Photovoltaic optimizer aging test system
The photovoltaic optimizer aging test system, which forms a closed current loop through mains power supply and inverter, solves the problem of high traditional testing costs, realizes batch testing and energy-saving monitoring, and reduces the aging test cost of photovoltaic optimizers.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- TCL PHOTOVOLTAIC INTELLIGENT TECH (SHENZHEN) CO LTD
- Filing Date
- 2025-07-03
- Publication Date
- 2026-07-10
AI Technical Summary
Traditional photovoltaic optimizer aging test systems require an external high-power power supply, resulting in high testing costs and poor scalability, making it impossible to achieve batch testing.
Mains power is used instead of high-power power supply. The mains power is connected through a test chamber and a switching power supply. Combined with the inverter, a closed current loop is formed to realize the batch aging test of photovoltaic optimizers. The aging curve is generated by the controller for life assessment.
It reduces testing costs, improves testing efficiency, supports aging tests of batch photovoltaic optimizers, and integrates energy-saving design and intelligent monitoring functions.
Smart Images
Figure CN224480534U_ABST
Abstract
Description
Technical Field
[0001] This application belongs to the field of photovoltaic equipment testing technology, and in particular relates to a photovoltaic optimizer aging test system. Background Technology
[0002] A photovoltaic optimizer, also known as a photovoltaic power optimizer, is used to solve the problem of reduced power generation in a photovoltaic system caused by shading, differences in the orientation of photovoltaic modules, or inconsistent degradation of photovoltaic modules. It achieves maximum power output of a single photovoltaic module and online monitoring, thereby improving system efficiency.
[0003] Before a photovoltaic (PV) optimizer leaves the factory, it needs to undergo aging tests to assess its lifespan. Lifespan assessment requires simulating long-term operating environments through high-temperature aging tests. However, traditional testing systems are costly because the high-temperature test chamber requires a continuous external high-power supply. Utility Model Content
[0004] This application provides a photovoltaic optimizer aging test system that can reduce testing costs.
[0005] This application provides a photovoltaic optimizer aging test system, including:
[0006] The test chamber is connected to mains power and is used to provide the set temperature.
[0007] At least one photovoltaic optimizer is installed inside the test chamber;
[0008] At least one switching power supply, the input terminal of each switching power supply is connected to the mains power, and the output terminal of each switching power supply is respectively connected to each of the photovoltaic optimizers;
[0009] The controller is communicatively connected to the test chamber and each of the switching power supplies. The controller is used to generate aging curves for each photovoltaic optimizer based on the voltage signals of each of the switching power supplies and the operating data of the test chamber.
[0010] Optionally, the photovoltaic optimizer aging test system further includes:
[0011] The inverter has its AC side connected to the mains power and its DC side connected to each of the photovoltaic optimizers to form a closed current circulation loop.
[0012] The controller is also communicatively connected to the inverter, and the controller is also used to generate aging curves for each of the photovoltaic optimizers based on the input and output data of the inverter.
[0013] Optionally, the DC-side input voltage range of the inverter is 200V to 1000V.
[0014] Optionally, the photovoltaic optimizer aging test system further includes a monitoring component, which includes a camera and a temperature and humidity sensor. Both the camera and the temperature and humidity sensor are installed inside the test chamber. The camera is used to monitor the working status of each photovoltaic optimizer, and the temperature and humidity sensor is used to detect the temperature and humidity inside the test chamber.
[0015] Optionally, the monitoring component can communicate with external devices, and the test chamber, each of the switching power supplies, and the controller can all communicate with the external devices. The external devices can remotely control the test chamber, each of the switching power supplies, and the controller based on the data from the monitoring component.
[0016] Optionally, the monitoring component is used to identify anomalies in the photovoltaic optimizer and the test chamber, and to issue an alarm via external devices.
[0017] Optionally, the photovoltaic optimizer aging test system further includes:
[0018] The main switch is connected between the mains power and the test chamber. The main switch is electrically connected to the controller. The main switch is used to connect or disconnect the mains power according to the control signal from the controller or an external device.
