High-precision automated test fixture for power semiconductor modules

Abstract

This utility model discloses a high-precision automated test fixture for power semiconductor modules, relating to the field of test fixture technology. It includes a test mechanism with a mounting frame fixedly installed on its top. An electric push rod is fixedly installed on the top of one end of the mounting frame. A set of limiting modules is provided on the front side of the mounting frame, and the top of the base is also equipped with a mounting frame. The output end of the electric push rod is equipped with a quick-change mechanism for quickly changing probe boards. The quick-change mechanism includes a locking unit and a reset unit. The locking unit is located at the bottom of the output end of the electric push rod and includes a lifting seat fixedly installed at the bottom of the output end of the test mechanism. By setting the locking unit, rapid disassembly and accurate positioning of the probe board are achieved. The operator only needs to slide the probe board along the slot and lock it in the L-slot using the locking rod to complete the probe board replacement, significantly improving the test adaptability and efficiency for power semiconductor modules with different packages.

Description

Technical Field

[0001] This utility model relates to the field of test fixture technology, specifically a high-precision automated test fixture for power semiconductor modules. Background Technology

[0002] After power semiconductor modules are packaged on the production line, their electrical parameters must be tested to determine whether the relevant electrical parameters of the modules are qualified.

[0003] According to the patent titled "A Power Semiconductor Module Test Fixture" (Patent Publication No.: CN206270455U, Patent Publication Date: 2017-06-20), it includes an upper pressure plate, a via plate, a support plate, and a protective plate. An upper pressure post is located in the center of the upper pressure plate, and the sample to be tested is placed in the center of the via plate, with the lower surface of the upper pressure post abutting against the upper surface of the sample. The upper pressure plate and the via plate are connected around their perimeter by upper pressure posts. Guide posts are located around the perimeter of the support plate, passing through the via plate, allowing the via plate to move up and down along the guide posts. Several springs are installed between the via plate and the support plate. Several test probes are installed on the support plate, and through holes are provided at corresponding positions on the via plate. The protective plate is connected to the support plate via connecting posts. It features high testing efficiency, high testing accuracy, and high testing safety.

[0004] Based on the aforementioned existing technologies, current high-precision automated test fixtures for power semiconductor modules still have the following problems: the probe boards of traditional fixtures are usually fixedly installed. When switching to test modules with different packages, operators need to manually remove dozens of screws, rewire, and calibrate the positions. This process is time-consuming and reduces testing efficiency. Therefore, this utility model provides a high-precision automated test fixture for power semiconductor modules. Utility Model Content

[0005] To address the shortcomings of existing technologies, this invention provides a high-precision automated test fixture for power semiconductor modules. It solves the following problems associated with existing high-precision automated test fixtures for power semiconductor modules: Traditional fixtures typically have fixedly mounted probe boards. When switching between testing modules with different packages, operators need to manually remove dozens of screws, rewire, and calibrate positions. This process is time-consuming and reduces testing efficiency.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a high-precision automated testing fixture for power semiconductor modules, comprising a testing mechanism, a mounting frame fixedly mounted on the top of the testing mechanism, an electric push rod fixedly mounted on the top of one end of the mounting frame, a set of limiting modules provided on the front side of the mounting frame, and a mounting frame provided on the top of the base, wherein the output end of the electric push rod is provided with a quick-change mechanism for quick-changing probe plates, the quick-change mechanism comprising:

[0007] The mounting unit is located at the bottom of the output end of the electric push rod, including a lifting seat fixedly installed at the bottom of the output end of the test mechanism. The front side of the lifting seat has a slot, and an insert plate is slidably inserted into the slot. The probe plate can be quickly replaced by sliding the insert plate into the slot. A set of locking rods is symmetrically slidably installed on the lifting seat to fix the position of the insert plate.

[0008] The reset unit is located inside the lifting base and is used to drive and reset the lever.

[0009] Preferably, two L-grooves are symmetrically formed on the left and right sides of the rear side of the insert plate, and the protruding end of the locking rod slides into the horizontal groove of the L-grooves to fix the position of the insert plate.

[0010] Preferably, two sets of limiting posts are symmetrically fixedly installed inside the lifting seat, and the locking rod slides on the two sets of limiting posts respectively to realize the locking rod's limited linear movement.

[0011] Preferably, the reset unit includes a gear rotatably installed inside the lifting seat, and two sets of limiting posts are respectively slidably installed with a first rack and a second rack, and the first rack and the second rack are symmetrically installed front to back and staggered, and both the first rack and the second rack are meshed with the gear.

[0012] Preferably, one end of both the first rack and the second rack is fixedly connected to the locking rod. The rotation of the gear drives the second rack to move, thereby moving the locking rod. A push block is fixedly installed on the top of one end of the first rack, and the push block slides inside the rectangular groove at the top of the lifting seat.

[0013] Preferably, each of the limiting posts has a stop fixedly installed on its surface, and the two stops of the limiting posts are installed symmetrically and alternately in front and behind. Each of the limiting posts has a spring installed on its surface, and the first rack is reset by the elastic force of the spring itself.

