A portable chip resistor testing device

Abstract

This invention provides a portable surface mount resistor testing device, comprising a support platform, a PCB board, a fixture, a magnetic block, and multiple probes. The PCB board is mounted on the support platform. The fixture includes a replaceable positioning plate, an outer frame, a top cover on the outer frame, and a clip. The outer frame is mounted on the PCB board and has a T-shaped slot. The probes connect to the PCB board and extend into the positioning hole to contact the surface mount resistor. The outer frame has a stepped storage hole, and the magnetic block is movably disposed within the stepped storage hole. The replaceable positioning plate has a through hole with an embedded iron insert. When the stepped storage hole is aligned with the through hole, the magnetic block extends into the through hole. The top cover and positioning hole in the fixture are used to position the surface mount resistor under test, ensuring effective contact between the tested part and the probe. The resistance value can be manually tested. By changing the replaceable positioning plate, the device can accommodate surface mount resistors of different shapes, allowing it to test resistors of various specifications and meet the needs of small-batch production.

Description

Technical Field

[0001] This utility model relates to the field of chip resistor manufacturing, and in particular to a portable chip resistor testing device. Background Technology

[0002] After resistors are manufactured, resistance testing is required to verify that the resistance value meets the standards and ensure the uniformity of resistance values ​​within the same batch of products. Current surface mount resistors are produced automatically on assembly lines, allowing resistance testing to be performed during the manufacturing process.

[0003] However, in actual production, there are orders for processing semi-finished products provided by other suppliers. These semi-finished products have already undergone preliminary processing. If the existing production line is used for subsequent processing, a separate program needs to be written on the control terminal. Moreover, such processing orders are often for small-batch production. It is not cost-effective to rewrite the program specifically for small-batch processed products, and it is more cost-effective to make test fixtures separately.

[0004] Therefore, it is necessary to provide an independent resistance testing device to meet the needs of manufacturers producing small batches of products. Utility Model Content

[0005] The purpose of this invention is to overcome the shortcomings of the existing technology and provide a portable chip resistor testing device that is small in size, easy to store, and can clamp chip resistors of different shapes to meet the resistance value testing needs of small-batch production.

[0006] The objective of this utility model is achieved through the following technical solution:

[0007] A portable surface mount resistor testing device includes: a support platform, a PCB board, a fixture, a magnetic block, and multiple probes;

[0008] The PCB board is mounted on the support platform;

[0009] The fixture includes a replaceable positioning plate, an outer frame, and a top cover and buckles disposed on the outer frame. The outer frame is disposed on the PCB board and has a T-shaped slot for receiving the replaceable positioning plate. The replaceable positioning plate has a positioning hole for receiving the surface mount resistor to be tested. The probe is connected to the PCB board and extends into the positioning hole to contact the surface mount resistor. The top cover is used to press the surface mount resistor.

[0010] The outer frame has a stepped storage hole, and the magnetic block is movably disposed in the stepped storage hole. The replaceable positioning plate has a through hole, and an iron insert is embedded in the through hole. When the stepped storage hole is aligned with the through hole, the magnetic block extends into the through hole.

[0011] In one embodiment, the magnetic block is provided with a plug-in portion and a stop ring, the diameter of the plug-in portion is the same as the through hole, and the diameter of the stop ring is larger than the diameter of the plug-in portion.

[0012] In one embodiment, the inner wall of the T-shaped slot is provided with a limiting edge, the outer wall of the replaceable positioning plate is provided with an anti-detachment edge, and there is a gap between the anti-detachment edge and the limiting edge.

[0013] In one embodiment, the replaceable positioning plate has a clearance groove on its back side, the clearance groove extends from the side of the replaceable positioning plate into the through hole, and an inclined surface is provided at the boundary between the clearance groove and the side of the replaceable positioning plate, the inclined surface being used to guide the probe to retract.

[0014] In one embodiment, the outer frame is provided with a protrusion that fits against the inner wall of the clearance groove.

[0015] In one embodiment, the top cover and the buckle are located on opposite sides of the outer frame, and the top cover has a groove that matches the buckle.

[0016] In one embodiment, the top cover is provided with a pressure block for pressing the chip resistor.

[0017] In one embodiment, the buckle is rotatably mounted on the outer frame, and a spring is provided between the buckle and the outer frame. The spring is used to push the buckle to flip towards the direction of the upper cover.

[0018] In one embodiment, the upper cover is rotatably mounted on the outer frame, and a torsion spring is provided at the connection point between the upper cover and the outer frame.

[0019] In one embodiment, the cross-sectional shape of the positioning hole is consistent with the outer contour of the chip resistor.

