Electromagnetic element automatic detection device

Abstract

The application discloses an electromagnetic element automatic detection device, which comprises a detection rack, and the detection rack is provided with a detection table top; a first pickup mechanism, an element test conveying mechanism, a second pickup mechanism and a tester are arranged on the detection table top; the first pickup mechanism is used for picking up electromagnetic elements in a first loading tray placed in the detection rack to the element test conveying mechanism; the element test conveying mechanism is provided with an element test position, and test probe assemblies are arranged on both sides of the element test position; each test probe assembly is provided with two contact probes, and the test probe assemblies are connected with the tester; and the second pickup mechanism is used for picking up tested electromagnetic elements to a second loading tray placed in the detection rack. The application can automatically detect electromagnetic elements placed in the loading tray in the detection rack, especially suitable for detecting electromagnetic elements with four pins, and can significantly improve the detection efficiency of the electromagnetic elements and improve the detection accuracy of the electromagnetic elements.

Description

Technical Field

[0001] This application relates to the technical field of electromagnetic component testing, and more specifically, to an automatic electromagnetic component testing device. Background Technology

[0002] In air conditioning equipment, the main board of the air conditioning equipment needs to use electromagnetic components such as high-frequency transformers and / or inductors. The electromagnetic components are mainly composed of a frame, enameled wire, magnetic core, pins, etc. Among them, the magnetic core is mostly made of manganese zinc ferrite material, which is prone to cracking after transportation and handling.

[0003] Due to quality control requirements, each batch of electromagnetic components delivered must be tested before they can be used. Currently, during transportation, multiple electromagnetic components are often placed in a tray. After delivery, workers manually test each component in the tray using testing equipment. However, this manual testing method is limited by the experience and fatigue of the workers, resulting in low testing efficiency, low accuracy, and uncertainty. Furthermore, for electromagnetic components with four pins, workers need to test the two pins at the front and two at the back, further reducing testing efficiency. Utility Model Content

[0004] The purpose of this application is to provide an automatic testing device for electromagnetic components, which can automatically test electromagnetic components placed in a tray on a testing bench, especially suitable for testing electromagnetic components with four pins, and can significantly improve the testing efficiency and accuracy of electromagnetic components.

[0005] To achieve the above objectives, this application provides an automatic testing device for electromagnetic components, including a testing stand with a testing surface;

[0006] The testing platform is equipped with a first pickup mechanism, a component testing and conveying mechanism, a second pickup mechanism, and a testing instrument.

[0007] The first picking mechanism is used to pick up the electromagnetic component located in the first loading tray placed in the testing bench and put it onto the component testing and conveying mechanism;

[0008] The component testing and conveying mechanism has a component testing position, and test probe assemblies are provided on both sides of the component testing position. Each test probe assembly has two contact probes and is connected to the tester.

[0009] The second picking mechanism is used to pick up the tested electromagnetic components and place them into the second loading tray placed in the testing bench.

[0010] In a preferred embodiment of this application, the component testing and conveying mechanism includes a conveying bracket and a conveying assembly.

[0011] The conveying bracket is disposed on the testing platform, and the conveying assembly is disposed in the conveying bracket;

[0012] The conveying assembly includes a timing pulley and a timing belt. There are two timing pulleys, which are respectively disposed at both ends of the conveying bracket, and the timing belt is disposed on the two timing pulleys.

[0013] The component test position is located on one end of the conveying bracket.

[0014] In a preferred embodiment of this application, the conveying support includes a base plate, two side plates, and two end plates.

[0015] The bracket base plate is disposed on the testing table, the two bracket side plates are disposed on both sides of the bracket base plate, and the two bracket end plates are disposed on both ends of the bracket base plate, and the two bracket end plates are connected to the two bracket side plates.

[0016] One of the synchronous pulleys is disposed on one end of the two bracket side plates, and the other synchronous pulley is disposed on the other end of the two bracket side plates.

[0017] In a preferred embodiment of this application, clearance grooves are provided on both sides of the two bracket side plates;

[0018] Both of the bracket side plates are provided with component test slots on the same side, and the component test slots form the component test positions;

[0019] The component test slot corresponds to the position of the clearance groove provided on the same side of the two bracket side plates.

[0020] In a preferred embodiment of this application, the testing platform is provided with a first hopper and a second hopper under the testing platform, the first hopper and the second hopper are respectively located on both sides of the testing platform, and the testing platform is provided with communicating openings corresponding to the first hopper and the second hopper on both sides.

[0021] The first picking mechanism is located close to the first hopper, and the second picking mechanism is located close to the second hopper;

[0022] Both the first hopper and the second hopper are equipped with a lifting drive mechanism. The first hopper is also equipped with a first loading plate, and the second hopper is also equipped with a second loading plate. The first loading plate is mounted on the lifting drive mechanism in the first hopper, and the second loading plate is mounted on the lifting drive mechanism in the second hopper.

