Circuit board test side pressing tool

Abstract

The application discloses a circuit board test side pressing tool, and relates to the field of circuit board testing, which comprises a bottom plate, a top surface testing mechanism for testing the top surface of a circuit board and a side surface testing mechanism for testing the side surface of the circuit board are arranged on one side of the surface of the bottom plate, the top surface testing mechanism comprises a pressing plate hinged on one side of the surface of the bottom plate, a plurality of probes one for transmitting electric signals to the top surface of the circuit board are arranged on the side of the pressing plate close to the surface of the bottom plate, the side surface testing mechanism comprises a driving frame slidingly arranged on one side of the surface of the bottom plate, a needle holder is fixedly arranged on the end of the driving frame away from the bottom plate, and a plurality of probes two for transmitting electric signals to the side surface of the circuit board are arranged on one side of the surface of the needle holder, when the side surface testing mechanism moves horizontally, the circuit board is lifted by the lifting assembly synchronously, the top surface testing mechanism and the side surface testing mechanism can test the top surface and the side surface of the circuit board at the same time, and the problem that the top surface probes need to be pressed and the side probes need to be manually moved for positioning twice is avoided.

Description

Technical Field

[0001] This application relates to the field of circuit board testing, and in particular to a circuit board testing side pressure fixture. Background Technology

[0002] In the development of electronic products, the design and manufacturing quality of circuit boards are fundamental factors affecting the overall performance of the device, while circuit board testing and pressure fitting is one of the key links to ensure the reliability of circuit boards.

[0003] This fixture, through a precise lateral pressure testing mechanism, can effectively detect the electrical connection stability, solder joint reliability, and overall structural strength of circuit boards under mechanical stress, thereby identifying design defects or manufacturing process problems in advance. This provides important technical support for improving the quality consistency and long-term stability of electronic products. However, it still has the following shortcomings in practical use:

[0004] During the circuit board testing process, the circuit board is tested by first pressing the top probe and then manually moving the side probe. This method requires secondary positioning of the circuit board. During the secondary positioning process, errors in manual operation or mechanical gaps can easily cause misalignment between the probe and the test point, which can easily lead to misjudgment and seriously affect the accurate testing of the circuit board. At the same time, the secondary positioning operation also reduces the testing efficiency. Utility Model Content

[0005] To improve the problem of misalignment between probes and test points, this application provides a circuit board test side pressure fixture.

[0006] The circuit board test side pressure fixture provided in this application adopts the following technical solution:

[0007] A circuit board testing side-pressure fixture includes a base plate, the base plate having a drive space inside, a top surface testing mechanism for testing the surface of the circuit board and a side surface testing mechanism for testing the side surface of the circuit board on one side of the base plate, and a lifting assembly for lifting the circuit board inside the base plate.

[0008] The top surface testing mechanism includes a pressure plate hinged to one side of the base plate surface, and a probe for transmitting electrical signals to the top surface of the circuit board is provided on the side of the pressure plate near the base plate surface.

[0009] The side testing mechanism includes a drive frame that is slidably disposed on one side of the base plate surface. A pin holder is fixed at one end of the drive frame away from the base plate. A plurality of probes for transmitting electrical signals to the side of the circuit board are disposed on one side of the surface of the pin holder. A positioning component for positioning the probes is disposed on the surface of the pin holder.

[0010] By adopting the above technical solution, when the side testing mechanism moves laterally, the lifting component simultaneously lifts the circuit board, so that the top surface of the circuit board contacts the probe of the top testing mechanism, allowing the fixture to test the top surface and side surface of the circuit board at the same time, and the side probe of the circuit board can be quickly replaced by the movement of the positioning component.

[0011] Preferably, the side testing mechanism further includes a handle disposed on one side of the base plate surface. The end of the handle near the base plate is fixedly provided with a rotating shaft rotatably disposed inside the base plate. The end of the rotating shaft away from the handle is fixedly provided with a screw rotatably disposed inside the drive space. The surface of the screw is threadedly connected to a drive block slidably disposed inside the drive space. A drive rod fixedly disposed on one side of the surface of the drive block is fixedly provided on one side of the drive frame surface.

