Test equipment for electronic products and burn-in room

Abstract

The application provides a test device and an aging room for electronic products, comprising a support assembly, the support assembly having a support part and a plurality of support parts for carrying electronic products arranged on the support part in a first direction; a wire slot for passing through a cable is arranged on the support part; a moving assembly, the moving assembly having the support assembly arranged thereon, the moving assembly being capable of driving the support frame to move from a first position to a second position; a power supply assembly, the power supply assembly having a power supply part, a conductive part electrically connected with the power supply part, and a transmission part electrically connected with the conductive part; the transmission part is arranged on the support part; the wire output by the transmission part can conduct electricity to the electronic products through the wire slot. In actual use, the conductive wire for testing the electronic products is passed through the wire slot, that is, the wire is not exposed but hidden in the wire slot, thereby solving the technical problem of the safety hidden danger caused by the exposed wire.

Description

Technical Field

[0001] This application relates to the field of testing technology, and in particular to testing equipment and aging chambers for electronic products. Background Technology

[0002] An aging chamber is a testing device widely used in the fields of electronics and communications to simulate the high-temperature and harsh environment of high-performance electronic products.

[0003] When electronic products undergo aging tests in an aging chamber, they need to be powered on and aging racks are used as carriers to hold the electronic products. When the aging racks are transferred using an assembly line and the electronic products are placed one by one on the multi-layer aging racks, the existing technology requires a power supply device to be installed on each layer of the aging rack to power the electronic products. The power supply wires are exposed outside the aging rack, the wiring is messy, and the electronic products are prone to collisions and falling when being picked up and put down, which can cause safety hazards.

[0004] Therefore, there is an urgent need for testing equipment and aging chambers for electronic products, which can, to some extent, solve the technical problems existing in the current technology. Utility Model Content

[0005] The purpose of this application is to provide a testing device and aging chamber for electronic products, which to a certain extent solves the technical problem that existing aging racks require a power supply device to power each layer of the electronic products, with power supply wires exposed outside the aging rack, resulting in messy wiring and easy collisions and falls when taking electronic products out and putting them in, thus causing safety hazards.

[0006] This application provides a testing device for electronic products, used for testing the performance of electronic products; the testing device for electronic products includes:

[0007] A support assembly, the support assembly having a support portion and a plurality of support portions for supporting the electronic product being spaced apart along a first direction on the support portion; the support portion is provided with a cable groove for passing through a cable;

[0008] A movable component, on which the support component is disposed, the movable component being capable of driving the support frame to be transported from a first position to a second position;

[0009] A power supply assembly includes a power supply section, a conductive section electrically connected to the power supply section, and a transmission section electrically connected to the conductive section; the transmission section is disposed on the support section; and a wire output from the transmission section can conduct electricity to the electronic product through the wire groove.

[0010] In the above technical solution, the support part further includes a support frame, and the support frame includes a vertical plate and a horizontal plate;

[0011] The vertical plate extends along the first direction; multiple vertical plates are provided, and the multiple vertical plates are arranged in a frame arrangement;

[0012] Horizontal plates are arranged at intervals along the first direction between adjacent vertical plates;

[0013] The vertical plate and the horizontal plate are respectively provided with interconnected grooves.

[0014] In the above technical solution, the supporting part further includes a supporting plate;

[0015] The support plate is disposed within the frame, and at least two ends of the support plate are respectively connected to the horizontal plate. A wire-passing hole is provided on the horizontal plate connected to the support plate, and the wires conducted through the wire groove can be connected to the electronic product through the wire-passing hole.

[0016] In the above technical solution, the bearing plate further has at least two bearing surfaces;

[0017] The two bearing surfaces are arranged at a first preset angle at their respective ends that are close to each other, and are connected to the horizontal plate at a second preset angle at their respective ends that are far apart from each other.

[0018] In the above technical solution, further, a baffle is provided on the side of the horizontal plate connected to the bearing surface facing the bearing surface, which is at a third preset angle with the side wall of the horizontal plate, so that the baffle is perpendicularly connected to the bearing surface.