[0023] In a preferred embodiment of this application, a first side door is provided on one side of the testing platform corresponding to the first hopper, and the first side door is connected to the first hopper;

[0024] A second side door is provided on the other side of the testing platform corresponding to the second hopper, and the second side door is connected to the second hopper.

[0025] In a preferred embodiment of this application, the lifting drive mechanism includes a lifting adjustment rod and a lifting drive component.

[0026] The lifting adjustment rod is arranged vertically, and multiple lifting adjustment rods are distributed in the corresponding hopper. The lifting drive component is drivenly connected to one of the multiple lifting adjustment rods.

[0027] The corresponding material carrier plate is vertically and adjustablely mounted on multiple corresponding lifting adjustment rods.

[0028] In a preferred embodiment of this application, the second hopper is provided with two lifting drive mechanisms, and the second hopper is also provided with a third material carrier plate. The second material carrier plate is disposed on one of the lifting drive mechanisms in the second hopper, and the third material carrier plate is disposed on the other lifting drive mechanism in the second hopper.

[0029] The testing platform is equipped with a pressing component, a lifting component, and a pushing plate component on the edge corresponding to the connecting opening between the second hopper and the second loading plate.

[0030] There are multiple pressing components, which are respectively disposed on two opposite edges of the communicating opening, for pressing the second material tray on the second material carrier plate; there are multiple lifting components, which are respectively disposed on two opposite edges of the communicating opening, for lifting the second material tray on the second material carrier plate; the pusher assembly is used to push the lifted second material tray on the second material carrier plate to the third material carrier plate.

[0031] In a preferred embodiment of this application, the first hopper is configured as two compartments in the testing bench, and the lifting drive mechanism and the first material loading plate in the first hopper are disposed in one of the compartments.

[0032] The testing platform has a pusher assembly on the edge of the connecting opening of the compartment corresponding to the compartment where the lifting drive mechanism and the first material plate are provided. The pusher assembly is used to push the first material tray on the first material plate to another compartment.

[0033] In a preferred embodiment of this application, both the first pickup mechanism and the second pickup mechanism include a multi-dimensional slide module and a pickup fixture.

[0034] The multi-dimensional sliding stage module is disposed on the detection table surface, and the picking fixture is disposed on the multi-dimensional sliding stage module.

[0035] This application discloses an automatic detection device for electromagnetic components, which, compared with the prior art, has at least the following advantages:

[0036] The automatic electromagnetic component testing device of this application includes a testing stand with a testing surface. A first pickup mechanism, a component testing and conveying mechanism, a second pickup mechanism, and a testing instrument are arranged on the testing surface. When testing electromagnetic components, a first tray and a second tray can be placed in the testing stand. The first tray holds the electromagnetic components to be tested, while the second tray is empty and used to hold electromagnetic components that have completed testing. The first pickup mechanism picks up the electromagnetic components from the first tray one by one and transfers them to the component testing and conveying mechanism. The component testing and conveying mechanism has component testing positions. When an electromagnetic component is conveyed to the component testing position, it passes through test probes set on both sides of the component testing position. The contact probes of the needle assembly contact the pins of the electromagnetic component, and the tester connected to the test probe assembly acquires the test data of the electromagnetic component. After the electromagnetic component is tested, the second pick-up mechanism picks up the tested electromagnetic components one by one into the second tray. This automatic electromagnetic component testing device can automatically test the electromagnetic components placed in the tray on the test bench. It is especially suitable for testing electromagnetic components with four pins. The electromagnetic component can be tested in one go by the test probe assemblies located on both sides of the component test position without secondary operation. The test can be performed without the intervention of personnel, which can significantly improve the testing efficiency and accuracy of electromagnetic components. Attached Figure Description

[0037] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments of this application will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0038] Figure 1This is a first three-dimensional structural schematic diagram of the automatic detection device for electromagnetic components provided in the embodiments of this application;

[0039] Figure 2 This is a second three-dimensional structural schematic diagram of the automatic electromagnetic component detection device provided in the embodiments of this application;

[0040] Figure 3 This is a third perspective structural diagram of the automatic electromagnetic component detection device provided in the embodiments of this application;

[0041] Figure 4 yes Figure 3 Enlarged view of a local structure in the image;

[0042] Figure 5 This is a fourth three-dimensional structural schematic diagram of the automatic electromagnetic component detection device provided in the embodiments of this application;

[0043] Figure 6 This is a fifth three-dimensional structural schematic diagram of the automatic electromagnetic component detection device provided in the embodiments of this application;

[0044] Figure 7 yes Figure 6 Enlarged view of a local structure in the image;

[0045] Figure 8 This is a three-dimensional structural schematic diagram of the component testing and conveying mechanism provided in the embodiments of this application;

[0046] Figure 9 This is an exploded view of the component testing and conveying mechanism provided in the embodiments of this application.