[0012] By adopting the above technical solution, the rotation of the handle provides power to the rotating shaft, causing the rotating shaft to rotate, which in turn drives the screw to rotate. The screw drives the drive block to move laterally, which in turn drives the drive rod to move laterally. The drive rod drives the drive frame to move laterally, which in turn drives the needle seat to move laterally. The needle seat drives the second probe to move laterally, so that the second probe makes contact with the contact point on the side of the circuit board.

[0013] Preferably, the lifting assembly includes a lifting seat fixed to the end of the drive frame away from the pin seat, a lifting frame is provided on the surface of the lifting seat, a lifting column is fixed to the end of the lifting frame near the lifting seat and a lifting plate is fixed to the end of the lifting frame away from the lifting seat and slidably disposed inside the drive space, a plurality of transmission rods are fixed to one side of the surface of the lifting plate, and a lifting block for lifting the circuit board is fixed to the end of the transmission rod away from the lifting plate.

[0014] By adopting the above technical solution, the lateral movement of the drive frame provides power to the lifting seat, causing the lifting seat to move laterally. When the lifting seat moves laterally, it lifts the lifting column, which in turn lifts the lifting frame, which in turn lifts the lifting plate, which in turn lifts the transmission rod, which in turn lifts the lifting block, thus lifting the circuit board and making the top surface contact of the circuit board contact the probe.

[0015] Preferably, a mounting plate is fixedly provided on one side of the surface of the base plate, and a limiting seat is symmetrically fixed on the side of the mounting plate near the surface of the base plate. The end of the lifting frame away from the lifting seat is slidably disposed on one side of the surface of the limiting seat. Limiting blocks that are slidably disposed inside the limiting seat are fixed on both sides of the surface of the lifting frame, and an elastic element fixed inside the limiting seat is fixed in the middle of one side of the surface of the limiting block.

[0016] By adopting the above technical solution, the lifting frame drives the limiting block to rise when it rises, so that the limiting block presses the elastic element, causing the elastic element to deform. After the lifting frame loses power, the lifting frame returns to its original position through the rebound force of the elastic element.

[0017] Preferably, the positioning component includes a positioning block disposed on one side of the needle seat surface, a positioning post threadedly connected to the inside of the needle seat is fixed at one end of the positioning block near the needle seat, and a plurality of positioning balls are fixed at the other end of the positioning post away from the positioning block.

[0018] By adopting the above technical solution, the rotation of the positioning block provides power to the positioning column, causing the positioning column to rotate. When the positioning column rotates, it gradually moves away from one side of the surface of the needle seat, causing the positioning column to drive the positioning ball away from the surface of the second probe, thus releasing the positioning of the second probe.

[0019] Preferably, the positioning ball is made of rubber.

[0020] By adopting the above technical solution, the positioning ball is made of rubber, so that the positioning ball can adapt to the irregular surface of the second probe.

[0021] Preferably, the top surface testing mechanism further includes an observation window disposed on one side of the pressure plate surface.

[0022] By adopting the above technical solution, the operating status of the circuit board can be observed through the observation window.

[0023] Preferably, a carrier plate is fixed on the side of the mounting plate away from the base plate, and a plurality of positioning bosses for positioning the circuit board are fixed on the side of the carrier plate away from the mounting plate.

[0024] By adopting the above technical solution, multiple positioning bosses are used to position the circuit board, ensuring that the circuit board is placed accurately on the carrier board.

[0025] In summary, this application includes at least one of the following beneficial technical effects:

[0026] 1. When the side testing mechanism moves laterally, the lifting component simultaneously lifts the circuit board, so that the top testing mechanism and the side testing mechanism can test the top and side surfaces of the circuit board at the same time. This avoids the problem of having to manually move the side probes after pressing the top probes, which requires secondary positioning. It also eliminates the misalignment and misjudgment of probes and test points caused by manual operation or mechanical gaps, thus improving the testing efficiency of the circuit board.

