one end of capacitor C5, one end of capacitor C6, one end of capacitor C7, one end of capacitor C8, and the anode of diode D2. The other end of capacitor C5 is connected to the other end of resistor R2 and resistor R3. One end of the resistor R5 is connected to the FB terminal of the FR9885 chip. The other end of the resistor R3 is grounded. The other end of the capacitor C6 is connected to the other ends of the capacitors C7 and C8 respectively and grounded. The cathode of the diode D2 is connected to one end of the capacitor C11, one end of the capacitor C12, the cathode of the diode TVS7, and pin 1 of the chip LM2596 respectively. Pin 2 of the chip LM2596 is connected to the cathode of the Zener diode Z1 and one end of the inductor L2 respectively. The other end of the inductor L2 is connected to one end of the capacitor C13, one end of the resistor R19 and pin 4 of the chip LM2596 respectively. The other end of the resistor R19 is connected to the anode of the light-emitting diode PLED1. The cathode of the light-emitting diode PLED1 is connected to the anode of the diode TVS7, the other end of the capacitor C11, the other end of the capacitor C12, pin 0, pin 3, pin 5 of the chip LM2596, the anode of the Zener diode Z1, and the other end of the capacitor C13 and grounded.

[0014] As a further preferred embodiment of the modular substation testing system of this utility model, the crystal oscillator module includes a control chip 7N10.000MBP, a capacitor C45, resistors R22, R23, and R24, a capacitor C69, and a voltage VCC terminal. The 8th interface of the control chip 7N10.000MBP is connected to one end of the resistor R22. The other end of the resistor R22 is connected to one end of the capacitor C45, the 9th interface of the control chip 7N10.000MBP, one end of the resistor R23, and the voltage VCC terminal. The other end of the capacitor C45 is grounded. The other end of the resistor R23 is connected to one end of the resistor R24, and the other end of the resistor R24 ​​is grounded. The 10th interface of the control chip 7N10.000MBP is connected to one end of the capacitor C69, and the other end of the capacitor C69 is grounded.

[0015] As a further preferred embodiment of the modular substation testing system of this utility model, the microcontroller module is an STM32.

[0016] As a further preferred embodiment of the modular substation testing system of this utility model, the clock module is model DS1302.

[0017] Compared with the prior art, the present invention, by adopting the above technical solution, has the following technical effects:

[0018] This utility model discloses a modular substation testing system, comprising a module under test (DUT), a multiplexer, a signal preprocessing module, an analog-to-digital converter (ADC), a microcontroller module, an RF switch circuit, a wireless RF chip, a data storage module, a clock module, a crystal oscillator module, a command input module, and a power supply module. The DUT receives the test data from the substation through the DUT module. The data is amplified and filtered before being input to the signal conversion circuit, significantly reducing signal noise and loss during measurement. The system processes the data and analyzes the link establishment time. A successive approximation AD chip is then used for conversion. The system collaborates with a host computer to verify the data acquisition accuracy, focusing on circuit design optimization and detailed performance testing. This ensures the DUT data can safely and quickly enter the monitoring state, enabling control and data storage of multiple test data sets. The combined data is then sent to the automated testing module for automated testing. This achieves automated testing control using artificial intelligence, improving the efficiency of automated testing. Attached Figure Description

[0019] The accompanying drawings, which are provided to further illustrate the present invention and form part of this application, do not constitute an undue limitation of the present invention. In the drawings:

[0020] Figure 1 This is a schematic diagram of the structural principle of a modular substation testing system according to this utility model;

[0021] Figure 2 This is a circuit diagram of the signal preprocessing module of this utility model;

[0022] Figure 3 This is a circuit diagram of the filter circuit and DC / DC converter of this utility model;

[0023] Figure 4 This is the circuit diagram of the crystal oscillator module of this utility model. Detailed Implementation

[0024] The present invention will now be described in detail with reference to the accompanying drawings and specific embodiments. The illustrative embodiments and descriptions are only used to explain the present invention and are not intended to limit the present invention.

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present utility model, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of the present utility model without creative effort are within the scope of protection of the present utility model.