[0014] This invention provides a high-precision automated testing fixture for power semiconductor modules. Compared with the prior art, it has the following advantages:

[0015] 1. This high-precision automated test fixture for power semiconductor modules, through the setting of a clamping unit, enables rapid disassembly and accurate positioning of the probe board. Operators simply slide the probe board along the slot and lock it in the L-slot using the clamping rod to complete the probe board replacement, significantly improving the test adaptability and efficiency for power semiconductor modules with different packages.

[0016] 2. This high-precision automated testing fixture for power semiconductor modules achieves synchronous driving and automatic reset of the clamping rod through a reset unit. Pushing the push block causes the clamping rod to exit the L-slot via gear and rack transmission. After releasing, the spring automatically pushes the rack to reset and lock the insert plate. The structure is stable and the operation is simple. Attached Figure Description

[0017] Figure 1 This is a frontal perspective view of the three-dimensional structure of this utility model;

[0018] Figure 2 This is a three-dimensional structural diagram of the quick-change mechanism of this utility model;

[0019] Figure 3 This is a three-dimensional structural diagram of the quick-change mechanism of this utility model.

[0020] Figure 4 This is a three-dimensional cross-sectional view of the quick-change mechanism of this utility model.

[0021] In the diagram: 1-Testing mechanism, 11-Base, 12-Mounting bracket, 13-Electric push rod, 14-Limit module, 2-Quick change mechanism, 21-Card mounting unit, 211-Lifting seat, 212-Card slot, 213-Insertion plate, 214-L-slot, 215-Limit post, 216-Card rod, 22-Reset unit, 221-Gear, 222-First rack, 223-Second rack, 224-Stop, 225-Spring, 226-Push block. Detailed Implementation

[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0023] Please see Figures 1-4 This utility model provides a technical solution:

[0024] A high-precision automated test fixture for power semiconductor modules includes a test mechanism 1. A mounting bracket 12 is fixedly mounted on the top of the test mechanism 1. An electric push rod 13 is fixedly mounted on one end of the mounting bracket 12. A set of limiting modules 14 is provided on the front side of the mounting bracket 12. The mounting bracket 12 is also provided on the top of the base 11. A quick-change mechanism 2 is provided at the output end of the electric push rod 13 for quick probe plate replacement. The quick-change mechanism 2 includes:

[0025] The mounting unit 21 is located at the bottom of the output end of the electric push rod 13. It includes a lifting seat 211 fixedly installed at the bottom of the output end of the test mechanism 1. The front side of the lifting seat 211 has a slot 212. An insert plate 213 is slidably inserted into the slot 212. The probe plate can be quickly replaced by sliding the insert plate 213 into the slot 212. A set of locking rods 216 are symmetrically slidably installed on the lifting seat 211 to fix the position of the insert plate 213.

[0026] The reset unit 22 is located inside the lifting base 211 and is used to drive and reset the lever 216.

[0027] The electric actuator 13, model SLEL205, is electrically connected to an external power source and is operated by a human-operated control panel.

[0028] In this embodiment, two L-grooves 214 are symmetrically opened on the left and right sides of the rear side of the insert plate 213, and the protruding end of the locking rod 216 slides into the horizontal groove of the L-grooves 214 to fix the position of the insert plate 213.

[0029] The L-shaped groove and the protruding end of the locking rod enable rapid and precise mechanical locking and releasing of the probe plate 213, ensuring the stable installation of the probe plate during the testing process, effectively preventing testing errors caused by displacement, and improving the efficiency of replacement and the reliability of positioning.

[0030] In this embodiment, two sets of limiting posts 215 are symmetrically fixedly installed inside the lifting seat 211, and the locking rod 216 slides on the two sets of limiting posts 215 respectively to realize the limiting linear movement of the locking rod 216.

[0031] The two ends of the lifting seat 211 slide on the vertical rod of the limiting module 14. The limiting post 215 provides precise linear motion guidance for the locking rod 216, constrains its movement trajectory, and prevents the locking rod 216 from deflecting or getting stuck during the sliding process.

[0032] In this embodiment, the reset unit 22 includes a gear 221 rotatably installed inside the lifting seat 211. Two sets of limiting posts 215 are respectively slidably installed with a first rack 222 and a second rack 223. The first rack 222 and the second rack 223 are symmetrically installed front to back and staggered. The first rack 222 and the second rack 223 are both meshed with the gear 221.

[0033] Through the meshing transmission of gear 221 and two racks, the input action of a single push block 226 is converted into the synchronous opposite or opposite movement of two locking rods 216, realizing the linkage control of the two locking rods and ensuring that the force on both sides of the insert plate 213 is uniform and the locking is reliable.

[0034] In this embodiment, one end of the first rack 222 and the second rack 223 are fixedly connected to the locking rod 216. The rotation of the gear 221 drives the second rack 223 to move, thereby realizing the movement of the locking rod 216. A push block 226 is fixedly installed on the top of one end of the first rack 222, and the push block 226 slides inside the rectangular groove at the top of the lifting seat 211.