[0047] Reference numerals: 10-Testing stand; 11-Testing table surface; 111-Connecting opening; 12-First hopper; 13-Second hopper; 14-Lifting drive mechanism; 141-Lifting adjustment rod; 142-Lifting drive component; 143-Limiting right-angle frame; 15-First loading plate; 16-Second loading plate; 17-Third loading plate; 18-First side door; 19-Second side door; 21-First picking mechanism; 22-Second picking mechanism; 201-Multi-dimensional sliding table module; 202 - Pick-up fixture; 30 - Component testing conveying mechanism; 31 - Conveying bracket; 311 - Bracket base plate; 312 - Bracket side plate; 3121 - Clearance groove; 3122 - Component testing slot; 313 - Bracket end plate; 32 - Conveying assembly; 321 - Synchronous pulley; 322 - Synchronous belt; 40 - Tester; 50 - Test probe assembly; 51 - Contact probe; 60 - Pressing assembly; 70 - Lifting assembly; 80 - Push plate assembly; 81 - Push bracket; 82 - Push plate. Detailed Implementation

[0048] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0049] In this application, the terms "upper," "lower," "left," "right," "front," "rear," "top," "bottom," "inner," "outer," "middle," "vertical," "horizontal," "lateral," and "longitudinal" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are primarily for the purpose of better describing this application and its embodiments, and are not intended to limit the indicated device, element, or component to having a specific orientation, or to be constructed and operated in a specific orientation.

[0050] Furthermore, in addition to indicating location or positional relationship, some of the aforementioned terms may also have other meanings. For example, the term "above" may also be used in some cases to indicate a certain dependency or connection relationship. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0051] Furthermore, the terms "installation," "setup," "equipped with," "connection," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral structure; they can refer to a mechanical connection or a point connection; they can refer to a direct connection or an indirect connection through an intermediate medium, or an internal connection between two devices, components, or parts. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0052] Furthermore, the terms "first," "second," etc., are primarily used to distinguish different devices, elements, or components (which may be the same or different in specific type and construction), and are not intended to indicate or imply the relative importance or quantity of the indicated devices, elements, or components. Unless otherwise stated, "a plurality of" means two or more.

[0053] Currently, during transportation, electromagnetic components are often placed in multiple trays. After the components arrive, workers manually inspect each tray using testing equipment. However, this manual inspection method is limited by the experience and fatigue of the workers, resulting in low inspection efficiency, low accuracy, and uncertainty. Furthermore, for electromagnetic components with four pins, workers need to inspect the two pins at the front and two at the back, further reducing inspection efficiency.

[0054] To address the problems in the prior art, this application provides an automatic electromagnetic component testing device that can automatically test electromagnetic components placed in a tray on a testing bench. It is particularly suitable for testing electromagnetic components with four pins, and can significantly improve the testing efficiency and accuracy of electromagnetic components.

[0055] Example 1

[0056] See Figure 1 , Figure 2 , Figure 5 and Figure 8 The automatic electromagnetic component testing device of this application includes a testing stand 10, which has a testing surface 11.

[0057] The testing platform 11 is equipped with a first pickup mechanism 21, a component testing and conveying mechanism 30, a second pickup mechanism 22, and a testing instrument 40.

[0058] The first picking mechanism 21 is used to pick up the electromagnetic component located in the first material tray placed in the test bench 10 and put it onto the component test conveying mechanism 30.

[0059] The component test conveying mechanism 30 has a component test position, and test probe assemblies 50 are provided on both sides of the component test position. The test probe assembly 50 has two contact probes 51 and is connected to the tester 40.

[0060] The second pick-up mechanism 22 is used to pick up the tested electromagnetic components and place them into the second loading tray placed in the test bench 10.

[0061] In this embodiment, the automatic electromagnetic component detection device can be used to automatically detect electromagnetic components such as high-frequency transformers and inductors.

[0062] In this embodiment, the testing platform 10 adopts a cuboid platform structure, and the testing platform 11 of the testing platform 10 is a rectangular testing platform 11. When the first pickup mechanism 21, the component testing conveying mechanism 30, and the second pickup mechanism 22 are provided on the testing platform 11, the component testing conveying mechanism 30 can be provided between the first pickup mechanism 21 and the second pickup mechanism 22.

[0063] When placing the first and second loading trays, the first loading tray can be placed close to the first picking mechanism 21, and the second loading tray can be placed close to the second picking mechanism 22. The first loading tray can be a loading tray loaded with electromagnetic components to be tested, and the second loading tray is an empty tray.

[0064] As an optional implementation, the first and second material trays can be placed on the testing table 11, so that the first and second material trays are in the testing frame 10.

[0065] In this embodiment, the first picking mechanism 21 can be used to pick up the electromagnetic components placed in the first material tray in the test stand 10 one by one and put them onto the component test conveying mechanism 30; and convey them one by one to the component test position of the component test conveying mechanism 30, wherein the component test position can be set at the end position of the component test conveying mechanism 30.