[0019] Optionally, the set temperature range is -40°C to 120°C.
[0020] Optionally, each of the photovoltaic optimizers includes two sub-optimizers integrated together, and the two sub-optimizers are respectively connected to the two switching power supplies.
[0021] Optionally, each of the photovoltaic optimizers is connected in series and connected to the DC side of the inverter to form a closed-loop energy feedback.
[0022] In the photovoltaic optimizer aging test system of this application embodiment, by connecting the test chamber and the switching power supply to the mains power, that is, using the mains power supply instead of the high-power power supply to power the test system, it can not only support batch aging tests of photovoltaic optimizers and improve test efficiency, but also reduce test costs. Attached Figure Description
[0023] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application, and those skilled in the art can obtain other drawings based on these drawings without creative effort.
[0024] To gain a more complete understanding of this application and its beneficial effects, the following description will be provided in conjunction with the accompanying drawings. In the following description, the same reference numerals denote the same parts.
[0025] Figure 1 This is a structural block diagram of a photovoltaic optimizer aging test system provided in an embodiment of this application.
[0026] Figure 2 This is a schematic diagram of the electrical connections of the photovoltaic optimizer aging test system provided in an embodiment of this application.
[0027] Figure 3 This is a communication connection block diagram of the photovoltaic optimizer aging test system provided in an embodiment of this application.
[0028] Figure 4 This is a block diagram of the signal control structure of the photovoltaic optimizer aging test system provided in an embodiment of this application. Detailed Implementation
[0029] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.
[0030] To save on the cost of aging tests for photovoltaic optimizers, this application provides a photovoltaic optimizer aging test system, which will be described below in conjunction with the accompanying drawings.
[0031] For example, please refer to Figure 1 As shown, Figure 1 This is a structural block diagram of a photovoltaic optimizer aging test system provided in an embodiment of this application. The photovoltaic optimizer aging test system 100 includes a test chamber 110, at least one photovoltaic optimizer 120, at least one switching power supply 130, and a controller 140.
[0032] The test chamber 110 is used to simulate the operating environment of the photovoltaic optimizer 120. The test chamber 110 is connected to mains power, such as through the live wire (L), neutral wire (N), and ground wire (PE), meaning the mains power supplies the test chamber 110. The test chamber 110 can provide a set temperature, with a range of -40℃ to 120℃, to accommodate different test objects, thus improving the versatility of the test chamber 110. For aging tests of the photovoltaic optimizer 120, a high-temperature environment is typically required; in this embodiment, the set temperature provided by the test chamber 110 can be 65℃.
[0033] The photovoltaic optimizer 120 is a device for optimizing the power of photovoltaic modules. This application embodiment can test at least one photovoltaic optimizer 120; conversely, the photovoltaic optimizer aging test system 100 of this application embodiment can test multiple photovoltaic optimizers 120 simultaneously. In traditional testing schemes, a high-power external power supply is required, and a single power supply can only drive a small number of devices under test, making batch testing impossible. The scalability of traditional testing methods is poor, thus limiting the application scenarios of the testing scheme. However, in this application embodiment, because it uses mains power, batch testing of the photovoltaic optimizer 120 can be performed, expanding the application scenarios of the testing system, such as applying the testing system to the aging tests of photovoltaic equipment or other electrical components.
[0034] A switching power supply 130, also known as a switch-mode power supply, switching power supply, or switching converter, is a high-frequency power conversion device and a type of power supply. Its function is to convert a voltage at a certain level into the voltage or current required by the user through different architectures. The input of a switching power supply is mostly AC or DC power, while the output is mostly for devices requiring DC power; the switching power supply performs the voltage and current conversion between these two. In this embodiment, the switching power supply 130 is configured to correspond to the photovoltaic optimizer 120. At least one switching power supply 130 has its input connected to AC mains power, and the output of each switching power supply 130 is connected to each photovoltaic optimizer 120. For example, the rated power of each switching power supply 130 can be 1kW, and the input of each switching power supply 130 is connected to AC mains power, while the output is a controllable DC power supply from 12V to 48V.
