A compact splicing flash meter

By integrating the camera module and telecentric lens system of the flash meter under the stage, the center of gravity is lowered and the optical design is optimized, solving the problems of swaying and resonance in vibrating environments and achieving high stability and high precision measurement.

CN224455741UActive Publication Date: 2026-07-03SHANDONG KOSHE AUTOMATION EQUIPMENT CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHANDONG KOSHE AUTOMATION EQUIPMENT CO LTD
Filing Date
2025-09-28
Publication Date
2026-07-03

AI Technical Summary

Technical Problem

Existing flash meters are prone to shaking and mechanical resonance in vibrating environments, which affects imaging stability and measurement accuracy.

Method used

The camera module and telecentric lens system are integrated under the stage to lower the center of gravity of the device, and the vibration transmission path and stray light interference are reduced through the design of a ring light source and a multi-layer optical structure.

Benefits of technology

It improves the stability and measurement accuracy of the equipment under vibration conditions, suppresses imaging blurring caused by mechanical resonance, and ensures high-efficiency measurement results.

✦ Generated by Eureka AI based on patent content.

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Abstract

This utility model discloses a compact splicing flash meter, belonging to the technical field of flash meter technology. It includes a base, a stage mounted on the upper surface of the base, an observation device inside the stage, an RGBW light source movably mounted above the stage, and ring light sources around the bottom of the observation device. This utility model integrates the camera module and telecentric lens system below the stage, achieving dual technical advantages: firstly, the device's center of gravity is significantly lowered, effectively improving the stability of the overall structure; secondly, the compact layout reduces the vibration transmission path of mechanical components. This integrated design, through the aforementioned synergistic effect, can suppress the impact of high-frequency vibration on the optical system, avoiding imaging blurring caused by mechanical resonance, thereby ensuring high-efficiency measurement accuracy even under vibration conditions.
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Description

Technical Field

[0001] This utility model relates to the field of flash meter technology, and in particular to a compact splicing flash meter. Background Technology

[0002] A flash measurement instrument is a rapid measurement mechanism that uses a telecentric lens with a wide field of view and large depth of field to reduce the product's outline image by tens of times before transmitting it to a high-resolution camera for digital processing. Then, powerful back-end measurement software captures the product's outline and performs calculations to determine its dimensions. Due to its high speed and high degree of automation, this measurement method is now widely used in various fields such as machinery, electronics, cables, and watches.

[0003] In current technology, the basic structure of a flash meter is that the camera and telecentric lens are set above the stage. This structure is not very compact. The focus is adjusted or the size of the object to be measured is adapted by moving the position of the camera or telecentric lens. The problem is that because the center of gravity is above the stage, the entire flash meter is prone to shaking during the above-mentioned movement. In a vibrating environment (such as a stamping workshop), it is easy to generate mechanical resonance, which affects the imaging stability of the camera.

[0004] To overcome the above shortcomings, the inventors invented a compact splicing flash detector. Utility Model Content

[0005] To address the shortcomings of existing technologies, the purpose of this invention is to provide a compact, stitched flash measurement instrument. By integrating the camera module and telecentric lens system below the stage, this flash measurement instrument achieves dual technological advantages: firstly, the center of gravity of the device is significantly lowered, effectively improving the stability of the overall structure; secondly, the compact layout reduces the vibration transmission path of mechanical components. This integrated design, through the aforementioned synergistic effect, can suppress the impact of high-frequency vibrations on the optical system, avoiding imaging blurring caused by mechanical resonance, thereby ensuring high-efficiency measurement accuracy even under vibration conditions.

[0006] To achieve the above objectives, this utility model is implemented through the following technical solution:

[0007] A compact splicing flash meter includes a base, a stage is set on the upper surface of the base, an observation device is set inside the stage, an RGBW light source is movably set above the stage, a ring light source is set around the bottom of the observation device, a quartz protective layer is set below the ring light source, and a telecentric lens and an industrial camera are arranged in sequence below the quartz protective layer. The industrial camera is linearly connected to a display. The ring light source can provide ring illumination without blind spots.

[0008] As a further implementation, the observation device, from bottom to top, includes borosilicate glass, a silicon dioxide transition layer, an ITO glass layer, a sapphire layer, and an antireflective hardening film.