[0027] 2. The rotation of the positioning block in the positioning assembly drives the positioning column and positioning ball to move, which can realize the rapid positioning and release of the second probe. The positioning ball is made of rubber, which can adapt to the irregular surface of the second probe, making it convenient for users to quickly replace the second probe, thus improving the practicality and convenience of this tooling. Attached Figure Description

[0028] Figure 1 This is a schematic diagram of the overall structure of this application;

[0029] Figure 2This is a front view structural diagram of this application;

[0030] Figure 3 This is a schematic diagram of the structure when the pressure plate of this application is open;

[0031] Figure 4 This is a schematic diagram of the internal structure of the base plate of this application;

[0032] Figure 5 For this application Figure 4 Enlarged view of point A in the middle;

[0033] Figure 6 For this application Figure 4 Enlarged view of point B in the middle;

[0034] Figure 7 This is a schematic diagram of the internal structure of the drive space in this application;

[0035] Figure 8 This is a schematic diagram of part of the internal structure of the drive space in this application;

[0036] Figure 9 For this application Figure 8 Enlarged diagram of point C in the middle.

[0037] Reference numerals: 1. Base; 2. Base plate; 21. Card slot; 22. Drive space; 221. Limiting plate; 222. Guide groove; 223. Guiding groove; 23. Limiting seat; 231. Mobility space; 232. Limiting groove;

[0038] 3. Top surface testing mechanism; 31. Pressure plate; 32. Observation window; 33. Probe one;

[0039] 4. Carrier plate; 41. Positioning boss; 42. Extension groove; 43. Sliding groove; 44. Stop post; 45. Mounting plate;

[0040] 5. Side testing mechanism; 51. Handle; 52. Rotating shaft; 53. Screw; 54. Drive block; 541. Guide block; 55. Drive rod; 56. Drive frame; 57. Needle holder; 571. Probe II;

[0041] 6. Lifting assembly; 61. Lifting seat; 611. Guide block; 62. Lifting frame; 621. Lifting column; 622. Limiting block; 623. Elastic element; 63. Lifting plate; 64. Lifting block; 641. Transmission rod;

[0042] 7. Positioning component; 71. Positioning block; 72. Positioning post; 73. Positioning ball. Detailed Implementation

[0043] The following is in conjunction with the appendix Figures 1-9 This application will be described in further detail.

[0044] This application discloses a circuit board test side pressure fixture.

[0045] Reference Figure 1 A circuit board test side pressure fixture includes a base 1, a base plate 2 is fixedly mounted on one side of the surface of the base 1, the base plate 2 is fixedly mounted on one side of the surface of the base 1 in an inclined state, the base plate 2 is at an angle of 30° with the horizontal plane, a driving space 22 is opened inside the base plate 2, a mounting plate 45 is fixedly mounted on the side of the base plate 2 away from the base 1, a carrier plate 4 is fixedly mounted on the side of the mounting plate 45 away from the surface of the base plate 2, and an insulating layer is fixedly mounted on the surface of the carrier plate 4, one side of the surface of the base plate 2, and one side of the surface of the mounting plate 45.

[0046] Reference Figures 1-3 A top surface testing mechanism 3 for inspecting the circuit board surface is provided on one side of the base plate 2. The top surface testing mechanism 3 includes a pressure plate 31 hinged to one side of the base plate 2. A card holder 21 is symmetrically fixed on one side of the base plate 2. A card post is symmetrically fixed on the side of the pressure plate 31 near the card holder 21. A card holder 21 has a carding structure installed inside, which adopts a card block + spring design to fix the pressure plate 31. A handle is fixed on one side of the pressure plate 31. The handle is U-shaped when viewed from above. An observation window 32 is installed on one side of the pressure plate 31. The observation window 32 adopts an embedded installation method. Multiple probes 33 for transmitting electrical signals to the top surface of the circuit board are fixed on the side of the observation window 32 near the surface of the base plate 2. The probes 33 are spring probes. The probes 33 consist of a needle contact end, a spring, and a needle tube tail. The spring provides elastic pressure to ensure stable contact with the circuit board pins during testing.

[0047] It should be noted that the length of the pin on the pressure plate 31 is sufficient to allow the pin to be inserted into the card holder 21, so that the distance between the pressure plate 31 and the carrier plate 4 is longer than the length of the probe 33, and the distance between the end of the probe 33 away from the observation window 32 and the surface of the base plate 2 is sufficient to place the circuit board.

