ICT test fixture with reconfigurable probe array

Abstract

The utility model relates to ICT testing equipment technical field especially, and more particularly to probe array reconfigurable ICT testing fixture. Its technical scheme includes ICT testing fixture ontology and a plurality of probes, still includes the needle bed board of setting on the ICT testing fixture ontology, the inside of needle bed board is opened with the rectangular adjusting hole, the inside sliding connection of rectangular adjusting hole has at least a pair of adjusting frame. The utility model uses the cooperation of needle bed board, rectangular adjusting hole, adjusting frame, holding frame, adjusting sliding slot, locking mechanism and brake mechanism and other structures, when using probe array reconfigurable ICT testing fixture, sliding adjusting frame in rectangular adjusting hole and adjusting sliding slot, through locking mechanism fixed, brake mechanism adjusts probe position, realizes array flexible reconfiguration. With adjustable structure instead of fixed layout, need not to remanufacture fixture to be able to adapt to different PCB test point change, reduces the cost of time -consuming, avoids the warehouse waste and the management complexity, solves traditional fixture adaptability poor, high cost and resource waste problem.

Description

Technical Field

[0001] This utility model relates to the field of ICT test equipment technology, and in particular to an ICT test fixture with reconfigurable probe array. Background Technology

[0002] ICT test fixtures are tooling fixtures used for in-circuit testing of circuit boards (PCBs). Their main function is to fix the PCB and connect it to testing equipment. Probes contact the PCB test points to quickly and automatically detect the parameters, soldering quality, and circuit connectivity of circuit components (resistors, capacitors, inductors, transistors), ensuring the correctness of PCB soldering and component assembly. Traditional ICT test fixtures typically have probes pre-designed and installed according to the PCB test point locations, and are fixed in structure. This structure can only adapt to specific PCBs. If the test point positions or spacing change, the fixture must be remade, which is not only time-consuming (usually several days to weeks) but also costly (involving design, manufacturing, and debugging costs). Furthermore, multi-variety production requires stocking multiple sets of fixtures, increasing warehousing costs and management complexity, and old fixtures are easily idled due to product iterations, resulting in resource waste. Utility Model Content

[0003] The purpose of this invention is to address the problems of traditional ICT test fixtures with fixed probes that are only compatible with specific PCBs. When the test points change, the fixture needs to be remade, which is time-consuming and expensive. In addition, the production of multiple varieties increases the warehousing and management costs and causes resource waste. The invention proposes an ICT test fixture with reconfigurable probe arrays.

[0004] The technical solution of this utility model is as follows: an ICT test fixture with reconfigurable probe array, comprising an ICT test fixture body and multiple probes, and further comprising: a needle bed plate disposed on the ICT test fixture body, the needle bed plate having a rectangular adjustment hole inside, at least one pair of adjustment frames slidably connected inside the rectangular adjustment hole, the adjustment frames having slots for probe sliding inside, and at least one pair of retainers slidably fitted on each adjustment frame; a pair of adjustment grooves disposed in the rectangular adjustment hole, the adjustment grooves and slots having locking mechanisms that cause the adjustment frames to be engaged in the rectangular adjustment hole; and a braking mechanism installed inside the retainers to automatically abut against the inner wall of the slots.

[0005] Optionally, the locking mechanism includes a support plate fixedly connected to the inside of one end of the slot, a threaded rod spirally connected to the support plate, a stop plate abutting against the inner wall of the adjusting slide groove at one end of the threaded rod, and a limiting groove communicating with the adjusting slide groove and allowing the threaded rod to slide on the needle bed plate.

[0006] Optionally, a knob is also fixedly connected to the other end of the threaded rod.

[0007] Optionally, the braking mechanism includes a pair of notches formed on the bracket, the bracket is provided with a bracket that engages with the notches, a pair of blocks corresponding to the notches are fixedly connected inside the bracket, springs are fixedly connected to both ends of the bracket, the ends of the springs away from the brackets are fixedly connected to the corresponding blocks, and abutments that abut against the inner wall of the notches are also fixedly connected to both ends of the bracket.