[0009] As a further implementation, the ring light source is a side-embedded light source, and the light source is an LED.

[0010] As a further implementation method, the sapphire layer is a sapphire single crystal wafer with a thickness of 0.5-2.0 mm and a Mohs hardness of 7-9 HM.

[0011] As a further implementation, the ITO glass layer thickness is 90nm-110nm.

[0012] As a further implementation method, the antireflection curing film material is MgF2, and the thickness of the antireflection curing film is 0.3μm-0.5μm.

[0013] As a further implementation, the observation device comprises, from bottom to top, borosilicate glass, a silicon nitride layer, an ITO glass layer, a sapphire layer, and an antireflection curing film; thin-film RTD sensors are arranged in a ring at the junction of the silicon nitride layer and the borosilicate glass substrate.

[0014] The beneficial effects of this utility model are as follows:

[0015] This invention reduces the risk of shaking in moving or vibrating environments by placing the stage above the base, thus avoiding mechanical resonance that could affect imaging accuracy. The stage houses the observation device; this design lowers the core optical components to the base area, significantly improving vibration resistance. Attached Figure Description

[0016] The accompanying drawings, which form part of this specification, are used to provide a further understanding of this utility model. The illustrative embodiments of this utility model and their descriptions are used to explain this utility model and do not constitute an improper limitation of this utility model.

[0017] Figure 1 This is a perspective view of Embodiment 1 of this utility model;

[0018] Figure 2 This is a schematic diagram of the structure of the base, platform, and display of Embodiment 1 of this utility model;

[0019] Figure 3 This is a utility model Figure 2 Enlarged view of point A in the middle;

[0020] Figure 4 This is a side view of Embodiment 1 of this utility model;

[0021] Figure 5 This is a cross-sectional view of the observation device, telecentric lens, and industrial camera of Embodiment 1 of this utility model.

[0022] Figure 6 This is a cross-sectional view of the observation device, telecentric lens, and industrial camera of Embodiment 2 of this utility model;

[0023] Among them, 100 is the base; 200 is the stage; 300 is the observation device; 400 is the RGBW light source; 500 is the ring light source; 600 is the quartz protective layer; 700 is the telecentric lens; 800 is the industrial camera; 900 is the display; 310 is the borosilicate glass; 320 is the silicon dioxide transition layer; 330 is the ITO glass layer; 340 is the sapphire layer; 350 is the anti-reflection hardening film; and 360 is the silicon nitride layer. Detailed Implementation

[0024] Example 1: This example provides a compact splicing flash detector, such as... Figure 1-5 As shown, the system includes a base 100, on the upper surface of which a stage 200 is disposed. The base 100 provides overall support and a stable foundation. The stage 200 is positioned above the base 100 to reduce the risk of swaying in moving or vibrating environments and to avoid mechanical resonance affecting imaging accuracy.

[0025] The stage 200 houses the observation device 300. Traditional flash meters have a high center of gravity due to the camera and lens being located above the stage 200, making them susceptible to vibration interference. This design lowers the core optical components (industrial camera 800 and telecentric lens 700) to the base 100 area, significantly improving vibration resistance. The upper surface of the stage 200 supports the object being measured (placed with the measured surface facing down), and the stage 200 provides a fixed measurement platform. The upper surface of the observation device 300 is a light-transmitting area.

[0026] An RGBW light source 400 is movably mounted above the stage 200 (specifically, the RGBW light source 400 has threaded holes, and the base 100 has a vertical rod with several threaded holes; the vertical position of the RGBW light source 400 is adjusted and fixed by bolts). This allows for vertical height adjustment of the RGBW light source 400. If necessary for production, the RGBW light source 400 can be fixedly mounted above the stage 200, that is, the RGBW light source 400 is fixedly mounted on a bracket, and the bracket is fixedly mounted on the base 100.