[0048] By manually pulling down the handle, the pressure plate 31 is flipped downwards, so that the pin on the pressure plate 31 is engaged inside the card holder 21, so that the distance between the end of the probe 33 away from the pressure plate 31 and the surface of the carrier plate 4 is the minimum, and so that the end of the probe 33 away from the pressure plate 31 contacts the top surface of the circuit board.

[0049] Reference Figures 1-4 On the side of the carrier plate 4 away from the mounting plate 45, a plurality of positioning bosses 41 for positioning the circuit board are fixedly provided. The positioning bosses 41 are cylindrical. The distribution of the positioning bosses 41 on the surface of the carrier plate 4 is based on the specific hole positions on the circuit board to ensure that the circuit board is accurately placed on the carrier plate 4. A stop post 44 is symmetrically fixed on one side of the surface of the carrier plate 4. The stop post 44 is cylindrical.

[0050] The positioning boss 41 can position the circuit board, restrict the movement of the circuit board in the horizontal direction, and make the test points of the circuit board correspond one-to-one with the probes 33 in the vertical direction.

[0051] Reference Figures 1-8 A side testing mechanism 5 for inspecting the side of the circuit board is provided on one side of the surface of the base plate 2. The side testing mechanism 5 includes a handle 51 provided on one side of the surface of the base plate 2. A rotating shaft 52 is fixed at one end of the handle 51 near the base plate 2. The rotating shaft 52 is rotatably connected to the inside of the base plate 2 through a bearing. The bearing includes an inner ring, an outer ring, rolling elements, and a cage. The bearing is an existing and mature technology, and the principle of the bearing will not be described in detail. The outer ring of the bearing on the surface of the rotating shaft 52 is fixed inside the base plate 2 near the handle 51. A screw 53 is fixed at one end of the rotating shaft 52 away from the handle 51. A limiting plate 221 is fixed on the inner wall of the drive space 22. The end of the screw 53 away from the rotating shaft 52 is rotatably connected to the middle of the surface of the limiting plate 221 near the screw 53 through a bearing. The outer ring of the bearing on the surface of the end of the screw 53 away from the rotating shaft 52 is fixed to the middle of the surface of the limiting plate 221 near the screw 53.

[0052] The rotation of handle 51 provides power to the rotating shaft 52, causing the rotating shaft 52 to rotate, which in turn causes the screw 53 to rotate.

[0053] Reference Figures 1-8 A drive block 54 is threadedly connected to the surface of the screw 53. The screw 53 has an external thread, and the drive block 54 has an internal thread on one side of its surface that meshes with the external thread. This allows the drive block 54 to slide within the drive space 22 when the screw 53 rotates, through the engagement of the external and internal threads. A guide block 541 is fixed to the center of the surface of the drive block 54 near the inner wall of the drive space 22. The guide block 541 is T-shaped on the surface near the limiting plate 221. A guide groove 222, adapted to the guide block 541, is formed on the inner wall of the drive space 22. The end of the guide block 541 furthest from the drive block 54 is connected to the guide groove 222. The guide block 541 abuts against the inner wall of the guide groove 222, allowing the end of the guide block 541 away from the drive block 54 to slide stably inside the guide groove 222. A drive rod 55 is fixedly provided in the middle of one side of the surface of the drive block 54. A drive frame 56 is fixedly provided at the end of the drive rod 55 away from the drive block 54. A drive groove is opened on one side of the surface of the mounting plate 45 and the carrier plate 4 for the drive frame 56 to slide away from the end of the drive rod 55. The surface of the drive frame 56 away from the drive rod 55 abuts against the inner wall of the drive groove, allowing the end of the drive frame 56 away from the drive rod 55 to slide stably inside the drive groove. The surface of the drive frame 56 near the drive rod 55 is L-shaped.

[0054] The rotation of screw 53 provides power to drive block 54, causing drive block 54 to move laterally. Drive block 54 drives drive rod 55 to move laterally, thereby driving drive frame 56 to move laterally.

