A fixture for chip aging resistance testing

Abstract

This utility model discloses a fixture for chip aging resistance testing, belonging to the field of chip testing technology, aiming to solve the technical problem of the inconvenience of existing chip aging resistance testing methods. The fixture includes a base plate, a housing, and a support assembly. Air inlets are provided on both sides of the base plate. The support assembly is located on top of the base plate and is used to hold the chip to be tested. The housing is located on top of the base plate, covering the air inlets and the support assembly. An air outlet window is provided at the top of the housing, and a fan unit is installed inside the outlet window. A heating wire is located inside the housing near the air inlets. This chip aging resistance testing fixture can simulate the environmental conditions of chips in actual use. Operators only need to set the test parameters to automatically complete the testing process, reducing manual intervention and improving testing efficiency.

Description

Technical Field

[0001] This utility model belongs to the field of chip testing technology, specifically relating to a tooling for chip aging resistance testing. Background Technology

[0002] In the research, development, production, and quality inspection of chips, aging resistance testing is a crucial step in evaluating chip performance and reliability. In real-world applications, chips face various complex environmental conditions, such as temperature variations, humidity fluctuations, and prolonged operation. These factors can all lead to performance degradation or even malfunction. Therefore, aging resistance testing is necessary to simulate the environment chips experience during long-term use, allowing for the early detection of potential problems and providing a basis for chip design optimization and manufacturing process improvements.

[0003] However, existing chip aging resistance testing fixtures have many shortcomings. On the one hand, they lack versatility, often only suitable for testing specific types or specifications of chips. When testing different types or packaged chips, the entire testing fixture needs to be replaced or extensively modified, increasing testing costs and time. On the other hand, their environmental control precision is insufficient, making it difficult to accurately simulate the environmental conditions of chips in actual use, such as large temperature fluctuations, leading to inaccurate test results. Therefore, this application proposes a chip aging resistance testing fixture. Utility Model Content

[0004] In view of the shortcomings of the existing technology, the purpose of this utility model is to provide a tooling for chip aging resistance testing, which aims to solve the technical problem that chip aging resistance testing is not convenient under the existing technology.

[0005] Technical solution

[0006] To address the aforementioned technical problems, this utility model provides a fixture for chip aging resistance testing, comprising a base plate, a housing, and a support assembly. The base plate has air inlets on both sides. The support assembly is located on top of the base plate and is used to hold the chip to be tested. The housing is located on top of the base plate and covers the air inlets and the support assembly. An air outlet is located at the top of the housing, and a fan unit is installed inside the air outlet. A heating wire is located inside the housing near the air inlets.

[0007] Preferably, an air guide shell is provided at the bottom of the inner side wall of the enclosure, and an air guide channel is formed between the air guide shell and the side wall of the enclosure. The air guide channel is connected to the air inlet. The top of the air guide shell has an air guide window, which discharges air towards the side of the supporting component. The heating wire is installed in the air guide window.

[0008] Preferably, both the air inlet and the air guide shell are equipped with a mesh screen, and the fan unit is located on the side of the mesh screen facing the inside of the housing.

[0009] Preferably, support legs are provided at the four corners of the bottom of the base plate, and a door is provided on one side wall of the box cover.

[0010] Preferably, a temperature and humidity sensor is provided on the inner wall of the enclosure, and the temperature and humidity sensor extends to the middle of the enclosure.

[0011] Preferably, the support assembly includes a support block rotatably mounted at the center of the upper surface of the base plate and a support tray disposed on the support block. A motor is installed at the bottom of the base plate, and the drive shaft of the motor is connected to the support block. When the motor is started, it drives the support block and the support tray to rotate.

[0012] The tray has a groove on the top outer side, and the groove surrounds the tray. Multiple dividing strips are arranged radially inside the groove, dividing the groove into multiple compartments for individually holding chips.

[0013] Preferably, a controller is provided on the outer wall of the enclosure, and the controller is connected to the heating wire, motor, fan unit and temperature and humidity sensor.

[0014] Preferably, multiple support arms are radially arranged on the side wall of the support block, and the support tray is movably placed on the support block and the multiple support arms. Multiple insertion posts are vertically arranged on the support arms, and multiple insertion holes are opened on the support tray. The multiple insertion posts and the multiple insertion holes are inserted and matched. A handle is provided on the upper surface of the support tray.

[0015] Beneficial effects

[0016] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0017] In this invention, the temperature and humidity inside the enclosure are monitored in real time by a temperature and humidity sensor, and the heating power of the heating wire and the speed of the fan unit are automatically adjusted by the controller. This can simulate the environmental conditions of the chip in actual use. The fan unit continuously exhausts hot air from the air outlet while simultaneously drawing in new air and heating it, forming a hot air circulation. This ensures a uniform temperature distribution inside the enclosure, improves the accuracy of the test results, and guarantees the reliability of the test results.