[0019] In the above technical solution, the power supply unit is a power supply battery, the conductive part is a conductive spring, and the transmission part is a brush;

[0020] The brush extends along the moving direction of the support assembly, and both ends of the brush along the moving direction of the support assembly are respectively connected to the horizontal plate;

[0021] One end of the conductive spring is electrically connected to the power supply battery, and the other end is electrically connected to the brush.

[0022] In the above technical solution, the moving component further includes a base, a roller, and a driving component;

[0023] Multiple rollers are provided, and the multiple rollers are arranged at intervals on the base along the moving direction of the support assembly;

[0024] The drive unit is disposed on the base, and each roller is connected to the output shaft of the drive unit. The drive unit drives the roller to rotate, so that the support assembly can move on the plurality of moving parts.

[0025] In the above technical solution, a sliding guide is further provided between the support component and the base; when the support component moves, the sliding guide guides the support component.

[0026] In the above technical solution, the sliding guide portion further includes a groove and a slider;

[0027] One of the groove and the slider is disposed on the side of the base facing the support assembly, and the other end is disposed on the side of the support assembly facing the base. When the support assembly moves, the slider can slide within the groove.

[0028] This application also provides an aging chamber, which includes the testing equipment for the aforementioned electronic products.

[0029] Compared with the prior art, this application has the following beneficial effects:

[0030] This application provides a testing device for electronic products, used for testing the performance of electronic products; the testing device for electronic products includes:

[0031] A support assembly, the support assembly having a support portion and a plurality of support portions for supporting the electronic product, which are spaced apart in a first direction on the support portion; the support portion is provided with a cable groove for passing through the cable;

[0032] A movable component, on which the support component is disposed, the movable component being capable of driving the support frame to be transported from a first position to a second position;

[0033] A power supply assembly includes a power supply section, a conductive section electrically connected to the power supply section, and a transmission section electrically connected to the conductive section; the transmission section is disposed on the support section; and a wire output from the transmission section can conduct electricity to the electronic product through the wire groove.

[0034] In summary, in actual use, the conductive wires used for testing electronic products pass through wire channels, meaning the wires are not exposed but hidden within the wire channels, thus solving the existing technical problem of safety hazards caused by exposed wires.

[0035] This application also provides an aging chamber, which includes the aforementioned testing equipment for electronic products. Therefore, it possesses all the beneficial effects of a testing equipment for electronic products, which will not be specifically elaborated here. Attached Figure Description

[0036] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0037] Figure 1 A schematic diagram of the test equipment for the electronic product provided in this application from a first-view perspective;

[0038] Figure 2 for Figure 1 Enlarged view of point A in the image;

[0039] Figure 3 A schematic diagram of the test equipment for the electronic product provided in this application from a second-view perspective;

[0040] Figure 4 for Figure 1 Enlarged view of point B in the image;

[0041] Figure 5 A schematic diagram of the test equipment for the electronic product provided in this application from a third-person perspective;

[0042] Figure 6 for Figure 1 Enlarged view of point C in the image;

[0043] Figure 7 A schematic diagram of the test equipment for the electronic product provided in this application in a superimposed state;

[0044] Figure 8 The wiring diagram of the electronic product testing equipment provided in this application.

[0045] Reference numerals: 1-Support assembly; 101-First direction; 102-Bearing part; 103-Supporting part; 104-Wire groove; 105-Supporting frame; 106-Vertical plate; 107-Horizontal plate; 109-Bearing plate; 110-Wire hole; 111-First bearing surface; 112-Second bearing surface; 113-Baffle;

[0046] 2-Moving component; 202-Base; 203-Roller; 204-Driver; 205-Base plate; 206-Support leg;

[0047] 3-Power supply assembly; 301-Power supply section; 302-Conductive section; 303-Transmission section; 304-Power supply battery; 305-Conductive spring; 306-Brush; 309-Support block; 310-Leg;

[0048] 4-Sliding guide; 401-Groove; 402-Slider;