[0055] Reference Figures 1-8 A needle holder 57 is fixed at the end of the drive frame 56 away from the drive rod 55. A guide rail is symmetrically fixed on one side of the surface of the carrier plate 4. A guide groove is symmetrically opened on the side of the needle holder 57 near the surface of the carrier plate 4. The surface of the guide rail abuts against the inner wall of the guide groove, so that the needle holder 57 can slide stably on the guide rail. Multiple insertion holes are opened on one side of the surface of the needle holder 57. The insertion holes are circular holes. Multiple probes 571 for transmitting electrical signals to the side of the circuit board are inserted into the circular holes. The probes 571 are spring probes with a spring telescopic structure. The needle tip can withstand lateral pressure, so that the probes 571 can adapt to slight deformation of the circuit board, such as uneven edges, and maintain contact reliability. A number of sliding grooves 43 equal to the number of probes 571 are opened on one side of the surface of the carrier plate 4. The surface of the probes 571 abuts against the inner wall of the sliding grooves 43, so that the end of the probes 571 away from the needle holder 57 slides stably inside the sliding grooves 43.

[0056] The lateral movement of the drive frame 56 provides power to the needle holder 57, causing the needle holder 57 to move laterally. The needle holder 57 drives the probe 2 571 to move laterally, so that the needle tip of the probe 2 571 contacts the contact point on the side of the circuit board.

[0057] Reference Figures 1-9 The base plate 2 has a lifting assembly 6 for lifting the circuit board. The lifting assembly 6 includes a lifting seat 61 fixed to the end of the drive frame 56 away from the pin seat 57. A guide block 611 is fixed on one side of the lifting seat 61 near the inner wall of the drive space 22. One side of the surface of the guide block 611 is cross-shaped. The inner wall of the drive space 22 has a guide groove 223 adapted to the guide block 611. The surface of the guide block 611 abuts against the inner wall of the guide groove 223, so that the guide block 611... The guide block 611 can slide stably inside the guide groove 223. The surface of the lifting seat 61 is provided with a lifting frame 62. A lifting column 621 is fixed at one end of the lifting frame 62 near the lifting seat 61. The lifting column 621 is cylindrical. The surface of the lifting column 621 abuts against the surface of the lifting seat 61. The middle part of one side of the surface of the lifting seat 61 is inclined. The slope of the inclined surface of the lifting seat 61 is 15°-30°, so that the surface of the lifting seat 61 is composed of the highest plane, the inclined surface, and the lowest plane.

[0058] When the drive frame 56 moves 20mm, the lifting frame 62 rises 5mm to ensure that probe 2 571 and probe 1 33 are in contact with the circuit board.

[0059] The lateral movement of the drive frame 56 provides power to the lifting seat 61, causing the drive frame 56 to drive the lifting seat 61 to move laterally. When the lifting seat 61 moves laterally, it causes the lifting column 621 to slide along the inclined plane, thereby causing the lifting column 621 to rise in the vertical direction, which in turn causes the lifting column 621 to drive the lifting frame 62 to rise.

[0060] Reference Figures 1-9 A lifting plate 63 is fixedly provided at one end of the lifting frame 62 away from the lifting seat 61. A limiting rod is fixedly provided in the middle of the surface of the lifting plate 63 away from the lifting frame 62. A plurality of transmission rods 641 are fixedly provided on one side of the surface of the lifting plate 63. A lifting block 64 for lifting the circuit board is fixedly provided at one end of the transmission rod 641 away from the lifting plate 63. The lifting block 64 is rectangular or cylindrical. An extension slot 42 with the same number and matching number of lifting blocks 64 is opened on one side of the surface of the carrier plate 4. The outer surface of the lifting block 64 and the inner wall of the extension slot 42 are on the same vertical line. A silicone layer is fixedly provided on the surface of the end of the lifting block 64 away from the transmission rod 641.

[0061] It should be noted that when the lifting column 621 reaches the highest plane of the lifting seat 61, the end of probe 1 33 away from the observation window 32 contacts the contact point on the top surface of the circuit board, and the end of probe 2 571 away from the stop column 44 contacts the contact point on the side of the circuit board. At this time, the lifting block 64 protrudes from the groove 42. When the lifting column 621 is located at the lowest plane of the lifting seat 61, the end of probe 1 33 away from the observation window 32 does not contact the contact point on the top surface of the circuit board, and the end of probe 2 571 away from the stop column 44 does not contact the contact point on the side of the circuit board. At this time, the lifting block 64 is located below the protrusion groove 42.

