A slot limiting structure of a memory stick testing device
By introducing a limiting structure and a cleaning mechanism into the memory module testing device, the problem of easy damage to the slots was solved, enabling accurate insertion and protection of memory modules, extending the service life of the equipment and reducing production costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN JIAHETAI TECH CO LTD
- Filing Date
- 2025-06-16
- Publication Date
- 2026-07-07
AI Technical Summary
Existing memory module testing devices are prone to damage to their slots during repeated insertion and removal, leading to poor contact, slot deformation, and affecting testing accuracy and equipment lifespan. Furthermore, the lack of effective limiting measures exacerbates the risk of damage due to positional deviations.
A slot limiting structure for a memory module testing device is designed, including a test motherboard, a limiting base plate, limiting posts, limiting blocks, and a cleaning mechanism. The limiting posts prevent the memory module from being over-inserted, the limiting blocks restrict lateral movement, and the cleaning mechanism prevents dust from entering, ensuring accurate insertion of the memory module and protecting the slot, thereby extending the lifespan of the device.
It effectively prevents memory modules from damaging the slots during testing, ensures accurate insertion, reduces wear and tear, extends the lifespan of the device, and has a simple structure and low cost, thus improving the practicality of the device.
Smart Images
Figure CN224472200U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of memory module testing equipment technology, and in particular to a slot limiting structure for a memory module testing device. Background Technology
[0002] A memory module is a computer component that the CPU can address and read / write through the bus. In the history of personal computers, memory modules were once an extension of main memory. With the continuous updates in computer software and hardware technology, memory modules have become an integral part of read and write memory. Usually, the size of computer memory (RAM) refers to the total capacity of the memory modules. In the production and testing process of memory modules, memory module testing equipment is an indispensable device.
[0003] Existing memory modules are tested by inserting them into slots. During the repeated insertion and removal of memory modules, the memory slots are easily damaged, leading to problems such as poor contact and slot deformation. This affects the accuracy of the test and the lifespan of the equipment. In addition, there is a lack of effective limiting measures, which may cause the memory modules to deviate in position during the insertion process, further increasing the risk of slot damage. Utility Model Content
[0004] To address the shortcomings of existing technologies, this application provides a slot limiting structure for a memory module testing device, which overcomes the deficiencies of existing technologies. It aims to solve the problem that in existing technologies, memory modules are inserted into slots for performance testing. During repeated insertion and removal of memory modules, the memory module slots are easily damaged, leading to problems such as poor contact and slot deformation, which affect the accuracy of the test and the lifespan of the device. In addition, the lack of effective limiting measures makes it possible for the memory module to deviate in position during insertion, further increasing the risk of slot damage.
[0005] To achieve the above objectives, this application provides the following technical solution: a slot limiting structure for a memory module testing device, including a test motherboard. Multiple sets of memory module slots are arranged on the top of the test motherboard. Each set of memory module slots has a limiting base plate on its exterior. The limiting base plate has a through hole, the size of which is the same as the memory module slot. Fixing blocks are provided at both ends of the bottom of the limiting base plate, and these fixing blocks are fixedly connected to the test motherboard. Two sets of limiting posts are arranged symmetrically inside each memory module slot. Each set of limiting posts has a slot inside it. The bottom of each limiting post is located inside the memory module slot. Limiting blocks are provided on both sides of the memory module slot, and the bottoms of the two sets of limiting blocks are fixedly connected to the test motherboard.
[0006] By adopting the above technical solution and setting up a test motherboard, during the testing process, when the memory module is inserted into the memory slot, two sets of limiting posts will prevent the memory module from being over-inserted into the memory slot. At the same time, the limiting base plate and limiting block will restrict the lateral movement of the memory module during insertion, ensuring that the memory module is accurately inserted into the memory slot. After the test is completed, when the memory module is removed, the limiting base plate and limiting block will also play a protective role, reducing slot wear and extending the life of the device. This design can effectively prevent the memory module from being repeatedly inserted into the memory slot during the test, thus effectively extending the life of the device. At the same time, the overall structure is simple and stable, and the production and manufacturing costs are low.
[0007] As a preferred technical solution of this application, two sets of cleaning mechanisms are provided above the limiting base plate, and a cleaning rod is provided on one side of each of the two sets of cleaning mechanisms. Both sets of cleaning rods are located at the top of the memory slot.