[0049] 5. Electronic products. Detailed Implementation

[0050] The following detailed embodiments are provided to aid the reader in gaining a comprehensive understanding of the methods, apparatus, and / or systems described herein. However, various changes, modifications, and equivalents of the methods, apparatus, and / or systems described herein will be apparent upon understanding the disclosure of this application. For example, the order of operations described herein is merely illustrative and is not limited to the order presented herein; rather, changes that will be apparent upon understanding the disclosure of this application are possible, except for operations that must occur in a specific order. Furthermore, descriptions of features known in the art may be omitted for clarity and brevity. The features described herein may be implemented in different forms and should not be construed as limited to the examples described herein. Rather, the examples described herein are provided only to illustrate some of the many possible ways of implementing the methods, apparatus, and / or systems described herein that will be apparent upon understanding the disclosure of this application. Throughout this specification, when an element (such as a layer, region, or substrate) is described as being "on" another element, "connected to" another element, "bonded to" another element, "on" another element, or "covering" another element, it may be directly "on" another element, "connected to" another element, "bonded to" another element, "on" another element, or "covering" another element, or there may be one or more other elements in between. Conversely, when an element is described as being "directly on" another element, "directly connected to" another element, "directly bonded to" another element, "directly on" another element, or "directly covering" another element, there may be no other elements in between. As used herein, the term "and / or" includes any one of the relevant items listed and any combination of any two or more of them. Although terms such as "first," "second," and "third" may be used herein to describe individual components, assemblies, regions, layers, or portions, these components, assemblies, regions, layers, or portions are not limited by these terms. More precisely, these terms are used only to distinguish one component, assembly, region, layer, or part from another. Therefore, without departing from the teachings of the examples described herein, the first component, assembly, region, layer, or part referred to as such in the examples may also be referred to as the second component, assembly, region, layer, or part. For ease of description, spatial relational terms such as “above,” “upper,” “below,” and “lower” may be used herein to describe the relationship between one element and another, as shown in the accompanying drawings. Such spatial relational terms are intended to include not only the orientation depicted in the drawings but also the different orientations of the device in use or operation. For example, if the device in the drawings is flipped, an element described as being “above” or “upper” relative to another element will subsequently be “below” or “lower” relative to that other element.Therefore, the term "above" includes both "above" and "below" depending on the spatial orientation of the device. The device may also be positioned in other ways (e.g., oscillating 90 degrees or in other orientations), and the spatial relational terms used herein will be interpreted accordingly. The terminology used herein is for describing various examples only and is not intended to limit this disclosure. Unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. The terms "comprising," "including," and "having" enumerate the stated features, quantities, operations, components, elements, and / or combinations thereof, but do not exclude the presence or addition of one or more other features, quantities, operations, components, elements, and / or combinations thereof. Variations in the shapes shown in the figures may occur due to manufacturing techniques and / or tolerances. Therefore, the examples described herein are not limited to the specific shapes shown in the figures but include changes in shape that occur during manufacturing. The features of the examples described herein may be combined in various ways that will be apparent upon understanding the disclosure of this application. Furthermore, although the examples described herein have a wide variety of constructions, other constructions are possible as will be apparent upon understanding the disclosure of this application.

[0051] Example 1

[0052] Currently, during display screen testing, messy wiring can easily cause safety hazards. To overcome this technical problem, this application provides a testing device for electronic products. The following is a combination of... Figures 1-8 As shown, the testing equipment for this electronic product is described in detail.

[0053] Firstly, the testing equipment for this electronic product is also used to test the performance of the electronic product.

[0054] The testing equipment for the electronic product includes a support assembly 1, which has a support portion 103. The support portion 103 has a frame structure, and the support assembly 1 also has a plurality of support portions 102 for supporting the electronic product, which are spaced apart along a first direction 101 on the support portion 103. Figure 1 As shown, the first direction 101 refers to the vertical direction, meaning that the supporting parts 102 are spaced apart from the supporting parts 103 along the vertical direction. In other words, the supporting parts 103 are used to support the supporting parts 102 to fix them in place. Furthermore, a cable groove 104 is provided on the supporting part 103 for passing cables. In actual use, conductive wires used for testing electronic products pass through the cable groove 104, meaning the wires are not exposed but hidden within the cable groove 104, thus solving the existing technical problem of safety hazards caused by exposed wires.