[0026] A modular substation testing system, such as Figure 1 As shown, the system includes a module under test (DUT), a multiplexer, a signal preprocessing module, an analog-to-digital converter (ADC), a microcontroller module, an RF switch circuit, a wireless RF chip, a data storage module, a clock module, a crystal oscillator module, a command input module, and a power supply module. The DUT is connected to the microcontroller module sequentially via the multiplexer, the signal preprocessing module, and the ADC. The data storage module, clock module, crystal oscillator module, command input module, and power supply module are all connected to the microcontroller module. The microcontroller module is connected to the wireless RF chip via the RF switch circuit. The power supply module includes a high-frequency converter, a filter circuit, a DC / DC converter, and a voltage regulator circuit. The high-frequency converter is connected to the microcontroller module sequentially via the filter circuit, the DC / DC converter, and the voltage regulator circuit.

[0027] This invention utilizes the measured data from a substation connected to the module under test. The data is amplified and filtered before being input to a signal conversion circuit, significantly reducing signal noise and loss during measurement. The data is processed, and the link establishment time is analyzed. A successive approximation AD chip is then used for conversion. The data acquisition accuracy is verified in conjunction with a host computer, with a focus on optimizing the circuit design and conducting detailed performance tests. This ensures the measured data can safely and quickly enter the monitoring state, enabling control and data storage of multiple test data sets. The combined data is then sent to the automated testing module for automated testing, achieving AI-based automated testing control and improving the efficiency of automated testing.

[0028] like Figure 2As shown, the signal preprocessing module includes an amplifier circuit and a dual op-amp bandpass filter. The amplifier circuit consists of an OPA277 operational amplifier and resistors and capacitors. The dual op-amp bandpass filter consists of two OPA277 operational amplifiers. Specifically, it includes a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, an eighth resistor, a ninth resistor, a first capacitor, a second capacitor, a third capacitor, a fourth capacitor, a first operational amplifier, a second operational amplifier, and a third operational amplifier. The signal input -IN terminal is connected to one end of the first resistor. The other end of the first resistor is connected to one end of the first capacitor, one end of the third resistor, and the negative power supply pin of the first operational amplifier. The other end of the first capacitor is connected to the other end of the third resistor and the output pin of the first operational amplifier. The signal input +IN terminal is connected to one end of the second resistor. The other end of the second resistor is connected to the positive power supply pin of the first operational amplifier, one end of the fourth resistor, and the second... One end of the capacitor is connected to the other end of the second capacitor and grounded. The output pin of the first operational amplifier is connected to one end of the fifth resistor. The other end of the fifth resistor is connected to the positive power supply pin of the second operational amplifier. The negative power supply pin of the second operational amplifier is connected to the negative power supply pin of the third operational amplifier. The positive power supply pin of the third operational amplifier is connected to one end of the eighth resistor and one end of the ninth resistor. The other end of the ninth resistor is grounded. The other end of the eighth resistor is connected to one end of the seventh resistor and the output pin of the second operational amplifier. The other end of the seventh resistor is connected to one end of the fourth capacitor. The other end of the fourth capacitor is connected to one end of the ninth resistor. The other end of the ninth resistor is connected to one end of the third capacitor. The other end of the third capacitor is grounded.

[0029] This utility model's signal preprocessing module amplifies and filters the acquired data before inputting it into the signal conversion circuit, significantly reducing signal noise and signal loss during measurement. The amplification circuit consists of an OPA277 operational amplifier and resistors / capacitors, forming a typical differential amplifier circuit. C3 and R6, and C4 and R7 form a low-pass filter. A dual-op-amp bandpass filter is formed by two OPA277 operational amplifiers. The Q value and center frequency of this bandpass filter are adjustable; adjusting R9 adjusts the circuit's resonant frequency, and adjusting R8 adjusts the Q value.

[0030] Preferably, the multiplexer is an AMC4601.

[0031] The analog-to-digital converter module uses an AD7794 model analog-to-digital converter.

[0032] like Figure 3As shown, the filter circuit includes resistor R9 and capacitor C9; the DC / DC converter and its peripheral circuits include voltage input VIN terminal, resistors R1, R2, R3, and R7, capacitors C1, C2, C3, C5, C6, C7, C8, and C10, inductor L1, chip FR9885, and voltage output VDCDC terminal;