[0020] The portable chip resistor testing device described above has the following advantages:

[0021] 1. The top cover and positioning holes in the fixture are used to position the patch resistor to be tested, ensuring that the part to be tested is in effective contact with the probe, and the resistance value can be tested manually.

[0022] 2. By changing the replaceable positioning plate to adapt to surface mount resistors of different shapes, the device can test resistors of various specifications to meet the needs of small-batch production.

[0023] 3. After the replaceable positioning plate is inserted into the T-shaped slot, the magnetic block is automatically attracted by the iron insert, so that the magnetic block extends into the through hole and automatically locks the replaceable positioning plate, preventing the replaceable positioning plate from shifting laterally during the test. When disassembling, the replaceable positioning plate is slightly tilted up, and the magnetic block will automatically fall back into the stepped storage hole after moving away from the iron insert. The disassembly and assembly process is simple and convenient. Attached Figure Description

[0024] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0025] Figure 1 This is a schematic diagram of the structure of the chip resistor to be tested;

[0026] Figure 2 This is a schematic diagram of the structure of a portable chip resistor testing device;

[0027] Figure 3 This is a split diagram of a portable surface mount resistor testing device;

[0028] Figure 4 Structural diagram of the replaceable positioning plate;

[0029] Figure 5 A schematic diagram showing the state before the replaceable positioning plate is inserted into the T-shaped slot;

[0030] Figure 6 for Figure 5 A schematic diagram showing the engagement of the probe and the replaceable positioning plate in the indicated state;

[0031] Figure 7 This is a schematic diagram showing the state after the replaceable positioning plate is inserted into the T-shaped slot.

[0032] Figure 8 for Figure 7 A schematic diagram showing the engagement of the probe and the replaceable positioning plate in the indicated state;

[0033] Figure 9 A schematic diagram showing the engagement of the iron insert and the magnetic block when removing the replaceable positioning plate.

[0034] Reference numerals: 10, Portable surface mount resistor testing device; 20, Surface mount resistor; 21, Electrode; 100, Support platform; 200, PCB board; 300, Fixture; 310, Replaceable positioning plate; 311, Positioning hole; 312, Through hole; 313, Iron insert; 314, Anti-detachment edge; 315, Clearance groove; 316, Inclined surface; 320, Outer frame; 321, T-shaped slot; 322, Stepped storage hole; 323, Protrusion; 31, Limiting edge; 330, Top cover; 331, Groove; 332, Pressure block; 340, Buckle; 400, Magnetic block; 410, Insertion part; 420, Stop ring; 500, Probe. Detailed Implementation

[0035] To facilitate understanding of this utility model, a more complete description will be given below with reference to the accompanying drawings. The drawings illustrate preferred embodiments of this utility model. However, this utility model can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a more thorough and complete understanding of the disclosure of this utility model.

[0036] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly attached to the other element or there may be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.

[0037] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed orders.

[0038] Please see Figure 2 and Figure 3 This utility model provides a portable chip resistor testing device 10 for testing the resistance value of chip resistor 20, which includes: a support platform 100, a PCB board 200, a fixture 300, a magnetic block 400 and multiple probes 500.

[0039] PCB board 200 is mounted on support platform 100. PCB board 200 is the component for testing chip resistor 20. After the chip resistor 20 to be tested is placed in fixture 300, it is connected to the electrode 21 (e.g., ...) on the resistor via probe 500. Figure 1(As shown) After contacting the resistor and applying current to it, the voltage value is measured. The actual resistance value of the resistor being measured can be calculated according to Ohm's law.

[0040] Please see Figure 7 and Figure 8 The fixture 300 includes a replaceable positioning plate 310, an outer frame 320, and a top cover 330 and a buckle 340 disposed on the outer frame 320. The outer frame 320 is disposed on the PCB board 200 and has a T-shaped slot 321 for accommodating the replaceable positioning plate 310. The replaceable positioning plate 310 has a positioning hole 311 for accommodating the surface mount resistor 20 to be tested. The cross-sectional shape of the positioning hole 311 is consistent with the outer contour of the surface mount resistor. The probe 500 is connected to the PCB board 200 and extends into the positioning hole 311 to contact the surface mount resistor. After the surface mount resistor 20 to be tested is placed in the positioning hole 311, the probe 500 can contact the electrode 21. At the same time, the top cover 330 presses down on the surface mount resistor 20 to ensure effective contact between the probe 500 and the electrode 21, avoiding displacement during the test.