[0055] Specifically, the support part 103 includes a support frame 105, which includes a vertical plate 106 and a horizontal plate 107; combined with Figure 1 As shown, four vertical plates 106 are provided, extending vertically and surrounding a rectangular frame structure. Horizontal plates 107 are arranged at vertical intervals between adjacent vertical plates 106. Figure 3 As shown, seven horizontal plates 107 are arranged vertically at intervals between adjacent vertical plates 106, numbered from bottom to top as horizontal plate 107, horizontal plate 2, horizontal plate 3, ..., horizontal plate 7. Furthermore, the adjacent horizontal plates 107 arranged vertically can serve as the first layer for placing the support unit 102. The vertical plates 106 and horizontal plates 107 are each provided with interconnecting wire grooves 104.

[0056] Specifically, the support portion 102 includes a support plate 109; combined with Figure 3 As shown, in the vertical direction, a support plate 109 is provided between each adjacent horizontal plate 107. Furthermore, the left and right ends of the support plate 109 are respectively connected to the left and right horizontal plates 107. In actual use, the support plate 109 is used to support the display screen to be tested.

[0057] Meanwhile, the horizontal plate 107 connected to the support plate 109 has multiple through holes 110. In actual use, the wires coming from the wire groove 104 charge the display screen under test through the through holes 110, thus realizing a closed-loop power supply for charging the display screen. Throughout the process, the wires are basically not exposed, and there will be no problem of mess due to too many exposed wires.

[0058] Furthermore, the bearing plate 109 has at least two bearing surfaces; combined with Figure 1 As shown, the support plate 109 has three support surfaces: a first support surface 111, a second support surface 112, and a third support surface. The first support surface 111 and the second support surface 112 are connected to each other at their closest ends via the third support surface. Furthermore, to facilitate viewing the display screen during testing, the first support surface 111 and the second support surface 112 are positioned at a second preset angle. The ends of the first support surface 111 and the second support surface 112 that are opposite to each other are connected to the left and right horizontal plates 107, respectively. This creates an inclined surface between the first support surface 111 and the second support surface 112, making it easier for operators to view the display screen when it is placed on the first support surface 111 and the second support surface 112. Additionally, this allows for an increase in the number of electronic products that can be placed on the screen.

[0059] Optionally, the second preset angle is 30°.

[0060] Furthermore, a baffle 113 is provided on the side of the horizontal plate 107 connected to the bearing surface, facing the bearing surface, and is at a third preset angle to the side wall of the horizontal plate 107, so that the baffle 113 is perpendicularly connected to the bearing surface. Figure 3 As shown, the receiving surface and the baffle 113 are connected at a 90-degree angle. At this time, the baffle 113 can serve as a fulcrum (stop point) for placing electronic products on the carrier plate 109, preventing the electronic products from sliding and falling.

[0061] In addition, a wire through hole 110 is also provided on the baffle 113 at the position corresponding to the wire through hole 110. In this way, the wires pass through the wire groove 104 of the horizontal plate 107, the wire through hole 110 of the horizontal plate 107, and the wire through hole 110 of the baffle 113 in sequence to supply power to the display screen. In this way, the wiring is orderly, reducing the risk of collision and drop when taking electronic products out and putting them back in.

[0062] The testing equipment for this electronic product also includes a moving component 2, combined with... Figure 3 As shown, the moving component 2 is equipped with a support component 1, and the moving component 2 can drive the support frame 105 to be transported from the first position to the second position; in actual use, Figure 3 The overall structure will have multiple components along the transport direction of support component 1. Figure 3 The structure within the structure will face different temperatures and humidity environments (to meet the requirements of detection under different temperatures and humidity), and the moving component 2 can place the structure within the... Figure 3 The display screen on the support component 1 moves to the next support component 1, that is, the moving component 2 plays the role of moving the display screen moving component 2.

