A multi-die memory test rack

Abstract

The utility model discloses a kind of multi-disc storage tester, it is related to memory test rack technical field, including test frame, a pair of fixed column is fixedly connected between the inner bottom end and the inner top end of test frame, and a pair of movable column is equipped between the inner bottom end and the inner top end of test frame, the inside of test frame is equipped with a pair of bakelite plate body.The utility model can drive bakelite plate body to be installed to test frame when testing by installation and removal mechanism, to facilitate support and fixed hard disk, and after testing, drive bakelite plate body to be disassembled and separated, to facilitate maintenance and cleaning to bakelite plate body, use subsequent test;Bakelite plate body can be adjusted in height by lifting adjusting mechanism, to facilitate driving adjacent two bakelite plate bodies to be adjusted in distance according to different thickness of hard disk, so that test frame can be effectively adapted to standardized and non-standardized hard disk, without replacing test frame, improve its applicability.

Description

Technical Field

[0001] This utility model belongs to the field of memory test rack technology, and in particular relates to a multi-bay memory test rack. Background Technology

[0002] A memory test fixture is a device or system used to test and verify the functionality and performance of memory. It connects to and controls the memory and performs test operations. Using a memory test fixture allows for comprehensive testing and verification of the memory, including read / write speed testing, data integrity checks, error detection and repair, and electromagnetic compatibility testing. These tests ensure the normal operation and reliability of the memory, while also helping to detect and troubleshoot memory faults, improving memory performance and lifespan.

[0003] For example, CN221101701U discloses a multi-bay storage test rack, which relates to the fields of computer hardware repair and data recovery technology. In this multi-bay storage test rack, a TTL interface, a SAS connector, and a cooling fan are fixed to the back panel to form an assembly. A DC power socket, a fan control knob, a level selection switch, a USB-B module, an SFF-8088 interface, and a 48-pin connector are fixed to the lower panel to form an assembly. The back panel, lower panel, and bottom panel are fixed together. Crossbeams and longitudinal beams are connected to columns, and bakelite boards are embedded in the crossbeams and longitudinal beams. The back panel is fixed to one side of the column, and the rear panel is fixed to the back panel. The assembly is embedded in the opening of the rear panel, enabling external electrical connection, power switch control, fan speed adjustment, TTL level voltage adjustment, and heat dissipation. With a magnetic limiting device, it is suitable for batch reading of data and engineering files from 2.5-inch / 3.5-inch mechanical hard drives, offering convenient operation, stability, and portability.

[0004] The above-mentioned patent has the following defects in use:

[0005] Although the spacing between multiple bakelite boards, combined with a magnetic limiting device, can accommodate the installation of standard-sized mechanical hard drives such as 2.5-inch and 3.5-inch drives, the size and thickness of hard drives are not completely standardized with the development of storage technology. For example, there are non-standard-sized hard drives with an industrial-grade thickness of 40mm, while the thickness of standard-sized mechanical hard drives such as 2.5-inch and 3.5-inch drives ranges from 7mm to 26mm. Their thickness differs from that of standardized hard drives, making it difficult to adapt the fixed spacing between multiple bakelite boards to non-standard-sized hard drives. This results in the need to change the test rack during testing, which is quite troublesome. Therefore, this utility model proposes a multi-bay storage test rack. Utility Model Content

[0006] This utility model provides a multi-bay storage test rack. An installation and disassembly mechanism allows the bakelite board body to be installed onto the test rack during testing to support and secure the hard drive. After testing, the bakelite board body can be disassembled for maintenance and cleaning, and reused in subsequent tests. A lifting and adjustment mechanism allows for height adjustment of the bakelite board body, enabling the spacing between adjacent boards to be adjusted according to hard drives of different thicknesses. This ensures the test rack can effectively adapt to both standardized and non-standardized hard drives without requiring replacement, thus improving its applicability and solving the problems in the prior art.

[0007] To solve the above-mentioned technical problems, this utility model is achieved through the following technical solution:

[0008] This utility model discloses a multi-bay memory test rack, comprising:

[0009] A test frame, wherein a pair of fixed posts are fixedly connected between the inner bottom end and the inner top end of the test frame, and a pair of movable posts are provided between the inner bottom end and the inner top end of the test frame; and a pair of bakelite board bodies are provided inside the test frame, and the bakelite board bodies are slidably connected to the pair of fixed posts.

[0010] The installation and disassembly mechanism is located between a pair of fixed columns and a movable column, and is used to drive the bakelite board body to be installed and disassembled.

