An AC HPD test system
By designing an AC HPD test system, using an MCU microcontroller and an AC output control unit, the problem of existing technologies being incompatible with high-voltage AC and DC testing was solved, enabling realistic simulation and defect detection of SiC devices.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- 杭州中安电子股份有限公司
- Filing Date
- 2025-06-13
- Publication Date
- 2026-07-03
AI Technical Summary
Existing technologies cannot simultaneously support high-voltage AC and DC testing, and cannot realistically simulate the AC high-voltage stress of SiC devices in actual operation, resulting in the inability to detect potential defects.
An AC HPD test system was designed, which uses an MCU microcontroller and an AC output control unit. Through a relay group and a voltage waveform selection circuit unit, combined with an electric voltage regulator and a transformer, the bias voltage switching and voltage waveform adjustment can be realized, and it can be compatible with high voltage AC and DC tests.
It achieves dynamic adjustment in AC voltage output, can switch between high-voltage AC and DC tests, realistically simulates the working conditions of devices, and discovers defects that cannot be found by conventional tests.
Smart Images

Figure CN224456936U_ABST