A TO-227B package product testing device
By designing a testing device for TO-227B packaged products, and utilizing positioning and fixing mechanisms and elastic probes, the problem of poor electrode contact in the testing of TO-227B packaged semiconductor discrete devices was solved, achieving efficient and accurate testing operations.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- CHINA ZHENHUA GRP YONGGUANG ELECTRONICS CO LTD STATE OWNED NO 873 FACTORY
- Filing Date
- 2025-06-25
- Publication Date
- 2026-07-03
AI Technical Summary
The electrical parameter testing of existing TO-227B packaged semiconductor discrete devices is inconvenient and inaccurate, and is prone to poor electrode contact, which may lead to irreversible damage and affect testing efficiency.
A testing device for TO-227B packaged products was designed, comprising a test base, a product slot, an outer dual-structure probe, and an inner dual-structure probe. Combined with a positioning and fixing mechanism, it ensures stable positioning and fixing of the product, and utilizes elastic probes to achieve good contact and avoid poor electrode contact.
It enables fast and convenient testing operations, improves testing efficiency by more than 10 times, avoids product damage, and saves manpower and time costs.
Smart Images
Figure CN224456949U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of packaging device testing technology, and in particular to a testing device for TO-227B packaged products. Background Technology
[0002] In recent years, TO-227B packaged semiconductor discrete devices have become a growth point in market demand, with significant growth in both production scale and testing requirements. The surface of TO-227B packaged semiconductor discrete devices has pre-set circular holes for product positioning, which facilitates the positioning and connection of the product.
[0003] Existing electrical parameter testing for this type of packaged product typically involves using simple fixed contact testing devices or directly testing the electrode plates using test leads with alligator clips. This method is not only inconvenient and inaccurate, but also prone to poor electrode contact during testing. In severe cases, it can even cause irreversible damage to the product, leading to product failure, which greatly affects the efficiency of testing for this type of packaged product. Utility Model Content
[0004] To solve the above-mentioned technical problems, this utility model provides a testing device for TO-227B packaged products.
[0005] This utility model is achieved through the following technical solution.
[0006] This utility model provides a testing device for TO-227B packaged products, including a test base, a product slot in the middle of the test base, an outer double-structure probe and an inner double-structure probe in the product slot, a positioning mechanism in the product slot for supporting and positioning the product, and a fixing mechanism on the test base for fixing the product.
[0007] Preferably, the positioning mechanism includes two metal columns, which are vertically installed at the bottom of the product slot and distributed on opposite sides of the product slot.
[0008] Preferably, the diameter of the metal column is 1-2 mm smaller than the diameter of the positioning hole in the product shape.
[0009] Preferably, the fixing mechanism includes a support base, a handle, a connecting jaw, a connecting rod, and a pressing head. The support base is mounted on the test base. One end of the connecting rod is hinged to the support base, and the other end is hinged to the middle position of the handle via a pivot. One end of the connecting jaw is fixedly connected to the pressing head, and the lower end of the other end of the connecting jaw is hinged to the support base via a pivot. The upper end of the other end of the connecting jaw is hinged to the end of the handle via a pivot.
[0010] Preferably, the surface of the handle is provided with an insulating adhesive layer.
[0011] Preferably, the surface of the metal column is provided with a nickel plating layer.
[0012] Preferably, both the outer double-structure probe and the inner double-structure probe are spring probes.
[0013] Preferably, both the outer double-structure probe and the inner double-structure probe are made of copper.
[0014] The beneficial effects of this utility model are as follows: By placing the product in the product slot, two metal columns support the product in the product slot. The outer double-structure probe and the inner double-structure probe contact the electrode plate of the product. The pressing head presses and fixes the upper surface of the product. At the same time, the outer double-structure probe and the inner double-structure probe elastically contract, so that the product can make good contact with the outer upper structure probe and the inner double-structure probe. The test operation can be completed quickly by pressing the test button. The entire test process is simple, efficient and convenient, avoiding poor electrode contact and thus avoiding irreversible damage to the product. The test operation can be completed quickly and efficiently by a single person, which greatly saves labor and time costs. The test efficiency is more than 10 times higher than that of the traditional method. Attached Figure Description
[0015] Figure 1 This is a schematic diagram of the structure of this utility model;
[0016] In the diagram: 1-Handle; 2-Outer double-structure probe; 3-Pressing head; 4-Product slot; 5-Metal column; 6-Inner double-structure probe; 7-Support base; 8-Connecting gripper; 9-Connecting rod; 10-Test base. Detailed Implementation
[0017] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0018] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in this utility model embodiment are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.
[0019] In this embodiment, refer to Figure 1The test base 10 includes a product slot 4 in the middle, which contains an outer double-structure probe 2 and an inner double-structure probe 6. The outer double-structure probe 2 and the inner double-structure probe 6 are designed with a Kelvin test circuit. A Kelvin socket is installed on the test base 10 to connect the Kelvin socket to the test system, thereby connecting the outer double-structure probe 2 and the inner double-structure probe 6 to the test system and making the product test results more accurate.
[0020] Both the outer double-structure probe 2 and the inner double-structure probe 6 are spring probes, which gives them elastic properties and facilitates expansion and contraction. This allows the product to make contact with the outer double-structure probe 2 and the inner double-structure probe 6 in a more flexible manner, avoiding damage to the product's contact electrodes and ensuring good contact between the product and the outer double-structure probe 2 and the inner double-structure probe 6.