[0035] The operator can pull the push block 226 to drive the two locking rods 216 on both sides to simultaneously exit the locked position through the rack and pinion system, thus completing the unlocking action.

[0036] In this embodiment, the surfaces of the limiting posts 215 are all fixedly equipped with blocks 224, and the two blocks 224 of the limiting posts 215 are installed in a symmetrical and staggered manner. The surfaces of the limiting posts 215 are all equipped with springs 225, and the first rack 222 is reset by the elastic force of the springs 225 themselves.

[0037] The spring force of the spring 225 provides the power for the automatic reset of the first rack 222, while the stop block 224 is used to precisely limit the reset endpoint position of the rack. This design ensures that after the push block 226 is released, the locking rod 216 can automatically and accurately return to and lock into the L groove 214 under the action of the spring force, realizing the automatic restoration of the probe plate locking state.

[0038] Furthermore, any content not described in detail in this specification is existing technology known to those skilled in the art.

[0039] During operation, the power semiconductor module is first fixedly installed on the mounting bracket 12. The user pushes the push block 226, which drives the first rack 222 to move. The first rack 222 drives the gear 221 to rotate. The gear 221 synchronously drives the second rack 223 to move. The movement of the first rack 222 and the second rack 223 drives the two push blocks 226 to move synchronously towards each other, so that the protruding end of the latch 216 slides out of the transverse groove of the L groove 214.

[0040] Then, the user pulls out the insert plate 213 and slides the new insert plate 213 into the slot 212. The user releases the push block 226, and the spring 225 pushes the first rack 222 and the second rack 223 to move by its own elastic force. The first rack 222 and the second rack 223 drive the two locking rods 216 to move synchronously, so that the protruding end of the locking rod 216 is inserted into the transverse groove of the L slot 214 to fix the insert plate 213.

[0041] Finally, the electric push rod 13 moves the quick-change mechanism 2 downward, so that the probe at the bottom of the slot 212 contacts the power semiconductor module for testing.

[0042] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0043] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A high-precision automated test fixture for power semiconductor modules, comprising a test mechanism (1), wherein a mounting bracket (12) is fixedly mounted on the top of the test mechanism (1), an electric push rod (13) is fixedly mounted on the top of one end of the mounting bracket (12), a set of limiting modules (14) is provided on the front side of the mounting bracket (12), and the mounting bracket (12) is provided on the top of the base (11), characterized in that: The output end of the electric push rod (13) is provided with a quick-change mechanism (2) for quick-change of probe plate, and the quick-change mechanism (2) includes: The mounting unit (21) is located at the bottom of the output end of the electric push rod (13), including a lifting seat (211) fixedly installed at the bottom of the output end of the test mechanism (1). The front side of the lifting seat (211) is provided with a slot (212). A plate (213) is slidably inserted into the slot (212). The probe plate can be quickly replaced by sliding the plate (213) into the slot (212). A set of locking rods (216) is symmetrically slidably installed on the lifting seat (211) for fixing the position of the plate (213). The reset unit (22) is located inside the lifting seat (211) and is used to drive and reset the lever (216).

2. The high precision automated test fixture for power semiconductor modules of claim 1, wherein: The insert plate (213) has two L-grooves (214) symmetrically opened on the left and right sides of its rear side, and the protruding end of the locking rod (216) slides into the horizontal groove of the L-grooves (214) to fix the position of the insert plate (213).

3. The high-precision automated test fixture for power semiconductor modules according to claim 1, characterized in that: The lifting seat (211) has two sets of limiting posts (215) fixedly installed symmetrically in front and behind, and the locking rod (216) slides on the two sets of limiting posts (215) respectively to realize the limiting linear movement of the locking rod (216).

4. The high-precision automated test fixture for power semiconductor modules according to claim 3, characterized in that: The reset unit (22) includes a gear (221) rotatably installed inside the lifting seat (211). The two sets of limiting posts (215) are respectively slidably installed with a first rack (222) and a second rack (223). The first rack (222) and the second rack (223) are symmetrically and staggered between each other. The first rack (222) and the second rack (223) are both meshed with the gear (221).

5. The high-precision automated test fixture for power semiconductor modules according to claim 4, characterized in that: One end of the first rack (222) and the second rack (223) are fixedly connected to the locking rod (216). The gear (221) rotates to drive the second rack (223) to move, thereby realizing the movement of the locking rod (216). A push block (226) is fixedly installed on the top of one end of the first rack (222), and the push block (226) slides inside the rectangular groove at the top of the lifting seat (211).

6. The high-precision automated test fixture for power semiconductor modules according to claim 4, characterized in that: Each of the limiting posts (215) is fixedly equipped with a stop (224), and the two stops (224) of the limiting posts (215) are installed in a symmetrical staggered manner. Each of the limiting posts (215) is equipped with a spring (225), and the first rack (222) is reset by the elastic force of the spring (225).

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