[0033] In this circuit, the PWM terminal of the high-frequency converter is connected to one end of resistor R4. The other end of resistor R4 is connected to one end of capacitor C9 and one end of resistor R5. The other end of capacitor C9 is grounded. The voltage input VIN terminal is connected to one end of capacitor C1, one end of capacitor C2, and the VIN terminal of chip FR9885. The other end of capacitor C1 is connected to the other end of capacitor C2, one end of capacitor C3, and the GND terminal of chip FR9885, and grounded. The other end of capacitor C3 is connected to one end of resistor R1. The other end of resistor R1 is connected to the SHDN terminal of chip FR9885. The BST terminal of chip FR9885 is connected to one end of capacitor C10. The other end of capacitor C10 is connected to the LX terminal of chip FR9885 and one end of inductor L1. The other end of inductor L1 is connected to one end of resistor R2, one end of capacitor C5, one end of capacitor C6, one end of capacitor C7, one end of capacitor C8, and the anode of diode D2. The other end of capacitor C5 is connected to the other end of resistor R2 and resistor R3. One end of the resistor R5 is connected to the FB terminal of the FR9885 chip. The other end of the resistor R3 is grounded. The other end of the capacitor C6 is connected to the other ends of the capacitors C7 and C8 respectively and grounded. The cathode of the diode D2 is connected to one end of the capacitor C11, one end of the capacitor C12, the cathode of the diode TVS7, and pin 1 of the chip LM2596 respectively. Pin 2 of the chip LM2596 is connected to the cathode of the Zener diode Z1 and one end of the inductor L2 respectively. The other end of the inductor L2 is connected to one end of the capacitor C13, one end of the resistor R19 and pin 4 of the chip LM2596 respectively. The other end of the resistor R19 is connected to the anode of the light-emitting diode PLED1. The cathode of the light-emitting diode PLED1 is connected to the anode of the diode TVS7, the other end of the capacitor C11, the other end of the capacitor C12, pin 0, pin 3, pin 5 of the chip LM2596, the anode of the Zener diode Z1, and the other end of the capacitor C13 and grounded.

[0034] The high-frequency converter generates a PWM wave with a variable duty cycle by adjusting its PWM module. The filter circuit consists of simple resistors and capacitors. The selection of resistor and capacitor values ​​depends on the first harmonic component of the PWM wave. In order to respond to the power request in a timely manner, the high-frequency converter needs to adjust the duty cycle of the PWM wave and increase or decrease the power received accordingly. The PWM output pin of the high-frequency converter processor needs to be connected to the DC / DC feedback pin after passing through the filter circuit.

[0035] This invention discloses a PWM switching power supply that directly utilizes the PWM function module integrated within a high-frequency converter to control the output voltage divider feedback circuit of a DC / DC converter. It eliminates the need for a high-frequency converter with a high main frequency, requiring only the high-frequency converter to generate a control signal to control the voltage regulation module, thereby achieving precise and reliable voltage regulation. This invention also avoids the output stage being directly affected by the input voltage, making products equipped with wireless fast charging technology more stable.

[0036] This invention uses the LM2596-5 chip, whose power supply circuit has a wide input voltage range, stable output voltage, and features a low-power mode and thermal shutdown current limiting protection.

[0037] like Figure 4 As shown, the crystal oscillator module includes a control chip 7N10.000MBP, a capacitor C45, resistors R22, R23, and R24, a capacitor C69, and a voltage VCC terminal. The 8-pin connector of the control chip 7N10.000MBP is connected to one end of resistor R22. The other end of resistor R22 is connected to one end of capacitor C45, the 9-pin connector of the control chip 7N10.000MBP, one end of resistor R23, and the voltage VCC terminal. The other end of capacitor C45 is grounded. The other end of resistor R23 is connected to one end of resistor R24, and the other end of resistor R24 ​​is grounded. The 10-pin connector of the control chip 7N10.000MBP is connected to one end of capacitor C69, and the other end of capacitor C69 is grounded.

[0038] The microcontroller module is an STM32.

[0039] The clock module is model DS1302.

[0040] The above description is only a preferred embodiment of the present utility model. Therefore, all equivalent changes or modifications made to the structure, features and principles described in the claims of the present utility model patent application are included in the scope of the present utility model patent application.

[0041] It will be understood by those skilled in the art that, unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. It should also be understood that terms such as those defined in general dictionaries should be understood to have the same meaning as in the context of the prior art, and should not be interpreted in an idealized or overly formal sense unless defined as herein.

[0042] The above embodiments are merely illustrative of the technical concept of this utility model and should not be construed as limiting the scope of protection of this utility model. Any modifications made to the technical solution based on the technical concept proposed in this utility model shall fall within the scope of protection of this utility model. The implementation methods of this utility model have been described in detail above, but this utility model is not limited to the above-described implementation methods. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of this utility model.