[0066] When an electromagnetic component is transported to the component testing position of the component testing conveying mechanism 30, the contact probes 51 of the test probe assemblies 50, which are provided on both sides of the component testing position, come into contact with the pins of the electromagnetic component. Since the test probe assemblies 50 are connected to the tester 40, the electromagnetic component can be tested and the test data can be obtained when the contact probes 51 come into contact with the pins of the electromagnetic component. During testing, the electromagnetic components can also be tested one by one. In this embodiment, test probe assemblies 50 are provided on both sides of the component testing position, that is, there are two test probe assemblies 50, and each test probe assembly 50 has two contact probes 51, that is, there are a total of four contact probes 51. Therefore, when testing an electromagnetic component with four pins, the test can be completed in one go without secondary operation. Preferably, the tester 40 can be a dual-channel high-frequency tester. The dual-channel high-frequency tester has higher practicality and is more suitable for testing electromagnetic components with four pins.

[0067] After the electromagnetic components are tested, the second picking mechanism 22 can pick up the tested electromagnetic components one by one and place them in the second material tray placed in the test bench 10.

[0068] In this embodiment, the tester 40 can be connected to the test host, which can be a computer device to record and save the test data of each electromagnetic component.

[0069] In the automatic electromagnetic component testing device of this application embodiment, when testing electromagnetic components, a first tray and a second tray can be placed in the testing platform 10. The first tray serves as a tray containing the electromagnetic components to be tested, while the second tray is an empty tray used to load electromagnetic components that have completed testing. A first pick-up mechanism 21 can pick up the electromagnetic components located in the first tray one by one and transfer them to the component testing conveying mechanism 30. The component testing conveying mechanism 30 has component testing positions. When an electromagnetic component is conveyed to the component testing position, the contact probes 51 of the test probe assemblies 50 arranged on both sides of the component testing position contact the pins of the electromagnetic component, and utilize the contact probes 51 of the test probe assemblies 50 to test the component. The tester 40 connected to the probe assembly 50 acquires test data about the electromagnetic components. After the electromagnetic components are tested, the second pick-up mechanism 22 picks up the tested electromagnetic components one by one and places them into the second loading tray. This automatic electromagnetic component testing device can automatically test the electromagnetic components placed in the loading tray in the test stand 10. It is especially suitable for testing electromagnetic components with four pins. The electromagnetic components can be tested in one go by the test probe assembly 50 located on both sides of the component test position without secondary operation. The testing can also be performed without the intervention of personnel, which can significantly improve the testing efficiency and accuracy of electromagnetic components.

[0070] Example 2

[0071] See Figure 1 , Figure 2 , Figure 5 , Figure 8 and Figure 9 Based on the above embodiment one, the difference between this embodiment and embodiment one is that the electromagnetic component automatic detection device in this embodiment includes a component testing and conveying mechanism 30, which comprises a conveying bracket 31 and a conveying assembly 32.

[0072] The conveying bracket 31 is mounted on the testing table 11, and the conveying assembly 32 is mounted in the conveying bracket 31;

[0073] The conveying assembly 32 includes a timing pulley 321 and a timing belt 322. There are two timing pulleys 321, which are respectively disposed at both ends of the conveying bracket 31. The timing belt 322 is disposed on the two timing pulleys 321.

[0074] The component test position is located at one end of the conveyor bracket 31.

[0075] In this embodiment, the conveying bracket 31 has a mounting cavity, and the conveying assembly 32 is disposed in the conveying bracket 31 through the mounting cavity. When the first pickup mechanism 21 picks up the electromagnetic component to the component testing conveying mechanism 30, the electromagnetic component rests on the synchronous belt 322 of the conveying assembly 32 and is driven by the synchronous belt 322 of the conveying assembly 32 to be conveyed to the component testing position of the component testing conveying mechanism 30. For an electromagnetic component with four pins, it rests stably on the synchronous belt 322 of the conveying assembly 32 through its four pins.

[0076] In the above structure, the component testing conveying mechanism 30 has a relatively simple structure, which can save its space on the testing platform 11. In addition, the method of conveying electromagnetic components adopted by this component testing conveying mechanism 30 is relatively convenient, which can simplify the structure of the component testing conveying mechanism 30. The conveying of electromagnetic components can be realized without using a complex structure, and the conveying stability is also high.

[0077] In this embodiment, the conveying support 31 further includes a support base plate 311, two support side plates 312, and two support end plates 313.

[0078] The support base plate 311 is set on the testing table 11, the two support side plates 312 are set on both sides of the support base plate 311, and the two support end plates 313 are set on both ends of the support base plate 311, and the two support end plates 313 are connected to the two support side plates 312.

[0079] One synchronous pulley 321 is disposed on one end of the two bracket side plates 312, and the other synchronous pulley 321 is disposed on the other end of the two bracket side plates 312.

[0080] In this embodiment, the conveying bracket 31, composed of a bracket base plate 311, two bracket side plates 312 and two bracket end plates 313, forms an installation cavity; the conveying bracket 31 has a flat frame bracket structure, the bracket base plate 311 and the two bracket side plates 312 are long strip plate structures, and the two bracket end plates 313 are matched small plate bodies.