[0008] Optionally, a protrusion is fixedly connected to the middle of the card holder.

[0009] Optionally, the ICT test fixture body is also provided with a manual pressure rod mechanism, and the top of the needle bed plate is fixedly connected with an arc-shaped support corresponding to the manual pressure rod mechanism.

[0010] Optionally, the ICT test fixture body is provided with a pair of support rods, and the needle bed plate is provided with a pair of sliding holes for support to pass through.

[0011] In summary, this application includes at least one of the following beneficial technical effects:

[0012] This invention utilizes a combination of a needle bed board, rectangular adjustment holes, an adjustment frame, a retaining frame, an adjustment slide, a locking mechanism, and a braking mechanism. When using a reconfigurable ICT test fixture with a probe array, the sliding adjustment frame is positioned within the rectangular adjustment holes and adjustment slide. The locking mechanism secures the probes, while the braking mechanism adjusts their positions, enabling flexible array reconfiguration. By replacing a fixed layout with an adjustable structure, it eliminates the need for remanufacturing the fixture to accommodate variations in PCB test points, reducing time and costs, avoiding storage waste and management complexity, and solving the problems of poor adaptability, high cost, and resource waste associated with traditional fixtures. Attached Figure Description

[0013] Figure 1 A schematic diagram of the reconfigurable probe array ICT test fixture of this utility model is provided;

[0014] Figure 2 for Figure 1 Partial structural diagram;

[0015] Figure 3 for Figure 2 A schematic diagram of the split structure;

[0016] Figure 4 for Figure 3 A partial diagram of the split structure;

[0017] Figure 5 for Figure 4 A partial breakdown diagram.

[0018] Reference numerals: 1. ICT test fixture body; 11. Manual pressure rod mechanism; 2. Needle bed plate; 21. Arc-shaped support frame; 22. Sliding hole; 23. Rectangular adjustment hole; 24. Adjustment slide groove; 25. Limiting groove; 3. Adjustment frame; 31. Slot; 32. Support plate; 33. Threaded rod; 34. Knob; 35. Abutment plate; 4. Probe; 41. Holder; 42. Notch; 43. Locking block; 44. Locking bracket; 45. Spring; 46. Abutment; 47. Protrusion. Detailed Implementation

[0019] The technical solution of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some embodiments of this utility model, but not all embodiments.

[0020] The components of the present invention embodiments described and shown in the accompanying drawings can typically be arranged and designed in a variety of different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention.

[0021] Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0022] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0023] It should be noted that the terms "comprising," "including," or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. In this specification, illustrative expressions of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0024] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0025] Example

[0026] like Figures 1 to 5 As shown, the ICT test fixture with reconfigurable probe array proposed in this utility model includes an ICT test fixture body 1 and multiple probes 4. The ICT test fixture body 1 is also equipped with a manual pressure rod mechanism 11. The manual pressure rod mechanism 11 applies pressure manually, and in conjunction with the arc-shaped support frame 21, presses down the needle bed plate 2, so that the probes 4 are in close contact with the test points on the circuit board. The ICT test fixture body 1 is provided with a pair of support rods, which pass through the sliding holes 22 of the needle bed plate 2, providing vertical support and guidance for the needle bed plate 2, allowing the needle bed plate 2 to slide up and down along the support rods, realizing the contact or separation of the probes 4 with the test points on the circuit board, and ensuring the stability and accuracy of the movement of the needle bed plate during the test. The needle bed plate 2 has a pair of sliding holes 22 for the support rods to pass through, allowing the needle bed plate 2 to slide up and down along the support rods, realizing the contact and separation of the probes with the circuit board. The top of the needle bed plate 2 is fixedly connected to an arc-shaped support 21 corresponding to the manual pressure rod mechanism 11, and a pair of support rods are provided on the ICT test fixture body 1.