[0063] Specifically, combined Figure 3 As shown, the moving component 2 includes a base 202, a roller 203, and a drive component 204. Combined with... Figure 4 As shown, the base 202 includes a base plate 205 and support legs 206. The support legs 206 support the base plate 205 from the ground. There are two base plates 205, which are opposite each other, thus forming a support structure. (This is still a combination...) Figure 3 As shown, the two ends of the roller 203 are connected to two opposing base plates 205, and multiple rollers 203 are provided, which are arranged at intervals on the base 202 along the moving direction of the support assembly 1. (Continuing with the connection...) Figure 3 As shown ( Figure 3 The image only shows one drive unit 204 (in fact, each roller corresponds to a drive unit). The drive unit 204 is set on the base 202, and each roller 203 is connected to the output shaft of the drive unit 204. The drive unit 204 drives the roller 203 to rotate so that the support assembly 1 can move.

[0064] Optionally, the driving component 204 is a drive motor, that is, the output shaft of the drive motor passes through the base plate and is directly connected to the roller, thereby driving the roller to rotate.

[0065] Specifically, combined Figure 1 and Figure 2 As shown, a sliding guide 4 is also provided between the support assembly 1 and the base 202; when the support assembly 1 moves, the sliding guide 4 guides the support assembly 1. Further, the sliding guide 4 includes a groove 401 and a slider 402; one end of the groove 401 and the slider 402 is located on the side of the base 202 facing the horizontal plate 107, and the other end is located on the side of the support assembly 1 facing the base 202, and when the support assembly 1 moves, the slider 402 can slide within the groove 401. Figure 2 As shown, the slide groove 401 is disposed on the base plate 205, and the slider 402 is disposed on the horizontal plate 107. In this way, the sliding guide part 4 assists the sliding of the support component 1, improving the movement stability of the support component 1.

[0066] The testing equipment for the electronic product also includes a power supply component 3, which has a power supply section 301, a conductive section 302 electrically connected to the power supply section 301, and a transmission section 303 electrically connected to the conductive section 302. The transmission section 303 is disposed on the support section 103. The wires output from the transmission section 303 can conduct electricity to the electronic product through the wire groove 104.

[0067] Furthermore, the power supply unit 301 is a power supply battery 304, the conductive part 302 is a conductive spring 305, and the transmission part 303 is a brush 306. The power supply battery 304 has a positive and a negative terminal. Two brushes 306 are provided; one brush is connected to the positive terminal of the power supply battery via a conductive spring, and the other brush is connected to the negative terminal of the power supply battery via a conductive spring. That is, electricity can be diverted to the brush 306 via the conductive spring 305. Then, electricity is diverted from the brush 306 to the display screen via wires. Figure 8 As shown, the blue arrows indicate the direction of the wire leading from the positive terminal, and the red arrows indicate the direction of the wire leading from the negative terminal. Figure 8 The diagram only shows one wire routing. Since both the horizontal plate 107 and the vertical plate 106 have wire grooves 104, there are multiple wiring methods.

[0068] Furthermore, the brush 306 extends along the moving direction of the support assembly 1, and both ends of the brush 306 along the moving direction of the support assembly 1 are respectively connected to the horizontal plate 107. Combined with... Figure 3 As shown, the brush 306 is disposed on the bottom horizontal plate 107. The conductive spring 305 only needs to pass through the adjacent roller 203 to connect with the brush 306.

[0069] Furthermore, the moving component 2 also includes a support block 309, which is supported on the ground by a leg 310 and is positioned opposite the brush of the same length. One end of a conductive spring 305 is disposed on the support block, and the other end passes through an adjacent roller and communicates with the brush. Specifically, the conductive spring 305 is disposed on the support block and is connected to the power supply battery via a wire.

[0070] It is worth noting that multiple conductive springs are installed on each support block.