[0041] The replaceable positioning plate 310 is a component for accommodating the chip resistor 20. It provides positioning for the chip resistor 20 to be tested through the hole wall of the positioning hole 311, so that its upper electrode 21 can be aligned with the probe 500. Different specifications of chip resistors 20 will have differences in size and shape. By replacing the replaceable positioning plate 310, the fixture 300 can be matched with various specifications of chip resistors 20, thereby improving the universality of the portable chip resistor testing device 10.

[0042] Please see Figure 3 , Figure 4 and Figure 5 The outer frame 320 has a stepped storage hole 322. The magnetic block 400 is movably disposed in the stepped storage hole 322. The replaceable positioning plate 310 has a through hole 312. An iron insert 313 is embedded in the through hole 312. When the stepped storage hole 322 is aligned with the through hole 312, the magnetic block 400 extends into the through hole 312. The replaceable positioning plate 310 is locked by the magnetic block 400 and the through hole 312 to prevent the replaceable positioning plate 310 from shifting laterally.

[0043] The working principle of the portable chip resistor testing device 10 described above is as follows:

[0044] Take a replaceable positioning plate 310 that matches the chip resistor 20 to be tested, align it with the slot of the T-shaped slot 321, and apply force to push the replaceable positioning plate 310 into the T-shaped slot 321, so that the through hole 312 is continuously close to the position of the stepped storage hole 322. When the through hole 312 is aligned with the stepped storage hole 322, the magnetic block 400 is attracted by the iron insert 313 and rises, and inserts into the through hole 312 to lock the replaceable positioning plate 310. The preparation work before the test is completed. After the chip resistor 20 to be tested is placed into the positioning hole 311, the probe 500 can contact the electrode 21. Flip the top cover 330 to press the chip resistor 20 firmly, and the buckle 340 locks the top cover 330. At this time, the power can be turned on to measure the resistance value of the chip resistor 20.

[0045] When the replaceable positioning plate 310 needs to be replaced, apply force to pry it up, causing the iron insert 313 to separate from the magnetic block 400. Figure 9 As shown, once the attraction of the iron insert 313 is lost, the magnetic block 400 will fall back into the stepped storage hole 322.

[0046] The portable chip resistor testing device 10 provided in this application is suitable for small-batch production scenarios, such as when manufacturers make samples for testing when designing new products, or when making small quantities of specific products, etc., where mass production is not required. The replaceable positioning plate 310 can be used to adapt chip resistors of different shapes and sizes.

[0047] Please see Figure 3 and Figure 4 In one embodiment, a limiting eave 31 is provided on the inner wall of the T-shaped slot 321, and an anti-detachment edge 314 is provided on the outer wall of the replaceable positioning plate 310. A gap is provided between the anti-detachment edge 314 and the limiting eave 31. The limiting eave 31 and the anti-detachment edge 314 restrict the vertical freedom of the replaceable positioning plate 310, preventing the replaceable positioning plate 310 from directly detaching along the axis of the through hole 312. The gap between the anti-detachment edge 314 and the limiting eave 31 provides vertical movement space for the replaceable positioning plate 310, making it easier for the user to release the magnetic force between the iron insert 313 and the magnetic block 400 when replacing the replaceable positioning plate 310.

[0048] Please see Figure 7 In one embodiment, the magnetic block 400 is provided with a plug-in portion 410 and a stop ring 420. The diameter of the plug-in portion 410 is the same as that of the through hole 312, and the diameter of the stop ring 420 is larger than that of the plug-in portion 410. When the magnetic block 400 extends, the plug-in portion 410 inserts into the through hole 312 to provide a limit, while the stop ring 420 abuts against the inner wall of the stepped receiving hole 322 to prevent the magnetic block 400 from coming out of the stepped receiving hole 322.

[0049] Please see Figure 7and Figure 8 In one embodiment, the back of the replaceable positioning plate 310 is provided with a clearance groove 315. The clearance groove 315 extends from the side of the replaceable positioning plate 310 into the through hole 312. An inclined surface 316 is provided at the boundary between the clearance groove 315 and the side of the replaceable positioning plate 310. During the process of inserting the replaceable positioning plate 310 into the T-shaped slot 321, the inclined surface 316 first contacts the probe 500. The inclined surface 316 can guide the probe 500 to retract downward. When the replaceable positioning plate 310 slides in the T-shaped slot 321, the probe 500 abuts against the inner wall of the clearance groove 315. After the replaceable positioning plate 310 slides into place, the probe 500 extends out and enters the positioning hole 311.

[0050] Please see Figure 3 and Figure 6 Preferably, the outer frame 320 is provided with a protrusion 323, which fits against the inner wall of the clearance groove 315. The cooperation between the protrusion 323 and the clearance groove 315 can provide guidance during the sliding of the replaceable positioning plate 310.

