A semiconductor device leakage current detection circuit

Abstract

The application discloses a semiconductor device leakage current detection circuit, and belongs to the technical field of leakage current detection, and solves the problem of how to improve the precision of leakage current detection. A first operational amplifier unit, a second operational amplifier unit, a third operational amplifier unit, a fourth operational amplifier unit and a fifth operational amplifier unit are connected in series, the output ends of the first operational amplifier unit, the second operational amplifier unit, the third operational amplifier unit, the fourth operational amplifier unit and the fifth operational amplifier unit are connected with a plurality of input ends of a multiplexer unit, the output end of the multiplexer unit is connected with an input end of an analog-to-digital converter, and the output end of the analog-to-digital converter is connected with an input end of an MCU. The sampling voltage is amplified by the multiple-stage operational amplifier units, the voltage value output by the operational amplifier unit is collected by the multiplexer after each amplification, and it is judged whether the voltage value is within a preset range, different current ranges are matched step by step, and it is ensured that the signals of each order are within the optimal measurement range of the ADC, so that the test efficiency is effectively improved.

Images