[0027] The observation device 300 has ring light sources 500 arranged around its bottom perimeter. Below the ring light sources 500 is a quartz protective layer 600. Below the quartz protective layer 600 are a telecentric lens 700 and an industrial camera 800 arranged sequentially. The quartz protective layer 600 is made of quartz, which is high in hardness, heat-resistant, and corrosion-resistant, making it suitable for industrial environments. Therefore, the quartz protective layer 600 isolates dust, oil, and other contaminants, reducing the frequency of lens cleaning. It also protects optical components from contamination or mechanical damage, extending the equipment's lifespan. The telecentric lens 700 can cover a wider area in a single shot, reducing errors. It also eliminates perspective errors, adapting to objects of different heights. The industrial camera 800 uses a CMOS sensor and a liquid zoom lens (specifically, the Optotune EL-16-40-TC). The industrial camera 800 converts optical images into digital signals.

[0028] The RGBW Light Source 400 is a four-channel composite lighting device, which achieves illumination simultaneously by integrating four-color LEDs: red (R), green (G), blue (B), and white (W).

[0029] The ring light source 500 eliminates surface reflection interference and highlights minute features (such as scratches and textures) at the edges of objects; it is especially suitable for precise contour extraction of highly reflective metals and transparent materials. Simultaneously, the ring light source 500 provides ring illumination without blind spots, avoiding localized overexposure or darkness. The industrial camera 800 is linearly connected to the display 900. The display 900 shows the measurement results and control interface in real time.

[0030] The observation device 300, from bottom to top, includes borosilicate glass 310, a silica transition layer 320, an ITO glass layer 330, a sapphire layer 340, and an antireflective hardening film 350. The borosilicate glass 310 possesses high heat resistance and chemical stability, ensuring the durability of the stage 200 surface. The silica transition layer 320 is used to adjust the properties of the borosilicate glass 310 (3.3 × 10⁻⁻⁶). 6 / K) and ITO glass layer 330 (7~9×10⁻ 6 The silicon dioxide transition layer 320 prevents thermal mismatch ( / K) and delamination between the borosilicate glass 310 and the ITO glass layer 330. The silicon dioxide transition layer 320 also blocks ion migration in the ITO glass layer 330. The ITO glass layer 330 absorbs and blocks ultraviolet damage. In operation, the ITO glass layer 330 can reflect near-infrared light through plasma vibration, reducing thermal interference and optical distortion.

[0031] The sapphire layer 340 has a transmittance of >95% in the ultraviolet-near infrared band, ensuring image clarity; the sapphire layer 340 has high thermal conductivity (35 W / m·K), so this design has excellent heat dissipation performance.

[0032] The ITO glass layer 330 achieves millisecond-level voltage response to the electrowetting effect, thereby enabling low sheet resistance conductivity.

[0033] The ring light source 500 is a side-embedded light source, and the light source is an LED (specifically a multi-chip white LED). Because in existing technologies, the entire light source is placed on the upper surface of the stage 200, resulting in a relatively high center of gravity, the ring light source 500 of this application is lower than the upper surface of the stage 200. Therefore, the center of gravity of this application is lower, making it less prone to shaking or resonance in vibrating environments. Furthermore, the ring light source 500 features a fast response and supports high-frequency flashing to freeze moving objects.

[0034] The sapphire layer 340 is made of sapphire single-crystal wafers with a thickness of 0.5-2.0 mm and a Mohs hardness of 7-9 HM. This design provides a high-strength optical window, allowing the sapphire layer 340 to combine wear resistance and light transmission. A thickness of 0.5-2.0 mm can withstand friction from workpieces, with a preferred thickness of 1 mm-1.6 mm (e.g., when metal parts are placed under impact).

[0035] The ITO glass layer 330 has a thickness of 90nm-110nm. This design effectively conducts static charge and prevents dust adsorption from interfering with imaging. The antireflective hardening film 350 is made of MgF2 and has a thickness of 0.3μm-0.5μm. The antireflective hardening film 350 (refractive index n≈1.38) is between that of sapphire (n≈1.76) and air (n=1.0). The design of the antireflective hardening film 350 optimizes the extinction effect.

[0036] In existing technologies, the camera is mounted on the base 100. During the up-and-down adjustment of the camera, the center of gravity is relatively high, making it more prone to resonance. In contrast, the entire observation device 300 of this application is built into the stage 200, so the center of gravity of this application is lower and the structure is more compact.