[0051] Please see Figure 2 In one embodiment, the upper cover 330 and the buckle 340 are located on both sides of the outer frame 320, and the upper cover 330 has a groove 331 that matches the buckle 340 so that the buckle 340 can fasten the upper cover 330.

[0052] Please see Figure 5 In one embodiment, the upper cover 330 is provided with a pressing block 332, which is used to press the chip resistor 20.

[0053] In one embodiment, the buckle 340 is rotatably mounted on the outer frame 320, and a spring (not shown) is provided between the buckle 340 and the outer frame 320. The spring is used to push the buckle 340 to rotate toward the upper cover 330. The upper cover 330 is rotatably mounted on the outer frame 320, and a torsion spring (not shown) is provided at the connection between the upper cover 330 and the outer frame 320.

[0054] The portable chip resistor testing device 10 described above has the following beneficial effects:

[0055] 1. The upper cover 330 and positioning hole 311 in the fixture 300 are used to position the patch resistor to be tested, ensuring that the part to be tested is in effective contact with the probe 500, and the resistance value can be tested manually.

[0056] 2. By changing the replaceable positioning plate 310 to adapt to surface mount resistors of different shapes, the device can test resistors of various specifications to meet the needs of small-batch production.

[0057] 3. After the replaceable positioning plate 310 is inserted into the T-shaped slot 321, the magnetic block 400 is automatically attracted by the iron insert 313, so that the magnetic block 400 extends into the through hole 312 and automatically locks the replaceable positioning plate 310, preventing the replaceable positioning plate 310 from shifting laterally during the test. When disassembling, the replaceable positioning plate 310 is slightly tilted up, and the magnetic block 400 will automatically fall back into the stepped storage hole 322 after moving away from the iron insert 313. The disassembly and assembly process is simple and convenient.

[0058] The embodiments described above are merely illustrative of several implementations of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.

Claims

1. A portable chip resistor testing device characterized by comprising: include: Support platform, PCB board, fixture, magnetic block and multiple probes; The PCB board is mounted on the support platform; The fixture includes a replaceable positioning plate, an outer frame, and a top cover and buckles disposed on the outer frame. The outer frame is disposed on the PCB board and has a T-shaped slot for receiving the replaceable positioning plate. The replaceable positioning plate has a positioning hole for receiving the surface mount resistor to be tested. The probe is connected to the PCB board and extends into the positioning hole to contact the surface mount resistor. The top cover is used to press the surface mount resistor. The outer frame has a stepped storage hole, and the magnetic block is movably disposed in the stepped storage hole. The replaceable positioning plate has a through hole, and an iron insert is embedded in the through hole. When the stepped storage hole is aligned with the through hole, the magnetic block extends into the through hole.

2. The portable chip resistor testing device according to claim 1, characterized in that, The magnetic block is provided with a plug-in part and a stop ring. The diameter of the plug-in part is the same as that of the through hole, and the diameter of the stop ring is larger than that of the plug-in part.

3. The portable chip resistor testing device according to claim 1, characterized in that, The inner wall of the T-shaped slot is provided with a limiting edge, and the outer wall of the replaceable positioning plate is provided with an anti-detachment edge, with a gap between the anti-detachment edge and the limiting edge.

4. The portable chip resistor testing device according to claim 1, characterized in that, The replaceable positioning plate has a clearance groove on its back side. The clearance groove extends from the side of the replaceable positioning plate into the through hole. An inclined surface is provided at the boundary between the clearance groove and the side of the replaceable positioning plate. The inclined surface is used to guide the probe to retract.

5. The portable chip resistor testing device according to claim 4, characterized in that, The outer frame has a protrusion that fits against the inner wall of the clearance groove.

6. The portable chip resistor testing device according to claim 1, characterized in that, The top cover and the buckle are located on opposite sides of the outer frame, and the top cover has a groove that matches the buckle.

7. The portable chip resistor testing device according to claim 6, characterized in that, The top cover is provided with a pressure block, which is used to press the chip resistor.

8. The portable chip resistor testing device according to claim 6, characterized in that, The buckle is rotatably mounted on the outer frame, and a spring is provided between the buckle and the outer frame. The spring is used to push the buckle to flip towards the direction of the upper cover.

9. The portable chip resistor testing device according to claim 6, characterized in that, The upper cover is rotatably mounted on the outer frame, and a torsion spring is provided at the connection point between the upper cover and the outer frame.

10. The portable chip resistor testing device according to claim 1, characterized in that, The cross-sectional shape of the positioning hole is consistent with the outer contour of the chip resistor.

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