[0035] The controller 140 is the control center of the photovoltaic optimizer aging test system 100. The controller 140 can be a chip. The controller 140 is connected to the test chamber 110 and each switching power supply 130. The controller 140 is used to generate aging curves for each photovoltaic optimizer 120 based on the voltage signals of each switching power supply 130 and the operating data of the test chamber 110, that is, to evaluate the life of each photovoltaic optimizer 120.
[0036] In the photovoltaic optimizer aging test system 100 of this application embodiment, by connecting the test chamber 110 and the switching power supply 130 to the mains power, that is, using the mains power supply instead of the high-power power supply to power the test system, it can not only support batch aging tests of photovoltaic optimizers 120 and improve test efficiency, but also reduce test costs.
[0037] During the aging test of photovoltaic optimizers, traditional testing systems consume the electrical energy supplied to the photovoltaic optimizers using light bulbs or heat, resulting in energy waste. To reduce energy waste, embodiments of this application also utilize the electrical energy supplied to the photovoltaic optimizers.
[0038] For example, please refer to Figure 1 And see Figure 2 As shown, Figure 2 This is a schematic diagram of the electrical connections of the photovoltaic optimizer aging test system provided in this application embodiment. The photovoltaic optimizer aging test system 100 also includes an inverter 150, which is a converter that transforms DC power into AC power with fixed frequency and voltage or frequency and voltage regulation. The inverter 150 has an AC side and a DC side. The AC side of the inverter 150 is connected to the mains power. The inverter 150 may have three connection ports PE1, L1, and N1. The three connection ports PE1, L1, and N1 on the AC side of the inverter 150 are connected to the mains power through the ground wire PE, the live wire L, and the neutral wire N, respectively. The DC side of the inverter 150 is connected to each photovoltaic optimizer 120 to form a closed current circulation loop. That is, the mains power supplies the photovoltaic optimizer 120 through the switching power supply 130, and then returns to the mains power through the inverter 150, thereby powering the test chamber 110.
[0039] The inverter 150 has a DC input voltage range of 200V to 1000V, which can support the input of photovoltaic optimizers 120 with different power ratings.
[0040] Furthermore, please combine Figure 1 and Figure 2 And see Figure 3 As shown, Figure 3 This is a communication connection block diagram of the photovoltaic optimizer aging test system provided in an embodiment of this application. The controller 140 is also communicatively connected to the inverter 150, and the controller 140 is also used to generate aging curves for each photovoltaic optimizer 120 based on the input and output data of the inverter 150.
[0041] The energy-saving design of the photovoltaic optimizer aging test system 100 in this application embodiment feeds the output power of the photovoltaic optimizer 120 back to the mains power network through the inverter 150 and supplies power to the test chamber 110, which can reduce the external power consumption by more than 30%.
[0042] Regarding the number of photovoltaic optimizers 120, in one scenario, the number can be the same as the number of switching power supplies 130, meaning a one-to-one correspondence between the switching power supply 130 and the photovoltaic optimizer 120. This facilitates connection and reduces confusion caused by numerous wiring terminals. Alternatively, the photovoltaic optimizer 120 can be configured as a one-to-two system, comprising two integrated sub-optimizers 122. Each sub-optimizer 122 is connected to one of the two switching power supplies 130, meaning one photovoltaic optimizer 120 connects to two switching power supplies 130. Since the two sub-optimizers 122 can share some components, this reduces cost and overall power loss of the photovoltaic optimizer 120. All photovoltaic optimizers 120 are connected in series to the DC side of the inverter 150, forming a closed-loop energy feedback system.