[0081] In the above structure, the conveyor bracket 31 with this structure can facilitate the setting of the synchronous pulley 321 and the synchronous belt 322. Furthermore, when the synchronous belt 322 conveys the electromagnetic components, the two bracket side plates 312 of this structure provide good support and limit the electromagnetic components, thus better ensuring the stability of the electromagnetic components during conveying.

[0082] In this embodiment, further, clearance grooves 3121 are provided on both sides of the two bracket side plates 312;

[0083] Both bracket side plates 312 are provided with component test slots 3122 on the same side, and the component test slots 3122 form component test positions;

[0084] The component test slot 3122 corresponds to the position of the clearance groove 3121 provided on the same side of the two bracket side plates 312.

[0085] In this embodiment, the clearance groove 3121 is provided on both sides of the two support side plates 312, that is, at the starting end and the end end of the component testing conveying mechanism 30. The shape and size of the clearance groove 3121 can match the shape and size of the clamping plate used by the first pickup mechanism 21 and the second pickup mechanism 22, so as to make way when the first pickup mechanism 21 picks up the electromagnetic component to the component testing conveying mechanism 30, and when the second pickup mechanism 22 picks up the electromagnetic component after testing, so as to facilitate the pickup operation of the first pickup mechanism 21 and the second pickup mechanism 22.

[0086] In this embodiment, the component test slot 3122 is located at the end of the component test conveying mechanism 30. When the contact probe 51 of the test probe assembly 50 contacts the pin of the electromagnetic component, the contact probe 51 of the test probe assembly 50 can contact the pin of the electromagnetic component by passing through the component test slot 3122. This facilitates the contact between the contact probe 51 and the pin of the electromagnetic component and can also play a role in alignment. The component test slot 3122 and the clearance groove 3121 are aligned so that the test position of the electromagnetic component is consistent with the pick-up position after the test is completed, so as to facilitate the pick-up by the second pick-up mechanism 22.

[0087] In this embodiment, furthermore, limit strips are provided on both support side plates 312. The limit strips are elongated and protrude partially towards the inside of the support side plate 312. The setting of these limit strips can prevent the electromagnetic components from tilting along the conveying direction when conveyed on the synchronous belt 322. The limit strips on the support side plates 312 can limit the electromagnetic components in the height direction.

[0088] Example 3

[0089] See Figures 1 to 8 Based on the above embodiment one or embodiment two, the difference between this embodiment and embodiment one or embodiment two is that, in the electromagnetic component automatic detection device of this embodiment, the detection frame 10 is provided with a first material bin 12 and a second material bin 13 under the detection table surface 11. The first material bin 12 and the second material bin 13 are respectively located on both sides of the detection frame 10, and the two sides of the detection table surface 11 are provided with connecting openings 111 corresponding to the first material bin 12 and the second material bin 13.

[0090] The first picking mechanism 21 is located close to the first hopper 12, and the second picking mechanism 22 is located close to the second hopper 13;

[0091] Both the first hopper 12 and the second hopper 13 are equipped with a lifting drive mechanism 14. The first hopper 12 is also equipped with a first carrying plate 15, and the second hopper 13 is also equipped with a second carrying plate 16. The first carrying plate 15 is mounted on the lifting drive mechanism 14 in the first hopper 12, and the second carrying plate 16 is mounted on the lifting drive mechanism 14 in the second hopper 13.

[0092] In this embodiment, the first hopper 12 can be the hopper of the first loading plate 15, and the second hopper 13 can be the hopper of the second loading plate 16. The first hopper 12 and the second hopper 13 are connected via connecting openings 111 on both sides of the testing platform 11. Multiple first loading trays can be stacked on the first loading plate 15 in the first hopper 12, and multiple second loading trays can be stacked on the second loading plate 16 in the second hopper 13. The height of the loading plate can be adjusted via the lifting drive mechanism 14, thereby adjusting the height of the loading trays. During testing, the height of the uppermost first loading tray can be aligned with the testing platform 11; similarly, the height of the uppermost second loading tray can be aligned with the testing platform 11. The height of the first tray is aligned with the testing platform 11, and then the testing of electromagnetic components is carried out. After the electromagnetic components in the first tray are tested, the first tray can be removed, and the testing of electromagnetic components in the next first tray can be carried out. When the first tray is removed, the height of the next first tray is raised to be aligned with the testing platform 11 by the lifting drive mechanism 14. Similarly, when the uppermost second tray is full of tested electromagnetic components, the second tray can be removed, and the electromagnetic components can be loaded into the next second tray. When the second tray is removed, the height of the next second tray is raised to be aligned with the testing platform 11 by the lifting drive mechanism 14.

[0093] In the above structure, the arrangement of the first hopper 12, the second hopper 13 and the lifting drive mechanism 14 allows the first and second loading trays to be stacked, thereby enabling the detection of more electromagnetic components, improving the practicality of the automatic electromagnetic component detection device, and increasing the number and efficiency of electromagnetic component detection.

[0094] In this embodiment, a first side door 18 is further provided on one side of the testing platform 10 corresponding to the first hopper 12, and the first side door 18 is connected to the first hopper 12.