[0062] The lifting frame 62 rises to provide power to the lifting plate 63, causing the lifting plate 63 to rise. The lifting plate 63 drives the transmission rod 641 to rise, causing the transmission rod 641 to lift the circuit board, so that the top surface contact of the circuit board contacts the probe 33.

[0063] Reference Figures 1-9A limiting seat 23 is symmetrically fixed on one side of the mounting plate 45 near the base plate 2. An active space 231 is provided inside the limiting seat 23. The surface of the lifting frame 62 away from the lifting seat 61 abuts against the inner wall of the active space 231, allowing the end of the lifting frame 62 away from the lifting seat 61 to slide stably within the active space 231. Limiting blocks 622 are fixed on both sides of the lifting frame 62 and the limiting rod. Limiting grooves 232 are provided on the side walls of the active space 231. The surface of the 2nd block abuts against the inner wall of the limiting groove 232, allowing the limiting block 622 to slide stably inside the limiting groove 232. An elastic element 623 is fixedly provided in the middle of one side of the surface of the limiting block 622. The end of the elastic element 623 away from the limiting block 622 is fixed to the inner wall of the limiting groove 232. The elastic element 623 ensures that the surface of the lifting column 621 always abuts against the inclined surface of the lifting seat 61, so that the inclined surface of the lifting seat 61 can continuously and stably push the lifting column 621 during the movement of the drive frame 56.

[0064] It should be noted that: the elastic element 623 adopts a spring, and the calculation formula for the spring is: F=kx, where F is the external force on the spring, in N, k is the spring constant, in N / m, and x is the deformation of the spring, in m. The elastic force of the spring is then calculated so that it can be used in this application.

[0065] The lifting frame 62 and the limiting rod are limited by the limiting seat 23, so that the lifting plate 63 can rise stably inside the driving space 22. When the lifting frame 62 rises, it drives the limiting block 622 to rise. When the limiting block 622 rises, it presses the elastic element 623, causing the elastic element 623 to deform. After the lifting frame 62 loses power, the limiting block 622 loses power, so the elastic element 623 loses the pressure from the limiting block 622. The limiting block 622 achieves automatic reset after lifting through the combined action of the elastic force of the elastic element 623 and the limiting groove 232, ensuring that the structure is restored after testing. The limiting block 622 drives the lifting frame 62 to return to its original position.

[0066] Reference Figures 1-5The surface of the needle holder 57 is provided with a positioning component 7 for positioning the second probe 571. The positioning component 7 includes a positioning block 71 disposed on one side of the surface of the needle holder 57. The side of the positioning block 71 away from the needle holder 57 is triangular. A positioning post 72 is fixedly disposed at one end of the positioning block 71 near the needle holder 57. The side of the needle holder 57 near the positioning block 71 has cylindrical holes equal in number to the second probe 571. The cylindrical holes communicate with the insertion holes on one side of the surface of the needle holder 57. The surface of the positioning post 72 is provided with external threads. The inner wall of the cylindrical hole is provided with internal threads that mesh with the external threads, so that the positioning post 72 can move downward through the meshing of the internal and external threads when rotating, so that the surface of the positioning post 72 away from the positioning block 71 abuts against the surface of the second probe 571. A plurality of positioning balls 73 are fixedly disposed at the end of the positioning post 72 away from the positioning block 71. The positioning balls 73 are hemispherical blocks.

[0067] The rotation of the positioning block 71 provides power to the positioning post 72, causing the positioning post 72 to rotate and move downward, so that the end of the positioning post 72 away from the positioning block 71 abuts against the surface of the second probe 571. The positioning post 72 drives the positioning ball 73 to move downward, so that the positioning ball 73 can fit against the surface of the second probe 571 and limit the positioning of the second probe 571.

[0068] It should be added that: the positioning boss 41 and the positioning ball 73 are both made of rubber, the elastic element 623 is made of spring steel, the lifting column 621 and the lifting seat 61 are both made of aluminum alloy, the observation window 32 is made of polymethyl methacrylate, the carrier plate 4 is made of aluminum alloy, and the surface insulation layer of the carrier plate 4 is made of ABS.

[0069] Probe 1-33 and Probe 2-571 adopt the ICT series.

[0070] Connect probe 33 and probe 571 to the ICT in-circuit tester. The ICT in-circuit tester forms an electrical connection with the test points on the circuit board through the probes, realizing the automated detection of the circuit's continuity, impedance, component parameters, etc.