[0008] By adopting the above technical solution and setting up a cleaning mechanism, the memory module can be cleaned when it is inserted into the memory slot, ensuring that external dust does not directly enter the memory slot and prevent damage to the inside of the memory slot. This makes it more convenient to use and further improves the practicality of the device.
[0009] As a preferred technical solution of this application, extension plates are provided on both sides of the multiple sets of limiting posts, and stabilizing sliders are provided at the bottom of the two sets of extension plates. The limiting base plate has two sets of stabilizing grooves inside, and the two sets of stabilizing sliders are slidably connected to the inside of the two sets of stabilizing grooves.
[0010] By adopting the above technical solution and setting an extension plate, the limiting post can move more stably inside the memory slot through the set stabilizing slider during use, which can further fix memory modules of different sizes, making it more convenient to use.
[0011] As a preferred technical solution of this application, both sets of extension plates are provided with threaded shafts inside, the threaded shafts pass through the extension plates and the stabilizing sliders, and a fixing ring is provided at the bottom of the threaded shafts, the fixing rings being threadedly connected to the threaded shafts.
[0012] By adopting the above technical solution, the fixed ring can be made to abut against the bottom of the test motherboard by rotating the threaded shaft, thereby quickly achieving the fixing effect and preventing abnormal displacement of the limit post.
[0013] As a preferred technical solution of this application, the bottom of both sets of cleaning mechanisms is provided with a moving groove, and the two sets of extension plates slide inside the two sets of moving grooves.
[0014] By adopting the above technical solution and setting a movable slot, the limiting post can be made to move more stably inside the memory slot during use, thus improving the practicality of the device.
[0015] As a preferred technical solution of this application, the slot is provided with a rubber buffer layer inside.
[0016] By adopting the above technical solution and setting a rubber buffer layer, the corners of the memory module can be more stable when they come into contact with the limiting post during use, and the memory module can be protected at the same time.
[0017] As a preferred technical solution of this application, the cleaning mechanism is provided with multiple sets of locking blocks on one side, and the cleaning rod is locked inside the locking blocks.
[0018] By adopting the above technical solution and setting a locking block, the locking effect of the cleaning rod can be improved during use, and the cleaning rod can be easily replaced, thus improving the practicality of the device.
[0019] As a preferred technical solution of this application, the top of the limiting base plate is provided with two sets of indicator lights, and both sets of indicator lights are electrically connected to the memory module slot.
[0020] By adopting the above technical solution and setting indicator lights, the working environment of the memory module can be detected externally during use, ensuring timely observation of its working status from the outside and improving the practicality of the device.
[0021] The beneficial effects of this application are:
[0022] 1. By configuring the test motherboard, during the testing process, when the memory module is inserted into the memory slot, two sets of limiting posts prevent the memory module from being over-inserted into the memory slot. At the same time, the limiting base plate and limiting block restrict the lateral movement of the memory module during insertion, ensuring that the memory module is accurately inserted into the memory slot. After the test is completed, when the memory module is removed, the limiting base plate and limiting block also play a protective role, reducing slot wear and extending the life of the device. This design effectively prevents the memory module from being repeatedly inserted into the memory slot during the test, thus effectively extending the life of the device. At the same time, the overall structure is simple and stable, and the production and manufacturing costs are low.
[0023] 2. By incorporating a cleaning mechanism, the memory modules can be cleaned while they are being inserted into their slots, preventing external dust from directly entering the slots and causing damage. This makes the device more convenient to use and further enhances its usability. Attached Figure Description
[0024] Figure 1 This is a schematic diagram of the overall structure of this application;
[0025] Figure 2 This is a schematic diagram of the overall internal structure of this application;
[0026] Figure 3 This is a schematic diagram of the limiting column structure in this application;
[0027] Figure 4 This is a schematic diagram of the cleaning organization structure in this application.