[0095] On the other side of the testing platform 10, a second side door 19 is provided corresponding to the second hopper 13, and the second side door 19 is connected to the second hopper 13.

[0096] In this embodiment, a transparent glass can be provided on the side of the testing table 10, and a top plate can be provided on the top surface, so that the testing table 10 is in a relatively closed state, thus avoiding external interference during testing; by providing a first side door 18 and a second side door 19, the staff can place the first material tray into the first material plate 15 in the first material bin 12 and the second material plate 16 in the second material bin 13 through the first side door 18 and the second side door 19, so as to facilitate the use of the staff, and the replenishment operation can be performed through the first side door 18 and the second side door 19.

[0097] In this embodiment, the lifting drive mechanism 14 further includes a lifting adjustment rod 141 and a lifting drive component 142.

[0098] The lifting adjustment rod 141 is arranged vertically, and multiple lifting adjustment rods 141 are distributed in the corresponding hopper. The lifting drive component 142 is driven to one of the multiple lifting adjustment rods 141.

[0099] The corresponding material carrier plate is vertically mounted on the corresponding multiple lifting adjustment rods 141.

[0100] In this embodiment, the lifting drive 142 can be a stepper motor. The stepper motor is driven to one of the multiple lifting adjustment rods 141 in the corresponding hopper. The lifting adjustment rod 141 drives the corresponding material plate to move up and down to adjust the height of the corresponding material plate. When the corresponding material plate is set on the corresponding multiple lifting adjustment rods 141, it can be set on the corresponding multiple lifting adjustment rods 141 through connecting parts such as bearings.

[0101] In the above structure, the lifting drive mechanism 14 can drive the material plate to move up and down relatively smoothly. Furthermore, the lifting drive mechanism 14 of this structure only needs to use one lifting drive component 142 to drive the material plate to move up and down on multiple lifting adjustment rods 141, which can simplify the structure and the power source.

[0102] In this embodiment, the lifting drive mechanism 14 may further include a limiting right angle bracket 143. The shape of the material plate can be set to match the shape of the material tray. In this embodiment, there are notches at the four corners of the material tray. Four limiting right angle brackets 143 are provided, corresponding to the four corners of the material plate. They can be used to limit the material tray and ensure the stability of the stacked material trays. Among them, the two limiting right angle brackets 143 near the side door are set to be rotatable. When the worker places the material tray on the material plate through the side door, the distance between the two limiting right angle brackets 143 near the side door can be widened by rotating the two limiting right angle brackets 143 near the side door, so that the material tray can enter the position of the material plate through the widened distance for placement.

[0103] In this embodiment, the second hopper 13 is further provided with two lifting drive mechanisms 14, and the second hopper 13 is also provided with a third carrying plate 17. The second carrying plate 16 is disposed on one of the lifting drive mechanisms 14 in the second hopper 13, and the third carrying plate 17 is disposed on the other lifting drive mechanism 14 in the second hopper 13.

[0104] The testing platform 11 is provided with a pressing component 60, a lifting component 70, and a pushing plate component 80 on the edge of the connecting opening 111 corresponding to the second material bin 13 and the second material carrier plate 16.

[0105] There are multiple pressing components 60, which are respectively disposed on two opposite edges of the connecting opening 111, for pressing the second material tray on the second material carrier plate 16; there are multiple lifting components 70, which are respectively disposed on two opposite edges of the connecting opening 111, for lifting the second material tray on the second material carrier plate 16; the push plate assembly 80 is used to push the lifted second material tray on the second material carrier plate 16 onto the third material carrier plate 17.

[0106] In this embodiment, the two lifting drive mechanisms 14 provided in the second hopper 13 are two independent lifting drive mechanisms 14, and the two lifting drive mechanisms 14 do not interfere with each other; the detection table 11 has two connecting openings 111 at the positions corresponding to the second material plate 16 and the third material plate 17, and the part between the two connecting openings 111 is still the solid table structure of the detection table 11.

[0107] The third loading plate 17 is used to support the second loading tray fully loaded with electromagnetic components. Since the second loading tray has a loading cavity, the stacked second loading trays will be densely stacked together through the loading cavity because the second loading tray is empty. Therefore, when the second loading tray on the second loading plate 16 is fully loaded with tested electromagnetic components, the second loading tray can be positioned by pressing it from the side using the pressing assembly 60. The pressing assembly 60 may include a cylinder and a pressing plate connected to the cylinder. During pressing, the cylinder drives the pressing plate to move. Then, the lifting assembly 70 can be used to lift the second loading tray from the side... The second loading tray is lifted. The lifting assembly 70 may include a cylinder, a connecting plate connected to the cylinder, and a lifting plate disposed on the connecting plate. During lifting, the cylinder drives the lifting plate to move, so that the lifting plate acts on the side edge of the second loading tray to lift the second loading tray, so that the uppermost second loading tray is separated from the lower second loading tray. Then, the second loading tray lifted on the second loading plate 16 is pushed onto the third loading plate 17 by the push plate assembly 80. The push plate assembly 80 includes a push bracket 81 and a push plate 82 disposed on the push bracket 81. The push bracket 81 is disposed at corresponding positions on the two opposite edges of the corresponding connecting opening 111.