[0037] Meanwhile, existing technologies use cameras positioned above, collecting light from bottom to top. Therefore, these technologies are more susceptible to interference from other stray lights in the workshop (workshop light bulbs, fluorescent lights, UV disinfection lamps, etc.). However, in this application, the object to be tested is placed with the measured surface facing down, achieving direct contact with the observation device 300 and reducing interference from other stray lights in the workshop.

[0038] Example 2: The difference between this example and Example 1 is as follows:

[0039] like Figure 6As shown, the observation device 300, from bottom to top, includes borosilicate glass 310, a silicon nitride layer 360, an ITO glass layer 330, a sapphire layer 340, and an antireflection curing film 350. A thin-film RTD sensor (not shown in the attached figure) is arranged in a ring at the interface between the silicon nitride layer 360 and the borosilicate glass 310 substrate. The thin-film RTD sensor is linearly connected to a display 900. This design can monitor differences in thermal expansion coefficients (silicon nitride layer 360: 2.3 × 10⁻⁻⁻⁴). 6 / K, ITO glass layer 330: 3.3×10⁻ 6 The micro-strain generated by / K). In existing technologies, the glass layer temperature becomes excessively high due to prolonged use of the flash meter. This excessive temperature causes micro-strain between two structures with different coefficients of thermal expansion. The micro-strain causes distortion of the medium during light transmission, resulting in unclear imaging. This embodiment clearly shows the imaging distortion caused by overheating of the flash meter. Once excessive micro-strain is detected, the flash meter is stopped and reused after cooling.

[0040] The other design schemes in this embodiment are the same as those in Embodiment 1.

[0041] The ring light source 500 in this application uses the E-Shine series manufactured by Jinko Electronics (Guangzhou) Co., Ltd.

[0042] The ITO glass layer 330 is a conventional setting in the prior art. Those skilled in the art can select appropriate devices or settings based on the above description to achieve "millisecond-level voltage response of the ITO glass layer 330 to electrowetting effect, thereby achieving low sheet resistance conductivity".

[0043] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

[0044] This utility model discloses a compact splicing flash meter, belonging to the technical field of flash meter technology. It includes a base, a stage mounted on the upper surface of the base, an observation device inside the stage, an RGBW light source movably mounted above the stage, and ring light sources around the bottom of the observation device. This utility model integrates the camera module and telecentric lens system below the stage, achieving dual technical advantages: firstly, the device's center of gravity is significantly lowered, effectively improving the stability of the overall structure; secondly, the compact layout reduces the vibration transmission path of mechanical components. This integrated design, through the aforementioned synergistic effect, can suppress the impact of high-frequency vibration on the optical system, avoiding imaging blurring caused by mechanical resonance, thereby ensuring high-efficiency measurement accuracy even under vibration conditions.

Claims

1. A compact flash photometer comprising a base, characterized in that, A stage is mounted on the upper surface of the base, an observation device is installed inside the stage, and an RGBW light source is movably mounted above the stage. The observation device has a ring light source set around its bottom, a quartz protective layer below the ring light source, and a telecentric lens and an industrial camera set below the quartz protective layer. The industrial camera is linearly connected to the display. The ring light source can provide ring illumination without blind spots.

2. A compact flashover tester according to claim 1, wherein The observation device, from bottom to top, consists of borosilicate glass, a silicon dioxide transition layer, an ITO glass layer, a sapphire layer, and an antireflective hardening film.

3. A compact flash instrument according to claim 1, wherein, The ring light source is a side-embedded light source, and the light source is an LED.

4. A compact flashover tester according to claim 2, wherein The sapphire layer is a single crystal sapphire wafer with a thickness of 0.5-2.0 mm and a Mohs hardness of 7-9 HM.

5. A compact flashover tester according to claim 2, wherein The thickness of the ITO glass layer is 90nm-110nm.

6. A compact flash photometer according to claim 2, wherein The antireflective hardening membrane is made of MgF2 and has a thickness of 0.3μm-0.5μm.

7. A compact flash photometer according to claim 1, wherein The observation device, from bottom to top, consists of borosilicate glass, a silicon nitride layer, an ITO glass layer, a sapphire layer, and an anti-reflection hardening film; Thin-film RTD sensors are arranged in a ring at the junction of the silicon nitride layer and the borosilicate glass substrate.