[0011] A lifting adjustment mechanism is provided on the outside of the bakelite board body, and the lifting adjustment mechanism is used to adjust the height of the bakelite board body;

[0012] The lifting and adjusting mechanism includes two pairs of movable sleeves. Multiple fixed rods are fixedly connected to both sides of each pair of bakelite boards, and the movable sleeves are fitted between the outer walls of the fixed rods. A fixed plate is fixedly connected between the ends of the fixed rods away from the bakelite board body. A spring is fitted onto the outer wall of each fixed rod, and both ends of the spring are fixedly connected to the opposite sides of the fixed plate and the movable sleeves. Multiple slots are chiseled into the side of the fixed column and the movable column away from the bakelite board body, and a first magnet is fixedly connected to the inner wall of each slot. A pair of second magnets are fixedly connected to the end of each movable sleeve close to the bakelite board body, and the opposite sides of the pair of second magnets attract the top and bottom ends of the first magnets, respectively.

[0013] Furthermore, the installation and disassembly mechanism includes two pairs of fixed long rods. Each pair of bakelite boards has a through groove, and the bakelite boards are fitted onto the outer walls of the pair of fixed long rods through the through grooves. Each pair of movable columns has a straight guide groove on its outer wall, and a pair of movable straight plates are provided on one side of the straight guide groove. The end of the fixed long rod away from the fixed column passes through the straight guide groove and is engaged with the movable straight plate. Each pair of movable columns has a pair of connecting plates fixedly connected to the side of the movable column near the movable straight plate, and the connecting plates are threadedly connected to the test frame.

[0014] Furthermore, an elastic locking block is fixedly connected to the end of the fixed long rod away from the fixed column, and a locking groove is chiseled on the side of the movable straight plate near the fixed long rod, and the elastic locking block engages with the locking groove.

[0015] Furthermore, both pairs of connecting plates are threaded with fixing bolts, and the test frame has two pairs of bolt fixing grooves on the side near the connecting plates, with the fixing bolts threadedly connected to the bolt fixing grooves.

[0016] Furthermore, each of the two pairs of fixed long rods is fixedly connected to a slider at one end near the fixed post, and each pair of fixed posts has a groove carved on the side near the bakelite board body, and the two sliders in the vertical direction are located in the groove and are slidably connected to it.

[0017] Furthermore, rubber pads are cut out on the opposite sides of each pair of second magnet blocks, and both rubber pads are in close contact with the inner wall of the slot.

[0018] Furthermore, a pair of round rods are fixedly connected between the opposite sides of the pair of connecting plates, and a pair of round holes are drilled between the top and bottom ends of the movable straight plate, and the movable straight plate is sleeved between the outer walls of the pair of round rods through the pair of round holes.

[0019] The present invention has the following advantages over the prior art:

[0020] 1. This technical solution, through its installation and disassembly mechanism, enables the bakelite board body to be installed onto the test frame during testing to support and secure the hard drive. After testing, the bakelite board body is disassembled and separated from the test frame for maintenance and cleaning, and can then be used for subsequent testing.

[0021] 2. This technical solution, through the setting of the lifting and adjustment mechanism, can drive the bakelite board body to move up and down along a pair of fixed columns and movable columns, so as to make the height adjustment appropriate for hard drives of different thicknesses. The spacing between two adjacent bakelite board bodies can meet the placement and fixation of hardness, so that the test frame can be effectively adapted to both standardized and non-standardized hard drives without the need to replace the test frame, thus improving its applicability.

[0022] Of course, any product implementing this utility model does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description

[0023] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0024] Figure 1 This is a three-dimensional structural diagram of a multi-bay memory test rack according to the present invention;

[0025] Figure 2 This is a partial disassembled structural diagram of a multi-bay memory test rack according to the present invention;

[0026] Figure 3 This is a partial cross-sectional view of a multi-bay memory test rack according to the present invention.

[0027] Figure 4 This utility model Figure 3 Enlarged structural diagram at point A;

[0028] Figure 5 This is a schematic diagram showing a partial disassembly of the installation / disassembly mechanism and the lifting / adjusting mechanism from the bakelite board body in this utility model.

[0029] Figure 6 This utility model Figure 5 A magnified structural diagram at point B in the middle.