[0108] In the above structure, when the second loading tray is full of electromagnetic components, the automatic electromagnetic component detection device can push the second loading tray from the second loading plate 16 to the third loading plate 17 through the pressing component 60, the lifting component 70 and the pushing plate component 80. In this way, the next empty second loading tray can be used to continue loading the tested electromagnetic components, thereby improving the detection efficiency. In addition, the second loading trays on the third loading plate 17 can also be stacked. The height of the third loading plate 17 can also be adjusted by the lifting drive mechanism 14, so that the second loading trays are stacked on the third loading plate 17.

[0109] In this embodiment, the first hopper 12 is further configured as two compartments in the testing stand 10, and the lifting drive mechanism 14 and the first material loading plate 15 in the first hopper 12 are disposed in one of the compartments.

[0110] The testing platform 11 has a pusher assembly 80 on the edge of the connecting opening 111 of the compartment where the lifting drive mechanism 14 and the first material loading plate 15 are provided. The pusher assembly 80 is used to push the first material loading plate on the first material loading plate 15 to another compartment.

[0111] In this embodiment, the two compartments of the first hopper 12 can be separated by a partition. The detection table 11 has two connecting openings 111 at the positions corresponding to the two compartments. The part between the two connecting openings 111 is still the solid table structure of the detection table 11.

[0112] During testing, when all the electromagnetic components on the topmost first tray are picked up and tested by the component testing conveyor 30, the topmost first tray of the first tray 15 can be pushed to another compartment by the pusher assembly 80. Since the first tray is a tray containing electromagnetic components, the upper and lower first trays will not be densely stacked together. The first tray can be directly pushed to another compartment by the pusher assembly 80. Then, the first tray 15 can be raised by the lifting drive mechanism 14 so that the next first tray is aligned with the testing table 11 for testing of the electromagnetic components of the next first tray.

[0113] In the above structure, after the electromagnetic components in the first loading tray are sent for testing, the automatic electromagnetic component detection device can push the first loading tray to another compartment for collection via the push plate assembly 80. The height of the first loading plate 15 can be adjusted via the lifting drive mechanism 14 to detect the electromagnetic components in the next first loading tray. This can improve the detection efficiency and enhance the practicality of the automatic electromagnetic component detection device.

[0114] In this embodiment, a defective product collection box may be further provided on the testing platform 11. The defective product collection box is located close to the second picking mechanism 22. For electromagnetic components that fail the test, they can be picked up by the second picking mechanism 22 and placed in the defective product collection box, thereby distinguishing between qualified and unqualified electromagnetic components.

[0115] Example 4

[0116] See Figures 1 to 8 Based on any of the embodiments in Examples 1 to 3 above, the difference between this embodiment and any of the embodiments in Examples 1 to 3 is that, in this embodiment, the electromagnetic component automatic detection device includes a multi-dimensional slide module 201 and a pickup fixture 202 in both the first pickup mechanism 21 and the second pickup mechanism 22.

[0117] The multi-dimensional slide module 201 is mounted on the detection table 11, and the pick-up fixture 202 is mounted on the multi-dimensional slide module 201.

[0118] In this embodiment, the multi-dimensional slide module 201 is a three-dimensional slide module, and the picking fixture 202 is disposed on the three-dimensional slide module and moves under the drive of the three-dimensional slide module; in this embodiment, the picking fixture 202 includes a mounting plate and a finger cylinder, the mounting plate is disposed on the three-dimensional slide module, and the finger cylinder is disposed on the mounting plate.

[0119] In the above structure, the movement adjustment of the first pickup mechanism 21 and the second pickup mechanism 22 is more precise, which can better pick up electromagnetic components and ensure the accurate and stable pickup and placement of electromagnetic components, thereby ensuring the smooth progress of the detection process.

[0120] In all the above embodiments, "large" and "small" are relative terms, "more" and "less" are relative terms, and "upper" and "lower" are relative terms. The embodiments of this application will not elaborate further on the expression of such relative terms.

[0121] It should be understood that phrases such as "in one embodiment," "in this embodiment," "in this application embodiment," or "as an optional implementation" throughout the specification mean that a specific feature, structure, or characteristic related to an embodiment is included in at least one embodiment of this application. Therefore, phrases such as "in one embodiment," "in this embodiment," "in this application embodiment," or "as an optional implementation" appearing throughout the specification do not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. Those skilled in the art should also understand that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily essential to this application.

[0122] In the various embodiments of this application, it should be understood that the sequence number of each process does not necessarily imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0123] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any person skilled in the art can apply this application to the technical scope disclosed herein.

[0124] Any changes or substitutions that can be easily conceived within the scope of this application should be included within the protection scope of this application.

[0125] Therefore, the scope of protection of this application should be determined by the scope of protection of the claims.