[0018] Furthermore, the controller enables automated control of the testing environment. Operators only need to set the test parameters to automatically complete the testing process, reducing manual intervention and improving testing efficiency. Meanwhile, the tray has multiple compartments, allowing for the simultaneous testing of multiple chips of different types or specifications without requiring replacement of the entire testing fixture or extensive modifications, thus reducing testing costs and time. The tray also features a handle for easy loading and unloading, further enhancing operational convenience. Attached image description:

[0019] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0021] Figure 2 This is a schematic diagram of the internal structure of the box cover in this utility model;

[0022] Figure 3 This utility model Figure 2 Enlarged view of point A in the image;

[0023] Figure 4 This is a schematic diagram of the support component in this utility model.

[0024] The labels in the attached diagram are as follows: 1. Base plate; 2. Cover; 3. Support leg; 4. Door; 5. Air outlet; 6. Controller; 7. Support assembly; 8. Motor; 9. Air guide shell; 10. Air inlet slot; 11. Temperature and humidity sensor; 12. Fan unit; 13. Air guide window; 14. Heating wire; 15. Partition mesh; 16. Air guide channel; 17. Support block; 18. Support arm; 19. Support tray; 20. Support groove; 21. Divider strip; 22. Insert post; 23. Handle; 24. Insertion hole. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0026] This embodiment provides a fixture for chip aging resistance testing, the structural schematic diagram of which is shown below. Figures 1-4 As shown, it includes a base plate 1, a box cover 2, and a support assembly 7.

[0027] In this embodiment, the base plate 1 serves as the supporting foundation for the entire tooling, and support legs 3 are provided at its four bottom corners to stably place the tooling on the worktable. Air inlet slots 10 are provided on both sides of the base plate 1.

[0028] In this embodiment, the support assembly 7 is disposed on the top of the base plate 1 and is used to hold the chip to be tested. The support assembly 7 includes a support block 17 rotatably mounted at the center of the upper surface of the base plate 1 and a support tray 19 disposed on the support block 17. Multiple support arms 18 are radially arranged on the side wall of the support block 17, and the support tray 19 is movably placed on the support block 17 and the multiple support arms 18. Multiple insertion posts 22 are vertically arranged on the support arms 18, and multiple insertion holes 24 are opened on the support tray 19. The multiple insertion posts 22 and the multiple insertion holes 24 are inserted and engaged to ensure the stable placement of the support tray 19. A groove 20 is opened on the outer side of the top of the support tray 19. The groove 20 surrounds the support tray 19. Multiple dividing strips 21 are radially arranged inside the groove 20 along the support tray 19. The multiple dividing strips 21 divide the groove 20 into multiple compartments. Each compartment can be used to hold a chip individually, which facilitates the simultaneous testing of multiple chips. A motor 8 is installed at the bottom of the base plate 1. The drive shaft of the motor 8 is connected to the support block 17. When the motor 8 is started, it can drive the support block 17 and the support tray 19 to rotate, so that the chip can be evenly subjected to the influence of the test environment.

[0029] In a further embodiment, the enclosure 2 is located on top of the base plate 1, and covers the air inlet 10 and the support assembly 7. A door 4 is provided on one side wall of the enclosure 2 for easy insertion and removal of the chip. An air outlet 5 is provided at the top of the enclosure 2, and a fan unit 12 is installed inside the air outlet 5 to exhaust hot air from inside the enclosure 2. A mesh 15 protects the fan unit 12. An air guide shell 9 is provided inside the enclosure 2 near the air inlet 10. An air guide channel 16 is formed between the bottom of the inner side wall of the air guide shell 9 and the side wall of the enclosure 2, and the air guide channel 16 communicates with the air inlet 10. An air guide window 13 is located at the top of the air guide shell 9, and air is discharged towards the support assembly 7. An electric heating wire 14 is installed inside the air guide window 13 to heat the incoming air to simulate a high-temperature environment. Both the air inlet 10 and the air guide shell 9 are equipped with a partition net 15. The fan unit 12 is located on the side of the partition net 15 facing the inside of the housing 2. The partition net 15 can prevent the heating wire 14 and the fan unit 12 from contacting the outside. At the same time, the partition net 15 can prevent external debris from entering the tooling, thus playing a protective role.

[0030] In a further embodiment, a temperature and humidity sensor 11 is installed on the inner wall of the enclosure 2, extending to the center of the enclosure 2, for real-time monitoring of the temperature and humidity inside the enclosure 2. A controller 6 is installed on the outer wall of the enclosure 2, and the controller 6 is connected to the heating wire 14, the motor 8, the fan unit 12, and the temperature and humidity sensor 11. Based on the temperature and humidity information fed back by the temperature and humidity sensor 11, the controller 6 can automatically adjust the heating power of the heating wire 14 and the speed of the fan unit 12 to achieve precise control of the temperature and humidity inside the enclosure 2. A handle 23 is provided on the upper surface of the tray 19 for easy handling by the operator.