[0030] The attached diagram lists the components represented by each number as follows:

[0031] 1. Test frame; 2. Fixed column; 3. Movable column; 4. Bakelite board body; 5. Installation and disassembly mechanism; 501. Fixed long rod; 502. Round through groove; 503. Conductive straight groove; 504. Elastic block; 505. Movable straight plate; 506. Slot; 507. Connecting plate; 508. Fixing bolt; 509. Bolt fixing slot; 6. Slide groove; 7. Sliding block; 8. Lifting and adjusting mechanism; 801. Movable sleeve plate; 802. Fixed rod; 803. Fixed plate; 804. Spring; 805. Slot; 806. First magnet block; 807. Second magnet block; 9. Rubber pad; 10. Round rod. Detailed Implementation

[0032] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0033] In the description of this utility model, it should be understood that the terms "relative", "one end", "inner", "lateral", "end", "both ends", "both sides", "front", "one end face", "the other end face", etc., which indicate orientation or positional relationship, are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the components or elements referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Specific Implementation Example 1:

[0035] Please see Figures 1-6 As shown, this utility model provides a multi-bay memory test rack, comprising:

[0036] Test frame 1, a pair of fixed posts 2 are fixedly connected between the inner bottom end and the inner top end of test frame 1, and a pair of movable posts 3 are provided between the inner bottom end and the inner top end of test frame 1. A pair of bakelite board bodies 4 are provided inside test frame 1, and the bakelite board bodies 4 are slidably connected to the pair of fixed posts 2.

[0037] The installation and disassembly mechanism 5 is located between a pair of fixed columns 2 and movable columns 3, and is used to drive the bakelite board body 4 to install and disassemble.

[0038] The lifting adjustment mechanism 8 is located on the outside of the bakelite board body 4 and is used to adjust the height of the bakelite board body 4.

[0039] The lifting and adjusting mechanism 8 includes two pairs of movable sleeve plates 801. Multiple fixing rods 802 are fixedly connected to both sides of each pair of bakelite board bodies 4. The movable sleeve plates 801 are fitted between the outer walls of the multiple fixing rods 802. A fixing plate 803 is fixedly connected between the ends of the multiple fixing rods 802 away from the bakelite board bodies 4. A spring 804 is fitted onto the outer wall of each of the multiple fixing rods 802. The two ends of the spring 804 are fixedly connected to the opposite sides of the fixing plate 803 and the movable sleeve plates 801, respectively. Multiple slots 805 are chiseled into the side of the fixed column 2 and the movable column 3 away from the bakelite board bodies 4. A first magnet block 806 is fixedly connected to the inner wall of the slot 805. A pair of second magnet blocks 807 are fixedly connected to the end of the movable sleeve plates 801 near the bakelite board bodies 4. The opposite sides of the pair of second magnet blocks 807 attract the top and bottom ends of the first magnet blocks 806, respectively.

[0040] In the specific implementation process, after a pair of bakelite board bodies 4 are installed on the test frame 1, when supporting hardness of different thicknesses, a pair of movable sleeve plates 801 are pulled apart, causing a pair of second magnet blocks 807 to separate from the first magnet block 806 until they are far away from the slot 805, thus releasing the fixation of the bakelite board bodies 4. Then, the bakelite board bodies 4 are moved up and down along the fixed column 2 and the movable column 3 to adjust the height according to the different thicknesses of the hard drives. This ensures that the spacing between two adjacent bakelite board bodies 4 meets the requirements for hardness placement and fixation, allowing the test frame to effectively adapt to both standardized and non-standardized hard drives without the need to replace the test frame, thus improving its applicability. Furthermore, the number of bakelite board bodies 4 in this solution is not limited to a pair; the test frame can support multiple bakelite board bodies 4, with the specific number depending on the testing requirements.

[0041] Among them, each of the two pairs of fixed long rods 501 has a slider 7 fixedly connected to one end near the fixed post 2, and each pair of fixed posts 2 has a groove 6 carved on one side near the bakelite board body 4, and the two sliders 7 in the vertical direction are located in the groove 6 and are slidably connected to it.

[0042] By setting up slider 7 and slide groove 6, the bakelite board body 4 can be assisted in sliding during the lifting and lowering movement, so as to keep it in stable movement and prevent positional deviation.

[0043] In this case, rubber pads 9 are cut out on the opposite sides of the pair of second magnet blocks 807, and the pair of rubber pads 9 are in close contact with the inner wall of the slot 805.

[0044] The rubber pad 9 provides cushioning during hard drive testing, reducing vibrations on the bakelite board body 4, movable sleeve 801, and a pair of second magnet blocks 807, thus ensuring connection stability. Specific Implementation Example 2:

[0046] Please see Figures 1-6 As shown, in a preferred embodiment, the installation and disassembly mechanism 5 includes two pairs of fixed long rods 501. A pair of bakelite board bodies 4 are each chiseled with a through groove 502, and the bakelite board bodies 4 are sleeved on the outer wall of the pair of fixed long rods 501 through the pair of through grooves 502. A pair of movable columns 3 are each chiseled with a straight guide groove 503, and a pair of movable straight plates 505 are provided on one side of the straight guide groove 503. The end of the fixed long rod 501 away from the fixed column 2 passes through the straight guide groove 503 and is engaged with the movable straight plate 505. A pair of connecting plates 507 are fixedly connected to the side of the pair of movable columns 3 near the movable straight plate 505, and the connecting plates 507 are threadedly connected to the test frame 1.