[0043] For example, the photovoltaic optimizer aging test system 100 of this application embodiment is equipped with 5 photovoltaic optimizers 120 and 10 switching power supplies 130. Each photovoltaic optimizer 120 is connected to 2 switching power supplies 130. Adjacent photovoltaic optimizers 120 are connected in series. The photovoltaic optimizer 120 at the first position and the photovoltaic optimizer at the fifth position are respectively connected to the DC side of the inverter 150. The DC side input voltage range of the inverter 150 is 200V to 1000V, and it supports a maximum power feedback of 10kW.
[0044] Please combine Figures 1 to 3 And see Figure 4 As shown, Figure 4 This is a block diagram of the signal control structure of the photovoltaic optimizer aging test system provided in this application embodiment. To facilitate the control of the mains power supply, the photovoltaic optimizer aging test system 100 in this application embodiment also includes a main switch K. The main switch K is connected between the mains power supply and the test chamber 110. The main switch K is electrically connected to the controller 140. The main switch K is used to connect or disconnect the mains power supply according to the control signal from the controller 140 or an external device.
[0045] The existing testing system still suffers from insufficient monitoring, relies on manual inspections, and has a relatively slow response to anomalies.
[0046] Based on this, the photovoltaic optimizer aging test system 100 of this application embodiment also includes a monitoring component (not shown in the figure). The monitoring component includes a camera and a temperature and humidity sensor. Both the camera and the temperature and humidity sensor are installed inside the test chamber 110. The camera is used to monitor the working status of each photovoltaic optimizer 120, and the temperature and humidity sensor is used to detect the temperature and humidity inside the test chamber 110.
[0047] The monitoring component, also known as a network camera, can communicate with external devices such as mobile phones. The test chamber 110, each switching power supply 130, and the controller 140 can also communicate with these external devices. These external devices can remotely control the test chamber 110, each switching power supply 130, and the controller 140 based on data from the monitoring component. The monitoring component is used to identify anomalies in the photovoltaic optimizer 120 and the test chamber 110 and to issue alarms via external devices.
[0048] For example, external devices such as mobile phones can be used, and applications such as monitoring programs can be downloaded on the phones. Users can monitor the test status of the photovoltaic optimizer 120 through the monitoring program on their phones. The monitoring components are also configured to detect smoke, photoelectric effects, and displacement anomalies. When the monitoring components detect an anomaly, the monitoring program on the phone will automatically trigger an alarm to remind the user to take timely action. Simultaneously, an alarm can also be installed at the location of the photovoltaic optimizer aging test system 100 to promptly alert nearby personnel to take action when an anomaly occurs in the photovoltaic optimizer aging test system 100.
[0049] The photovoltaic optimizer aging test system 100 of this application is a photovoltaic optimizer life assessment test system based on high-temperature aging test. It can be applied to high-temperature accelerated aging test and data acquisition under the condition of multiple photovoltaic optimizers 120 connected in series. The controller 140 can be a chip, which communicates with the switching power supply 130, inverter 150, and test chamber 110 to acquire the voltage and current of the switching power supply 130, the input and output data of the inverter 150, and the operating data of the test chamber 110 to generate aging curves. The mains power line is connected to the system via the main switch K, supplying power to the switching power supply 130 and the test chamber 110. The AC side of the inverter 150 is connected to the mains power for grid connection. In the test link, the output terminals of each switching power supply 130 are connected to the input terminals of the photovoltaic optimizer 120 under test. The outputs of all photovoltaic optimizers 120 are connected in series to the DC side of the inverter 150, forming a closed-loop energy feedback.
[0050] Users can remotely perform the following operations via an application on an external device, such as a mobile phone: start and stop the main switch K with one click; individually control the power supply of any switching power supply 130 or the test chamber 110; and push alarm information and automatically cut off the corresponding sub-circuit when the system malfunctions. This enables intelligent monitoring of the photovoltaic optimizer aging test system 100.
[0051] The testing and life assessment process can be as follows:
[0052] Set up a test platform, such as placing 5 photovoltaic optimizers 120 inside the test chamber 110 and connecting them according to the system electrical connection diagram.