[0071] To ensure the stability and security of signal transmission, probe 2571 is connected to the wiring terminals located inside the base plate 2 via a flexible circuit board (FPC) and led out to the interface module of the ICT test equipment. All signal channels are equipped with shielding protection layers to avoid electromagnetic interference.

[0072] The implementation principle of the circuit board test side pressure fixture in this application embodiment is as follows: Before use, the state of this application is as follows: Figure 1 As shown, the user manually pulls the handle on the pressure plate 31 upwards, causing the end of the pressure plate 31 near the card holder 21 to flip upwards, disengaging the card holder on the pressure plate 31 from the inside of the card holder 21. At this time, the pressure plate 31 is in the following state: Figure 3As shown, the user then aligns the holes on the circuit board with the positioning boss 41, places the circuit board on the surface of the carrier plate 4, and positions the positioning boss 41 on the circuit board. Then, the user manually pulls down the handle to flip the pressure plate 31 downwards, so that the pin on the pressure plate 31 engages with the inside of the card holder 21, making the distance between the end of the probe 33 away from the pressure plate 31 and the surface of the carrier plate 4 the minimum gap. At this time, the end of the probe 33 away from the pressure plate 31 is located above the contact point on the top surface of the circuit board.

[0073] The user manually rotates handle 51 counterclockwise. Handle 51 drives shaft 52 to rotate counterclockwise, shaft 52 drives screw 53 to rotate counterclockwise, screw 53 drives drive block 54 to move closer to limit plate 221, drive block 54 moves closer to limit plate 221, drives drive rod 55 to move closer to lifting plate 63, drive rod 55 moves drive frame 56 to move closer to lifting plate 63, drive frame 56 moves needle seat 57 to move closer to lifting plate 63, needle seat 57 moves probe 2 571 to move closer to lifting block 64.

[0074] As the drive frame 56 moves closer to the lifting plate 63, it simultaneously drives the lifting seat 61 to move closer to the lifting plate 63. When the inclined surface of the lifting seat 61 moves to the surface of the lifting column 621, the inclined surface of the lifting seat 61 lifts the lifting column 621, causing the lifting column 621 to move upward. The lifting column 621 drives the lifting frame 62 to move upward, the lifting frame 62 drives the lifting plate 63 to move upward, the lifting plate 63 drives the transmission rod 641 to move upward, and the transmission rod 641 drives the lifting block 64 to move upward, thereby lifting the circuit board. This causes the end of probe 1 33 away from the pressure plate 31 to contact the top contact of the circuit board, while simultaneously causing probe 2 571 to contact the side contact of the circuit board. This allows the ICT online tester to test the contacts on both the top and side of the circuit board simultaneously, avoiding blind spots caused by a single test direction.

[0075] In ICT online testing, probe 33 contacts the test pads on the top surface of the circuit board, and probe 571 contacts edge test points such as USB interfaces and gold fingers. A single test can cover more than 90% of the test points on the entire board, which is more than 50% more efficient than batch testing.

[0076] When the lifting frame 62 rises, it drives the limiting block 622 to rise. When the limiting block 622 rises, it presses the elastic element 623, causing the elastic element 623 to deform. After the lifting frame 62 loses power, the limiting block 622 loses power, causing the elastic element 623 to lose the pressure from the limiting block 622. The limiting block 622 returns to its original position through the rebound force of the elastic element 623, thereby causing the limiting block 622 to drive the lifting frame 62 to return to its original position.

[0077] When probe 2 571 needs to be replaced, the user needs to manually rotate the positioning block 71 counterclockwise. The positioning block 71 drives the positioning post 72 to rotate counterclockwise and moves upward during the rotation. This causes the end of the positioning post 72 away from the positioning block 71 to move away from the surface of probe 2 571. The positioning post 72 then drives the positioning ball 73 away from the surface of probe 2 571, releasing the positioning of probe 2 571. This allows the user to pull probe 2 571 out of the insertion hole on the surface of the needle seat 57. Then, the new probe 2 571 is inserted into the insertion hole. Rotating the positioning block 71 clockwise causes the positioning post 72 to move downward, causing the positioning ball 73 to move downward. This causes the end of the positioning post 72 away from the positioning block 71 and the positioning ball 73 to position probe 2 571 on the surface, making it easier for the user to replace probe 2 571.