[0047] In the specific implementation process, during testing, the bakelite board body 4 is fitted onto the fixed long rod 501 through the through groove 502. Then, the movable column 3 is brought close to the fixed long rod 501, causing the fixed long rod 501 to extend into the through straight groove 503, and driving the elastic locking block 504 to engage with the locking groove 506 on the movable straight plate 505. Immediately afterwards, the fixing bolt 508 on the rotating connecting plate 507 extends into the bolt fixing groove 509 on the test frame 1 and is threaded to it, driving the bakelite board body 4 and the movable column 3 to be connected and fixed to the test frame 1, so as to support and fix the hard drive during testing. After the test, the fixing bolt 508 is rotated away from the bolt fixing groove 509, and the elastic locking block 504 is separated from the locking groove 506, so that the bakelite board body 4 and the movable column 3 are disassembled and separated from the test frame 1, so as to facilitate the maintenance and cleaning of the bakelite board body 4 for subsequent testing.

[0048] Among them, the end of the fixed long rod 501 away from the fixed column 2 is fixedly connected to an elastic block 504, and the movable straight plate 505 has a slot 506 cut on the side near the fixed long rod 501, and the elastic block 504 engages with the slot 506.

[0049] The engagement of the elastic block 504 with the slot 506 enables the fixed rod 501 to be connected and fixed to the movable straight plate 505.

[0050] Among them, both pairs of connecting plates 507 are threaded with fixing bolts 508, and the test frame 1 has two pairs of bolt fixing grooves 509 on the side near the connecting plate 507, and the fixing bolts 508 are threadedly connected to the bolt fixing grooves 509.

[0051] By rotating and screwing the fixing bolt 508 into the bolt fixing groove 509, the connecting plate 507 is connected and fixed to the test frame 1, so as to drive a pair of movable columns 3 to be installed on the test frame 1.

[0052] Among them, a pair of round rods 10 are fixedly connected between opposite sides of a pair of connecting plates 507, and a pair of round holes are drilled between the top and bottom ends of the movable straight plate 505, and the movable straight plate 505 is sleeved between the outer walls of the pair of round rods 10 through the pair of round holes.

[0053] The movable straight plate 505 is fitted between the outer walls of a pair of round rods 10 through a pair of round holes, which enables the movable straight plate 505 to maintain linear movement along the pair of round rods 10 when it moves up and down with the fixed long rod 501, and it is not easy to deviate.

[0054] The circuits, electronic components, and chip modules involved in this utility model are all existing technologies, which can be fully implemented by those skilled in the art, and need not be elaborated upon. The content protected by this utility model does not involve any improvement to the software and methods.

[0055] All standard parts used in the application documents can be purchased from the market. All components in this application document can be customized according to the description and drawings. The specific connection methods of each part adopt conventional methods such as bolts, rivets, and welding that are mature in the prior art. The machinery, parts and equipment adopt conventional models in the prior art. The electrical components mentioned in this document are all electrically connected to the external main controller and power supply, and the main controller is a conventional known device that can play a control role.

[0056] The working principle of this utility model is as follows:

[0057] In use, the bakelite board body 4 is first placed onto the fixed long rod 501 through the through groove 502. Next, the movable column 3 is brought close to the fixed long rod 501, causing the fixed long rod 501 to extend into the through straight groove 503, and driving the elastic locking block 504 to engage with the locking groove 506 on the movable straight plate 505. Immediately afterwards, the fixing bolt 508 on the rotating connecting plate 507 extends into the bolt fixing groove 509 on the test frame 1, connecting it threadedly, thus connecting and fixing the bakelite board body 4 and the movable column 3 to the test frame 1. Next, a pair of movable sleeve plates 801 are pulled apart, causing a pair of second magnet blocks 807 to engage with the first... The magnet 806 separates until it is far away from the slot 805, thus removing the fixation on the bakelite board body 4. Then, the bakelite board body 4 is moved up and down along the fixed post 2 and the movable post 3 to adjust the height according to the different thicknesses of the hard drives. This ensures that the spacing between two adjacent bakelite board bodies 4 meets the requirements for hardness placement and fixation, thereby supporting and fixing the hard drive. After the test is completed, the fixing bolt 508 is rotated away from the bolt fixing slot 509, and the elastic block 504 is driven to separate from the slot 506, so that the bakelite board body 4 and the movable post 3 are disassembled from the test frame 1 for maintenance and cleaning.