[0053] To start the test, adjust the set temperature of the test chamber 110 to 65℃ using the application on the external device, turn on all the switching power supplies 130, and set the output voltage and current of the switching power supplies 130. The settings can be based on the rated voltage and current of each photovoltaic optimizer 120.
[0054] Data acquisition involves the system recording changes in the output current and voltage of the photovoltaic optimizer 120, power attenuation, and efficiency changes of the inverter 150, until a certain sample, namely the photovoltaic optimizer 120, fails.
[0055] Lifetime assessment: Based on failure time and temperature stress model, the expected lifetime of photovoltaic optimizer 120 at room temperature is estimated.
[0056] In the photovoltaic optimizer aging test system 100 of this application embodiment, energy saving is achieved by linking the power supply of the inverter 150 energy feedback and the test chamber 110, and the photovoltaic optimizers 120 can be tested in batches. It also integrates remote control and intelligent monitoring functions, which improves test efficiency and safety.
[0057] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.
[0058] In the description of this application, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more features.
[0059] The photovoltaic optimizer aging test system provided in the embodiments of this application has been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.
Claims
1. A photovoltaic optimizer aging test system, characterized in that, include: The test chamber is connected to mains power and is used to provide the set temperature. At least one photovoltaic optimizer is installed inside the test chamber; At least one switching power supply, the input terminal of each switching power supply is connected to the mains power, and the output terminal of each switching power supply is respectively connected to each of the photovoltaic optimizers; The controller is communicatively connected to the test chamber and each of the switching power supplies. The controller is used to generate aging curves for each photovoltaic optimizer based on the voltage signals of each of the switching power supplies and the operating data of the test chamber.
2. The photovoltaic optimizer aging test system according to claim 1, characterized in that, The photovoltaic optimizer aging test system also includes: The inverter has its AC side connected to the mains power and its DC side connected to each of the photovoltaic optimizers to form a closed current circulation loop. The controller is also communicatively connected to the inverter, and the controller is also used to generate aging curves for each of the photovoltaic optimizers based on the input and output data of the inverter.
3. The photovoltaic optimizer aging test system according to claim 2, characterized in that, The DC input voltage range of the inverter is 200V to 1000V.
4. The photovoltaic optimizer aging test system according to claim 1, characterized in that, The photovoltaic optimizer aging test system also includes a monitoring component, which includes a camera and a temperature and humidity sensor. Both the camera and the temperature and humidity sensor are installed inside the test chamber. The camera is used to monitor the working status of each photovoltaic optimizer, and the temperature and humidity sensor is used to detect the temperature and humidity inside the test chamber.
5. The photovoltaic optimizer aging test system according to claim 4, characterized in that, The monitoring component can communicate with external devices, and the test chamber, each of the switching power supplies and the controller can also communicate with the external devices. The external devices can remotely control the test chamber, each of the switching power supplies and the controller based on the data from the monitoring component.
6. The photovoltaic optimizer aging test system according to claim 4, characterized in that, The monitoring component is used to identify abnormalities in the photovoltaic optimizer and the test chamber, and to issue alarms via external devices.
7. The photovoltaic optimizer aging test system according to any one of claims 1 to 6, characterized in that, The photovoltaic optimizer aging test system also includes: The main switch is connected between the mains power and the test chamber. The main switch is electrically connected to the controller. The main switch is used to connect or disconnect the mains power according to the control signal from the controller or an external device.
8. The photovoltaic optimizer aging test system according to claim 7, characterized in that, The set temperature range is -40℃ to 120℃.
9. The photovoltaic optimizer aging test system according to claim 2, characterized in that, Each of the photovoltaic optimizers includes two sub-optimizers integrated together, and the two sub-optimizers are respectively connected to the two switching power supplies.
10. The photovoltaic optimizer aging test system according to claim 9, characterized in that, Each of the photovoltaic optimizers is connected in series and connected to the DC side of the inverter to form a closed-loop energy feedback.