[0027] Among them, such as Figures 2 to 5 As shown, the needle bed plate 2 has a pair of sliding holes 22 for support and movement. The ICT test fixture body 1 is equipped with the needle bed plate 2, which is the core component for mounting the adjustment frame. Its internal structure (rectangular adjustment hole 23, adjustment groove 24) provides space for adjusting the probe array. The needle bed plate 2 has a rectangular adjustment hole 23 inside, and at least a pair of adjustment frames 3 are slidably connected inside the rectangular adjustment hole 23. The adjustment frame 3 has a slot 31 inside for mounting the probe 4. The position and spacing of the probe array can be adjusted by sliding within the rectangular adjustment hole 23 and the adjustment groove 24. The adjustment frame 3 has a slot 31 inside for the probe 4 to slide. At least a pair of brackets 41 are slidably fitted on each adjustment frame 3. The rectangular adjustment hole 23 has a pair of adjustment grooves 24 inside.

[0028] Secondly, such as Figures 2 to 4As shown, the adjusting slide 24 and the slot 31 are equipped with a locking mechanism that allows the adjusting frame 3 to be locked in the rectangular adjusting hole 23. The locking mechanism includes a support plate 32 fixedly connected to the inside of one end of the slot 31. A threaded rod 33 is screwed onto the support plate 32. The threaded rod 33 is screwed onto the support plate 32. When rotated, it drives the abutment plate 35 to abut against the inner wall of the adjusting slide 24, fixing the position of the adjusting frame 3. One end of the threaded rod 33 is fixedly connected to the abutment plate 35, which abuts against the inner wall of the adjusting slide 24. The abutment plate 35 contacts the inner wall of the adjusting slide 24, and the adjusting frame 3 is locked and fixed by the thrust of the threaded rod 33. The needle bed plate 2 is provided with a limiting groove 25 that communicates with the adjusting slide 24 and allows the threaded rod 33 to slide. The other end of the threaded rod 33 is also fixedly connected to a knob 34, which facilitates manual rotation of the threaded rod 33, improving the ease of operation.

[0029] In addition, such as Figures 2 to 5 As shown, a braking mechanism is installed inside the bracket 41. The braking mechanism is used to automatically abut against the inner wall of the slot 31. The braking mechanism includes a pair of notches 42 formed on the bracket 41. The bracket 41 is provided with a bracket 44 that engages with the notches 42. The bracket 44 is connected to the block 43 by a spring 45. The two end abutments 46 abut against the inner wall of the slot 31 to fix the position of the probe 4. The central protrusion 47 facilitates manual adjustment. The protrusion 47 is fixedly connected to the middle of the bracket 44. The protrusion 47 is located in the middle of the bracket 44, which is convenient for the operator to move the bracket 44 to trigger the adjustment action of the braking mechanism. A pair of blocks 43 corresponding to the notches 42 are fixedly connected inside the bracket 41. The blocks 43 are fixed inside the bracket 41 and cooperate with the spring 45 to provide elastic restoring force for the bracket 44. Springs 45 are fixedly connected to both ends of the clip 44. The springs 45 provide elastic thrust, causing the abutments 46 of the clip 44 to press tightly against the inner wall of the slot 31, ensuring that the probe 4 is securely fixed. The ends of the springs 45 away from the clip 44 are fixedly connected to the corresponding clips 43. Abutments 46 that abut against the inner wall of the slot 31 are also fixedly connected to both ends of the clip 44. The abutments 46 contact the inner wall of the slot 31, and the movement of the clip 44 can clamp or release the probe 4, making it easy to adjust the probe position.

[0030] In this embodiment, when using the probe array reconfigurable ICT test fixture, the circuit board is first placed on the ICT test fixture body 1, positioned directly below the needle bed plate 2, and the positions of multiple rows of test points on the circuit board are determined. Then, a pair of adjustment brackets 3 are slid within the rectangular adjustment hole 23. The two ends of the adjustment brackets 3 are adjusted by sliding in the adjustment groove 24 to ensure that the probes 4 within the adjustment brackets 3 correspond vertically to the positions of a certain row of test points on the circuit board. Next, rotating the knob 34 drives the threaded rod 33 to rotate. Since the threaded rod 33 is helically connected to the support plate 32, one end of the threaded rod 33 will cause the abutment plate 35 to press tightly against the inner wall of the adjustment groove 24, thus securing the adjustment brackets 3 within the rectangular adjustment hole 23 and the adjustment groove 24.