[0028] In the diagram: 1. Test motherboard; 2. Memory slot; 3. Limiting base plate; 301. Through hole; 302. Fixing block; 303. Stabilizing slide; 4. Limiting block; 5. Limiting post; 501. Slot; 502. Extension plate; 503. Stabilizing slider; 504. Threaded shaft; 505. Fixing ring; 506. Rubber buffer layer; 6. Cleaning mechanism; 601. Moving groove; 602. Cleaning rod; 603. Locking block; 7. Indicator light. Detailed Implementation
[0029] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0030] Reference Figure 1-4 A slot limiting structure for a memory module testing device includes a test motherboard 1. Multiple memory module slots 2 are arranged on the top of the test motherboard 1. Each set of memory module slots 2 has a limiting base plate 3 on its exterior. The limiting base plate 3 has a through hole 301 inside, the through hole 301 being the same size as the memory module slot 2. Fixing blocks 302 are provided at both ends of the bottom of the limiting base plate 3, and the fixing blocks 302 are fixedly connected to the test motherboard 1. Two sets of limiting posts 5 are arranged symmetrically inside the memory module slots 2. Each set of limiting posts 5 has a slot 501 inside, and the bottom of the limiting posts 5 is located inside the memory module slot 2. Limiting blocks 4 are provided on both sides of the memory module slot 2, and the bottoms of the two sets of limiting blocks 4 are fixedly connected to the test motherboard 1. Both sides of the multiple sets of limiting posts 5 are provided with extension plates 502, and the bottom of the two sets of extension plates 502 are provided with stabilizing sliders 503. The interior of the limiting base plate 3 is provided with two sets of stabilizing grooves 303, and the two sets of stabilizing sliders 503 are slidably connected to the interior of the two sets of stabilizing grooves 303.
[0031] By configuring the test motherboard 1, during the testing process, when the memory module is inserted into the memory slot 2, two sets of limiting posts 5 prevent the memory module from being over-inserted into the memory slot 2. At the same time, the limiting base plate 3 and the limiting block 4 restrict the lateral movement of the memory module during insertion, ensuring that the memory module is accurately inserted into the memory slot 2. After the test is completed, when the memory module is removed, the limiting base plate 3 and the limiting block 4 also play a protective role, reducing slot wear and extending the life of the device. This configuration effectively prevents the memory module from being repeatedly inserted into the memory slot 2 during the test, thus preventing damage and extending the life of the device. At the same time, the overall structure is simple and stable, and the production and manufacturing costs are low. By setting up the extension plate 502, during use, the stabilizing slider 503 can make the movement of the limiting posts 5 inside the memory slot 2 more stable, and can further fix memory modules of different sizes, making it more convenient to use.
[0032] Reference Figure 1-4 Two sets of cleaning mechanisms 6 are provided above the limiting base plate 3. Each set of cleaning mechanisms 6 has a cleaning rod 602 on one side, and both cleaning rods 602 are located at the top of the memory module slot 2. Threaded shafts 504 are provided inside both extension plates 502, passing through the extension plate 502 and the stabilizing slider 503. A retaining ring 505 is provided at the bottom of the threaded shaft 504, and the retaining ring 505 is threadedly connected to the threaded shaft 504. A rubber buffer layer 506 is provided inside the slot 501. By providing the cleaning mechanisms 6, during use, the memory module can be inserted into the memory module slot 2. The internal cleaning of the memory module ensures that external dust does not directly enter the memory slot 2, preventing damage to the internal components and making it more convenient to use, further enhancing the device's practicality. Rotating the threaded shaft 504 allows the retaining ring 505 to contact the bottom of the test motherboard 1, quickly achieving a secure fit and preventing abnormal displacement of the limiting post 5. The rubber buffer layer 506 ensures more stable contact between the corners of the memory module and the limiting post 5 during use, while also protecting the memory module.
[0033] Reference Figure 1-4Both sets of cleaning mechanisms 6 have a sliding groove 601 at their bottom, and both sets of extension plates 502 slide inside the two sets of sliding grooves 601. By setting the sliding grooves 601, the limiting post 5 can move more stably inside the memory slot 2 during use, improving the practicality of the device. Multiple sets of locking blocks 603 are set on one side of the cleaning mechanism 6, and the cleaning rod 602 is locked inside the locking block 603. By setting the locking block 603, the locking effect of the cleaning rod 602 can be improved during use, and the cleaning rod 602 can be easily replaced, improving the practicality of the device. Two sets of indicator lights 7 are set on the top of the limiting base plate 3, and both sets of indicator lights 7 are electrically connected to the memory slot 2. By setting the indicator lights 7, the working environment of the memory module can be detected from the outside during use, ensuring that the working status can be observed in a timely manner from the outside, improving the practicality of the device.