[0031] Working principle:

[0032] First, open the chamber door 4 and place the chips to be tested into their respective compartments on the support tray 19. Then, place the support tray 19 on the support block 17 and support arm 18, ensuring that the insertion pins 22 are inserted into the insertion holes 24, and that the support tray 19 is placed stably. Close the chamber door 4 and start the motor 8. The motor 8 drives the support block 17 and the support tray 19 to rotate, allowing the chips to be evenly exposed to the influence of the testing environment.

[0033] The required test temperature parameters are set via controller 6. Fan unit 12 starts, drawing in outside air through air inlet 10. The air is filtered by mesh 15 and enters air duct 16, then blown out through air duct 13. At this time, heating wire 14 heats the blown air according to the controller 6's instructions, raising the temperature inside chamber 2. Temperature and humidity sensor 11 monitors the temperature and humidity inside chamber 2 in real time and feeds the data back to controller 6. Controller 6 automatically adjusts the heating power of heating wire 14 and the speed of fan unit 12 based on the feedback data to achieve precise control of the temperature and humidity inside chamber 2.

[0034] During the test, the chip exchanges heat with the hot air inside the enclosure 2 through heat conduction and convection to test the chip's heat resistance. The fan unit 12 continuously exhausts hot air from the exhaust window 5 while simultaneously drawing in and heating fresh air, creating a hot air circulation system to ensure a uniform temperature distribution within the enclosure 2. Once the preset test time has elapsed, the motor 8, heating wire 14, and fan unit 12 are turned off. The enclosure door 4 is then opened, and the tested chip is removed for performance testing and analysis.

[0035] All technical features in this embodiment can be freely combined according to actual needs.

[0036] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A fixture for chip aging resistance testing, characterized in that, include: The base plate (1) has air inlet slots (10) on both sides; Support component (7), which is disposed on the top of the base plate (1) and is used to hold the chip to be tested; The box cover (2) is set on the top of the base plate (1) and covers the air inlet slot (10) and the support assembly (7) inside. The top of the box cover (2) is provided with an air outlet window (5), and a fan unit (12) is installed inside the air outlet window (5). An electric heating wire (14) is provided inside the box cover (2) near the air inlet slot (10).

2. The fixture for chip aging resistance testing according to claim 1, characterized in that, The bottom of the inner wall of the box cover (2) is provided with an air guide shell (9), and an air guide channel (16) is formed between the air guide shell (9) and the side wall of the box cover (2). The air guide channel (16) is connected to the air inlet slot (10). The top of the air guide shell (9) has an air guide window (13). The air guide window (13) exhausts air towards the side of the support component (7). The heating wire (14) is assembled in the air guide window (13).

3. The fixture for chip aging resistance testing according to claim 2, characterized in that, Both the air inlet (10) and the air guide shell (9) are equipped with a mesh (15), and the fan unit (12) is located on the side of the mesh (15) facing the inside of the box cover (2).

4. The fixture for chip aging resistance testing according to claim 1, characterized in that, The bottom plate (1) is provided with support legs (3) at the four corners of the bottom, and the box cover (2) is provided with a box door (4) on one side wall.

5. The fixture for chip aging resistance testing according to claim 2, characterized in that, A temperature and humidity sensor (11) is provided on the inner wall of the enclosure (2), and the temperature and humidity sensor (11) extends to the middle of the enclosure (2).

6. The fixture for chip aging resistance testing according to claim 5, characterized in that, The supporting assembly (7) includes a support block (17) rotatably mounted on the upper surface of the base plate (1) at the center and a support tray (19) set on the support block (17). A motor (8) is installed at the bottom of the base plate (1). The drive shaft of the motor (8) is connected to the support block (17). When the motor (8) starts, it drives the support block (17) and the support tray (19) to rotate. The tray (19) has a slot (20) on the outer side of the top. The slot (20) surrounds the tray (19) in a ring. Multiple partition strips (21) are arranged radially along the tray (19) inside the slot (20). The multiple partition strips (21) divide the slot (20) into multiple compartments for individually holding chips.

7. The fixture for chip aging resistance testing according to claim 6, characterized in that, A controller (6) is provided on the outer wall of the enclosure (2). The controller (6) is connected to the heating wire (14), the motor (8), the fan unit (12), and the temperature and humidity sensor (11).

8. The fixture for chip aging resistance testing according to claim 6, characterized in that, The support block (17) has multiple support arms (18) radially arranged on its side wall. The support tray (19) is movably placed on the support block (17) and the multiple support arms (18). The support arms (18) have multiple insertion posts (22) vertically arranged on them. The support tray (19) has multiple insertion holes (24) opened on it. The multiple insertion posts (22) are inserted into the multiple insertion holes (24). The upper surface of the support tray (19) is provided with a handle (23).

Images