[0031] When it is necessary to adjust the holder 41 on the adjustment frame 3 to ensure that the holder 41, after moving the probe 4, is perpendicular to the test point on the circuit board and is on the same axis, simply move the protrusion 47 on the holder 44. The protrusion 47 will move the holder 44, and the holder 44 will then disengage the abutment 46 from the inner wall of the slot 31. Finally, slide the probe 4 on the adjustment frame 3 to adjust it. After adjustment, release the protrusion 47. At this time, the holder 44, through the elastic thrust of a pair of springs 45, will cause the pair of abutments 46 to firmly press against the inner wall of the slot 31 again, so that the probe 4 is securely installed on the adjustment frame 3.

[0032] The preferred embodiments of this utility model described above are merely illustrative of the present utility model. These preferred embodiments do not exhaustively describe all details, nor do they limit the utility model to any specific implementation. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of this utility model, thereby enabling those skilled in the art to better understand and utilize it. This utility model is limited only by the claims and their full scope and equivalents.

Claims

1. An ICT test fixture with reconfigurable probe array, comprising an ICT test fixture body (1) and a plurality of probes (4), characterized in that, Also includes: The needle bed plate (2) is set on the ICT test fixture body (1). The needle bed plate (2) has a rectangular adjustment hole (23) inside. At least one pair of adjustment brackets (3) are slidably connected inside the rectangular adjustment hole (23). The adjustment brackets (3) have a slot (31) for the probe (4) to slide inside. At least one pair of brackets (41) are slidably fitted on each adjustment bracket (3). A pair of adjustment grooves (24) are provided in the rectangular adjustment hole (23), and the adjustment grooves (24) and the slot (31) are provided with a locking mechanism that allows the adjustment frame (3) to be locked in the rectangular adjustment hole (23); The braking mechanism is installed in the bracket (41) and automatically abuts against the inner wall of the slot (31).

2. The ICT test fixture with reconfigurable probe array according to claim 1, wherein, The locking mechanism includes a support plate (32) fixedly connected to the inside of one end of the slot (31), a threaded rod (33) is screwed on the support plate (32), and a stop plate (35) is fixedly connected to one end of the threaded rod (33) to abut against the inner wall of the adjusting slide (24). The needle bed plate (2) is provided with a limiting groove (25) that communicates with the adjusting slide (24) and allows the threaded rod (33) to slide.

3. The ICT test fixture with reconfigurable probe array according to claim 2, wherein, A knob (34) is also fixedly connected to the other end of the threaded rod (33).

4. The ICT test fixture with reconfigurable probe array of claim 1, wherein, The braking mechanism includes a pair of slots (42) formed on the bracket (41). The bracket (41) is provided with a bracket (44) that engages with the slots (42). A pair of blocks (43) corresponding to the slots (42) are fixedly connected inside the bracket (41). Springs (45) are fixedly connected to both ends of the bracket (44). The ends of the springs (45) away from the bracket (44) are fixedly connected to the corresponding blocks (43). Abutments (46) that abut against the inner wall of the slot (31) are also fixedly connected to both ends of the bracket (44).

5. The ICT test fixture with reconfigurable probe array according to claim 4, wherein, A protrusion (47) is fixedly connected to the middle of the card holder (44).

6. The ICT test fixture with reconfigurable probe array according to claim 1, characterized in that, The ICT test fixture body (1) is also provided with a manual pressure rod mechanism (11), and the top of the needle bed plate (2) is fixedly connected with an arc-shaped support (21) corresponding to the manual pressure rod mechanism (11).

7. The ICT test fixture with reconfigurable probe array of claim 1, wherein, The ICT test fixture body (1) is provided with a pair of support rods, and the needle bed plate (2) is provided with a pair of sliding holes (22) for support to pass through.

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