[0034] Working principle: By setting up the test motherboard 1, during the test, when the memory module is inserted into the memory slot 2, two sets of limiting posts 5 will prevent the memory module from being over-inserted into the memory slot 2. At the same time, the limiting base plate 3 and the limiting block 4 will limit the lateral movement of the memory module during insertion, ensuring that the memory module is accurately inserted into the memory slot 2. After the test is completed, when the memory module is removed, the limiting base plate 3 and the limiting block 4 will also play a protective role, reducing the wear of the slot and extending the service life of the device. This setting can effectively prevent the memory module from being repeatedly inserted into the memory slot 2 during the test, thus effectively extending the service life of the device. At the same time, the overall structure is simple and stable, and the production and manufacturing costs are low. By setting up the cleaning mechanism 6, the memory module can be cleaned when it is inserted into the memory slot 2, ensuring that the external dust of the memory module does not directly enter the memory slot 2, preventing damage to the inside of the memory slot 2. This makes it more convenient to use and further improves the practicality of the device.
[0035] In this design, by setting the extension plate 502, the stabilizing slider 503 can make the limiting post 5 move more stably inside the memory slot 2, and can further fix memory modules of different sizes, making it more convenient to use. By rotating the threaded shaft 504, the fixing ring 505 can be made to abut against the bottom of the test motherboard 1, thereby quickly achieving the fixing effect and preventing abnormal displacement of the limiting post 5.
[0036] Meanwhile, by setting the movable slot 601, the limiting post 5 can be moved more stably inside the memory slot 2 during use, thus improving the practicality of the device.
[0037] In addition, by setting a rubber buffer layer 506, the corner of the memory module can be more stable when it comes into contact with the limiting post 5 during use, and the memory module can be protected at the same time. By setting a locking block 603, the locking effect of the cleaning rod 602 can be improved during use, and the cleaning rod 602 can be replaced easily, thus improving the practicality of the device. By setting an indicator light 7, the working environment of the memory module can be detected from the outside during use, so as to ensure that the working status can be observed in a timely manner from the outside, thus improving the practicality of the device.
[0038] The above are merely preferred embodiments of this application and are not intended to limit this application. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.
Claims
1. A slot limiting structure for a memory module testing device, comprising a test motherboard (1), characterized in that, The test motherboard (1) has multiple sets of memory slots (2) on its top. Each set of memory slots (2) has a limiting base plate (3) on its exterior. The limiting base plate (3) has a through hole (301) inside. The through hole (301) is the same size as the memory slot (2). The limiting base plate (3) has a fixing block (302) at both ends of its bottom. The fixing block (302) is fixedly connected to the test motherboard (1). The memory slot (2) has two sets of limiting posts (5) inside. The two sets of limiting posts (5) are symmetrically arranged. Each set of limiting posts (5) has a slot (501) inside. The bottom of the limiting post (5) is located inside the memory slot (2). The memory slot (2) has a limiting block (4) on both sides. The bottom of the two sets of limiting blocks (4) is fixedly connected to the test motherboard (1).
2. The slot limiting structure of the memory module testing device according to claim 1, characterized in that, Two sets of cleaning mechanisms (6) are provided above the limiting base plate (3). Each of the two sets of cleaning mechanisms (6) has a cleaning rod (602) on one side. Both sets of cleaning rods (602) are located at the top of the memory slot (2).
3. The slot limiting structure of a memory module testing device according to claim 2, characterized in that, Both sides of the multiple sets of limiting posts (5) are provided with extension plates (502), and the bottom of the two sets of extension plates (502) are provided with stabilizing sliders (503). The limiting base plate (3) has two sets of stabilizing grooves (303) inside, and the two sets of stabilizing sliders (503) are slidably connected to the inside of the two sets of stabilizing grooves (303).
4. The slot limiting structure of a memory module testing device according to claim 3, characterized in that, Both sets of extension plates (502) are provided with threaded shafts (504) inside. The threaded shafts (504) pass through the extension plates (502) and the stabilizing sliders (503). A retaining ring (505) is provided at the bottom of the threaded shafts (504). The retaining rings (505) are threadedly connected to the threaded shafts (504).
5. The slot limiting structure of a memory module testing device according to claim 3, characterized in that, Both sets of cleaning mechanisms (6) have a moving groove (601) at their bottom, and both sets of extension plates (502) slide inside the moving grooves (601).
6. The slot limiting structure of a memory module testing device according to claim 1, characterized in that, The slot (501) is provided with a rubber buffer layer (506).
7. The slot limiting structure of a memory module testing device according to claim 2, characterized in that, The cleaning mechanism (6) is provided with multiple sets of locking blocks (603) on one side, and the cleaning rod (602) is locked inside the locking block (603).
8. The slot limiting structure of a memory module testing device according to claim 1, characterized in that, The top of the limiting base plate (3) is provided with two sets of indicator lights (7), and both sets of indicator lights (7) are electrically connected to the memory slot (2).