[0078] The above are merely optional embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A circuit board test side pressing tool characterized by: Includes a base plate (2), the base plate (2) has a drive space (22) inside, a top surface testing mechanism (3) for testing the surface of the circuit board and a side surface testing mechanism (5) for testing the side surface of the circuit board are provided on one side of the surface of the base plate (2), and a lifting assembly (6) for lifting the circuit board is provided inside the base plate (2). The top surface testing mechanism (3) includes a pressure plate (31) hinged to one side of the surface of the base plate (2), and a probe (33) for transmitting electrical signals to the top surface of the circuit board is provided on the side of the pressure plate (31) near the surface of the base plate (2); The side testing mechanism (5) includes a drive frame (56) slidably disposed on one side of the surface of the base plate (2). A pin seat (57) is fixed at one end of the drive frame (56) away from the base plate (2). A plurality of probes (571) for transmitting electrical signals to the side of the circuit board are disposed on one side of the surface of the pin seat (57). A positioning component (7) for positioning the probes (571) is disposed on the surface of the pin seat (57).

2. The circuit board test side pressing tooling of claim 1, wherein: The side testing mechanism (5) also includes a handle (51) disposed on one side of the surface of the base plate (2). The end of the handle (51) near the base plate (2) is fixed with a rotating shaft (52) rotatably disposed inside the base plate (2). The end of the rotating shaft (52) away from the handle (51) is fixed with a screw (53) rotatably disposed inside the drive space (22). The surface of the screw (53) is threadedly connected to a drive block (54) slidably disposed inside the drive space (22). The surface of the drive block (54) is fixed with a drive rod (55) fixed on one side of the surface of the drive frame (56).

3. The circuit board test side pressure fixture according to claim 1, characterized in that: The lifting assembly (6) includes a lifting seat (61) fixedly mounted on the end of the drive frame (56) away from the pin seat (57). A lifting frame (62) is provided on the surface of the lifting seat (61). A lifting column (621) is fixedly mounted on the end of the lifting frame (62) near the lifting seat (61) and abuts against the surface of the lifting seat (61). A lifting plate (63) is fixedly mounted on the end of the lifting frame (62) away from the lifting seat (61) and slides inside the drive space (22). A plurality of transmission rods (641) are fixedly mounted on one side of the surface of the lifting plate (63). A lifting block (64) for lifting the circuit board is fixedly mounted on the end of the transmission rod (641) away from the lifting plate (63).

4. The circuit board test side pressure fixture according to claim 3, characterized in that: A mounting plate (45) is fixedly provided on one side of the surface of the base plate (2). A limiting seat (23) is symmetrically fixed on the side of the mounting plate (45) near the surface of the base plate (2). The end of the lifting frame (62) away from the lifting seat (61) is slidably disposed on one side of the surface of the limiting seat (23). Limiting blocks (622) that are slidably disposed inside the limiting seat (23) are fixed on both sides of the surface of the lifting frame (62). An elastic element (623) that is fixed inside the limiting seat (23) is fixedly provided in the middle of one side of the surface of the limiting block (622).

5. The circuit board test side pressure fixture according to claim 1, characterized in that: The positioning component (7) includes a positioning block (71) disposed on one side of the surface of the needle seat (57). The positioning block (71) is fixed with a positioning post (72) threadedly connected inside the needle seat (57) at one end near the needle seat (57). The positioning post (72) is fixed with a plurality of positioning balls (73) at one end away from the positioning block (71).

6. The circuit board test side pressure fixture according to claim 5, characterized in that: The positioning ball (73) is made of rubber.

7. The circuit board test side pressure fixture according to claim 1, characterized in that: The top surface testing mechanism (3) also includes an observation window (32) disposed on one side of the surface of the pressure plate (31).

8. The circuit board test side pressure fixture according to claim 4, characterized in that: A carrier plate (4) is fixed on the side of the mounting plate (45) away from the base plate (2), and a plurality of positioning bosses (41) for positioning the circuit board are fixed on the side of the carrier plate (45) away from the mounting plate (45).

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