[0021] In this embodiment, refer to Figure 1 Both the outer double-structure probe 2 and the inner double-structure probe 6 are made of copper and have good electrical conductivity.
[0022] In this embodiment, refer to Figure 1 The product slot 4 is equipped with a positioning mechanism, which is used to support and position the product. The positioning mechanism includes two metal columns 5, which are vertically installed at the bottom of the product slot 4. The two metal columns 5 are distributed on opposite sides of the product slot 4. The two metal columns 5 correspond to the positioning holes of the product shape. The two metal columns 5 are inserted into the positioning holes of the product shape, and the two metal columns 5 support the product.
[0023] In this embodiment, the diameter of the metal column 5 is 1-2 mm smaller than the diameter of the positioning hole of the product shape. This can cover all such products and ensure that the misalignment of the electrode contacts will not have a significant impact after the product is placed. The two metal columns 5 facilitate more precise positioning of the product.
[0024] In this embodiment, refer to Figure 1 The surface of the metal column 5 is also coated with nickel, which not only prevents rust but also effectively avoids scratches on the product.
[0025] In this embodiment, refer to Figure 1 The test base 10 is equipped with a fixing mechanism for fixing the product. The fixing mechanism includes a support base 7, a handle 1, a connecting claw 8, a connecting rod 9, and a pressing head 3. The support base 7 is installed on the test base 10. One end of the connecting rod 9 is hinged to the support base 7, and the other end is hinged to the middle position of the handle 1 via a pivot. One end of the connecting claw 8 is fixedly connected to the pressing head 3. The lower end of the other end of the connecting claw 8 is hinged to the support base 7 via a pivot, and the upper end of the other end of the connecting claw 8 is hinged to the end of the handle 1 via a pivot.
[0026] By lifting the handle 1 upwards and pulling it backwards, the pressing head 3 is moved away from the middle of the product slot 4, the product is placed in the middle of the product slot 4, and then the handle 1 is pressed and pushed forward, so that the pressing head 3 abuts against the product surface to fix the product.
[0027] In this embodiment, refer to Figure 1 The surface of handle 1 is covered with an insulating layer, making it sturdy, reliable, and durable. It can be pressed repeatedly at high frequencies and effectively prevents static electricity.
[0028] The operating principle of this implementation is as follows: Applying an upward force to handle 1 and pulling it backward causes the connecting jaws 8 and connecting rod 9 to rotate along the shaft. The pressing head 3 moves away from the middle of the product slot 4, and the product is then placed into the product slot 4. The two metal pillars 5 and the corresponding positioning holes on the product shape are engaged to achieve product positioning and support. At the same time, the electrode positions of the product contact the corresponding outer double-structure probe 2 and inner double-structure probe 6, so that the product and the testing system form a good circuit connection. Pressing and pushing handle 1 forward causes the pressing head 3 to move to the middle of the product slot 4, so that the pressing head 3 abuts against the surface of the product to fix the product, which is convenient for the testing system to test the product. The operation is simple and convenient, the test results are accurate, and it avoids poor electrode contact, thereby avoiding irreversible damage to the product. The test operation can be completed quickly and efficiently by a single person, which greatly saves labor and time costs. The testing efficiency is more than 10 times higher than that of traditional methods.
[0029] The above are merely preferred embodiments of this utility model and do not limit the patent scope of this utility model. Any equivalent structural transformations made based on the concept of this utility model and the contents of the specification and drawings of this utility model, or direct / indirect applications in other related technical fields, are included within the patent protection scope of this utility model.
Claims
1. A testing device for TO-227B packaged products, characterized in that: The test base (10) includes a product slot (4) in the middle of the test base (10), an outer double structure probe (2) and an inner double structure probe (6) in the product slot (4), a positioning mechanism in the product slot (4) for supporting and positioning the product, and a fixing mechanism on the test base (10) for fixing the product.
2. A TO-227B package product testing apparatus according to claim 1, wherein: The positioning mechanism includes two metal columns (5), which are vertically installed at the bottom of the product groove (4) and distributed on opposite sides of the product groove (4).
3. A TO-227B package testing apparatus as claimed in claim 2, wherein: The diameter of the metal column (5) is 1-2 mm smaller than the diameter of the positioning hole of the product.
4. A TO-227B package testing device as claimed in claim 1, wherein: The fixing mechanism includes a support base (7), a handle (1), a connecting claw (8), a connecting rod (9), and a pressing head (3). The support base (7) is installed on the test base (10). One end of the connecting rod (9) is hinged to the support base (7), and the other end is hinged to the middle position of the handle (1) via a pivot. One end of the connecting claw (8) is fixedly connected to the pressing head (3). The lower end of the other end of the connecting claw (8) is hinged to the support base (7) via a pivot, and the upper end of the other end of the connecting claw (8) is hinged to the end of the handle (1) via a pivot.
5. A TO-227B package testing device as claimed in claim 4, wherein: The handle (1) has an insulating adhesive layer on its surface.
6. A TO-227B package testing device as claimed in claim 2, wherein: The surface of the metal column (5) is coated with a nickel layer.
7. A TO-227B package testing device as claimed in claim 1, wherein: Both the outer double-structure probe (2) and the inner double-structure probe (6) are spring probes.
8. A TO-227B package testing device as claimed in claim 1, wherein: Both the outer double-structure probe (2) and the inner double-structure probe (6) are made of copper.