[0071] In actual use, the brush 306 and the support assembly 1 move together, each as... Figure 3 Each structure has a conductive spring 305, so the brush 306 can conduct electricity when the support component 1 is moved from one moving component 2 to another moving component 2.

[0072] In addition, a controller can be installed in actual use. The controller is connected to the power supply battery 304 and can control whether the power supply battery 304 is conductive.

[0073] In addition, the distance between adjacent horizontal plates 107 in the vertical direction is adjustable, and the distance between the support plates 109 in the vertical direction is also adjustable, so as to accommodate electronic products of different sizes and models.

[0074] Example 2

[0075] This application also provides an aging chamber, including the aforementioned testing equipment for electronic products. The beneficial effects of the steel frame structure are therefore not detailed here.

[0076] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A testing device for electronic products, used to test the performance of electronic products; characterized in that, The testing equipment for the electronic products includes: A support assembly, the support assembly having a support portion and a plurality of support portions for supporting the electronic product being spaced apart along a first direction on the support portion; the support portion is provided with a cable groove for passing through a cable; A movable component, on which the support component is disposed, the movable component being capable of driving the support component to be transported from a first position to a second position; A power supply assembly includes a power supply section, a conductive section electrically connected to the power supply section, and a transmission section electrically connected to the conductive section; the transmission section is disposed on the support section; and a wire output from the transmission section can conduct electricity to the electronic product through the wire groove.

2. The testing equipment for electronic products according to claim 1, characterized in that, The support includes a support frame, which includes a vertical plate and a horizontal plate. The vertical plate extends along the first direction; multiple vertical plates are provided, and the multiple vertical plates are arranged in a frame arrangement; Horizontal plates are arranged at intervals along the first direction between adjacent vertical plates; The vertical plate and the horizontal plate are respectively provided with interconnected grooves.

3. The testing equipment for electronic products according to claim 2, characterized in that, The supporting part includes a supporting plate; The support plate is disposed within the frame, and at least two ends of the support plate are respectively connected to the horizontal plate. A wire-passing hole is provided on the horizontal plate connected to the support plate, and the wires conducted through the wire groove can be connected to the electronic product through the wire-passing hole.

4. The testing equipment for electronic products according to claim 3, characterized in that, The bearing plate has at least two bearing surfaces; The two bearing surfaces are arranged at a first preset angle at their respective ends that are close to each other, and are connected to the horizontal plate at a second preset angle at their respective ends that are far apart from each other.

5. The testing equipment for electronic products according to claim 4, characterized in that, A baffle is provided on the side of the horizontal plate connected to the bearing surface facing the bearing surface, which is at a third preset angle to the side wall of the horizontal plate, so that the baffle is perpendicularly connected to the bearing surface.

6. The testing equipment for electronic products according to claim 2, characterized in that, The power supply unit is a power supply battery, the conductive part is a conductive spring, and the transmission part is a brush; The brush extends along the moving direction of the support assembly, and both ends of the brush along the moving direction of the support assembly are respectively connected to the horizontal plate; One end of the conductive spring is electrically connected to the power supply battery, and the other end is electrically connected to the brush.

7. The testing equipment for electronic products according to claim 1, characterized in that, The moving component includes a base, a roller, and a driving component; Multiple rollers are provided, and the multiple rollers are arranged at intervals on the base along the moving direction of the support assembly; The drive component is disposed on the base, and each roller is connected to the output shaft of the drive component. The drive component drives the roller to rotate, thereby enabling the support assembly to move.

8. The testing equipment for electronic products according to claim 7, characterized in that, A sliding guide is also provided between the support component and the base; when the support component moves, the sliding guide guides the support component.

9. The testing equipment for electronic products according to claim 8, characterized in that, The sliding guide includes a groove and a slider; One of the groove and the slider is disposed on the side of the base facing the support assembly, and the other end is disposed on the side of the support assembly facing the base. When the support assembly moves, the slider can slide within the groove.

10. An aging room, characterized in that, The testing equipment for electronic products includes any one of claims 1-9.

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