Claims

1. A modular substation testing system, characterized in that: The system includes a module under test (DUT), a multiplexer, a signal preprocessing module, an analog-to-digital converter (ADC), a microcontroller module, an RF switch circuit, a wireless RF chip, a data storage module, a clock module, a crystal oscillator module, a command input module, and a power supply module. The DUT is connected to the microcontroller module sequentially via the multiplexer, the signal preprocessing module, and the ADC. The data storage module, clock module, crystal oscillator module, command input module, and power supply module are all connected to the microcontroller module. The microcontroller module is connected to the wireless RF chip via the RF switch circuit. The power supply module includes a high-frequency converter, a filter circuit, a DC / DC converter, and a voltage regulator circuit. The high-frequency converter is connected to the microcontroller module sequentially via the filter circuit, the DC / DC converter, and the voltage regulator circuit.

2. The modular substation testing system according to claim 1, characterized in that: The signal preprocessing module includes an amplifier circuit and a dual op-amp bandpass filter. The amplifier circuit consists of an OPA277 operational amplifier and resistors and capacitors, and the dual op-amp bandpass filter consists of two OPA277 operational amplifiers.

3. The modular substation testing system according to claim 1, characterized in that: The multiplexer is model AMC4601.

4. The modular substation testing system according to claim 1, characterized in that: The analog-to-digital converter module uses an AD7794 model analog-to-digital converter.

5. The modular substation testing system according to claim 1, characterized in that: The filter circuit comprises resistor R9 and capacitor C9; the DC / DC converter and its peripheral circuit comprise voltage input V IN The filter circuit comprises resistor R9 and capacitor C9; the DC / DC converter and its peripheral circuit comprise voltage input V DCDC The filter circuit comprises resistor R9 and capacitor C9; the DC / DC converter and its peripheral circuit comprise voltage input V In this circuit, the PWM terminal of the high-frequency converter is connected to one end of resistor R4, the other end of resistor R4 is connected to one end of capacitor C9 and one end of resistor R5, and the other end of capacitor C9 is grounded. The voltage input is V. IN One end of capacitor C1 is connected to one end of capacitor C2 and one end of capacitor C3, and the VIN terminal of chip FR9885. The other end of capacitor C1 is connected to the other end of capacitor C2, one end of capacitor C3, and the GND terminal of chip FR9885, and grounded. The other end of capacitor C3 is connected to one end of resistor R1. The other end of resistor R1 is connected to the SHDN terminal of chip FR9885. The BST terminal of chip FR9885 is connected to one end of capacitor C10. The other end of capacitor C10 is connected to the LX terminal of chip FR9885 and one end of inductor L1. The other end of inductor L1 is connected to one end of resistor R2, one end of capacitor C5, one end of capacitor C6, one end of capacitor C7, one end of capacitor C8, and the anode of diode D2. The other end of capacitor C5 is connected to the other end of resistor R2, one end of resistor R3, one end of resistor R5, and the FB terminal of chip FR9885. The other end of resistor R3 is connected to... The other end of capacitor C6 is connected to the other ends of capacitors C7 and C8 and grounded. The cathode of diode D2 is connected to one end of capacitor C11, one end of capacitor C12, the cathode of diode TVS7, and pin 1 of chip LM2596. Pin 2 of chip LM2596 is connected to the cathode of Zener diode Z1 and one end of inductor L2. The other end of inductor L2 is connected to one end of capacitor C13, one end of resistor R19, and pin 4 of chip LM2596. The other end of resistor R19 is connected to the anode of LED PLED1. The cathode of LED PLED1 is connected to the anode of diode TVS7, the other end of capacitor C11, the other end of capacitor C12, pins 0, 3, and 5 of chip LM2596, the anode of Zener diode Z1, and the other end of capacitor C13 and grounded.

6. The modular substation testing system according to claim 1, characterized in that: The crystal oscillator module includes a control chip 7N10.000MBP, a capacitor C45, resistors R22, R23, and R24, a capacitor C69, and a voltage VCC terminal. The 8-pin connector of the control chip 7N10.000MBP is connected to one end of resistor R22. The other end of resistor R22 is connected to one end of capacitor C45, the 9-pin connector of the control chip 7N10.000MBP, one end of resistor R23, and the voltage VCC terminal. The other end of capacitor C45 is grounded. The other end of resistor R23 is connected to one end of resistor R24, and the other end of resistor R24 ​​is grounded. The 10-pin connector of the control chip 7N10.000MBP is connected to one end of capacitor C69, and the other end of capacitor C69 is grounded.

7. The modular substation testing system according to claim 1, characterized in that: The microcontroller module is an STM32.

8. The modular substation testing system according to claim 1, characterized in that: The clock module is model DS1302.

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