Claims

1. An automatic testing device for electromagnetic components, characterized in that, Includes a testing stand, the testing stand having a testing surface; The testing platform is equipped with a first pickup mechanism, a component testing and conveying mechanism, a second pickup mechanism, and a testing instrument. The first picking mechanism is used to pick up the electromagnetic component located in the first loading tray placed in the testing bench and put it onto the component testing and conveying mechanism; The component testing and conveying mechanism has a component testing position, and test probe assemblies are provided on both sides of the component testing position. Each test probe assembly has two contact probes and is connected to the tester. The second picking mechanism is used to pick up the tested electromagnetic components and place them into the second loading tray placed in the testing bench.

2. The automatic detection device for electromagnetic components according to claim 1, characterized in that, The component testing and conveying mechanism includes a conveying bracket and a conveying assembly. The conveying bracket is disposed on the testing platform, and the conveying assembly is disposed in the conveying bracket; The conveying assembly includes a timing pulley and a timing belt. There are two timing pulleys, which are respectively disposed at both ends of the conveying bracket, and the timing belt is disposed on the two timing pulleys. The component test position is located on one end of the conveying bracket.

3. The automatic detection device for electromagnetic components according to claim 2, characterized in that, The conveying support includes a base plate, two side plates, and two end plates. The bracket base plate is disposed on the testing table, the two bracket side plates are disposed on both sides of the bracket base plate, and the two bracket end plates are disposed on both ends of the bracket base plate, and the two bracket end plates are connected to the two bracket side plates. One of the synchronous pulleys is disposed on one end of the two bracket side plates, and the other synchronous pulley is disposed on the other end of the two bracket side plates.

4. The automatic detection device for electromagnetic components according to claim 3, characterized in that, Both sides of the two bracket side plates are provided with clearance grooves; Both of the bracket side plates are provided with component test slots on the same side, and the component test slots form the component test positions; The component test slot corresponds to the position of the clearance groove provided on the same side of the two bracket side plates.

5. The automatic detection device for electromagnetic components according to any one of claims 1-4, characterized in that, The testing platform has a first hopper and a second hopper under the testing platform surface. The first hopper and the second hopper are located on both sides of the testing platform, and the testing platform surface has a connecting opening corresponding to the first hopper and the second hopper. The first picking mechanism is located close to the first hopper, and the second picking mechanism is located close to the second hopper; Both the first hopper and the second hopper are equipped with a lifting drive mechanism. The first hopper is also equipped with a first loading plate, and the second hopper is also equipped with a second loading plate. The first loading plate is mounted on the lifting drive mechanism in the first hopper, and the second loading plate is mounted on the lifting drive mechanism in the second hopper.

6. The automatic detection device for electromagnetic components according to claim 5, characterized in that, A first side door is provided on one side of the testing platform corresponding to the first hopper, and the first side door is connected to the first hopper; A second side door is provided on the other side of the testing platform corresponding to the second hopper, and the second side door is connected to the second hopper.

7. The automatic detection device for electromagnetic components according to claim 5, characterized in that, The lifting drive mechanism includes a lifting adjustment rod and a lifting drive component. The lifting adjustment rod is arranged vertically, and multiple lifting adjustment rods are distributed in the corresponding hopper. The lifting drive component is drivenly connected to one of the multiple lifting adjustment rods. The corresponding material carrier plate is vertically and adjustablely mounted on multiple corresponding lifting adjustment rods.

8. The automatic detection device for electromagnetic components according to claim 5, characterized in that, The second hopper is provided with two lifting drive mechanisms, and the second hopper is also provided with a third material carrier plate. The second material carrier plate is disposed on one of the lifting drive mechanisms in the second hopper, and the third material carrier plate is disposed on the other lifting drive mechanism in the second hopper. The testing platform is equipped with a pressing component, a lifting component, and a pushing plate component on the edge corresponding to the connecting opening between the second hopper and the second loading plate. There are multiple pressing components, which are respectively disposed on two opposite edges of the communicating opening, for pressing the second material tray on the second material carrier plate; there are multiple lifting components, which are respectively disposed on two opposite edges of the communicating opening, for lifting the second material tray on the second material carrier plate; the pusher assembly is used to push the lifted second material tray on the second material carrier plate to the third material carrier plate.

9. The automatic detection device for electromagnetic components according to claim 5, characterized in that, The first hopper is configured as two compartments in the testing frame, and the lifting drive mechanism and the first material loading plate in the first hopper are located in one of the compartments. The testing platform has a pusher assembly on the edge of the connecting opening of the compartment corresponding to the compartment where the lifting drive mechanism and the first material loading plate are provided. The pusher assembly is used to push the first material loading plate on the first material loading plate into another compartment.

10. The automatic detection device for electromagnetic components according to any one of claims 1-4, characterized in that, Both the first and second picking mechanisms include a multi-dimensional slide module and a picking fixture. The multi-dimensional sliding stage module is disposed on the detection table surface, and the picking fixture is disposed on the multi-dimensional sliding stage module.

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