[0058] The preferred embodiments of this utility model disclosed above are merely illustrative of the present utility model. These preferred embodiments do not exhaustively describe all details, nor do they limit the utility model to the specific implementations described. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of this utility model, thereby enabling those skilled in the art to better understand and utilize it. This utility model is limited only by the claims and their full scope and equivalents.

Claims

1. A multi-bay memory test rack, characterized in that, include: The test frame (1) has a pair of fixed posts (2) fixedly connected between its inner bottom end and inner top end, and a pair of movable posts (3) provided between its inner bottom end and inner top end. The test frame (1) has a pair of bakelite board bodies (4) inside, and the bakelite board bodies (4) are slidably connected to the pair of fixed posts (2). The installation and disassembly mechanism (5) is located between a pair of fixed columns (2) and movable columns (3), and the installation and disassembly mechanism (5) is used to drive the bakelite board body (4) to install and disassemble. A lifting adjustment mechanism (8) is provided on the outside of the bakelite board body (4), and the lifting adjustment mechanism (8) is used to adjust the height of the bakelite board body (4); The lifting adjustment mechanism (8) includes two pairs of movable sleeves (801). Multiple fixing rods (802) are fixedly connected to both sides of each pair of bakelite board bodies (4), and the movable sleeves (801) are fitted between the outer walls of the multiple fixing rods (802). A fixing plate (803) is fixedly connected between the ends of the multiple fixing rods (802) away from the bakelite board body (4). A spring (804) is fitted onto the outer wall of each of the multiple fixing rods (802), and both ends of the spring (804) are respectively connected to the fixing plate (803). The fixed column (2) and the movable column (3) are fixedly connected to each other on opposite sides. Multiple slots (805) are drilled on the side of the fixed column (2) and the movable column (3) away from the bakelite board body (4). A first magnet block (806) is fixedly connected to the inner wall of the slot (805). A pair of second magnet blocks (807) are fixedly connected to the end of the movable column (801) near the bakelite board body (4). The opposite sides of the pair of second magnet blocks (807) are attracted to the top and bottom of the first magnet block (806) respectively.

2. The multi-bay memory test rack according to claim 1, characterized in that, The installation and disassembly mechanism (5) includes two pairs of fixed long rods (501). A pair of bakelite board bodies (4) are each chiseled with a through groove (502), and the bakelite board body (4) is sleeved on the outer wall of the pair of fixed long rods (501) through the pair of through grooves (502). A pair of movable columns (3) are each chiseled with a straight guide groove (503), and a pair of movable straight plates (505) are provided on one side of the straight guide groove (503). The end of the fixed long rod (501) away from the fixed column (2) passes through the straight guide groove (503) and is engaged with the movable straight plate (505). A pair of connecting plates (507) are fixedly connected to the side of the pair of movable columns (3) near the movable straight plate (505), and the connecting plates (507) are threadedly connected to the test frame (1).

3. A multi-bay memory test rack according to claim 2, characterized in that, An elastic locking block (504) is fixedly connected to one end of the fixed long rod (501) away from the fixed column (2). A slot (506) is chiseled on the side of the movable straight plate (505) near the fixed long rod (501), and the elastic locking block (504) engages with the slot (506).

4. A multi-bay memory test rack according to claim 2, characterized in that, Both pairs of connecting plates (507) are threaded with fixing bolts (508). The test frame (1) has two pairs of bolt fixing grooves (509) on the side near the connecting plate (507), and the fixing bolts (508) are threaded with the bolt fixing grooves (509).

5. A multi-bay memory test rack according to claim 1, characterized in that, Two pairs of fixed long rods (501) are fixedly connected to sliders (7) at one end near the fixed post (2). A pair of fixed posts (2) are each chiseled with a groove (6) on the side near the bakelite board body (4), and the two sliders (7) in the vertical direction are located in the groove (6) and are slidably connected to it.

6. A multi-bay memory test rack according to claim 1, characterized in that, Rubber pads (9) are cut out on the opposite sides of the pair of second magnet blocks (807), and the pair of rubber pads (9) are in close contact with the inner wall of the slot (805).

7. A multi-bay memory test rack according to claim 2, characterized in that, A pair of round rods (10) are fixedly connected between opposite sides of the pair of connecting plates (507). A pair of round holes are drilled between the top and bottom ends of the movable straight plate (505), and the movable straight plate (505) is sleeved between the outer walls of the pair of round rods (10) through the pair of round holes.

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